KAF-3200E / KAF-3200ME

Eastman Kodak Company - Image Sensor Solutions

For the most current information regarding this product:

Phone: (585) 722-4385 Fax: (585) 477-4947 Web: www.kodak.com/go/imagers E-mail: imagers@kodak.com

Revision No. 2

TABLE OF CONTENTS

1. Description.......................................................................................................................................3
1.1 Features............................................................................................................................................3
1.2 Architecture .....................................................................................................................................3
1.3 Functional

Description.....................................................................................................................4

1.4 Pin

Description ................................................................................................................................5

Imaging Performance Specifications ...............................................................................................6

2.1 Electro-Optical

Characteristics ........................................................................................................6

2.2 Quantum Efficiency (No microlens, no cover glass).......................................................................7
2.3 Quantum Efficiency (With microlens, no cover glass)....................................................................7
2.4 Cosmetic

Specification ....................................................................................................................9

3. Operation .......................................................................................................................................10
3.1 Absolute Maximum Ratings ..........................................................................................................10
3.2 DC Operating Conditions ..............................................................................................................11
3.3 AC Operating Conditions ..............................................................................................................12
3.4 AC Timing Conditions...................................................................................................................12
3.5 Clock

Timing .................................................................................................................................13

Storage and Handling.....................................................................................................................14

Quality Assurance and Reliability .................................................................................................15

6. Packager

Drawing..........................................................................................................................16

AR Cover Glass Transmission.......................................................................................................17

8. Ordering

Information.....................................................................................................................18

FIGURES

Figure 1 Block Diagram........................................................................................................................3
Figure 2 Pin Assignments......................................................................................................................5
Figure 3 Spectral response. ...................................................................................................................8
Figure 4 Typical Output Load Diagram for Operation of up to 10 MHz............................................11
Figure 5 Timing Diagrams ..................................................................................................................13
Figure 6 Package Drawing ..................................................................................................................16
Figure 7 CoverGlass Transmission. ....................................................................................................17

KAF-3200E / KAF-3200ME

Eastman Kodak Company - Image Sensor Solutions

For the most current information regarding this product:

Phone: (585) 722-4385 Fax: (585) 477-4947 Web: www.kodak.com/go/imagers E-mail: imagers@kodak.com

Revision No. 2

1. Description

1.1 Features

3.2 Million Pixel Area CCD

2184 H x 1472V Pixels

Transparent Gate True Two Phase Technology

Microlens option

Enhanced Spectral Response

6.8 x 6.8

µm Pixels

14.85mm H x 10.26mm V Photosensitive Area

100% Fill Factor

High Output Sensitivity (20

µV/e-)

78 dB Dynamic Range

Low Dark Current ( <7pA/cm2 @ 25oC)

1.2 Architecture

The KAF-3200E is a high performance monochrome area
CCD (charge-coupled device) image sensor with 2184H x
1472V photoactive pixels designed for a wide range of
image sensing applications in the 0.3 nm to 1.0 nm
wavelength band. Typical applications include military,
scientific, and industrial imaging. A 75dB dynamic range
is possible operating at room temperature.

The sensor is built with a true two-phase CCD
technology employing a transparent gate and with micro
lenses available. This technology simplifies the support
circuits that drive the sensor and reduces the dark current
without compromising charge capacity. The transparent
gate results in spectral response increased ten times at
400 nm, compared to a front side illuminated standard
poly silicon gate technology. The micro lenses are an
integral part of each pixel and cause most of the light to
pass through the transparent gate half of the pixel,
further improving the spectral sensitivity.

The photoactive area is 14.85 mm x 10.26mm and is
housed in a 24 pin, dual in line (DIP) package with 0.1"
pin spacing.

The sensor consists of 2254 parallel (vertical) CCD shift
registers each 1510 elements long. These registers act as
both the photosensitive elements and as the transport
circuits that allow the image to be sequentially read out of
the sensor. The parallel (vertical) CCD registers transfer
the image one line at a time into a single 2267 element
(horizontal) CCD shift register. The horizontal register
transfers the charge to a single output amplifier. The
output amplifier is a two-stage source follower that
converts the photo-generated charge to a voltage for each
pixel.

