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Электронный компонент: IS61LV12816L-10TI

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IS61LV12816L
ISSI
Integrated Silicon Solution, Inc. -- www.issi.com --
1-800-379-4774
1
Rev. F
10/27/05
Copyright 2005 Integrated Silicon Solution, Inc. All rights reserved. ISSI reserves the right to make changes to this specification and its products at any time without notice. ISSI assumes no liability
arising out of the application or use of any information, products or services described herein. Customers are advised to obtain the latest version of this device specification before relying on any
published information and before placing orders for products.
FEATURES
High-speed access time: 8, 10 ns
Operating Current: 50mA (typ.)
Stand by Current: 700A (typ.)
TTL and CMOS compatible interface levels
Single 3.3V power supply
Fully static operation: no clock or refresh
required
Three state outputs
Data control for upper and lower bytes
Industrial temperature available
Lead-free available
128K x 16 HIGH-SPEED CMOS STATIC RAM
WITH 3.3V SUPPLY
DESCRIPTION
The
ISSI
IS61LV12816L is a high-speed, 2,097,152-bit
static RAM organized as 131,072 words by 16 bits. It is
fabricated using
ISSI
's high-performance CMOS
technology. This highly reliable process coupled with
innovative circuit design techniques, yields access times
as fast as 8 ns with low power consumption.
When
CE
is HIGH (deselected), the device assumes a
standby mode at which the power dissipation can be
reduced down with CMOS input levels.
Easy memory expansion is provided by using Chip Enable
and Output Enable inputs,
CE
and
OE
. The active LOW
Write Enable (
WE
) controls both writing and reading of the
memory. A data byte allows Upper Byte (
UB
) and Lower
Byte (
LB
) access.
The IS61LV12816L is packaged in the JEDEC standard
44-pin TSOP (Type II), 44-pin LQFP, and 48-pin mini BGA
(6mm x 8mm).
FUNCTIONAL BLOCK DIAGRAM
OCTOBER 2005
A0-A16
CE
OE
WE
128Kx16
MEMORY ARRAY
DECODER
COLUMN I/O
CONTROL
CIRCUIT
GND
VDD
I/O
DATA
CIRCUIT
I/O0-I/O7
Lower Byte
I/O8-I/O15
Upper Byte
UB
LB
IS61LV12816L
2
Integrated Silicon Solution, Inc. -- www.issi.com --
1-800-379-4774
Rev. F
10/27/05
ISSI
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
44
43
42
41
40
39
38
37
36
35
34
33
32
31
30
29
28
27
26
25
24
23
A4
A3
A2
A1
A0
CE
I/O0
I/O1
I/O2
I/O3
V
DD
GND
I/O4
I/O5
I/O6
I/O7
WE
A16
A15
A14
A13
A12
A5
A6
A7
OE
UB
LB
I/O15
I/O14
I/O13
I/O12
GND
V
DD
I/O11
I/O10
I/O9
I/O8
NC
A8
A9
A10
A11
NC
44-Pin TSOP (Type II) (T)
PIN DESCRIPTIONS
A0-A16
Address Inputs
I/O0-I/O15
Data Inputs/Outputs
CE
Chip Enable Input
OE
Output Enable Input
WE
Write Enable Input
LB
Lower-byte Control (I/O0-I/O7)
UB
Upper-byte Control (I/O8-I/O15)
NC
No Connection
V
DD
Power
GND
Ground
TRUTH TABLE
I/O PIN
Mode
WE
WE
WE
WE
WE
CE
CE
CE
CE
CE
OE
OE
OE
OE
OE
LB
LB
LB
LB
LB
UB
UB
UB
UB
UB
I/O0-I/O7
I/O8-I/O15
V
DD
Current
Not Selected
X
H
X
X
X
High-Z
High-Z
I
SB
1
, I
SB
2
Output Disabled
H
L
H
X
X
High-Z
