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Электронный компонент: HAL800UT-C

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HAL 800
Programmable Linear
Hall Effect Sensor
Edition Oct. 20, 1999
6251-441-1DS
PRELIMINARY DATA SHEET
MICRONAS
MICRONAS
HAL 800
2
Micronas
Contents
Page
Section
Title
3
1.
Introduction
3
1.1.
Major Applications
3
1.2.
Features
4
1.3.
Marking Code
4
1.4.
Operating Junction Temperature Range (T
J
)
4
1.5.
Hall Sensor Package Codes
4
1.6.
Solderability
4
1.7.
Pin Connections and Short Descriptions
5
2.
Functional Description
5
2.1.
General Function
7
2.2.
Digital Signal Processing and EEPROM
9
2.3.
Calibration Procedure
9
2.3.1.
General Procedure
10
2.3.2.
Calibration of Angle Sensor
11
3.
Specifications
11
3.1.
Outline Dimensions
11
3.2.
Dimensions of Sensitive Area
11
3.3.
Position of Sensitive Area
12
3.4.
Absolute Maximum Ratings
12
3.5.
Recommended Operating Conditions
13
3.6.
Electrical Characteristics
14
3.7.
Magnetic Characteristics
14
3.8.
Typical Characteristics
17
4.
Application Notes
17
4.1.
Application Circuit
17
4.2.
Temperature Compensation
18
4.3.
Ambient Temperature
18
4.4.
EMC and ESD
19
5.
Programming of the Sensor
19
5.1.
Definition of Programming Pulses
19
5.2.
Definition of the Telegram
21
5.3.
Telegram Codes
22
5.4.
Number Formats
23
5.5.
Register Information
23
5.6.
Programming Information
24
6.
Data Sheet History
HAL 800
Micronas
3
Programmable Linear Hall Effect Sensor
1. Introduction
The
HAL 800 is an universal magnetic field sensor with
a linear output based on the Hall effect. The IC is
designed and produced in sub-micron CMOS technol-
ogy and can be used for angle or distance measure-
ments if combined with a rotating or moving magnet.
The major characteristics like magnetic field range,
sensitivity, output quiescent voltage (output voltage at
B = 0 mT), and output voltage range are programma-
ble in a non-volatile memory. The sensor has a ratio-
metric output characteristic, which means that the out-
put voltage is proportional to the magnetic flux and the
supply voltage.
The HAL 800 features a temperature compensated
Hall plate with choppered offset compensation, an A/D
converter, digital signal processing, a D/A converter
with output driver, an EEPROM memory with redun-
dancy and lock function for the calibration data, a serial
interface for programming the EEPROM, and protec-
tion devices at all pins. The internal digital signal pro-
cessing is of great benefit because analog offsets,
temperature shifts, and mechanical stress do not
degrade the sensor accuracy.
The HAL 800 is programmable by modulating the sup-
ply voltage. No additional programming pin is needed.
The easy programmability allows a 2-point calibration
by adjusting the output voltage directly to the input sig-
nal (like mechanical angle, distance or current). An
individual adjustment of each sensor during the cus-
tomers manufacturing process is possible. With this
calibration procedure the tolerances of the sensor, the
magnet, and the mechanical positioning can be com-
pensated in the final assembly.
In addition, the temperature compensation of the Hall
IC can be fit to all common magnetic materials by pro-
gramming first and second order temperature coeffi-
cients of the Hall sensor sensitivity. This enables an
operation over the full temperature range with high
accuracy.
The calculation of the individual sensor characteristics
and the programming of the EEPROM memory can
easily be done with a PC and the application kit from
Micronas. The HAL 800 eases logistic because its
characteristics can be programmed in a wide range.
Therefore, one Hall IC type can be used for various
applications.
The sensor is designed for hostile industrial and auto-
motive applications and operates with typically 5 V
supply voltage in the ambient temperature range from
-
40 C up to 150 C.
The
HAL 800 is available in the very small leaded
package TO-92UT.
1.1. Major Applications
Due to the sensor's versatile programming characteris-
tics, the HAL 800 is the optimal system solution for
applications such as:
contactless potentiometers,
rotary position measurement,
linear position detection,
magnetic field and current measurement.
1.2. Features
high precision linear Hall effect sensor with
ratiometric output
multiple programmable magnetic characteristics
with non-volatile memory
digital signal processing
temperature characteristics programmable for
matching all common magnetic materials
programmable clamping voltages
programming with a modulation of the supply
voltage
lock function and redundancy for EEPROM memory
operates from
-
40 C up to 150 C
ambient temperature
operates from 4.5 V up to 5.5 V supply voltage
operates with static magnetic fields and dynamic
magnetic fields up to 2 kHz
choppered offset compensation
overvoltage and reverse-voltage protection at all
pins
magnetic characteristics extremely robust against
mechanical stress
short-circuit protected push-pull output
EMC optimized design
HAL 800
4
Micronas
1.3. Marking Code
The HAL 800 has a marking on the package surface
(branded side). This marking includes the name of the
sensor and the temperature range.
1.4. Operating Junction Temperature Range (T
J
)
A: TJ =
-
40 C to +170 C
K: TJ =
-
40 C to +140 C
E: TJ =
-
40 C to +100 C
C: TJ = 0 C to +100 C
The Hall sensors from Micronas are specified to the
chip temperature (junction temperature T
J
).
The relationship between ambient temperature (T
A
)
and junction temperature is explained in Section 4.3.
on page 18.
1.5. Hall Sensor Package Codes
Example: HAL800UT-A
Type:
800
Package:
TO-92UT
Temperature Range:
T
J
=
-
40C to +170C
Hall sensors are available in a wide variety of packag-
ing versions and quantities. For more detailed informa-
tion, please refer to the brochure: "Ordering Codes for
Hall Sensors".
