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Электронный компонент: HDD16M72D9W-10A

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HANBit HDD16M72D9W
URL : www.hbe.co.kr 1 HANBit Electronics Co.,Ltd.
REV 1.0 (November.2002)


GENERAL DESCRIPTION
The HDD16M72D9W is a 64M x 72 bit Double Data Rate(DDR) Synchronous Dynamic RAM high-density memory
module. The module consists of nine CMOS 16M x 8 bit with 4banks DDR SDRAMs in 66pin TSOP-II 400mil packages and
2K EEPROM in 8-pin TSSOP package on a 184-pin glass-epoxy. Four 0.1uF decoupling capacitors are mounted on the
printed circuit board in parallel for each DDR SDRAM. The HDD16M72D9W is a DIMM(Dual in line Memory
Module) .Synchronous design allows precise cycle control with the use of system clock. Data I/O transactions are possible
on both edges of DQS. Range of operating frequencies, programmable latencies and burst lengths allows the same device
to be useful for a variety of high bandwidth, high performance memory system applications. All module components may be
powered from a single 2.5V DC power supply and all inputs and outputs are SSTL_2 compatible.
FEATURES
Part Identification
HDD16M72D9W
10A : 100MHz (CL=2)
HDD16M72D9W
13A : 133MHz (CL=2)
HDD16M72D9W
13B : 133MHz (CL=2.5)
Power supply : V
DD
: 2.5V
0.2V, V
DDQ
: 2.5V
0.2V
Double-data-rate architecture; two data transfers per clock cycle
Bidirectional data strobe(DQS)
Differential clock inputs(CK and CK)
DLL aligns DQ and DQS transition with CK transition
Programmable Read latency 2, 2.5 (clock)
Programmable Burst length (2, 4, 8)
Programmable Burst type (sequential & interleave)
Edge aligned data output, center aligned data input
Auto & Self refresh, 15.6us refresh interval (4K/64ms refresh)
Serial presence detect with EEPROM
PCB : Height 1200 mil, double sided component









DDR SDRAM Module 128Mbyte (16Mx72bit), based on 16Mx8, 4Banks
4K Ref., 184Pin-DIMM with Unbuffered ECC
Part No. HDD16M72D9W
HANBit HDD16M72D9W
URL : www.hbe.co.kr 2 HANBit Electronics Co.,Ltd.
REV 1.0 (November.2002)
PIN ASSIGNMENT
































