JUNE 2003
DSC-5297/03
1
2000 Integrated Device Technology, Inc.
Features
x
x
x
x
x
128K x 36, 256K x 18 memory configurations
x
x
x
x
x
Supports high system speed:
Commercial:
200MHz 3.1ns clock access time
Commercial and Industrial:
183MHz 3.3ns clock access time
166MHz 3.5ns clock access time
x
x
x
x
x
LBO input selects interleaved or linear burst mode
x
x
x
x
x
Self-timed write cycle with global write control (
GW), byte write
enable (
BWE), and byte writes (BWx)
x
x
x
x
x
3.3V core power supply
x
x
x
x
x
Power down controlled by ZZ input
x
x
x
x
x
2.5V I/O
x
x
x
x
x
Optional - Boundary Scan JTAG Interface (IEEE 1149.1
Compliant)
x
x
x
x
x
Packaged in a JEDEC Standard 100-pin plastic thin quad
flatpack (TQFP), 119 ball grid array (BGA) and 165 fine pitch ball
grid array
Description
The IDT71V25761/781 are high-speed SRAMs organized as 128K
x 36/256K x 18. The IDT71V25761/781 SRAMs contain write, data,
address and control registers. Internal logic allows the SRAM to generate
a self-timed write based upon a decision which can be left until the end of
the write cycle.
The burst mode feature offers the highest level of performance to the
system designer, as the IDT71V25761/718 can provide four cycles of data
for a single address presented to the SRAM. An internal burst address
counter accepts the first cycle address from the processor, initiating the
access sequence. The first cycle of output data will be pipelined for one
cycle before it is available on the next rising clock edge. If burst mode
operation is selected (
ADV=LOW), the subsequent three cycles of output
data will be available to the user on the next three rising clock edges. The
order of these three addresses are defined by the internal burst counter
and the
LBO input pin.
The IDT71V25761/781 SRAMs utilize IDT's latest high-performance
CMOS process and are packaged in a JEDEC standard 14mm x 20mm
100-pin thin plastic quad flatpack (TQFP) as well as a 119 ball grid array
(BGA) and 165 fine pitch ball grid array (fBGA).
Pin Description Summary
NOTE:
1.
BW
3
and
BW
4
are not applicable for the IDT71V25781.
A
0
-A
17
Address Inputs
Input
Synchronous
CE
Chip Enable
Input
Synchronous
CS
0
,
CS
1
Chip Selects
Input
Synchronous
OE
Output Enable
Input
Asynchronous
GW
Global Write Enable
Input
Synchronous
BWE
Byte Write Enable
Input
Synchronous
BW
1
,
BW
2
,
BW
3
,
BW
4
(1)
Individual Byte Write Selects
Input
Synchronous
CLK
Clock
Input
N/A
ADV
Burst Address Advance
Input
Synchronous
ADSC
Address Status (Cache Controller)
Input
Synchronous
ADSP
Address Status (Processor)
Input
Synchronous
LBO
Linear / Interleaved Burst Order
Input
DC
TMS
Test Mode Select
Input
Synchronous
TDI
Test Data Input
Input
Synchronous
TCK
Test Clock
Input
N/A
TDO
Test Data Output
Output
Synchronous
TRST
JTAG Reset (Optional)
Input
Asynchronous
ZZ
Sleep Mode
Input
Asynchronous
I/O
0
-I/O
31
, I/O
P1
-I/O
P4
Data Input / Output
I/O
Synchronous
V
DD
, V
DDQ
Core Power, I/O Power
Supply
N/A
V
SS
Ground
Supply
N/A
5297 tbl 01
128K X 36, 256K X 18
3.3V Synchronous SRAMs
2.5V I/O, Pipelined Outputs,
Burst Counter, Single Cycle Deselect
IDT71V25761S
IDT71V25781S
IDT71V25761SA
IDT71V25781SA
6.42
2
IDT71V25761, IDT71V25781, 128K x 36, 256K x 18, 3.3V Synchronous SRAMs with
2.5V I/O, Pipelined Outputs, Burst Counter, Single Cycle Deselect Commercial and Industrial Temperature Ranges
Symbol
Pin Function
I/O
Active
Description
A
0
-A
17
Address Inputs
I
N/A
Synchronous Address inputs. The address register is triggered by a combination of the rising edge of CLK
and
ADSC Low or ADSP Low and CE Low.
