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Электронный компонент: ACS630KMSR

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CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.
1-888-INTERSIL or 321-724-7143 | Copyright Intersil Corporation 1999
TM
ACS630MS
Radiation Hardened EDAC
(Error Detection and Correction Circuit)
Features
Devices QML Qualified in Accordance with MIL-PRF-38535
Detailed Electrical and Screening Requirements are Contained in
SMD# 5962-96711 and Intersil' QM Plan
1.25 Micron Radiation Hardened SOS CMOS
Total Dose . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . >300K RAD (Si)
Single Event Upset (SEU) Immunity: <1 x 10
-10
Errors/Bit/Day
(Typ)
SEU LET Threshold . . . . . . . . . . . . . . . . . . . . . . . >100 MEV-cm
2
/mg
Dose Rate Upset . . . . . . . . . . . . . . . . >10
11
RAD (Si)/s, 20ns Pulse
Dose Rate Survivability . . . . . . . . . . . >10
12
RAD (Si)/s, 20ns Pulse
Latch-Up Free Under Any Conditions
Military Temperature Range . . . . . . . . . . . . . . . . . . -55
o
C to +125
o
C
Significant Power Reduction Compared to ALSTTL Logic
DC Operating Voltage Range . . . . . . . . . . . . . . . . . . . . 4.5V to 5.5V
Input Logic Levels
- VIL = 30% of VCC Max
- VIH = 70% of VCC Min
Input Current
1
A at VOL, VOH
Fast Propagation Delay . . . . . . . . . . . . . . . . 37ns (Max), 24ns (Typ)
Description
The Intersil ACS630MS is a Radiation Hardened 16-bit parallel error
detection and correction circuit. It uses a modified Hamming code to gen-
erate a 6-bit check word from each 16-bit data word. The check word is
stored with the data word during a memory write cycle; during a memory
read cycle a 22-bit word is taken form memory and checked for errors.
Single bit errors in the data words are flagged and corrected. Single bit
errors in check words are flagged but not corrected. The position of the
incorrect bit is pinpointed, in both cases, by the 6-bit error syndrome
code which is output during the error correction cycle.
The ACS630MS utilizes advanced CMOS/SOS technology to achieve
high-speed operation. This device is a member of a radiation hardened,
high-speed, CMOS/SOS Logic Family.
The ACS630MS is supplied in a 28 lead Ceramic Flatpack (K suffix) or a
28 Lead Ceramic Dual-In-Line Package (D suffix).
January 1996
Ordering Information
PART NUMBER
TEMPERATURE RANGE
SCREENING LEVEL
PACKAGE
5962F9671101VXC
-55
o
C to +125
o
C
MIL-PRF-38535 Class V
28 Lead SBDIP
5962F9671101VYC
-55
o
C to +125
o
C
MIL-PRF-38535 Class V
28 Lead Ceramic Flatpack
ACS630D/Sample
25
o
C
Sample
28 Lead SBDIP
ACS630K/Sample
25
o
C
Sample
28 Lead Ceramic Flatpack
ACS630HMSR
25
o
C
Die
Die
Pinouts
28 PIN CERAMIC DUAL-IN-LINE, MIL-STD-1835