*These pins should be NC in the system which does not support SPD
PIN
PIN DESCRIPTION
PIN
PIN DESCRIPTION
A0~A11
Address input
VDD
Power supply(2.5V)
BA0~BA1
Bank Select Address
VDDQ
Power supply for DQs(2.5V)
DQ0~DQ63
Data input/output
VREF
Power supply for reference
CB0~CB7
Check bit(Data input/output)
VSPD
Serial EEPROM Power supply(3.3)
DQS0~DQS7
Data Strobe input/output
VSS
Ground
DM0~DM7
Data-in Mask
SA0~SA2
Address in EEPROM
CK0~CK2,/CK0~/CK2
Clock input
SDA
Serial data I/O
CKE0
Clock enable input
SCL
Serial clock
/CS0
Chip Select input
WP
Write protection
/RAS
Row Address strobe
VDDIN
VDD identification flag
/CAS
Column Address strobe
NC
No connection
PIN
Front
PIN
Back
PIN
Frontl
PIN
Back
PIN
Front
PIN
Back
1
VREF
32
A5
62
V
DDQ
93
V
SS
124
V
SS
154
/RAS
2
DQ0
33
DQ24
63
/WE
94
DQ4
125
A6
155
DQ45
3
V
SS
34
V
SS
64
DQ41
95
DQ5
126
DQ28
156
V
DDQ
4
DQ1
35
DQ25
65
/CAS
96
V
DDQ
127
DQ29
157
/CS0
5
DQS0
36
DQS3
66
V
SS
97
DM0
128
V
DDQ
158
* /CS1
6
DQ2
37
A4
67
DQS5
98
DQ6
129
DM3
159
DM5
7
V
DD
38
V
DD
68
DQ42
99
DQ7
130
A3
160
V
SS
8
DQ3
39
DQ26
69
DQ43
100
V
SS
131
DQ30
161
DQ46
9
NC
40
DQ27
70
V
DD
101
NC
132
V
SS
162
DQ47
10
NC
41
A2
71
* /CS2
102
NC
133
DQ31
163
* /CS3
11
V
SS
42
V
SS
72
DQ48
103
NC
134
CB4
164
V
DDQ
12
DQ8
43
A1
73
DQ49
104
V
DDQ
135
CB5
165
DQ52
13
DQ9
44
CB0
74
V
SS
105
DQ12
136
V
DDQ
166
DQ53
14
DQS1
45
CB1
75
* CK2
106
DQ13
137
CK0
167
*A13
15
V
DDQ
46
V
DD
76
* /CK2
107
DM1
138
/CK0
168
V
DD
16
* CK1
47
DQS8
77
V
DDQ
108
V
DD
139
V
SS
169
DM6
17
* /CK1
48
A0
78
DQS6
109
DQ14
140
DM8
170
DQ54
18
V
SS
49
CB2
79
DQ50
110
DQ15
141
A10
171
DQ55
19
DQ10
50
V
SS
80
DQ51
111
CKE1
142
CB6
172
V
DDQ
20
DQ11
51
CB3
81
V
SS
112
V
DDQ
143
V
DDQ
173
NC
21
CKE0
52
BA1
82
VDDID
113
* BA2
144
CB7
174
DQ60
22
V
DDQ
KEY
83
DQ56
114
DQ20
KEY
175
DQ61
23
DQ16
53
DQ32
84
DQ57
115
*A12
145
V
SS
176
V
SS
24
DQ17
54
V
DDQ
85
V
DD
116
V
SS
146
DQ36
177
DM7
25
DQS2
55
DQ33
86
DQS7
117
DQ21
147
DQ37
178
DQ62
26
V
SS
56
DQS4
87
DQ58
118
A11
148
V
DD
179
DQ63
27
A9
57
DQ34
88
DQ59
119
DM2
149
DM4
180
V
DDQ
28
DQ18
58
V
SS
89
V
SS
120
V
DD
150
DQ38
181
SA0
29
A7
59
BA0
90
NC
121
DQ22
151
DQ39
182
SA1
30
V
DDQ
60
DQ35
91
SDA
122
A8
152
V
SS
183
SA2
31
DQ19
61
DQ40
92
SCL
123
DQ23
153
DQ44
184
VDDSPD
HANBit HDD16M72D9W
URL : www.hbe.co.kr 3 HANBit Electronics Co.,Ltd.
REV 1.0 (November.2002)
FUNCTIONAL BLOCK DIAGRAM