1.6. Solderability
Package TO-92UT: according to IEC68-2-58
During soldering reflow processing and manual
reworking, a component body temperature of 260 C
should not be exceeded.
Components stored in the original packaging should
provide a shelf life of at least 12 months, starting from
the date code printed on the labels, even in environ-
ments as extreme as 40 C and 90% relative humidity.
1.7. Pin Connections and Short Descriptions
Fig. 11: Pin configuration
Type
Temperature Range
A
K
E
C
HAL 800
800A
800K
800E
800C
HALXXXPA-T
Temperature Range: A, K, E, or C
Package: UT for TO-92UT
Type: 800
Pin
No.
Pin Name
Type
Short Description
1
V
DD
IN
Supply Voltage and
Programming Pin
2
GND
Ground
3
OUT
OUT
Push Pull Output
1
2
3
V
DD
OUT
GND
HAL 800
Micronas
5
2. Functional Description
2.1. General Function
The HAL 800 is a monolithic integrated circuit which
provides an output voltage proportional to the mag-
netic flux through the Hall plate and proportional to the
supply voltage.
The external magnetic field component perpendicular
to the branded side of the package generates a Hall
voltage. This voltage is converted to a digital value,
processed in the Digital Signal Processing Unit (DSP)
according to the EEPROM programming, converted to
an analog voltage with ratiometric behavior, and stabi-
lized by a push-pull output transistor stage. The func-
tion and the parameters for the DSP are detailed
explained in Section 2.2. on page 7.
The setting of the LOCK register disables the program-
ming of the EEPROM memory for all time. This regis-
ter cannot be reset.
As long as the LOCK register is not set, the output
characteristic can be adjusted by modifying the
EEPROM registers. The IC is addressed by modulat-
ing the supply voltage (see Fig. 21). In the supply
voltage range from 4.5 V up to 5.5 V, the sensor gener-
ates an analog output voltage. After detecting a com-
mand, the sensor reads or writes the memory and
answers with a digital signal on the output pin. The
analog output is switched off during the communica-
tion.
Internal temperature compensation circuitry and the
choppered offset compensation enables operation
over the full temperature range with minimal changes
in accuracy and high offset stability. The circuitry also
rejects offset shifts due to mechanical stress from the
package. The non-volatile memory is equipped with
redundant EEPROM cells. In addition, the sensor IC is
equipped with devices for overvoltage and reverse volt-
age protection at all pins.
Fig. 21: Programming with V
DD
modulation
Fig. 22: HAL800 block diagram
V
OU
T
(V
)
5
6
7
8
V
DD
(V
)
HAL
800A
V
DD
GND
OUT
analog
V
DD
digital
Internally
Temperature
Oscillator
Switched
A/D
Digital
D/A
Analog
OUT
V
DD
GND
Supply
EEPROM Memory
Lock Control
Digital
stabilized
Supply and
Protection
Devices
Dependent
Bias
Protection
Devices
Hall Plate
Converter
Signal
Processing
Converter
Output
Level
Detection
Output
100
HAL 800
6
Micronas
Fig. 23: Details of EEPROM and Digital Signal Processing
MODE Register
FILTER
TC
6 bit
TCSQ
5 bit
SENSI-
14 bit
VOQ
11 bit
CLAMP-
10 bit
11 bit
LOCK
1 bit
1 bit
RANGE
2 bit
EEPROM Memory
A/D
Converter
Digital
Filter
Multiplier
Adder
Limiter
D/A
Converter
Digital Signal Processing
ADC-READOUT Register
14 bit
Digital
Lock
Control
TIVITY
LOW
CLAMP-
HIGH
Output
Micronas
Registers
0
1
2
3
4
5
40
20
0
20
40 mT
V
B
V
OUT
Clamp-high = 4 V
Sensitivity = 0.15
V
OQ
= 2.5 V
Clamp-low = 1 V
Range = 30 mT
Fig. 24: Example for output characteristics
0
1
2
3
4
5
150 100
50
0
50
100
150 mT
V
B
V
OUT
Clamp-high = 4.5 V
Sensitivity = 0.45
V
OQ
= 0.5 V
Clamp-low = 0.5 V
Range = 150 mT
Fig. 25: Example for output characteristics
HAL 800
Micronas
7
2.2. Digital Signal Processing and EEPROM
The DSP is the major part of this sensor and performs
the signal conditioning. The parameters for the DSP
are stored in the EEPROM registers. The details are
shown in Fig. 23.
Terminology:
SENSITIVITY: name of the register or register value
Sensitivity:
name of the parameter
The EEPROM registers consist of three groups:
Group 1 contains the registers for the adaption of the
sensor to the magnetic system:
MODE for selecting the magnetic field range and filter
frequency, TC and TCSQ for temperature characteris-
tics of the magnetic sensitivity.
Group 2 contains the registers for defining the output
characteristics: SENSITIVITY, VOQ, CLAMP-LOW,
and CLAMP-HIGH. The output characteristic of the
sensor is defined by these 4 parameters (see Fig. 24
and
Fig. 25 for examples).
The parameter V
OQ
(Output Quiescent Voltage) cor-
responds to the output voltage at B = 0 mT.
The parameter Sensitivity is defined as:
The output voltage can be calculated as:
The output voltage range can be clamped by setting
the registers CLAMP-LOW and CLAMP-HIGH in order
to enable failure detection (such as short-circuits to
V
DD
or GND).
Group 3 contains the Micronas registers and LOCK for
the locking of all registers. The Micronas registers are
programmed and locked during production and are
read-only for the customer. These registers are used
for oscillator frequency trimming, A/D converter offset
compensation, and several other special settings.