High-Z
I
CC
X
L
X
H
H
High-Z
High-Z
Read
H
L
L
L
H
D
OUT
High-Z
I
CC
H
L
L
H
L
High-Z
D
OUT
H
L
L
L
L
D
OUT
D
OUT
Write
L
L
X
L
H
D
IN
High-Z
I
CC
L
L
X
H
L
High-Z
D
IN
L
L
X
L
L
D
IN
D
IN
PIN CONFIGURATION
IS61LV12816L
Integrated Silicon Solution, Inc. -- www.issi.com --
1-800-379-4774
3
Rev. F
10/27/05
ISSI
PIN DESCRIPTIONS
A0-A16
Address Inputs
I/O0-I/O15
Data Inputs/Outputs
CE
Chip Enable Input
OE
Output Enable Input
WE
Write Enable Input
LB
Lower-byte Control (I/O0-I/O7)
UB
Upper-byte Control (I/O8-I/O15)
NC
No Connection
V
DD
Power
GND
Ground
48-Pin mini BGA (B)
44-Pin LQFP (LQ)
1
2
3
4
5
6
7
8
9
10
11
33
32
31
30
29
28
27
26
25
24
23
12 13 14 15 16 17 18 19 20 21 22
44 43 42 41 40 39 38 37 36 35 345
CE
I/O0
I/O1
I/O2
I/O3
V
DD
GND
I/O4
I/O5
I/O6
I/O7
I/O15
I/O14
I/O13
I/O12
GND
V
DD
I/O11
I/O10
I/O9
I/O8
NC
TOP VIEW
WE
A0
A1
A2
A3
A4
NC
A5
A6
A7
A8
A16
A15
A14
A13
A12
A11
A10
A9
OE
UB
LB
PIN CONFIGURATION
1 2 3 4 5 6
A
B
C
D
E
F
G
H
LB
OE
A0
A1
A2
NC
I/O
8
UB
A3
A4
CE
I/O
0
I/O
9
I/O
10
A5
A6
I/O
1
I/O
2
GND
I/O
11
NC
A7
I/O
3
V
DD
V
DD
I/O
12
NC
A16
I/O
4
GND
I/O
14
I/O
13
A14
A15
I/O
5
I/O
6
I/O
15
NC
A12
A13
WE
I/O
7
NC
A8
A9
A10
A11
NC
IS61LV12816L
4
Integrated Silicon Solution, Inc. -- www.issi.com --
1-800-379-4774
Rev. F
10/27/05
ISSI
OPERATING RANGE
Range
Ambient Temperature
V
DD
(8 n
S
)
V
DD
(10 n
S
)
Commercial
0C to +70C
3.3V + 10%, -5%
3.3V + 10%
Industrial
40C to +85C
3.3V + 10%, -5%
3.3V + 10%
DC ELECTRICAL CHARACTERISTICS
(Over Operating Range)
Symbol
Parameter
Test Conditions
Min.
Max.
Unit
V
OH
Output HIGH Voltage
V
DD
= Min., I
OH
= 4.0 mA
2.4
--
V
V
OL
Output LOW Voltage
V
DD
= Min., I
OL
= 8.0 mA
--
0.4
V
V
IH
Input HIGH Voltage
(1)
2
V
DD
+ 0.3
V
V
IL
Input LOW Voltage
(1)
0.3
0.8
V
I
LI
Input Leakage
GND
V
IN
V
DD
1
1
A
I
LO
Output Leakage
GND
V
OUT
V
DD
, Outputs Disabled
1
1
A
Note:
1.
V
IL
(min.) = 0.3V DC; V
IL
(min.) = 2.0V AC (pulse width - 2.0 ns). Not 100% tested.
V
IH
(max.) = V
DD
+ 0.3V DC; V
IH
(max.) = V
DD
+ 2.0V AC (pulse width - 2.0 ns). Not 100% tested.
ABSOLUTE MAXIMUM RATINGS
(1)
Symbol
Parameter
Value
Unit
V
DD
Power Supply Voltage Relative to GND
0.5 to 4.0V
V
V
TERM
Terminal Voltage with Respect to GND
0.5 to V
DD
+ 0.5
V
T
STG
Storage Temperature
65 to + 150
C
P
T
Power Dissipation
1.0
W
Note:
1. Stress greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause permanent damage to the device. This is
a stress rating only and functional operation of the device at these or any other conditions above those indicated in the opera-
tional sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may
affect reliability.
IS61LV12816L
Integrated Silicon Solution, Inc. -- www.issi.com --
1-800-379-4774
5
Rev. F
10/27/05
ISSI
POWER SUPPLY CHARACTERISTICS
(1)
(Over Operating Range)
-8 ns
-10 ns
Symbol
Parameter
Test Conditions
Min. Max.
Min. Max.
Unit
I
CC
V
DD
Operating
V
DD
= Max.,
CE
= V
IL
Com.
--
65
--
60
mA
Supply Current
I
OUT
= 0 mA, f = Max.
Ind.
--
70
--
65
typ.
(2)
--
50
--
50
I
SB
1
TTL Standby
V
DD
= Max.,
Com.
