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Электронный компонент: IS61LV12816-15I

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Integrated Silicon Solution, Inc. -- 1-800-379-4774
1
Rev. C
02/05/2003
IS61LV12816
ISSI
Copyright 2003 Integrated Silicon Solution, Inc. All rights reserved. ISSI reserves the right to make changes to this specification and its products at any time
without notice. ISSI assumes no liability arising out of the application or use of any information, products or services described herein. Customers are advised to
obtain the latest version of this device specification before relying on any published information and before placing orders for products.
FEATURES
High-speed access time: 10, 12, and 15 ns
CMOS low power operation
TTL and CMOS compatible interface levels
Single 3.3V 10% power supply
Fully static operation: no clock or refresh
required
Three state outputs
Data control for upper and lower bytes
Industrial temperature available
128K x 16 HIGH-SPEED CMOS STATIC RAM
WITH 3.3V SUPPLY
DESCRIPTION
The
ISSI
IS61LV12816 is a high-speed, 2,097,152-bit static
RAM organized as 131,072 words by 16 bits. It is fabricated
using
ISSI
's high-performance CMOS technology. This
highly reliable process coupled with innovative circuit design
techniques, yields access times as fast as 10 ns with low
power consumption.
When
CE
is HIGH (deselected), the device assumes a
standby mode at which the power dissipation can be
reduced down with CMOS input levels.
Easy memory expansion is provided by using Chip Enable
and Output Enable inputs,
CE
and
OE
. The active LOW
Write Enable (
WE
) controls both writing and reading of the
memory. A data byte allows Upper Byte (
UB
) and Lower
Byte (
LB
) access.
The IS61LV12816 is packaged in the JEDEC standard 44-
pin 400-mil SOJ, 44-pin TSOP (Type II), 44-pin LQFP, and
48-pin mini BGA (6mm x 8mm).
FUNCTIONAL BLOCK DIAGRAM
FEBRUARY 2003
A0-A16
CE
OE
WE
128K x 16
MEMORY ARRAY
DECODER
COLUMN I/O
CONTROL
CIRCUIT
GND
V
DD
I/O
DATA
CIRCUIT
I/O0-I/O7
Lower Byte
I/O8-I/O15
Upper Byte
UB
LB
IS61LV12816
2
Integrated Silicon Solution, Inc. -- 1-800-379-4774
Rev. C
02/05/2003
ISSI
PIN CONFIGURATIONS
44-Pin SOJ (K)
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
44
43
42
41
40
39
38
37
36
35
34
33
32
31
30
29
28
27
26
25
24
23
A4
A3
A2
A1
A0
CE
I/O0
I/O1
I/O2
I/O3
V
DD
GND
I/O4
I/O5
I/O6
I/O7
WE
A16
A15
A14
A13
A12
A5
A6
A7
OE
UB
LB
I/O15
I/O14
I/O13
I/O12
GND
V
DD
I/O11
I/O10
I/O9
I/O8
NC
A8
A9
A10
A11
NC
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
44
43
42
41
40
39
38
37
36
35
34
33
32
31
30
29
28
27
26
25
24
23
A4
A3
A2
A1
A0
CE
I/O0
I/O1
I/O2
I/O3
V
DD
GND
I/O4
I/O5
I/O6
I/O7
WE
A16
A15
A14
A13
A12
A5
A6
A7
OE
UB
LB
I/O15
I/O14
I/O13
