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Электронный компонент: CD4097BMS

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7-1
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.
1-888-INTERSIL or 321-724-7143 | Copyright Intersil Corporation 1999
Pinout
CD4067BMS
TOP VIEW
CD4097BMS
TOP VIEW
1
2
3
4
5
6
7
8
9
10
11
12
COMMON OUT/IN
7
6
5
4
3
2
1
0
A
B
VSS
16
17
18
19
20
21
22
23
24
15
14
13
VDD
9
10
11
12
14
INHIBIT
C
D
8
13
15
*
*
*
CHANNEL
IN/OUT
1
2
3
4
5
6
7
8
9
10
11
12
COMMON X
7
6
5
4
3
2
1
0
A
B
VSS
16
17
18
19
20
21
22
23
24
15
14
13
VDD
1
2
3
4
COMMON Y
7
C
INHIBIT
0
5
6
CHANNEL X
Y CHANNEL
OUT/IN
IN/OUT
OUT/IN
IN/OUT
Y CHANNEL
IN/OUT
Features
High Voltage Types (20V Rating)
CD4067BMS Single 16 Channel Multiplexer/Demultiplexer
CD4097BMS Differential 8 Channel Multiplexer/Demulti-
plexer
Low ON Resistance: 125
(typ) Over 15Vp-p Signal
Input Range for VDD - VSS = 15V
High OFF Resistance: Channel Leakage of
10pA (typ)
at VDD - VSS = 18V
Matched Switch Characteristics: RON = 5
(typ) for
VDD - VSS = 15V
Very Low Quiescent Power Dissipation Under All Digi-
tal Control Input and Supply Conditions: 0.2
W (typ)
at VDD - VSS = 10V
Binary Address Decoding on Chip
5V, 10V and 15V Parametric Ratings
100% Tested for Quiescent Current at 20V
Maximum Input Current of 1
A at 18V Over Full Pack-
age Temperature Range; 100nA at 18V and +25
o
C
Standardized Symmetrical Output Characteristics
Applications
Analog and Digital Multiplexing and Demultiplexing
A/D and D/A Conversion
Signal Gating
* When these devices are used as demultiplexers the "CHANNEL
IN/OUT" terminals are the outputs and the "COMMON OUT/IN" ter-
minals are the inputs.
Description
CD4067BMS and CD4097BMS CMOS analog multiplexers/
demultiplexers* are digitally controlled analog switches having
low ON Impedance, low OFF leakage current, and internal
address decoding. In addition, the ON resistance is relatively
constant over the full input-signal range.
The CD4067BMS is a 16 channel multiplexer with four binary
control inputs, A, B, C, D and an inhibit input, arranged so that
any combination of the inputs selects one switch.
The CD4097BMS is a differential 8 channel multiplexer having
three binary control inputs A, B, C and an inhibit input. The inputs
permit selection of one of eight pairs of switches. A logic "1"
present at the inhibit input turns all channels off.
The CD4067BMS and CD4097BMS are supplied in these 24
lead outline packages:
Braze Seal DIP
*H4V
H6M
Frit Seal DIP
*H1Z
HFN
Ceramic Flatpack
*H4P
H4P
*CD4067B Only
CD4097B
December 1992
CD4067BMS
CD4097BMS
CMOS Analog
Multiplexers/Demultiplexers
File Number
3190
7-2
Specifications CD4067BMS, CD4097BMS
Absolute Maximum Ratings
Reliability Information
DC Supply Voltage Range, (VDD) . . . . . . . . . . . . . . . -0.5V to +20V
(Voltage Referenced to VSS Terminals)
Input Voltage Range, All Inputs . . . . . . . . . . . . .-0.5V to VDD +0.5V
DC Input Current, Any One Input
. . . . . . . . . . . . . . . . . . . . . . . .
10mA
Operating Temperature Range . . . . . . . . . . . . . . . . -55
o
C to +125
o
C
Package Types D, F, K, H
Storage Temperature Range (TSTG) . . . . . . . . . . . -65
o
C to +150
o
C
Lead Temperature (During Soldering) . . . . . . . . . . . . . . . . . +265
o
C
At Distance 1/16
1/32 Inch (1.59mm
0.79mm) from case for
10s Maximum
Thermal Resistance . . . . . . . . . . . . . . . .
ja
jc
Ceramic DIP and FRIT Package . . . . .
80
o
C/W
20
o
C/W
Flatpack Package . . . . . . . . . . . . . . . .