--
30
--
25
mA
Current
V
IN
= V
IH
or V
IL
Ind.
--
35
--
30
(TTL Inputs)
CE
V
IH
, f = max
I
SB
2
CMOS Standby
V
DD
= Max.,
Com.
--
3
--
3
mA
Current
CE
V
DD
0.2V,
Ind.
--
4
--
4
mA
(CMOS Inputs)
V
IN
V
DD
0.2V, or
typ.
(2)
--
700
--
700
A
V
IN
0.2V, f = 0
Note:
1. At f = f
MAX
, address and data inputs are cycling at the maximum frequency, f = 0 means no input lines change.
2. Typical values are measured at V
DD
=3.3V, T
A
=25
o
C. Not 100% tested.
CAPACITANCE
(1)
Symbol
Parameter
Conditions
Max.
Unit
C
IN
Input Capacitance
V
IN
= 0V
6
pF
C
OUT
Input/Output Capacitance
V
OUT
= 0V
8
pF
Note:
1. Tested initially and after any design or process changes that may affect these parameters.
IS61LV12816L
6
Integrated Silicon Solution, Inc. -- www.issi.com --
1-800-379-4774
Rev. F
10/27/05
ISSI
AC TEST CONDITIONS
Parameter
Unit
Input Pulse Level
0V to 3.0V
Input Rise and Fall Times
3 ns
Input and Output Timing
1.5V
and Reference Level
Output Load
See Figures 1 and 2
AC TEST LOADS
Figure 1.
319
5 pF
Including
jig and
scope
353
OUTPUT
3.3V
Figure 2.
READ CYCLE SWITCHING CHARACTERISTICS
(1)
(Over Operating Range)
-8 ns
-10 ns
Symbol
Parameter
Min.
Max
Min.
Max.
Unit
t
RC
Read Cycle Time
8
--
10
--
ns
t
AA
Address Access Time
--
8
--
10
ns
t
OHA
Output Hold Time
3
--
3
--
ns
t
ACE
CE
Access Time
--
8
--
10
ns
t
DOE
OE
Access Time
--
3.5
--
4
ns
t
HZOE
(2)
OE
to High-Z Output
--
3.5
--
4
ns
t
LZOE
(2)
OE
to Low-Z Output
0
--
0
--
ns
t
HZCE
(2)
CE
to High-Z Output
0
3.5
0
4
ns
t
LZCE
(2)
CE
to Low-Z Output
3.5
--
3
--
ns
t
BA
LB
,
UB
Access Time
--
3.5
--
4
ns
t
HZB
(2)
LB
,
UB
to High-Z Output
0
3.5
0
4
ns
t
LZB
(2)
LB
,
UB
to Low-Z Output
0
--
0
--
ns
Notes:
1. Test conditions assume signal transition times of 3 ns or less, timing reference levels of 1.5V, input pulse levels of 0V to
3.0V and output loading specified in Figure 1.
2. Tested with the load in Figure 2. Transition is measured 500 mV from steady-state voltage. Not 100% tested.
Z
O
= 50
1.5V
50
OUTPUT
30 pF
Including
jig and
scope
IS61LV12816L
Integrated Silicon Solution, Inc. -- www.issi.com --
1-800-379-4774
7
Rev. F
10/27/05
ISSI
DATA VALID
READ1.eps
PREVIOUS DATA VALID
t
AA
t
OHA
t
OHA
t
RC
D
OUT
ADDRESS
t
RC
t
OHA
t
AA
t
DOE
t
LZOE
t
ACE
t
LZCE
t
HZOE
HIGH-Z
DATA VALID
UB_CEDR2.eps
t
HZB
ADDRESS
OE
CE
LB
,
UB
D
OUT
t
HZCE
t
BA
t
LZB
READ CYCLE NO. 2
(1,3)
AC WAVEFORMS
READ CYCLE NO. 1
(1,2)
(Address Controlled) (
CE
=
OE
= V
IL
,
UB
or
LB
= V
IL
)
Notes:
1.
WE
is HIGH for a Read Cycle.
2. The device is continuously selected.
OE
,
CE
,
UB
, or
LB
= V
IL
.
3. Address is valid prior to or coincident with
CE
LOW transition.
IS61LV12816L
8
Integrated Silicon Solution, Inc. -- www.issi.com --
1-800-379-4774
Rev. F
10/27/05
ISSI
WRITE CYCLE SWITCHING CHARACTERISTICS
(1,3)
(Over Operating Range)
-8 ns
-10 ns
Symbol
Parameter
Min.