I/O12
GND
V
DD
I/O11
I/O10
I/O9
I/O8
NC
A8
A9
A10
A11
NC
44-Pin TSOP-II (T)
48-Pin mini BGA (B)
44-Pin LQFP (LQ)
1
2
3
4
5
6
7
8
9
10
11
33
32
31
30
29
28
27
26
25
24
23
12 13 14 15 16 17 18 19 20 21 22
44 43 42 41 40 39 38 37 36 35 345
CE
I/O0
I/O1
I/O2
I/O3
V
DD
GND
I/O4
I/O5
I/O6
I/O7
I/O15
I/O14
I/O13
I/O12
GND
V
DD
I/O11
I/O10
I/O9
I/O8
NC
TOP VIEW
WE
A0
A1
A2
A3
A4
NC
A5
A6
A7
A8
A16
A15
A14
A13
A12
A11
A10
A9
OE
UB
LB
1 2 3 4 5 6
A
B
C
D
E
F
G
H
LB
OE
A0
A1
A2
N/C
I/O
8
UB
A3
A4
CE
I/O
0
I/O
9
I/O
10
A5
A6
I/O
1
I/O
2
GND
I/O
11
NC
A7
I/O
3
V
DD
V
DD
I/O
12
NC
A16
I/O
4
GND
I/O
14
I/O
13
A14
A15
I/O
5
I/O
6
I/O
15
NC
A12
A13
WE
I/O
7
NC
A8
A9
A10
A11
NC
IS61LV12816
Integrated Silicon Solution, Inc. -- 1-800-379-4774
3
Rev. C
02/05/2003
ISSI
OPERATING RANGE
Range
Ambient Temperature
V
DD
Commercial
0C to + 70C
3.3V 10%
Industrial
40C to + 85C
3.3V 10%
DC ELECTRICAL CHARACTERISTICS
(Over Operating Range)
Symbol
Parameter
Test Conditions
Min.
Max.
Unit
V
OH
Output HIGH Voltage
V
DD
= Min., I
OH
= 4.0 mA
2.4
--
V
V
OL
Output LOW Voltage
V
DD
= Min., I
OL
= 8.0 mA
--
0.4
V
V
IH
Input HIGH Voltage
(1)
2
V
DD
+ 0.3
V
V
IL
Input LOW Voltage
(1)
0.3
0.8
V
I
LI
Input Leakage
GND
V
IN
V
DD
1
1
A
I
LO
Output Leakage
GND
V
OUT
V
DD
, Outputs Disabled
1
1
A
Note:
1. V
IL
(min.) = 0.3V DC; V
IL
(min.) = 2.0V AC (pulse width - 2.0 ns).
V
IH
(max.) = V
DD
+ 0.3V DC; V
IH
(max.) = V
DD
+ 2.0V AC (pulse width - 2.0 ns).
PIN DESCRIPTIONS
A0-A16
Address Inputs
I/O0-I/O15
Data Inputs/Outputs
CE
Chip Enable Input
OE
Output Enable Input
WE
Write Enable Input
LB
Lower-byte Control (I/O0-I/O7)
UB
Upper-byte Control (I/O8-I/O15)
NC
No Connection
V
DD
Power
GND
Ground
ABSOLUTE MAXIMUM RATINGS
(1)
Symbol
Parameter
Value
Unit
V
DD
Power Supply Voltage Relative to GND
0.3 to 4.0
V
V
TERM
Terminal Voltage with Respect to GND
0.5 to V
DD
+ 0.5
V
T
STG
Storage Temperature
65 to + 150
C
P
T
Power Dissipation
1.0
W
I
OUT
DC Output Current
20
mA
Note:
1. Stress greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause permanent
damage to the device. This is a stress rating only and functional operation of the device at these or
any other conditions above those indicated in the operational sections of this specification is not
implied. Exposure to absolute maximum rating conditions for extended periods may affect reliabil-
ity.
IS61LV12816
4
Integrated Silicon Solution, Inc. -- 1-800-379-4774
Rev. C
02/05/2003
ISSI
POWER SUPPLY CHARACTERISTICS
(1)
(Over Operating Range)
-10 ns
-12 ns
-15 ns
Symbol
Parameter
Test Conditions
Min. Max.
Min. Max.
Min. Max.
Unit
I
CC
V
DD
Operating
V
DD
= Max.,
CE
= V
IL
Com.
--
125
--
110
--
90
mA
Supply Current
I
OUT
= 0 mA, f = Max.
Ind.
--
135
--
120
--
100
I
SB
1
TTL Standby
V
DD
= Max.,
Com.