70
o
C/W
20
o
C/W
Maximum Package Power Dissipation (PD) at +125
o
C
For TA = -55
o
C to +100
o
C (Package Type D, F, K) . . . . . . 500mW
For TA = +100
o
C to +125
o
C (Package Type D, F, K) . . . . . Derate
Linearity at 12mW/
o
C to 200mW
Device Dissipation per Output Transistor . . . . . . . . . . . . . . . 100mW
For TA = Full Package Temperature Range (All Package Types)
Junction Temperature . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . +175
o
C
TABLE 1. DC ELECTRICAL PERFORMANCE CHARACTERISTICS
PARAMETER
SYMBOL
CONDITIONS (NOTE 1)
GROUP A
SUBGROUPS
TEMPERATURE
LIMITS
UNITS
MIN
MAX
Supply Current
IDD
VDD = 20V, VIN = VDD or GND
1
+25
o
C
-
10
A
2
+125
o
C
-
1000
A
VDD = 18V, VIN = VDD or GND
3
-55
o
C
-
10
A
Input Leakage Current
IIL
VIN = VDD or GND
VDD = 20
1
+25
o
C
-100
-
nA
2
+125
o
C
-1000
-
nA
VDD = 18V
3
-55
o
C
-100
-
nA
Input Leakage Current
IIH
VIN = VDD or GND
VDD = 20
1
+25
o
C
-
100
nA
2
+125
o
C
-
1000
nA
VDD = 18V
3
-55
o
C
-
100
nA
ON-State Resistance
RL = 10K Returned to
VDD - VSS/2
RON
VDD = 5V
VIS = VSS to VDD
1
+25
o
C
-
1050
2
+125
o
C
-
1300
3
-55
o
C
-
800
VDD = 10V
VIS = VSS to VDD
1
+25
o
C
-
400
2
+125
o
C
-
500
3
-55
o
C
-
310
VDD = 15V
VIS = VSS to VDD
1
+25
o
C
-
240
2
+125
o
C
-
320
3
-55
o
C
-
220
N Threshold Voltage
VNTH
VDD = 10V, ISS = -10
A
1
+25
o
C
-2.8
-0.7
V
P Threshold Voltage
VPTH
VSS = 0V, IDD = 10
A
1
+25
o
C
0.7
2.8
V
Functional (Note 4)
F
VDD = 2.8V, VIN = VDD or GND
7
+25
o
C
VOH >
VDD/2
VOL <
VDD/2
V
VDD = 20V, VIN = VDD or GND
7
+25
o
C
VDD = 18V, VIN = VDD or GND
8A
+125
o
C
VDD = 3V, VIN = VDD or GND
8B
-55
o
C
Input Voltage Low
(Note 2)
VIL
VDD = 5V = VIS Thru 1K
VEE = VSS
RL = 1K to VSS
|ISS| < 2
A on all
OFF Channels
1, 2, 3
+25
o
C, +125
o
C, -55
o
C
-
1.5
V
Input Voltage High
(Note 2)
VIH
1, 2, 3
+25
o
C, +125
o
C, -55
o
C
3.5
-
V
Input Voltage Low
(Note 2)
VIL
VDD = 15V = VIS Thru 1K
VEE = VSS
RL = 1K to VSS
|ISS| < 2
A on all
OFF Channels
1, 2, 3
+25
o
C, +125
o
C, -55
o
C
-
4
V
Input Voltage High
(Note 2)
VIH
1, 2, 3
+25
o
C, +125
o
C, -55
o
C
11
-
V
7-3
Specifications CD4067BMS, CD4097BMS
OFF Channel Leakage
Any Channel OFF or All
Channels OFF
(Common OUT/IN)
IOZL
VOUT = 0V
VDD = 20V
1
+25
o
C
-0.1
-
A
2
+125
o
C
-1.0
-
A
VDD = 18V
3
-55
o
C
-0.1
-
A
IOZH
VOUT = VDD
VDD = 20V
1
+25
o
C
-
0.1
A
2
+125
o
C
-
1.0
A
VDD = 18V
3
-55
o
C
-
0.1
A
NOTES: 1. All voltages referenced to device GND, 100% testing being
implemented.
2. Go/No Go test with limits applied to inputs.
3. For accuracy, voltage is measured differentially to VDD. Limit
is 0.050V max.
4. VDD = 2.8/3.0V, RL = 200K
VDD = 20V/18V, RL = 10K - 25K
TABLE 2. AC ELECTRICAL PERFORMANCE CHARACTERISTICS
PARAMETER
SYMBOL
CONDITIONS
GROUP A
SUBGROUPS
TEMPERATURE
LIMITS
UNITS
MIN
MAX
Propagation Delay
(Signal In to Output)
TPHL
TPLH
VDD = 5V, VIN = VDD or GND
(Notes 1, 2)
9
+25
o
C
-
60
ns
10, 11
+125
o
C, -55
o
C
-
81
ns
Propagation Delay
Address or Inhibit to
Signal Out.