Max
Min.
Max.
Unit
t
WC
Write Cycle Time
8
--
10
--
ns
t
SCE
CE
to Write End
7
--
8
--
ns
t
AW
Address Setup Time
7
--
8
--
ns
to Write End
t
HA
Address Hold from Write End
0
--
0
--
ns
t
SA
Address Setup Time
0
--
0
--
ns
t
PBW
LB
,
UB
Valid to End of Write
6.5
--
8
--
ns
t
PWE
1
WE
Pulse Width (
OE
= HIGH)
6
--
7
--
ns
t
PWE
2
WE
Pulse Width (
OE
= LOW)
6.5
--
8
--
ns
t
SD
Data Setup to Write End
4
--
5
--
ns
t
HD
Data Hold from Write End
0
--
0
--
ns
t
HZWE
(3)
WE
LOW to High-Z Output
--
3
--
4
ns
t
LZWE
(3)
WE
HIGH to Low-Z Output
0
--
0
--
ns
Notes:
1. Test conditions assume signal transition times of 3 ns or less, timing reference levels of 1.5V, input pulse levels of 0V to
3.0V and output loading specified in Figure 1.
2. The internal write time is defined by the overlap of
CE
LOW and
UB
or
LB
, and
WE
LOW. All signals must be in valid states
to initiate a Write, but any one can go inactive to terminate the Write. The Data Input Setup and Hold timing are referenced
to the rising or falling edge of the signal that terminates the write.
3. Tested with the load in Figure 2. Transition is measured 500 mV from steady-state voltage. Not 100% tested.
IS61LV12816L
Integrated Silicon Solution, Inc. -- www.issi.com --
1-800-379-4774
9
Rev. F
10/27/05
ISSI
WRITE CYCLE NO. 1
(1,2)
(
CE
Controlled,
OE
= HIGH or LOW)
DATA UNDEFINED
t
WC
VALID ADDRESS
t
SCE
t
PWE1
t
PWE2
t
AW
t
HA
HIGH-Z
t
PBW
t
HD
t
SA
t
HZWE
ADDRESS
CE
UB
,
LB
WE
D
OUT
D
IN
DATA
IN
VALID
t
LZWE
t
SD
UB_CEWR1.eps
IS61LV12816L
10
Integrated Silicon Solution, Inc. -- www.issi.com --
1-800-379-4774
Rev. F
10/27/05
ISSI
WRITE CYCLE NO. 2
(1)
(
WE
Controlled,
OE
= HIGH during Write Cycle)
WRITE CYCLE NO. 3
(
WE
Controlled:
OE
is LOW During Write Cycle)
DATA UNDEFINED
LOW
t
WC
VALID ADDRESS
t
PWE1
t
AW
t
HA
HIGH-Z
t
PBW
t
HD
t
SA
t
HZWE
ADDRESS
CE
UB
,
LB
WE
D
OUT
D
IN
OE
DATA
IN
VALID
t
LZWE
t
SD
UB_CEWR2.eps
DATA UNDEFINED
t
WC
VALID ADDRESS
LOW
LOW
t
PWE2
t
AW
t
HA
HIGH-Z
t
PBW
t
HD
t
SA
t
HZWE
ADDRESS
CE
UB
,
LB
WE
D
OUT
D
IN
OE
DATA
IN
VALID
t
LZWE
t
SD
UB_CEWR3.eps
IS61LV12816L
Integrated Silicon Solution, Inc. -- www.issi.com --
1-800-379-4774
11
Rev. F
10/27/05
ISSI
DATA UNDEFINED
t
WC
ADDRESS 1
ADDRESS 2
t
WC
HIGH-Z
t
PBW
WORD 1
LOW
WORD 2
UB_CEWR4.eps
t
HD
t
SA
t
HZWE
ADDRESS
CE
UB
,
LB
WE
D
OUT
D
IN
OE
DATA
IN
VALID
t
LZWE
t
SD
t
PBW
DATA
IN
VALID
t
SD
t
HD
t
SA
t
HA
t
HA
WRITE CYCLE NO. 4
(
LB
,
UB
Controlled, Back-to-Back Write)
(1,3)
Notes:
1. The internal Write time is defined by the overlap of
CE
= LOW,
UB
and/or
LB
= LOW, and
WE
= LOW. All signals must be
in valid states to initiate a Write, but any can be deasserted to terminate the Write. The t
SA
, t
HA
, t
SD
, and t
HD
timing is
referenced to the rising or falling edge of the signal that terminates the Write.
