Part NO. : ATIR0A11S
SPEC NO: DSAD1563
REV NO: V.1
DATE: APR/19/2003
PAGE: 1 OF 4
APPROVED: J. Lu
CHECKED: Allen Liu
DRAWN: K.ZHANG
*Features
!
Compact and thin.
!
Visible light cut-off type.
!
High sensitivity.
*Applications
!
Cassette tape recorders,VCRS.
!
Floppy disk drives.
!
Various microcomputerized control equipment.
SUBMINIATURE, HIGH SENSITIVITY PHOTOINTERRUPTER
UNIT : MM[INCH]
TOLERANCE
:
0.25[
0.01] UNLESS OTHERWISE NOTED.
*Absolute Maximum Ratings ( Ta=25
C )
Output
(1/16 inch from body for 5 seconds)
Lead Soldering Temperature
Operating Temperature
Storage Temperature
mA
Tsol
260
Collector Current
Collector Power Dissipation
Tstg
Topr
-40~+100
-40~+85
C
P
C
I
75
20
:C
:C
:C
mW
Input
75
d
P
Power Dissipation
Collector-Emitter Voltage
Emitter-Collector Voltage
CEO
V
ECO
V
35
6
Forward Current
Reverse Voltage
Item
50
F
I
R
V
6
Symbol
Rating
mW
V
V
mA
V
Unit
SPEC NO: DSAD1563
REV NO: V.1
DATE: APR/19/2003
PAGE: 2 OF 4
APPROVED: J. Lu
CHECKED: Allen Liu
DRAWN: K.ZHANG
Part NO. : ATIR0A11S
0
500
1000
1500
2000
0
10
20
30
40
50
Forward current
1
F
(mA)
Collector current
1
c(uA)
V
+-
=2V
Ta=25J
0
100
200
300
400
500
600
700
0
2
4
6
8
10
12
Collector current
1
c(uA)
I
.
=15mA
10mA
7mA
4mA
2mA
Ta= 25J
Collector-emitter voltage V
CE
(V)
0
25
50
75
100
125
-25
0
25
50
75
100
Ambient temperature T
a
(J
J
J
J )
Relative collector current
1
c (%)
I
.
=4mA
V
+-
=2V
1mm-thick glass
Test Condition and
Arrangement for
Collector Current
AI evaporation
Fig.1 Forward Current vs.
Forward Voltage
Fig.3 Collector Current vs.
Collector-emitter Voltage
Fig.2 Collector Current vs.
Forward Current
1
10
100
0
0.5
1
1.5
2
Forw ard voltage V
.
(V)
Forward current
I
.
(mA)
75J
50J
25J
-25J
0J
Fig.4 Relative Collector Current vs.
Ambient Temperature
Electro-optical Characteristics(Ta=25J
J
J
J)
Parameter
Symbol
Conditions
Min. Typ. Max. Unit
Forward voltage
V
F
I
F
=20mA
1.0V 1.2
1.4
V
Input
Reverse current
I
R
V
R
=6V
10
A
Output Collector dark current
I
CEO
V
CE
=20V
10
-9
10
-7
A
*
1
Collector current
Ic
V
CE
=2V,I
F
=4mA
10
40 0
A
*
2
Leak current
I
LEAK
V
CE
=2V,I
F
=4mA
0
.1
A
Rise time
t
R
20
100 sec
Transfer
charac-
teristics Response time
Fall time
t
F
V
CE
=2V,I
C
=100A
R
L
=1K[,d=1mm
20
100 sec
*1 The condition and arrangement of the reflective object are shown below
*2 Without reflective object
Classification table of radiant flux
Rank mark
BIN1
BIN2
BIN3
BIN4
BIN5
BIN6
Ic(gA)
10~30
31~60
61~90
91~125
126~200
201~400
Part NO. : ATIR0A11S
SPEC NO: DSAD1563
REV NO: V.1
DATE: APR/19/2003
PAGE: 3 OF 4
APPROVED: J. Lu
CHECKED: Allen Liu
DRAWN: K.ZHANG
Fig.5 Response Time vs.
Load Resistance
Fig.6 Collector Dark Current vs.
Ambient Temperature
Fig.7 Relative Collector Current vs.
Distance between Sensor and
Al Evaporation Glass
0.1
1
10
100
1000
10000
0.1
1
10
100
1000
Load resistance R
L
(K[
[
[
[ )
Response time (us)
V
+-
=2V
I
+
=100uA
Ta=25J
t
H
t
B
t
@
t
I
Input
t
H
t
@
t
B
t
I
Input
R
D
Output
Output
R
L
Vcc
Test Circuit for Response Time
1.E-10
1.E-09
1.E-08
1.E-07
1.E-06
0
25
50
75
100
Ambient temperature Ta (J
J
J
J )
Collector dark current I
CEO
(A)
V
+-
=20V
0
20
40
60
80
100
0
1
2
3
4
5
Relative collector current (%)
Distance betw een sensor and Al evaporation
glass d(mm)
I
.
=4mA
V
+-
=2V
Ta=25J
0
20
40
60
80
100
-3 -2
-1
0
1
2
3
4
5
6
Card moving distance 1 (mm)
Relative collector current(%)
I
.
=4mA
V
+-
=2V
d=1mm
Ta=25J
Fig.8 Relative Collector Current vs.
Card Moving Distance(1)
Fig.9 Relative Collector Current vs.
Card Moving Distance(2)
0
20
40
60
80
100
-2 -1
0
1
2
3
4
5
6
7
Card mov ing distance 1 (mm)
Relative collector current(%)
I
.
=4mA
V
+-
=2V
d=1mm
Ta=25J
SPEC NO: DSAD1563
REV NO: V.1
DATE: APR/19/2003
PAGE: 4 OF 4
APPROVED: J. Lu
CHECKED: Allen Liu
DRAWN: K.ZHANG
Part NO. : ATIR0A11S
Test Condition for Distance &Detecting
PositionCharacteristics
Correpond to Fig. 8
Test condition
White
Black
OMS card
d
1mm
+
I=0
-
OMS card
White
Test condition
Correpond to Fig. 9
+
d
-
I=0
Black
1mm
I
.
=4mA
V
+-
=2V
d=1mm
I
.
=4mA
V
+-
=2V
d=1mm
Correpond to Fig. 7
AI evaorated glass d
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