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Электронный компонент: nAD1240-25

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PRELIMINARY PRODUCT SPECIFICATION
Main office: Nordic VLSI ASA - Vestre Rosten 81, N-7075 Tiller, Norway - Phone +4772898900 - Fax +4772898989
Revision: 1.0
Page 1 of 11
September 4th, 2001
12-Bit 40MSPS Sampling
Analog-to-Digital Converter IP
FEATURES
2.5V power supply
SNR typ 66dB for (f
in
= 10MHz)
Low power (105mW@2.5V)
Sample rate: 40MSPS
Frequency dependent biasing
Internal/sample hold
Differential input
Low input capacitance
APPLICATIONS
Imaging
Test equipment
Computer scanners
Communications
Set top boxes
Video products
GENERAL DESCRIPTION
The nAD1240-25 is a compact, high-speed, low power 12-bit monolithic analog-to-
digital converter, implemented in the TSMC Mixed-Signal MiM CMOS process. It
has 12-bit resolution with more than 10 effective bits, and close to 11 bit dynamic
range for video frequency signals. The converter includes a high bandwidth sample
and hold. The full scale range is
1V. The full scale range can be set between
0.5V
and
1V. It operates from a single 2.5V supply. Its low distortion and high dynamic
range offers the performance needed for demanding imaging, multimedia,
telecommunications and instrumentation applications.
The bias current level for the ADC is automatically adjusted based on the clock input
frequency. Hence, the power dissipation of the device is continuously minimised for
the current operation frequency.
QUICK REFERENCE DATA
Symbol
Parameter
Conditions
Min.
Typ.
Max.
Unit
V
DD
supply voltage
2.25
2.5
2.75
V
I
DD
supply current
(40 MSPS)
42
mA
P
D
power dissipation
(40 MSPS)
Except digital
output drivers
105
mW
P
D
power dissipation
(10 MSPS)
Except digital
output drivers
30
mW
P
D
power dissipation
(sleep mode)
Except digital
output drivers
1.5
mW
DNL
differential nonlinearity
f
IN
=0.9991MHz
1
LSB
INL
integral nonlinearity
f
IN
=0.9991MHz
3
LSB
f
S
conversion rate
10
40
MHz
N
resolution
12
bit
Table 1. Quick reference data
nAD1240-25
PRELIMINARY PRODUCT SPECIFICATION
nAD1240-25 12 Bit 40 MSPS Sampling ADC IP
Main office: Nordic VLSI ASA - Vestre Rosten 81, N-7075 Tiller, Norway - Phone +4772898900 - Fax +4772898989
Revision: 1.0
Page 2 of 11
September 4th, 2001
GENERAL DESCRIPTION (Continued)
The nAD1240-25 has a pipelined architecture - resulting in low input capacitance.
Digital error correction of the 11 most significant bits ensures good linearity for input
frequencies approaching Nyquist. The nAD1240-25 is compact. The core occupies
less than 1,5mm
2
of die area in TSMC Mixed Signal MiM 0.25
m CMOS process.
The fully differential architecture makes it insensitive to substrate noise. Thus it is
ideal as a mixed signal ASIC macro cell.
BLOCK DIAGRAM
Figure 1. Block diagram nAD1240-25
CORR_LOG
A
NCLO
C
K
IN_CORR<17:0>
CKBUS<3:0>
CLK
INN
INP
RE
F
P
RE
F
N
BIAS0
BIAS1
CL
O
C
K
B
U
F
EXT
R
E
F
CKCORR<1:0>
CK0
CK0B
CK2
CK2B
BIT<11:0>
ANALO
G
CM
PRELIMINARY PRODUCT SPECIFICATION
nAD1240-25 12 Bit 40 MSPS Sampling ADC IP
Main office: Nordic VLSI ASA - Vestre Rosten 81, N-7075 Tiller, Norway - Phone +4772898900 - Fax +4772898989
Revision: 1.0
Page 3 of 11
September 4th, 2001
ELECTRICAL SPECIFICATIONS
(
At T
A
= 25
C, V
DD
= 2.5V, Sampling Rate = 40MHz, Input frequency = 10MHz dBFS, Differential
input signal, 50% duty cycle clock unless otherwise noted).
Symbol Parameter (condition)
Test
Level
Min.
Typ.
Max.
