PRODUCTS AND SPECIFICATIONS DISCUSSED HEREIN ARE SUBJECT TO CHANGE BY MICRON WITHOUT NOTICE.
09005aef808f8ccd
DD9C16_32_64x72AG_A.fm - Rev. A 8/03 EN
1
2003 Micron Technology, Inc.
128MB, 256MB, 512MB (x72, ECC)
184-Pin DDR SDRAM DIMM
DDR SDRAM
DIMM
MT9VDDT1672A 128MB
MT9VDDT3272A 256MB
MT9VDDT6472A 512MB
For the latest data sheet, please refer to the Micron
Web
site:
www.micron.com/moduleds
Features
JEDEC-standard 184-pin dual in-line memory
module (DIMM)
Fast data transfer rates PC1600, PC2100, or PC2700
Utilizes 200 MT/s, 266 MT/s, and 333MT/s DDR
SDRAM components
ECC-optimized pinout: 128MB (16 Meg x 72),
256MB (32 Meg x 72), and 512MB (64 Meg x 72)
V
DD
= V
DD
Q = +2.5V
V
DDSPD
= +2.3V to +3.6V
+2.5V I/O (SSTL_2 compatible)
Commands entered on each positive CK edge
DQS edge-aligned with data for READs; center-
aligned with data for WRITEs
Internal, pipelined double data rate (DDR)
architecture; two data accesses per clock cycle
Bidirectional data strobe (DQS) transmitted/
received with data--i.e., source-synchronous data
capture
Differential clock inputs (CK and CK#)
Four internal device banks for concurrent operation
Programmable burst lengths: 2, 4, or 8
Auto precharge option
Auto Refresh and Self Refresh Modes
15.6s (128MB), 7.8125s (256MB) maximum
average periodic refresh interval
Serial Presence-Detect (SPD) with EEPROM
Programmable READ CAS latency
Gold edge contacts
Figure 1: 184-Pin DIMM (MO-206)
1. Contact Micron for availability of lead-free prod-
ucts.
2. CL = CAS (READ) latency.
OPTIONS
MARKING
Package
184-pin DIMM (standard)
G
184-pin DIMM (lead-free)
1
Y
Frequency/CAS Latency
2
6ns (167 MHz) 333 MT/s, CL = 2.5
-335
7.5ns (133 MHz ) 266 MT/s, CL = 2
-262
7.5ns (133 MHz ) 266 MT/s, CL = 2
-26A
7.5ns (133 MHz )266 MT/s, CL = 2.5
-265
10ns (100 MHz ) 200 MT/s, CL = 2
-202
Self Refresh
Standard
None
Low Power
L
Table 1:
Address Table
128MB
256MB
512MB
Refresh Count
4K
8K
8K
Row Addressing
4K (A0A11)
8K (A0A12)
8K (A0A12)
Device Bank Addressing
4 (BA0, BA1)
4 (BA0, BA1)
4 (BA0, BA1)
Device Configuration
16 Meg x 8
32 Meg x 8
64 Meg x 8
Column Addressing
1K (A0A9)
1K (A0A9)
2K (A0A9, A11)
Module Rank Addressing
1 (S0#)
1 (S0#)
1 (S0#)
128MB, 256MB, 512MB (x72, ECC)
184-Pin DDR SDRAM DIMM
09005aef808f8ccd
Micron Technology, Inc., reserves the right to change products or specifications without notice.
DD9C16_32_64x72AG_A.fm - Rev. A 8/03 EN
2
2003 Micron Technology, Inc.
NOTE:
All part numbers end with a two-place code (not shown), designating component and PCB revisions. Consult factory for
current revision codes. Example: MT9VDDT3272AG-265A1.
Table 2:
Part Numbers and Timing Parameters
PART NUMBER
MODULE
DENSITY
CONFIGURATION
MODULE
BANDWIDTH
MEMORY CLOCK/
DATA RATE
LATENCY
(CL -
t
RCD -
t
RP)
MT9VDDT1672A(L)G-335__
128MB
16 Meg x 72
2.7 GB/s
6ns/333 MT/s
2.5-3-3
MT9VDDT1672A(L)Y-335__
128MB
16 Meg x 72
2.7 GB/s
6ns/333 MT/s
2.5-3-3
MT9VDDT1672A(L)G-262__
128MB
16 Meg x 72
2.1 GB/s
7.5ns/266 MT/s
2-2-2
MT9VDDT1672A(L)Y-262__
128MB
16 Meg x 72
2.1 GB/s
7.5ns/266 MT/s
2-2-2
MT9VDDT1672A(L)G-26A__
128MB
16 Meg x 72
2.1 GB/s
7.5ns/266 MT/s
2-3-3
MT9VDDT1672A(L)Y-26A__
128MB
16 Meg x 72
2.1 GB/s
7.5ns/266 MT/s
2-3-3
MT9VDDT1672A(L)G-265__
128MB
16 Meg x 72
2.1 GB/s
7.5ns/266 MT/s
2.5-3-3
MT9VDDT1672A(L)Y-265__
128MB
16 Meg x 72
2.1 GB/s
7.5ns/266 MT/s
2.5-3-3
MT9VDDT1672A(L)G-202__
128MB
16 Meg x 72
1.6 GB/s
10ns/200 MT/s
2-2-2
MT9VDDT1672A(L)Y-202__
128MB
16 Meg x 72
1.6 GB/s
10ns/200 MT/s
2-2-2
MT9VDDT3272A(L)G-335__
256MB
32 Meg x 72
2.7 GB/s
6ns/333 MT/s
2.5-3-3
MT9VDDT3272A(L)Y335__
256MB
32 Meg x 72
2.7 GB/s
6ns/333 MT/s
2.5-3-3
MT9VDDT3272A(L)G-262__
256MB
32 Meg x 72
2.1 GB/s
7.5ns/266 MT/s
2-2-2
MT9VDDT3272A(L)Y-262__
256MB
32 Meg x 72
2.1 GB/s
7.5ns/266 MT/s
2-2-2
MT9VDDT3272A(L)G-26A__
256MB
32 Meg x 72
2.1 GB/s
7.5ns/266 MT/s
2-3-3
MT9VDDT3272A(L)Y-26A__
256MB
32 Meg x 72
2.1 GB/s
7.5ns/266 MT/s
2-3-3
MT9VDDT3272A(L)G-265__
256MB
32 Meg x 72
2.1 GB/s
7.5ns/266 MT/s
2.5-3-3
MT9VDDT3272A(L)Y-265__
256MB
32 Meg x 72
2.1 GB/s
7.5ns/266 MT/s
2.5-3-3
MT9VDDT3272A(L)G-202__
256MB
32 Meg x 72
1.6 GB/s
10ns/200 MT/s
2-2-2
MT9VDDT3272A(L)Y-202__
256MB
32 Meg x 72
1.6 GB/s
10ns/200 MT/s
2-2-2
MT9VDDT6472A(L)G-335__
512MB
64 Meg x 72
2.7 GB/s
6ns/333 MT/s
2.5-3-3
MT9VDDT6472A(L)Y335__
512MB
64 Meg x 72
2.7 GB/s
6ns/333 MT/s
2.5-3-3
MT9VDDT6472A(L)G-262__
512MB
64 Meg x 72
2.1 GB/s
7.5ns/266 MT/s
2-2-2
MT9VDDT6472A(L)Y-262__
512MB
64 Meg x 72
2.1 GB/s
7.5ns/266 MT/s
2-2-2
MT9VDDT6472A(L)G-26A__
512MB
64 Meg x 72
2.1 GB/s
7.5ns/266 MT/s
2-3-3
MT9VDDT6472A(L)Y-26A__
512MB
64 Meg x 72
2.1 GB/s
7.5ns/266 MT/s
2-3-3
MT9VDDT6472A(L)G-265__
512MB
64 Meg x 72
2.1 GB/s
7.5ns/266 MT/s
2.5-3-3
MT9VDDT6472A(L)Y-265__
512MB
64 Meg x 72
2.1 GB/s
7.5ns/266 MT/s
2.5-3-3
MT9VDDT6472A(L)G-202__
512MB
64 Meg x 72
1.6 GB/s
10ns/200 MT/s
2-2-2
MT9VDDT6472A(L)Y-202__
512MB
64 Meg x 72
1.6 GB/s
10ns/200 MT/s
2-2-2
128MB, 256MB, 512MB (x72, ECC)
184-Pin DDR SDRAM DIMM
09005aef808f8ccd
Micron Technology, Inc., reserves the right to change products or specifications without notice.
DD9C16_32_64x72AG_A.fm - Rev. A 8/03 EN
3
2003 Micron Technology, Inc.
NOTE:
Pin 115 is No Connect (128MB), and A12 (256MB, 512MB).
Figure 2: 184-Pin DIMM Pinouts
Table 3:
Pin Assignment
(184-Pin DIMM Front)
PIN SYMBOL PIN SYMBOL PIN SYMBOL PIN SYMBOL
1
V
REF
24
DQ17
47
DQS8
70
V
DD
2
DQ0
25
DQS2
48
A0
71
NC
3
V
SS
26
V
SS
49
CB2
72
DQ48
4
DQ1
27
A9
50
V
SS
73
DQ49
5
DQS0
28
DQ18
51
CB3
74
V
SS
6
DQ2
29
A7
52
BA1
75
CK2#
7
V
DD
30
V
DD
53
DQ32
76
CK2
8
DQ3
31
DQ19
54
V
DD
77
V
DD
9
NC
32
A5
55
DQ33
78
DQS6
10
NC
33
DQ24
56
DQS4
79
DQ50
11
V
SS
34
V
SS
57
DQ34
80
DQ51
12
DQ8
35
DQ25
58
V
SS
81
V
SS
13
DQ9
36
DQS3
59
BA0
82
NC
14
DQS1
37
A4
60
DQ35
83
DQ56
15
V
DD
38
V
DD
61
DQ40
84
DQ57
16
CK1
39
DQ26
62
V
DD
85
V
DD
17
CK1#
40
DQ27
63
WE#
86
DQS7
18
V
SS
41
A2
64
DQ41
87
DQ58
19
DQ10
42
V
SS
65
CAS#
88
DQ59
20
DQ11
43
A1
66
V
SS
89
V
SS
21
CKE0
44
CB0
67
DQS5
90
NC
22
V
DD
45
CB1
68
DQ42
91
SDA
23
DQ16
46
V
DD
69
DQ43
92
SCL
Table 4:
Pin Assignment
(184-Pin DIMM Back)
PIN SYMBOL PIN SYMBOL PIN SYMBOL PIN SYMBOL
93
V
SS
116
V
SS
139
V
SS
162
DQ47
94
DQ4
117
DQ21
140
DQS17
163
NC
95
DQ5
118
A11
141
A10
164
V
DD
96
V
DD
119
DQS11
142
CB6
165
DQ52
97
DQS9
120
V
DD
143
V
DD
166
DQ53
98
DQ6
121
DQ22
144
CB7
167
NC
99
DQ7
122
A8
145
V
SS
168
V
DD
100
V
SS
123
DQ23
146
DQ36
169
DQS15
101
NC
124
V
SS
147
DQ37
170
DQ54
102
NC
125
A6
148
V
DD
171
DQ55
103
NC
126
DQ28
149
DQS13
172
V
DD
104
V
DD
127
DQ29
150
DQ38
173
NC
105
DQ12
128
V
DD
151
DQ39
174
DQ60
106
DQ13
129
DQS12
152
V
SS
175
DQ61
107
DQS10
130
A3
153
DQ44
176
V
SS
108
V
DD
131
DQ30
154
RAS#
177
DQS16
109
DQ14
132
V
SS
155
DQ45
178
DQ62
110
DQ15
133
DQ31
156
V
DD
179
DQ63
111
NC
134
CB4
157
S0#
180
V
DD
112
V
DD
135
CB5
158
NC
181
SA0
113
NC
136
V
DD
159
DQS14
182
SA1
114
DQ20
137
CK0
160
V
SS
183
SA2
115
NC/
A12
138
CK0#
161
DQ46
184
V
DDSPD
PIN 93
PIN 144
PIN 145
PIN 184
PIN 1
PIN 52
PIN 53
PIN 92
BACK VIEW
FRONT VIEW
Indicates a V
DD
pin
Indicates a V
SS
pin
No Components This Side
U1
U2
U3
U4
U5
U6
U7
U8
U9
U10
128MB, 256MB, 512MB (x72, ECC)
184-Pin DDR SDRAM DIMM
09005aef808f8ccd
Micron Technology, Inc., reserves the right to change products or specifications without notice.
