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Электронный компонент: IC62C1024AL-55TI

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Integrated Circuit Solution Inc.
1
ALSR009-0A 5/7/2002
IC62C1024AL
Document Title
128K x 8 Low Power CMOS SRAM
Revision History
Revision No
History
Draft Date
Remark
0A
Initial Draft
May 7,2002
The attached datasheets are provided by ICSI. Integrated Circuit Solution Inc reserve the right to change the specifications and
products. ICSI will answer to your questions about device. If you have any questions, please contact the ICSI offices.
2
Integrated Circuit Solution Inc.
ALSR009-0A 5/7/2002
IC62C1024AL
ICSI reserves the right to make changes to its products at any time without notice in order to improve design and supply the best possible product. We assume no responsibility for any errors
which may appear in this publication. Copyright 2000, Integrated Circuit Solution Inc.
DESCRIPTION
The
ICSI
IC62C1024AL is a low power,131,072-word by 8-bit
CMOS static RAM. It is fabricated using
ICSI
's high-
performance CMOS technology. This highly reliable process
coupled with innovative circuit design techniques, yields higher
performance and low power consumption devices.
When
CE1
is HIGH or CE2 is LOW (deselected), the device
assumes a standby mode at which the power dissipation can
be reduced by using CMOS input levels.
Easy memory expansion is provided by using two Chip Enable
inputs,
CE1
and CE2. The active LOW Write Enable (
WE
)
controls both writing and reading of the memory.
The IC62C1024L is available in 32-pin 600mil DIP, 450mil SOP
and 8*20mm TSOP-1 packages.
FUNCTIONAL BLOCK DIAGRAM
A0-A16
CE1
OE
WE
512 x 2048
MEMORY ARRAY
DECODER
COLUMN I/O
CONTROL
CIRCUIT
GND
VCC
I/O
DATA
CIRCUIT
I/O0-I/O7
CE2
128K x 8 LOW POWER CMOS STATIC RAM
FEATURES
High-speed access time: 35, 45, 55, 70 ns
Low active power: 450 mW (typical)
Low standby power: 150 W (typical) CMOS
standby
Output Enable (
OE
) and two Chip Enable
(
CE1
and CE2) inputs for ease in applications
Fully static operation: no clock or refresh
required
TTL compatible inputs and outputs
Single 5V (
10%) power supply
Integrated Circuit Solution Inc.
3
ALSR009-0A 5/7/2002
IC62C1024AL
TRUTH TABLE
Mode
WE
WE
WE
WE
WE
CE1
CE1
CE1
CE1
CE1
CE2
OE
OE
OE
OE
OE
I/O Operation
Vcc Current
Not Selected
X
H
X
X
High-Z
I
SB
1
, I
SB
2
(Power-down)
X
X
L
X
High-Z
I
SB
1
, I
SB
2
Output Disabled H
L
H
H
High-Z
I
CC
Read
H
L
H
L
D
OUT
I
CC
Write
L
L
H
X
D
IN
I
CC
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
32
31
30
29
28
27
26
25
24
23
22
21
20
19
18
17
NC
A16
A14
A12
A7
A6
A5
A4
A3
A2
A1
A0
I/O0
I/O1
I/O2
GND
VCC
A15
CE2
WE
A13
A8
A9
A11
OE
A10
CE1
I/O7
I/O6
I/O5
I/O4
I/O3
PIN CONFIGURATION
32-Pin SOP and DIP
PIN DESCRIPTIONS
A0-A16
Address Inputs
CE1
Chip Enable 1 Input
CE2
Chip Enable 2 Input
OE
Output Enable Input
WE
Write Enable Input
I/O0-I/O7
Input/Output
Vcc
Power
GND
Ground
OPERATING RANGE
Range
Ambient Temperature
V
CC
Commercial
0C to + 70C
5V
10%
Industrial
40C to + 85C
5V
10%
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
32
31
30
29
28
27
26
25
24
23
22
21
20
19
18
17
A11
A9
A8
A13
WE
CE2
A15
VCC
NC
A16
A14
A12
A7
A6
A5
A4
OE
A10
CE1
I/O7
I/O6
I/O5
I/O4
I/O3
GND
I/O2
I/O1
I/O0
A0
A1
A2
A3
PIN CONFIGURATION
32-Pin 8x20mm TSOP-1
4
Integrated Circuit Solution Inc.