The ADC converts positive or negative Hall voltages
(operates with magnetic north and south poles at the
branded side of the package) in a digital value. This
signal is filtered in the Digital Filter and is readable in
the ADC-READOUT register as long as the LOCK bit
is not set.
Note: The ADC-READOUT values and the resolution
of the system depends on the filter frequency. Positive
values accord to a magnetic north pole on the branded
side of the package. Fig. 26 and Fig. 27 show typi-
cal ADC-READOUT values for the different magnetic
field ranges and filter frequencies.
6000
4000
2000
0
2000
4000
6000
200150100 50
0
50 100 150 200 mT
B
ADC-
READOUT
Filter = 500 Hz
Range 150 mT
Range 90 mT
Range 75 mT
Range 30 mT
Fig. 26: Typical ADC-READOUT
versus magnetic field for filter = 500 Hz
V
OUT
B
Sensitivity =
V
OUT
Sensitivity
B + V
OQ
1500
1000
500
0
500
1000
1500
200150100 50
0
50 100 150 200 mT
B
ADC-
READOUT
Range 150 mT
Range 90 mT
Range 75 mT
Range 30 mT
Filter = 2 kHz
Fig. 27: Typical ADC-READOUT
versus magnetic field for filter = 2 kHz
HAL 800
8
Micronas
Range
The RANGE bits are the two lowest bits of the MODE
register; they define the magnetic field range of the
A/D converter.
Filter
The FILTER bit is the highest bit of the MODE register;
it defines the
-
3 dB frequency of the digital low pass fil-
ter
TC and TCSQ
The temperature dependence of the magnetic sensitiv-
ity can be adapted to different magnetic materials in
order to compensate for the change of the magnetic
strength with temperature. The adaption is done by
programming the TC (Temperature Coefficient) and
the TCSQ registers (Quadratic Temperature Coeffi-
cient). Thereby, the slope and the curvature of the
magnetic sensitivity can be matched to the magnet
and the sensor assembly. As a result, the output volt-
age characteristic can be fixed over the full tempera-
ture range. The sensor can compensate for linear tem-
perature coefficients in the range from about -2900
ppm/K up to 700 ppm/K and quadratic coefficients
from about -5 ppm/K to 5 ppm/K. Please refer to
Section 4.2. on page 17 for the recommended settings
for different linear temperature coefficients.
Sensitivity
The SENSITIVITY register contains the parameter for
the Multiplier in the DSP. The Sensitivity is programma-
ble between -4 and 4. For V
DD
= 5 V the register can
be changed in steps of 0.00049. Sensitivity = 1 corre-
sponds to an increase of the output voltage by V
DD
if
the ADC-READOUT increases by 2048.
For all calculations, the digital value from the magnetic
field of the A/D converter is used. This digital informa-
tion is readable from the ADC-READOUT register.
VOQ
The VOQ register contains the parameter for the
Adder in the DSP. V
OQ
is the output voltage without
external magnetic field (B = 0 mT) and programmable
from
-
V
DD
up to V
DD
. For V
DD
= 5 V the register can
be changed in steps of 4.9 mV.
Note: If V
OQ
is programmed to a negative voltage, the
maximum output voltage is limited to:
For calibration in the system environment, a 2-point
adjustment procedure (see Section 2.3.) is recom-
mended. The suitable Sensitivity and V
OQ
values for
each sensor can be calculated individually by this pro-
cedure.
Clamping Voltage
The output voltage range can be clamped in order to
detect failures like shorts to V
DD
or GND.
The CLAMP-LOW register contains the parameter for
the lower limit. The lower clamping voltage is program-
mable between 0 V and V
DD
/2. For V
DD
= 5 V the reg-
ister can be changed in steps of 2.44 mV.
The CLAMP-HIGH register contains the parameter for
the higher limit. The higher clamping voltage is pro-
grammable between 0 V and V
DD
. For V
DD
= 5 V in
steps of 2.44 mV.
LOCK
By setting this 1-bit register, all registers will be locked,
and the sensor will no longer respond to any supply
voltage modulation.
Warning: This register cannot be reset!
ADC-READOUT
This 14-bit register delivers the actual digital value of
the applied magnetic field before the signal process-
ing. This register can be read out and is the basis for
the calibration procedure of the sensor in the system
environment.
RANGE
Magnetic Field Range
0
-
30 mT...30 mT
1
-
75 mT...75 mT
2
-
90 mT...90 mT
3
-
150 mT...150 mT
FILTER
-
3 dB Frequency
0
2 kHz
1
500 Hz
V
OUT
* 2048
ADC-READOUT * V
DD
Sensitivity =
V
OUTmax
= V
OQ
+ V
DD
HAL 800
Micronas
9
2.3. Calibration Procedure
2.3.1. General Procedure
For calibration in the system environment, the applica-
tion kit from Micronas is recommended. It contains the
hardware for the generation of the serial telegram for
programming and the corresponding software for the
input of the register values.
In this section, programming of the sensor with this
programming tool is explained. Please refer to
Section 5. on page 19 for information about program-
ming without this tool.
For the individual calibration of each sensor in the cus-
tomer application, a two point adjustment is recom-
mended (see Fig. 28 for an example). When using
the application kit, the calibration can be done in three
steps:
Step 1: Input of the registers which need not be
adjusted individually
The magnetic circuit, the magnetic material with its
temperature characteristics, the filter frequency, and
low and high clamping voltage are given for this appli-
cation.
Therefore, the values of the following registers should
be identical for all sensors of the customer application.
FILTER
(according to the maximum signal frequency)
RANGE
(according to the maximum magnetic field at the
sensor position)
TC and TCSQ
(depends on the material of the magnet and the
other temperature dependencies of the application)
CLAMP-LOW and CLAMP-HIGH
(according to the application requirements)
Write the appropriate settings into the HAL 800 regis-
ters.
