ChipFind - документация

Электронный компонент: QS74FCT153ATSO

Скачать:  PDF   ZIP
INDUSTRIAL TEMPERATURE RANGE
IDTQS74FCT153AT/CT
HIGH-SPEED CMOS DUAL 4-INPUT MULTIPLEXER
1
FEBRUARY 2001
INDUSTRIAL TEMPERATURE RANGE
The IDT logo is a registered trademark of Integrated Device Technology, Inc.
2001 Integrated Device Technology, Inc.
DSC-5230/1
FEATURES:
CMOS power levels: <7.5mW static
Undershoot clamp diodes on all inputs
True TTL input and output compatibility
Ground bounce controlled outputs
Reduced output swing of 0 to 3.5V
A and C grades with 4.5ns t
PD
for C
I
OL
= 48mA
Available in SOIC and QSOP packages
FUNCTIONAL BLOCK DIAGRAM
IDTQS74FCT153AT/CT
HIGH-SPEED CMOS
DUAL 4-INPUT
MULTIPLEXER
DESCRIPTION:
The IDTQS74FCT153T is a high-speed CMOS TTL-compatible dual
4-input multiplexer. All inputs have clamp diodes for undershoot noise
suppression. All outputs have ground bounce suppression. Outputs will
not load an active bus when Vcc is removed from the device.
YA
EB
YB
EA
S1
S0
I0A
I1A
I2A
I3A
I0B
I1B
I2B
I3B
INDUSTRIAL TEMPERATURE RANGE
2
IDTQS74FCT153AT/CT
HIGH-SPEED CMOS DUAL 4-INPUT MULTIPLEXER
PIN CONFIGURATION
Symbol
Description
Max
Unit
V
TERM
Terminal Voltage with Respect to GND
0.5 to +7
V
T
STG
Storage Temperature
65 to +150
C
I
OUT
DC Output Current Max Current Sink/Pin
+120
mA
I
IK
Input Diode Current, V
IN
< 0
-20
mA
I
OK
DC Output Current, V
OUT
< 0
-50
mA
ABSOLUTE MAXIMUM RATINGS
(1)
NOTE:
1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause
permanent damage to the device. This is a stress rating only and functional operation
of the device at these or any other conditions above those indicated in the operational
sections of this specification is not implied. Exposure to absolute maximum rating
conditions for extended periods may affect reliability.
Symbol
Parameter
(1)
Conditions
Typ.
Max.
Unit
C
IN
Input Capacitance
V
IN
= 0V
4
--
pF
C
OUT
Output Capacitance
V
OUT
= 0V
8
--
pF
CAPACITANCE
(T
A
= +25C, F = 1.0MHz)
NOTE:
1. This parameter is measured at characterization but not tested.
SOIC/ QSOP
TOP VIEW
Pin Names
I/O
Description
Ixx
I
Data In
S
0
- S
1
I
Select
EA, EB
I
Enable
YA, YB
O
Data Out
PIN DESCRIPTION
NOTE:
1. H = HIGH Voltage Level
X = Don't Care
L = LOW Voltage Level
FUNCTION TABLE
(1)
Enable
Inputs
Output
EA
EB
S
1
S
0
YA
YB
Function
H
X
X
X
L
X
Disable A
X
H
X
X
X
L
Disable B
L
L
L
L
1
0A
1
0B
S
1
- 0 = 0
L
L
L
H
1
1A
1
1B
S
1
- 0 = 1
L
L
H
L
1
2A
1
2B
S
1
- 0 = 2
L
L
H
H
1
3A
1
3B
S
1
- 0 = 3
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
1
EA
S
1
GND
YA
I
1A
I
0A
I
3A
EB
S
0
I
3B
I
2B
I
1B
I
0B
YB
V
CC
I
2A
INDUSTRIAL TEMPERATURE RANGE
IDTQS74FCT153AT/CT
HIGH-SPEED CMOS DUAL 4-INPUT MULTIPLEXER
3
Symbol
Parameter
Test Conditions
Min.
Typ.
(1)
Max.
Unit
V
IH
Input HIGH Level
Guaranteed Logic HIGH Level
2
--
--
V
V
IL
Input LOW Level
Guaranteed Logic LOW Level
--
--
0.8
V
V
T
Input Hysteresis
V
TLH
- V
THL
for all inputs
--
0.2
--
V
I
IH
Input HIGH Current
V
CC
= Max.
0
V
IN
V
CC
--
--
5
A
I
IL
Input LOW Current
I
OS
Short Circuit Current
V
CC
= Max., V
OUT
= GND
(2)
60
--
--
mA
V
IC
Input Clamp Voltage
V
CC
= Min., I
IN
= 18mA, T
A
= 25C
(2)
--
0.7
1.2
V
V
OH
Output HIGH Voltage
V
CC
= Min.
I
OH
= 15mA
2.4
--
--
V
V
OL
Output LOW Voltage
V
CC
= Min.
I
OL
= 48mA
--
--
0.5
V
DC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE
Following Conditions Apply Unless Otherwise Specified:
Industrial: T
A
= 40C to +85C, V
CC
= 5.0V 5%
NOTES:
1. Typical values are at V
CC
= 5.0V, +25C ambient.
2. This parameter is guaranteed but not tested.
Symbol
Parameter
Test Conditions
(1)
Min.
Max.
Unit
I
CC
Quiescent Power Supply Current
V
CC
= Max.
--
1.5
mA
freq = 0
0V
V
IN
0.2V or
V
CC
- 0.2V
V
IN
V
CC
I
CC
Supply Current per Input TTL Inputs HIGH
V
CC
= Max.