HANBit HDD16M72D9W
URL : www.hbe.co.kr 4 HANBit Electronics Co.,Ltd.
REV 1.0 (November.2002)
PIN FUNCTION DESCRIPTION
Pin
Name
Input Function
CK, /CK
Clock
CK and /CK are differential clock inputs. All address and control input signals are
sampled on the positive edge of CK and negative edge of CK. Output (read) data
is referenced to both edges of CK. Internal clock signals are derived from CK/CK.
CKE
Clock Enable
CKE HIGH activates, and CKE LOW deactivates internal clock signals, and
device input buffers and output drivers. Deactivating the clock provides
PRECHARGE
POWER-DOWN and SELF REFRESH operation (all banks idle), or ACTIVE
POWER-DOWN(row ACTIVE in any bank). CKE is synchronous for all functions
except for disabling outputs, which is achieved asynchronously. Input buffers,
excluding CK, CK and CKE are disabled during power-down and self refresh
modes, providing low standby power. CKE will recognizean LVCMOS LOW level
prior to VREF being stable on power-up.
/CS
Chip Select
/CS enables(registered LOW) and disables(registered HIGH) the command
decoder.
All commands are masked when /CS is registered HIGH. /CS provides for external
bank selection on systems with multiple banks. /CS is considered part of the
command code.
A0 ~ A11
Address
Addresses are multiplexed on the same pins. Address : A0 ~ A11
BA0 ~ BA1 Bank select address
BA0 and BA1 define to which bank an ACTIVE, READ, WRITE or PRE-CHARGE
command is being applied.
/RAS
Row address strobe
Latches row addresses on the positive going edge of the CLK with /RAS low.
Enables row access & precharge.
/CAS
Columnaddress strobe
Latches column addresses on the positive going edge of the CLK with /CAS low.
Enables column access.
/WE
Write enable
Enables write operation and row precharge.
Latches data in starting from /CAS, /WE active.
DQS0 ~ 7
Data Strobe
Output with read data, input with write data. Edge-aligned with read data, cen-
tered in write data. Used to capture write data.
DM0~7
Input Data Mask
DM is an input mask signal for write data. Input data is masked when DM is
sampled HIGH along with that input data during a WRITE access. DM is sampled
on both edges of DQS. DM pins include dummy loading internally, to matches the
DQ and DQS load-ing.
DQ0 ~ 63
Data input/output
Data inputs/outputs are multiplexed on the same pins.
WP
Write Protection
WP pin is connected to Vcc.
When WP is
"
high
"
, EEPROM Programming will be inhibited and the entire
memory will be write-protected.
VDDQ
Supply
DQ Power Supply : +2.5V
0.2V.
VDD
Supply
Power Supply : +2.5V
0.2V (device specific).
VSS
Supply
DQ Ground.
VREF
Supply
SSTL_2 reference voltage.
HANBit HDD16M72D9W
URL : www.hbe.co.kr 5 HANBit Electronics Co.,Ltd.
REV 1.0 (November.2002)
ABSOLUTE MAXIMUM RATINGS
PARAMETER
SYMBOL
RATING
UNTE
Voltage on any pin relative to Vss
V
IN
, V
OUT
-0.5 ~ 3.6
V
Voltage on V
DD
supply relative to Vss
V
DD
-1.0 ~ 3.6
V
Voltage on V
DDQ
supply relative to Vss
V
DDQ
-0.5 ~ 3.6
V
Storage temperature
T
STG
-55 ~ +150
C
Power dissipation
P
D
13.5
W
Short circuit current
I
OS
50
mA
Notes:
Permanent device damage may occur if ABSOLUTE MAXIMUM RATINGS are exceeded.
Functional operation should be restricted to recommended operating condition.
Exposure to higher than recommended voltage for extended periods of time could affect device reliability.
POWER & DC OPERATING CONDITIONS
(Recommended operating conditions (Voltage referenced to Vss = 0V, T
A
= 0 to 70
C) )
PARAMETER
SYMBOL
MIN
MAX
UNIT
NOTE
Supply Voltage
V
DD
2.3
2.7
V
I/O Supply Voltage
V
DDQ
2.3
2.7
V
I/O Reference Voltage
V
REF
V
DDQ
/2-50mV
V
DDQ
/2+50mV
V
1
I/O Termination Voltage(system)
V
TT
V
REF
0.04
V
REF
+ 0.04
V
2
Input High Voltage
V
IH
(DC)
V
REF
+ 0.15
V
REF
+ 0.3
V
Input Low Voltage
V
IL
(DC)
-0.3
V
REF
- 0.15
V
Input Voltage Level, CK and /CK inputs
V
IN
(DC)
-0.3
V
DDQ
+ 0.3
V
Input Differential Voltage, CK and /CK inputs
V
ID
(DC)
0.3
V
DDQ
+ 0.6
V
Input leakage current
I
LI
-2
2
uA
3
Output leakage current
I
OZ
-5
5
uA
Output High current (V
OUT
= 1.95V)
I
OH
-16.8
mA
Output Low current (V
OUT
= 0.35V)
I
OL
16.8
mA
Output High Current(Half strengh driver)
I
OH
-9
mA
Output High Current(Half strengh driver)
I
OL
9
mA
Notes
1. Includes
25mV margin for DC offset on
V
REF
, and a combined total of
50mV margin for all AC noise and DC offset on
V
REF
,
bandwidth limited to 20MHz. The DRAM must accommodate DRAM current spikes on
V
REF
and internal DRAM noise coupled
TO
V
REF
, both of which may result in
V
REF
noise.
V
REF
should be de-coupled with an inductance of
3nH.
2. V
TT
is not applied directly to the device. V
TT
is a system supply for signal termination resistors, is expected to be set equal to
V
REF
, and must track variations in the DC le vel of
V
REF
3. V
ID
is the magnitude of the difference between the input level on CK and the input level on CK.
4. These parameters should be tested at the pin on actual components and may be checked at either the pin or the pad in
simulation. The AC and DC input specifications are relative to a
V
REF
envelop that has been bandwidth limited to 200MHZ.
5. The value of V
IX
is expected to equal 0.5*V
DDQ
of the transmitting device and must track variations in the dc level of the same.
6. These charactericteristics obey the SSTL-2 class II standards.
HANBit HDD16M72D9W
URL : www.hbe.co.kr 6 HANBit Electronics Co.,Ltd.
REV 1.0 (November.2002)
INPUT/OUTPUT Capacitance (V
DD
= 2.5V, V
DDQ
= 2.5V, T
A
= 25
C, F = 1MHZ)
DESCRIPTION
SYMBOL
MIN
MAX
UNITS
Input Capacitance(A0
~ A12, BA0
~ BA1,RAS,CAS, WE )
C
IN1
49
57
pF
Input Capacitance(CKE0)
C
IN2
42
50
pF
Input Capacitance( CS0)
C
IN3
42
50
pF
Input Capacitance( CLK0, CLK
1
,CLK
2
)
C
IN4
22
25
pF
Data & DQS input/output Capacitance(DQ0~DQ63)
C
OUT1
6
8
pF
Input Capacitance(DM0~DM8)
C
IN5
6
8
pF



