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Электронный компонент: 71V2578

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APRIL 2003
DSC-4876/08
1
2003 Integrated Device Technology, Inc.
Features
x
x
x
x
x
128K x 36, 256K x 18 memory configurations
x
x
x
x
x
Supports high system speed:
Commercial and Industrial:
150MHz 3.8ns clock access time
133MHz 4.2ns clock access time
x
x
x
x
x
LBO input selects interleaved or linear burst mode
x
x
x
x
x
Self-timed write cycle with global write control (
GW), byte write
enable (
BWE), and byte writes (BWx)
x
x
x
x
x
3.3V core power supply
x
x
x
x
x
Power down controlled by ZZ input
x
x
x
x
x
2.5V I/O
x
x
x
x
x
Packaged in a JEDEC Standard 100-pin plastic thin quad
flatpack (TQFP), 119 ball grid array (BGA) and 165 fine pitch ball
grid array (fBGA)
Description
The IDT71V2576/78 are high-speed SRAMs organized as 128K x
36/256K x 18. The IDT71V2576/78 SRAMs contain write, data, address
and control registers. Internal logic allows the SRAM to generate a self-
timed write based upon a decision which can be left until the end of the write
cycle.
The burst mode feature offers the highest level of performance to the
system designer, as the IDT71V2576/78 can provide four cycles of data
for a single address presented to the SRAM. An internal burst address
counter accepts the first cycle address from the processor, initiating the
access sequence. The first cycle of output data will be pipelined for one
cycle before it is available on the next rising clock edge. If burst mode
operation is selected (
ADV=LOW), the subsequent three cycles of output
data will be available to the user on the next three rising clock edges. The
order of these three addresses are defined by the internal burst counter
and the
LBO input pin.
The IDT71V2576/78 SRAMs utilize IDT's latest high-performance
CMOS process and are packaged in a JEDEC standard 14mm x 20mm
100-pin thin plastic quad flatpack (TQFP) as well as a 119 ball grid array
(BGA) and 165 fine pitch ball grid array (fBGA).
Pin Description Summary
NOTE:
1.
BW
3
and
BW
4
are not applicable for the IDT71V2578.
A
0
-A
17
Address Inputs
Input
Synchronous
CE
Chip Enable
Input
Synchronous
CS
0
,
CS
1
Chip Selects
Input
Synchronous
OE
Output Enable
Input
Asynchronous
GW
Global Write Enable
Input
Synchronous
BWE
Byte Write Enable
Input
Synchronous
BW
1
,
BW
2
,
BW
3
,
BW
4
(1)
Individual Byte Write Selects
Input
Synchronous
CLK
Clock
Input
N/A
ADV
Burst Address Advance
Input
Synchronous
ADSC
Address Status (Cache Controller)
Input
Synchronous
ADSP
Address Status (Processor)
Input
Synchronous
LBO
Linear / Interleaved Burst Order
Input
DC
ZZ
Sleep Mode
Input
Asynchronous
I/O
0
-I/O
31
, I/O
P1
-I/O
P4
Data Input / Output
I/O
Synchronous
V
DD
, V
DDQ
Core Power, I/O Power
Supply
N/A
V
SS
Ground
Supply
N/A
4876 tbl 01
128K X 36, 256K X 18
3.3V Synchronous SRAMs
2.5V I/O, Pipelined Outputs,
Burst Counter, Single Cycle Deselect
IDT71V2576
IDT71V2578
6.42
2
IDT71V2576, IDT71V2578, 128K x 36, 256K x 18, 3.3V Synchronous SRAMs with
2.5V I/O, Pipelined Outputs, Burst Counter, Single Cycle Deselect Commercial and Industrial Temperature Ranges
Pin Definitions
(1)
NOTE:
1. All synchronous inputs must meet specified setup and hold times with respect to CLK.
Symbol
Pin Function
I/O
Active
Description
A
0
-A
17
Address Inputs
I
N/A
Synchronous Address inputs. The address register is trig gered by a combination of the
rising edge of CLK and
ADSC Low or ADSP Low and CE Low.
ADSC
Address Status
(Cache Controller)
I
LOW
Synchronous Address Status from Cache Controller.
ADSC is an active LOW input that is
used to load the address registers with new addresses.
ADSP
Address Status
(Processor)
I
LOW
Synchronous Address Status from Processor.
ADSP is an active LOW input that is used to
load the address registers with new addresses.
ADSP is gated by CE.
ADV
Burst Address
Advance
I
LOW
Synchronous Address Advance.
ADV is an active LOW input that is used to advance the
internal burst counter, controlling burst access after the initial address is loaded. When the
input is HIGH the burst counter is not incremented; that is, there is no address advance.
BWE
Byte Write Enable
I
LOW
Synchronous byte write enable gates the byte write inputs BW
1
-BW
4
. If BWE is LOW at the
rising edge of CLK then
BWx inputs are passed to the next stage in the circuit. If BWE is
HIGH then the byte write inputs are blocked and only
GW can initiate a write cycle.