--
2
mA
V
IN
= 3.4V
(2)
freq = 0
I
CCD
Supply Current per Input per MHz
V
CC
= Max.
--
0.25
mA/
Outputs Open and Enabled
MHz
One Bit Toggling
50% Duty Cycle
Other inputs at GND or V
CC(3,4)
NOTES:
1. For conditions shown as Min. or Max., use appropriate value specified under DC Electrical Characteristics.
2. Per TTL driven input (V
IN
= 3.4V).
3. For flip-flops, I
CCD
is measured by switching one of the data input pins so that the output changes every clock cycle. This is a measurement of device power consumption
only and does not include power to drive load capacitance or tester capacitance.
4. I
C
= I
QUIESCENT
+ I
INPUTS
+ I
DYNAMIC
I
C
= I
CC
+
I
CC
D
H
N
T
+ I
CCD
(f
CP
/2 + f
i
N
i
)
I
CC
= Quiescent Current
I
CC
= Power Supply Current for a TTL High Input (V
IN
= 3.4V)
D
H
= Duty Cycle for TTL Inputs High
N
T
= Number of TTL Inputs at D
H
I
CCD
= Dynamic Current caused by an Output Transition Pair (HLH or LHL)
f
CP
= Clock Frequency for Register Devices (Zero for Non-Register Devices)
f
i
= Output Frequency
N
i
= Number of Outputs at f
i
All currents are in milliamps and all frequencies are in megahertz.
POWER SUPPLY CHARACTERISTICS
INDUSTRIAL TEMPERATURE RANGE
4
IDTQS74FCT153AT/CT
HIGH-SPEED CMOS DUAL 4-INPUT MULTIPLEXER
NOTE:
1. C
LOAD
= 50pF, R
LOAD
= 500
unless otherwise noted.
74FCT153AT
74FCT153CT
Symbol
Parameter
Min.
Max.
Min.
Max.
Unit
t
PLH
Propagation Delay
1.5
5.2
1.5
4.5
ns
t
PHL
Ixx to Y
t
PLH
Propagation Delay
1.5
6.6
1.5
5.6
ns
t
PHL
Sx to Y
t
PLH
Propagation Delay
1.5
5.2
1.5
4.8
ns
t
PHL
E to Y
SWITCHING CHARACTERISTICS OVER OPERATING RANGE
(1)
INDUSTRIAL TEMPERATURE RANGE
IDTQS74FCT153AT/CT
HIGH-SPEED CMOS DUAL 4-INPUT MULTIPLEXER
5
Pulse
G enerator
R
T
D.U .T.
V
C C
V
IN
C
L
V
O UT
50pF
500
500
7.0V
3V
1.5V
0V
3V
1.5V
0V
3V
1.5V
0V
3V
1.5V
0V
DATA
IN PUT
TIM ING
INPU T
ASYNC HR O NOU S C ON TROL
PRES ET
C LEA R
ETC.
SYN CH RON OUS C ON TR OL
t
SU
t
H
t
R E M
t
SU
t
H
HIG H-LOW -H IGH
PU LS E
LOW -HIGH -LOW
PU LS E
t
W
1.5V
1.5V
SAM E PHA SE
IN PU T TR ANSITIO N
3V
1.5V
0V
1.5V
V
O H
t
PL H
O UTPU T
OPPOS ITE PH ASE
IN PU T TR ANSITIO N
3V
1.5V
0V
t
P LH
t
PH L
t
PH L
V
O L
CON TRO L
IN PUT
3V
1.5V
0V
3.5V
0V
OU TPUT
NO RM ALLY
LOW
OU TPUT
NO RM ALLY
HIGH
SW ITC H
C LOSE D
SW ITCH
OPEN
V
O L
0.3V
0.3V
t
PLZ
t
PZL
t
P ZH
t
PH Z
3.5V
0V
1.5V
1.5V
ENAB LE
D ISA BLE
V
OH
PRES ET
C LEA R
CLOCK ENABLE
ETC.
FCTL link
FCTL link
FCTL link
FCTL link
FCTL link
TEST CIRCUITS AND WAVEFORMS
Propagation Delay
Test Circuits for All Outputs
Enable and Disable Times
Set-Up, Hold, and Release Times
Pulse Width
NOTES:
1. Diagram shown for input Control Enable-LOW and input Control Disable-HIGH.
2. Pulse Generator for All Pulses: Rate
1.0MHz; t
F
2.5ns; t
R
2.5ns.
Test
Switch
Open Drain
Disable Low
Closed
Enable Low
All Other Tests
Open
SWITCH POSITION
DEFINITIONS:
C
L
= Load capacitance: includes jig and probe capacitance.
R
T
= Termination resistance: should be equal to Z
OUT
of the Pulse Generator.
INDUSTRIAL TEMPERATURE RANGE
6
IDTQS74FCT153AT/CT
HIGH-SPEED CMOS DUAL 4-INPUT MULTIPLEXER
ORDERING INFORMATION
CORPORATE HEADQUARTERS
for SALES:
for Tech Support:
2975 Stender Way
800-345-7015 or 408-727-6116
logichelp@idt.com
Santa Clara, CA 95054
fax: 408-492-8674
(408) 654-6459
www.idt.com
IDTQS
XX
FCT
XXXX
XX
Package
Device Type
SO
Q
Small Outline IC (gull wing)
Quarter Size Small Outline Package
High-Speed CMOS Dual 4-Input Multiplexer
153AT
153CT
Temp. Range
74
40C to +85C