(Channel Turning On)
TPZH
TPZL
VDD = 5V, VIN = VDD or GND
(Notes 2, 3)
9
+25
o
C
-
650
ns
10, 11
+125
o
C, -55
o
C
-
878
ns
NOTES:
1. CL = 50pF, RL = 200K, Input TR, TF < 20ns.
2. -55
o
C and +125
o
C limits guaranteed, 100% testing being implemented.
3. CL = 50pF, RL = 10K, Input TR, TF < 20ns.
TABLE 3. ELECTRICAL PERFORMANCE CHARACTERISTICS
PARAMETER
SYMBOL
CONDITIONS
NOTES
TEMPERATURE
LIMITS
UNITS
MIN
MAX
Supply Current
IDD
VDD = 5V, VIN = VDD or GND
1, 2
-55
o
C, +25
o
C
-
5
A
+125
o
C
-
150
A
VDD = 10V, VIN = VDD or GND
1, 2
-55
o
C, +25
o
C
-
10
A
+125
o
C
-
300
A
VDD = 15V, VIN = VDD or GND
1, 2
-55
o
C, +25
o
C
-
10
A
+125
o
C
-
600
A
Input Voltage Low
VIL
VDD = VIS = 10V
VEE = VSS
RL = 1K to VSS
IIS < 2
A
ON OFF Channel
1, 2
+25
o
C, +125
o
C,
-55
o
C
-
3
V
Input Voltage High
VIH
1, 2
+25
o
C, +125
o
C,
-55
o
C
+7
-
V
Propagation Delay
Address or Inhibit to
Signal Out.
(Channel Turning On)
TPZH
TPZL
VDD = 10V
1, 2, 4
+25
o
C
-
270
ns
VDD = 15V
1, 2, 4
+25
o
C
-
190
ns
Propagation Delay
Signal In to Output
TPHL
TPLH
VDD = 10V
VIS = VDD or
GND
1, 2, 3
+25
o
C
-
30
ns
VDD = 15V
1, 2, 3
+25
o
C
-
20
ns
TABLE 1. DC ELECTRICAL PERFORMANCE CHARACTERISTICS
PARAMETER
SYMBOL
CONDITIONS (NOTE 1)
GROUP A
SUBGROUPS
TEMPERATURE
LIMITS
UNITS
MIN
MAX
7-4
Specifications CD4067BMS, CD4097BMS
Propagation Delay
Address or Inhibit to
Signal Out
(Channel Turning Off)
TPHZ
TPLZ
VDD = 5V
1, 2, 5
+25
o
C
-
440
ns
VDD = 10V
1, 2, 5
+25
o
C
-
180
ns
VDD = 15V
1, 2, 5
+25
o
C
-
130
ns
Input Capacitance
CIN
Any Address or Inhibit
1, 2
+25
o
C
-
7.5
pF
NOTES:
1. All voltages referenced to device GND.
2. The parameters listed on Table 3 are controlled via design or process and are not directly tested. These parameters are characterized
on initial design release and upon design changes which would affect these characteristics.
3. CL = 50pF, RL = 200K, Input TR, TF < 20ns.
4. CL = 50pF, RL = 10K, Input TR, TF < 20ns.
5. CL = 50pF, RL = 300
, Input TR, TF < 20ns.
TABLE 4. POST IRRADIATION ELECTRICAL PERFORMANCE CHARACTERISTICS
PARAMETER
SYMBOL
CONDITIONS
NOTES
TEMPERATURE
LIMITS
UNITS
MIN
MAX
Supply Current
IDD
VDD = 20V, VIN = VDD or GND
1, 4
+25
o
C
-
25
A
N Threshold Voltage
VNTH
VDD = 10V, ISS = -10
A
1, 4
+25
o
C
-2.8
-0.2
V
N Threshold Voltage
Delta
VTN
VDD = 10V, ISS = -10
A
1, 4
+25
o
C
-
1
V
P Threshold Voltage
VTP
VSS = 0V, IDD = 10
A
1, 4
+25
o
C
0.2
2.8
V
P Threshold Voltage
Delta
VTP
VSS = 0V, IDD = 10
A
1, 4
+25
o
C
-
1
V
Functional
F
VDD = 18V, VIN = VDD or GND
1
+25
o
C
VOH >
VDD/2
VOL <
VDD/2
V
VDD = 3V, VIN = VDD or GND
Propagation Delay Time
TPHL
TPLH
VDD = 5V
1, 2, 3, 4
+25
o
C
-
1.35 x
+25
o
C
Limit
ns
NOTES: 1. All voltages referenced to device GND.