DD9C16_32_64x72AG_A.fm - Rev. A 8/03 EN
4
2003 Micron Technology, Inc.
Table 5:
Pin Descriptions
Refer to Pin Assignment Tables on page 3 for pin number and symbol information
PIN NUMBERS
SYMBOL
TYPE
DESCRIPTION
63, 65, 154
WE#, CAS#, RAS#
Input
Command Inputs: WE#, RAS#, and CAS# (along with S#)
define the command being entered.
16, 17, 75, 76, 137, 138
CK0, CK0#, CK1,
CK1#, CK2, CK2#
Input
Clocks: CK and CK# are differential clock inputs. All
address and control input signals are sampled on the
crossing of the positive edge of CK and negative edge of
CK#. Output data (DQs and DQS) is referenced to the
crossings of CK and CK#.
21
CKE0
Input
Clock Enable: CKE activates (HIGH) and deactivates (LOW)
internal clock signals, device input buffers, and output
drivers. Deactivating the clock provides PRECHARGE
POWER-DOWN and SELF REFRESH operation (all device
banks idle), or ACTIVE POWER-DOWN (row ACTIVE in any
device bank). CKE is synchronous for all functions except
for disabling outputs, which is achieved asynchronously.
CKE must be maintained HIGH throughout read and
write accesses. Input buffers (excluding CK, CK# and CKE)
are disabled during POWERDOWN. Input buffers
(excluding CKE) are disabled during SELF REFRESH. CKE is
an SSTL_2 input but will detect an LVCMOS LOW level
after V
DD
is applied and until CKE is first brought HIGH.
After CKE is brought HIGH, it becomes an SSTL_2 input
only.
157
S0#
Input
Chip Select: S# enables (registered LOW) and disable
(registered HIGH) the command decoder. All commands
are masked when S# is registered HIGH. S# is considered
part of the command code.
52, 59
BA0, BA1
Input
Bank Addresses: BA0 and BA1 define to which device
bank an ACTIVE, READ, WRITE or PRECHARGE command
is being applied.
27, 29, 32, 37, 41, 43, 48,
115
(256MB, 512MB)
,
118,
122, 125, 130, 141
A0-A11
(128MB)
A0-A12
(256MB,
512MB)
Input
Address Inputs: Sampled during the ACTIVE command
(row-address) and READ/WRITE command (column-
address, with A10 defining auto precharge) to select one
location out of the memory array in the respective device
device bank. A10 is sampled during a PRECHARGE
command to determine whether the PRECHARGE applies
to one device bank (A10 LOW) or all device banks (A10
HIGH). The address inputs also provide the op-code
during a MODE REGISTER SET command.
92
SCL
Input
Serial Clock for Presence-Detect: SCL is used to
synchronize the presence-detect data transfer to and
from the module.
181, 182, 183
SA0-SA2
Input
Presence-Detect Address Inputs: These pins are used to
configure the presence-detect device.
91
SDA
Input/Output
Serial Presence-Detect Data: SDA is a bidirectional pin
used to transfer addresses and data into and out of the
presence- detect portion of the module.
44, 45, 49, 51, 134, 135,
142, 144
CB0-CB7
Input/Output
Data I/Os: Check bits. ECC, one-bit error detection and
correction.
5, 14, 25, 36, 47, 56, 67, 78,
86, 97, 107, 119, 129, 140,
149, 159, 169, 177
DQS0-DQS17
Input/Output
Data Strobes: Output with read data, input with write
data. Edge- aligned with read data, centered in write
data. Used to capture write data.
128MB, 256MB, 512MB (x72, ECC)
184-Pin DDR SDRAM DIMM
09005aef808f8ccd
Micron Technology, Inc., reserves the right to change products or specifications without notice.
DD9C16_32_64x72AG_A.fm - Rev. A 8/03 EN
5
2003 Micron Technology, Inc.
2, 4, 6, 8, 12, 13, 19, 20, 23,
24, 28, 31, 33, 35, 39, 40,
53, 55, 57, 60, 61, 64, 68,
69, 72, 73, 79, 80, 83, 84,
87, 88, 94, 95, 98, 99, 105,
106, 109, 110, 117, 121,
131, 133, 146, 147, 150,
151, 153, 155, 161, 162,
165, 166, 170, 171, 174,
175, 178, 179
DQ0-DQ63
Input/Output
Data I/Os: Data bus.
1
V
REF
Input
SSTL_2 reference voltage.
7, 15, 22, 30, 38, 46, 54, 62,
70, 77, 85, 96, 104, 108,
112, 120, 128, 136, 143,
148, 156, 164, 168, 172, 180
V
DD
Supply
Power Supply: +2.5V +0.2V.
3, 11, 18, 26, 34, 42, 50, 58,
66, 74, 81, 89, 93, 100, 116,
124, 132, 139, 145, 152,
160, 176
V
SS
Supply
Ground.
184
V
DDSPD
Supply
Serial EEPROM positive power supply: +2.3V to +3.6V.
This supply is isolated from the V
DD
/V
DD
Q supply.
9, 10, 71, 82, 90, 101, 102,
103, 111, 113, 115 (128MB),
158, 163, 167, 173
NC
No Connects.
Table 5:
Pin Descriptions (Continued)
Refer to Pin Assignment Tables on page 3 for pin number and symbol information
128MB, 256MB, 512MB (x72, ECC)
184-Pin DDR SDRAM DIMM
09005aef808f8ccd
Micron Technology, Inc., reserves the right to change products or specifications without notice.
DD9C16_32_64x72AG_A.fm - Rev. A 8/03 EN
6
2003 Micron Technology, Inc.
Figure 3: Functional Block Diagram
-26A, -265, -202 Speed Optimized
A0
SA0
SERIAL PD
U10
SDA
A1
SA1
A2
SA2
BA0, BA1
A0-A11 (128MB)
A0-A12 (256MB, 512MB)
RAS#
BA0, BA1: SDRAMs
A0-A11: SDRAMs
A0-A12: SDRAMs
RAS#: SDRAMs
CAS#: SDRAMs
WE#: SDRAMs
CKE0: SDRAMs
CAS#
WE#
CKE0
V
REF
V
SS
SDRAMs
SDRAMs
DQ56
DQ57
DQ58
DQ59
DQ60
DQ61
DQ62
DQ63
U9
DQ48
DQ49
DQ50
DQ51
DQ52
DQ53
DQ54
DQ55
U7
DQ40
DQ41
DQ42
DQ43
DQ44
DQ45
DQ46
DQ47
U6
DQ32
DQ33
DQ34
DQ35
DQ36
DQ37
DQ38
DQ39
U5
DQ24
DQ25
DQ26
DQ27
DQ28
DQ29
DQ30
DQ31
U4
DQ16
DQ17
DQ18
DQ19
DQ20
DQ21
DQ22
DQ23
U2
DQ8
DQ9
DQ10
DQ11
DQ12
DQ13
DQ14
DQ15
DM CS# DQS
U1
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ0
DQ1
DQ2
DQ3
DQ4
DQ5
DQ6
DQ7
DQS9
S0#
U3
WP
SCL
DM CS# DQS
DM CS# DQS
DM CS# DQS
DQS0
DQS13
DQS4
DQS10
DQS1
DQS14
DQS5
DQS11
DQS2
DQS15
DQS6
DM CS# DQS
U8
DM CS# DQS
DM CS# DQS
DM CS# DQS
DM CS# DQS
DQS12
DQS3
DQS16
DQS7
DQS17
DQS8
CB0
CB1
CB2
CB3
CB4
CB5
CB6
CB7
V
DDQ
V
DD
SDRAMs
SDRAMs
SDRAM
x 3
CK0
CK0#
120
SDRAM
x 3
CK1
CK1#
120
SDRAM
x 3
CK2
CK2#
120
V
DDSPD
SPD/EEPROM
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
4.5pF
4.5pF
4.5pF
NOTE:
1. All resistor values are 22
W unless otherwise specified.
2. Per industry standard, Micron modules utilize various component speed grades, as
referenced in the module part number guide at
www.micron.com/numberguide.
U1 - U9 = MT46V16M8TG DDR SDRAM device (128MB)
U1 - U9 = MT46V32M8TG DDR SDRAM device (256MB)
U1 - U9 = MT46V64M8TG DDR SDRAM device (512MB)
128MB, 256MB, 512MB (x72, ECC)
184-Pin DDR SDRAM DIMM
09005aef808f8ccd
Micron Technology, Inc., reserves the right to change products or specifications without notice.
DD9C16_32_64x72AG_A.fm - Rev. A 8/03 EN
7
2003 Micron Technology, Inc.
Figure 4: Functional Block Diagram
-335 Speed Optimized
A0
SA0
SERIAL PD
U10
SDA
A1
SA1
A2
SA2
BA0, BA1
A0-A11 (128MB)
A0-A12 (256MB, 512MB)
RAS#
CAS#
WE#
CKE0
BA0, BA1: SDRAMs
A0-A11: SDRAMs
A0-A12: SDRAMs
RAS#: SDRAMs
CAS#: SDRAMs
WE#: SDRAMs
CKE0: SDRAMs
DQ56
DQ57
DQ58
DQ59
DQ60
DQ61
DQ62
DQ63
U9
DQ48
DQ49
DQ50
DQ51
DQ52
DQ53
DQ54
DQ55
U7
DQ40
DQ41
DQ42
DQ43
DQ44
DQ45
DQ46
DQ47
U6
DQ32
DQ33
DQ34
DQ35
DQ36
DQ37
DQ38
DQ39
U5
DQ24
DQ25
DQ26
DQ27
DQ28
DQ29
DQ30
DQ31
U4
DQ16
DQ17
DQ18
DQ19
DQ20
DQ21
DQ22
DQ23
U2
DQ8
DQ9
DQ10
DQ11
DQ12
DQ13
DQ14
DQ15
DM CS# DQS
U1
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ0
DQ1
DQ2
DQ3
DQ4
DQ5
DQ6
DQ7
DQS9
S0#
U3
WP
SCL
DM CS# DQS
DM CS# DQS
DM CS# DQS
DQS0
DQS13
DQS4
DQS10
DQS1
DQS14
DQS5
DQS11
DQS2
DQS15
DQS6
DM CS# DQS
U8
DM CS# DQS
DM CS# DQS
DM CS# DQS
DM CS# DQS
DQS12
DQS3
DQS16
DQS7
DQS17
DQS8
CB0
CB1
CB2
CB3
CB4
CB5
CB6
CB7
SDRAM
x 3
CK0
CK0#
120
SDRAM
x 3
CK1
CK1#
120
SDRAM
x 3
CK2
CK2#
120
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
DQ
3pF
3pF
3pF
V
REF
V
SS
SDRAMs
SDRAMs
V
DDQ
V
DD
SDRAMs
SDRAMs
V
DDSPD
SPD/EEPROM
5.1
5.1
5.1
5.1
5.1
5.1
NOTE:
1. All resistor values are 22
W unless otherwise specified.
2. Per industry standard, Micron modules utilize various component speed grades, as
referenced in the module part number guide at
www.micron.com/numberguide.
U1 - U9 = MT46V16M8TG DDR SDRAM device (128MB)
U1 - U9 = MT46V32M8TG DDR SDRAM device (256MB)
U1 - U9 = MT46V64M8TG DDR SDRAM device (512MB)
128MB, 256MB, 512MB (x72, ECC)
184-Pin DDR SDRAM DIMM
09005aef808f8ccd
Micron Technology, Inc., reserves the right to change products or specifications without notice.
DD9C16_32_64x72AG_A.fm - Rev. A 8/03 EN
8
2003 Micron Technology, Inc.
General Description
The MT9VDDT1672A, MT9VDDT3272A, and
MT9VDDT6472A are high-speed CMOS, dynamic ran-
dom-access, memory modules organized in a x72
(ECC) configuration. DDR SDRAM modules use inter-
nally configured quad-bank DDR SDRAM devices.
DDR SDRAM modules use a double data rate archi-
tecture to achieve high-speed operation. The double
data rate architecture is essentially a 2n-prefetch
architecture with an interface designed to transfer two
data words per clock cycle at the I/O pins. A single read
or write access for the DDR SDRAM module effectively
consists of a single 2n-bit wide, one-clock-cycle data
transfer at the internal DRAM core and two corre-
sponding n-bit wide, one-half-clock-cycle data trans-
fers at the I/O pins.