After writing, the information is stored in an internal
RAM and not in the EEPROM. It is valid until switching
off the supply voltage. If the values should be perma-
nently stored in the EEPROM, the "STORE" command
must be used before switching off the supply voltage.
Step 2: Calculation of V
OQ
and Sensitivity
The calibration points 1 and 2 can be set inside the
specified range. The corresponding values for V
OUT1
and V
OUT2
result from the application requirements.
For highest accuracy of the sensor, calibration points
near the minimum and maximum input signal are rec-
ommended. The difference of the output voltage
between calibration point 1 and calibration point 2
should be more than 3.5 V.
Set the system to calibration point 1 and read the reg-
ister ADC-READOUT. The result is the value ADC-
READOUT1.
Now, set the system to calibration point 2, read the
register ADC-READOUT again, and get the value
ADC-READOUT2.
With these values and the target values V
OUT1
and
V
OUT2
, for the calibration points 1 and 2, respectively,
the values for Sensitivity and V
OQ
are calculated as:
This calculation has to be done individually for each
sensor.
Now, write the calculated values for Sensitivity and
V
OQ
for adjusting the sensor.
Use the "STORE" command for permanently storing
the EEPROM registers. The sensor is now calibrated
for the customer application. However, the program-
ming can be changed again and again if necessary.
Step 3: Locking the Sensor
The last step is activating the LOCK function with the
"LOCK" command. The sensor is now locked and does
not respond to any programming or reading com-
mands.
Warning: This register cannot be reset!
Low clamping voltage
V
OUT1,2
High clamping voltage
V
OUT1
-
V
OUT2
ADC-READOUT1
-
ADC-READOUT2
Sensitivity =
V
DD
2048
*
ADC-READOUT1 * Sensitivity * V
DD
2048
V
OQ
= V
OUT1
-
HAL 800
10
Micronas
2.3.2. Calibration of Angle Sensor
The following description explains the calibration pro-
cedure using an angle sensor as an example. The
required output characteristic is shown in Fig. 28.
the angle range is from
-
25 to 25
temperature coefficient of the magnet:
-
500 ppm/K
Step 1: Input of the registers which need not to be
adjusted individually
The register values for the following registers are given
for all applications:
FILTER
Select the filter frequency: 500 Hz
RANGE
Select the magnetic field range: 30 mT
TC
For this magnetic material: 1
TCSQ
For this magnetic material: 12
CLAMP-LOW
For our example: 0.5 V
CLAMP-HIGH
For our example: 4.5 V
Enter these values in the software, and use the
"WRITE" command for writing the values in the regis-
ters.
Step 2: Calculation of V
OQ
and Sensitivity
There are 2 ways to calculate the values for V
OQ
and
Sensitivity
Manual Calculation:
Set the system to calibration point 1 (angle 1 =
-
25)
and read the register ADC-READOUT. For our exam-
ple, the result is ADC-READOUT1 =
-
2500.
Now, set the system to calibration point 2 (angle 2 =
25), and read the register ADC-READOUT again. For
our example, the result is ADC-READOUT2 =
+
2350.
With these measurements and the targets V
OUT1
=
4.5 V and V
OUT2
= 0.5 V, the values for Sensitivity and
V
OQ
are
This calculation has to be done individually for each
sensor.
Automatic Calibration:
Use the menu CALIBRATE from the PC software and
enter the values 4.5 V for V
OUT1
and 0.5 V for V
OUT2
.
Set the system to calibration point 1 (angle 1 =
-
25),
hit the button Read ADC-Readout1, set the system to
calibration point 2 (angle 2 = 25), hit the button Read
ADC-Readout2, and hit the button Calculate. The soft-
ware will then calculate the appropriate V
OQ
and Sen-
sitivity.
Now, write the calculated values into the
HAL 800 for
programming the sensor and use the "STORE" com-
mand for permanently storing the EEPROM registers.
Step 3: Locking the Sensor
The last step is activating the LOCK function with the
"LOCK" command. The sensor is now locked and does
not respond to any programming or reading com-
mands.
Warning: This register cannot be reset!
4.5 V
-
0.5 V
-
2500
-
2350
Sensitivity =
5 V
2048
*
=
-
0.3378
V
OQ
= 4.5 V
-
2048
-
2500 *
(-
0.3378) * 5 V
= 2.438 V
0
1
2
3
4
5
30
20
10
0
10
20
30
V
Angle
V
OUT
Clamp-high = 4.5 V
Clamp-low = 0.5 V
Calibration point 2
Calibration point 1
Fig. 28: Example for output characteristics
HAL 800
Micronas
11
3. Specifications
3.1. Outline Dimensions
Fig. 31:
Plastic Transistor Single Outline Package
(TO-92UT)
Weight approximately 0.14 g
Dimensions in mm
A mechanical tolerance of
50
m applies to all
dimensions where no tolerance is explicitly given.
3.2. Dimensions of Sensitive Area
0.25 mm x 0.25 mm
3.3. Position of Sensitive Area
sensitive area
y
4.06
0.1
x2
4.05
0.1
13.0
min.
1.27
1.27
(2.54)
1
2
3
0.42
0.3
1.5
0.36
branded side
0.8
45
0.55
0.48
SPGS0014-3-A/1E
x1
2.1
0.2
0.75
0.2
TO-92UT
x1
-
x2
/ 2
0.2 mm
y = 1.5 mm
0.2 mm
HAL 800
12
Micronas
3.4. Absolute Maximum Ratings
Stresses beyond those listed in the "Absolute Maximum Ratings" may cause permanent damage to the device. This
is a stress rating only. Functional operation of the device at these or any other conditions beyond those indicated in
the "Recommended Operating Conditions/Characteristics" of this specification is not implied. Exposure to absolute
maximum ratings conditions for extended periods may affect device reliability.
