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IC61LV12816
Integrated Circuit Solution, Inc.
1
AHSR024-0B
04/23/2004
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Document Title
128K x 16 Hight Speed SRAM with 3.3V
Revision History
Revision No
History
Draft Date
Remark
0A
Initial Draft
September 12,2001
0B
Revise typo on page 6
April 23,2004
The attached datasheets are provided by ICSI. Integrated Circuit Solution Inc reserve the right to change the specifications and
products. ICSI will answer to your questions about device. If you have any questions, please contact the ICSI offices.
IC61LV12816
2
Integrated Circuit Solution, Inc.
AHSR024-0B
04/23/2004
FEATURES
High-speed access time: 8, 10, 12, and 15 ns
CMOS low power operation
TTL and CMOS compatible interface levels
Single 3.3V
10%power supply
Fully static operation: no clock or refresh
required
Three state outputs
Data control for upper and lower bytes
Industrial temperature available
128K x 16 HIGH-SPEED CMOS STATIC RAM
WITH 3.3V SUPPLY
DESCRIPTION
The
ICSI
IC61LV12816 is a high-speed, 2,097,152-bit static
RAM organized as 131,072 words by 16 bits. It is fabricated
using
ICSI
's high-performance CMOS technology. This highly
reliable process coupled with innovative circuit design
techniques, yields access times as fast as 8 ns with low power
consumption.
When CE is HIGH (deselected), the device assumes a standby
mode at which the power dissipation can be reduced down with
CMOS input levels.
Easy memory expansion is provided by using Chip Enable and
Output Enable inputs, CE and OE. The active LOW Write
Enable (WE) controls both writing and reading of the memory.
A data byte allows Upper Byte (UB) and Lower Byte (LB)
access.
The IC61LV12816 is packaged in the JEDEC standard 44-pin
400mil SOJ, 44-pin 400mil TSOP-2, and 48-pin 6*8mm TF-
BGA.
FUNCTIONAL BLOCK DIAGRAM
ICSI reserves the right to make changes to its products at any time without notice in order to improve design and supply the best possible product. We assume no responsibility for any errors
which may appear in this publication. Copyright 2000, Integrated Circuit Solution, Inc.
A0-A16
CE
OE
WE
128K x 16
MEMORY ARRAY
DECODER
COLUMN I/O
CONTROL
CIRCUIT
GND
VCC
I/O
DATA
CIRCUIT
I/O0-I/O7
Lower Byte
I/O8-I/O15
Upper Byte
UB
LB
IC61LV12816
Integrated Circuit Solution, Inc.
3
AHSR024-0B
04/23/2004
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PIN CONFIGURATIONS
44-Pin SOJ
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
44
43
42
41
40
39
38
37
36
35
34
33
32
31
30
29
28
27
26
25
24
23
A4
A3
A2
A1
A0
CE
I/O0
I/O1
I/O2
I/O3
Vcc
GND
I/O4
I/O5
I/O6
I/O7
WE
A16
A15
A14
A13
A12
A5
A6
A7
OE
UB
LB
I/O15
I/O14
I/O13
I/O12
GND
Vcc
I/O11
I/O10
I/O9
I/O8
NC
A8
A9
A10
A11
NC
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
44
43
42
41
40
39
38
37
36
35
34
33
32
31
30
29
28
27
26
25
24
23
A4
A3
A2
A1
A0
CE
I/O0
I/O1
I/O2
I/O3
Vcc
GND
I/O4
I/O5
I/O6
I/O7
WE
A16
A15
A14
A13
A12
A5
A6
A7
OE
UB
LB
I/O15
I/O14
I/O13
I/O12
GND
Vcc
I/O11
I/O10
I/O9
I/O8
NC
A8
A9
A10
A11
NC
44-Pin TSOP-2
48-Pin TF-BGA
1 2 3 4 5 6
A
B
C
D
E
F
G
H
LB
OE
A0
A1
A2
N/C
I/O
0
UB
A3
A4
CE
I/O
8
I/O
1
I/O
2
A5
A6
I/O
10
I/O
9
GND
I/O
3
NC
A7
I/O
11
Vcc
Vcc
I/O
4
NC
A16
I/O
12
GND
I/O
6
I/O
5
A14
A15
I/O
13
I/O
14
I/O
7
NC
A12
A13
WE
I/O
15
NC
A8
A9
A10
A11
NC
IC61LV12816
4
Integrated Circuit Solution, Inc.