A bidirectional data strobe (DQS) is transmitted
externally, along with data, for use in data capture at
the receiver. DQS is an intermittent strobe transmitted
by the DDR SDRAM during READs and by the memory
controller during WRITEs. DQS is edge-aligned with
data for READs and center-aligned with data for
WRITEs.
DDR SDRAM modules operate from a differential
clock (CK and CK#); the crossing of CK going HIGH
and CK# going LOW will be referred to as the positive
edge of CK. Commands (address and control signals)
are registered at every positive edge of CK. Input data
is registered on both edges of DQS, and output data is
referenced to both edges of DQS, as well as to both
edges of CK.
Read and write accesses to DDR SDRAM modules
are burst oriented; accesses start at a selected location
and continue for a programmed number of locations
in a programmed sequence. Accesses begin with the
registration of an ACTIVE command, which is then fol-
lowed by a READ or WRITE command. The address
bits registered coincident with the ACTIVE command
are used to select the device bank and row to be
accessed [BA0, BA1 select device bank; A0A11
(128MB) or A0A12 (256MB, 512MB) select device
row[. The address bits registered coincident with the
READ or WRITE command are used to select the
device bank and the starting device column location
for the burst access.
DDR SDRAM modules provide for programmable
READ or WRITE burst lengths of 2, 4, or 8 locations. An
auto precharge function may be enabled to provide a
self-timed row precharge that is initiated at the end of
the burst access.
The pipelined, multibank architecture of DDR
SDRAM modules allows for concurrent operation,
thereby providing high effective bandwidth by hiding
row precharge and activation time.
An auto refresh mode is provided, along with a pow-
ersaving power-down mode. All inputs are compatible
with the JEDEC Standard for SSTL_2. All outputs are
SSTL_2, Class II compatible. For more information
regarding DDR SDRAM operation, refer to the 128Mb,
256Mb, and 512Mb DDR SDRAM component data
sheets.
Serial Presence-Detect Operation
These DDR SDRAM modules incorporate serial
presence-detect (SPD). The SPD function is imple-
mented using a 2,048-bit EEPROM. This nonvolatile
storage device contains 256 bytes. The first 128 bytes
can be programmed by Micron to identify the module
type and various SDRAM organizations and timing
parameters. The remaining 128 bytes of storage are
available for use by the customer. System READ/
WRITE operations between the master (system logic)
and the slave EEPROM device (DIMM) occur via a
standard I
2
C bus using the DIMM's SCL (clock) and
SDA (data) signals, together with SA (2:0), which pro-
vide eight unique DIMM/EEPROM addresses. Write
protect (WP) is tied to ground on the module, perma-
nently disabling hardware write protect.
Mode Register Definition
The mode register is used to define the specific
mode of operation of the DDR SDRAM. This definition
includes the selection of a burst length, a burst type, a
CAS latency and an operating mode, as shown in
Figure 5, Mode Register Definition Diagram, on page 9.
The mode register is programmed via the MODE REG-
ISTER SET command (with BA0 = 0 and BA1 = 0) and
will retain the stored information until it is pro-
grammed again or the device loses power (except for
bit A8, which is self-clearing).
Reprogramming the mode register will not alter the
contents of the memory, provided it is performed cor-
rectly. The mode register must be loaded (reloaded)
when all device banks are idle and no bursts are in
progress, and the controller must wait the specified
time before initiating the subsequent operation. Vio-
lating either of these requirements will result in
unspecified operation.
Mode register bits A0A2 specify the burst length,
A3 specifies the type of burst (sequential or inter-
leaved), A4A6 specify the CAS latency, and A7A11
(128MB) or A7A12 (128MB, 512MB) specify the oper-
ating mode.
128MB, 256MB, 512MB (x72, ECC)
184-Pin DDR SDRAM DIMM
09005aef808f8ccd
Micron Technology, Inc., reserves the right to change products or specifications without notice.
DD9C16_32_64x72AG_A.fm - Rev. A 8/03 EN
9
2003 Micron Technology, Inc.
Burst Length
Read and write accesses to the DDR SDRAM are
burst oriented, with the burst length being program-
mable, as shown in Figure 5, Mode Register Definition
Diagram. The burst length determines the maximum
number of column locations that can be accessed for a
given READ or WRITE command. Burst lengths of 2, 4,
or 8 locations are available for both the sequential and
the interleaved burst types.
Reserved states should not be used, as unknown
operation or incompatibility with future versions may
result.
When a READ or WRITE command is issued, a block
of columns equal to the burst length is effectively
selected. All accesses for that burst take place within
this block, meaning that the burst will wrap within the
block if a boundary is reached. The block is uniquely
selected by A1Ai when the burst length is set to two,
by A2Ai when the burst length is set to four and by
A3Ai when the burst length is set to eight (where Ai is
the most significant column address bit for a given
configuration; see Note 5 for Table 6, Burst Definition
Table, on page 10). The remaining (least significant)
address bit(s) is (are) used to select the starting loca-
tion within the block. The programmed burst length
applies to both read and write bursts.
Burst Type
Accesses within a given burst may be programmed
to be either sequential or interleaved; this is referred to
as the burst type and is selected via bit M3.
The ordering of accesses within a burst is deter-
mined by the burst length, the burst type and the start-
ing column address, as shown in Table 6, Burst
Definition Table, on page 10.
Read Latency
The READ latency is the delay, in clock cycles,
between the registration of a READ command and the
availability of the first bit of output data. The latency
can be set to 2 or 2.5 clocks, as shown in Figure 6, CAS
Latency Diagram, on page 10.
If a READ command is registered at clock edge n,
and the latency is m clocks, the data will be available
nominally coincident with clock edge n + m. Table 7,
CAS Latency (CL) Table, on page 10, indicates the
operating frequencies at which each CAS latency set-
ting can be used.
Reserved states should not be used as unknown
operation or incompatibility with future versions may
result.
Figure 5: Mode Register Definition
Diagram
Operating Mode
The normal operating mode is selected by issuing a
MODE REGISTER SET command with bits A7A11
(128MB) or A7A12 (256MB, 512MB) each set to zero,
and bits A0A6 set to the desired values. A DLL reset is
initiated by issuing a MODE REGISTER SET command
with bits A7 and A9A11 (128MB), or A7 and A9A12
(256MB, 512MB) each set to zero, bit A8 set to one, and
bits A0A6 set to the desired values. Although not
required by the Micron device, JEDEC specifications
recommend when a LOAD MODE REGISTER com-
mand is issued to reset the DLL, it should always be
followed by a LOAD MODE REGISTER command to
select normal operating mode.
M3 = 0
Reserved
2
4
8
Reserved
Reserved
Reserved
Reserved
M3 = 1
Reserved
2
4
8
Reserved
Reserved
Reserved
Reserved
Operating Mode
Normal Operation
Normal Operation/Reset DLL
All other states reserved
0
1
-
0
0
-
0
0
-
0
0
-
0
0
-
0
0
-
Valid
Valid
-
0
1
Burst Type
Sequential
Interleaved
CAS Latency
Reserved
Reserved
2
Reserved
Reserved
Reserved
2.5
Reserved
Burst Length
M0
0
1
0
1
0
1
0
1
Burst Length
CAS Latency BT
0*
A9
A7 A6 A5 A4 A3
A8
A2 A1 A0
Mode Register (Mx)
Address Bus
9
7
6
5
4
3
8
2
1
0
M1
0
0
1
1
0
0
1
1
M2
0
0
0
0
1
1
1
1
M3
M4
0
1
0
1
0
1
0
1
M5
0
0
1
1
0
0
1
1
M6
0
0
0
0
1
1
1
1
M6-M0
M8 M7
Operating Mode
A10
A12 A11
BA0
BA1
10
11
12
13
0*
14
* M14 and M13 (BA0 and BA1)
must be "0, 0" to select the
base mode register (vs. the
extended mode register).
M9
M10
M12 M11
Burst Length
CAS Latency BT
0*
0*
A9
A7 A6 A5 A4 A3
A8
A2 A1 A0
Mode Register (Mx)
Address Bus
9
7
6
5
4
3
8
2
1
0
Operating Mode
A10
A11
BA0
BA1
10
11
12
13
* M13 and M12 (BA0 and BA1)
must be "0, 0" to select the
base mode register (vs. the
extended mode register).
128MB Module
256MB, 512MB Modules
128MB, 256MB, 512MB (x72, ECC)
184-Pin DDR SDRAM DIMM
09005aef808f8ccd
Micron Technology, Inc., reserves the right to change products or specifications without notice.
DD9C16_32_64x72AG_A.fm - Rev. A 8/03 EN
10
2003 Micron Technology, Inc.
NOTE:
1. For a burst length of two, A1
Ai select the two-data-
element block; A0 selects the first access within the
block.
2. or a burst length of four, A2
Ai select the four-data-ele-
ment block; A0
A1 select the first access within the
block.
3. For a burst length of eight, A3
Ai select the eight-data-
element block; A0
A2 select the first access within the
block.
4. Whenever a boundary of the block is reached within a
given sequence above, the following access wraps
within the block.
5. i = 9 (128MB, 256MB)
i = 9, 11 (512MB)
Figure 6: CAS Latency Diagram
All other combinations of values for A7A11, or A7
A12 are reserved for future use and/or test modes. Test
modes and reserved states should not be used because
unknown operation or incompatibility with future ver-
sions may result.
Extended Mode Register
The extended mode register controls functions
beyond those controlled by the mode register; these
additional functions are DLL enable/disable and out-
put drive strength. These functions are controlled via
the bits shown in Figure 7, Extended Mode Register
Definition Diagram, on page 11. The extended mode
register is programmed via the LOAD MODE REGIS-
TER command to the mode register (with BA0 = 1 and
BA1 = 0) and will retain the stored information until it
is programmed again or the device loses power. The
enabling of the DLL should always be followed by a
LOAD MODE REGISTER command to the mode regis-
ter (BA0/BA1 both low) to reset the DLL.
The extended mode register must be loaded when
all device banks are idle and no bursts are in progress,
and the controller must wait the specified time before
initiating any subsequent operation. Violating either
of these requirements could result in unspecified oper-
ation.
Table 6:
Burst Definition Table
BURST
LENGTH
STARTING
COLUMN
ADDRESS
ORDER OF ACCESSES WITHIN A
BURST
TYPE =
SEQUENTIAL
TYPE =
INTERLEAVED
2
A0
0
0-1
0-1
1
1-0
1-0
4
A1 A0
0
0
0-1-2-3
0-1-2-3
0
1
1-2-3-0
1-0-3-2
1
0
2-3-0-1
2-3-0-1
1
1
3-0-1-2
3-2-1-0
8
A2 A1 A0
0
0
0
0-1-2-3-4-5-6-7
0-1-2-3-4-5-6-7
0
0
1
1-2-3-4-5-6-7-0
1-0-3-2-5-4-7-6
0
1
0
2-3-4-5-6-7-0-1
2-3-0-1-6-7-4-5
0
1
1
3-4-5-6-7-0-1-2
3-2-1-0-7-6-5-4
1
0
0
4-5-6-7-0-1-2-3
4-5-6-7-0-1-2-3
1
0
1
5-6-7-0-1-2-3-4
5-4-7-6-1-0-3-2
1
1
0
6-7-0-1-2-3-4-5
6-7-4-5-2-3-0-1
1
1
1
7-0-1-2-3-4-5-6
7-6-5-4-3-2-1-0
Table 7:
CAS Latency (CL) Table
SPEED
ALLOWABLE OPERATING
FREQUENCY (MHZ)
CL = 2
CL = 2.5
-335
75
f 133
75
f 167
-26A
75
f 133
75
f 133
-265
75
f 100
75
f 133
-202
75
f 100
N/A
CK
CK#
COMMAND
DQ
DQS
CL = 2
READ
NOP
NOP
NOP
READ
NOP
NOP
NOP
Burst Length = 4 in the cases shown
Shown with nominal tAC, tDQSCK, and tDQSQ
CK
CK#
COMMAND
DQ
DQS
CL = 2.5
T0
T1
T2
T2n
T3
T3n
T0
T1
T2
T2n
T3
T3n
DON'T CARE
TRANSITIONING DATA
128MB, 256MB, 512MB (x72, ECC)
184-Pin DDR SDRAM DIMM
09005aef808f8ccd
Micron Technology, Inc., reserves the right to change products or specifications without notice.