ADSC
Address Status
(Cache Controller)
I
LOW
Synchronous Ad dress Status from Cache Controller.
ADSC is an active LOW input that is used to load the
address registers with new addresses.
ADSP
Address Status
(Processor)
I
LOW
Synchrono us Address Status from Processor.
ADSP is an active LOW input that is used to load the address
registers with new addresses.
ADSP is gated by CE.
ADV
Burst Address
Advance
I
LOW
Synchronous Address Advance.
ADV is an active LOW input that is used to advance the internal burst
counter, controlling burst access after the initial address is loaded. When the input is HIGH the burst counter is
not incremented; that is, there is no address advance.
BWE
Byte Write Enable
I
LOW
Synchronous byte write enable gates the byte write inputs
BW
1
-
BW
4
. If
BWE is LOW at the rising edge of CLK
then
BWx inputs are passed to the next stage in the circuit. If BWE is HIGH then the byte write inputs are
blocked and only
GW can initiate a write cycle.
BW
1
-
BW
4
Individual Byte
Write Enables
I
LOW
Synchronous byte write enables.
BW
1
controls I/O
0-7
, I/O
P1
,
BW
2
controls I/O
8-15
, I/O
P2
, etc. Any active byte
write causes all outputs to be disabled.
CE
Chip Enable
I
LOW
Synchronous chip enable.
CE is used with CS
0
and
CS
1
to enable the IDT71V25761/781.
CE also gates ADSP.
CLK
Clock
I
N/A
This is the clock input. All timing references for the device are made with respect to this input.
CS
0
Chip Select 0
I
HIGH
Synchronous active HIGH chip select. CS
0
is used with
CE and CS
1
to enable the chip.
CS
1
Chip Select 1
I
LOW
Synchronous active LOW chip select.
CS
1
is used with
CE and CS
0
to enable the chip.
GW
Global Write
Enable
I
LOW
Synchronous global write enable. This input will write all four 9-bit data bytes when LOW on the rising edge of
CLK.
GW supersedes individual byte write enables.
I/O
0
-I/O
31
I/O
P1
-I/O
P4
Data Input/Output
I/O
N/A
Synchronous data input/output (I/O) pins. Both the data input path and data output path are registered and
triggered by the rising edge of CLK.
LBO
Linear Burst Order
I
LOW
Asynchronous burst order selection input. When
LBO is HIGH, the interleaved burst sequence is selected.
When
LBO is LOW the Linear burst sequence is selected. LBO is a static input and must not change state
while the device is operating.
OE
Output Enable
I
LOW
Asynchronous output enable. When
OE is LOW the data output drivers are enabled on the I/O pins if the chip
is also selected. When
OE is HIGH the I/O pins are in a high-impedance state.
TMS
Test ModeSelect
I
N/A
Gives input command for TAP controller. Sampled on rising edge of TDK. This pin has an internal pullup.
TDI
Test Data Input
I
N/A
Serial input of registers placed between TDI and TDO. Sampled on rising edge of TCK. This pin has an
internal pullup.
TCK
Test Clock
I
N/A
Clock input of TAP controller. Each TAP event is clocked. Test inputs are captured o n rising edge of TCK,
while test outputs are d riven from the falling edge of TCK. This pin has an internal pullup.
TDO
Test DataOutput
O
N/A
Serial output of registers placed between TDI and TDO. This output is active depending on the state of the
TAP controller.
TRST
JTAG Reset
(Optional)
I
LOW
Optional Asynchronous JTAG reset. Can be used to reset the TAP controller, but not required. JTAG reset
occurs automatically at power up and also resets using TMS and TCK per IEEE 1149.1. If not used
TRST can
be left floating. This pin has an internal pullup. Only available in BGA package.
ZZ
Sleep Mode
I
HIGH
Asynchronous sleep mode input. ZZ HIGH will gate the CLK internally and power down the IDT71V25761/781
to its lowest power consumption level. Data retention is guaranteed in Sleep Mode.This pin has an internal
pull down.