--
40
--
35
--
30
mA
Current
V
IN
= V
IH
or V
IL
Ind.
--
50
--
45
--
40
(TTL Inputs)
CE
V
IH
, f = max
I
SB
2
CMOS Standby
V
DD
= Max.,
Com.
--
10
--
10
--
10
mA
Current
CE
V
DD
0.2V,
Ind.
--
20
--
20
--
20
(CMOS Inputs)
V
IN
V
DD
0.2V, or
V
IN
0.2V, f = 0
Note:
1. At f = f
MAX
, address and data inputs are cycling at the maximum frequency, f = 0 means no input lines change.
TRUTH TABLE
I/O PIN
Mode
WE
WE
WE
WE
WE
CE
CE
CE
CE
CE
OE
OE
OE
OE
OE
LB
LB
LB
LB
LB
UB
UB
UB
UB
UB
I/O0-I/O7
I/O8-I/O15
V
DD
Current
Not Selected
X
H
X
X
X
High-Z
High-Z
I
SB
1
, I
SB
2
Output Disabled
H
L
H
X
X
High-Z
High-Z
I
CC
X
L
X
H
H
High-Z
High-Z
Read
H
L
L
L
H
D
OUT
High-Z
I
CC
H
L
L
H
L
High-Z
D
OUT
H
L
L
L
L
D
OUT
D
OUT
Write
L
L
X
L
H
D
IN
High-Z
I
CC
L
L
X
H
L
High-Z
D
IN
L
L
X
L
L
D
IN
D
IN
IS61LV12816
Integrated Silicon Solution, Inc. -- 1-800-379-4774
5
Rev. C
02/05/2003
ISSI
READ CYCLE SWITCHING CHARACTERISTICS
(1)
(Over Operating Range)
-10 ns
-12 ns
-15 ns
Symbol Parameter
Min.
Max.
Min.
Max.
Min.
Max.
Unit
t
RC
Read Cycle Time
10
--
12
--
15
--
ns
t
AA
Address Access Time
--
10
--
12
--
15
ns
t
OHA
Output Hold Time
3
--
3
--
3
--
ns
t
ACE
CE
Access Time
--
10
--
12
--
15
ns
t
DOE
OE
Access Time
--
4
--
5
--
6
ns
t
HZOE
(2)
OE
to High-Z Output
--
4
--
5
0
6
ns
t
LZOE
(2)
OE
to Low-Z Output
0
--
0
--
0
--
ns
t
HZCE
(2)
CE
to High-Z Output
0
4
0
5
0
8
ns
t
LZCE
(2)
CE
to Low-Z Output
3
--
3
--
3
--
ns
t
BA
LB
,
UB
Access Time
--
4
--
5
--
6
ns
t
HZB
(2)
LB
,
UB
to High-Z Output
0
4
0
5
0
6
ns
t
LZB
(2)
LB
,
UB
to Low-Z Output
0
--
0
--
0
--
ns
Notes:
1. Test conditions assume signal transition times of 3 ns or less, timing reference levels of 1.5V, input
pulse levels of 0V to 3.0V and output loading specified in Figure 1.
2. Tested with the load in Figure 2. Transition is measured 500 mV from steady-state voltage. Not
100% tested.
CAPACITANCE
(1)
Symbol
Parameter
Conditions
Max.
Unit
C
IN
Input Capacitance
V
IN
= 0V
6
pF
C
OUT
Input/Output Capacitance
V
OUT
= 0V
8
pF
Note:
1. Tested initially and after any design or process changes that may affect these parameters.
IS61LV12816
6
Integrated Silicon Solution, Inc. -- 1-800-379-4774
Rev. C
02/05/2003
ISSI
AC TEST CONDITIONS
Parameter
Unit
Input Pulse Level
0V to 3.0V
Input Rise and Fall Times
3 ns
Input and Output Timing
1.5V
and Reference Level
Output Load
See Figures 1 and 2
AC TEST LOADS
Figure 1.