2. Tested with OE HIGH for a minimum of 4 ns before
WE
= LOW to place the I/O in a HIGH-Z state.
3. WE may be held LOW across many address cycles and the
LB
,
UB
pins can be used to control the Write function.
IS61LV12816L
12
Integrated Silicon Solution, Inc. -- www.issi.com --
1-800-379-4774
Rev. F
10/27/05
ISSI
DATA RETENTION WAVEFORM
(
CE
Controlled)
DATA RETENTION SWITCHING CHARACTERISTICS
Symbol
Parameter
Test Condition
Options
Min.
Typ.
(1)
Max.
Unit
V
DR
V
DD
for Data Retention
See Data Retention Waveform
2.0
--
3.6
V
I
DR
Data Retention Current
V
DD
= 2.0V,
CE
V
DD
0.2V
Com.
--
0.7
3
mA
Ind.
--
--
4
t
SDR
Data Retention Setup Time
See Data Retention Waveform
0
--
--
ns
t
RDR
Recovery Time
See Data Retention Waveform
t
RC
--
--
ns
Note 1:
Typical values are measured at V
DD
= 3.3V, T
A
= 25
O
C. Not 100% tested.
V
DD
CE
V
DD
- 0.2V
t
SDR
t
RDR
V
DR
CE
GND
Data Retention Mode
IS61LV12816L
Integrated Silicon Solution, Inc. -- www.issi.com --
1-800-379-4774
13
Rev. F
10/27/05
ISSI
ORDERING INFORMATION:
Commercial Range: 0C to +70C
Speed (ns)
Order Part No.
Package
8
IS61LV12816L-8T
Plastic TSOP (Type II)
IS61LV12816L-8TL
Plastic TSOP (Type II), Lead-free
10
IS61LV12816L-10T
Plastic TSOP (Type II)
IS61LV12816L-10TL
Plastic TSOP (Type II), Lead-free
Industrial Range: 40C to +85C
Speed (ns)
Order Part No.
Package
8
IS61LV12816L-8BI
mini BGA (6mm x 8mm)
IS61LV12816L-8TI
Plastic TSOP (Type II)
10
IS61LV12816L-10BI
mini BGA (6mm x 8mm)
IS61LV12816L-10BLI
mini BGA (6mm x 8mm), Lead-free
IS61LV12816L-10LQI
LQFP
IS61LV12816L-10LQLI
LQFP, Lead-free
IS61LV12816L-10TI
Plastic TSOP (Type II)
IS61LV12816L-10TLI
Plastic TSOP (Type II), Lead-free
PACKAGING INFORMATION
ISSI
Copyright 2003 Integrated Silicon Solution, Inc. All rights reserved. ISSI reserves the right to make changes to this specification and its products at any time
without notice. ISSI assumes no liability arising out of the application or use of any information, products or services described herein. Customers are advised to
obtain the latest version of this device specification before relying on any published information and before placing orders for products.
Integrated Silicon Solution, Inc. -- www.issi.com --
1-800-379-4774
Rev. B
05/30/03
LQFP (Low Profile Quad Flat Pack)
Package Code: LQ (44-pin)
Low Profile Quad Flat Pack (LQ)
Ref. Std.
MS-026
No. Leads
44
Millimeters
Inches
Symbol
Min
Max
Min
Max
A
--
1.60
--
0.063
A1
0.05
0.15
0.002
0.006
A2
1.35
1.45
0.053
0.057
b
0.30
0.45
0.012
0.018
C
0.09
0.20
0.004
0.008
D
12.00 BSC
0.472 BSC
D1
10.00 BSC
0.394 BSC
E
12.00 BSC
0.472 BSC
E1
10.00 BSC
0.394 BSC
e
0.80 BSC
0.031 BSC
L
0.45
0.75
0.018
0.030
L1
1.00 REF.
0.039 REF.
0
o
7
o
0
o
7
o
Notes:
1. All dimensioning and tolerancing
conforms to ANSI Y14.5M-1982.
2. Dimensions D1 and E1 do not include
mold protrusions. Allowable protrusion is
0.25 mm per side. D1 and E1 include
mold mismatch.
