KAF-6302LE

Eastman Kodak Company - Image Sensor Solutions

For the most current information regarding this product:

Phone: (585) 722-4385 Fax: (585) 477-4947 Web: www.kodak.com/go/imagers E-mail: imagers@kodak.com

Revision No. 1

TABLE OF CONTENTS

1. Description....................................................................................................................................3
1.1. Features.........................................................................................................................................3
1.2. Architecture ..................................................................................................................................3
1.3. Functional

description ..................................................................................................................4

1.3.1. Image Acquisition.........................................................................................................................4
1.3.2. Charge Transport ..........................................................................................................................4
1.3.3. Output Structure............................................................................................................................4
1.3.4. Dark Reference Pixels ..................................................................................................................4
1.3.5. Buffer Rows..................................................................................................................................4
1.3.6. Dummy Pixels...............................................................................................................................4
1.4. Pin

description ..............................................................................................................................5

Imaging Performance Specifications ............................................................................................6

2.1. Electro-optical

characteristics.......................................................................................................6

2.2. Quantum

efficiency.......................................................................................................................7

2.3. Cosmetic

Specification .................................................................................................................7

2.3. Cosmetic

Specification .................................................................................................................8

3. Operation ......................................................................................................................................9
3.1.

Absolute Maximum Ratings .........................................................................................................9

3.2.

DC Operating Conditions ...........................................................................................................10

3.3.

AC Operating Conditions ...........................................................................................................11

3.4.

AC Timing Conditions................................................................................................................11

3.5 Clock

Timing ..............................................................................................................................12

Storage and Handling .................................................................................................................13

Quality Assurance and Reliability ..............................................................................................14

6. Mechanical

drawings ..................................................................................................................15

6.1. Package

Drawing ........................................................................................................................15

7. Ordering

Information..................................................................................................................16

Changes...................................................................................................................................................16

FIGURES

Figure 1 Functional Block Diagram .........................................................................................................3
Figure 2 Pin Designations........................................................................................................................5
Figure 3 Typical Output Structure Load Diagram..................................................................................10
Figure 4 Timing Diagrams.....................................................................................................................12

KAF-6302LE

Eastman Kodak Company - Image Sensor Solutions

For the most current information regarding this product:

Phone: (585) 722-4385 Fax: (585) 477-4947 Web: www.kodak.com/go/imagers E-mail: imagers@kodak.com

Revision No. 1

1. DESCRIPTION

1.1 F

EATURES

6M Pixel Area CCD

3072H x 2034V (9

�m) Pixels

Transparent Gate True Two Phase

Technology

(Enhanced Spectral Response)

27.65 mm H x 18.48 mm V Photosensitive

Area

2-Phase Register Clocking

70% Fill Factor

Antiblooming Protection

Low Dark Current ( <10pA/cm2 @ 25oC)

1.2 A

RCHITECTURE

The KAF-6302LE is a high performance monochrome
area CCD (charge-coupled device) image sensor with
3072H x 2034 V photo active pixels designed for a wide
range of image sensing applications in the 0.3 nm to 1.0
nm wavelength band. Typical applications include
military, scientific, and industrial imaging. A 74dB
dynamic range is possible operating at room temperature.

The sensor is built with a true two-phase CCD
technology. This technology simplifies the support
circuits that drive the sensor and reduces the dark current
without compromising charge capacity. The transparent
gate results in spectral response increased ten times at 400
nm, compared to a front side illuminated standard poly
silicon gate technology. The sensitivity is increased 50%
over the rest of the visible wavelengths.

Total chip size is 29.0 mm x 19.1 mm and is housed in a
26-pin, 0.88" wide DIL ceramic package with 0.1" pin
spacing.

The sensor consists of 3088 parallel (vertical) CCD shift
registers each 2056 elements long. These registers act as
both the photosensitive elements and as the transport
circuits that allow the image to be sequentially read out of
the sensor. The elements of these registers are arranged
into a 3072 x 2034 photosensitive array surrounded by a
light shielded dark reference of 16 columns and 20 rows.
The parallel (vertical) CCD registers transfer the image
one line at a time into a single 3100 element (horizontal)
CCD shift register. The horizontal register transfers the
charge to a single output amplifier. The output amplifier
is a two-stage source follower that converts the photo
generated charge to a voltage for each pixel.