319
5 pF
Including
jig and
scope
353
OUTPUT
3.3V
319
30 pF
Including
jig and
scope
353
OUTPUT
3.3V
Figure 2.
IS61LV12816
Integrated Silicon Solution, Inc. -- 1-800-379-4774
7
Rev. C
02/05/2003
ISSI
DATA VALID
READ1.eps
PREVIOUS DATA VALID
t
AA
t
OHA
t
OHA
t
RC
D
OUT
ADDRESS
t
RC
t
OHA
t
AA
t
DOE
t
LZOE
t
ACE
t
LZCE
t
HZOE
HIGH-Z
DATA VALID
UB_CEDR2.eps
t
HZB
ADDRESS
OE
CE
LB, UB
D
OUT
t
HZCE
t
BA
t
LZB
READ CYCLE NO. 2
(1,3)
AC WAVEFORMS
READ CYCLE NO. 1
(1,2)
(Address Controlled) (
CE
=
OE
= V
IL
,
UB
or
LB
= V
IL
)
Notes:
1.
WE
is HIGH for a Read Cycle.
2. The device is continuously selected.
OE
,
CE
,
UB
, or
LB
= V
IL
.
3. Address is valid prior to or coincident with
CE
LOW transition.
IS61LV12816
8
Integrated Silicon Solution, Inc. -- 1-800-379-4774
Rev. C
02/05/2003
ISSI
WRITE CYCLE SWITCHING CHARACTERISTICS
(1,3)
(Over Operating Range)
-10 ns
-12 ns
-15 ns
Symbol Parameter
Min.
Max.
Min.
Max.
Min.
Max.
Unit
t
WC
Write Cycle Time
10
--
12
--
15
--
ns
t
SCE
CE
to Write End
8
--
8
--
10
--
ns
t
AW
Address Setup Time
8
--
8
--
10
--
ns
to Write End
t
HA
Address Hold from Write End
0
--
0
--
0
--
ns
t
SA
Address Setup Time
0
--
0
--
0
--
ns
t
PWB
LB
,
UB
Valid to End of Write
8
--
9
--
10
--
ns
t
PWE
1
WE
Pulse Width (
OE
= HIGH)
7
--
8
--
10
--
ns
t
PWE
2
WE
Pulse Width (
OE
= LOW)
8
--
10
--
11
--
ns
t
SD
Data Setup to Write End
5
--
6
--
7
--
ns
t
HD
Data Hold from Write End
0
--
0
--
0
--
ns
t
HZWE
(3)
WE
LOW to High-Z Output
--
4
--
5
--
6
ns
t
LZWE
(3)
WE
HIGH to Low-Z Output
0
--
0
--
0
--
ns
Notes:
1. Test conditions assume signal transition times of 3 ns or less, timing reference levels of 1.5V, input pulse
levels of 0V to 3.0V and output loading specified in Figure 1.
2. The internal write time is defined by the overlap of
CE
LOW and
UB
or
LB
, and
WE
LOW. All signals must
be in valid states to initiate a Write, but any one can go inactive to terminate the Write. The Data Input Setup
and Hold timing are referenced to the rising or falling edge of the signal that terminates the write.
3. Tested with the load in Figure 2. Transition is measured 500 mV from steady-state voltage. Not 100%
tested.