DD9C16_32_64x72AG_A.fm - Rev. A 8/03 EN
11
2003 Micron Technology, Inc.
DLL Enable/Disable
The DLL must be enabled for normal operation.
DLL enable is required during power-up initialization
and upon returning to normal operation after having
disabled the DLL for the purpose of debug or evalua-
tion. (When the device exits self refresh mode, the DLL
is enabled automatically.) Any time the DLL is
enabled, 200 clock cycles must occur before a READ
command can be issued.
Figure 7: Extended Mode Register
Definition Diagram
NOTE:
1. E13 and E12 (128MB), or E14 and E13 (256MB, 512MB)
(BA1 and BA0) must be "0, 1" to select the Extended
Mode Register (vs. the base Mode Register).
2. The QFC# option is not supported.
Operating Mode
Reserved
Reserved
0
0
Valid
0
1
DLL
Enable
Disable
DLL
11
01
A9
A7 A6 A5 A4 A3
A8
A2 A1 A0
Extended Mode
Register (Ex)
Address Bus
9
7
6
5
4
3
8
2
2
1
0
E0
0
Drive Strength
Normal
E1
E0
E1,
Operating Mode
A10
A11
A12
BA1 BA0
10
11
12
13
14
E3
E4
0
0
0
0
0
E6 E5
E7
E8
E9
0
0
E10
E11
0
E12
DS
DLL
11
01
A9
A7 A6 A5 A4 A3
A8
A2 A1 A0
Extended Mode
Register (Ex)
Address Bus
9
7
6
5
4
3
8
2
2
1
0
Operating Mode
A10
A11
BA1 BA0
10
11
12
13
DS
128MB Module
256MB, 512MB Modules
0
E2
2
128MB, 256MB, 512MB (x72, ECC)
184-Pin DDR SDRAM DIMM
09005aef808f8ccd
Micron Technology, Inc., reserves the right to change products or specifications without notice.
DD9C16_32_64x72AG_A.fm - Rev. A 8/03 EN
12
2003 Micron Technology, Inc.
Commands
The Truth Tables below provides a general reference
of available commands. For a more detailed descrip-
tion of commands and operations, refer to the 128Mb,
256Mb, and 512Mb DDR SDRAM component data
sheets.
NOTE:
1. CKE is HIGH for all commands shown except SELF REFRESH.
2. DESELECT and NOP are functionally interchangeable.
3. BA0BA1 provide device bank address and A0A11 (128MB) or A0A12 (256MB, 512MB) provide device row address.
4. BA0BA1 provide device bank address; A0A9 (128MB, 256MB) or A0A9, A11 (512MB) provide device column address;
A10 HIGH enables the auto precharge feature (nonpersistent), and A10 LOW disables the auto precharge feature.
5. Applies only to read bursts with auto precharge disabled; this command is undefined (and should not be used) for read
bursts with auto precharge enabled and for write bursts.
6. A10 LOW: BA0BA1 determine which device bank is precharged. A10 HIGH: all device banks are precharged and BA0
BA1 are "Don't Care."
7. This command is AUTO REFRESH if CKE is HIGH, SELF REFRESH if CKE is LOW.
8. Internal refresh counter controls device row addressing; all inputs and I/Os are "Don't Care" except for CKE.
9. BA0-BA1 select either the mode register or the extended mode register (BA0 = 0, BA1 = 0 select the mode register; BA0 =
1, BA1 = 0 select extended mode register; other combinations of BA0BA1 are reserved). A0A11 (128MB) or A0A12
(256MB, 512MB) provide the op-code to be written to the selected mode register.
Table 8:
Truth Table Commands
Notes: 1
NAME (FUNCTION)
CS#
RAS# CAS#
WE#
ADDR
NOTES
DESELECT (NOP)
H
X
X
X
X
2
NO OPERATION (NOP)
L
H
H
H
X
2
ACTIVE (Select bank and activate row)
L
L
H
H
Bank/Row
3
READ (Select bank and column, and start READ burst)
L
H
L
H
Bank/Col
4
WRITE (Select bank and column, and start WRITE burst)
L
H
L
L
Bank/Col
4
BURST TERMINATE
L
H
H
L
X
5
PRECHARGE (Deactivate row in bank or banks)
L
L
H
L
Code
6
AUTO REFRESH or SELF REFRESH (Enter self refresh mode)
L
L
L
H
X
7, 8
LOAD MODE REGISTER
L
L
L
L
Op-Code
9
Table 9:
Truth Table DM Operation
Used to mask write data; provided coincident with the corresponding data
NAME (FUNCTION)
DM
DQS
WRITE Enable
L
Valid
WRITE Inhibit
H
X
128MB, 256MB, 512MB (x72, ECC)
184-Pin DDR SDRAM DIMM
09005aef808f8ccd
Micron Technology, Inc., reserves the right to change products or specifications without notice.
DD9C16_32_64x72AG_A.fm - Rev. A 8/03 EN
13
2003 Micron Technology, Inc.
Absolute Maximum Ratings
Stresses greater than those listed may cause perma-
nent damage to the device. This is a stress rating only,
and functional operation of the device at these or any
other conditions above those indicated in the opera-
tional sections of this specification is not implied.
Exposure to absolute maximum rating conditions for
extended periods may affect reliability.
Voltage on V
DD
Supply
Relative to V
SS
. . . . . . . . . . . . . . . . . . . . -1V to +3.6V
Voltage on V
DD
Q Supply
Relative to Vs
SS
. . . . . . . . . . . . . . . . . . . -1V to +3.6V
Voltage on V
REF
and Inputs
Relative to V
SS
. . . . . . . . . . . . . . . . . . . . -1V to +3.6V
Voltage on I/O Pins
Relative to V
SS
. . . . . . . . . . . . -0.5V to V
DD
Q +0.5V
Operating Temperature,
T
A
(ambient) . . . . . . . . . . . . . . . . . . . . . .0C to +70C
Storage Temperature (plastic) . . . . . . -55C to +150C
Power Dissipation . . . . . . . . . . . . . . . . . . . . . . . . . . . 9W
Short Circuit Output Current. . . . . . . . . . . . . . . . 50mA
Table 10: DC Electrical Characteristics and Operating Conditions
Notes: 15, 14, 50; notes appear on pages 2124; 0
C T
A
+70C
PARAMETER/CONDITION
SYMBOL
MIN
MAX
UNITS
NOTES
Supply Voltage
V
DD
Q
2.3
2.7
V
32, 36
I/O Supply Voltage
V
DD
Q 2.3
2.7
V
32,
36,
39
I/O Reference Voltage
V
REF
0.49 x V
DD
Q 0.51 x V
DD
Q V
6,
39
I/O Termination Voltage (system)
V
TT
V
REF
- 0.04
V
REF
+ 0.04
V
7, 39
Input High (Logic 1) Voltage
V
IH
(DC)
V
REF
+ 0.15
V
DD
+ 0.3
V
25
Input Low (Logic 0) Voltage
V
IL
(AC)
-0.3
V
REF
- 0.15
V
25
INPUT LEAKAGE CURRENT: Any input 0V
V
IN
V
DD
, V
REF
pin 0V
V
IN
1.35V (All
other pins not under test = 0V)
Command/Address,
RAS#, CAS#, WE#,
CKE, S#
I
L
-18
18
A
49
CK, CK#
I
L
-6
6
A
49
DM
I
L
-2
2
A
49
OUTPUT LEAKAGE CURRENT:
(DQs are disabled; 0V
V
OUT
V
DD
Q)
DQ, DQS
I
OZ
-5
5
A
49
OUTPUT LEVELS:
High Current (V
OUT
= V
DD
Q - 0.373V, minimum V
REF
, minimum V
TT
)
Low Current (V
OUT
= 0.373V, maximum V
REF
, maximum V
TT
)
I
OH
-16.8
mA
33, 36
I
OL
16.8
mA
34
Table 11: AC Input Operating Conditions
Notes: 15, 14, 50; notes appear on pages 2124; 0
C T
A
+70C; V
DD
= V
DD
Q = +2.5V +0.2V
PARAMETER/CONDITION
SYMBOL
MIN
MAX
UNITS
NOTES
Input High (Logic 1) Voltage
V
IH
(AC)
V
REF
+ 0.310
V
12, 25, 35
Input Low (Logic 0) Voltage
V
IL
(AC)
V
REF
- 0.310
V
12, 25, 35
I/O Reference Voltage
V
REF
(AC)
0.49 x V
DD
Q
0.51 x V
DD
Q V
6
128MB, 256MB, 512MB (x72, ECC)
184-Pin DDR SDRAM DIMM
09005aef808f8ccd
Micron Technology, Inc., reserves the right to change products or specifications without notice.
DD9C16_32_64x72AG_A.fm - Rev. A 8/03 EN
14
2003 Micron Technology, Inc.
Table 12: I
DD
Specifications and Conditions 128MB
DRAM components only
Notes: 15, 8, 10, 12, 50; notes appear on pages 2124; 0
C T
A
+70C; V
DD
= V
DD
Q = +2.5V +0.2V
PARAMETER/CONDITION
SYMBOL
MAX
UNITS
NOTES
-335
-262
-26A/
-265/
-202
OPERATING CURRENT: One device bank; Active-Precharge;
t
RC
=
t
RC (MIN);
t
CK =
t
CK (MIN); DQ, DM, and DQS inputs
changing once per clock cycle; Address and control inputs
changing once every two clock cycles;
I
DD0
1,125
990
945
mA
20, 43
OPERATING CURRENT: One device bank; Active-Read-
Precharge; Burst = 2;
t
RC =
t
RC (MIN);
t
CK =
t
CK (MIN); I
OUT
=
0mA; Address and control inputs changing once per clock
cycle
I
DD1
1,215
1,080
1,080
mA
20, 43
PRECHARGE POWER-DOWN STANDBY CURRENT: All device
banks idle; Power-down mode;
t
CK =
t
CK (MIN); CKE = LOW;
I
DD2P
27
27
27
mA
21, 28, 45
IDLE STANDBY CURRENT: CS# = HIGH; All device banks idle;
t
CK =
t
CK (MIN); CKE = HIGH; Address and other control inputs
changing once per clock cycle. V
IN
= V
REF
for DQ, DQS, and DM
I
DD2F
405
405
360
mA
46
ACTIVE POWER-DOWN STANDBY CURRENT: One device bank
active; Power-down mode;
t
CK =
t
CK (MIN); CKE = LOW
I
DD3P
225
225
180
mA
21, 28, 45
ACTIVE STANDBY CURRENT: CS# = HIGH; CKE = HIGH; One
device bank; Active-Precharge;
t
RC =
t
RAS (MAX);
t
CK =
t
CK
(MIN); DQ, DM, and DQS inputs changing twice per clock
cycle; Address and other control inputs changing once per
clock cycle
I
DD3N
450
450
405
mA
40
OPERATING CURRENT: Burst = 2; Reads; Continuous burst; One
device bank active; Address and control inputs changing once
per clock cycle;
t
CK =
t
CK (MIN); I
OUT
= 0mA
I
DD4R
1,260
1,170
1,125
mA
20, 43,
24, 45
OPERATING CURRENT: Burst = 2; Writes; Continuous burst;
One device bank active; Address and control inputs changing
once per clock cycle;
t
CK =
t
CK (MIN); DQ, DM, and DQS inputs
changing twice per clock cycle
I
DD4W
1,260
1,125
1,080
mA
20
AUTO REFRESH CURRENT
t
RC =
t
REFC (MIN)
I
DD5
2,385
1,980
1,980
mA
24, 45
t
REFC = 15.625s
I
DD5A
45
45
45
mA
24, 45
SELF REFRESH CURRENT: CKE
0.2V
Standard
I
DD6
27
27
18
mA
9
Low Power
I
DD6A
18
18
9
mA
OPERATING CURRENT: Four device bank interleaving READs
(BL=4) with auto precharge,
t
RC =
t
RC (MIN);
t
CK =
t
CK (MIN);
Address and control inputs change only during Active, READ,
or WRITE commands.
I
DD7
3,195
2,970
2,925
mA
20, 44
128MB, 256MB, 512MB (x72, ECC)
184-Pin DDR SDRAM DIMM
09005aef808f8ccd
Micron Technology, Inc., reserves the right to change products or specifications without notice.