KAF - 6302LE

Usable Active Image Area

3072(H) x 2034(V)
9 x 9

�m pixels

3:2 aspect ratio

3072 Active Pixels/Line

6 Dark

10 Inactive

V rd

V dd
V out
V ss

Sub
V og

V 1

V 2

Guard

2 Inactive

10 Dark

10 Dark lines

1 Buffer line

Figure 1 - Functional Block Diagram

KAF-6302LE

Eastman Kodak Company - Image Sensor Solutions

For the most current information regarding this product:

Phone: (585) 722-4385 Fax: (585) 477-4947 Web: www.kodak.com/go/imagers E-mail: imagers@kodak.com

Revision No. 1

1.3 F

UNCTIONAL DESCRIPTION

1.3.1 Image

Acquisition

An electronic representation of an image is formed when
incident photons falling on the sensor plane create
electron-hole pairs within the sensor. These photon-
induced electrons are collected locally by the formation of
potential wells at each photo gate or pixel site. The
number of electrons collected is linearly dependent on
light level and exposure time and non-linearly dependent
on wavelength. When the pixel's capacity is reached,
excess electrons will spill into the lateral overflow drain
(LOD) and drain off chip, thus isolating adjacent pixels
from the excess signal. This is termed anti-blooming
protection. During the integration period, the V1 and

V2 register clocks are held at a constant (low) level. See
Figure 5. - Timing Diagrams.

The anti blooming capability is provided by a lateral
overflow drain structure. This type of anti blooming
design consumes thirty percent of the pixel area and
reduces the saturation signal and quantum efficiency
proportionately. However, it maintains the broad spectral
response from 400 to 1000 nm and good linear response
up to saturation.

1.3.2 Charge

Transport

Referring again to Figure 5 - Timing Diagrams, the
integrated charge from each photo gate is transported to
the output using a two-step process. Each line (row) of
charge is first transported from the vertical CCDs to the
horizontal CCD register using the V1 and V2 register
clocks. The horizontal CCD is presented a new line on the
falling edge of V2 while H1 is held high. The
horizontal CCDs then transport each line, pixel by pixel,
to the output structure by alternately clocking the H1
and H2 pins in a complementary fashion. On each
falling edge of H2 a new charge packet is transferred
onto a floating diffusion and sensed by the output
amplifier

1.3.3 Output

Structure

Charge presented to the floating diffusion (FD) is
converted into a voltage and current amplified in order to
drive off-chip loads. The resulting voltage change seen at
the output is linearly related to the amount of charge
placed on FD. Once the signal has been sampled by the
system electronics, the reset gate (R) is clocked to
remove the signal and FD is reset to the potential applied
by Vrd. More signal at the floating diffusion reduces the
voltage seen at the output pin. In order to activate the
output structure, an off-chip load must be added to the
Vout pin of the device - see Figure 4

1.3.4

Dark Reference Pixels

Surrounding the peripheral of the device is a border of
light shielded pixels. This includes 6 leading and 10
trailing pixels on every line excluding dummy pixels.
There are also 10 full dark lines at the start of every frame
and 10 full dark lines at the end of each frame. Under
normal circumstances, these pixels do not respond to
light. However, dark reference pixels in close proximity
to an active pixel, or the outer bounds of the chip
(including the first two lines out), can scavenge signal
depending on light intensity and wavelength and therefore
will not represent the true dark signal.

1.3.5 Buffer

Rows

The rows adjacent to the dark reference have photo
response that is somewhat lower than that of the rest of
the photo active rows. For this reason they are not
included in the count of photo active rows. They may be
useful depending on the application.

1.3.6 Dummy

Pixels

Within the horizontal shift register are 10 leading and 2
trailing additional shift phases, which are not associated
with a column of pixels from the vertical register. These
pixels contain only horizontal shift register dark current
signal and do not respond to light. A few leading dummy
pixels may scavenge false signal depending on operating
conditions.

KAF-6302LE

Eastman Kodak Company - Image Sensor Solutions

For the most current information regarding this product:

Phone: (585) 722-4385 Fax: (585) 477-4947 Web: www.kodak.com/go/imagers E-mail: imagers@kodak.com

Revision No. 1

1.4 P

IN DESCRIPTION

Pin

Symbol

Description

Pin

Symbol

Description

1,13,14,15, 26

Vsub

Substrate (Ground)

Horizontal CCD Clock - Phase 1

Vout

Video Output

Horizontal CCD Clock - Phase 2

Vdd

Amplifier Supply

16, 17, 22,23

Vertical CCD Clock - Phase 1

Vrd

Reset Drain

18, 19, 20,21

Vertical CCD Clock - Phase 2

Reset Clock

Vguard Guard Ring

Vss

Amplifier Supply Return

Vog

Output Gate

7, 8, 9, 12

N/C

No connection (open pin)

