2004 Fairchild Semiconductor Corporation
1N5985B - 1N6025B, Rev. C
Zener
s
1N
5
985B -
1N60
25B
Electrical Characteristics
T
A
=25
C unless otherwise noted
Device
V
Z
(V) @ I
Z (Note 1)
Test Current
I
Z
(mA)
Zener Impedance
leakage Current
I
ZM
(mA)
(Note 2)
Min.
Typ.
Max.
Z
Z
@ I
Z
(
)
Z
ZK
@ I
ZK
= 250
A
(
)
I
R
(mA)
V
R
(V)
1N5985B
1N5986B
1N5987B
1N5988B
1N5989B
2.58
2.565
2.85
3.135
3.42
2.4
2.7
3
3.3
3.6
2.52
2.835
3.15
3.465
3.78
5
5
5
5
5
100
100
95
95
90
1800
1900
2000
2200
2300
100
75
50
25
15
1
1
1
1
1
208
185
167
152
139
1N5990B
1N5991B
1N5992B
1N5993B
1N5994B
3.705
4.085
4.465
4.845
5.32
3.9
4.3
4.7
5.1
5.6
4.095
4.515
4.935
5.355
5.88
5
5
5
5
5
90
88
70
50
25
2400
2500
2200
2050
1800
10
5
3
2
2
1
1
1.5
2
3
128
116
106
98
89
1N5995B
1N5996B
1N5997B
1N5998B
1N5999B
5.89
6.46
7.125
7.79
8.645
6.2
6.8
7.5
8.2
9.1
6.51
7.14
7.875
8.61
9.555
5
5
5
5
5
10
8
7
7
10
1300
750
600
600
600
1
1
0.5
0.5
0.1
4
5.2
6
6.5
7
81
74
67
61
55
1N6000B
1N6001B
1N6002B
1N6003B
1N6004B
9.5
10.45
11.4
12.35
14.25
10
11
12
13
15
10.5
11.55
12.6
13.65
15.75
5
5
5
5
5
15
18
22
25
32
600
600
600
600
600
0.1
0.1
0.1
0.1
0.1
8
8.4
9.1
9.9
11
50
45
42
38
33
1N6005B
1N6006B
1N6007B
1N6008B
1N6009B
15.2
17.1
19
20.9
22.8
16
18
20
22
24
16.8
18.9
21
23.1
25.2
5
5
5
5
5
36
42
48
55
62
600
600
600
600
600
0.1
0.1
0.1
0.1
0.1
12
14
15
17
18
31
28
25
23
21
1N6010B
1N6011B
1N6012B
1N6013B
1N6014B
25.65
28.5
31.35
34.2
37.05
27
30
33
36
39
28.35
31.5
34.65
37.8
40.95
5
5
5
5
2
70
78
88
95
130
600
600
700
700
800
0.1
0.1
0.1
0.1
0.1
21
23
25
27
30
19
17
15
14
13
Zeners
1N5985B - 1N6025B
Absolute Maximum Ratings *
T
A
= 25
C unless otherwise noted
* These ratings are limiting values above which the serviceability of the diode may be impaired.
Symbol
Parameter
Value
Units
P
D
Power Dissipation
@ TL
75C, Lead Length = 3/8"
500
mW
Derate above 75
C
4.0
mW/
C
T
J
, T
STG
Operating and Storage Temperature Range
-65 to +200
C
Tolerance = 5%
DO-35 Glass case
COLOR BAND DENOTES CATHODE
2004 Fairchild Semiconductor Corporation
1N5985B - 1N6025B, Rev. C
Zener
s
1N
5
985B -
1N60
25B
Electrical Characteristics
(Continued) T
A
=25
C unless otherwise noted
Notes:
1. Zener Voltage (V
Z
)
The zener voltage is measured with the device junction in the themal equilibrium at the lead temperature (T
L
) at 30
C 1C and 3/8" lead length.
2. Maximum Zener Current Ratings (I
ZM
)
The maximum current handling capability on a worst case basis is limited by the actual zener voltage at the operation point and the power derating curve.
Device
V
Z
(V) @ I
Z (Note 1)
Test Current
I
Z
(mA)
Zener Impedance
leakage Current
I
ZM
(mA)
(Note 2)
Min.
Typ.
Max.
