May 2001
QFET
TM
FQP
50N06L
2001 Fairchild Semiconductor Corporation
Rev. A1. May 2001
FQP50N06L
60V LOGIC N-Channel MOSFET
General Description
These N-Channel enhancement mode power field effect
transistors are produced using Fairchild's proprietary,
planar stripe, DMOS technology.
This advanced technology has been especially tailored to
minimize on-state resistance, provide superior switching
performance, and withstand high energy pulse in the
avalanche and commutation mode. These devices are well
suited for low voltage applications such as automotive, DC/
DC converters, and high efficiency switching for power
management in portable and battery operated products.
Features
52.4A, 60V, R
DS(on)
= 0.021
@V
GS
= 10 V
Low gate charge ( typical 24.5 nC)
Low Crss ( typical 90 pF)
Fast switching
100% avalanche tested
Improved dv/dt capability
175
C maximum junction temperature rating
Absolute Maximum Ratings
T
C
= 25C unless otherwise noted
Thermal Characteristics
Symbol
Parameter
FQP50N06L
Units
V
DSS
Drain-Source Voltage
60
V
I
D
Drain Current
- Continuous (T
C
= 25C)
52.4
A
- Continuous (T
C
= 100C)
37.1
A
I
DM
Drain Current
- Pulsed
(Note 1)
210
A
V
GSS
Gate-Source Voltage
20
V
E
AS
Single Pulsed Avalanche Energy
(Note 2)
990
mJ
I
AR
Avalanche Current
(Note 1)
52.4
A
E
AR
Repetitive Avalanche Energy
(Note 1)
12.1
mJ
dv/dt
Peak Diode Recovery dv/dt
(Note 3)
7.0
V/ns
P
D
Power Dissipation (T
C
= 25C)
121
W
- Derate above 25C
0.81
W/C
T
J
, T
STG
Operating and Storage Temperature Range
-55 to +175
C
T
L
Maximum lead temperature for soldering purposes,
1/8
"
from case for 5 seconds
300
C
Symbol
Parameter
Typ
Max
Units
R
JC
Thermal Resistance, Junction-to-Case
--
1.24
C
/
W
R
CS
Thermal Resistance, Case-to-Sink
0.5
--
C
/
W
R
JA
Thermal Resistance, Junction-to-Ambient
--
62.5
C
/
W
! "
!
!
!
"
"
"
! "
!
!
!
"
"
"
S
D
G
TO-220
FQP Series
G
S
D
FQP
50N06L
Rev. A1. May 2001
2001 Fairchild Semiconductor Corporation
Electrical Characteristics
T
C
= 25C unless otherwise noted
Notes:
1. Repetitive Rating : Pulse width limited by maximum junction temperature
2. L = 300
H, I
AS
= 52.4A, V
DD
= 25V, R
G
= 25
,
Starting T
J
= 25C
3. I
SD
52.4A, di/dt
300A/
s, V
DD
BV
DSS,
Starting T
J
= 25C
4. Pulse Test : Pulse width
300
s, Duty cycle
2%
5. Essentially independent of operating temperature
Symbol
Parameter
Test Conditions
Min
Typ
Max
Units
Off Characteristics
BV
DSS
Drain-Source Breakdown Voltage
V
GS
= 0 V, I
D
= 250
A
60
--
--
V
BV
DSS
/
T
J
Breakdown Voltage Temperature
Coefficient
I
D
= 250
A, Referenced to 25C
--
0.06
--
V/C
I
DSS
Zero Gate Voltage Drain Current
V
DS
= 60 V, V
GS
= 0 V
--
--
1
A
V
DS
= 48 V, T
C
= 150C
--
--
10
A
I
GSSF