BW
1
-
BW
4
Individual Byte
Write Enables
I
LOW
Synchronous byte write enables.
BW
1
controls I/O
0-7
, I/O
P1
,
BW
2
controls I/O
8-15
, I/O
P2
, etc.
Any active byte write causes all outputs to be disabled.
CE
Chip Enable
I
LOW
Synchronous chip enable.
CE is used with CS
0
and
CS
1
to enable the IDT71V2576/78.
CE
also gates
ADSP.
CLK
Clock
I
N/A
This is the clock input. All timing references for the device are made with respect to this
input.
CS
0
Chip Select 0
I
HIGH
Synchrono us active HIGH chip select. CS
0
is used with
CE and CS
1
to enable the chip.
CS
1
Chip Select 1
I
LOW
Synchronous active LOW chip select.
CS
1
is used with
CE and CS
0
to enable the chip.
GW
Global Write
Enable
I
LOW
Synchronous global write enable. This input will write all four 9-bit data bytes when LOW
on the rising edge of CLK.
GW supersedes individual byte write enables.
I/O
0
-I/O
31
I/O
P1
-I/O
P4
Data Input/Output
I/O
N/A
Synchro nous data input/output (I/O) pins. Both the data input path and data output path are
registered and triggered by the rising edge of CLK.
LBO
Linear Burst Order
I
LOW
Asynchronous burst order selection input. When
LBO is HIGH, the interleaved burst
sequence is selected. When LBO is LOW the Line ar burst sequence is selected. LBO is a
static input and must not change state while the device is operating.
OE
Output Enable
I
LOW
Asynchronous output enable. When
OE is LOW the data output drivers are enabled on the
I/O pins if the chip is also selected. When
OE is HIGH the I/O pins are in a high-
impedance state.
V
DD
Power Supply
N/A
N/A
3.3V core power supply.
V
DDQ
Power Supply
N/A
N/A
2.5V I/O Supply.
V
SS
Ground
N/A
N/A
Ground.
NC
No Connect
N/A
N/A
NC pins are not electrically connected to the device.
ZZ
Sleep Mode
I
HIGH
Asynchro nous sleep mode input. ZZ HIGH will gate the CLK internally and power down the
IDT71V2576/78 to its lowest p ower consumption level. Data retention is guaranteed in
Sleep Mode.
4876 tbl 02
6.42
IDT71V2576, IDT71V2578, 128K x 36, 256K x 18, 3.3V Synchronous SRAMs with
2.5V I/O, Pipelined Outputs, Burst Counter, Single Cycle Deselect Commercial and Industrial Temperature Ranges
3
Functional Block Diagram
A
0 -
A
16/17
ADDRESS
REGISTER
CLR
A1*
A0*
17/18
2
17/18
A
2 -
A
17
128K x 36/
256K x 18-
BIT
MEMORY
ARRAY
INTERNAL
ADDRESS
A
0
,A
1
BW
4
BW
3
BW
2
BW
1
Byte 1
Write Register
36/18
36/18
ADSP
ADV
CLK
ADSC
CS
0
CS
1
Byte 1
Write Driver
Byte 2
Write Driver
Byte 3
Write Driver
Byte 4
Write Driver
Byte 2
Write Register
Byte 3
Write Register
Byte 4
Write Register
9
9
9
9
GW
CE
BWE
LBO
I/O
0
-- I/O
31
I/O
P1
-- I/O
P4
OE
DATA INPUT
REGISTER
36/18
OUTPUT
BUFFER
OUTPUT
REGISTER
D
Q
D
Q
Enable
Register
Enable
Delay
Register
OE
Burst
Sequence
CEN
CLK EN
CLK EN
Q1
Q0
2
Burst
Logic
Binary
Counter
4876 drw 01
ZZ
Powerdown
,
6.42
4
IDT71V2576, IDT71V2578, 128K x 36, 256K x 18, 3.3V Synchronous SRAMs with
2.5V I/O, Pipelined Outputs, Burst Counter, Single Cycle Deselect Commercial and Industrial Temperature Ranges
100 TQFP Capacitance
(T
A
= +25C, f = 1.0MHz)
Recommended DC Operating
Conditions
Recommended Operating
Temperature and Supply Voltage
Absolute Maximum Ratings
(1)
NOTES:
1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may
cause permanent damage to the device. This is a stress rating only and functional
operation of the device at these or any other conditions above those indicated
in the operational sections of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect reliability.
2. V
DD
terminals only.
3. V
DDQ
terminals only.
4. Input terminals only.
5. I/O terminals only.
6. This is a steady-state DC parameter that applies after the power supplies have
ramped up. Power supply sequencing is not necessary; however, the voltage
on any input or I/O pin cannot exceed V
DDQ
during power supply ramp up.
7. T
A
is the "instant on" case temperature
NOTES:
1. V
IH
(max) = V
DDQ
+ 1.0V for pulse width less than t
CYC/2
, once per cycle.
2. V
IL
(min) = -1.0V for pulse width less than t
CYC/2
, once per cycle.