Figure 2 - Pin

Designations

Pin 1

Pixel 1,1

Vog

Vguard

Vsub

Vout

Vdd

Vrd

N/C

Vss

N/C

Vsub

Vsub 1

KAF-6302LE

Eastman Kodak Company - Image Sensor Solutions

For the most current information regarding this product:

Phone: (585) 722-4385 Fax: (585) 477-4947 Web: www.kodak.com/go/imagers E-mail: imagers@kodak.com

Revision No. 1

IMAGING PERFORMANCE SPECIFICATIONS

2.1 E

LECTRO

OPTICAL CHARACTERISTICS

All values measured at 25

�

C, and nominal operating conditions. These parameters exclude defective pixels.

Description

Symbol

Min.

Nom.

Max.

Units

Notes

Saturation Signal

Vertical CCD capacity
Horizontal CCD capacity
Output Node capacity

Nsat

45000

170000
150000

55000

200000
160000

65000

240000
170000

electrons / pixel

Red Quantum Efficiency (

=650nm)

Green Quantum Efficiency (

=550nm)

Blue Quantum Efficiency (

=450nm)

Blue Quantum Efficiency (

=400nm)

Rg
Rb

Rb 400

42
35
20
16

%
%
%

Photoresponse Non-Linearity

PRNL

Photoresponse Non-Uniformity

PRNU

Dark Signal

Jdark

2.1

electrons / pixel / sec

pA/cm2

Dark Signal Doubling Temperature

6.3

7.5

Dark Signal Non-Uniformity

DSNU

electrons / pixel / sec

Dynamic Range

Charge Transfer Efficiency

CTE

0.99997

0.99999

Output Amplifier DC Offset

Vodc

Vrd+1.0

Output Amplifier Bandwidth

f-3dB

Mhz

Output Amplifier Sensitivity

Vout/Ne~

uV/e~

Output Amplifier output Impedance

Zout

175

200

250

Ohms

Noise Floor

ne~

electrons

Antiblooming Protection

Vab

128

Saturation exposure

Notes:

For pixel binning applications, electron capacity up to 320000 can be achieved with modified CCD inputs.

Each sensor may have to be optimized individually for these applications. Some performance parameters may be compromised
to achieve the largest signals.

Worst case deviation from straight line fit, between 1% and 90% of Vsat.

One Sigma deviation of a 128x128 sample when CCD illuminated uniformly.

Average of all pixels with no illumination at 25

Average dark signal of any of 12 x 8 blocks within the sensor. (each block is 128 x 128 pixels)

20log ( Nsat / ne~) at nominal operating frequency and 25

Video level offset with respect to ground

Last output amplifier stage only. Assumes 10pF off-chip load..

Output noise of the amplifier

at nominal operating frequency, and tint = 0, excluding dark current shot noise.

Bandwidth is five times the pixel frequency. Lower noise floor can be achieved at lower pixel frequencies and
reduced bandwidth. The noise floor is calculated to be 5 electrons at a pixel frequency of 200 kHz.

10. Number of times above the Vsat illumination level required to cause 50% distortion in a test pattern consisting of a bright

circular region approximately 1/10 the size of the image sensor. In most systems a 128x optical overload will cause flare from
reflections that mask the performance of the image sensor.

KAF-6302LE

Eastman Kodak Company - Image Sensor Solutions

For the most current information regarding this product:

Phone: (585) 722-4385 Fax: (585) 477-4947 Web: www.kodak.com/go/imagers E-mail: imagers@kodak.com

Revision No. 1

2.3 C

OSMETIC

PECIFICATION

Defect tests performed at T=25

Class Point

Defects Cluster Defects Maximum

Cluster

Size

Column Defects

Total

Zone A

Total

Zone A

Total

Zone A

0 0 2 0 0

3072,2048

1,1

3072,1

1,2048

1024,512

2048,512

2048,1536

1024,1536

Zone A

Center 1024 x 1024 Pixels

Point Defect

Dark: A pixel which deviates by more than 6% from
neighboring pixels when illuminated to 70% of saturation, OR

Bright: A Pixel with dark current > 3,000 e/pixel/sec at 25C.

Cluster Defect

A grouping of not more than 5 adjacent point defects

Column Defect

A grouping of >5 contiguous point defects along a single
column, OR
A column containing a pixel with dark current >
7,000e/pixel/sec, OR A column that does not meet the CTE
specification for all exposures less than the specified Max sat.
signal level and greater than 2 Ke, OR
A pixel which loses more than 250 e under 2Ke illumination.

Neighboring pixels

The surrounding 128 x 128 pixels or

�64 columns/rows.