Gate-Body Leakage Current, Forward
V
GS
= 20 V, V
DS
= 0 V
--
--
100
nA
I
GSSR
Gate-Body Leakage Current, Reverse
V
GS
= -20 V, V
DS
= 0 V
--
--
-100
nA
On Characteristics
V
GS(th)
Gate Threshold Voltage
V
DS
= V
GS
, I
D
= 250
A
1.0
--
2.5
V
R
DS(on)
Static Drain-Source
On-Resistance
V
GS
= 10 V, I
D
= 26.2 A
V
GS
= 5 V, I
D
=26.2 A
--
--
0.017
0.020
0.021
0.025
g
FS
Forward Transconductance
V
DS
= 25 V, I
D
= 26.2 A
--
40
--
S
Dynamic Characteristics
C
iss
Input Capacitance
V
DS
= 25 V, V
GS
= 0 V,
f = 1.0 MHz
--
1250
1630
pF
C
oss
Output Capacitance
--
445
580
pF
C
rss
Reverse Transfer Capacitance
--
90
120
pF
Switching Characteristics
t
d(on)
Turn-On Delay Time
V
DD
= 30 V, I
D
= 26.2 A,
R
G
= 25
--
20
50
ns
t
r
Turn-On Rise Time
--
380
770
ns
t
d(off)
Turn-Off Delay Time
--
80
170
ns
t
f
Turn-Off Fall Time
--
145
300
ns
Q
g
Total Gate Charge
V
DS
= 48 V, I
D
= 52.4 A,
V
GS
= 5 V
--
24.5
32
nC
Q
gs
Gate-Source Charge
--
6
--
nC
Q
gd
Gate-Drain Charge
--
14.5
--
nC
Drain-Source Diode Characteristics and Maximum Ratings
I
S
Maximum Continuous Drain-Source Diode Forward Current
--
--
52.4
A
I
SM
Maximum Pulsed Drain-Source Diode Forward Current
--
--
210
A
V
SD
Drain-Source Diode Forward Voltage
V
GS
= 0 V, I
S
= 52.4 A
--
--
1.5
V
t
rr
Reverse Recovery Time
V
GS
= 0 V, I
S
= 52.4 A,
dI
F
/ dt = 100 A/
s
--
65
--
ns
Q
rr
Reverse Recovery Charge
--
125
--
nC
(Note 4)
(Note 4, 5)
(Note 4, 5)
(Note 4)
FQP
50N06L
2001 Fairchild Semiconductor Corporation
Rev. A1. May 2001
0
10
20
30
40
50
0
2
4
6
8
10
12
V
DS
= 30V
V
DS
= 48V
Note : I
D
= 52.4A
V
GS
,
Gat
e
-
S
our
c
e
Vol
t
age
[
V
]
Q
G
, Total Gate Charge [nC]
10
-1
10
0
10
1
0
1000
2000
3000
4000
C
iss
= C
gs
+ C
gd
(C
ds
= shorted)
C
oss
= C
ds
+ C
gd
C
rss
= C
gd
Notes :
1. V
GS
= 0 V
2. f = 1 MHz
C
rss
C
oss
C
iss
C
a
p
a
c
i
t
a
nc
e [
p
F]
V
DS
, Drain-Source Voltage [V]
0.2
0.4
0.6
0.8
1.0
1.2
1.4
1.6
10
0
10
1
10
2
175
Notes :
1. V
GS
= 0V
2. 250
s Pulse Test
25
I
DR
,
Re
v
e
r
s
e
Dr
a
i
n
Cu
r
r
e
n
t
[
A
]
V
SD
, Source-Drain voltage [V]
0
25
50
75
100
125
150
175
200
0
10
20
30
40
50
60
V
GS
= 10V
V
GS
= 5V
Note : T
J
= 25
R
DS
(O
N)
[m
],
Dr
ai
n
-
S
o
ur
c
e
On-
R
es
i
s
t
a
nc
e
I
D
, Drain Current [A]
0
2
4
6
8
10
10
0
10
1
10
2
175
25
-55
Notes :
1. V
DS
= 25V
2. 250
s Pulse Test
I
D
,
D
r
a
i
n
C
u
r
r
ent
[
A
]
V
GS
, Gate-Source Voltage [V]
10
-1
10
0
10
1
10
0
10
1
10
2
V
GS
Top : 10.0 V
8.0 V
6.0 V
5.0 V
4.5 V
4.0 V
3.5 V
Bottom : 3.0 V
Notes :
1. 250
s Pulse Test
2. T
C
= 25
I
D
,
Dr
a
i
n
Cu
r
r
e
n
t
[
A
]
V
DS
, Drain-Source Voltage [V]
Typical Characteristics
Figure 5. Capacitance Characteristics
Figure 6. Gate Charge Characteristics
Figure 3. On-Resistance Variation vs.