3.5. Recommended Operating Conditions
Symbol
Parameter
Pin No.
Min.
Max.
Unit
V
DD
Supply Voltage
1
-
8.5
8.5
V
V
DD
Supply Voltage
1
-
14.4
1) 2)
14.4
1) 2)
V
-
I
DD
Reverse Supply Current
1
-
50
1)
mA
I
Z
Current through Protection Device
1 or 3
-
300
4)
300
4)
mA
V
OUT
Output Voltage
3
-
5
6)
-
5
6)
8.5
3)
14.4
3) 2)
V
V
OUT
-
V
DD
Excess of Output Voltage
over Supply Voltage
3,1
2
V
I
OUT
Continuous Output Current
3
-
10
10
mA
t
Sh
Output Short Circuit Duration
3
-
10
min
T
S
Storage Temperature Range
-
65
150
C
T
J
Junction Temperature Range
-
40
-
40
170
5)
150
C
C
1)
as long as T
Jmax
is not exceeded
2)
t < 10 minutes (V
DDmin
=
-
15 V for t < 1min, V
DDmax
= 16 V for t < 1min)
3)
as long as T
Jmax
is not exceeded, output is not protected to external 14 V-line (or to
-
14 V)
4)
t < 2 ms
5)
t < 1000h
6)
internal protection resistor = 100
Symbol
Parameter
Pin No.
Min.
Typ.
Max.
Unit
V
DD
Supply Voltage
1
4.5
5
5.5
V
I
OUT
Continuous Output Current
3
-
1
-
1
mA
R
L
Load Resistor
3
4.5
-
-
k
C
L
Load Capacitance
3
0.33
10
1000
nF
HAL 800
Micronas
13
3.6. Electrical Characteristics
at T
J
=
-
40 C to +170 C, V
DD
= 4.5 V to 5.5 V, after programming, as not otherwise specified in Conditions.
Typical Characteristics for T
J
= 25 C and V
DD
= 5 V.
Symbol
Parameter
Pin No.
Min.
Typ.
Max.
Unit
Conditions
I
DD
Supply Current
1
7
10
mA
T
J
= 25 C, V
DD
= 4.5 V to 8.5 V
I
DD
Supply Current
over Temperature Range
1
7
10
mA
V
DDZ
Overvoltage Protection
at Supply
1
17.5
20
V
I
DD
= 25 mA, T
J
= 25 C, t = 20 ms
V
OZ
Overvoltage Protection
at Output
3
17
19.5
V
I
O
= 10 mA, T
J
= 25 C, t = 20 ms
Resolution
3
12
bit
ratiometric to V
DD
1)
E
A
Accuracy Error over all
3
-
2
0
2
%
R
L
= 4.7 k
(% of supply voltage)
3)
INL
Non-Linearity of Output Voltage
over Temperature
3
-
1
0
1
%
% of supply voltage
3)
E
R
Ratiometric Error of Output
over Temperature
(Error in V
OUT
/ V
DD
)
3
-
1
0
1
%
V
OUT1
- V
OUT2
> 2 V
during calibration procedure
V
OUTCL
Accuracy of Output Voltage at
Clamping Low Voltage over
Temperature Range
3
-
45
0
45
mV
R
L
= 4.7 k
, V
DD
= 5 V
V
OUTCH
Accuracy of Output Voltage at
Clamping High Voltage over
Temperature Range
3
-
45
0
45
mV
R
L
= 4.7 k
, V
DD
= 5 V
V
OUTH
Output High Voltage
3
4.65
4.8
V
V
DD
= 5 V,
-
1 mA
I
OUT
1mA
V
OUTL
Output Low Voltage
3
0.2
0.35
V
V
DD
= 5 V,
-
1 mA
I
OUT
1mA
f
ADC
Internal ADC Frequency
-
120
128
140
kHz
T
J
= 25 C
f
ADC
Internal ADC Frequency over
Temperature Range
-
110
128
150
kHz
V
DD
= 4.5 V to 8.5 V
t
r(O)
Response Time of Output
3
-
2
1
4
2
ms
ms
3 dB Filter frequency = 500 Hz
3 dB Filter frequency = 2 kHz
C
L
= 10 nF, time from 10% to 90% of
final output voltage for a steplike
signal B
step
from 0 mT to B
max
t
d(O)
Delay Time of Output
3
0.1
0.5
ms
t
POD
Power-Up Time (Time to reach
stabilized Output Voltage)
3
2
5
3
ms
3 dB Filter frequency = 500 Hz
3 dB Filter frequency = 2 kHz
90% of V
OUT
BW
Small Signal Bandwidth (
-
3 dB)
3
-
2
-
kHz
B
AC
< 10 mT;
3 dB Filter frequency = 2 kHz
V
OUTn
Noise Output Voltage
pp
3
-
3
6
mV
2)
magnetic range = 90 mT
R
OUT
Output Resistance over Recom-
mended Operating Range
3
-
1
10
V
OUTL
V
OUT
V
OUTH
R
thJA
TO-92UT
Thermal Resistance Junction to
Soldering Point
-
-
150
200
K/W
1)
Output DAC full scale = 5 V ratiometric, Output DAC offset = 0 V, Output DAC LSB = V
DD
/4096
2)
peak-to-peak value exceeded: 5%
3)
if more than 50% of the selected magnetic field range are used
HAL 800
14
Micronas
3.7. Magnetic Characteristics
at T
J
=
-
40 C to +170 C, V
DD
= 4.5 V to 5.5 V, after programming, as not otherwise specified in Conditions.
Typical Characteristics for T
J
= 25 C and V
DD
= 5 V.
3.8. Typical Characteristics
Symbol
Parameter
Pin No.
Min.
Typ.
Max.
