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Электронный компонент: HCTS161AMS

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CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.
1-888-INTERSIL or 321-724-7143 | Copyright Intersil Corporation 1999
Ordering Information
PART NUMBER
TEMPERATURE RANGE
SCREENING LEVEL
PACKAGE
HCTS161ADMSR
-55
o
C to +125
o
C
Intersil Class S Equivalent
16 Lead SBDIP
HCTS161AKMSR
-55
o
C to +125
o
C
Intersil Class S Equivalent
16 Lead Ceramic Flatpack
HCTS161AD/Sample
+25
o
C
Sample
16 Lead SBDIP
HCTS161AK/Sample
+25
o
C
Sample
16 Lead Ceramic Flatpack
HCTS161AHMSR
+25
o
C
Die
Die
HCTS161AMS
Radiation Hardened
Synchronous Counter
Pinouts
16 LEAD CERAMIC DUAL-IN-LINE
METAL SEAL PACKAGE (SBDIP)
MIL-STD-1835 CDIP2-T16, LEAD FINISH C
TOP VIEW
16 LEAD CERAMIC METAL SEAL
FLATPACK PACKAGE (FLATPACK)
MIL-STD-1835 CDFP4-F16, LEAD FINISH C
TOP VIEW
14
15
16
9
13
12
11
10
1
2
3
4
5
7
6
8
CP
P0
P1
P2
P3
GND
PE
Q0
Q1
Q2
Q3
TE
TC
MR
VCC
SPE
2
3
4
5
6
7
8
1
16
15
14
13
12
11
10
9
CP
P0
P1
P2
P3
GND
PE
MR
Q0
Q1
Q2
Q3
TE
TC
VCC
SPE
Features
3 Micron Radiation Hardened CMOS SOS
Total Dose 200K RAD (Si)
Minimum LET for SEU Upsets: >100 MEV-cm
2
/mg
Single Event Upset (SEU) Immunity < 2 x 10
-9
Errors/Bit-
Day (Typ)
Dose Rate Survivability: >1 x 10
12
RAD (Si)/s
Dose Rate Upset >10
10
RAD (Si)/s 20ns Pulse
Latch-Up Free Under Any Conditions
Military Temperature Range: -55
o
C to +125
o
C
Significant Power Reduction Compared to LSTTL ICs
DC Operating Voltage Range: 4.5V to 5.5V
Input Logic Levels
-VIL = 0.8V Max
-VIH = VCC/2V Min
Input Current Levels Ii
5
A at VOL, VOH
Description
The Intersil HCTS161AMS high-reliability high-speed presettable
four-bit binary synchronous counter features asynchronous reset
and look-ahead carry logic. The HCTS161AMS has an active-low
master reset to zero, MR. A low level at the synchronous parallel
enable, SPE, disables counting and allows data at the preset
inputs (P0 - P3) to load the counter. The data is latched to the
outputs on the positive edge of the clock input, CP. The
HCTS161AMS has two count enable pins, PE and TE. TE also
controls the terminal count output, TC. The terminal count output
indicates a maximum count for one clock pulse and is used to
enable the next cascaded stage to count.
The HCTS161AMS utilizes advanced CMOS/SOS technology to
achieve high-speed operation. This device is a member of
radiation hardened, high-speed, CMOS/SOS Logic Family.
The HCTS161AMS is supplied in a 16 lead Ceramic flatpack
(K suffix) or a SBDIP Package (D suffix).
September 1995
Spec Number
518888
File Number
2144.2
2
Specifications HCTS161AMS
Absolute Maximum Ratings
Reliability Information
Supply Voltage (VCC). . . . . . . . . . . . . . . . . . . . . . . . . . -0.5 to +7.0V
Input Voltage Range, All Inputs . . . . . . . . . . . . .-0.5V to VCC +0.5V
DC Input Current, Any One Input
. . . . . . . . . . . . . . . . . . . . . . . .
10mA
DC Drain Current, Any One Output
. . . . . . . . . . . . . . . . . . . . . . .
25mA
(All Voltage Reference to the VSS Terminal)
Storage Temperature Range (TSTG) . . . . . . . . . . . -65
o
C to +150
o
C
Lead Temperature (Soldering 10sec) . . . . . . . . . . . . . . . . . . +265
o
C
Junction Temperature (TJ) . . . . . . . . . . . . . . . . . . . . . . . . . . +175
o
C
ESD Classification . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Class 1
Thermal Resistance
JA
JC
SBDIP Package. . . . . . . . . . . . . . . . . . . .
73
o
C/W
24
o
C/W
Ceramic Flatpack Package . . . . . . . . . . .