DD9C16_32_64x72AG_A.fm - Rev. A 8/03 EN
15
2003 Micron Technology, Inc.
Table 13: I
DD
Specifications and Conditions 256MB
DRAM components only
Notes: 15, 8, 10, 12, 50; notes appear on pages 2124; 0
C T
A
+70C; V
DD
= V
DD
Q = +2.5V +0.2V
PARAMETER/CONDITION
SYMBOL
MAX
UNITS
NOTES
-335
-262
-26A/
-265
-202
OPERATING CURRENT: One device bank; Active-Precharge;
t
RC =
t
RC (MIN);
t
CK =
t
CK (MIN); DQ, DM, and DQS inputs
changing once per clock cycle; Address and control inputs
changing once every two clock cycles;
I
DD0
1,125
1,125
945
1,080
mA
20, 43
OPERATING CURRENT: One device bank; Active-Read-
Precharge; Burst = 4;
t
RC =
t
RC (MIN);
t
CK =
t
CK (MIN); I
OUT
=
0mA; Address and control inputs changing once per clock
cycle
I
DD1
1,530
1,440
1,305
1,395
mA
20, 43
PRECHARGE POWER-DOWN STANDBY CURRENT: All device
banks idle; Power-down mode;
t
CK =
t
CK (MIN); CKE = LOW;
I
DD2P
36
36
36
36
mA
21, 28, 45
IDLE STANDBY CURRENT: CS# = HIGH; All device banks idle;
t
CK =
t
CK (MIN); CKE = HIGH; Address and other control
inputs changing once per clock cycle. V
IN
= V
REF
for DQ, DQS,
and DM
I
DD2F
450
405
405
405
mA
46
ACTIVE POWER-DOWN STANDBY CURRENT: One device bank
active; Power-down mode;
t
CK =
t
CK (MIN); CKE = LOW
I
DD3P
270
225
225
270
mA
21, 28, 45
ACTIVE STANDBY CURRENT: CS# = HIGH; CKE = HIGH; One
device bank; Active-Precharge;
t
RC =
t
RAS (MAX);
t
CK =
t
CK
(MIN); DQ, DM, and DQS inputs changing twice per clock
cycle; Address and other control inputs changing once per
clock cycle
I
DD3N
540
450
450
450
mA
42
OPERATING CURRENT: Burst = 2; Reads; Continuous burst;
One device bank active; Address and control inputs changing
once per clock cycle;
t
CK =
t
CK (MIN); I
OUT
= 0mA
I
DD4R
1,575
1,350
1,350
1,575
mA
20, 43,
24, 45
OPERATING CURRENT: Burst = 2; Writes; Continuous burst;
One device bank active; Address and control inputs changing
once per clock cycle;
t
CK =
t
CK (MIN); DQ, DM, and DQS
inputs changing twice per clock cycle
I
DD4W
1,395
1,215
1,215
1,710
mA
20
AUTO REFRESH CURRENT
t
RC =
t
REFC (MIN)
I
DD5
2,295
2,115
2,115
2,205
mA
24, 45
t
REFC = 7.8125s
I
DD6
54
54
54
54
mA
24, 45
SELF REFRESH CURRENT: CKE
0.2V
Standard
I
DD7
36
36
36
36
mA
9
Low Power
I
DD7A
18
18
18
18
mA
OPERATING CURRENT: Four device bank interleaving READs
(BL=4) with auto precharge,
t
RC =
t
RC (MIN);
t
CK =
t
CK (MIN);
Address and control inputs change only during Active, READ,
or WRITE commands.
I
DD8
3,645
3,150
3,150
3,285
mA
20, 44
128MB, 256MB, 512MB (x72, ECC)
184-Pin DDR SDRAM DIMM
09005aef808f8ccd
Micron Technology, Inc., reserves the right to change products or specifications without notice.
DD9C16_32_64x72AG_A.fm - Rev. A 8/03 EN
16
2003 Micron Technology, Inc.
Table 14: I
DD
Specifications and Conditions 512MB
DRAM components only
Notes: 15, 8, 10, 12, 50; notes appear on pages 2124; 0
C T
A
+70C; V
DD
= V
DD
Q = +2.5V +0.2V
PARAMETER/CONDITION
SYMBOL
MAX
UNITS
NOTES
-335
-262
-26A/
-265/
-202
OPERATING CURRENT: One device bank; Active-Precharge;
t
RC
=
t
RC (MIN);
t
CK =
t
CK (MIN); DQ, DM, and DQS inputs
changing once per clock cycle; Address and control inputs
changing once every two clock cycles;
I
DD0
1,170
1,170
1,035
mA
20, 43
OPERATING CURRENT: One device bank; Active-Read-
Precharge; Burst = 4;
t
RC =
t
RC (MIN);
t
CK =
t
CK (MIN); I
OUT
=
0mA; Address and control inputs changing once per clock
cycle
I
DD1
1,440
1,440
1,305
mA
20, 43
PRECHARGE POWER-DOWN STANDBY CURRENT: All device
banks idle; Power-down mode;
t
CK =
t
CK (MIN); CKE = LOW;
I
DD2P
45
45
45
mA
21, 28, 45
IDLE STANDBY CURRENT: CS# = HIGH; All device banks idle;
t
CK =
t
CK (MIN); CKE = HIGH; Address and other control inputs
changing once per clock cycle. V
IN
= V
REF
for DQ, DQS, and DM
I
DD2F
405
405
360
mA
46
ACTIVE POWER-DOWN STANDBY CURRENT: One device bank
active; Power-down mode;
t
CK =
t
CK (MIN); CKE = LOW
I
DD3P
315
315
270
mA
21, 28, 45
ACTIVE STANDBY CURRENT: CS# = HIGH; CKE = HIGH; One
device bank; Active-Precharge;
t
RC =
t
RAS (MAX);
t
CK =
t
CK
(MIN); DQ, DM, and DQS inputs changing twice per clock cycle;
Address and other control inputs changing once per clock
cycle
I
DD3N
405
405
361
mA
42
OPERATING CURRENT: Burst = 2; Reads; Continuous burst; One
device bank active; Address and control inputs changing once
per clock cycle;
t
CK =
t
CK (MIN); I
OUT
= 0mA
I
DD4R
1,485
1,485
1,305
mA
20, 43,
24, 45
OPERATING CURRENT: Burst = 2; Writes; Continuous burst;
One device bank active; Address and control inputs changing
once per clock cycle;
t
CK =
t
CK (MIN); DQ, DM, and DQS inputs
changing twice per clock cycle
I
DD4W
1,395
1,395
1,215
mA
20
AUTO REFRESH CURRENT
t
RC =
t
REFC (MIN)
I
DD5
2,610
2,610
2,520
mA
24, 45
t
REFC = 7.8125s
I
DD6
90
90
90
mA
24, 45
SELF REFRESH CURRENT: CKE
0.2V
Standard
I
DD7
45
45
45
mA
9
Low Power
I
DD7A
27
27
27
mA
OPERATING CURRENT: Four device bank interleaving READs
(BL=4) with auto precharge,
t
RC =
t
RC (MIN);
t
CK =
t
CK (MIN);
Address and control inputs change only during Active, READ,
or WRITE commands.
I
DD8
3,645
3,600
3,150
mA
20, 44
128MB, 256MB, 512MB (x72, ECC)
184-Pin DDR SDRAM DIMM
09005aef808f8ccd
Micron Technology, Inc., reserves the right to change products or specifications without notice.
DD9C16_32_64x72AG_A.fm - Rev. A 8/03 EN
17
2003 Micron Technology, Inc.
Table 15: Capacitance
Note: 11; notes appear on pages 2124
PARAMETER
SYMBOL
MIN
MAX
UNITS
Input/Output Capacitance: DQs, DQSs
C
IO
4.0
5.0
pF
Input Capacitance: Command and Address, S0#
C
I1
18.0
27.0
pF
Input Capacitance: CK0, CK0# (-26A, -265, -202)
C
I2
12.0
15.0
pF
Input Capacitance: CK0, CK0# (-335)
C
I2
9.0
12.0
pF
Input Capacitance: CK1, CK1#, CK2, CK2# (-26A, -265, -202)
C
I2
10.5
13.5
pF
Input Capacitance: CKE
C
I3
18.0
27.0
pF
Table 16: Electrical Characteristics and Recommended AC Operating Conditions
(-335 and -262 Speed Grades)
Notes: 15, 8, 1215, 29, 31, 50; notes appear on pages 2124; 0
C T
A
+70C; V
DD
= V
DD
Q = +2.5V +0.2V
AC CHARACTERISTICS
-335
-262
UNITS
NOTES
PARAMETER
SYMBOL
MIN
MAX
MIN
MAX
Access window of DQ from CK/CK#
t
AC
-0.7
+0.7
-0.75
+0.75
ns
CK high-level width
t
CH
0.45
0.55
0.45
0.55
t
CK
26
CK low-level width
t
CL
0.45
0.55
0.45
0.55
t
CK
26
Clock cycle time
CL = 2.5
t
CK (2.5)
6
13
7.5
13
ns
40, 47, 48
CL = 2
t
CK (2)
7.5
13
7.5
13
ns
40, 47
DQ and DM input hold time relative to DQS
t
DH
0.45
0.5
ns
23, 27
DQ and DM input setup time relative to DQS
t
DS
0.45
0.5
ns
23, 27
DQ and DM input pulse width (for each input)
t
DIPW
1.75
1.75
ns
27
Access window of DQS from CK/CK#
t
DQSCK
-0.60
+0.60
-0.75
+0.75
ns
DQS input high pulse width
t
DQSH
0.35
0.35
t
CK
DQS input low pulse width
t
DQSL
0.35
0.35
t
CK
DQS-DQ skew, DQS to last DQ valid, per group, per access
t
DQSQ
0.45
0.5
ns
22, 25
Write command to first DQS latching transition
t
DQSS
0.75
1.25
0.75
1.25
t
CK
DQS falling edge to CK rising - setup time
t
DSS
0.2
0.2
t
CK
DQS falling edge from CK rising - hold time
t
DSH
0.2
0.2
t
CK
Half clock period
t
HP
t
CH,
t
CL
t
CH,
t
CL
ns
30
Data-out high-impedance window from CK/CK#
t
HZ
+0.70
+0.75
ns
16, 37
Data-out low-impedance window from CK/CK#
t
LZ
-0.70
-0.75
ns
16, 38
Address and control input hold time (fast slew rate)
t
IH
F
0.75
0.90
ns
12
Address and control input setup time (fast slew rate)
t
IS
F
0.75
0.90
ns
12
Address and control input hold time (slow slew rate)
t
IH
S
0.80
1
ns
12
Address and control input setup time (slow slew rate)
t
IS
S
0.80
1
ns
12
LOAD MODE REGISTER command cycle time
t
MRD
12
15
ns
DQ-DQS hold, DQS to first DQ to go non-valid, per access
t
QH
t
HP -
t
QHS
t
HP -
t
QHS
ns
22, 23
Data hold skew factor
t
QHS
0.55
0.75
ns
ACTIVE to PRECHARGE command
t
RAS
42
70,000
40
120,000
ns
31
128MB, 256MB, 512MB (x72, ECC)
184-Pin DDR SDRAM DIMM
09005aef808f8ccd
Micron Technology, Inc., reserves the right to change products or specifications without notice.
DD9C16_32_64x72AG_A.fm - Rev. A 8/03 EN
18
2003 Micron Technology, Inc.
ACTIVE to READ with Auto precharge command
t
RAP
18
15
ns
40
ACTIVE to ACTIVE/AUTO REFRESH command period
t
RC
60
60
ns
AUTO REFRESH command period
t
RFC
72
75
ns
45
ACTIVE to READ or WRITE delay
t
RCD
18
15
ns
PRECHARGE command period
t
RP
18
15
ns
DQS read preamble
t
RPRE
0.9
1.1
0.9
1.1
t
CK
37
DQS read postamble
t
RPST
0.4
0.6
0.4
0.6
t
CK
ACTIVE bank a to ACTIVE bank b command
t
RRD
12
15
ns
DQS write preamble
t
WPRE
0.25
0.25
t
CK
DQS write preamble setup time
t
WPRES
0
0
ns
18, 19
DQS write postamble
t
WPST
0.4
0.6
0.4
0.6
t
CK
17
Write recovery time
t
WR
15
15
ns
Internal WRITE to READ command delay
t
WTR
1
1
t
CK
Data valid output window
na
t
QH -
t
DQSQ
t
QH -
t
DQSQ
ns
22
REFRESH to REFRESH command interval
128MB
t
REFC
140.6
140.6
s
21
256MB,
512MB
70.3
140.6
s
21
Average periodic refresh interval
128MB
t
REFI
15.6
15.6
s
21
256MB,
512MB
7.8
7.8
s
21
Terminating voltage delay to V
DD
t
VTD
0
0
ns
Exit SELF REFRESH to non-READ command
t
XSNR
75
75
ns
Exit SELF REFRESH to READ command
t
XSRD
200
200
t
CK
Table 16: Electrical Characteristics and Recommended AC Operating Conditions
(-335 and -262 Speed Grades) (Continued)
Notes: 15, 8, 1215, 29, 31, 50; notes appear on pages 2124; 0
C T
A
+70C; V
DD
= V
DD
Q = +2.5V +0.2V
AC CHARACTERISTICS
-335
-262
UNITS
NOTES
PARAMETER
SYMBOL
MIN
MAX
MIN
MAX
128MB, 256MB, 512MB (x72, ECC)
184-Pin DDR SDRAM DIMM
09005aef808f8ccd
Micron Technology, Inc., reserves the right to change products or specifications without notice.