ALSR009-0A 5/7/2002
IC62C1024AL
ABSOLUTE MAXIMUM RATINGS
(1)
Symbol
Parameter
Value
Unit
V
TERM
Terminal Voltage with Respect to GND
0.5 to + 7.0
V
T
BIAS
Temperature Under Bias
45 to + 85
C
T
STG
Storage Temperature
65 to + 150
C
P
T
Power Dissipation
1.5
W
I
OUT
DC Output Current (LOW)
20
mA
Notes:
1. Stress greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause
permanent damage to the device. This is a stress rating only and functional operation of the
device at these or any other conditions above those indicated in the operational sections of
this specification is not implied. Exposure to absolute maximum rating conditions for
extended periods may affect reliability.
CAPACITANCE
(1,2)
Symbol
Parameter
Conditions
Max.
Unit
C
IN
Input Capacitance
V
IN
= 0V
6
pF
C
OUT
Output Capacitance
V
OUT
= 0V
8
pF
Notes:
1. Tested initially and after any design or process changes that may affect these parameters.
2. Test conditions: T
A
= 25C, f = 1 MHz, Vcc = 5.0V.
DC ELECTRICAL CHARACTERISTICS
(Over Operating Range)
Symbol Parameter
Test Conditions
Min.
Max.
Unit
V
OH
Output HIGH Voltage
V
CC
= Min., I
OH
= 1.0 mA
2.4
--
V
V
OL
Output LOW Voltage
V
CC
= Min., I
OL
= 2.1 mA
--
0.4
V
V
IH
Input HIGH Voltage
2.2
V
CC
+ 0.5
V
V
IL
Input LOW Voltage
(1)
0.3
0.8
V
I
LI
Input Leakage
GND
V
IN
V
CC
Com.
2
2
A
Ind.
10
10
I
LO
Output Leakage
GND
V
OUT
V
CC
Com.
2
2
A
Ind.
10
10
Notes:
1. V
IL
= 3.0V for pulse width less than 10 ns.
POWER SUPPLY CHARACTERISTICS
(1)
(Over Operating Range)
-35 ns
-45 ns
-55 ns
-70 ns
Symbol Parameter
Test Conditions
Min. Max.
Min. Max.
Min. Max.
Min. Max.
Unit
I
CC
Vcc Dynamic Operating V
CC
= Max.,
CE
= V
IL
Com.
--
100
--
90
--
80
--
70
mA
Supply Current
I
OUT
= 0 mA, f = f
MAX
Ind.
--
110
--
100
--
90
--
80
I
SB
1
TTL Standby Current
V
CC
= Max.,
Com.
--
10
--
10
--
10
--
10
mA
(TTL Inputs)
V
IN
= V
IH
or V
IL
,
CE1
V
IH
, Ind.
--
15
--
15
--
15
--
15
or CE2
V
IL
, f = 0
I
SB
2
CMOS Standby
V
CC
= Max.,
Com.
--
500
--
500
--
500
--
500
A
Current (CMOS Inputs)
CE1
V
CC
0.2V,
Ind.
--
750
--
750
--
750
--
750
CE2
0.2V, V
IN
> V
CC
0.2V,
or V
IN
0.2V, f = 0
Note:
1. At f = f
MAX
, address and data inputs are cycling at the maximum frequency, f = 0 means no input lines change.
Integrated Circuit Solution Inc.
5
ALSR009-0A 5/7/2002
IC62C1024AL
READ CYCLE SWITCHING CHARACTERISTICS
(1)
(Over Operating Range)
-35
-45
-55
-70
Symbol Parameter
Min.
Max.
Min.
Max.
Min.
Max.
Min.
Max.
Unit
t
RC
Read Cycle Time
35
--
45
--
55
--
70
--
ns
t
AA
Address Access Time
--
35
--
45
--
55
--
70
ns
t
OHA
Output Hold Time
3
--
3
--
3
--
3
--
ns
t
ACE
1
CE1
Access Time
--
35
--
45
--
55
--
70
ns
t
ACE
2
CE2 Access Time
--
35
--
45
--
55
--
70
ns
t
DOE
OE
Access Time
--
10
--
20
--
25
--
35
ns
t
LZOE
(2)
OE
to Low-Z Output
0
--
0
--
0
--
0
--
ns
t
HZOE
(2)
OE
to High-Z Output
0
10
0
15
0
20
0
25
ns
t
LZCE
1
(2)
CE1
to Low-Z Output
3
--
5
--
7
--
10
--
ns
t
LZCE
2
(2)
CE2 to Low-Z Output
3
--
5
--
7
--
10
--
ns
t
HZCE
(2)
CE1
or CE2 to High-Z Output
0
10
0
15
0
20
0
25
ns
Notes:
1. Test conditions assume signal transition times of 5 ns or less, timing reference levels of 1.5V, input pulse levels of 0 to 3.0V
and output loading specified in Figure 1a.