114
o
C/W
29
o
C/W
Maximum Package Power Dissipation at +125
o
C Ambient
SBDIP Package. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0.68W
Ceramic Flatpack Package . . . . . . . . . . . . . . . . . . . . . . . . . 0.44W
If device power exceeds package dissipation capability, provide heat
sinking or derate linearly at the following rate:
SBDIP Package. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 13.7mW/
o
C
Ceramic Flatpack Package . . . . . . . . . . . . . . . . . . . . . . 8.8mW/
o
C
CAUTION: As with all semiconductors, stress listed under "Absolute Maximum Ratings" may be applied to devices (one at a time) without resulting in permanent
damage. This is a stress rating only. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. The conditions listed
under "Electrical Performance Characteristics" are the only conditions recommended for satisfactory device operation..
Operating Conditions
Supply Voltage (VCC). . . . . . . . . . . . . . . . . . . . . . . . +4.5V to +5.5V
Input Rise and Fall Times at VCC = 4.5V (TR, TF) . . . . .100ns Max
Operating Temperature Range (T
A
) . . . . . . . . . . . . -55
o
C to +125
o
C
Input Low Voltage (VIL). . . . . . . . . . . . . . . . . . . . . . . . . 0.0V to 0.8V
Input High Voltage (VIH) . . . . . . . . . . . . . . . . . . . . . . .VCC/2 to VCC
TABLE 1. DC ELECTRICAL PERFORMANCE CHARACTERISTICS
PARAMETER
SYMBOL
(NOTE 1)
CONDITIONS
GROUP
A SUB-
GROUPS
TEMPERATURE
LIMITS
UNITS
MIN
MAX
Supply Current
ICC
VCC = 5.5V,
VIN = VCC or GND
1
+25
o
C
-
40
A
2, 3
+125
o
C, -55
o
C
-
750
A
Output Current
(Sink)
IOL
VCC = 4.5V, VIH = 4.5V,
VOUT = 0.4V, VIL = 0V ,
(Note 2)
1
+25
o
C
4.8
-
mA
2, 3
+125
o
C, -55
o
C
4.0
-
mA
Output Current
(Source)
IOH
VCC = 4.5V, VIH = 4.5V,
VOUT = VCC -0.4V,
VIL = 0V, (Note 2)
1
+25
o
C
-4.8
-
mA
2, 3
+125
o
C, -55
o
C
-4.0
-
mA
Output Voltage Low
VOL
VCC = 4.5V, VIH = 2.25V,
IOL = 50
A, VIL = 0.8V
1, 2, 3
+25
o
C, +125
o
C, -55
o
C
-
0.1
V
VCC = 5.5V, VIH = 2.75V,
IOL = 50
A, VIL = 0.8V
1, 2, 3
+25
o
C, +125
o
C, -55
o
C
-
0.1
V
Output Voltage High
VOH
VCC = 4.5V, VIH = 2.25V,
IOH = -50
A, VIL = 0.8V
1, 2, 3
+25
o
C, +125
o
C, -55
o
C
VCC
-0.1
-
V
VCC = 5.5V, VIH = 2.75V,
IOH = -50
A, VIL = 0.8V
1, 2, 3
+25
o
C, +125
o
C, -55
o
C
VCC
-0.1
-
V
Input Leakage
Current
IIN
VCC = 5.5V, VIN = VCC or
GND
1
+25
o
C
-
0.5
A
2, 3
+125
o
C, -55
o
C
-
5.0
A
Noise Immunity
Functional Test
FN
VCC = 4.5V, VIH = 2.25V,
VIL = 0.8V, (Note 3)
7, 8A, 8B
+25
o
C, +125
o
C, -55
o
C
-
-
V
NOTES:
1. All voltages reference to device GND.
2. Force/measure functions may be interchanged.
3. For functional tests VO
4.0V is recognized as a logic "1", and VO
0.5V is recognized as a logic "0".