DD9C16_32_64x72AG_A.fm - Rev. A 8/03 EN
19
2003 Micron Technology, Inc.
Table 17: Electrical Characteristics and Recommended AC Operating Conditions
Notes: 15, 8, 1215, 29, 31, 50; notes appear on pages 2124; 0
C T
A
+70C; V
DD
= V
DD
Q = +2.5V +0.2V
AC CHARACTERISTICS
-26A/265
-202
UNITS
NOTES
PARAMETER
SYMBOL
MIN
MAX
MIN
MAX
Access window of DQ from CK/CK#
t
AC
-0.75
+0.75
-0.8
+0.8
ns
CK high-level width
t
CH
0.45
0.55
0.45
0.55
t
CK
26
CK low-level width
t
CL
0.45
0.55
0.45
0.55
t
CK
26
Clock cycle time
CL = 2.5
t
CK (2.5)
7.5
13
8
13
ns
40, 47, 48
CL = 2
t
CK (2)
7.5
13
10
13
ns
40, 47
DQ and DM input hold time relative to DQS
t
DH
0.5
0.6
ns
23, 27
DQ and DM input setup time relative to DQS
t
DS
0.5
0.6
ns
23, 27
DQ and DM input pulse width (for each input)
t
DIPW
1.75
2
ns
27
Access window of DQS from CK/CK#
t
DQSCK
-0.75
+0.75
-0.8
+0.8
ns
DQS input high pulse width
t
DQSH
0.35
0.35
t
CK
DQS input low pulse width
t
DQSL
0.35
0.35
t
CK
DQS-DQ skew, DQS to last DQ valid, per group, per access
t
DQSQ
0.5
0.6
ns
22, 25
Write command to first DQS latching transition
t
DQSS
0.75
1.25
0.75
1.25
t
CK
DQS falling edge to CK rising - setup time
t
DSS
0.2
0.2
t
CK
DQS falling edge from CK rising - hold time
t
DSH
0.2
0.2
t
CK
Half clock period
t
HP
t
CH,
t
CL
t
CH,
t
CL
ns
30
Data-out high-impedance window from CK/CK#
t
HZ
+0.75
+0.8
ns
16, 37
Data-out low-impedance window from CK/CK#
t
LZ
-0.75
-0.8
ns
16, 38
Address and control input hold time (fast slew rate)
t
IH
F
0.90
1.1
ns
12
Address and control input setup time (fast slew rate)
t
IS
F
0.90
1.1
ns
12
Address and control input hold time (slow slew rate)
t
IH
S
1
1.1
ns
12
Address and control input setup time (slow slew rate)
t
IS
S
1
1.1
ns
12
LOAD MODE REGISTER command cycle time
t
MRD
15
16
ns
DQ-DQS hold, DQS to first DQ to go non-valid, per access
t
QH
t
HP -
t
QHS
t
HP-
t
QHS
ns
22, 23
Data hold skew factor
t
QHS
0.75
1
ns
ACTIVE to PRECHARGE command
t
RAS
40
120,000
40
120,000
ns
31
ACTIVE to READ with Auto precharge command
t
RAP
t
RAS(MIN) - (burst length) *
t
CK/2)
ns
40
ACTIVE to ACTIVE/AUTO REFRESH command period
t
RC
65
70
ns
AUTO REFRESH command period
t
RFC
75
80
ns
45
ACTIVE to READ or WRITE delay
t
RCD
20
20
ns
PRECHARGE command period
t
RP
20
20
ns
DQS read preamble
t
RPRE
0.9
1.1
0.9
1.1
t
CK
37
DQS read postamble
t
RPST
0.4
0.6
0.4
0.6
t
CK
ACTIVE bank a to ACTIVE bank b command
t
RRD
15
15
ns
DQS write preamble
t
WPRE
0.25
0.25
t
CK
DQS write preamble setup time
t
WPRES
0
0
ns
18, 19
128MB, 256MB, 512MB (x72, ECC)
184-Pin DDR SDRAM DIMM
09005aef808f8ccd
Micron Technology, Inc., reserves the right to change products or specifications without notice.
DD9C16_32_64x72AG_A.fm - Rev. A 8/03 EN
20
2003 Micron Technology, Inc.
DQS write postamble
t
WPST
0.4
0.6
0.4
0.6
t
CK
17
Write recovery time
t
WR
15
15
ns
Internal WRITE to READ command delay
t
WTR
1
1
t
CK
Data valid output window
na
t
QH -
t
DQSQ
t
QH -
t
DQSQ
ns
22
REFRESH to REFRESH command interval
128MB
t
REFC
140.6
140.6
s
21
256MB,
512MB
140.6
140.6
s
21
Average periodic refresh interval
128MB
t
REFI
15.6
15.6
s
21
256MB,
512MB
7.8
s
21
Terminating voltage delay to V
DD
t
VTD
0
ns
Exit SELF REFRESH to non-READ command
t
XSNR
75
ns
Exit SELF REFRESH to READ command
t
XSRD
200
t
CK
Table 17: Electrical Characteristics and Recommended AC Operating Conditions
(Continued)
AC CHARACTERISTICS
-26A/265
-202
UNITS
NOTES
PARAMETER
SYMBOL
MIN
MAX
MIN
MAX
128MB, 256MB, 512MB (x72, ECC)
184-Pin DDR SDRAM DIMM
09005aef808f8ccd
Micron Technology, Inc., reserves the right to change products or specifications without notice.
DD9C16_32_64x72AG_A.fm - Rev. A 8/03 EN
21
2003 Micron Technology, Inc.
Notes
1. All voltages referenced to V
SS
.
2. Tests for AC timing, I
DD
, and electrical AC and DC
characteristics may be conducted at nominal ref-
erence/supply voltage levels, but the related spec-
ifications and device operation are guaranteed for
the full voltage range specified.
3. Outputs measured with equivalent load:
4. AC timing and I
DD
tests may use a V
IL
-to-V
IH
swing of up to 1.5V in the test environment, but
input timing is still referenced to V
REF
(or to the
crossing point for CK/CK#), and parameter speci-
fications are guaranteed for the specified AC input
levels under normal use conditions. The mini-
mum slew rate for the input signals used to test
the device is 1V/ns in the range between V
IL
(
AC
)
and V
IH
(
AC
).
5. The AC and DC input level specifications are as
defined in the SSTL_2 Standard (i.e., the receiver
will effectively switch as a result of the signal
crossing the AC input level, and will remain in that
state as long as the signal does not ring back
above [below] the DC input LOW [HIGH] level).
6. V
REF
is expected to equal V
DD
Q/2 of the transmit-
ting device and to track variations in the DC level
of the same. Peak-to-peak noise (non-common
mode) on V
REF
may not exceed 2 percent of the
DC value. Thus, from V
DD
Q/2, V
REF
is allowed
25mV for DC error and an additional 25mV for
AC noise. This measurement is to be taken at the
nearest V
REF
by-pass capacitor.
7. V
TT
is not applied directly to the device. V
TT
is a
system supply for signal termination resistors, is
expected to be set equal to V
REF
and must track
variations in the DC level of V
REF
.
8. I
DD
is dependent on output loading and cycle
rates. Specified values are obtained with mini-
mum cycle time at CL = 2 for -262, -26A, and -202,
CL = 2.5 for -265 and -335 with the outputs open.
9. Enables on-chip refresh and address counters.
10. I
DD
specifications are tested after the device is
properly initialized, and is averaged at the defined
cycle rate.
11. This parameter is sampled. V
DD
= +2.5V 0.2V,
V
DD
Q = +2.5V 0.2V, V
REF
= V
SS
, f = 100 MHz, T
A
=
25C, V
OUT
(DC) = V
DD
Q/2, V
OUT
(peak to peak) =
0.2V. DM input is grouped with I/O pins, reflecting
the fact that they are matched in loading.
12. Command/Address input slew rate = 0.5V/ns. At
slew rates 1 V/ns and faster,
t
IS and
t
IH are re-
duced to 900ps for -262, -26A, and -265; for -335
t
IS and
t
IH are reduced to 750ps. If the slew rate is
less than 0.5V/ns, timing must be derated:
t
IS has
an additional 50ps per each 100mV/ns reduction
in slew rate from the 500mV/ns.
t
IH has 0ps
added, that is, it remains constant. If the slew rate
exceeds 4.5V/ns, functionality is uncertain.
13. The CK/CK# input reference level (for timing ref-
erenced to CK/CK#) is the point at which CK and
CK# cross; the input reference level for signals
other than CK/CK# is V
REF
.
14. Inputs are not recognized as valid until V
REF
stabi-
lizes. Exception: during the period before V
REF
stabilizes, CKE
0.3 x V
DD
Q is recognized as LOW.
15. The output timing reference level, as measured at the
timing reference point indicated in Note 3, is V
TT
.
16.
t
HZ and
t
LZ transitions occur in the same access
time windows as valid data transitions. These
parameters are not referenced to a specific voltage
level, but specify when the device output is no
longer driving (HZ) or begins driving (LZ).
17. The intent of the Don't Care state after completion
of the postamble is the DQS-driven signal should
either be high, low, or high-Z and that any signal
transition within the input switching region must
follow valid input requirements. That is, if DQS
transitions high [above V
IH
DC (MIN)] then it must
not transition low (below V
IH
DC) prior to
t
DQSH
(MIN).
18. This is not a device limit. The device will operate
with a negative value, but system performance
could be degraded due to bus turnaround.
19. It is recommended that DQS be valid (HIGH or
LOW) on or before the WRITE command. The
case shown (DQS going from High-Z to logic
LOW) applies when no WRITEs were previously in
progress on the bus. If a previous WRITE was in
progress, DQS could be HIGH during this time,
depending on
t
DQSS.
20. MIN (
t
RC or
t
RFC) for I
DD
measurements is the
smallest multiple of
t
CK that meets the minimum
absolute value for the respective parameter.
t
RAS
(MAX) for Idd measurements is the largest multi-
ple of
t
CK that meets the maximum absolute
value for
t
RAS.
Output
(V
OUT
)
Reference
Point
50
V
TT
30pF
128MB, 256MB, 512MB (x72, ECC)
184-Pin DDR SDRAM DIMM
09005aef808f8ccd
Micron Technology, Inc., reserves the right to change products or specifications without notice.
DD9C16_32_64x72AG_A.fm - Rev. A 8/03 EN
22
2003 Micron Technology, Inc.
21. The refresh period 64ms. This equates to an aver-
age refresh rate of 15.625s (128MB module)
7.8125s (256MB module). However, an AUTO
REFRESH command must be asserted at least
once every 140.6s (128MB module) or 70.3s
(256MB module); burst refreshing or posting by
the DRAM controller greater than eight refresh
cycles is not allowed.
22. The valid data window is derived by achieving
other specifications:
t
HP (
t
CK/2),
t
DQSQ, and
t
QH
(
t
QH =
t
HP -
t
QHS). The data valid window der-
ates directly porportional with the clock duty
cycle and a practical data valid window can be
derived. The clock is allowed a maximum duty
cycle variation of 45/55, beyond which function-
ality is uncertain. Figure 8, Derating Data Valid
Window (
t
QH -
t
DQSQ), shows the derating curves
for duty cycles ranging between 50/50 and 45/55.
23. Each byte lane has a corresponding DQS.
24. This limit is actually a nominal value and does not
result in a fail value. CKE is HIGH during
REFRESH command period (
t
RFC [MIN]) else
CKE is LOW (i.e., during standby).