Unit
Test Conditions
B
Offset
Magnetic Offset
3
-
1
0
1
mT
B = 0 mT, I
OUT
= 0 mA, T
J
= 25 C
B
Offset
/
T
Magnetic Offset Change
due to T
J
-
15
0
15
T/K
B = 0 mT, I
OUT
= 0 mA
B
Hysteresis
Magnetic Hysteresis
-
20
0
20
T
Range = 30 mT, Filter = 500 Hz
SR
Magnetic Slew Rate
3
-
12
50
-
mT/ms
Filter frequency = 500 Hz
Filter frequency = 2 kHz
n
meff
Magnetic RMS Broadband
Noise
3
-
10
-
T
BW = 10 Hz to 2 kHz
f
Cflicker
Corner Frequency of 1/f Noise
3
-
20
Hz
B = 0 mT
f
Cflicker
Corner Frequency of 1/frms
Noise
3
-
100
Hz
B = 65 mT, T
J
= 25 C
20
15
10
5
0
5
10
15
20
15 10
5
0
5
10
15
20 V
mA
V
DD
I
DD
T
A
= 40
C
T
A
= 25
C
T
A
=150
C
Fig. 32: Typical current consumption
versus supply voltage
0
2
4
6
8
10
50
0
50
100
150
200
C
mA
T
A
I
DD
V
DD
= 5 V
Fig. 33: Typical current consumption
versus ambient temperature
HAL 800
Micronas
15
0
2
4
6
8
10
1.5
1.0
0.5
0.0
0.5
1.0
1.5 mA
mA
I
OUT
I
DD
T
A
= 25
C
V
DD
= 5 V
Fig. 34: Typical current consumption
versus output current
40
35
30
25
20
15
10
5
0
5
10
100
1000
10000 Hz
dB
f
signal
V
OUT
3
Filter: 500 Hz
Filter: 2 kHz
Fig. 35: Typical output voltage
versus signal frequency
1
0.8
0.6
0.4
0.2
0.0
0.2
0.4
0.6
0.8
1.0
4
5
6
7
8 V
%
V
DD
E
R
V
OUT
/V
DD
= 0.82
V
OUT
/V
DD
= 0.66
V
OUT
/V
DD
= 0.5
V
OUT
/V
DD
= 0.34
V
OUT
/V
DD
= 0.18
Fig. 36: Typical ratiometric error
versus supply voltage
0
20
40
60
80
100
120
50
0
50
100
150
200
C
%
T
A
1/sensitivity
TC = 16, TCSQ = 8
TC = 0, TCSQ = 12
TC = 20, TCSQ = 12
TC = 31, TCSQ = 0
Fig. 37: Typical 1/sensitivity
versus ambient temperature
HAL 800
16
Micronas
1
0.8
0.6
0.4
0.2
0.0
0.2
0.4
0.6
0.8
1.0
50
0
50
100
150
200
C
mT
T
A
B
Offset
TC = 16, TCSQ = 8
TC = 0, TCSQ = 12
TC = 20, TCSQ = 12
Fig. 38: Typical magnetic offset
versus ambient temperature
1
0.8
0.6
0.4
0.2
0.0
0.2
0.4
0.6
0.8
1.0
40
20
0
20
40 mT
%
B
INL
Range = 30 mT
Fig. 39: Typical nonlinearity
versus magnetic field
HAL 800
Micronas
17
4. Application Notes
4.1. Application Circuit
For EMC protection, it is recommended to add each a
ceramic 4.7 nF capacitor between ground and the sup-
ply voltage respectively the output voltage pin. In addi-
tion, the input of the controller unit should be pulled-
down with a 4.7 kOhm resistor and a ceramic 4.7 nF
capacitor.
Please note that during programming, the sensor will
be supplied repeatedly with the programming voltage
of 12 V for 100 ms. All components connected to the
V
DD
line at this time must be able to resist this voltage.
Fig. 41: Recommended application circuit
4.2. Temperature Compensation
The relation between the temperature coefficient of the
magnet and the corresponding TC and TCSQ codes
for a linear compensation is given in the following
table. In addition to the linear change of the magnetic
field with temperature, the curvature can be adjusted,
too. For that purpose, TC and TCSQ have to be
changed to combinations that are not given in the
table. Please contact Micronas for more detailed infor-
mation.
Temperature
Coefficient of
Magnet (ppm/K)
TC
TCSQ
700
29
8
600
26
9
500
23
9
400
21
9
300
18
9
200
16
9
100
14
10
OUT
V
DD
GND
4.7 nF
HAL800
4.7 k
C
4.7 nF
4.7 nF
0
11
10
-
100
8
10
-
200
6
11
-
300
4
11
-
400
3
12
-
500
1
12
-
600
-
1
13
-
700
-
3
13
-
800
-
5
14
-
900
-
6
14
-
1000
-
8
15
-
1100
-
9
15
-
1200
-
11
16
-
1300
-
13
17
-
1400
-
14
17
-
1500
-
15
18
-
1600
-
17
18
-
1700
-
18
18
-
1800
-
19
19
-
1900
-
20
19
-
2000
-
22
20
-
2100
-
23
21
-
2200
-
24
21
-
2300
-
25
22
-
2400
-
26
22
-
2500
-
27
23
-
2600
-
28
23
-
2700
-
29
24
-
2800
-
30
24
-
2900
-
31
26
Temperature
Coefficient of
Magnet (ppm/K)
TC
TCSQ
HAL 800
18
Micronas
4.3. Ambient Temperature
Due to the internal power dissipation, the temperature
on the silicon chip (junction temperature T
J
) is higher
than the temperature outside the package (ambient
temperature T
A
).
T
J
= T
A
+
T
At static conditions, the following equation is valid:
T = I
DD
* V
DD
* R
thJA
For typical values, use the typical parameters. For
worst case calculation, use the max. parameters for
I
DD
and R
th
, and the max. value for V
DD
from the appli-
cation.