3. Controlling dimension: millimeters.
D
D1
E
E1
A2
A1
A
e
b
SEATING
PLANE
L1
L
PACKAGING INFORMATION
ISSI
Integrated Silicon Solution, Inc. -- www.issi.com --
1-800-379-4774
Rev. D
01/15/03
Copyright 2003 Integrated Silicon Solution, Inc. All rights reserved. ISSI reserves the right to make changes to this specification and its products at any time
without notice. ISSI assumes no liability arising out of the application or use of any information, products or services described herein. Customers are advised to
obtain the latest version of this device specification before relying on any published information and before placing orders for products.
Mini Ball Grid Array
Package Code: B (48-pin)
Notes:
1. Controlling dimensions are in millimeters.
mBGA - 6mm x 8mm
MILLIMETERS
INCHES
Sym.
Min. Typ. Max.
Min. Typ. Max.
N0.
Leads
48
A
--
--
1.20
--
--
0.047
A1
0.24
--
0.30
0.009
--
0.012
A2
0.60
--
--
0.024
--
--
D
7.90
--
8.10
0.311
--
0.319
D1
5.25 BSC
0.207 BSC
E
5.90
--
6.10
0.232
--
0.240
E1
3.75 BSC
0.148 BSC
e
0.75 BSC
0.030 BSC
b
0.30
0.35
0.40
0.012 0.014 0.016
mBGA - 8mm x 10mm
MILLIMETER
INCHES
Sym.
Min. Typ. Max.
Min. Typ. Max.
N0.
Leads
48
A
--
--
1.20
--
--
0.047
A1
0.24
--
0.30
0.009
--
0.012
A2
0.60
--
--
0.024
--
--
D
9.90
--
10.10
0.390
--
0.398
D1
5.25 BSC
0.207 BSC
E
7.90
--
8.10
0.311
--
0.319
E1
3.75 BSC
0.148 BSC
e
0.75 BSC
0.030 BSC
b
0.30
0.35
0.40
0.012 0.014 0.016
SEATING PLANE
A
A1
A2
A
B
C
D
E
F
G
H
e
e
D1
E1
E
D
b (48x)
Top View
Bottom View
6 5 4 3 2 1
1 2 3 4 5 6
A
B
C
D
E
F
G
H
PACKAGING INFORMATION
ISSI
Integrated Silicon Solution, Inc. -- www.issi.com --
1-800-379-4774
Rev. F
06/18/03
Copyright 2003 Integrated Silicon Solution, Inc. All rights reserved. ISSI reserves the right to make changes to this specification and its products at any time
without notice. ISSI assumes no liability arising out of the application or use of any information, products or services described herein. Customers are advised to
obtain the latest version of this device specification before relying on any published information and before placing orders for products.
Plastic TSOP
Package Code: T (Type II)
D
SEATING PLANE
b
e
C
1
N/2
N/2+1
N
E1
A1
A
E
L
ZD
.
Notes:
1. Controlling dimension: millimieters,
unless otherwise specified.
2. BSC = Basic lead spacing
between centers.
3. Dimensions D and E1 do not
include mold flash protrusions and
should be measured from the
bottom of the package.
4. Formed leads shall be planar with
respect to one another within
0.004 inches at the seating plane.
Plastic TSOP (T - Type II)
Millimeters
Inches
Millimeters
Inches
Millimeters
Inches
Symbol Min
Max
Min
Max
Min
Max
Min
Max
Min
Max
Min
Max
Ref. Std.
No. Leads (N)
32
44
50
A
--
1.20
--
0.047
--
1.20
--
0.047
--
1.20
--
0.047
A1
0.05
0.15
0.002 0.006
0.05
0.15
0.002 0.006
0.05
0.15
0.002 0.006
b
0.30
0.52
0.012 0.020
0.30
0.45
0.012 0.018
0.30
0.45
0.012 0.018
C
0.12
0.21
0.005 0.008
0.12
0.21
0.005 0.008
0.12
0.21
0.005 0.008
D
20.82 21.08
0.820 0.830
18.31 18.52
0.721 0.729
20.82 21.08
0.820 0.830
E1
10.03 10.29
0.391 0.400
10.03 10.29
0.395 0.405
10.03 10.29
0.395 0.405
E
11.56 11.96
0.451 0.466
11.56 11.96
0.455 0.471
11.56 11.96
0.455 0.471
e
1.27 BSC
0.050 BSC
0.80 BSC
0.032 BSC
0.80 BSC
0.031 BSC
L
0.40
0.60
0.016 0.024
0.41
0.60
0.016 0.024
0.40
0.60
0.016 0.024
ZD 0.95 REF 0.037 REF 0.81 REF 0.032 REF 0.88 REF 0.035 REF
0
5
0
5
0
5
0
5
0
5
0
5