25. To maintain a valid level, the transitioning edge of
the input must:
a. Sustain a constant slew rate from the current
AC level through to the target AC level, V
IL
(AC)
or V
IH
(AC).
b. Reach at least the target AC level.
c. After the AC target level is reached, continue to
maintain at least the target DC level, V
IL
(DC)
or V
IH
(DC).
26. CK and CK# input slew rate must be
1V/ns (
2V/ns if measured differentially).
27. DQ and DM input slew rates must not deviate
from DQS by more than 10 percent. If the DQ/
DM/DQS slew rate is less than 0.5V/ns, timing
must be derated: 50ps must be added to
t
DS and
t
DH for each 100mv/ns reduction in slew rate. If
slew rate exceeds 4V/ns, functionality is uncer-
tain.
28. V
DD
must not vary more than 4 percent if CKE is
not active while any device bank is active.
29. The clock is allowed up to 150ps of jitter. Each
timing parameter is allowed to vary by the same
amount.
Figure 8: Derating Data Valid Window
(
t
QH -
t
DQSQ)
3.750
3.700
3.650
3.600
3.550
3.500
3.450
3.400
3.350
3.300
3.250
3.400
3.350
3.300
3.250
3.200
3.150
3.100
3.050
3.000
2.950
2.900
2.500
2.463
2.425
2.388
2.350
2.313
2.275
2.238
2.200
2.163
2.125
1.8
2.0
2.2
2.4
2.6
2.8
3.0
3.2
3.4
3.6
3.8
50/50
49.5/50.5 49/51
48.5/52.5
48/52
47.5/53.5
47/53
46.5/54.5
46/54
45.5/55.5
45/55
Clock Duty Cycle
ns
-26A/-265 @
t
CK = 10ns
-202 @
t
CK = 10ns
-26A/-265 @
t
CK = 7.5ns
-202 @
t
CK = 8ns
-335 @
t
CK = 6ns
TBD
128MB, 256MB, 512MB (x72, ECC)
184-Pin DDR SDRAM DIMM
09005aef808f8ccd
Micron Technology, Inc., reserves the right to change products or specifications without notice.
DD9C16_32_64x72AG_A.fm - Rev. A 8/03 EN
23
2003 Micron Technology, Inc.
30.
t
HP (MIN) is the lesser of
t
CL minimum and
t
CH
minimum actually applied to the device CK and
CK# inputs, collectively during bank active.
31. READs and WRITEs with auto precharge are not
allowed to be issued until
t
RAS (MIN) can be satis-
fied prior to the internal precharge command
being issued.
32. Any positive glitch must be less than 1/3 of the
clock cycle and not more than +400mV or 2.9V,
whichever is less. Any negative glitch must be less
than 1/3 of the clock cycle and not exceed either -
300mV or 2.2V, whichever is more positive. The
DC average cannot go below 2.3V minimum.
33. Normal Output Drive Curves:
a. The full variation in driver pull-down current
from minimum to maximum process, temper-
ature and voltage will lie within the outer
bounding lines of the V-I curve of Figure 9,
Pull-Down Characteristics.
b. The variation in driver pull-down current
within nominal limits of voltage and tempera-
ture is expected, but not guaranteed, to lie
within the inner bounding lines of the V-I
curve of Figure 9, Pull-Down Characteristics.
c. The full variation in driver pull-up current from
minimum to maximum process, temperature
and voltage will lie within the outer bounding
lines of the V-I curve of Figure 10, Pull-Up Char-
acteristics.
d. The variation in driver pull-up current within
nominal limits of voltage and temperature is
expected, but not guaranteed, to lie within the
inner bounding lines of the V-I curve of Figure
10, Pull-Up Characteristics.
e. The full variation in the ratio of the maximum
to minimum pull-up and pull-down current
should be between 0.71 and 1.4, for device
drain-to-source voltages from 0.1V to 1.0V, and
at the same voltage and temperature.
f. The full variation in the ratio of the nominal
pull-up to pull-down current should be unity
10 percent, for device drain-to-source volt-
ages from 0.1V to 1.0V.
34. The voltage levels used are derived from a mini-
mum V
DD
level and the refernced test load. In
practice, the voltage levels obtained from a prop-
erly terminated bus will provide significantly dif-
ferent voltage values.
35. V
IH
overshoot: V
IH
(MAX) = V
DD
Q+1.5V for a pulse
width
3ns and the pulse width can not be greater
than 1/3 of the cycle rate. V
IL
undershoot: V
IL
(MIN)
= -1.5V for a pulse width
3ns and the pulse width
can not be greater than 1/3 of the cycle rate.
36. V
DD
and V
DD
Q must track each other.
37. This maximum value is derived from the refer-
enced test load. In practice, the values obtained
in a typical terminated design may reflect up to
310ps less for
t
HZ (MAX) and the last DVW.
t
HZ
(MAX) will prevail over
t
DQSCK (MAX) +
t
RPST
(MAX) condition.
t
LZ (MIN) will prevail over
t
DQSCK (MIN) +
t
RPRE (MAX) condition.
38. For slew rates of greater than 1V/ns the (LZ) tran-
sition will start about 310ps earlier.
39. During initialzation, V
DD
Q, V
TT
, and V
REF
must be
equal to or less than V
DD
+ 0.3V. Alternatively, V
TT
may be 1.35V maximum during power up, even if
V
DD
/V
DD
Q are 0.0V, provided a minimum of 42
W
of series resistance is used between the V
TT
sup-
ply and the input pin.
Figure 9: Pull-Down Characteristics
Figure 10: Pull-Up Characteristics
160
140
I
OUT
(mA)
V
OUT
(V)
Nominal low
Minimum
Nominal high
Maximum
120
100
80
60
40
20
0
0.0
0.5
1.0
1.5
2.0
2.5
V
OUT
(V)
0
-20
I
OUT
(mA)
Nominal low
Minimum
Nominal high
Maximum
-40
-60
-80
-100
-120
-140
-160
-180
-200
0.0
0.5
1.0
1.5
2.0
2.5
V
DD
Q - V
OUT
(V)
128MB, 256MB, 512MB (x72, ECC)
184-Pin DDR SDRAM DIMM
09005aef808f8ccd
Micron Technology, Inc., reserves the right to change products or specifications without notice.
DD9C16_32_64x72AG_A.fm - Rev. A 8/03 EN
24
2003 Micron Technology, Inc.
40. The current Micron part operates below the slow-
est JEDEC operating frequency of 83 MHz. As
such, future die may not reflect this option.
41.
t
RAP
t
RCD.
42. For -335, -262, -26A, and -265 speed grades, I
DD
3N
is specified to be 35mA per DRAM device at 100
MHz.
43. Random addressing changing and 50 percent of
data changing at every transfer.
44. Random addressing changing and 100 percent of
data changing at every transfer.
45. CKE must be active (high) during the entire time a
refresh command is executed. That is, from the
time the AUTO REFRESH command is registered,
CKE must be active at each rising clock edge, until
t
REF later.
46. I
DD
2N specifies the DQ, DQS and DM to be driven
to a valid high or low logic level. IDD2Q is similar
to I
DD
2F except I
DD
2Q specifies the address and
control inputs to remain stable. Although IDD2F,
I
DD
2N, and I
DD
2Q are similar, I
DD
2F is "worst
case."
47. Whenever the operating frequency is altered, not
including jitter, the DLL is required to be reset.
This is followed by 200 clock cycles.
48. Min
t
CK value at CL = 2.5 in the SPD for and -26A
speeds is 0.7ns, to facilitate proper system opera-
tion.
49. Leakage number reflects the worst case leakage
possible through the module pin, not what each
memory device contributes.
50. When an input signal is HIGH or LOW, it is
defined as a steady state logic HIGH or LOW.
128MB, 256MB, 512MB (x72, ECC)
184-Pin DDR SDRAM DIMM
09005aef808f8ccd
Micron Technology, Inc., reserves the right to change products or specifications without notice.
DD9C16_32_64x72AG_A.fm - Rev. A 8/03 EN
25
2003 Micron Technology, Inc.
SPD Clock and Data Conventions
Data states on the SDA line can change only during
SCL LOW. SDA state changes during SCL HIGH are
reserved for indicating start and stop conditions (as
shown in Figure 11, Data Validity, and Figure 12, Defi-
nition of Start and Stop).
SPD Start Condition
All commands are preceded by the start condition,
which is a HIGH-to-LOW transition of SDA when SCL
is HIGH. The SPD device continuously monitors the
SDA and SCL lines for the start condition and will not
respond to any command until this condition has been
met.
SPD Stop Condition
All communications are terminated by a stop condi-
tion, which is a LOW-to-HIGH transition of SDA when
SCL is HIGH. The stop condition is also used to place
the SPD device into standby power mode.
SPD Acknowledge
Acknowledge is a software convention used to indi-
cate successful data transfers. The transmitting device,
either master or slave, will release the bus after trans-
mitting eight bits. During the ninth clock cycle, the
receiver will pull the SDA line LOW to acknowledge
that it received the eight bits of data (as shown in Fig-
ure 12, Definition of Start and Stop).
The SPD device will always respond with an
acknowledge after recognition of a start condition and
its slave address. If both the device and a WRITE oper-
ation have been selected, the SPD device will respond
with an acknowledge after the receipt of each subse-
quent eight-bit word. In the read mode the SPD device
will transmit eight bits of data, release the SDA line and
monitor the line for an acknowledge. If an acknowl-
edge is detected and no stop condition is generated by
the master, the slave will continue to transmit data. If
an acknowledge is not detected, the slave will termi-
nate further data transmissions and await the stop
condition to return to standby power mode.
Figure 11: Data Validity
Figure 12: Definition of Start and Stop
Figure 13: Acknowledge Response from Receiver
SCL
SDA
DATA STABLE
DATA STABLE
DATA
CHANGE
SCL
SDA
START
BIT
STOP
BIT
SCL from Master
Data Output
from Transmitter
Data Output
from Receiver
9
8
Acknowledge
128MB, 256MB, 512MB (x72, ECC)
184-Pin DDR SDRAM DIMM
09005aef808f8ccd
Micron Technology, Inc., reserves the right to change products or specifications without notice.
DD9C16_32_64x72AG_A.fm - Rev. A 8/03 EN
26
2003 Micron Technology, Inc.
Figure 14: SPD EEPROM Timing Diagram
Table 18: EEPROM Device Select Code
Most significant bit (b7) is sent first
SELECT CODE
DEVICE TYPE IDENTIFIER
CHIP ENABLE
RW
b7
b6
b5
b4
b3
b2
b1
b0
Memory Area Select Code (two arrays)
1
0
1
0
SA2
SA1
SA0
RW
Protection Register Select Code
0
1
1
0
SA2
SA1
SA0
RW
Table 19: EEPROM Operating Modes
MODE
RW BIT
WC
BYTES
INITIAL SEQUENCE
Current Address Read
1
V
IH
or V
IL
1
START, Device Select, RW = `1'
Random Address Read
0
V
IH
or V
IL
1
START, Device Select, RW = `0', Address
1
V
IH
or V
IL
1
reSTART, Device Select, RW = `1'
Sequential Read
1
V
IH
or V
IL
1
Similar to Current or Random Address Read
Byte Write
0
V
IL
1
START, Device Select, RW = `0'
Page Write
0
V
IL
16
START, Device Select, RW = `0'
SCL
SDA IN
SDA OUT
tLOW
tSU:STA
tHD:STA
tF
tHIGH
tR
tBUF
tDH
tAA
tSU:STO
tSU:DAT
tHD:DAT
UNDEFINED
128MB, 256MB, 512MB (x72, ECC)
184-Pin DDR SDRAM DIMM
09005aef808f8ccd
Micron Technology, Inc., reserves the right to change products or specifications without notice.
DD9C16_32_64x72AG_A.fm - Rev. A 8/03 EN
27
2003 Micron Technology, Inc.
NOTE:
1. To avoid spurious START and STOP conditions, a minimum delay is placed between SCL = 1 and the falling or rising
edge of SDA.
2. This parameter is sampled.
3. For a reSTART condition, or following a WRITE cycle.
4. The SPD EEPROM WRITE cycle time (
t
WRC) is the time from a valid stop condition of a write sequence to the end of
the EEPROM internal erase/program cycle. During the WRITE cycle, the EEPROM bus interface circuit is disabled, SDA
remains HIGH due to pull-up resistor, and the EEPROM does not respond to its slave address.