For V
DD
= 5.5 V, R
th
= 200 K/W and I
DD
= 10 mA the
temperature difference
T = 11 K.
For all sensors, the junction temperature T
J
is speci-
fied. The maximum ambient temperature T
Amax
can be
calculated as:
T
Amax
= T
Jmax
-
T
4.4. EMC and ESD
The HAL 800 is designed for a stabilized 5 V supply.
Interferences and disturbances conducted along the
12 V onboard system (product standards DIN40839
part 1 or ISO 7637 part 1) are not relevant for these
applications.
For applications with disturbances by capacitive or
inductive coupling on the supply line or radiated distur-
bances, the application circuit shown in Fig. 41 is rec-
ommended.
Applications with this arrangement passed the EMC
tests according to the product standards DIN 40839
part 3 (Electrical transient transmission by capacitive
or inductive coupling) and part 4 (Radiated distur-
bances).
Please contact Micronas for the detailed investigation
reports with the EMC and ESD results.
HAL 800
Micronas
19
5. Programming of the Sensor
5.1. Definition of Programming Pulses
The sensor is addressed by modulating a serial tele-
gram on the supply voltage. The sensor answers with a
serial telegram on the output pin.
The bits in the serial telegram have a different Bit time
for the V
DD
-line and the output. The Bit time for the
V
DD
-line is defined through the length of the Sync Bit
at the beginning of each telegram. The Bit time for the
output is defined through the Acknowledge Bit.
A logical 0 is coded as no voltage change within the Bit
time. A logical 1 is coded as a voltage change between
50% and 80% of the Bit time. After each bit a voltage
change occurs.
5.2. Definition of the Telegram
Each telegram starts with the Sync Bit (logical 0), 3
bits for the Command (COM), the Command Parity Bit
(CP), 4 bits for the Address (ADR), and the Address
Parity Bit (AP).
There are 3 kinds of telegrams:
Write a register (see Fig. 52)
After the AP Bit follow 14 Data Bits (DAT) and the
Data Parity Bit (DP). If the telegram is valid and the
command has been processed the sensor answers
with an Acknowledge Bit (logical 0) on the output.
Read a register (see Fig. 53)
After evaluating this command the sensor answers
with the Acknowledge Bit, 14 Data Bits, and the
Data Parity Bit on the output.
Programming the EEPROM cells (see Fig. 54)
After evaluating this command the sensor answers
with the Acknowledge Bit. After the delay time t
w
the
supply voltage rises up to the programming voltage.
Fig. 51: Definition of logical 0 and 1 bit
t
r
t
f
t
p0
t
p0
logical 0
V
DDH
V
DDL
or
t
p0
logical 1
V
DDH
V
DDL
or
t
p0
t
p1
t
p1
Table 51: Telegram parameters
Symbol
Parameter
Pin
Min.
Typ.
Max.
Unit
Remarks
V
DDL
Supply Voltage for Low Level
during Programming
1
5
5.6
6
V
V
DDH
Supply Voltage for High Level
during Programming
1
6.8
8.0
8.5
V
t
r
Rise time
1
0.05
ms
t
f
Fall time
1
0.05
ms
t
p0
Bit time on V
DD
1
3.4
3.5
3.6
ms
t
p0
is defined through the Sync Bit
t
pOUT
Bit time on output pin
3
4
6
8
ms
t
pOUT
is defined through the
Acknowledge Bit
t
p1
Voltage Change for logical 1
1, 3
50
65
80
%
% of t
p0
or t
pOUT
V
DDPROG
Supply Voltage for
Programming the EEPROM
1
11.95
12
12.1
V
t
PROG
Programming Time for EEPROM
1
95
100
105
ms
t
rp
Rise time of programming voltage
1
0.2
0.5
1
ms
t
fp
Fall time of programming voltage
1
0
1
ms
t
w
Delay time of programming voltage
after Acknowledge
1
0.5
0.7
1
ms
HAL 800
20
Micronas
Fig. 52: Telegram for coding a Write command
Fig. 53: Telegram for coding a Read command
Fig. 54: Telegram for coding the EEPROM programming
Sync
COM
CP
ADR
AP
DAT
DP
Acknowledge
V
DD
V
OUT
WRITE
Sync
COM
CP
ADR
AP
DAT
DP
Acknowledge
V
DD
V
OUT
READ
Sync
COM
CP
ADR
AP
t
PROG
Acknowledge
V
DD
V
OUT
ERASE, PROM, LOCK, and LOCKI
t
rp
t
fp
t
w
V
DDPROG
HAL 800
Micronas
21
5.3. Telegram Codes
Sync Bit
Each telegram starts with the Sync Bit. This logical 0
pulse defines the exact timing for t
p0
.
Command Bits (COM)
The Command code contains 3 bits and is a binary
number. Table 52 shows the available commands and
the corresponding codes for the HAL 800.
Command Parity Bit (CP)
This parity bit is 1, if the number of zeros within the 3
Command Bits is uneven. The parity bit is 0, if the
number of zeros is even.
Address Bits (ADR)
The Address code contains 4 bits and is a binary num-
ber.
Table 53 shows the available addresses for the
HAL 800 registers.
Address parity bit (AP)
This parity bit is 1, if the number of zeros within the 4
Address bits is uneven. The parity bit is 0, if the num-
ber of zeros is even.
Data Bits (DAT)
The 14 Data Bits contain the register information.
The registers use different number formats for the Data
Bits. These formats are explained in Section 5.4.
In the Write command the last bits are valid. If for
example the TC register (6 bits) is written, only the last
6 bits are valid.
In the Read command the first bits are valid. If for
example the TC register (6 bits) is read, only the first 6
bits are valid.
