Integrated Device Technology, Inc.
MILITARY AND COMMERCIAL TEMPERATURE RANGES
APRIL 1995
1995 Integrated Device Technology, Inc.
6.16
DSC-4210/4
DESCRIPTION:
The IDT54/74FCT521T/AT/BT/CT are 8-bit identity com-
parators built using an advanced dual metal CMOS technol-
ogy. These devices compare two words of up to eight bits each
and provide a LOW output when the two words match bit for
bit. The expansion input
I
A
=
B
also serves as an active LOW
enable input.
IDT54/74FCT521T
IDT54/74FCT521AT
IDT54/74FCT521BT
IDT54/74FCT521CT
FAST CMOS 8-BIT
IDENTITY COMPARATOR
1
The IDT logo is a registered trademark of Integrated Device Technology, Inc.
FEATURES:
Std., A, B and C speed grades
Low input and output leakage
1
A (max.)
CMOS power levels
True TTL input and output compatibility
V
OH
= 3.3V (typ.)
V
OL
= 0.3V (typ.)
High drive outputs (-15mA I
OH
, 48mA I
OL
)
Meets or exceeds JEDEC standard 18 specifications
Product available in Radiation Tolerant and Radiation
Enhanced versions
Military product compliant to MIL-STD-883, Class B
and DESC listed (dual marked)
Available in DIP, SOIC, SSOP, QSOP, CERPACK and
LCC packages
A
0
B
0
A
1
B
1
A
2
B
2
A
3
B
3
A
4
B
4
A
5
B
5
A
6
B
6
A
7
B
7
I
A=B
O
A=B
2572 drw 01
O
A=B
A
0
B
0
A
1
B
1
A
2
B
2
A
3
B
3
GND
B
7
A
7
B
6
A
6
A
5
A
4
B
5
B
4
V
CC
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
DIP/SOIC/SSOP/QSOP/CERPACK
TOP VIEW
P20-1
D20-1
SO20-2
SO20-7
SO20-8
&
E20-1
I
A=B
2572 drw 02
INDEX
A
1
B
1
A
2
B
2
A
3
B
7
A
7
B
6
A
6
B
5
A
0
B
0
I
A=B
V
CC
O
A=B
B
3
GND
A
4
B
4
A
5
LCC
TOP VIEW
3
2
20 19
1
4
5
6
7
8
18
17
16
15
14
9 10 11 12 13
L20-2
2572 drw 03
PIN CONFIGURATIONS
FUNCTIONAL BLOCK DIAGRAM
MILITARY AND COMMERCIAL TEMPERATURE RANGES
IDT54/74FCT521T/AT/BT/CT
FAST CMOS 8-BIT IDENTITY COMPARATOR
6.16
2
PIN DESCRIPTION
2572 tbl 01
FUNCTION TABLE
(1)
NOTE:
2572 tbl 02
1. H = HIGH Voltage Level
L = LOW Voltage Level
*
A
0 =
B
0,
A
1 =
B
1,
A
2 =
B
2, etc.
ABSOLUTE MAXIMUM RATINGS
(1)
Symbol
Rating
Commercial
Military
Unit
V
TERM(2)
Terminal Voltage
with Respect to
GND
0.5 to +7.0
0.5 to +7.0
V
V
TERM(3)
Terminal Voltage
with Respect to
GND
0.5 to
V
CC
+0.5
0.5 to
V
CC
+0.5
V
T
A
Operating
Temperature
0 to +70
55 to +125
C
T
BIAS
Temperature
Under Bias
55 to +125
65 to +135
C
T
STG
Storage
Temperature
55 to +125
65 to +150
C
P
T
Power Dissipation
0.5
0.5
W
I
OUT
DC Output
Current
60 to +120 60 to +120 mA
2572 lnk 03
NOTES:
1. Stresses greater than those listed under ABSOLUTE MAXIMUM RAT-
INGS may cause permanent damage to the device. This is a stress rating
only and functional operation of the device at these or any other conditions
above those indicated in the operational sections of this specification is
not implied. Exposure to absolute maximum rating conditions for
extended periods may affect reliability. No terminal voltage may exceed
V
CC
by +0.5V unless otherwise noted.
2. Input and V
CC
terminals only.
3. Outputs and I/O terminals only.
CAPACITANCE
(T
A
= +25
C, f = 1.0MHz)
Symbol
Parameter
(1)
Conditions
Typ.
Max. Unit
C
IN
Input
Capacitance
V
IN
= 0V
6
10
pF
C
OUT
Output
Capacitance
V
OUT
= 0V
8
12
pF
NOTE:
1. This parameter is measured at characterization but not tested.
2572 lnk 04
DC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE
Following Conditions Apply Unless Otherwise Specified:
Commercial: T
A
= 0
C to +70
C, V
CC
= 5.0V
5%; Military: T
A
= 55
C to +125
C, V
CC
= 5.0V
10%
Symbol
Parameter
Test Conditions
(1)
Min.