AHSR024-0B
04/23/2004
ABSOLUTE MAXIMUM RATINGS
(1)
Symbol Parameter
Value
Unit
V
CC
Power Supply Voltage Relative to GND
0.5 to 4.0
V
V
TERM
Terminal Voltage with Respect to GND
0.5 to Vcc+0.5
V
T
STG
Storage Temperature
65 to +150
C
T
BIAS
Temperature Under Bias:
Com.
65 to +85
C
Ind.
45 to +90
C
P
T
Power Dissipation
2.0
W
I
OUT
DC Output Current (LOW)
+20
mA
Note:
1. Stress greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause
permanent damage to the device. This is a stress rating only and functional operation
of the device at these or any other conditions above those indicated in the operational
sections of this specification is not implied. Exposure to absolute maximum rating
conditions for extended periods may affect reliability.
DC ELECTRICAL CHARACTERISTICS
(Over Operating Range)
Symbol
Parameter
Test Conditions
Min.
Max.
Unit
V
OH
Output HIGH Voltage
V
CC
= Min., I
OH
= 4.0 mA
2.4
--
V
V
OL
Output LOW Voltage
V
CC
= Min., I
OL
= 8.0 mA
--
0.4
V
V
IH
Input HIGH Voltage
2
V
CC
+ 0.3
V
V
IL
Input LOW Voltage
(1)
0.3
0.8
V
I
LI
Input Leakage
GND
V
IN
V
CC
Com.
1
1
A
Ind.
5
5
A
I
LO
Output Leakage
GND
V
OUT
V
CC
,
Com.
1
1
A
Outputs Disabled
Ind.
5
5
A
Notes:
1. V
IL
(min.) = 2.0V for pulse width less than 10 ns.
2. The Vcc operating range for 8 ns is 3.3V +10%, -5%.
PIN DESCRIPTIONS
A0-A16
Address Inputs
I/O0-I/O15
Data Inputs/Outputs
CE
Chip Enable Input
OE
Output Enable Input
WE
Write Enable Input
LB
Lower-byte Control (I/O0-I/O7)
UB
Upper-byte Control (I/O8-I/O15)
NC
No Connection
Vcc
Power
GND
Ground
OPERATING RANGE
Range
Ambient Temperature
Vcc
Commercial
0C to +70C
3.3V
10%
Industrial
40C to +85C
3.3V
10%
IC61LV12816
Integrated Circuit Solution, Inc.
5
AHSR024-0B
04/23/2004
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POWER SUPPLY CHARACTERISTICS
(1)
(Over Operating Range)
-8 ns
-10 ns
-12 ns
-15 ns
Symbol
Parameter
Test Conditions
Min. Max.
Min. Max.
Min. Max.
Min. Max. Unit
I
CC
Vcc Dynamic Operating
V
CC
= Max., CE = V
IL
Com.
--
220
--
200
--
180
--
165
mA
Supply Current
I
OUT
= 0 mA, f = f
MAX
Ind.
--
230
--
210
--
190
--
175
I
SB
1
TTL Standby Current
V
CC
= Max.,
Com.
--
30
--
30
--
30
--
30
mA
(TTL Inputs)
V
IN
= V
IH
or V
IL
Ind.
--
40
--
40
--
40
--
40
CE
V
IH
, f = 0
I
SB
2
CMOS Standby
V
CC
= Max.,
Com.
--
10
--
10
--
10
--
10
mA
Current (CMOS Inputs)
CE
V
CC
0.2V,
Ind.
--
15
--
15
--
15
--
15
V
IN
V
CC
0.2V, or
V
IN
0.2V, f = 0
Note:
1. At f = f
MAX
, address and data inputs are cycling at the maximum frequency, f = 0 means no input lines change.