2184 Active Pixels/Line

34 Dark

8 Invalid

Vrd

Vdd
Vout
Vss

Sub
Vog

2 Invalid

34 Dark line

4 Dark line

Vlg

= scavanging CCDs

to reduce edge

artifacts

1 active(CTE monitor)

3 Invalid

34 Dark

1 active(CTE monitor)

KAF - 3200E

Usable Active Area:

2184(H) x 1472(V)
6.8m x 6.8

µm pixels

Figure 1 - Block Diagram

KAF-3200E / KAF-3200ME

Eastman Kodak Company - Image Sensor Solutions

For the most current information regarding this product:

Phone: (585) 722-4385 Fax: (585) 477-4947 Web: www.kodak.com/go/imagers E-mail: imagers@kodak.com

Revision No. 2

1.3 Functional Description
1.3.1 Image Acquisition

An electronic representation of an image is formed when
incident photons falling on the sensor plane create
electron-hole pairs within the sensor. These photon-
induced electrons are collected locally by the formation of
potential wells at each pixel site. The number of electrons
collected is linearly dependent on light level and exposure
time and non-linearly dependent on wavelength. When
the pixel's capacity is reached, excess electrons will leak
into the adjacent pixels within the same column. This is
termed blooming. During the integration period, the V1
and V2 register clocks are held at a constant (low) level.
See Figure 5. - Timing Diagrams.

1.3.2 Charge Transport

Referring again to Figure 5 - Timing Diagrams, the
integrated charge from each photo-gate is transported to
the output using a two-step process. Each line (row) of
charge is first transported from the vertical CCDs to the
horizontal CCD register using the V1 and V2 register
clocks. The horizontal CCD is presented a new line on the
falling edge of V1 while H2 is held high. The
horizontal CCD's then transport each line, pixel by pixel,
to the output structure by alternately clocking the H1
and H2 pins in a complementary fashion. On each
falling edge of H1 a new charge packet is transferred
onto a floating diffusion and sensed by the output
amplifier

1.3.1 Output Structure

Charge presented to the floating diffusion (FD) is
converted into a voltage and current amplified in order to
drive off-chip loads. The resulting voltage change seen at
the output is linearly related to the amount of charge
placed on FD. Once the signal has been sampled by the
system electronics, the reset gate (R) is clocked to
remove the signal and FD is reset to the potential applied
by VRD. More signal at the floating diffusion reduces the
voltage seen at the output pin. In order to activate the
output structure, an off-chip load must be added to the
Vout pin of the device - see Figure 4

1.3.4 Dark Reference Pixels

At the beginning of each line are 34 light shielded pixels.
There is also 34 full dark line at the start of every frame
and 4 full dark line at the end of each frame. Under
normal circumstances, these pixels do not respond to
light. However, dark reference pixels in close proximity
to an active pixel, (including the 2 full dark lines and one
column at end of each line), can scavenge signal
depending on light intensity and wavelength and therefore
will not represent the true dark signal.

1.3.5 Transfer Efficiency Test Pixels and
Dummy Pixels

At the beginning of each line and at the end of each line
are extra horizontal CCD pixels. These are a combination
of pixels that are not associated with any vertical CCD
register and two that are associated with extra photoactive
vertical CCDs. These are provided to give an accurate
photosensitive signal that can be used to monitor the
charge transfer efficiency in the serial (horizontal)
register.

They are arranged as follows beginning with the first
pixel in each line

8 dark, inactive pixels

photoactive

3 inactive pixels

34 dark reference pixels

2184 photoactive pixels

34 dark pixels

1 photo active pixel

2 inactive pixels

KAF-3200E / KAF-3200ME

Eastman Kodak Company - Image Sensor Solutions

For the most current information regarding this product:

Phone: (585) 722-4385 Fax: (585) 477-4947 Web: www.kodak.com/go/imagers E-mail: imagers@kodak.com

Revision No. 2

1.4 Pin Description

Pin

Symbol

Description

Pin

Symbol

Description

VOG

Output Gate

12, 13, 14

VSUB

Substrate (Ground)

VOUT

Video Output

15, 16, 21, 22

Vertical CCD Clock - Phase 1

VDD

Amplifier Supply

17, 18, 19, 20

Vertical CCD Clock - Phase 2

VRD

Reset Drain

VGuard Guard Ring

Reset Clock

N/C

No Connection (open pin)