Typ.
(2)
Max.
Unit
V
IH
Input HIGH Level
Guaranteed Logic HIGH Level
2.0
--
--
V
V
IL
Input LOW Level
Guaranteed Logic LOW Level
--
--
0.8
V
I
I H
Input HIGH Current
(4)
V
CC
= Max.
V
I
= 2.7V
--
--
1
A
I
I L
Input LOW Current
(4)
V
CC
= Max.
V
I
= 0.5V
--
--
1
A
I
I
Input HIGH Current
(4)
V
CC
= Max., V
I
= V
CC
(Max.)
--
--
1
A
V
IK
Clamp Diode Voltage
V
CC
= Min., I
N
= 18mA
--
0.7
1.2
V
I
OS
Short Circuit Current
V
CC
= Max.
(3)
, V
O
= GND
60
120
225
mA
V
OH
Output HIGH Voltage
V
CC
= Min.
V
IN
= V
IH
or V
IL
I
OH
= 6mA MIL.
I
OH
= 8mA COM'L.
2.4
3.3
--
V
I
OH
= 12mA MIL.
I
OH
= 15mA COM'L.
2.0
3.0
--
V
V
OL
Output LOW Voltage
V
CC
= Min.
V
IN
= V
IH
or V
IL
I
OL
= 32mA MIL.
I
OL
= 48mA COM'L.
--
0.3
0.5
V
V
H
Input Hysteresis
--
--
200
--
mV
I
CC
Quiescent Power Supply Current
V
CC
= Max.
V
IN
= GND or V
CC
--
0.01
1
mA
NOTES:
2572 tbl 05
1. For conditions shown as Max. or Min., use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at V
CC
= 5.0V, +25
C ambient.
3. Not more than one output should be shorted at one time. Duration of the short circuit test should not exceed one second.
4. The test limit for this parameter is
5
A at T
A
= -55
C.
Pin Names
Description
A
0
- A
7
Word A Inputs
B
0
- B
7
Word B Inputs
I
A
=
B
Expansion or Enable Input (Active LOW)
O
A
=
B
Identity Output (Active LOW)
Inputs
Output
I
I
A=B
A, B
O
O
A=B
L
L
H
H
A = B*
A
B
A = B*
A
B
L
H
H
H
IDT54/74FCT521T/AT/BT/CT
FAST CMOS 8-BIT IDENTITY COMPARATOR
MILITARY AND COMMERCIAL TEMPERATURE RANGES
6.16
3
POWER SUPPLY CHARACTERISTICS
2572 tbl 06
Symbol
Parameter
Test Conditions
(1)
Min.
Typ.
(2)
Max.
Unit
I
CC
Quiescent Power Supply
Current TTL
Inputs HIGH
V
CC
= Max.
V
IN
= 3.4V
(3)
--
0.5
2.0
mA
I
CCD
Dynamic Power Supply Current
(4)
V
CC
= Max.
Outputs Open
One Input Toggling
50% Duty Cycle
V
IN
= V
CC
V
IN
= GND
--
0.15
0.25
mA/
MHz
I
C
Total Power Supply Current
(5)
V
CC
= Max.
Outputs Open
V
IN
= V
CC
V
IN
= GND
--
1.5
3.5
mA
fi = 10MHz
One Bit Toggling
50% Duty Cycle
V
IN
= 3.4V
V
IN
= GND
--
1.8
4.5
NOTES:
1. For conditions shown as Max. or Min., use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at V
CC
= 5.0V, +25
C ambient.
3. Per TTL driven input (V
IN
= 3.4V). All other inputs at V
CC
or GND.
4. This parameter is not directly testable, but is derived for use in Total Power Supply Calculations.
5. Values for these conditions are examples of the I
CC
formula. These limits are guaranteed but not tested.
6. I
C
= I
QUIESCENT
+ I
INPUTS
+ I
DYNAMIC
I
C
= I
CC
+
I
CC
D
H
N
T
+ I
CCD
(f
CP/
2 + f
i
N
i
)
I
CC
= Quiescent Current
I
CC
= Power Supply Current for a TTL High Input (V
IN
= 3.4V)
D
H
= Duty Cycle for TTL Inputs High
N
T
= Number of TTL Inputs at D
H
I
CCD
= Dynamic Current Caused by an Input Transition Pair (HLH or LHL)
f
CP
= Clock Frequency for Register Devices (Zero for Non-Register Devices)
f
i
= Input Frequency
N
i
= Number of Inputs at f
i
All currents are in milliamps and all frequencies are in megahertz.