2. Tested with the load in Figure 1b. Transition is measured 500 mV from steady-state voltage. Not 100% tested.
AC TEST CONDITIONS
Parameter
Unit
Input Pulse Level
0V to 3.0V
Input Rise and Fall Times
5 ns
Input and Output Timing
1.5V
and Reference Level
Output Load
See Figures 1a and 1b
AC TEST LOADS
Figure 1a.
Figure 1b.
480
5 pF
Including
jig and
scope
255
OUTPUT
5V
480
100 pF
Including
jig and
scope
255
OUTPUT
5V
6
Integrated Circuit Solution Inc.
ALSR009-0A 5/7/2002
IC62C1024AL
DATA VALID
t
AA
t
OHA
t
OHA
t
RC
DOUT
ADDRESS
t
RC
t
OHA
t
AA
t
DOE
t
LZOE
t
ACE1/
t
ACE2
t
LZCE1/
t
LZCE2
t
HZOE
HIGH-Z
DATA VALID
t
HZCE
ADDRESS
OE
CE1
CE2
DOUT
Notes:
1.
WE
is HIGH for a Read Cycle.
2. The device is continuously selected.
OE
,
CE1
= V
IL
, CE2 = V
IH
.
3. Address is valid prior to or coincident with
CE1
LOW and CE2 HIGH transitions.
READ CYCLE NO. 2
(1,3)
AC WAVEFORMS
READ CYCLE NO. 1
(1,2)
Integrated Circuit Solution Inc.
7
ALSR009-0A 5/7/2002
IC62C1024AL
WRITE CYCLE SWITCHING CHARACTERISTICS
(1,3)
(Over Operating Range, Standard and Low
Power)
-35
-45
-55
-70
Symbol Parameter
Min.
Max.
Min.
Max.
Min.
Max.
Min.
Max.
Unit
t
WC
Write Cycle Time
35
--
45
--
55
--
70
--
ns
t
SCE
1
CE1
to Write End
25
--
35
--
50
--
60
--
ns
t
SCE
2
CE2 to Write End
25
--
35
--
50
--
60
--
ns
t
AW
Address Setup Time to Write End
25
--
35
--
45
--
60
--
ns
t
HA
Address Hold from Write End
0
--
0
--
0
--
0
--
ns
t
SA
Address Setup Time
0
--
0
--
0
--
0
--
ns
t
PWE
(4)
WE
Pulse Width
25
--
35
--
40
--
50
--
ns
t
SD
Data Setup to Write End
20
--
25
--
25
--
30
--
ns
t
HD
Data Hold from Write End
0
--
0
--
0
--
0
--
ns
t
HZWE
(2)
WE
LOW to High-Z Output
--
10
--
15
--
20
--
25
ns
t
LZWE
(2)
WE
HIGH to Low-Z Output
3
--
5
--
5
--
5
--
ns
Notes:
1. Test conditions assume signal transition times of 5 ns or less, timing reference levels of 1.5V, input pulse levels of 0 to 3.0V
and output loading specified in Figure 1a.
2. Tested with the load in Figure 1b. Transition is measured 500 mV from steady-state voltage. Not 100% tested.
3. The internal write time is defined by the overlap of
CE1
LOW, CE2 HIGH and
WE
LOW. All signals must be in valid states to
initiate a Write, but any one can go inactive to terminate the Write. The Data Input Setup and Hold timing are referenced to the
rising or falling edge of the signal that terminates the Write.
4. Tested with
OE
HIGH.
DATA-IN VALID
DATA UNDEFINED
t
WC
t
SCE1
t
SCE2
t
AW
t
HA
t
PWE
(4)
t
HZWE
HIGH-Z
t
LZWE
t
SA
t
SD
t
HD
ADDRESS
CE1
CE2
WE
DOUT
DIN
AC WAVEFORMS
WRITE CYCLE NO. 1 (
WE
WE
WE
WE
WE Controlled)
(1,2)
8
Integrated Circuit Solution Inc.