DESIGNATOR CDIP2-T28, LEAD FINISH C
TOP VIEW
28 PIN CERAMIC FLATPACK, MIL-STD-1835
DESIGNATOR CDFP3-F28, LEAD FINISH C
TOP VIEW
DEF
DB0
DB1
DB2
DB3
DB4
DB5
DB6
DB7
DB8
DB9
DB10
DB11
GND
VCC
S1
S0
CB0
CB1
CB3
CB5
DB15
DB14
DB13
DB12
SEF
CB2
CB4
28
27
26
25
24
23
22
21
20
19
18
17
16
15
1
2
3
4
5
6
7
8
9
10
11
12
13
14
1
14
28
15
DEF
DB0
DB1
DB2
DB3
DB4
DB5
DB6
DB7
DB8
DB9
DB10
DB11
GND
VCC
SEF
S1
S0
CB0
CB1
CB2
CB3
CB4
CB5
DB15
DB14
DB13
DB12
2
3
4
5
6
7
8
9
10
11
12
13
27
26
25
24
23
22
21
20
19
18
17
16
Spec Number
518781
File Number
3199.1
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2
ACS630MS
Function Tables
Control Functions
MEMORY
CYCLE
CONTROL
EDAC FUNCTION
DATA I/O
CHECKWORD
ERROR FLAGS
S1
S0
SEF
DEF
WRITE
Low
Low
Generates Checkword
Input Data
Output Checkword
Low
Low
READ
Low
High
Read Data and Check-
word
Input Data
Input Checkword
Low
Low
READ
High
High
Latch and Flag Error
Latch Data
Latch Checkword
Enabled
Enabled
READ
High
Low
Correct Data Word and
Generate Syndrome Bits
Output Corrected
Data
Output Syndrome
Bits
Enabled
Enabled
Check Word Generation
CHECKWORD BIT
16-BIT DATA WORD
0
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
CB0
X
X
X
X
X
X
X
X
CB1
X
X
X
X
X
X
X
X
CB2
X
X
X
X
X
X
X
X
CB3
X
X
X
X
X
X
X
X
CB4
X
X
X
X
X
X
X
X
CB5
X
X
X
X
X
X
X
X
NOTE: The six check bits are parity bits derived from the matrix of data bits as indicated by "x" for each bit
Error Syndrome Codes
SYNDROME
ERROR
CODE
ERROR LOCATIONS
DB
CB
NO
ERROR
0
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
0
1
2
3
4
5
CB0
L
L
H
L
L
H
H
H
L
L
L
H
H
L
H
H
L
H
H
H
H
H
H
CB1
L
H
L
L
H
L
L
H
L
H
H
L
H
H
L
H
H
L
H
H
H
H
H
CB2
H
L
L
H
L
L
H
L
H
L
H
H
L
H
H
L
H
H
L
H
H
H
H
CB3
L
L
L
H
H
H
L
L
H
H
L
L
L
H
H
H
H
H
H
L
H
H
H
CB4
H
H
H
L
L
L
L
L
H
H
H
H
H
L
L
L
H
H
H
H
L
H
H
CB5
H
H
H
H
H
H
H
H
L
L
L
L
L
L
L
L
H
H
H
H
H
L
H
Error Functions
TOTAL NUMBER OF ERRORS
ERROR FLAGS
DATA CORRECTION
16-BIT DATA
6-BIT CHECKWORD
SEF
DEF
0
0
Low
Low
Not Applicable
1
0
High
Low
Correction
0
1
High
Low
Correction
1
1
High
High
Interrupt
2
0
High
High
Interrupt
0
2
High
High
Interrupt
Spec Number
518781
3
ACS630MS
Die Characteristics
DIE DIMENSIONS:
171 mils x 159 mils
4340mm x 4040mm
METALLIZATION:
Type: AlSi
Metal 1 Thickness: 7.125k
1.125k
Metal 2 Thickness: 9k
1k
GLASSIVATION:
Type: SiO
2
Thickness: 8k
1k
WORST CASE CURRENT DENSITY:
<2.0 x 10
5
A/cm
2
BOND PAD SIZE:
110
m x 110
m
4.4 mils x 4.4 mils
Metallization Mask Layout
ACS630MS
DEF
DB0
DB1
DB2
VCC SEF
S1
(15)
(14)
(13)
(12)
(16)
(17) (118)
DB3 (5)
DB4 (6)
DB5 (7)
DB6 (8)
DB7 (9)
DB8 (10)
DB9 (11)
(25) S0
(24) CB0
(23) CB1
(22) CB2
(21) CB3
(20) CB4
(19) CB5
(4)
(3)
(2)
(1)
(28)
(27) (26)
DB10 DB11 GND DB12 DB13 DB14 DB15
Spec Number
518781