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All data sheets are subject to change without notice
(858) 503-3300 - Fax: (858) 503-3301 - www.maxwell.com
Nuclear Event Detector
HSN-500
2005 Maxwell Technologies
All rights reserved.
01.7.05 Rev 3
F
EATURES
:
Detects ionizing radiation pulses
Tested/certified detection threshold level
Adjustable circumvention period
100% testable with built-in test
Detection threshold adjustability
Single +5V operation
Designed-in radiation hardness
Compliant to MIL-PRF-38534 Class H
1
Flat pack (F) or DIP (L) packages
R
ADIATION
H
ARDNESS
C
HARACTERISTICS
Dose Rate (operate-through): 1 x 10
12
rad(Si)/sec
Total Dose: 1 x 10
6
rad(Si)
Neutron Fluence: 5 x 10
13
n/cm
2
Approximate Detection Range: 2 x 10
5
- 2 x 10
7
rad(Si)/sec
Maxwell Technologies Specified, Controlled, and Tested
D
ESCRIPTION
:
Maxwell Technologies' HSN-500 radiation-hardened Hybrid
Nuclear Event Detector (NED) senses ionizing radiation pulses
generated by a nuclear event, such as the detonation of a nuclear
weapon, and rapidly switches its output from the normal high
state to a low state with a propagation delay time of less than 20
ns. The active low Nuclear Event Detection signal (NED) is used
to initiate a wide variety of circumvention functions, thus prevent-
ing upset and burnout of electronic components. The NED output
is also used to initiate both hardware and software recovery. This
high-speed, 14-pin hybrid detector is used in electronic systems
as a general-purpose circumvention device to protect memory,
stop data processing, and drive power supply switches as well as
signal clamps.
The HSN-500 is designed to operate through three critical envi-
ronments: ionizing dose rate [10
12
rad(Si)/s], gamma total dose
[10
6
rad(Si)], and neutron fluence [5 x 10
13
n/cm
2
]. In addition, the
device is designed to function throughout the transient neutron
pulse. The hybrid's discrete design ensures a controlled response
in these radiation environments as well as immunity to latchup.
The detection level and functionality of a sample of each HSN-
500 production lot are tested in an ionizing dose rate environ-
ment. A certificate is provided reporting the test results for the
production lot.
The detection threshold of the HSN-500 is adjustable within the
range of 2 x 10
5
rad(Si)/s to 2 x 10
7
rad(Si)/s. This detection level
can be preset by Maxwell or adjusted by the user. Less than a
30% variation in detection threshold can be expected over the
entire operating temperature range.
1.
Manufactured for Maxwell Technologies by Teledyne Micoelectronic
Technologies to MIL-PRF-38534, Class H, no RHA
Detector
(Pin Diode)
Amplifier
Pulse Timer
LED
4
5
7
6
8
9
14
1
2
V
H
V
L
Threshold
Adjust
V
B
BIT
GND
C
RC
NED
10 k
Logic Diagram
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All data sheets are subject to change without notice
2005 Maxwell Technologies
All rights reserved.
Nuclear Event Detector
HSN-500
01.07.05 Rev 3
T
ABLE
1. P
IN
D
ESCRIPTION
P
IN
N
UMBER
P
IN
F
UNCTION
1
Load Voltage, V
L
2
Nuclear Event Detector, NED
3
No Connection
4
External Capacitor
5
External Capacitor
6
Built In Test, BIT
7
Package Ground and Case
8
PIN Diode Bias, V
B
9
Threshold Adjust
10
No Connection
11
No Connection
12
No Connection
13
No Connection
14
Hardened Supply Voltage, V
H
T
ABLE
2. E
LECTRICAL
C
HARACTERISTICS
P
ARAMETER
S
YMBOL
C
ONDITIONS
-55
C < T
A
< 125
C
M
IN
M
AX
U
NIT
G
ROUP
A
S
UBGROUP
Hardened Supply Voltage
V
H
4.5
5.5
V
1,2,3
Hardened Supply Current
- Standby
1
- Operational
2
I
H
V
H
= 5.5V
--
--
--
30
120
mA
1,2,3
Load Voltage
V
L
--
20
V
1,2,3
Load Current
- Standby
1
- Operational
2
I
L
V
L
= 20V
--
--
100
2.25
A
mA
1,2,3
PIN Diode Bias Voltage - Standby
1
V
B
4.5
20
V
1,2,3
PIN Diode Bias Current - Standby
1
I
B
--
100
A
1,2,3
Built-In-Test (BIT)
3,4
V
IH
I
IH
V
IL
I
IL
t
PW
V
IH
= 4.0V
V
IL
= 0.5V
Pin 9 Open, V
IH
= 4.0V
4.0
--
--
--
10
5.5
25
0.5
10
--
V
mA
V
A
s
7,8
1,2,3
7,8
1,2,3
9,10,11
NED
V
OH
V
OL
V
L
= 20V, I
OH
= -100 A
I
OL
= 10 mA
I
OL
= 100 mA
18.5
--
--
--
0.6
1.0
V
1,2,3
1,2,3
Radiation Propagation Delay Time
5
t
D
--
20
ns
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All data sheets are subject to change without notice
2005 Maxwell Technologies
All rights reserved.
Nuclear Event Detector
HSN-500
01.07.05 Rev 3
M
ECHANICAL
D
IMENSIONS
Note: All dimensions in inches.
1. Standby mode is the normal state of the device, defined as having the NED output (pin 2) in the "high" state.
2. Operational mode is in effect during the timeout period of the NED signal, characterized by having the NED output in the "low"
state, causing the greatest current draw of the device.
3. BIT electrical characteristics are not guaranteed over the radiation range.
4. BIT may not meet specification when only a resistor is used to adjust the detection level. To use BIT in this situation, it is
advised that a series resistor/capacitor combination is used.
5. Guaranteed but not tested over temperature. Time delay, t
D
, is measured at 50% points from the rising edge of the radiation
pulse to the falling edge of the NED output at approximately 10 times the detection level.
0.600
0.015 0.003
0.100
TYP
0.500
MIN
0.495
0.795
0.145 MAX
0.070 0.002
0.010 0.002
14 13 12 11 10
9
8
1
2
3
4
5
6
7
14 13 12 11 10
9
8
1
2
3
4
5
6
7
0.795
0.600
0.100 TYP
0.495
0.300
0.145 MAX
0.200
0.016
0.020
DIA
TOP VIEW
Flatpack Hybrid Package
HSN-500F
DIP Hybrid Package
HSN-500L
All tolerances are 0.005 unless specified
Table 2. Notes
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All data sheets are subject to change without notice
2005 Maxwell Technologies
All rights reserved.
Nuclear Event Detector
HSN-500
01.07.05 Rev 3
Important Notice:
The specifications presented within these data sheets represent the latest and most accurate information available to
date. However, these specifications are subject to change without notice and Maxwell Technologies assumes no
responsibility for the use of this information.
Maxwell Technologies' products are not authorized for use as critical components in life support devices or systems
without express written approval from Maxwell Technologies.
Any claim against Maxwell Technologies must be made within 90 days from the date of shipment from Maxwell Tech-
nologies. Maxwell Technologies' liability shall be limited to replacement of defective parts.
Product Ordering Options
Model Number
Feature
Option Details
HSN-500
X
Package
Base Product
Nomenclature
L = Dual In-line Package (DIP)
F = Flat Pack
Nuclear Event Detector
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