Table 20: Serial Presence-Detect EEPROM DC Operating Conditions
All voltages referenced to V
SS
; V
DDSPD
= +2.3V to +3.6V
PARAMETER/CONDITION
SYMBOL
MIN
MAX
UNITS
SUPPLY VOLTAGE
V
DD
3
3.6
V
INPUT HIGH VOLTAGE: Logic 1; All inputs
V
IH
V
DD
x 0.7 V
DD
+ 0.5
V
INPUT LOW VOLTAGE: Logic 0; All inputs
V
IL
-1
V
DD
x 0.3
V
OUTPUT LOW VOLTAGE: I
OUT
= 3mA
V
OL
0.4
V
INPUT LEAKAGE CURRENT: VIN = GND to V
DD
I
LI
10
A
OUTPUT LEAKAGE CURRENT: V
OUT
= GND to V
DD
I
LO
10
A
STANDBY CURRENT: SCL = SDA = V
DD
- 0.3V; All other inputs = V
SS
or V
REF
I
SB
30
A
POWER SUPPLY CURRENT: SCL clock frequency = 100 KHz
I
CC
2
mA
Table 21: Serial Presence-Detect EEPROM AC Operating Conditions
All voltages referenced to V
SS
; V
DDSPD
= +2.3V to +3.6V
PARAMETER/CONDITION
SYMBOL
MIN
MAX
UNITS
NOTES
SCL LOW to SDA data-out valid
t
AA
0.2
0.9
s
1
Time the bus must be free before a new transition can start
t
BUF
1.3
s
Data-out hold time
t
DH
200
ns
SDA and SCL fall time
t
F
300
ns
2
Data-in hold time
t
HD:DAT
0
s
Start condition hold time
t
HD:STA
0.6
s
Clock HIGH period
t
HIGH
0.6
s
Noise suppression time constant at SCL, SDA inputs
t
I
50
ns
Clock LOW period
t
LOW
1.3
s
SDA and SCL rise time
t
R
0.3
s
2
SCL clock frequency
f
SCL
400
KHz
Data-in setup time
t
SU:DAT
100
ns
Start condition setup time
t
SU:STA
0.6
s
3
Stop condition setup time
t
SU:STO
0.6
s
WRITE cycle time
t
WRC
10
ms
4
128MB, 256MB, 512MB (x72, ECC)
184-Pin DDR SDRAM DIMM
09005aef808f8ccd
Micron Technology, Inc., reserves the right to change products or specifications without notice.
DD9C16_32_64x72AG_A.fm - Rev. A 8/03 EN
28
2003 Micron Technology, Inc.
Table 22: Serial Presence-Detect Matrix
"1"/"0": Serial Data, "driven to HIGH"/"driven to LOW"; notes at end of SPD Matrix
BYTE
DESCRIPTION
ENTRY
(VERSION)
MT9VDDT1672A MT9VDDT3272A MT9VDDT6472A
0
Number of Bytes Used by Micron
128
80
80
80
1
Total Number of SPD Memory Bytes
256
08
08
08
2
Memory Type
SDRAM DDR
07
07
07
3
Number of Row Addresses
12 or 13
0C
0D
0D
4
Number of Column Addresses
10
0A
0A
0A
5
Number of Ranks
1
01
01
01
6
Module Data Width
72
48
48
48
7
Module Data Width (Continued)
0
00
00
00
8
Module Voltage Interface Levels
SSTL 2.5V
04
04
04
9
SDRAM Cycle Time,
t
CK, (CAS Latency
= 2.5) (See note 1)
6ns (-335)
7ns (-262/-26A)
7.5ns (-265)
8ns (-202)
60
70
75
80
60
70
75
80
60
70
75
80
10
SDRAM Access From Clock,
t
AC
(CAS Latency = 2.5)
0.7ns (-335)
0.75ns (-262/-265/-26A)
0.8ns (-202)
70
75
80
70
75
80
70
75
80
11
Module Configuration Type
ECC
02
02
02
12
Refresh Rate/Type
15.6 or 7.81s/SELF
80
82
82
13
SDRAM Width (Primary SDRAM)
8
08
08
08
14
Error-Checking SDRAM Data Width
8
08
08
08
15
Minimum Clock Delay, Back -to- Back
1
01
01
01
Random Column Access
16
Burst Lengths Supported
2, 4, 8
0E
0E
0E
17
Number of Banks on SDRAM Device
4
04
04
04
18
CAS Latencies Supported
2, 2.5
0C
0C
0C
19
CS Latency
0
01
01
01
20
WE Latency
1
02
02
02
21
SDRAM Module Attributes
Unbuffered, Diff CLK
20
20
20
22
SDRAM Device Attributes: General
Fast/concurrent auto
precharge
C0
C0
C0
23
SDRAM Cycle Time,
t
CK
(CAS Latency = 2)
7.5ns (-335/-262/-26A)
10ns (-202/-265)
75
A0
75
A0
75
A0
24
SDRAM Cycle Time,
t
CK
(CAS Latency = 2) (See note 1)
0.7ns (-335)
0.75ns (-262/-265/-26A)
0.8ns (-202)
70
75
80
70
75
80
70
75
80
25
SDRAM Cycle Time,
t
CK
(CAS Latency = 1)
00
00
00
26
SDRAM Access From CK
(CAS latency = 1)
00
00
00
27
Minimum Row Precharge Time,
t
RP
18ns (-335)
20ns (-262)
20ns (-202/-265/-26A)
48
3C
50
48
3C
50
48
3C
50
28
Minimum Row Active To Row Active,
t
RRD
12ns (-335)
15ns (-202/-265/-26A/-262)
30
3C
30
3C
30
3C
128MB, 256MB, 512MB (x72, ECC)
184-Pin DDR SDRAM DIMM
09005aef808f8ccd
Micron Technology, Inc., reserves the right to change products or specifications without notice.
DD9C16_32_64x72AG_A.fm - Rev. A 8/03 EN
29
2003 Micron Technology, Inc.
29
Minimum RAS# to CAS# Delay,
t
RCD
18ns (-335)
20ns (-262)
20ns (-202/-265/-26A)
48
3C
50
48
3C
50
48
3C
50
30
Minimum RAS# Pulse Width,
t
RAS
42ns (-335)
45ns (-262/-265/-26A)
40ns (-202)
2A
2D
28
2A
2D
28
2A
2D
28
31
Module Rank Density
128MB or 256MB
20
40
40
32
Address and Command Setup Time,
t
IS
(See note 2)
0.8ns (-335)
1.0ns (-262/-265/-26A)
1.1ns (-202)
80
A0
B0
80
A0
B0
80
A0
B0
33
Address and Command Hold Time,
t
IH
(See note 2)
0.8ns (-335)
1.0ns (-262/-265/-26A)
1.1ns (-202)
80
A0
B0
80
A0
B0
80
A0
B0
34
Data/Data Mask Input Setup Time,
t
DS
0.45ns (-335
0.5ns (-262/-265/-26A)
0.6ns (-202)
45
50
60
45
50
60
45
50
60
35
Data/Data Mask Input Hold Time,
t
DH
0.45ns (-335
0.5ns (-262/-265/-26A)
0.6ns (-202)
45
50
60
45
50
60
45
50
60
36-40 Reserved
00
00
00
41
Minimum Active/Auto Refresh Time,
(
t
RC)
60ns (-335/-262)
65ns (-265/-26A)
70ns (-202)
3C
41
46
3C
41
46
3C
41
46
42
Minimum Auto Refresh to Active/
Auto Refresh Command Period, (
t
RFC)
72ns (-335)
75ns (-262/-265/-26A)
80ns (-202)
48
4B
50
48
4B
50
48
4B
50
43
Maximum Cycle Time, (
t
CK (MAX))
12ns (-335)
13ns (-202/-265/-26A/-262)
30
34
30
34
30
34
44
Maximum DQS-DQ Skew Time,
(
t
DQSQ)
0.45ns (-335)
0.5ns (-262-265/-26A)
0.6ns (-202)
2D
32
3C
2D
32
3C
2D
32
3C
45
Maximum Read Data Hold Skew
Factor, (
t
QHS)
0.55ns (-335)
0.75ns (-262/-265/-26A)
1ns (-202)
55
75
A0
55
75
A0
55
75
A0
46
Reserved
00
00
00
47
DIMM Height
01
01
01
4861 Reserved
00
00
00
62
SPD Revision
Release 1.0
10
10
10
63
Checksum for Bytes 062
-335
-262
-26A
-265
-202
16
A9
D6
06
A1
39
CC
F9
29
C4
7A
0D
3A
6A
05
64
Manufacturer's JEDEC ID Code
MICRON
2C
2C
2C
65-71 Manufacturer's JEDEC ID Code
(Continued)
00
00
00
72
Manufacturing Location
0112
010C
010C
010C
73-90 Module Part Number (ASCII)
Variable Data
Variable Data
Variable Data
Table 22: Serial Presence-Detect Matrix (Continued)
"1"/"0": Serial Data, "driven to HIGH"/"driven to LOW"; notes at end of SPD Matrix
BYTE
DESCRIPTION
ENTRY
(VERSION)
MT9VDDT1672A MT9VDDT3272A MT9VDDT6472A
128MB, 256MB, 512MB (x72, ECC)
184-Pin DDR SDRAM DIMM
09005aef808f8ccd
Micron Technology, Inc., reserves the right to change products or specifications without notice.
DD9C16_32_64x72AG_A.fm - Rev. A 8/03 EN
30
2003 Micron Technology, Inc.
NOTE:
1. The value of
t
CK for -26A modules is set at 7.0ns. Component spec. value is 7.5ns.
2. The JEDEC SPD specification allows fast or slow slew rate values for these bytes. The worst-case (slow slew rate) value is
represented here. Systems requiring the fast slew rate setup and hold values are supported, provided the faster mini-
mum slew rate is met.
91
PCB Identification Code
19
0109
0109
0109
92
Identification Code (Continued)
0
00
00
00
93
Year of Manufacture in BCD
Variable Data
Variable Data
Variable Data
94
Week of Manufacture in BCD
Variable Data
Variable Data
Variable Data
95-98 Module Serial Number
Variable Data
Variable Data
Variable Data
99-127 Manufacturer-Specific Data (RSVD)
Table 22: Serial Presence-Detect Matrix (Continued)
"1"/"0": Serial Data, "driven to HIGH"/"driven to LOW"; notes at end of SPD Matrix
BYTE
DESCRIPTION
ENTRY
(VERSION)
MT9VDDT1672A MT9VDDT3272A MT9VDDT6472A
128MB, 256MB, 512MB (x72, ECC)
184-Pin DDR SDRAM DIMM
09005aef808f8ccd
Micron Technology, Inc., reserves the right to change products or specifications without notice..
DD9C16_32_64x72AG_A.fm - Rev. A 8/03 EN
31
2003 Micron Technology, Inc
8000 S. Federal Way, P.O. Box 6, Boise, ID 83707-0006, Tel: 208-368-3900
E-mail: prodmktg@micron.com, Internet: http://www.micron.com, Customer Comment Line: 800-932-4992
Micron, the M logo, and the Micron logo are trademarks and/or service marks of Micron Technology, Inc.
All other trademarks are the property of their respective owners.
Figure 15: 184-Pin DIMM Dimensions
NOTE:
All dimensions in inches (millimeters)
or typical where noted.
Data Sheet Designation
Released (No Mark): This data sheet contains mini-
mum and maximum limits specified over the complete
power supply and temperature range for production
devices. Although considered final, these specifica-
tions are subject to change, as further product devel-
opment and data characterization sometimes occur.
1.255 (31.88)
1.245 (31.62)
PIN 1
0.700 (17.78)
TYP.
0.098 (2.50) D
(2X)
0.091 (2.30) TYP.
0.250 (6.35) TYP.
4.750 (120.65)
0.050 (1.27)
TYP.
0.091 (2.30)
TYP.
0.040 (1.02)
TYP.
0.079 (2.00) R
(4X)
0.035 (0.90) R
PIN 92
FRONT VIEW
BACK VIEW
NO COMPONENTS THIS SIDE
0.054 (1.37)
0.046 (1.17)
5.256 (133.50)
5.244 (133.20)
2.55 (64.77)
1.95 (49.53)
PIN 184
PIN 93
0.150 (3.80)
0.150 (3.80)
TYP.
0.394 (10.00)
TYP.
0.125 (3.18)
MAX
U1
U2
U3
U4
U5
U6
U7
U8
U9
U10
MAX
MIN
PDF 
ZIP