AC Operating Conditions
PARAMETER/ Condition
STMBOL
MIN
MAX
UNIT
NOTE
Input High (Logic 1) Voltage, DQ, DQS and DM signals
V
IH
(AC)
V
REF
+ 0.31
3
Input Low (Logic 0) Voltage, DQ, DQS and DM signals.
V
IL
(AC)
V
REF
- 0.31
V
3
Input Differential Voltage, CK and CK inputs
V
ID
(AC)
0.7
V
DDQ
+0.6
V
1
Input Crossing Point Voltage, CK and CK inputs
V
IX
(AC)
0.5*V
DDQ
-0.2
0.5*V
DDQ
+0.2
V
2
Note 1. V
ID
is the magnitude of the difference between the input level on CK and the input on CK.
2. The value of V
IX
is expected to equal 0.5* V
DDQ
of the transmitting device and must track variations in the DC level of the same.
3. These parameters should be tested at the pim on actual components and may be checked at either the pin or the pad in simulation.
the AC and DC input specificatims are refation to a V
REF
envelope that has been bandwidth limited 20MHz.


AC Operating TEST Conditions
PARAMETER
VALUE
UNIT
NOTE
Input reference voltage for Clock
0.5 * V
DDQ
V
Input signal maximum peak swing
1.5
V
Input signal minimum slew rate
0.5
V/ns
Input Levels(V
IH
/V
IL
)
V
REF
+0.31/V
REF
-0.31
V
Input timing measurement reference level
V
REF
V
Output timing measurement reference level
V
TT
V
Output load condition
See Load Circuit
V





HANBit HDD16M72D9W
URL : www.hbe.co.kr 7 HANBit Electronics Co.,Ltd.
REV 1.0 (November.2002)

AC Timming Parameters & Specifications
(These AC charicteristics were tested on the Component)
DDR200
DDR266A
DDR266B
-10A
-13A
-13B
PARAMETER
SYMBOL
MIN MAX
MIN
MAX
MIN
MAX
UNIT
NOTE
Row cycle time
t
RC
70
65
65
ns
1
Refresh row cycle time
t
RFC
80
75
75
ns
1,2
Row active time
t
RAS
48
120K
45
120K
45
120K
ns
1,2
/RAS to /CAS delay
t
RCD
20
20
20
ns
3
Row precharge time
t
RP
20
20
20
ns
3
Row active to Row active delay
t
RRD
15
15
15
ns
3
Write recovery time
t
WR
15
15
15
t
CK
3
Last data in to Read command
t
CDLR
1
1
1
t
CK
2
Col. address to Col. address delay
t
CCD
1
1
1
t
CK
CL=2.0
10
12
7.5
12
10
12
ns
Clock cycle time
CL=2.5
t
CK
12
7.5
12
7.5
12
ns
Clock high level width
t
CH
0.45
0.55
0.45
0.55
0.45
0.55
t
CK
Clock low level width
t
CL
0.45
0.55
0.45
0.55
0.45
0.55
t
CK
DQS-out access time from CK/CK
t
DQSCK
-0.8
+0.8
-0.75
+0.75
-0.75
+0.75
ns
Output data access time from CK/CK
t
AC
-0.8
+0.8
-0.75
+0.75
-0.75
+0.75
ns
Data strobe edge to ouput data edge
t
DQSQ
-
+0.6
-
+0.5
-
+0.5
ns
Read Preamble
t
RPRE
0.9
1.1
0.9
1.1
0.9
1.1
t
CK
Read Postamble
t
RPST
0.4
0.6
0.4
0.6
0.4
0.6
t
CK
Data out high impedence time from CK-/CK
t
HZQ
-0.8
+0.8
-0.75
+0.75
-0.75
+0.75
ns
2
CK to valid DQS-in
t
DQSS
0.75
1.25
0.75
1.25
0.75
1.25
t
CK
DQS-in setup time
t
WPRES
0
0
0
ns
3
DQS-in hold time
t
WPREH
0.25
0.25
0.25
t
CK
DQS-in falling edge to CK rising-setup time
t
DSS
0.2
0.2
0.2
t
CK
DQS-in falling edge to CK rising hold time
t
DSH
0.2
0.2
0.2
t
CK
DQS-in high level width
t
DQSH
0.35
0.35
0.35
t
CK
DQS-in low level width
t
DQSL
0.35
0.35
0.35
t
CK
DQS-in cycle time
t
DSC
0.9
1.1
0.9
1.1
0.9
1.1
t
CK
Address and Control Input setup time
t
IS
1.1
0.9
0.9
ns
Address and Control Input hold time
t
IH
1.1
0.9
0.9
ns
Mode register set cycle time
t
MRD
16
15
15
ns
DQ & DM setup time to DQS
t
DS
0.6
0.5
0.5
ns
DQ & DM hold time to DQS
t
DH
0.6
0.5
0.5
ns
DQ & DM input pulse width
t
DIPW
2
1.75
1.75
ns
Power down exit time
t
PDEX
10
7.5
7.5
ns
Exit self refresh to write command
t
XSW
116
95
ns
Exit self refresh to bank active command
t
XSA
80
75
75
ns
Exit self refresh to read command
t
XSR
200
200
200
Cycle
Refresh interval time
t
REF
15.6
15.6
15.6
us
1
Output DQS valid window
t
QH
-
-
-
-
-
-
t
CK
DQS write postamble time
t
WPST
0.4
0.6
0.4
0.6
0.4
0.6
t
CK
4
HANBit HDD16M72D9W
URL : www.hbe.co.kr 8 HANBit Electronics Co.,Ltd.
REV 1.0 (November.2002)
Notes :
1.
Maximum burst refresh cycle : 8