2. CL = 50pF, RL = 200K, Input TR, TF < 20ns.
3. See Table 2 for +25
o
C limit.
4. Read and Record
TABLE 5. BURN-IN AND LIFE TEST DELTA PARAMETERS +25
O
C
PARAMETER
SYMBOL
DELTA LIMIT
Supply Current - MSI-2
IDD
1.0
A
ON Resistance
RONDEL10
20% x Pre-Test Reading
TABLE 6. APPLICABLE SUBGROUPS
CONFORMANCE GROUP
MIL-STD-883
METHOD
GROUP A SUBGROUPS
READ AND RECORD
Initial Test (Pre Burn-In)
100% 5004
1, 7, 9
IDD, IOL5, IOH5A, RONDEL10
Interim Test 1 (Post Burn-In)
100% 5004
1, 7, 9
IDD, IOL5, IOH5A, RONDEL10
Interim Test 2 (Post Burn-In)
100% 5004
1, 7, 9
IDD, IOL5, IOH5A, RONDEL10
PDA (Note 1)
100% 5004
1, 7, 9, Deltas
Interim Test 3 (Post Burn-In)
100% 5004
1, 7, 9
IDD, IOL5, IOH5A, RONDEL10
PDA (Note 1)
100% 5004
1, 7, 9, Deltas
Final Test
100% 5004
2, 3, 8A, 8B, 10, 11
TABLE 3. ELECTRICAL PERFORMANCE CHARACTERISTICS (Continued)
PARAMETER
SYMBOL
CONDITIONS
NOTES
TEMPERATURE
LIMITS
UNITS
MIN
MAX
7-5
Specifications CD4067BMS, CD4097BMS
Group A
Sample 5005
1, 2, 3, 7, 8A, 8B, 9, 10, 11
Group B
Subgroup B-5
Sample 5005
1, 2, 3, 7, 8A, 8B, 9, 10, 11, Deltas
Subgroups 1, 2, 3, 9, 10, 11
Subgroup B-6
Sample 5005
1, 7, 9
Group D
Sample 5005
1, 2, 3, 8A, 8B, 9
Subgroups 1, 2 3
NOTE: 1. 5% Parameteric, 3% Functional; Cumulative for Static 1 and 2.
TABLE 7. TOTAL DOSE IRRADIATION
CONFORMANCE GROUPS
MIL-STD-883
METHOD
TEST
READ AND RECORD
PRE-IRRAD
POST-IRRAD
PRE-IRRAD
POST-IRRAD
Group E Subgroup 2
5005
1, 7, 9
Table 4
1, 9
Table 4
TABLE 8. BURN-IN AND IRRADIATION TEST CONNECTIONS
FUNCTION
OPEN
GROUND
VDD
9V
-0.5V
OSCILLATOR
50kHz
25kHz
PART NUMBER CD4067BMS
Static Burn-In 1 Note 1
1
2 - 23
24
Static Burn-In 2 Note 1
1
12
2 - 11, 13 - 24
Dynamic Burn-In Note 1
-
12, 15
24
1
2 - 9, 16 - 23
10, 11, 13, 14
(Note 3)
Irradiation Note 2
1
12
2 - 11, 13 - 24
PART NUMBER CD4097BMS
Static Burn-In 1 Note 1
1, 17
2 - 16, 18 - 23
24
Static Burn-In 2 Note 1
1, 17
12
2 - 11, 13 - 16,
18 - 24
Dynamic Burn-In Note 1
-
12, 13
24
1, 17
2 - 9, 15, 16,
18 - 23
10, 11, 14
(Note 4)
Irradiation Note 2
1, 17
12
2 - 11, 13 - 16,
18 - 24
NOTE:
1. Each pin except VDD and GND will have a series resistor of 10K
5%, VDD = 18V
0.5V
2. Each pin except VDD and GND will have a series resistor of 47K
5%; Group E, Subgroup 2, sample size is 4 dice/wafer, 0 failures,
VDD = 10V
0.5V
3. Pin 10 is at 14kHz, Pin 11 is at 7kHz, Pin 13 is at 1.7kHz, Pin 14 is at 3.5kHz
4. Pin 10 is at 14kHz, Pin 11 is at 7kHz, Pin 14 is at 3.5kHZ
TABLE 6. APPLICABLE SUBGROUPS
CONFORMANCE GROUP
MIL-STD-883
METHOD
GROUP A SUBGROUPS
READ AND RECORD