TRUTH TABLE
I/O PIN
Mode
WE
WE
WE
WE
WE
CE
CE
CE
CE
CE
OE
OE
OE
OE
OE
LB
LB
LB
LB
LB
UB
UB
UB
UB
UB
I/O0-I/O7
I/O8-I/O15
Vcc Current
Not Selected
X
H
X
X
X
High-Z
High-Z
I
SB
1
, I
SB
2
Output Disabled
H
L
H
X
X
High-Z
High-Z
I
CC
X
L
X
H
H
High-Z
High-Z
Read
H
L
L
L
H
D
OUT
High-Z
I
CC
H
L
L
H
L
High-Z
D
OUT
H
L
L
L
L
D
OUT
D
OUT
Write
L
L
X
L
H
D
IN
High-Z
I
CC
L
L
X
H
L
High-Z
D
IN
L
L
X
L
L
D
IN
D
IN
IC61LV12816
6
Integrated Circuit Solution, Inc.
AHSR024-0B
04/23/2004
READ CYCLE SWITCHING CHARACTERISTICS
(1)
(Over Operating Range)
-8
-10
-12
-15
Symbol
Parameter
Min.
Max.
Min.
Max.
Min.
Max.
Min.
Max.
Unit
t
RC
Read Cycle Time
8
--
10
--
12
--
15
--
ns
t
AA
Address Access Time
--
8
--
10
--
12
--
15
ns
t
OHA
Output Hold Time
3
--
3
--
3
--
3
--
ns
t
ACE
CE Access Time
--
8
--
10
--
12
--
15
ns
t
DOE
OE Access Time
--
3
--
4
--
5
--
6
ns
t
HZOE
(2)
OE to High-Z Output
--
3
--
4
--
5
0
6
ns
t
LZOE
(2)
OE to Low-Z Output
0
--
0
--
0
--
0
--
ns
t
HZCE
(2)
CE to High-Z Output
0
3
0
4
0
5
0
8
ns
t
LZCE
(2)
CE to Low-Z Output
3
--
3
--
3
--
3
--
ns
t
BA
LB, UB Access Time
--
3
--
4
--
5
--
6
ns
t
HZB
(2)
LB, UB to High-Z Output
0
3
0
4
0
5
0
6
ns
t
LZB
(2)
LB, UB to Low-Z Output
0
--
0
--
0
--
0
--
ns
Notes:
1. Test conditions assume signal transition times of 3 ns or less, timing reference levels of 1.5V, input pulse levels of
0 to 3.0V and output loading specified in Figure 1.
2. Tested with the load in Figure 2. Transition is measured 500 mV from steady-state voltage. Not 100% tested.
AC TEST CONDITIONS
Parameter
Unit
Input Pulse Level
0V to 3.0V
Input Rise and Fall Times
3 ns
Input and Output Timing
1.5V
and Reference Level
Output Load
See Figures 1 and 2
Notes:
1. The Vcc operating range for 8 ns is 3.3V +10%, -5%.
CAPACITANCE
(1)
Symbol
Parameter
Conditions
Max.
Unit
C
IN
Input Capacitance
V
IN
= 0V
6
pF
C
OUT
Input/Output Capacitance
V
OUT
= 0V
8
pF
Note:
1. Tested initially and after any design or process changes that may affect these parameters.
AC TEST LOADS
Figure 1.
Figure 2.
319
30 pF
Including
jig and
scope
353
OUTPUT
3.3V
319
5 pF
Including
jig and
scope
353
OUTPUT
3.3V
IC61LV12816
Integrated Circuit Solution, Inc.
