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Электронный компонент: HYMP532S64P6-E3

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This document is a general product description and is subject to change without notice. Hynix Semiconductor does not assume any
responsibility for use of circuits described. No patent licenses are implied.
Rev. 1.0 / Feb. 2005 1
200pin Unbuffered DDR2 SDRAM SO-DIMMs based on 512 Mb 1st ver.
This Hynix unbuffered Slim Outline Dual In-Line Memory Module(DIMM) series consists of 512Mb 1st ver. DDR2
SDRAMs in Fine Ball Grid Array(FBGA) packages on a 200pin glass-epoxy substrate. This Hynix 512Mb 1st ver. based
Unbuffered DDR2 SO-DIMM series provide a high performance 8 byte interface in 67.60mm width form factor of indus-
try standard. It is suitable for easy interchange and addition.
FEATURES
ORDERING INFORMATION
Part Name
Density
Organization
# of
DRAMs
# of
ranks
Materials
HYMP532S646-E3/C4
256MB
32Mx64
4
1
Leaded
HYMP564S648-E3/C4
512MB
64Mx64
8
1
Leaded
HYMP564S646-E3/C4
512MB
64Mx64
8
2
Leaded
HYMP112S64M8-E3/C4
1GB
128Mx64
16
2
Leaded
HYMP532S64P6-E3/C4
256MB
32Mx64
4
1
Lead free
HYMP564S64P8-E3/C4
512MB
64Mx64
8
1
Lead free
HYMP564S64P6-E3/C4
512MB
64Mx64
8
2
Lead free
HYMP112S64MP8-E3/C4
1GB
128Mx64
16
2
Lead free
JEDEC standard Double Data Rate2 Synchronous
DRAMs (DDR2 SDRAMs) with 1.8V +/- 0.1V Power
Supply
All inputs and outputs are compatible with SSTL_1.8
interface
Posted CAS
Programmable CAS Latency 3 ,4 ,5
OCD (Off-Chip Driver Impedance Adjustment) and
ODT (On-Die Termination)
Fully differential clock operations (CK & CK)
Programmable Burst Length 4 / 8 with both sequen-
tial and interleave mode
Auto refresh and self refresh supported
8192 refresh cycles / 64ms
Serial presence detect with EEPROM
DDR2 SDRAM Package: 60ball(x8), 84ball(x16)
FBGA
67.60 x 30.00 mm form factor
Lead-free Products are RoHS compliant
Rev. 1.0 / Feb. 2005
2
1
200pin Unbuffered DDR2 SDRAM SO-DIMMs
SPEED GRADE & KEY PARAMETERS
ADDRESS TABLE
E3 (DDR2-400)
C4 (DDR2-533)
Unit
Speed@CL3
400
400
Mbps
Speed@CL4
400
533
Mbps
Speed@CL5
-
-
Mbps
CL-tRCD-tRP
3-3-3
4-4-4
tCK
Density Organization Ranks
SDRAMs
# of
DRAMs
# of row/bank/column Address
Refresh
Method
256MB
32M x 64
1
32Mb x 16
4
13(A0~A12)/2(BA0~BA1)/10(A0~A9)
8K / 64ms
512MB
64M x 64
2
64Mb x 8
8
14(A0~A13)/2(BA0~BA1)/10(A0~A9)
8K / 64ms
512MB
64M x 64
1
32Mb x 16
8
13(A0~A12)/2(BA0~BA1)/10(A0~A9)
8K / 64ms
1GB
128M x 64
2
64Mb x 8
16
14(A0~A13)/2(BA0~BA1)/10(A0~A9)
8K / 64ms
Rev. 1.0 / Feb. 2005
3
1
200pin Unbuffered DDR2 SDRAM SO-DIMMs
PIN DESCRIPTION
Symbol
Type
Polarity
Pin Description
CK[1:0], CK[1:0]
Input
Cross
Point
The system clock inputs. All adress an commands lines are sampled on the cross point of
the rising edge of CK and falling edge of CK. A Delay Locked Loop(DLL) circuit is driven
from the clock inputs and output timing for read operations is synchronized to the input
clock.