Drain Current and Gate Voltage
Figure 4. Body Diode Forward Voltage
Variation vs. Source Current
and Temperature
Figure 2. Transfer Characteristics
Figure 1. On-Region Characteristics
FQP
50N06L
2001 Fairchild Semiconductor Corporation
Rev. A1. May 2001
1 0
- 5
1 0
- 4
1 0
- 3
1 0
- 2
1 0
- 1
1 0
0
1 0
1
1 0
- 2
1 0
- 1
1 0
0
N o t e s :
1 . Z
J C
( t ) = 1 . 2 4
/W M a x .
2 . D u t y F a c t o r , D = t
1
/t
2
3 . T
J M
- T
C
= P
D M
* Z
J C
( t )
s i n g l e p u l s e
D = 0 . 5
0 . 0 2
0 . 2
0 . 0 5
0 . 1
0 . 0 1
Z
JC
(
t
)
,
T
her
m
a
l
R
e
s
pons
e
t
1
, S q u a r e W a v e P u l s e D u r a t i o n [ s e c ]
25
50
75
100
125
150
175
0
10
20
30
40
50
60
I
D
,
Dr
ai
n Cu
r
r
e
n
t
[
A
]
T
C
, Case Temperature [
]
10
-1
10
0
10
1
10
2
10
0
10
1
10
2
10
3
DC
10 ms
1 ms
100
s
Operation in This Area
is Limited by R
DS(on)
Notes :
1. T
C
= 25
o
C
2. T
J
= 175
o
C
3. Single Pulse
I
D
,
Dr
ai
n
C
u
rr
ent
[
A
]
V
DS
, Drain-Source Voltage [V]
-100
-50
0
50
100
150
200
0.0
0.5
1.0
1.5
2.0
2.5
Notes :
1. V
GS
= 10 V
2. I
D
= 26.2 A
R
DS
(
O
N)
, (N
o
r
m
a
l
i
z
e
d
)
D
r
ai
n-
S
o
ur
ce
O
n
-
R
esi
s
t
anc
e
T
J
, Junction Temperature [
o
C]
-100
-50
0
50
100
150
200
0.8
0.9
1.0
1.1
1.2
Notes :
1. V
GS
= 0 V
2. I
D
= 250
A
BV
DS
S
,
(
N
or
m
a
l
i
z
e
d)
D
r
ai
n-
S
o
u
r
c
e
B
r
eak
dow
n V
o
l
t
age
T
J
, Junction Temperature [
o
C]
Typical Characteristics
(Continued)
Figure 9. Maximum Safe Operating Area
Figure 10. Maximum Drain Current
vs. Case Temperature
Figure 7. Breakdown Voltage Variation
vs. Temperature
Figure 8. On-Resistance Variation
vs. Temperature
Figure 11. Transient Thermal Response Curve
t
1
P
DM
t
2
FQP
50N06L
2001 Fairchild Semiconductor Corporation
Rev. A1. May 2001
Gate Charge Test Circuit & Waveform
Resistive Switching Test Circuit & Waveforms
Unclamped Inductive Switching Test Circuit & Waveforms
Charge
V
GS
5V
Q
g
Q
gs
Q
gd
3mA
V
GS
DUT
V
DS
300nF
50K
200nF
12V
Same Type
as DUT
Charge
V
GS
5V
Q
g
Q
gs
Q
gd
3mA
V
GS
DUT
V
DS
300nF
50K
200nF
12V
Same Type
as DUT
V
GS
V
DS
10%
90%
t
d(on)
t
r
t
on
t
off
t
d(off)
t
f
V
DD
5V
V
DS
R
L
DUT
R
G
V
GS
V
GS
V
DS
10%
90%
t
d(on)
t
r
t
on
t
off
t
d(off)
t
f
V
DD
5V
V
DS
R
L
DUT
R
G
V
GS
E
AS
=
L I
AS
2
----
2
1
--------------------
BV
DSS
- V
DD
BV
DSS
V
DD
V
DS
BV
DSS
t
p
V
DD
I
AS
V
DS
(t)
I
D
(t)
Time
10V
DUT
R
G
L
I
D
t
p
E
AS
=
L I
AS
2
----
2
1
E
AS
=
L I
AS
2
----
2
1
----
2
1
--------------------
BV
DSS
- V
DD
BV
DSS
V
DD
V
DS
BV
DSS
t
p
V
DD
I
AS
V
DS
(t)
I
D
(t)
Time
10V
DUT
R
G
L
L
I
D
I
D
t
p
FQP
50N06L
2001 Fairchild Semiconductor Corporation
Rev. A1. May 2001
Peak Diode Recovery dv/dt Test Circuit & Waveforms
DUT
V
DS
+
_
Driver
R
G
Same Type
as DUT
V
GS
dv/dt controlled by R
G
I
SD
controlled by pulse period
V
DD
L
I
SD
10V
V
GS
( Driver )
I
SD
( DUT )
V
DS
( DUT )
V
DD
Body Diode
Forward Voltage Drop
V
SD
I
FM
, Body Diode Forward Current
Body Diode Reverse Current
I
RM
Body Diode Recovery dv/dt
di/dt
D =
Gate Pulse Width
Gate Pulse Period
--------------------------
DUT
V
DS
+
_
Driver
R
G
Same Type
as DUT
V
GS
dv/dt controlled by R
G
I