V
DD
Power Supply
N/A
N/A
3.3V core power supply.
V
DDQ
Power Supply
N/A
N/A
2.5V I/O Supply.
V
SS
Ground
N/A
N/A
Ground.
NC
No Connect
N/A
N/A
NC pins are not electrically connected to the device.
5297 tbl 02
Pin Definitions
(1)
NOTE:
1. All synchronous inputs must meet specified setup and hold times with respect to CLK.
6.42
IDT71V25761, IDT71V25781, 128K x 36, 256K x 18, 3.3V Synchronous SRAMs with
2.5V I/O, Pipelined Outputs, Burst Counter, Single Cycle Deselect Commercial and Industrial Temperature Ranges
3
Functional Block Diagram
A
0 -
A
16/17
ADDRESS
REGISTER
CLR
A1*
A0*
17/18
2
17/18
A
2 -
A
17
128K x 36/
256K x 18-
BIT
MEMORY
ARRAY
INTERNAL
ADDRESS
A
0
,A
1
BW
4
BW
3
BW
2
BW
1
Byte 1
Write Register
36/18
36/18
ADSP
ADV
CLK
ADSC
CS
0
CS
1
Byte 1
Write Driver
Byte 2
Write Driver
Byte 3
Write Driver
Byte 4
Write Driver
Byte 2
Write Register
Byte 3
Write Register
Byte 4
Write Register
9
9
9
9
GW
CE
BWE
LBO
I/O
0
-- I/O
31
I/O
P1
-- I/O
P4
OE
DATA INPUT
REGISTER
36/18
OUTPUT
BUFFER
OUTPUT
REGISTER
D
Q
D
Q
Enable
Register
Enable
Delay
Register
OE
Burst
Sequence
CEN
CLK EN
CLK EN
Q1
Q0
2
Burst
Logic
Binary
Counter
5297 drw 01
ZZ
Powerdown
,
JTAG
(SA Version)
TMS
TDI
TCK
TRST
(Optional)
TDO
6.42
4
IDT71V25761, IDT71V25781, 128K x 36, 256K x 18, 3.3V Synchronous SRAMs with
2.5V I/O, Pipelined Outputs, Burst Counter, Single Cycle Deselect Commercial and Industrial Temperature Ranges
100 pin TQFP Capacitance
(T
A
= +25C, f = 1.0MHz)
Recommended DC Operating
Conditions
Recommended Operating
Temperature and Supply Voltage
Absolute Maximum Ratings
(1)
NOTES:
1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may
cause permanent damage to the device. This is a stress rating only and functional
operation of the device at these or any other conditions above those indicated
in the operational sections of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect reliability.
2. V
DD
terminals only.
3. V
DDQ
terminals only.
4. Input terminals only.
5. I/O terminals only.
6. This is a steady-state DC parameter that applies after the power supplies have
ramped up. Power supply sequencing is not necessary; however, the voltage
on any input or I/O pin cannot exceed V
DDQ
during power supply ramp up.
7. T
A
is the "instant on" case temperature.
NOTES:
1. V
IH
(max) = V
DDQ
+ 1.0V for pulse width less than t
CYC/2
, once per cycle.
2. V
IL
(min) = -1.0V for pulse width less than t
CYC/2
, once per cycle.
NOTE:
1. This parameter is guaranteed by device characterization, but not production tested.
Symbol
Rating
Commercial &
Industrial
Unit
V
TERM
(2)
Terminal Voltage with
Respect to GND
-0.5 to +4.6
V
V
TERM
(3,6)
Terminal Voltage with
Respect to GND
-0.5 to V
DD
V
V
TERM
(4,6)
Terminal Voltage with
Respect to GND
-0.5 to V
DD
+0.5
V
V
TERM
(5,6)
Terminal Voltage with
Respect to GND
-0.5 to V
DDQ
+0.5
V
T
A
(7)
Commercial
Operating Temperature
-0 to +70
o
C
Industrial
Operating Temperature
-40 to +85
o
C
T
BIAS
Temperature
Under Bias
-55 to +125
o
C
T
STG
Storage
Temperature
-55 to +125
o
C
P
T
Power Dissipation
2.0
W
I
OUT
DC Output Current
50
mA
5297 tbl 03
Grade
Temperature
(1)
V
SS
V
DD
V
DDQ
Commercial
0C to +70C
0V
3.3V5%
2.5V5%
Industrial
-40C to +85C
0V
3.3V5%
2.5V5%
5297 tbl 04
Symbol
Parameter
Min.