Spec Number
518888
3
Specifications HCTS161AMS
TABLE 2. AC ELECTRICAL PERFORMANCE CHARACTERISTICS
PARAMETER
SYMBOL
(NOTES 1, 2)
CONDITIONS
GROUP
A SUB-
GROUPS
TEMPERATURE
LIMITS
UNITS
MIN
MAX
Propagation Delay
CP to Qn
TPLH1
VCC = 4.5V, VIH = 3.0V,
VIL = 0V
9
+25
o
C
2
27
ns
10, 11
+125
o
C, -55
o
C
2
29
ns
TPHL1
VCC = 4.5V, VIH = 3.0V,
VIL = 0V
9
+25
o
C
2
27
ns
10, 11
+125
o
C, -55
o
C
2
29
ns
Propagation Delay
CP to TC
TPLH2
VCC = 4.5V, VIH = 3.0V,
VIL = 0V
9
+25
o
C
2
28
ns
10, 11
+125
o
C, -55
o
C
2
31
ns
TPHL2
VCC = 4.5V, VIH = 3.0V,
VIL = 0V
9
+25
o
C
2
29
ns
10, 11
+125
o
C, -55
o
C
2
33
ns
Propagation Delay
TE to TC
TPLH3
VCC = 4.5V, VIH = 3.0V,
VIL = 0V
9
+25
o
C
2
20
ns
10, 11
+125
o
C, -55
o
C
2
21
ns
TPHL3
VCC = 4.5V, VIH = 3.0V,
VIL = 0V
9
+25
o
C
2
25
10, 11
+125
o
C, -55
o
C
2
29
Propagation Delay
MR to Q
TPHL4
VCC = 4.5V, VIH = 3.0V,
VIL = 0V
9
+25
o
C
2
38
ns
10, 11
+125
o
C, -55
o
C
2
45
ns
Propagation Delay
MR to TC
TPHL5
VCC = 4.5V, VIH = 3.0V,
VIL = 0V
9
+25
o
C
2
44
ns
10, 11
+125
o
C, -55
o
C
2
51
ns
NOTES:
1. All voltages referenced to device GND.
2. AC measurements assume RL = 500
, CL = 50pF, Input TR = TF = 3ns, VIL = GND, VIH = VCC.
TABLE 3. ELECTRICAL PERFORMANCE CHARACTERISTICS
PARAMETER
SYMBOL
(NOTE 1)
CONDITIONS
TEMPERATURE
LIMITS
UNITS
MIN
MAX
Capacitance Power
Dissipation
CPD
VCC = 5.0V, VIH = 5.0,
VIL = 0.0V, f = 1MHz
+25
o
C
-
231
pF
+125
o
C, -55
o
C
-
285
pF
Input Capacitance
CIN
VCC = 5.0V, VIH = 5.0,
VIL = 0.0V, f = 1MHz
+25
o
C
-
10
pF
+125
o
C, -55
o
C
-
10
pF
Pulse Width Time CP
TW
VCC = 4.5V, VIH = 4.5,
VIL = 0.0V,
+25
o
C
16
-
ns
+125
o
C, -55
o
C
24
-
ns
Pulse Width Time MR
TW
VCC = 4.5V, VIH = 4.5,
VIL = 0.0V,
+25
o
C
20
-
ns
+125
o
C, -55
o
C
30
-
ns
Setup Time Pn to CP
TSU
VCC = 4.5V, VIH = 4.5,
VIL = 0.0V,
+25
o
C
10
-
ns
+125
o
C, -55
o
C
15
-
ns
Setup Time PE to CP or TE
TSU
VCC = 4.5V, VIH = 4.5,
VIL = 0.0V,
+25
o
C
13
-
ns
+125
o
C, -55
o
C
20
-
ns
Setup Time SPE to CP
TSU
VCC = 4.5V, VIH = 4.5,
VIL = 0.0V,
+25
o
C
12
-
ns
+125
o
C, -55
o
C
18
-
ns
Hold Time Pn to CP
TSU
VCC = 4.5V, VIH = 4.5,
VIL = 0.0V,
+25
o
C
5
-
ns
+125
o
C, -55
o
C
5
-
ns
Spec Number
518888
4
Specifications HCTS161AMS
Hold Time TE or PE to CP
TSU
VCC = 4.5V, VIH = 4.5,
VIL = 0.0V,
+25
o
C
3
-
ns
+125
o
C, -55
o
C
3
-
ns
Hold Time SPE to CP
TSU
VCC = 4.5V, VIH = 4.5,
VIL = 0.0V,
+25
o
C
3
-
ns
+125
o
C, -55
o
C
3
-
ns
Recovery Time
TREC
VCC = 4.5V, VIH = 4.5,
VIL = 0.0V,
+25
o
C
15
-
ns
+125
o
C, -55
o
C
22
-
ns
Maximum Frequency
FMAX
VCC = 4.5V, VIH = 4.5,
VIL = 0.0V,
+25
o
C
0
30
MHz
+125
o
C, -55
o
C
0
20
MHz
NOTE:
1. The parameters listed in Table 3 are controlled via design or process parameters. Min and Max Limits are guaranteed but not directly
tested. These parameters are characterized upon initial design release and upon design changes which affect these characteristics.