7
AHSR024-0B
04/23/2004
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DATA VALID
PREVIOUS DATA VALID
t
AA
t
OHA
t
OHA
t
RC
D
OUT
ADDRESS
t
RC
t
OHA
t
AA
t
DOE
t
LZOE
t
ACE
t
LZCE
t
HZOE
HIGH-Z
DATA VALID
t
HZB
ADDRESS
OE
CE
LB, UB
D
OUT
t
HZCE
t
BA
t
LZB
READ CYCLE NO. 2
(1,3)
AC WAVEFORMS
READ CYCLE NO. 1
(1,2)
(Address Controlled) (CE = OE = V
IL
, UB or LB = V
IL
)
Notes:
1. WE is HIGH for a Read Cycle.
2. The device is continuously selected. OE, CE, UB, or LB = V
IL
.
3. Address is valid prior to or coincident with CE LOW transition.
IC61LV12816
8
Integrated Circuit Solution, Inc.
AHSR024-0B
04/23/2004
WRITE CYCLE SWITCHING CHARACTERISTICS
(1,3)
(Over Operating Range)
-8
-10
-12
-15
Symbol Parameter
Min.
Max.
Min.
Max.
Min.
Max.
Min.
Max.
Unit
t
WC
Write Cycle Time
8
--
10
--
12
--
15
--
ns
t
SCE
CE to Write End
7
--
8
--
8
--
10
--
ns
t
AW
Address Setup Time
7
--
8
--
8
--
10
--
ns
to Write End
t
HA
Address Hold from Write End
0
--
0
--
0
--
0
--
ns
t
SA
Address Setup Time
0
--
0
--
0
--
0
--
ns
t
PWB
LB, UB Valid to End of Write
7
--
8
--
9
--
10
--
ns
t
PWE
(4)
WE Pulse Width
7
--
8
--
9
--
10
--
ns
t
SD
Data Setup to Write End
4.5
--
5
--
6
--
7
--
ns
t
HD
Data Hold from Write End
0
--
0
--
0
--
0
--
ns
t
HZWE
(2)
WE LOW to High-Z Output
--
3
--
4
--
5
--
6
ns
t
LZWE
(2)
WE HIGH to Low-Z Output
0
--
0
--
0
--
0
--
ns
Notes:
1. Test conditions assume signal transition times of 3 ns or less, timing reference levels of 1.5V, input pulse levels of 0 to 3.0V
and output loading specified in Figure 1.
2. Tested with the load in Figure 2. Transition is measured 500 mV from steady-state voltage. Not 100% tested.
3. The internal write time is defined by the overlap of CE LOW and UB or LB, and WE LOW. All signals must be in valid states to
initiate a Write, but any one can go inactive to terminate the Write. The Data Input Setup and Hold timing are referenced to the
rising or falling edge of the signal that terminates the write.
4.Tested with OE Hith.
IC61LV12816
Integrated Circuit Solution, Inc.
9
AHSR024-0B
04/23/2004
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Notes:
1. WRITE is an internally generated signal asserted during an overlap of the LOW states on the CE and WE inputs and at least
one of the LB and UB inputs being in the LOW state.
2. WRITE = (CE)
[
(LB) = (UB)
]
(WE).
AC WAVEFORMS
WRITE CYCLE NO. 1
(1 ,2)
(CE Controlled, OE is HIGH or LOW)
DATA UNDEFINED
t
WC
VALID ADDRESS
t
SCE
t
PWE1
t
PWE2
t
AW
t
HA
HIGH-Z
t
PWB
t
HD
t
SA
t
HZWE
ADDRESS
CE
UB, LB
WE
D
OUT
D
IN
DATA
IN
VALID
t
LZWE
t
SD
IC61LV12816
10
Integrated Circuit Solution, Inc.
AHSR024-0B
04/23/2004
WRITE CYCLE NO. 2
(1)
(WE Controlled. OE is HIGH During Write Cycle)
DATA UNDEFINED
LOW
t
WC
VALID ADDRESS
t
PWE1
t
AW
t
HA
HIGH-Z
t
PWB
t
HD
t
SA
t
HZWE
ADDRESS
CE
UB, LB
WE
D
OUT
D
IN
OE
DATA
IN
VALID
t
LZWE
t
SD
WRITE CYCLE NO. 3
(WE Controlled. OE is LOW During Write Cycle)
DATA UNDEFINED
t
WC
VALID ADDRESS
LOW
LOW
t
PWE2
t
AW
t
HA
HIGH-Z
t
PWB
t
HD
t
SA
t
HZWE
ADDRESS
CE
UB, LB
WE
D
OUT
D
IN
OE
DATA
IN
VALID
t
LZWE
t
SD
IC61LV12816
Integrated Circuit Solution, Inc.