CKE[1:0]
Input
Active
High
Activates the DDR2 SDRAM CK signal when high and deactivates the CK signal when low.
By deactivating the clocks, CKE low initiates the Power Down mode or the Self Refresh
mode.
S[1:0]
Input
Active
Low
Enables the associated DDR2 SDRAM command decoder when low and disables the com-
mand decoder when high. When the command decoder is disabled, new commands are
ignored but previous operations continue. Rank 0 is selected by S0; Rank 1 is selected by
S1
RAS, CAS, WE
Input
Active
Low
When sampled at the cross point of the rising edge of CK and falling edge of CK, CAS, RAS
and WE define the operation to be excecuted by the SDRAM.
BA[1:0]
Input
Selects which DDR2 SDRAM internal bank of four is activated.
ODT[1:0]
Input
Active
High
Asserts on-die termination for DQ, DM, DQS and DQS signals if enabled via the DDR2
SDRAM mode register.
A[9:0], A10/AP,
A[15:11]
Input
During a Bank Activate command cycle, difines the row address when sampled at the cross
point of the rising edge of CK and falling edge of CK. During a Read or Write command
cycle, defines the column address when sampled at the cross point of the rising edge of CK
and falling edge of CK. In addition to the column address, AP is used to invoke autopre-
charge operation at the end of the burst read or write cycle. If AP is high., autoprecharge
is selected and BA0-BAn defines the bank to be precharged. If AP is low, autoprecharge is
disabled. During a Precharge command cycle., AP is used in conjunction with BA0-BAn to
control which bank(s) to precharge. If AP is high, all banks will be precharged regardless
of the state of BA0-BAn inputs. If AP is low, then BA0-BAn are used to define which bank
to precharge.
DQ[63:0]
In/Out
Data Input/Output pins.
DM[7:0]
Input
Active
High
The data write masks, associated with one data byte. In Write mode, DM operates as a
byte mask by allowing input data to be written if it is low but blocks the write operation if
it is high. In Read mode, DM lines have no effect.
DQS[7:0], DQS[7:0] In/Out
Cross
point
The data strobe, associated with one data byte, sourced whit data transfers. In Write
mode, the data strobe is sourced by the controller and is centered in the data window. In
Read mode, the data strobe is sourced by the DDR2 SDRAMs and is sent at leading edge
of the data window. DQS signals are complements, and timing is relative to the crosspoint
of respective DQS and DQS. If the module is to be operated in single ended strobe mode,
all DQS signals must be tied on the system board to VSS and DDR2 SDRAM mode registers
programmed approriately.
V
DD
, V
DD
SPD,V
SS
Supply
Power supplies for core, I/O, Serial Presense Detect, and ground for the module.
SDA
In/Out
This is a bidirectional pin used to transfer data into or out of the SPD EEPROM. A resister
must be connected to V
DD t
o act as a pull up.
SCL
Input
This signals is used to clock data into and out of the SPD EEPROM. A resistor may be con-
nected from SCL to VDD to act as a pull up.
SA[1:0]
Input
Address pins used to select the Serial Presence Detect base address.
TEST
In/Out
The TEST pin is reserved for bus analysis tools and is not connected on normal memory
modules(SODIMMs).
Rev. 1.0 / Feb. 2005
4
1
200pin Unbuffered DDR2 SDRAM SO-DIMMs
PIN ASSIGNMENT
Pin Location
Pin
NO.
Front
Side
Pin
NO.
Back
Side
Pin
NO.
Front
Side
Pin
NO.
Back
Side
Pin
NO.
Front
Side
Pin
NO.
Back
Side
Pin
NO.
Front
Side
Pin
NO.