Typ.
Max.
Unit
V
DD
Core Supply Voltage
3.135
3.3
3.465
V
V
DDQ
I/O Supply Voltage
2.375
2.5
2.625
V
V
SS
Supply Voltage
0
0
0
V
V
IH
Input High Voltage -
Inputs
1.7
____
V
DD
+0.3
V
V
IH
Input High Voltage - I/O
1.7
____
V
DDQ
+0.3
(1)
V
V
IL
Input Low Voltage
-0.3
(2)
____
0.7
V
5297 tbl 05
Symbol
Parameter
(1)
Conditions
Max.
Unit
C
IN
Input Capacitance
V
IN
= 3dV
5
pF
C
I/O
I/O Capacitance
V
OUT
= 3dV
7
pF
5297 tbl 07
NOTES:
1. T
A
is the "instant on" case temperature.
119 BGA Capacitance
(T
A
= +25C, f = 1.0MHz)
Symbol
Parameter
(1)
Conditions
Max.
Unit
C
IN
Input Capacitance
V
IN
= 3dV
7
pF
C
I/O
I/O Capacitance
V
OUT
= 3dV
7
pF
5297 tbl 07a
165 fBGA Capacitance
(T
A
= +25C, f = 1.0MHz)
Symbol
Parameter
(1)
Conditions
Max.
Unit
C
IN
Input Capacitance
V
IN
= 3dV
7
pF
C
I/O
I/O Capacitance
V
OUT
= 3dV
7
pF
5297 tbl 07b
6.42
IDT71V25761, IDT71V25781, 128K x 36, 256K x 18, 3.3V Synchronous SRAMs with
2.5V I/O, Pipelined Outputs, Burst Counter, Single Cycle Deselect Commercial and Industrial Temperature Ranges
5
Pin Configuration 128K x 36
100 TQFP
Top View
NOTES:
1. Pin 14 can either be directly connected to V
DD
, or connected to an input voltage
V
IH
, or left unconnected.
2. Pin 64 can be left unconnected and the device will always remain in active mode.
100 99 98 97 96 95 94 93 92 91 90
87 86 85 84 83 82 81
89 88
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
A
6
A
7
C
E
C
S
0
B
W
4
B
W
3
B
W
2
B
W
1
C
S
1
V
D
D
V
S
S
C
LK
G
W
B
W
E
O
E
A
D
S
C
A
D
S
P
A
D
V
A
8
A
9
31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50
N
C
N
C
N
C
LB
O
A
14
A
13
A
12
A
11
A
10
V
D
D
V
S
S
A
0
A
1
A
2
A
3
A
4
A
5
I/O
31
I/O
30
V
DDQ
V
SS
I/O
29
I/O
28
I/O
27
I/O
26
V
SS
V
DDQ
I/O
25
I/O
24
V
SS
V
DD
I/O
23
I/O
22
V
DDQ
V
SS
I/O
21
I/O
20
I/O
19
I/O
18
V
SS
V
DDQ
I/O
17
I/O
16
80
79
78
77
76
75
74
73
72
71
70
69
68
67
66
65
64
63
62
61
60
59
58
57
56
55
54
53
52
51
I/O
14
V
DDQ
V
SS
I/O
13
I/O
12
I/O
11
I/O
10
V
SS
V
DDQ
I/O
9
I/O
8
V
SS
V
DD
I/O
7
I/O
6
V
DDQ
V
SS
I/O
5
I/O
4
I/O
3
I/O
2
V
SS
V
DDQ
I/O
1
I/O
0
5297 drw 02
V
DD
/NC
(1)
I/O
15
I/O
P3
NC
I/O
P4
A
15
A
16
I/O
P1
NC
I/O
P2
ZZ
(2)
,
N
C
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