IS61LV12816
Integrated Silicon Solution, Inc. -- 1-800-379-4774
9
Rev. C
02/05/2003
ISSI
WRITE CYCLE NO. 1
(1,2)
(
CE
Controlled,
OE
= HIGH or LOW)
DATA UNDEFINED
t
WC
VALID ADDRESS
t
SCE
t
PWE1
t
PWE2
t
AW
t
HA
HIGH-Z
t
PBW
t
HD
t
SA
t
HZWE
ADDRESS
CE
UB, LB
WE
D
OUT
D
IN
DATA
IN
VALID
t
LZWE
t
SD
UB_CEWR1.eps
IS61LV12816
10
Integrated Silicon Solution, Inc. -- 1-800-379-4774
Rev. C
02/05/2003
ISSI
WRITE CYCLE NO. 2
(1)
(
WE
Controlled,
OE
= HIGH during Write Cycle)
DATA UNDEFINED
LOW
t
WC
VALID ADDRESS
t
PWE1
t
AW
t
HA
HIGH-Z
t
PBW
t
HD
t
SA
t
HZWE
ADDRESS
CE
UB, LB
WE
D
OUT
D
IN
OE
DATA
IN
VALID
t
LZWE
t
SD
UB_CEWR2.eps
WRITE CYCLE NO. 3
(
WE
Controlled:
OE
is LOW During Write Cycle)
DATA UNDEFINED
t
WC
VALID ADDRESS
LOW
LOW
t
PWE2
t
AW
t
HA
HIGH-Z
t
PBW
t
HD
t
SA
t
HZWE
ADDRESS
CE
UB, LB
WE
D
OUT
D
IN
OE
DATA
IN
VALID
t
LZWE
t
SD
UB_CEWR3.eps
IS61LV12816
Integrated Silicon Solution, Inc. -- 1-800-379-4774
11
Rev. C
02/05/2003
ISSI
DATA UNDEFINED
t
WC
ADDRESS 1
ADDRESS 2
t
WC
HIGH-Z
t
PBW
WORD 1
LOW
WORD 2
UB_CEWR4.eps
t
HD
t
SA
t
HZWE
ADDRESS
CE
UB, LB
WE
D
OUT
D
IN
OE
DATA
IN
VALID
t
LZWE
t
SD
t
PBW
DATA
IN
VALID
t
SD
t
HD
t
SA
t
HA
t
HA
WRITE CYCLE NO. 4
(
LB
,
UB
Controlled, Back-to-Back Write)
(1,3)
Notes:
1. The internal Write time is defined by the overlap of
CE
= LOW,
UB
and/or
LB
= LOW, and
WE
= LOW. All signals must be
in valid states to initiate a Write, but any can be deasserted to terminate the Write. The
t
SA
,
t
HA
,
t
SD
, and
t
HD
timing is
referenced to the rising or falling edge of the signal that terminates the Write.
2. Tested with
OE
HIGH for a minimum of 4 ns before
WE
= LOW to place the I/O in a HIGH-Z state.
3.
WE
may be held LOW across many address cycles and the
LB
,
UB
pins can be used to control the Write function.
IS61LV12816
12
Integrated Silicon Solution, Inc. -- 1-800-379-4774
Rev. C
02/05/2003
ISSI
IS61LV12816 STANDARD VERSION
ORDERING INFORMATION
Commercial Range: 0C to +70C
Speed (ns)
Order Part No.
Package
10
IS61LV12816-10B
mini BGA (6mm x 8mm)
IS61LV12816-10K
400-mil Plastic SOJ
IS61LV12816-10LQ
LQFP
IS61LV12816-10T
Plastic TSOP-II
12
IS61LV12816-12B
mini BGA (6mm x 8mm)
IS61LV12816-12K
400-mil Plastic SOJ
IS61LV12816-12LQ
LQFP
IS61LV12816-12T
Plastic TSOP-II
15
IS61LV12816-15B
mini BGA (6mm x 8mm)
IS61LV12816-15LQ
LQFP
IS61LV12816-15T
Plastic TSOP-II
IS61LV12816 STANDARD VERSION
ORDERING INFORMATION
Industrial Range: 40C to +85C
Speed (ns)
Order Part No.
Package
10
IS61LV12816-10BI
mini BGA (6mm x 8mm)
IS61LV12816-10KI
400-mil Plastic SOJ
IS61LV12816-10LQI
LQFP
IS61LV12816-10TI
Plastic TSOP-II
12
IS61LV12816-12LQI
LQFP
IS61LV12816-12TI
Plastic TSOP-II
15
IS61LV12816-15BI
mini BGA (6mm x 8mm)
IS61LV12816-15LQI
LQFP
IS61LV12816-15TI
Plastic TSOP-II