TABLE 4. DC POST RADIATION ELECTRICAL PERFORMANCE CHARACTERISTICS
PARAMETER
SYMBOL
(NOTES 1, 2)
CONDITIONS
TEMPERATURE
200K RAD
LIMITS
UNITS
MIN
MAX
Supply Current
ICC
VCC = 5.5V, VIN = VCC or GND
+25
o
C
-
0.75
mA
Output Current (Sink)
IOL
VCC = 4.5V, VIH = 4.5, VIL = 0V,
VOUT = 0.4V
+25
o
C
4.0
-
mA
Output Current (Source)
IOH
VCC = 4.5V, VIH = 4.5, VIL = 0V,
VOUT = VCC -0.4V
+25
o
C
-4.0
-
mA
Output Voltage Low
VOL
VCC = 4.5V, VIH = 2.25V, VIL = 0.8V ,
IOL = 50
A
+25
o
C
-
0.1
V
VCC = 5.5V, VIH = 2.75V, VIL = 0.8V ,
IOL = 50
A
+25
o
C
-
0.1
V
Output Voltage High
VOH
VCC = 4.5V, VIH = 2.25V,
VIL = 0.8V, IOH = -50
A
+25
o
C
VCC
-0.1
-
V
VCC = 5.5V, VIH = 2.75V,
VIL = 0.8V, IOH = -50
A
+25
o
C
VCC
-0.1
-
V
Input Leakage Current
IIN
VCC = 5.5V, VIN = VCC or GND
+25
o
C
-
5
A
Noise Immunity
Functional Test
FN
VCC = 4.5V, VIH = 2.25V, VIL = 0.8V ,
(Note 2)
+25
o
C
-
-
V
Propagation Delay
CP to Qn
TPHL1
VCC = 4.5V, VIH = 3.0V, VIL = 0V
+25
o
C
2
29
ns
TPLH1
VCC = 4.5V, VIH = 3.0V, VIL = 0V
+25
o
C
2
29
ns
Propagation Delay
CP to TC
TPHL2
VCC = 4.5V, VIH = 3.0V, VIL = 0V
+25
o
C
2
33
ns
TPLH2
VCC = 4.5V, VIH = 3.0V, VIL = 0V
+25
o
C
2
31
ns
Propagation Delay
TE to TC
TPHL3
VCC = 4.5V, VIH = 3.0V, VIL = 0V
+25
o
C
2
29
ns
TPLH3
VCC = 4.5V, VIH = 3.0V, VIL = 0V
+25
o
C
2
21
ns
Propagation Delay
MR to Q
TPHL4
VCC = 4.5V, VIH = 3.0V, VIL = 0V
+25
o
C
2
45
ns
Propagation Delay
MR to TC
TPHL5
VCC = 4.5V, VIH = 3.0V, VIL = 0V
+25
o
C
2
51
ns
NOTES:
1. All voltages referenced to device GND.
2. For functional tests VO
4.0V is recognized as a logic "1", and VO
0.5V is recognized as a logic "0".
TABLE 3. ELECTRICAL PERFORMANCE CHARACTERISTICS (Continued)
PARAMETER
SYMBOL
(NOTE 1)
CONDITIONS
TEMPERATURE
LIMITS
UNITS
MIN
MAX
Spec Number
518888
5
Specifications HCTS161AMS
TABLE 5. BURN-IN AND OPERATING LIFE TEST, DELTA PARAMETERS (+25
o
C)
PARAMETER
GROUP B
SUBGROUP
DELTA LIMIT
ICC
5
12
A
IOL/IOH
5
-15% of 0 Hour
TABLE 6. APPLICABLE SUBGROUPS
CONFORMANCE GROUPS
METHOD
GROUP A SUBGROUPS
READ AND RECORD
Initial Test (Preburn-In)
100%/5004
1, 7, 9
ICC, IOL/H
Interim Test
I
(Postburn-In)
100%/5004
1, 7, 9
ICC, IOL/H
Interim Test
II
(Postburn-In)
100%/5004
1, 7, 9
ICC, IOL/H
PDA
100%/5004
1, 7, 9, Deltas
Interim Test
III
(Postburn-In)
100%/5004
1, 7, 9
ICC, IOL/H
PDA
100%/5004
1, 7, 9, Deltas
Final Test
100%/5004
2, 3, 8A, 8B, 10, 11
Group A (Note 1)
Sample/5005
1, 2, 3, 7, 8A, 8B, 9, 10, 11
Group B
Subgroup B-5
Sample/5005
1, 2, 3, 7, 8A, 8B, 9, 10, 11, Deltas
Subgroups 1, 2, 3, 9, 10, 11
Subgroup B-6
Sample/5005
1, 7, 9
Group D
Sample/5005
1, 7, 9
NOTE:
1. Alternate group A testing in accordance with method 5005 of MIL-STD-883 may be exercised.
TABLE 7. TOTAL DOSE IRRADIATION
CONFORMANCE
GROUPS
METHOD
TEST
READ AND RECORD
PRE RAD
POST RAD
PRE RAD
POST RAD
Group E Subgroup 2
5005
1, 7, 9
Table 4
1, 9
Table 4 (Note 1)
NOTE:
1. Except FN test which will be performed 100% Go/No-Go.
Spec Number
518888