SWITCHING CHARACTERISTICS OVER OPERATING RANGE
NOTES:
2572 tbl 07
1. See test circuit and waveforms.
2. Minimum limits are guaranteed but not tested on Propagation Delays.
IDT54/74FCT521T
IDT54/74FCT521AT
IDT54/74FCT521BT
IDT54/74FCT521CT
Com'l.
Mil.
Com'l.
Mil.
Com'l.
Mil.
Com'l.
Mil.
Symbol
Parameter
Condition
(1) Min.
(2)
Max. Min.
(2)
Max. Min.
(2)
Max. Min.
(2)
Max. Min.
(2)
Max. Min.
(2)
Max. Min.
(2)
Max. Min.
(2)
Max.
Unit
t
PLH
t
PHL
Propagation
Delay
An or Bn to
O
A
=
B
CL = 50pF
RL = 500
1.5 11.0 1.5 15.0 1.5
7.2
1.5
9.5
1.5
5.5
1.5
7.3
1.5
4.5
1.5
5.1
ns
t
PLH
t
PHL
Propagation
Delay
I
A
=
B
to
O
A
=
B
1.5 10.0 1.5
9.0
1.5
6.0
1.5
7.8
1.5
4.6
1.5
6.0
1.5
4.1
1.5
4.5
ns
MILITARY AND COMMERCIAL TEMPERATURE RANGES
IDT54/74FCT521T/AT/BT/CT
FAST CMOS 8-BIT IDENTITY COMPARATOR
6.16
4
TEST CIRCUITS AND WAVEFORMS
TEST CIRCUITS FOR ALL OUTPUTS
ENABLE AND DISABLE TIMES
PROPAGATION DELAY
SET-UP, HOLD AND RELEASE TIMES
PULSE WIDTH
SWITCH POSITION
Pulse
Generator
R
T
D.U.T.
V
CC
V
IN
C
L
V
OUT
50pF
500
500
7.0V
3V
1.5V
0V
3V
1.5V
0V
3V
1.5V
0V
3V
1.5V
0V
DATA
INPUT
TIMING
INPUT
ASYNCHRONOUS CONTROL
PRESET
CLEAR
ETC.
SYNCHRONOUS CONTROL
t
SU
t
H
t
REM
t
SU
t
H
HIGH-LOW-HIGH
PULSE
LOW-HIGH-LOW
PULSE
t
W
1.5V
1.5V
SAME PHASE
INPUT TRANSITION
3V
1.5V
0V
1.5V
V
OH
t
PLH
OUTPUT
OPPOSITE PHASE
INPUT TRANSITION
3V
1.5V
0V
t
PLH
t
PHL
t
PHL
V
OL
CONTROL
INPUT
3V
1.5V
0V
3.5V
0V
OUTPUT
NORMALLY
LOW
OUTPUT
NORMALLY
HIGH
SWITCH
CLOSED
SWITCH
OPEN
V
OL
0.3V
0.3V
t
PLZ
t
PZL
t
PZH
t
PHZ
3.5V
0V
1.5V
1.5V
ENABLE
DISABLE
V
OH
PRESET
CLEAR
CLOCK ENABLE
ETC.
NOTES:
1. Diagram shown for input Control Enable-LOW and input Control Disable-
HIGH
2. Pulse Generator for All Pulses: Rate
1.0MHz; t
F
2.5ns; t
R
2.5ns
Test
Switch
Disable Low
Enable Low
Closed
All Other Tests
Open
Open Drain
DEFINITIONS:
C
L
=
Load capacitance: includes jig and probe capacitance.
R
T
=
Termination resistance: should be equal to Z
OUT
of the Pulse
Generator.
2572 drw 04
2572 drw 05
2572 drw 06
2572 drw 07
2572 drw 08
2572 lnk 08
IDT54/74FCT521T/AT/BT/CT
FAST CMOS 8-BIT IDENTITY COMPARATOR
MILITARY AND COMMERCIAL TEMPERATURE RANGES
6.16
5
ORDERING INFORMATION
IDT XX FCT
XXXX
Device Type
X
Package
X
Process
Blank
B
P
D
E
L
SO
P
Q
521T
521AT
521BT
521CT
Commercial
MIL-STD-883, Class B
Plastic DIP
CERDIP
CERPACK
Leadless Chip Carrier
Small Outline IC
Shrink Small Outline Package
Quarter-size Small Outline Package
8-Bit Comparator
54
74
55
C to +125
C
0
C to +70
C
Temp. Range
Blank
High Drive
X
Family
2572 drw 09
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