Z
Z
@ I
Z
(
)
Z
ZK
@ I
ZK
= 250
A
(
)
I
R
(mA)
V
R
(V)
1N6015B
1N6016B
1N6017B
1N6018B
1N6019B
40.85
44.65
48.45
53.2
58.9
43
47
51
56
62
45.15
49.35
53.55
58.8
65.1
2
2
2
2
2
150
170
180
200
225
900
1000
1300
1400
1400
0.1
0.1
0.1
0.1
0.1
33
36
39
43
47
12
11
9.8
8.9
8
1N6020B
1N6021B
1N6022B
1N6023B
1N6024B
64.6
71.25
77.9
86.45
95
68
75
82
91
100
71.4
78.75
86.1
95.55
105
2
2
2
2
1
240
265
280
300
500
1600
1700
2000
2300
2600
0.1
0.1
0.1
0.1
0.1
52
56
62
69
76
7.4
6.7
6.1
5.5
5
1N6025B
104.5
110
115.5
1
650
3000
0.1
84
4.5
V
F
Forward Voltage = 1.2V Max @ I
F
= 200mA
2004 Fairchild Semiconductor Corporation
1N5985B - 1N6025B, Rev. C
Zener
s
1N
5
985B -
1N60
25B
Top Mark Information
Device
Line 1
Line 2
Line 3
Line 4
1N5985B
1N5986B
1N5987B
1N5988B
1N5989B
LOGO
LOGO
LOGO
LOGO
LOGO
598
598
598
598
598
5B
6B
7B
8B
9B
XY
XY
XY
XY
XY
1N5990B
1N5991B
1N5992B
1N5993B
1N5994B
LOGO
LOGO
LOGO
LOGO
LOGO
599
599
599
599
599
0B
1B
2B
3B
4B
XY
XY
XY
XY
XY
1N5995B
1N5996B
1N5997B
1N5998B
1N5999B
LOGO
LOGO
LOGO
LOGO
LOGO
599
599
599
599
599
5B
6B
7B
8B
9B
XY
XY
XY
XY
XY
1N6000B
1N6001B
1N6002B
1N6003B
1N6004B
LOGO
LOGO
LOGO
LOGO
LOGO
600
600
600
600
600
0B
1B
2B
3B
4B
XY
XY
XY
XY
XY
1N6005B
1N6006B
1N6007B
1N6008B
1N6009B
LOGO
LOGO
LOGO
LOGO
LOGO
600
600
600
600
600
5B
6B
7B
8B
9B
XY
XY
XY
XY
XY
1N6010B
1N6011B
1N6012B
1N6013B
1N6014B
LOGO
LOGO
LOGO
LOGO
LOGO
601
601
601
601
601
0B
1B
2B
3B
4B
XY
XY
XY
XY
XY
1N6015B
1N6016B
1N6017B
1N6018B
1N6019B
LOGO
LOGO
LOGO
LOGO
LOGO
601
601
601
601
601
5B
6B
7B
8B
9B
XY
XY
XY
XY
XY
1N6020B
1N6021B
1N6022B
1N6023B
1N6024B
LOGO
LOGO
LOGO
LOGO
LOGO
602
602
602
602
602
0B
1B
2B
3B
4B
XY
XY
XY
XY
XY
1N6025B
LOGO
602
5B
XY
2004 Fairchild Semiconductor Corporation
1N5985B - 1N6025B, Rev. C
Zener
s
1N
5
985B -
1N60
25B
Top Mark Information
(Continued)
General Requirements:
1.0 Cathod Band
2.0 First Line: F - Fairchild Logo
3.0 Second Line: Device name - For 1Nxx series: 3
rd
to 5th characters of the device name.
For BZxx series: 4
th
to 6
th
characters of the device name.
4.0 Third Line: Device name - For 1Nxx series: 6
th
to 7
th
characters of the device name.
For BZXyy series: Voltage rating
5.0 Fourth Line: XY or XYL - Two Digit - Six Weeks Date Code
Where: X represents the last digit of the calendar year
Y represents the Six weeks numeric code
L represents the Large die identification
6.0 Devices shall be marked as required in the device specification (PID or FSC Test Spec).
7.0 Maximum no. of marking lines: 4
8.0 Maximum no. of digits per line: 3
9.0 FSC logo must be 20 % taller than the alphanumeric marking and should occupy the 2 characters of the specified line.
10.0 Marking Font: Arial (Except FSC Logo)
11.0 First character of each marking line must be aligned vertically
F
522
9B
XY
1
st
line: F - Fairchild Logo
2
nd
line: Device Name - 3
rd
to 5
th
characters of the device name.
or 4
th
to 6
th
characters for BZXyy series
3
rd
line: Device Name - 6
th
to 7
th
characters of the device name.
or Voltage rating for BZXyy series
4
th
line: Device Code or - Two Digit - Six Weeks Date Code.
Date code plus or Two Digit - Six Weeks Date Code
Large die identification plus Large die identification, "L"
DISCLAIMER
FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO ANY
PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION OR DESIGN. FAIRCHILD DOES NOT ASSUME ANY LIABILITY
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not intended to be an exhaustive list of all such trademarks.
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DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR CORPORATION.
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reasonably expected to result in significant injury to the
user.
2. A critical component is any component of a life
support device or system whose failure to perform can
be reasonably expected to cause the failure of the life
support device or system, or to affect its safety or
effectiveness.
PRODUCT STATUS DEFINITIONS
Definition of Terms
Datasheet Identification
Product Status
Definition
Advance Information
Preliminary
No Identification Needed
Obsolete
This datasheet contains the design specifications for
product development. Specifications may change in
any manner without notice.
This datasheet contains preliminary data, and
supplementary data will be published at a later date.
Fairchild Semiconductor reserves the right to make
changes at any time without notice in order to improve
design.
This datasheet contains final specifications. Fairchild
Semiconductor reserves the right to make changes at
any time without notice in order to improve design.
This datasheet contains specifications on a product
that has been discontinued by Fairchild semiconductor.
The datasheet is printed for reference information only.
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In Design
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