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Электронный компонент: ECLSOIC8EVB

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Semiconductor Components Industries, LLC, 2004
August, 2004 - Rev. 1
1
Publication Order Number:
ECLSOIC8EVB/D
ECLSOIC8EVB
Evaluation Board Manual
for High Frequency SOIC 8
INTRODUCTION
ON Semiconductor has developed an evaluation board for
the devices in 8-lead SOIC package. These evaluation
boards are offered as a convenience for the customers
interested in performing their own engineering assessment
on the general performance of the 8-lead SOIC device
samples. The board provides a high bandwidth 50
W
controlled impedance environment. The pictures in Figure 1
show the top and bottom view of the evaluation board, which
can be configured in several different ways, depending on
device under test (See Table 1. Configuration List).
This evaluation board manual contains:
Information on 8-lead SOIC Evaluation Board
Assembly Instructions
Appropriate Lab Setup
Bill of Materials
This manual should be used in conjunction with the device
data sheet, which contains full technical details on the device
specifications and operation.
Board Lay-Up
The 8-lead SOIC evaluation board is implemented in four
layers with split (dual) power supplies (Figure 2.
Evaluation Board Lay-up). For standard ECL lab setup and
test, a split (dual) power supply is essential to enable the
50
W internal impedance in the oscilloscope as a termination
for ECL devices. The first layer or primary trace layer is
0.008
thick Rogers RO4003 material, which is designed to
have equal electrical length on all signal traces from the
device under the test (DUT) to the sense output. The second
layer is the 1.0 oz copper ground plane and a portion of the
plane is the V
EE
power plane. The FR4 dielectric material is
placed between second and third layer and between third and
fourth layer. The third layer is also 1.0 oz copper ground
plane and a portion of this layer is V
CC
power plane. The
fourth layer is the secondary trace layer.
Figure 1. Top and Bottom View of the 8-lead SOIC Evaluation Board
EVALUATION BOARD MANUAL
http://onsemi.com
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ECLSOIC8EVB
http://onsemi.com
2
Figure 2. Evaluation Board Lay-up
LAY-UP DETAIL
4 LAYER
LAYER 1 (TOP SIDE)
ROGERS 4003 0.008 in
LAYER 2 (GROUND AND VEE PLANE P1) 1 OZ
FR-4 0.020 in
LAYER 3 (GROUND AND VCC PLANE P2) 1 OZ
FR-4 0.025 in
LAYER 4 (BOTTOM SIDE)
SILKSCREEN (TOP SIDE)
0.062
$
0.007
Board Layout
The 8-lead SOIC evaluation board was designed to be
versatile and accommodate several different configurations.
The input, output, and power pin layout of the evaluation
board is shown in Figure 3. The evaluation board has at least
eleven possible configurable options. Table 1. list the
devices and the relevant configuration that utilizes this PCB
board. List of components and simple schematics are located
in Figures 4 through 14. Place SMA connectors on J1
through J7, 50
W chip resistors on R1 through R7, and chip
capacitors C1 through C4 according to configuration
figures. (C1 and C2 are 0.01
mF and C3 and C4 are 0.1 mF).