2.
The specific requirement is that DQS be valid(High or Low) on or before this CK edge. The case shown(DQS going from High_Z
to logic Low) applies when no writes were previously in progress on the bus. If a pre vious write was in progress, DQS could be
High at this time, depending on t
DQSS
.

3.
The maximum limit for this parameter is not a device limit. The device will operate with a great value for this parameter, but
system performance (bus turnaround) will degrade accordingly.

4.
A write command can be applied with t
RCD
satisfied after this command.

5.
For registered DIMMs, t
CL
and t
CH
are
45% of the period including both the half period jitter (t
JIT
(HP) ) of the PLL and the half
jitter due to crosstalk (t
JIT
(crosstalk) ) on the DIMM.
6.
Input Setup/Hold Slew Rate Derating
Input Setup/Hold Slew Rate
t
IS
t
IH
(V/ns)
(ps)
(ps)
0.5
0
0
0.4
+50
+50
0.3
+100
+100
-
This derating table is used to increase t
DS
/t
DH
in the case where the input slew rate is below 0.5V/ns. Input setup/hold slew rate
based on the lesser of AC-AC slew rate and DC-DC slew rate.
7.
I/O Setup/Hold Slew Rate Derating
Input Setup/Hold Slew Rate
t
IS
t
IH
(V/ns)
(ps)
(ps)
0.5
0
0
0.4
+75
+75
0.3
+150
+150
-
This derating table is used to increase t
DS
/t
DH
in the case where the I/O slew rate is below 0.5V/ns. I/O setup/hold slew rate based
on the lesser of AC-AC slew rate and DC-DC slew rate.
8.
I/O Setup/Hold Plateau Derating
I/O Input Level
t
DS
t
DH
(mV)
(ps)
(ps)
280
+50
+50
-
This derating table is used to increase t
DS
/t
DH
in the case where the input level is flat below V
REF
310mV for a duration of up to 2ns.
9.
I/O Delta Rise/Fall Rate(1/slew-rate) Derating
Delta Rise/Fall Rate
t
DS
t
DH
(ns/V)
(ps)
(ps)
0
0
0
0.25
+50
+50
0.5
+100
+100
-
This derating table is used to increase t
DS
/t
DH
in the case where the DQ and DQS slew rates differ. The Delta Rise/Fall Rate is
calated as 1/SlewRate1-1/SlewRate2. For example, if slew rate 1 = 5V/ns and slew rate 2 =.4V/ns then the Delta Rise/Fall Rate =-
0/5ns/V. Input S/H slew rate based on larger of AC-AC delta rise/fall rate and DC-DC delta rise/fall rate.
10. This parameter is fir system simulation purpose. It is guranteed by design.