VSS

Amplifier Supply Return

Horizontal CCD Clock - Phase 1

Horizontal CCD Clock - Phase 2

9, 10, 11

N/C

No connection (open pin)

Pin 1

Pixel 1,1

VGUARD

VSUB

N/C

VOG

VOUT

VDD

VRD

VSS

N/C

VSUB

Figure 2 - Pin Assignments

Note:
The KAF-3200E is designed to be compatible with the KAF-1602 and KAF-0401 series of Image sensors. The exception is the addition of
two new Vsub connections on pins 12 and 13.

KAF-3200E / KAF-3200ME

Eastman Kodak Company - Image Sensor Solutions

For the most current information regarding this product:

Phone: (585) 722-4385 Fax: (585) 477-4947 Web: www.kodak.com/go/imagers E-mail: imagers@kodak.com

Revision No. 2

2. Imaging Performance Specifications

2.1 Electro-Optical Characteristics

All values measured at 25

C, and nominal operating conditions. These parameters exclude defective pixels.

Description

Symbol

Min.

Nom.

Max.

Units

Notes

Saturation Signal
Vertical CCD capacity
Horizontal CCD capacity
Output Node capacity

Nsat

50000

100000
100000

55000

110000
110000

120000

electrons / pixel

Photoresponse Non-Linearity

PRNL

Photoresponse Non-Uniformity

PRNU

Dark Signal

Jdark

30
10

electrons / pixel / sec

pA/cm2

°C

Dark Signal Doubling Temperature

Dark Signal Non-Uniformity

DSNU

electrons / pixel / sec

Dynamic Range

Charge Transfer Efficiency

CTE

0.99997

0.99999

Output Amplifier DC Offset

Vodc

VRD - 2

VRD - 1

VRD

Output Amplifier Bandwidth

f-3dB

Mhz

Output Amplifier Sensitivity

Vout/Ne~

uV/e~

Output Amplifier output Impedance

Zout

175

200

250

Ohms

Noise Floor

ne~

electrons

Notes:

For pixel binning applications, electron capacity up to 150,000 can be achieved with modified CCD inputs.
Each sensor may have to be optimized individually for these applications. Some performance parameters may be compromised to
achieve the largest signals.

Worst-case deviation from straight line fit, between 2% and 90% of Nsat.

One Sigma deviation of a 128x128 sample when CCD illuminated uniformly.

Average of all pixels with no illumination at 25

°C..

Average dark signal of any of 11 x 8 blocks within the sensor. (Each block is 128 x 128 pixels)

20log ( Nsat / ne~) at nominal operating frequency and 25

Video level offset with respect to ground

Last output amplifier stage only. Assumes 10pF off-chip load..

Output noise at -10

C, 1MHz operating frequency (15MHz bandwidth), and tint = 0 (excluding dark signal).

KAF-3200E / KAF-3200ME

Eastman Kodak Company - Image Sensor Solutions

For the most current information regarding this product:

Phone: (585) 722-4385 Fax: (585) 477-4947 Web: www.kodak.com/go/imagers E-mail: imagers@kodak.com

Revision No. 2

2.2 Quantum Efficiency (No micro lens; no cover glass)

(See Figure 3 - Spectral Response)

Wavelength

Min.

Nom.

Max.

Units Notes

Rr (650 nm)

% 1,

Rg (550 nm)

% 1,

Rb (450 nm)

% 1,

Rb (400 nm)

% 1,

Notes:

The spectral response is characterized on a small number of parts.

The expected minmum value at each wavelength is nom (0.15 * nom)

The spectral response is characterized on a small number of parts.

The expected maximum value at each wavelength is nom + (0.15 * nom

)

The no micro lens configuration is available with either no cover glass or with a multi side anti-reflection coated cover glass.
See Figure 7 - MAR Cover Glass Transmission. The values above and in Figure 3 - Spectral Response are for the no cover
glass configuration.

2.3Quantum Efficiency (With micro lens; no cover glass)

(See Figure 3 - Spectral Response)

Wavelength

Min.

Nom.

Max.