Back
Side
1
VREF
2
VSS
51
DQS2
52
DM2
101
A1
102
A0
151
DQ42
152
DQ46
3
VSS
4
DQ4
53
VSS
54
VSS
103
VDD
104
VDD
153
DQ43
154
DQ47
5
DQ0
6
DQ5
55
DQ18
56
DQ22
105
A10/AP
106
BA1
155
VSS
156
VSS
7
DQ1
8
VSS
57
DQ19
58
DQ23
107
BA0
108
RAS
157
DQ48
158
DQ52
9
VSS
10
DM0
59
VSS
60
VSS
109
WE
110
S0
159
DQ49
160
DQ53
11
DQS0
12
VSS
61
DQ24
62
DQ28
111
VDD
112
VDD
161
VSS
162
VSS
13
DQS0
14
DQ6
63
DQ25
64
DQ29
113
CAS
114
ODT0
163 NC,TEST 164
CK1
15
VSS
16
DQ7
65
VSS
66
VSS
115
NC/S1
116
A13
165
VSS
166
CK1
17
DQ2
18
VSS
67
DM3
68
DQS3
117
VDD
118
VDD
167
DQS6
168
VSS
19
DQ3
20
DQ12
69
NC
70
DQS3
119 NC/ODT1 120
NC
169
DQS6
170
DM6
21
VSS
22
DQ13
71
VSS
72
VSS
121
VSS
122
VSS
171
VSS
172
VSS
23
DQ8
24
VSS
73
DQ26
74
DQ30
123
DQ32
124
DQ36
173
DQ50
174
DQ54
25
DQ9
26
DM1
75
DQ27
76
DQ31
125
DQ33
126
DQ37
175
DQ51
176
DQ55
27
VSS
28
VSS
77
VSS
78
VSS
127
VSS
128
VSS
177
VSS
178
VSS
29
DQS1
30
CK0
79
CKE0
80
NC/CKE1 129
DQS4
130
DM4
179
DQ56
180
DQ60
31
DQS1
32
CK0
81
VDD
82
VDD
131
DQS4
132
VSS
181
DQ57
182
DQ61
33
VSS
34
VSS
83
NC
84
NC/A15 133
VSS
134
DQ38
183
VSS
184
VSS
35
DQ10
36
DQ14
85
BA2
86
NC/A14 135
DQ34
136
DQ39
185
DM7
186
DQS7
37
DQ11
38
DQ15
87
VDD
88
VDD
137
DQ35
138
VSS
187
VSS
188
DQS7
39
VSS
40
VSS
89
A12
90
A11
139
VSS
140
DQ44
189
DQ58
190
VSS
41
VSS
42
VSS
91
A9
92
A7
141
DQ40
142
DQ45
191
DQ59
192
DQ62
43
DQ16
44
DQ20
93
A8
94
A6
143
DQ41
144
VSS
193
VSS
194
DQ63
45
DQ17
46
DQ21
95
VDD
96
VDD
145
VSS
146
DQS5
195
SDA
196
VSS
47
VSS
48
VSS
97
A5
98
A4
147
DM5
148
DQS5
197
SCL
198
SA0
49
DQS2
50
NC
99
A3
100
A2
149
VSS
150
VSS
199
VDDSPD 200
SA1
Front
Back
1
39 41
199
2
40
200
42
Rev. 1.0 / Feb. 2005
5
1
200pin Unbuffered DDR2 SDRAM SO-DIMMs
FUNCTIONAL BLOCK DIAGRAM
256MB(32Mbx64) : HYMP532S646-E3/C4
C K E 0
/S 0
O D T 0
D 0
/C S O D T C K E
D Q S 0
L D Q S
/D Q S 0
/U D Q S
D M 0
L D M