11. For each of the terms, if not already an integer, round to the next highest integer. t
CK
is actual to the system clock cycle time.


HANBit HDD16M72D9W
URL : www.hbe.co.kr 9 HANBit Electronics Co.,Ltd.
REV 1.0 (November.2002)

COMMAND TRUTH TABLE
(V=Valid, X=Don
'
t Care, H=Logic High, L=Logic Low)
COMMAND
CK
E
n-1
CKE
n
/CS
/RAS
/CAS
/WE
DM
BA
0,1
A10/
AP
A11
A9~A0
NOTE
Register
Extended MRS
H
X
L
L
L
L
X
OP code
1,2
Register
Mode register set
H
X
L
L
L
L
X
OP code
1,2
Auto refresh
H
3
Entry
H
L
L
L
L
H
X
X
3
L
H
H
H
3
Refresh
Self
refresh
Exit
L
H
H
X
X
X
X
X
3
Bank active & Row Addr.
H
X
L
L
H
H
X
V
Row address
Auto precharge
disable
L
4
Read &
column
address
Auto precharge
eable
H
X
L
H
L
H
X
V
H
Column
Address
(A0 ~ A9)
4
Auto precharge
disable
H
L
4
Write &
column
address
Auto precharge
enable
H
X
L
H
L
L
X
V
H
Column
Address
(A0 ~ A9)
4,6
Burst Stop
H
X
L
H
H
L
X
X
7
Bank selection
V
L
Precharge
All banks
H
X
L
L
H
L
X
X
H
X
5
H
X
X
X
Entry
H
L
L
V
V
V
X
Clock suspend or
active power down
Exit
L
H
X
X
X
X
X
X
H
X
X
X
Entry
H
L
L
H
H
H
X
H
X
X
X
Precharge power
down mode
Exit
L
H
L
V
V
V
X
X
DM
H
X
V
X
8
H
X
X
X
No operation command
H
X
L
H
H
H
X
X
Note :
1.
OP Code : Operand Code. A0 ~ A12 & BA0 ~ BA1 : Program keys. (@EMRS/MRS)

2.
EMRS/ MRS can be issued only at all banks precharge state.
A new command can be issued 2 clock cycles after EMRS or MRS.
3.
Auto refresh functions are same as the CBR refresh of DRAM.
The automatical precharge without row precharge command is meant by "Auto".
Auto/self refresh can be issued only at all banks precharge state.

4.
BA0 ~ BA1 : Bank select addresses.
If both BA0 and BA1 are "Low" at read, write, row active and precharge, bank A is selected.
If BA0 is "High" and BA1 is "Low" at read, write, row active and precharge, bank B is selected.
If BA0 is "Low" and BA1 is "High" at read, write, row active and precharge, bank C is selected.
If both BA0 and BA1 are "High" at read, write, row active and precharge, bank D is select ed.
5.
If A10/AP is "High" at row precharge, BA0 and BA1 are ignored and all banks are selected.
6.
During burst write with auto precharge, new read/write command can not be issued.
Another bank read/write command can be issued after the end of burst.
New row active of the associated bank can be issued at tRP after the end of burst.
7.
Burst stop command is valid at every burst length.

8.
DM sampled at the rising and falling edges of the DQS and Data -in are masked at the both edges (Write DM latency is 0).

9.
This combination is not defined for any function, which means "No Operation(NOP)" in DDR SDRAM.
HANBit HDD16M72D9W
URL : www.hbe.co.kr 10 HANBit Electronics Co.,Ltd.
REV 1.0 (November.2002)

PACKAGE DIMENSIONS
Unit : mm
< Front
Side >
< Rear
Side >


133.35
0.20
HANBit HDD16M72D9W
URL : www.hbe.co.kr 11 HANBit Electronics Co.,Ltd.
REV 1.0 (November.2002)

ORDERING INFORMATION
Part Number
Density
Org.
Package
Ref.
Vcc
MODE
MAX.frq
HDD16M72D9W-10A
128MByte
16M x 72
184PIN
DIMM
4K
2.5V
DDR
100MHz/CL2
HDD16M72D9W-13A
128MByte
16M x 72
184PIN
DIMM
4K
2.5V
DDR
133MHz/CL2
HDD16M72D9W-13B
128MByte
16M x 72
184PIN
DIMM
4K
2.5V
DDR
133MHz/CL2.5