Units
DC Accuracy
DNL
Differential Nonlinearity
f
IN
= 0.9991 MHz
III
0.5
1.0
LSB
INL
Integral Nonlinearity
f
IN
= 0.9991 MHz
III
1.0
3.0
LSB
V
OS
Midscale offset
III
TBD
mV
CMRR
Common Mode Rejection Ratio (of V
OS
)
TBD
dB
Dynamic Performance
SINAD
Signal to Noise and Distortion Ratio
f
IN
= 10 MHz
III
66
dBFS
f
IN
= 40 MHz
III
60
dBFS
SNR
Signal to Noise Ratio (without
harmonics)
f
IN
= 10 MHz
III
66
dBFS
SFDR
Spurious Free Dynamic Range
f
IN
= 10 MHz
III
75
dBFS
f
IN
= 40 MHz
III
60
70
dBFS
PSRR
Power Supply Rejection Ratio (of V
OS
)
III
-55
dB
Analog Input
V
FSR
Input Voltage Range (differential)
IV
+0.5
1.0
V
V
CMI
Common mode input voltage
III
1
1.2
1.35
V
C
INA
Input Capacitance (differential)
III
2.5
pF
Reference Voltages
V
REFN
Negative Input Voltage
III
0.7
V
V
REFP
Positive Input Voltage
III
1.7
V
V
RR
Reference input voltage range
1
III
0.5
1
1.05
V
V
CM
Common mode output voltage
III
1.2
V
Digital Inputs
V
IL
Logic "0" voltage
IV
0.4
V
V
IH
Logic "1" voltage
IV
AV
DD
-0.4
V
I
IL
Logic "0" current (V
I
=V
SS
)
IV
10
A
I
IH
Logic "1" current (V
I
=V
DD
)
IV
10
A
C
IND
Input Capacitance
IV
5
pF
Digital Outputs
V
OL
Logic "0" voltage (I = 2 mA)
IV
0.2
0.4
V
V
OH
Logic "1" voltage (I = 2 mA)
IV
85% OV
DD
90% OV
DD
V
t
H
Output hold time
V
1.9
ns
t
D
Output delay time
V
4.8
ns
(table continued on next page)
1
See "Input Signal Range" section
PRELIMINARY PRODUCT SPECIFICATION
nAD1240-25 12 Bit 40 MSPS Sampling ADC IP
Main office: Nordic VLSI ASA - Vestre Rosten 81, N-7075 Tiller, Norway - Phone +4772898900 - Fax +4772898989
Revision: 1.0
Page 4 of 11
September 4th, 2001
Switching Performance
f
S
Conversion Rate
V
10
40
MSPS
Pipeline Delay
IV
7
Clocks
AP
Aperture jitter
V
TBD
ps
t
AP
Aperture delay
V
1.4
ns
Power Supply
V
DD
supply voltage
V
2.25
2.5
2.75
V
I
DD
supply current (except digital output)
IV
42
mA
P
D
power dissipation (except digital output)
(40 MSPS)
IV
105
mW
P
D
power dissipation (except digital output)
(10 MSPS)
IV
30
mW
P
D
power dissipation (except digital output)
(sleep mode)
1)
IV
1.5
mW
V
SS
supply voltage
GND
AV
DD
-
DV
DD1
analog power digital power pins
-0.2
+0.2
V
OV
DD
Output driver supply voltage
III
2.25
2.5/3.0
3.3
V
T
Ambient operating temperature
IV
-40
+85
C
Table 3. Electrical specifications
1)
Power Down Mode ("zero" power dissipation) available for IP version of nAD1240-25
Test Levels
Test Level I: 100% production tested at +25C
Test Level II: 100% production tested at +25C and sample tested at specified
temperatures
Test Level III: Sample tested only
Test Level IV: Parameter is guaranteed by design and characterisation testing
Test Level V: Parameter is typical value only
Test Level VI: 100% production tested at +25C. Guaranteed by design and
characterisation testing for industrial temperature range
ABSOLUTE MAXIMUM RATINGS
Supply voltages
AV
DD
...............................- 0.3V to +3V
DV
DD1
..................- 0.3V to V
DD
+ 0.3V
OV
DD
...................- 0.3V to V
DD
+ 0.3V
Input voltages
Analog In.......... - 0.3V to AV
DD
+ 0.3V
Digital In..............- 0.3V to V
DD
+ 0.3V
REF
P
................. - 0.3V to AV
DD
+ 0.3V
REF
N
................. - 0.3V to AV
DD
+ 0.3V
CLOCK ...............- 0.3V to V
DD
+ 0.3V
Temperatures
Operating Temperature....-40 to +85
C
Storage Temperature.....-65 to +125
C
Note: Stress above one or more of the
limiting values may cause permanent
damage to the device.
PRELIMINARY PRODUCT SPECIFICATION
nAD1240-25 12 Bit 40 MSPS Sampling ADC IP
Main office: Nordic VLSI ASA - Vestre Rosten 81, N-7075 Tiller, Norway - Phone +4772898900 - Fax +4772898989
Revision: 1.0
Page 5 of 11
September 4th, 2001
PIN FUNCTIONS
Pin Name
Description
INP INN
Differential input signal pins. Common mode voltage: 1.2V
REFP REFN
Reference input pins. Bypass with 100nF || 1nF capacitors close to the pins. See
Application Information below.
BIAS0, BIAS1
Digital inputs for max. sampling rate programming.
BIAS1=0, BIAS0=0: Sleep mode (power save)
BIAS1=0, BIAS0=1: - 12.5% bias
BIAS1=1, BIAS0=0: +12.5% bias
BIAS1=1, BIAS0=1: Typ. Bias
The bias current is automatically scaled based on the clock input frequency.
CLK
Clock input
CM
Common mode voltage output
BIT11 - BIT0
Digital outputs ( MSB to LSB)
PD
Power Down. Tie to Vss for normal operation.
EXTREF
Disable internal references
V
DD
Power pins for chip core
V
SS
Ground pins
OV
DD
Power pins for output drivers
Table 4. Pin functions
IP BLOCK OUTLINE
The height and width of the layout is X =1875
m and Y=800
m respectively
(PRELIMINARY).
Figure 2. IP block outline and pin placement for nAD1240-25