D Q 0
I/O 0
D Q 1
I/O 1
D Q 2
I/O 2
D Q 3
I/O 3
D Q 4
I/O 4
D Q 5
I/O 5
D Q 6
I/O 6
I/O 7
D Q 7
D Q S 1
U D Q S
/D Q S 1
/U D Q S
D M 1
U D M
D Q 8
D Q 8
D Q 1 0
D Q 1 1
D Q 1 2
D Q 1 3
D Q 1 4
D Q 1 5
D 1
/C S O D T C K E
D Q S 2
L D Q S
/D Q S 2
/L D Q S
D M 2
L D M
D Q 1 6
I/O 0
D Q 1 7
I/O 1
D Q 1 8
I/O 2
D Q 1 9
I/O 3
D Q 2 0
I/O 4
D Q 2 1
I/O 5
D Q 2 2
I/O 6
I/O 7
D Q 2 3
D Q S 3
U D Q S
/D Q S 3
/U D Q S
D M 3
U D M
D Q 2 4
D Q 2 5
D Q 2 6
D Q 2 7
D Q 2 8
D Q 2 9
D Q 3 0
D Q 3 1
S C L
S D A
A 0
A 1
A 2
S e r ia l P D
S C L
S D A
W P
S A 0
S A 1
D Q S 5
/D Q S 5
D M 5
D Q 4 0
D Q 4 1
D Q 4 2
D Q 4 3
D Q 4 4
D Q 4 5
D Q 4 6
D Q 4 7
D 3
/C S O D T C K E
D Q S 6
L D Q S
/D Q S 6
/L D Q S
D M 6
L D M
D Q 4 8
I/O 0
D Q 4 9
I/O 1
D Q 5 0
I/O 2
D Q 5 1
I/O 3
D Q 5 2
I/O 4
D Q 5 3
I/O 5
D Q 5 4
I/O 6
I/O 7
D Q 5 5
D Q S 7
U D Q S
/D Q S 7
/U D Q S
D M 7
U D M
D Q 5 6
D Q 5 7
D Q 5 8
D Q 5 9
D Q 6 0
D Q 6 1
D Q 6 2
D Q 6 3
D 2
/C S O D T C K E
D Q S 4
L D Q S
/D Q S 4
/L D Q S
D M 4
L D M
D Q 3 2
I/O 0
D Q 3 3
I/O 1
D Q 3 4
I/O 2
D Q 3 5
I/O 3
D Q 3 6
I/O 4
D Q 3 7
I/O 5
D Q 3 8
I/O 6
I/O 7
D Q 3 9
/S 1
N .C .
O D T 1
N .C .
C K E 1
N .C .
3
+ /-
5 %
B A 0 -B A 1
3
+ /- 5 %
A 0 - A N
/R A S
/C A S
/W E
S D R A M S D 0 -3
S D R A M S D 0 -3
S D R A M S D 0 -3
S D R A M S D 0 -3
S D R A M S D 0 -3
2 lo a d s
C K 0
/C K 0
2 lo a d s
C K 1
/C K 1
I/O 8
I/O 9
I/O 1 0
I/O 1 1
I/O 1 2
I/O 1 3
I/O 1 4
I/O 1 5
I/O 8
I/O 9
I/O 1 0
I/O 1 1
I/O 1 2
I/O 1 3
I/O 1 4
I/O 1 5
I/O 8
I/O 9
I/O 1 0
I/O 1 1
I/O 1 2
I/O 1 3
I/O 1 4
I/O 1 5
U D Q S
/U D Q S
U D M
I/O 8
I/O 9
I/O 1 0
I/O 1 1
I/O 1 2
I/O 1 3
I/O 1 4
I/O 1 5
V
D D
S P D
V
D D
V
R E F
V
S S
S e r ia l P D
S D R A M S D O - D 3
S D R A M S D O - D 3 , V D D a n d V D D Q
S D R A M S D O - D 3 , S P D
1 . R e s is to r v a lu e s a r e 2 2 O h m + /- 5 %
N o te s :