Units Notes

Rr (650 nm)

% 1,

Rg (550 nm)

% 1,

Rb (450 nm)

% 1,

Rb (400 nm)

% 1,

Notes:

The spectral response is characterized on a small number of parts.
The expected minmum value at each wavelength is nom (0.15 * nom)

The spectral response is characterized on a small number of parts.
The expected maximum value at each wavelength is nom + (0.15 * nom)

The micro lens configuration is available with either no cover glass or with a multi side anti-reflection coated cover glass.
See Figure 7 - MAR Cover Glass Transmission. The values above and in Figure 3 - Spectral Response are for the no cover
glass configuration.

KAF-3200E / KAF-3200ME

Eastman Kodak Company - Image Sensor Solutions

For the most current information regarding this product:

Phone: (585) 722-4385 Fax: (585) 477-4947 Web: www.kodak.com/go/imagers E-mail: imagers@kodak.com

Revision No. 2

2.4 Cosmetic Specification

Defect tests performed at T=25

Grade Point

Defects

Cluster Defects

Column Defects

Total Zone

A Total Zone

C1 <5 <2 0 0 0 0

C2 <10 <5 <4 <2 0 0

1,1

2184,1

2184,1472

1,1472

320,216

1864,216

320,1256

1864,1256

Zone A

Zone A = Central 1544H x 1040V Region

Point Defect

DARK: A pixel which deviates by more than 6% from
neighboring pixels when illuminated to 70% of saturation, OR

BRIGHT: A Pixel with dark current >5000e/pixel/sec at 25

°C.

Cluster Defect

A grouping of not more than 5 adjacent point defects

Column Defect

1) A grouping of >5 contiguous point defects along a single
column,
2) A column containing a pixel with dark current >
12,000e/pixel/sec (bright column)
3) A column that does not meet the minimum vertical CCD
charge capacity (low charge capacity column)
4) A column which loses more than 250 e under 2Ke
illumination.(trap defect))

Neighboring pixels

The surrounding 128 x 128 pixels or

±64 columns/rows.

Defect Separation

Column and cluster defects are separated by no less than two
(2) pixels in any direction (excluding single pixel defects).

KAF-3200E / KAF-3200ME

Eastman Kodak Company - Image Sensor Solutions

For the most current information regarding this product:

Phone: (585) 722-4385 Fax: (585) 477-4947 Web: www.kodak.com/go/imagers E-mail: imagers@kodak.com

Revision No. 2

3. Operation

3.1 Absolute Maximum Ratings

Description Symbol

Min.

Max.

Units

Notes

Diode Pin Voltages

Vdiode

1, 2

Gate Pin Voltages - Type 1

Vgate1

-16

1, 3

Gate Pin Voltages - Type 2

Vgate2

1, 4

Inter-Gate Voltages

Vg-g

V 5

Output Bias Current

Iout

-10

Output Load Capacitance

Cload

Storage Temperature

100

Humidity

RH 5

90 %

Notes:
1. Referenced to pin Vsub.

2. Includes pins: VRD, Vdd, Vss, Vout.
3. Includes

pins:

V1, V2, H1, H2.

4. Includes pins: Vog, R
5. Voltage difference between overlapping gates. Includes: V1 to V2, H1 to H2, V2 to H1, H2 to Vog.
6. Avoid shorting output pins to ground or any low impedance source during operation.
7. T=25

°C. Excessive humidity will degrade MTTF.

CAUTION:

This device contains limited protection against Electrostatic Discharge (ESD) and is rated as a Class 0
device, JESD22 Human Body, and Class A, JESD22 Machine Model.
Devices should be handled in accordance with strict handling precautions. (See ISS Application Note
MTD/PS-0224.)

KAF-3200E / KAF-3200ME

Eastman Kodak Company - Image Sensor Solutions

For the most current information regarding this product:

Phone: (585) 722-4385 Fax: (585) 477-4947 Web: www.kodak.com/go/imagers E-mail: imagers@kodak.com

Revision No. 2

3.2 DC Operating Conditions

Description

Symbol

Min.

Nom.

Max.