Figure 3. Evaluation Board Layout
Top View
Bottom View
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ECLSOIC8EVB
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3
Table 1. Configuration List
ECLinPS Lite
E
Device
Comments
Configuration
MC10EL01D/MC100EL01D
See Figure 4
1
MC10EL04D/MC100EL04D
See Figure 5
2
MC10EL05D/MC100EL05D
See Figure 4
1
MC10EL07D/MC100EL07D
See Figure 5
2
MC10EL11D/MC100EL11D
See Figure 6
3
MC10EL12D/MC100EL12D
See Figure 6
3
MC10EL16D/MC100EL16D*
See Figure 5
2
MC10EL31D/MC100EL31D
See Figure 4
1
MC10EL32D/MC100EL32D
See Figure 7
4
MC10EL33D/MC100EL33D
See Figure 7
4
MC10EL35D/MC100EL35D
See Figure 4
1
MC10EL51D/MC100EL51D
See Figure 4
1
MC10EL52D/MC100EL52D
See Figure 4
1
MC10EL58D/MC100EL58D
See Figure 8
5
MC10EL89D/MC100EL89D
See Figure 6
3
MC10ELT20D/
MC100ELT20D
See Figure 9
6
MC10ELT21D/
MC100ELT21D
See Figure 10
7
MC10ELT22D/
MC100ELT22D
See Figure 11
8
MC100ELT23D
See Figure 12
9
MC10ELT26D/
MC100ELT26D
See Figure 13
10
MC10ELT28D/
MC100ELT28D
See Figure 14
11
Low Voltage ECLinPS
E
Device
Comments
Configuration
MC100LVEL01D
See Figure 4
1
MC100LVEL05D
See Figure 4
1
MC100LVEL11D
See Figure 6
3
MC100LVEL12D
See Figure 6
3
MC100LVEL16D*
See Figure 5
2
MC100LVEL31D
See Figure 4
1
MC100LVEL32D
See Figure 7
4
MC100LVEL33D
See Figure 7
4
MC100LVEL51D
See Figure 4
1
MC100LVEL58D
See Figure 8
5
MC100LVELT22D
See Figure 11
8
MC100LVELT23D
See Figure 12
9
ECLinPS Plus
E
Device
Comments
Configuration
MC10EP01D/MC100EP01D
See Figure 4
1
MC10EP05D/MC100EP05D
See Figure 4
1
MC10EP08D/MC100EP08D
See Figure 4
1
MC10EP11D/MC100EP11D
See Figure 6
3
MC10EP16D/
MC100EP16D*
See Figure 5
2
MC100EP16FD*
See Figure 5
2
MC10EP16TD/
MC100EP16TD*
See Figure 5
2
MC100EP16VAD*
See Figure 5
2
MC100EP16VBD*
See Figure 5
2
MC100EP16VCD*
See Figure 8
5
MC100EP16VSD*
See Figure 5
2
MC100EP16VTD*
See Figure 5
2
MC10EP31D/MC100EP31D
See Figure 4
1
MC10EP32D/MC100EP32D
See Figure 7
4
MC10EP33D/MC100EP33D
See Figure 7
4
MC10EP35D/MC100EP35D
See Figure 4
1
MC10EP51D/MC100EP51D
See Figure 4
1
MC10EP52D/MC100EP52D
See Figure 4
1
MC10EP58D/MC100EP58D
See Figure 8
5
MC100EP89D
See Figure 6
3
MC10EPT20D/
MC100EPT20D
See Figure 9
6
MC100EPT21D*
See Figure 10
7
MC100EPT22D
See Figure 11
8
MC100EPT23D*
See Figure 12
9
MC100EPT26D*
See Figure 13
10
Low Voltage ECLinPS Plus
Device
Comments
Configuration
MC100LVEP11D
See Figure 6
3
MC100LVEP16D*
See Figure 5
2
*See Appendix for additions or modifications to the current
configuration.
ECLinPS MAX
E
Device
Comments
Configuration
NB6L11D
See Figure 6
3
NB6L16D
See Figure 5
2
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ECLSOIC8EVB
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4
Evaluation Board Assembly Instructions
The 8-lead SOIC evaluation board is designed for
characterizing devices in a 50
W laboratory environment
using high bandwidth equipment. Each signal trace on the
board has a via, which has an option of termination resistor
or bypassing capacitor depending on the input/output
configuration (see Table 1. Configuration List). Table 17
contains the Bill of Materials for this evaluation board.
Solder the Device on the Evaluation Board
The soldering can be accomplished by hand soldering or
soldering re-flow techniques. Make sure pin 1 of the device
is located next the white dotted mark U1 and all the pins are
aligned to the footprint pads. Solder the 8-lead SOIC device
to the evaluation board.