NOTE:
1. This parameter is guaranteed by device characterization, but not production tested.
Symbol
Rating
Commercial &
Industrial
Unit
V
TERM
(2)
Terminal Voltage with
Respect to GND
-0.5 to +4.6
V
V
TERM
(3,6)
Terminal Voltage with
Respect to GND
-0.5 to V
DD
V
V
TERM
(4,6)
Terminal Voltage with
Respect to GND
-0.5 to V
DD
+0.5
V
V
TERM
(5,6)
Terminal Voltage with
Respect to GND
-0.5 to V
DDQ
+0.5
V
T
A
(7)
Commercial
Operating Temperature
-0 to +70
o
C
Industrial
Operating Temperature
-40 to +85
o
C
T
BIAS
Temperature
Under Bias
-55 to +125
o
C
T
STG
Storage
Temperature
-55 to +125
o
C
P
T
Power Dissipation
2.0
W
I
OUT
DC Output Current
50
mA
4876 tbl 03
Grade
Temperature
(1)
V
SS
V
DD
V
DDQ
Commercial
0C to +70C
0V
3.3V5%
2.5V5%
Industrial
-40C to +85C
0V
3.3V5%
2.5V5%
4876 tbl 04
Symbol
Parameter
Min.
Typ.
Max.
Unit
V
DD
Core Supply Voltage
3.135
3.3
3.465
V
V
DDQ
I/O Supply Voltage
2.375
2.5
2.625
V
V
SS
Supply Voltage
0
0
0
V
V
IH
Input High Voltage -
Inputs
1.7
____
V
DD
+0.3
V
V
IH
Input High Voltage - I/O
1.7
____
V
DDQ
+0.3
(1)
V
V
IL
Input Low Voltage
-0.3
(2)
____
0.7
V
4876 tbl 05
Symbol
Parameter
(1)
Conditions
Max.
Unit
C
IN
Input Capacitance
V
IN
= 3dV
5
pF
C
I/O
I/O Capacitance
V
OUT
= 3dV
7
pF
4876 tbl 07
NOTES:
1. T
A
is the "instant on" case temperature
Symbol
Parameter
(1)
Conditions
Max.
Unit
C
IN
Input Capacitance
V
IN
= 3dV
7
pF
C
I/O
I/O Capacitance
V
OUT
= 3dV
7
pF
4876 tbl 07a
119 BGA Capacitance
(T
A
= +25C, f = 1.0MHz)
165 fBGA Capacitance
(T
A
= +25C, f = 1.0MHz)
Symbol
Parameter
(1)
Conditions
Max.
Unit
C
IN
Input Capacitance
V
IN
= 3dV
7
pF
C
I/O
I/O Capacitance
V
OUT
= 3dV
7
pF
4876 tbl 07b
6.42
IDT71V2576, IDT71V2578, 128K x 36, 256K x 18, 3.3V Synchronous SRAMs with
2.5V I/O, Pipelined Outputs, Burst Counter, Single Cycle Deselect Commercial and Industrial Temperature Ranges
5
Pin Configuration 128K x 36
100 TQFP
Top View
NOTES:
1. Pin 14 can either be directly connected to V
DD
, or connected to an input voltage
V
IH
, or left unconnected.
2. Pins 38 and 39 can be either NC or connected to V
SS.
3. Pin 64 can be left unconnected and the device will always remain in active mode.
100 99 98 97 96 95 94 93 92 91 90
87 86 85 84 83 82 81
89 88
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
A
6
A
7
C
E
C
S
0
B
W
4
B
W
3
B
W
2
B
W
1
C
S
1
V
D
D
V
S
S
C
LK
G
W
B
W
E
O
E
A
D
S
C
A
D
S
P
A
D
V
A
8
A
9
31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50
N
C
N
C
N
C
(2)
N
C
(2)
LB
O
A
14
A
13
A
12
A
11
A
10
V
D
D
V
S
S
A
0
A
1
A
2
A
3
A
4
A
5
I/O
31
I/O
30
V
DDQ
V
SS
I/O
29
I/O
28
I/O
27
I/O
26
V
SS
V
DDQ
I/O
25
I/O
24
V
SS
V
DD
I/O
23
I/O
22
V
DDQ
V
SS
I/O
21
I/O
20
I/O
19
I/O
18
V
SS
V
DDQ
I/O
17
I/O
16
80
79
78
77
76
75
74
73
72
71
70
69
68
67
66
65
64
63
62
61
60
59
58
57
56
55
54
53
52
51
I/O
14
V
DDQ
V
SS
I/O
13
I/O
12
I/O
11
I/O
10
V
SS
V
DDQ
I/O
9
I/O
8
V
SS
V
DD
I/O
7
I/O
6
V
DDQ
V
SS
I/O
5
I/O
4
I/O
3
I/O
2
V
SS
V
DDQ
I/O
1
I/O
0
4876 drw 02
V
DD
/NC
(1)
I/O
15
I/O
P3
NC
I/O
P4
A
15
A
16
I/O
P1
NC
I/O
P2
ZZ
(3)
,