Defect Separation

Column and cluster defects are separated by no less than two
(2) pixels in any direction (excluding single pixel defects).

Defect Region Exclusion Defect region excludes the outer two (2) rows and columns at

each side/end of the sensor.

KAF-6302LE

Eastman Kodak Company - Image Sensor Solutions

For the most current information regarding this product:

Phone: (585) 722-4385 Fax: (585) 477-4947 Web: www.kodak.com/go/imagers E-mail: imagers@kodak.com

Revision No. 1

3 OPERATION

3.1 A

BSOLUTE

AXIMUM

ATINGS

Description Symbol

Min.

Max.

Units

Notes

Diode Pin Voltages

Vdiode

1,2

Gate Pin Voltages - Type 1

Vgate1

-16

1,3

Gate Pin Voltages - Type 2

Vgate2

1,4

Inter-Gate Voltages

Vg-g 16

Output Bias Current

Iout

-10

Output Load Capacitance

Cload

Notes:

1. Referenced to pin Vsub.

2. Includes pins: Vrd, Vdd, Vss, Vout, Vguard.
3. Includes pins:

V1,

V2,

H1,

H2.

4. Includes pins:

R, Vog.

5. Voltage difference between overlapping gates. Includes:

V1 to

V2,

H1 to

H2,

V2 to

H1,

H2 to Vog.

6. Avoid shorting output pins to ground or any low impedance source during operation.

CAUTION:

This device contains limited protection against Electrostatic Discharge (ESD). This device is rated as Class 0 (<250V
per JESD22 Human Body Model test), or Class A (<200V JESD22 Machine Model test.)
Devices should be handled in accordance with strict ESD protection procedures.

KAF-6302LE

Eastman Kodak Company - Image Sensor Solutions

For the most current information regarding this product:

Phone: (585) 722-4385 Fax: (585) 477-4947 Web: www.kodak.com/go/imagers E-mail: imagers@kodak.com

Revision No. 1

3.3 AC

PERATING

ONDITIONS

Description Symbol

Level

Min. Nom. Max. Units Effective

Capacitance

Notes

Vertical CCD Clock - Phase 1

Low

High

-9.5

0.5

-9.0

2.0

-8.5

1.5

V
V

24 nF

(all V1 pins)

1, 2

Vertical CCD Clock - Phase 2

Low

High

-9.5

0.5

-9.0

2.0

-8.5

1.5

V
V

24 nF

(all V2 pins)

1, 2

Horizontal CCD Clock - Phase 1

Low

High

-4.0

Low+1

0.0

-4.0

Low+10.

-2.5

Low+1

0.0

V
V

300 pF

Horizontal CCD Clock - Phase 2

Low

High

-4.0

Low+1

0.0

-4.0

Low+10.

-2.5

Low+1

0.0

V
V

200 pF

Reset Clock

Low

High

4.0

9.0s

5.0

10.0

6.0

11.0

V
V

10 pF

Notes:

1. All pins draw less than 10uA DC current.
2. Capacitance values measured by examining the rise and fall times of the clock waveforms using clock drivers with known

output impedance. This is the effective capacitance that the clock driver will see when operating the sensor.

3.4 AC

IMING

ONDITIONS

Description Symbol

Min.

Nom.

Max.

Units

Notes

H1, H2 Clock Frequency

MHz

1, 2, 3

Pixel Period (1 Count)

83 250 ns

H1, H2 Setup Time

0.5 1 us

V1, V2 Clock Pulse Width

10 20 us

Reset Clock Pulse Width

10 20 ns

Readout Time

readout

592 1719 ms

Integration Time

int

Line Time

tline

287.8 836

Notes:

1. 50% duty cycle values.
2. CTE may degrade above the nominal frequency.
3. Rise and fall times (10/90% levels) should be limited to 5-10% of clock period. Cross-over of register clocks should be

between 40-60% of amplitude.

R should be clocked continuously.

5. t

readout

= ( 2056 * tline )

6. Integration time is user specified. Longer integration times will degrade noise performance.

7. tline = ( 3* t

) + t

+ ( 3100 * t

) + t

KAF-6302LE

Eastman Kodak Company - Image Sensor Solutions

For the most current information regarding this product:

Phone: (585) 722-4385 Fax: (585) 477-4947 Web: www.kodak.com/go/imagers E-mail: imagers@kodak.com

Revision No. 1

4. ENVIRONMENTAL

4.1 Operating

Conditions

Environment Minimum Maximum

Units

Notes

Temperature -25 +40

�C

Operating to Specification

Humidity 5

%RH

Temperature -25 +70

�C

Operating without Damage

Humidity 5

%RH

Temperature -20 +80

�C

In-Use Storage

Humidity -

%RH

Notes:
1. The image sensor shall meet the specifications of this document while operating at these conditions.
2. The image sensor shall continue to function but not necessarily meet the specifications of this document while operating at the

specified conditions.