Data Parity Bit (DP)
This parity bit is 1, if the number of zeros within the
binary number is even. The parity bit is 0, if the number
of zeros is uneven.
Table 52: Available Commands
Command
Code
Explanation
READ
2
read a register
WRITE
3
write a register
PROM
4
program all nonvolatile registers (except the lock bits)
ERASE
5
erase all nonvolatile registers (except the lock bits)
LOCKI
6
lock Micronas lockable register
LOCK
7
lock the whole device and switch permanently to the analog-mode
Please note:
The Micronas lock bit (LOCKI) has already been set during production and cannot be reset.
HAL 800
22
Micronas
5.4. Number Formats
Binary number:
The most significant bit is given as first, the least signif-
icant bit as last digit.
Example:
101001
represents 41 decimal.
Signed binary number:
The first digit represents the sign of the following
binary number (1 for negative, 0 for positive sign).
Example:
0101001
represents +41 decimal
1101001
represents
-
41 decimal
Two-complementary number:
The first digit of positive numbers is 0, the rest of the
number is a binary number. Negative numbers start
with 1. In order to calculate the absolute value of the
number, you have to calculate the complement of the
remaining digits and to add 1.
Example:
0101001
represents +41 decimal
1010111
represents
-
41 decimal
Micronas registers (read only for customers)
Table 53: Available register addresses
Parameter
Code
Data
Bits
Format
Customer
Remark
CLAMP-LOW
1
10
binary
read/write/program
Low clamping voltage
CLAMP-HIGH
2
11
binary
read/write/program
High clamping voltage
VOQ
3
11
two compl.
binary
read/write/program
SENSITIVITY
4
14
signed binary
read/write/program
MODE
5
3
binary
read/write/program
Range and filter parameters
see Table 54 for details
LOCKR
6
1
binary
lock
Lock Bit
ADC-READOUT
7
14
two compl.
binary
read
TC
11
6
signed binary
read/write/program
TCSQ
12
5
binary
read/write/program
Parameter
Code
Data
Bits
Format
Remark
OFFSET
8
4
two compl. binary
ADC offset adjustment
FOSCAD
9
5
binary
Oscillator frequency adjustment
SPECIAL
13
6
special settings
IMLOCK
14
1
binary
Lock Bit for the Micronas registers
HAL 800
Micronas
23
5.5. Register Information
CLAMP-LOW
The register range is from 0 up to 1023.
The register value is calculated by:
CLAMP-HIGH
The register range is from 0 up to 2047.
The register value is calculated by:
VOQ
The register range is from
-
1024 up to 1023.
The register value is calculated by:
SENSITIVITY
The register range is from
-
8192 up to 8191.
The register value is calculated by:
MODE
The register range is from 0 up to 7 and contains the
settings for FILTER and RANGE
ADC-READOUT
This register is read only.
The register range is from
-
8192 up to 8191.
TC and TCSQ
The TC register range is from
-
31 up to 31,
The TCSQ register range is from 0 up to 31.
Please refer Section 4.2. on page 17 for the recom-
mended values.
5.6. Programming Information
If you want to change the content of any register
(except the lock registers) you have to write the
desired value into the corresponding RAM register at
first.
If you want to permanently store the value in the
EEPROM, you have to send an ERASE command first
and a PROM command afterwards. The address within
the ERASE and PROM command is not important.
ERASE and PROM acts on all registers in parallel.
If you want to change all registers of the HAL 800, you
can send all writing commands one after each other
and send one ERASE and PROM command at the
end.
Low Clamping Voltage
V
DD
* 2048
CLAMP-LOW =
High Clamping Voltage
V
DD
* 2048
CLAMP-HIGH =
V
OQ
V
DD
* 1024
VOQ =
Sensitivity
2048
SENSITIVITY =
Table 54: Parameters for the MODE register
MODE
FILTER
-
3 dB Frequency
RANGE
Magnetic Field Range
0
0
2 kHz
0
-
30 mT...30 mT
1
0
2 kHz
1
-
75 mT...75 mT
2
0
2 kHz
2
-
90 mT...90 mT
3
0
2 kHz
3
-
150 mT...150 mT
4
1
500 Hz
0
-
30 mT...30 mT
5
1
500 Hz
1
-
75 mT...75 mT
6
1
500 Hz
2
-
90 mT...90 mT
7
1
500 Hz
3
-
150 mT...150 mT
All information and data contained in this data sheet are without any
commitment, are not to be considered as an offer for conclusion of a
contract, nor shall they be construed as to create any liability. Any new
issue of this data sheet invalidates previous issues. Product availability
and delivery are exclusively subject to our respective order confirmation
form; the same applies to orders based on development samples deliv-
ered. By this publication, Micronas GmbH does not assume responsibil-
ity for patent infringements or other rights of third parties which may
result from its use.
Further, Micronas GmbH reserves the right to revise this publication and
to make changes to its content, at any time, without obligation to notify
any person or entity of such revisions or changes.
No part of this publication may be reproduced, photocopied, stored on a
retrieval system, or transmitted without the express written consent of
Micronas GmbH.
HAL 800
24
Micronas
Micronas GmbH
Hans-Bunte-Strasse 19
D-79108 Freiburg (Germany)
P.O. Box 840
D-79008 Freiburg (Germany)
Tel. +49-761-517-0
Fax +49-761-517-2174
E-mail: docservice@micronas.com
Internet: www.micronas.com
Printed in Germany
Order No. 6251-441-1DS
6. Data Sheet History
1. Advance information: "HAL 800 Programmable Lin-
ear Hall Effect Sensor, Aug. 24, 1998, 6251-441-1AI.
First release of the advance information.
2. Final data sheet: "HAL 800 Programmable Linear
Hall Effect Sensor, Oct. 20, 1999, 6251-441-1DS. First
release of the final data sheet.