ALSR009-0A 5/7/2002
IC62C1024AL
WRITE CYCLE NO. 2 (
CE1
CE1
CE1
CE1
CE1, CE2 Controlled)
(1,2)
HIGH-Z
DATA UNDEFINED
DATA-IN VALID
t
WC
t
SCE1
t
SA
t
HA
t
SCE2
t
PWE
(4)
t
AW
t
HZWE
t
SD
t
HD
t
LZWE
ADDRESS
DIN
CE1
CE2
WE
DOUT
Notes:
1. The internal write time is defined by the overlap of
CE1
LOW, CE2 HIGH and
WE
LOW. All signals must be in valid states to
initiate a Write, but any one can go inactive to terminate the Write. The Data Input Setup and Hold timing are referenced to the
rising or falling edge of the signal that terminates the Write.
2. I/O will assume the High-Z state if
OE
= V
IH
.
DATA RETENTION SWITCHING CHARACTERISTICS
Symbol
Parameter
Test Condition
Min.
Max.
Unit
V
DR
Vcc for Data Retention
See Data Retention Waveform
2.0
5.5
V
I
DR
Data Retention Current
Vcc = 3.0V,
CE1
> Vcc 0.2V
Com.
--
250
A
Ind.
--
400
t
SDR
Data Retention Setup Time
See Data Retention Waveform
0
--
ns
t
RDR
Recovery Time
See Data Retention Waveform
t
RC
--
ns
DATA RETENTION WAVEFORM (
CE1
CE1
CE1
CE1
CE1 Controlled)
V
CC
CE1
V
CC
- 0.2V
t
SDR
t
RDR
V
DR
CE1
GND
5.0V
3.0V
Data Retention Mode
Integrated Circuit Solution Inc.
9
ALSR009-0A 5/7/2002
IC62C1024AL
ORDERING INFORMATION
Commercial Range: 0C to +70C
Speed (ns)
Order Part No.
Package
35
IC62C1024AL-35W 600mil DIP
35
IC62C1024AL-35Q 450mil SOP
35
IC62C1024AL-35T 8*20mm TSOP-1
45
IC62C1024AL-45W 600mil DIP
45
IC62C1024AL-45Q 450mil SOP
45
IC62C1024AL-45T 8*20mm TSOP-1
55
IC62C1024AL-55W 600mil DIP
55
IC62C1024AL-55Q 450mil SOP
55
IC62C1024AL-55T 8*20mm TSOP-1
70
IC62C1024AL-70W 600mil DIP
70
IC62C1024AL-70Q 450mil SOP
70
IC62C1024AL-70T 8*20mm TSOP-1
ORDERING INFORMATION
Industrial Range: 40C to +85C
Speed (ns)
Order Part No.
Package
35
IC62C1024AL-35WI 600mil DIP
35
IC62C1024AL-35QI 450mil SOP
35
IC62C1024AL-35TI 8*20mm TSOP-1
45
IC62C1024AL-45WI 600mil DIP
45
IC62C1024AL-45QI 450mil SOP
45
IC62C1024AL-45TI 8*20mm TSOP-1
55
IC62C1024AL-55WI 600mil DIP
55
IC62C1024AL-55QI 450mil SOP
55
IC62C1024AL-55TI 8*20mm TSOP-1
70
IC62C1024AL-70WI 600mil DIP
70
IC62C1024AL-70QI 450mil SOP
70
IC62C1024AL-70TI 8*20mm TSOP-1
Integrated Circuit Solution Inc.
HEADQUARTER:
NO.2, TECHNOLOGY RD. V, SCIENCE-BASED INDUSTRIAL PARK,
HSIN-CHU, TAIWAN, R.O.C.
TEL: 886-3-5780333
Fax: 886-3-5783000
BRANCH OFFICE:
7F, NO. 106, SEC. 1, HSIN-TAI 5
TH
ROAD,
HSICHIH TAIPEI COUNTY, TAIWAN, R.O.C.
TEL: 886-2-26962140
FAX: 886-2-26962252
http://www.icsi.com.tw
DATA RETENTION WAVEFORM (CE2 Controlled)
V
CC
CE2
0.2V
t
SDR
t
RDR
V
DR
0.4V
CE2
GND
5.0V
3.0V
Data Retention Mode