Units Max DC Current

(mA)

Notes

Reset Drain

VRD

12.25

0.01

Output Amplifier Return VSS

2.5

3.0

3.2

-0.5

Output Amplifier Supply VDD

14.5

15.25

Iout

Substrate VSUB

0.01

Output Gate

VOG

4.75

5.5

0.01

Guard VGUARD

Video Output Current

Iout

-5

-10

Notes:
1. An output load sink must be applied to Vout to activate output amplifier - see Figure below.

+15V

0.1uF

Vout

Buffered Output

140

2N3904 or equivalent

~5ma

Figure 4 - Typical Output Load Diagram for Operation of up to 10 MHz.

The value of R1 depends on the desired output current according the following formula: R1 = 0.7 / Iout
The optimal output current depends on the capacitance that needs to be driven by the amplifier and the bandwidth required.
5mA is recommended for capacitance of 12pF and pixel rates up to 15 MHz.

KAF-3200E / KAF-3200ME

Eastman Kodak Company - Image Sensor Solutions

For the most current information regarding this product:

Phone: (585) 722-4385 Fax: (585) 477-4947 Web: www.kodak.com/go/imagers E-mail: imagers@kodak.com

Revision No. 2

3.3 AC Operating Conditions

Description Symbol

Level

Min. Nom. Max. Units Effective

Capacitance

Vertical CCD Clock - Phase 1

Low

High

-10.0

0.0

-8.5

2.0

-8.5

3.0

V
V

5 nF

(all V1 pins)

Vertical CCD Clock - Phase 2

Low

High

-10.0

0.0

-8.5

2.0

-8.5

3.0

V
V

5 nF

(all V2 pins)

Horizontal CCD Clock - Phase 1

Low

High

-3.5

Low +

-3.0

7.0

-2

Low +

V
V

150 pF

Horizontal CCD Clock - Phase 2

Low

High

-3.5

Low +

-3.0

7.0

-2

Low +

V
V

150 pF

Reset Clock

Low

High

3.0

10.0

4.0

11.0

4.25

11.25

V
V

5pF

Notes:
1. All pins draw less than 10uA DC current.

3.4. AC Timing Conditions

Description Symbol

Min.

Nom.

Max.

Units

Notes

H1, H2 Clock Frequency

MHz

1, 2, 3

Pixel Period

67 100

H1, H2 Setup Time

0.5 1 us

V1, V2 Clock Pulse Width

4 5 us 2

Reset Clock Pulse Width

5 20 ns

Readout Time

readout

252.5 366.3

Integration Time

int

Line Time

tline

167.2 242.6

Notes:
1. 50% duty cycle values.
2. CTE may degrade above the nominal frequency.
3. Rise and fall times (10/90% levels) should be limited to 5-10% of clock period. Cross-over of register clocks should be between 40-

60% of amplitude.

R should be clocked continuously.

5. t

readout

= ( 1510 * tline )

6. Integration time is user specified. Longer integration times will degrade noise performance due to dark signal fixed pattern and shot

noise.

7. tline = ( 3* t

) + t

+ ( 2267 * t

) + t

KAF-3200E / KAF-3200ME

Eastman Kodak Company - Image Sensor Solutions

For the most current information regarding this product:

Phone: (585) 722-4385 Fax: (585) 477-4947 Web: www.kodak.com/go/imagers E-mail: imagers@kodak.com

Revision No. 2

3.5 Clock Timing

Frame Timing

tReadout

Line

1509

1510

1 Frame = 1510 Lines

tint

Pixel Timing Detail

Vout

Vsat

Vdark

Vsub

Vodc

1 count

Line Timing Detail

1 line

2267 counts

tHS

Vpix

Line Content

Photoactive Pixels

Dark Reference Pixels

Dummy Pixels

1-12

13-46

2231-2264

Vsat Saturated pixel video output signal
Vdark Video output signal in no light situation, not zero due to Jdark
Vpix Pixel video output signal level, more electrons =more negative*
Vodc Video level offset with respect to vsub
Vsub Analog Ground

* See Image Aquisition section (page 4)

47 - 2230

2265-2267

Figure 5 - Timing Diagrams

Note:
The KAF-3200E was designed to be compatible with the KAF-1602 and KAF-0401 series of image sensors. Please note that
the polarities of the two-phase clocks have been swapped on the KAF-3200E compared to the KAF-1602 and KAF-0401.