11
AHSR024-0B
04/23/2004
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2
3
4
5
6
7
8
9
10
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WRITE CYCLE NO. 4
(1,3)
(LB, UB Controlled, Back-to-Back Write)
DATA UNDEFINED
t
WC
ADDRESS 1
ADDRESS 2
t
WC
HIGH-Z
t
PWB
WORD 1
LOW
WORD 2
t
HD
t
SA
t
HZWE
ADDRESS
CE
UB, LB
WE
D
OUT
D
IN
OE
DATA
IN
VALID
t
LZWE
t
SD
t
PWB
DATA
IN
VALID
t
SD
t
HD
t
SA
t
HA
t
HA
Notes:
1. The internal Write time is defined by the overlap of CE = LOW, UB and/or LB = LOW, and WE = LOW. All signals must be
in valid states to initiate a Write, but any can be deasserted to terminate the Write. The
t
SA
,
t
HA
,
t
SD
, and
t
HD
timing is
referenced to the rising or falling edge of the signal that terminates the Write.
2. Tested with OE HIGH for a minimum of 4 ns before WE = LOW to place the I/O in a HIGH-Z state.
3. WE may be held LOW across many address cycles and the LB, UB pins can be used to control the Write function.
IC61LV12816
12
Integrated Circuit Solution, Inc.
AHSR024-0B
04/23/2004
ORDERING INFORMATION
Commercial Range: 0C to +70C
Speed (ns)
Order Part No.
Package
8
IC61LV12816-8B
6*8mm TF-BGA
8
IC61LV12816-8K
400mil SOJ
8
IC61LV12816-8T
400mil TSOP-2
10
IC61LV12816-10B
6*8mm TF-BGA
10
IC61LV12816-10K
400mil SOJ
10
IC61LV12816-10T
400mil TSOP-2
12
IC61LV12816-12B
6*8mm TF-BGA
12
IC61LV12816-12K
400mil SOJ
12
IC61LV12816-12T
400mil TSOP-2
15
IC61LV12816-15B
6*8mm TF-BGA
15
IC61LV12816-15K
400mil SOJ
15
IC61LV12816-15T
400mil TSOP-2
ORDERING INFORMATION
Industrial Range: 40C to +85C
Speed (ns)
Order Part No.
Package
8
IC61LV12816-8BI
6*8mm TF-BGA
8
IC61LV12816-8KI
400mil SOJ
8
IC61LV12816-8TI
400mil TSOP-2
10
IC61LV12816-10BI
6*8mm TF-BGA
10
IC61LV12816-10KI
400mil SOJ
10
IC61LV12816-10TI
400mil TSOP-2
12
IC61LV12816-12BI
6*8mm TF-BGA
12
IC61LV12816-12KI
400mil SOJ
12
IC61LV12816-12TI
400mil TSOP-2
15
IC61LV12816-15BI
6*8mm TF-BGA
15
IC61LV12816-15KI
400mil SOJ
15
IC61LV12816-15TI
400mil TSOP-2
IC61LV12816
Integrated Circuit Solution, Inc.
13
AHSR024-0B
04/23/2004
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Integrated Circuit Solution, Inc.
HEADQUARTER:
NO.2, TECHNOLOGY RD. V, SCIENCE-BASED INDUSTRIAL PARK,
HSIN-CHU, TAIWAN, R.O.C.
TEL: 886-3-5780333
Fax: 886-3-5783000
BRANCH OFFICE:
7F, NO. 106, SEC. 1, HSIN-TAI 5
TH
ROAD,
HSICHIH TAIPEI COUNTY, TAIWAN, R.O.C.
TEL: 886-2-26962140
FAX: 886-2-26962252
http://www.icsi.com.tw