4.2 Reliability

Testing

See Application Note MTD/PS-0292, Quality and Reliability, for the ISS environmental testing philosophy and procedures.

4.3 Inventory

Storage

Image sensors should be stored at room temperature (nominally 25�C.) in dry nitrogen. This is particularly important for
image sensors with temporary cover glass. Excessive humidity will degrade MTTF.

4.4 Electrostatic

Discharge

CAUTION:

To allow for maximum performance, this device was designed with limited input protection; thus, it is sensitive to
electrostatic induced damage. These devices should be installed in accordance with strict ESD handling procedures for
Class 0 (<250V per JESD22 Human Body Model test), or Class A (<200V JESD22 Machine Model test).

Devices should be stored in the conductive plastic, first-level packing.

For more information, see ISS Application Note MTD/PS-0224, Electrostatic Discharge Control.

KAF-6302LE

Eastman Kodak Company - Image Sensor Solutions

For the most current information regarding this product:

Phone: (585) 722-4385 Fax: (585) 477-4947 Web: www.kodak.com/go/imagers E-mail: imagers@kodak.com

Revision No. 1

QUALITY ASSURANCE AND RELIABILITY

5.1 Quality

Strategy

: All image sensors will conform to the specifications stated in this document.

This will be accomplished through a combination of statistical process control and inspection at
key points of the production process. Typical specification limits are not guaranteed but provided
as a design target. For further information refer to ISS Application Note MTD/PS-0292, Quality
and Reliability.

5.2 Replacement

: All devices are warranted against failure in accordance with the terms of Terms of

Sale. This does not include failure due to mechanical and electrical causes defined as the liability
of the customer below.

5.3

Liability of the Supplier

: A reject is defined as an image sensor that does not meet all of the

specifications in this document upon receipt by the customer

5.4

Liability of the Customer:

Damage from mechanical (scratches or breakage), electrical (ESD), or

other electrical misuse of the device beyond the stated absolute maximum ratings, which occurred
after receipt of the sensor by the customer, shall be the responsibility of the customer.

5.5 Cleanliness

: Devices are shipped free of mobile contamination inside the package cavity.

Immovable particles and scratches that are within the imager pixel area and the corresponding
cover glass region directly above the pixel sites are also not allowed. The cover glass is highly
susceptible to particles and other contamination. Touching the cover glass must be avoided. See
ISS Application Note DS 00-009, Cover Glass Cleaning, for further information.

5.6 ESD

Precautions

: Devices are shipped in static-safe containers and should only be handled at

static-safe workstations. See ISS Application Note MTD/PS-0224 for handling
recommendations.

5.7 Reliability

: Information concerning the quality assurance and reliability testing procedures and

results are available from the Image Sensor Solutions and can be supplied upon request. . For
further information refer to ISS Application Note MTD/PS-0292, Quality and Reliability.

5.8

Test Data Retention:

Image sensors shall have an identifying number traceable to a test data file.

Test data shall be kept for a period of 2 years after date of delivery.

5.9 Mechanical

: The device assembly drawing is provided as a reference. The device will conform to

the published package tolerances.

KAF-6302LE

Eastman Kodak Company - Image Sensor Solutions

For the most current information regarding this product:

Phone: (585) 722-4385 Fax: (585) 477-4947 Web: www.kodak.com/go/imagers E-mail: imagers@kodak.com

Revision No. 1

7. Ordering

Information

Address all inquiries and purchase orders to:

Image Sensor Solutions
Eastman Kodak Company
Rochester, New York 14650-2010
Phone: (585)

722-4385

Fax: (585)

477-4947

Web:

www.kodak.com/go/imagers

E-mail:

imagers@kodak.com

Kodak reserves the right to change any information contained herein without notice. All information furnished by
Kodak is believed to be accurate.

WARNING: LIFE SUPPORT APPLICATIONS POLICY

Kodak image sensors are not authorized for and should not be used within Life Support Systems without
the specific written consent of the Eastman Kodak Company. Product warranty is limited to replacement of
defective components and does not cover injury or property or other consequential damages.

Changes:

Revision

Number

Release

Date

Description of Changes

7/18/02

Initial formal release.

Электронный компонент: KAF-6302LE