KAF-3200E / KAF-3200ME

Eastman Kodak Company - Image Sensor Solutions

For the most current information regarding this product:

Phone: (585) 722-4385 Fax: (585) 477-4947 Web: www.kodak.com/go/imagers E-mail: imagers@kodak.com

Revision No. 2

4. Storage and Handling

4.1 Storage Conditions

Image sensors should be stored at room temperature (nominally 25ºC.) in dry nitrogen. This is particularly important for
image sensors with temporary cover glass.

4.2 Electrostatic Discharge
CAUTION:

To allow for maximum performance, this device was designed with limited input protection; thus, it is sensitive to
electrostatic induced damage. These devices should be installed in accordance with strict ESD handling procedures for
Class 0 devices, JESD22 Human Body Model and Class A, Machine Model.

Devices should be stored in the conductive plastic, first-level packing.

For more information see Application Note MTD/PS-0224, Electrostatic Discharge Control.

KAF-3200E / KAF-3200ME

Eastman Kodak Company - Image Sensor Solutions

For the most current information regarding this product:

Phone: (585) 722-4385 Fax: (585) 477-4947 Web: www.kodak.com/go/imagers E-mail: imagers@kodak.com

Revision No. 2

5. Quality Assurance and Reliability

5.1 Quality Strategy:

All image sensors will conform to the specifications stated in this document. This will be accomplished through a
combination of statistical process control and inspection at key points of the production process. Typical specification
limits are not guaranteed but provided as a design target. For further information refer to ISS Application Note
MTD/PS-0292, Quality and Reliability.

5.2 Replacement

All devices are warranted against failure in accordance with the terms of Terms of Sale. This does not include failure
due to mechanical and electrical causes defined as the liability of the customer below.

5.3 Liability of the Supplier:

A reject is defined as an image sensor that does not meet all of the specifications in this document upon receipt by the
customer.

5.4 Liability of the Customer:

Damage from mechanical (scratches or breakage), electrical (ESD), or other electrical misuse of the device beyond the
stated absolute maximum ratings, which occurred after receipt of the sensor by the customer, shall be the responsibility
of the customer.

5.5 Cleanliness:

Devices are shipped free of mobile contamination inside the package cavity. Immovable particles and scratches that are
within the imager pixel area and the corresponding cover glass region directly above the pixel sites are also not allowed.
The cover glass is highly susceptible to particles and other contamination. Touching the cover glass must be avoided.
See ISS Application Note MTD/PS-0237, Cover Glass Cleaning for Image Sensors, for further information.

5.6 ESD Precautions

Devices are shipped in static-safe containers and should only be handled at static-safe workstations. See ISS
Application Note MTD/PS-0224. Electrostatic Discharge Control, for handling recommendations.

5.7 Reliability:

Information concerning the quality assurance and reliability testing procedures and results are available from the Image
Sensor Solutions and can be supplied upon request. For further information refer to ISS Application Note MTD/PS-
0292, Quality and Reliability.

5.8 Test Data Retention:

Image sensors shall have an identifying number traceable to a test data file. Test data shall be kept for a period of 2 years
after date of delivery.

5.9 Mechanical:

The device assembly drawing is provided as a reference. The device will conform to the published package tolerances.

KAF-3200E / KAF-3200ME

Eastman Kodak Company - Image Sensor Solutions

For the most current information regarding this product:

Phone: (585) 722-4385 Fax: (585) 477-4947 Web: www.kodak.com/go/imagers E-mail: imagers@kodak.com

Revision No. 2

8. Ordering Information

Address all inquiries and purchase orders to:

Image Sensor Solutions
Eastman Kodak Company
Rochester, New York 14650-2010
Phone: (585)

722-4385

Fax: (585)

477-4947

E-mail:

imagers@kodak.com

Web: www.kodak.com/go/imagers

Kodak reserves the right to change any information contained herein without notice. All information furnished by
Kodak is believed to be accurate.

WARNING: LIFE SUPPORT APPLICATIONS POLICY

Kodak image sensors are not authorized for and should not be used within Life Support Systems without
the specific written consent of the Eastman Kodak Company. Product warranty is limited to replacement of
defective components and does not cover injury or property or other consequential damages.

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