SD
controlled by pulse period
V
DD
L
L
I
SD
10V
V
GS
( Driver )
I
SD
( DUT )
V
DS
( DUT )
V
DD
Body Diode
Forward Voltage Drop
V
SD
I
FM
, Body Diode Forward Current
Body Diode Reverse Current
I
RM
Body Diode Recovery dv/dt
di/dt
D =
Gate Pulse Width
Gate Pulse Period
--------------------------
D =
Gate Pulse Width
Gate Pulse Period
--------------------------
FQP
50N06L
2001 Fairchild Semiconductor Corporation
Rev. A1. May 2001
Package Dimensions
4.50
0.20
9.90
0.20
1.52
0.10
0.80
0.10
2.40
0.20
10.00
0.20
1.27
0.10
3.60
0.10
(8.70)
2.80
0.10
15.90
0.20
10.08
0.30
18.95MAX.
(1.70)
(3.70)
(3.00)
(1.46)
(1.00)
(45
)
9.20
0.20
13.08
0.20
1.30
0.10
1.30
+0.10
0.05
0.50
+0.10
0.05
2.54TYP
[2.54
0.20
]
2.54TYP
[2.54
0.20
]
TO-220
2001 Fairchild Semiconductor Corporation
Rev. H2
TRADEMARKS
The following are registered and unregistered trademarks Fairchild Semiconductor owns or is authorized to use and is not
intended to be an exhaustive list of all such trademarks.
DISCLAIMER
FAIRCHILD SEMICONDUCTOR RESERVES THE RIGHT TO MAKE CHANGES WITHOUT FURTHER NOTICE TO ANY
PRODUCTS HEREIN TO IMPROVE RELIABILITY, FUNCTION OR DESIGN. FAIRCHILD DOES NOT ASSUME ANY
LIABILITY ARISING OUT OF THE APPLICATION OR USE OF ANY PRODUCT OR CIRCUIT DESCRIBED HEREIN;
NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT RIGHTS, NOR THE RIGHTS OF OTHERS.
LIFE SUPPORT POLICY
FAIRCHILD'S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT
DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF FAIRCHILD SEMICONDUCTOR
CORPORATION.
As used herein:
1. Life support devices or systems are devices or systems
which, (a) are intended for surgical implant into the body,
or (b) support or sustain life, or (c) whose failure to perform
when properly used in accordance with instructions for use
provided in the labeling, can be reasonably expected to
result in significant injury to the user.
2. A critical component is any component of a life support
device or system whose failure to perform can be
reasonably expected to cause the failure of the life support
device or system, or to affect its safety or effectiveness.
PRODUCT STATUS DEFINITIONS
Definition of Terms
Datasheet Identification
Product Status
Definition
Advance Information
Formative or In
Design
This datasheet contains the design specifications for
product development. Specifications may change in
any manner without notice.
Preliminary
First Production
This datasheet contains preliminary data, and
supplementary data will be published at a later date.
Fairchild Semiconductor reserves the right to make
changes at any time without notice in order to improve
design.
No Identification Needed
Full Production
This datasheet contains final specifications. Fairchild
Semiconductor reserves the right to make changes at
any time without notice in order to improve design.
Obsolete
Not In Production
This datasheet contains specifications on a product
that has been discontinued by Fairchild semiconductor.
The datasheet is printed for reference information only.
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