Connecting Power and Ground Planes
For standard ECL lab setup and test, a split (dual) power
supply is required enabling the 50
W internal impedance in
the oscilloscope to be used as a termination of the ECL
signals (V
TT
= V
CC
2.0 V, in split power supply setup, V
TT
is the system ground, V
CC
is 2.0 V, and V
EE
is 3.0 V or
1.3 V; see Table 2: Power Supply Levels).
Table 2. Power Supply Levels
Power Supply
V
CC
V
EE
GND
5.0 V
2.0 V
-3.0 V
0.0 V
3.3 V
2.0 V
-1.3 V
0.0 V
2.5 V
2.0 V
-0.5 V
0.0 V
The power supply for voltage level translating device need
slight modification as indicated in Table 3. Power Supply
Levels for Translators.
Table 3. Power Supply Levels for Translators
V
CC
V
EE
GND
PECL Translators
3.3 V / 5.0 V
0.0 V
0.0 V
On the top side of the evaluation board solder the four
surface mount test point clips to the pads labeled V
CC
, V
EE
,
and GND. The V
CC
clip connects directly to pin 8 of the
device. The V
EE
clip connects directly to pin 5 of the device.
There are two GND clip footprints which can be connected
to the ground plane of the evaluation board depending on the
setup configuration.
It is recommended to solder 0.01
mF capacitors to C1 and
C2 to reduce the unwanted noise from the power supplies.
C3 and C4 pads are provided for 0.1
mF capacitor to further
diminish the noise from the power supplies. Adding
capacitors can improve edge rates, reduce overshoot and
undershoot.
Termination
All ECL outputs need to be terminated to V
TT
(V
TT
= V
CC
2.0 V = GND) via a 50
W resistor in a split power supply
lab set-up. 0603 chip resistor pads are provided on the
bottom side of the evaluation board to terminate the ECL
driver (More information on termination is provided in
AN8020). Solder the chip resistors to the bottom side of the
board on the appropriate input of the device pins labeled R1,
R2, R3, R4, R6, and R7, depending on the specific device.
Installing the SMA Connectors
Each configuration indicates the number of SMA
connectors needed to populate an evaluation board for a
given configuration. Each input and output requires one
SMA connector. Attach all the required SMA connectors
onto the board and solder the connectors to the board. Please
note that alignment of the signal connector pin of the SMA
can influence the lab results. The reflection and launch of the
signals are largely influenced by imperfect alignment and
soldering of the SMA connector.
Validating the Assembled Board
After assembling the evaluation board, it is recommended
to perform continuity checks on all soldered areas before
commencing with the evaluation process. Time Domain
Reflectometry (TDR) is another highly recommended
validation test.
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ECLSOIC8EVB
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5
CONFIGURATIONS
J1
J3
J4
J2
R1
50
W
R2
50
W
R3
50
W
R4
50
W
J5
J6
C1
0.01
m
F
GND
C4
0.1
m
F
C2
0.01
m
F
GND
C3
0.1
m
F
Figure 4. Configuration 1 Schematic
V
CC
V
EE
DUT
Table 4. Configuration 1
Pin 1
Pin 2
Pin 3
Pin 4
Pin 5
Pin 6
Pin 7
Pin 8
Device
J1
R1
J2
R2
J3
R3
J4
R4
C2
C3
J6
R6
J7
R7
C1
C4
MC10EL01D/MC100EL01D
MC10EL05D/MC100EL05D
MC10EL31D/MC100EL31D
MC10EL35D/MC100EL35D
MC10EL51D/MC100EL51D
MC10EL52D/MC100EL52D
MC100LVEL01D
MC100LVEL05D
MC100LVEL31D
Yes
Yes
Yes
Yes
Yes
Yes
Yes
Yes
Yes
Yes
Yes
No
Yes
No
Yes
Yes
MC100LVEL51D
MC10EP01D/MC100EP01D
MC10EP05D/MC100EP05D
MC10EP08D/MC100EP08D
MC10EP31D/MC100EP31D
MC10EP35D/MC100EP35D
MC10EP51D/MC100EP51D
MC10EP52D/MC100EP52D