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Электронный компонент: NB100LVEP224

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Semiconductor Components Industries, LLC, 2003
June, 2003 - Rev. 4
1
Publication Order Number:
NB100LVEP224/D
NB100LVEP224
2.5V/3.3V 1:24 Differential
ECL/PECL Clock Driver with
Clock Select and Output
Enable
The NB100LVEP224 is a low skew 1-to-24 differential clock
driver, designed with clock distribution in mind, accepting two clock
sources into an input multiplexer. The part is designed for use in low
voltage applications which require a large number of outputs to drive
precisely aligned low skew signals to their destination. The two clock
inputs are differential ECL/PECL and they are selected by the
CLK_SEL pin. To avoid generation of a runt clock pulse when the
device is enabled/disabled, the Output Enable (OE) is synchronous
ensuring the outputs will only be enabled/disabled when they are
already in LOW state (See Figure 4).
The NB100LVEP224 guarantees low output-to-output skew. The
optimal design, layout, and processing minimize skew within a device
and from lot to lot. In any differential output, the same bias and
termination scheme is required. Unused output pairs should be left
unterminated (open) to "reduce power and switching noise as much as
possible." Any unused single line of a differential pair should be
terminated the same as the used line to maintain balanced loads on the
differential driver outputs. The wide VIHCMR specification allows
both pair of CLOCK inputs to accept LVDS levels.
The NB100LVEP224, as with most other ECL devices, can be
operated from a positive V
CC
supply in LVPECL mode. This allows
the LVEP224 to be used for high performance clock distribution in
+3.3 V or +2.5 V systems. Single-ended CLK input operation is
limited to a V
CC
3.0 V in LVPECL mode, or V
EE
-3.0 V in NECL
mode. In a PECL environment, series or Thevenin line terminations
are typically used as they require no additional power supplies. For
more information on PECL terminations, designers should refer to
Application Note AND8020/D.
20 ps Typical Output-to-Output Skew
75 ps Typical Device-to- Device Skew
Maximum Frequency > 1 GHz
650 ps Typical Propagation Delay
LVPECL Mode Operating Range:
V
CC
= 2.375 V to 3.8 V with V
EE
= 0 V
NECL Mode Operating Range:
V
CC
= 0 V with V
EE
= -2.375 V to -3.8 V
Internal Input Pulldown Resistors
Q Output will Default Low with Inputs Open or at V
EE
Thermally Enhanced 64-Lead LQFP
CLOCK Inputs are LVDS-Compatible; Requires External 100
W
LVDS Termination Resistor
64-LEAD LQFP
CASE 848G
THERMALLY ENHANCED
FA SUFFIX
Device
Package
Shipping
ORDERING INFORMATION
NB100LVEP224FA
LQFP-64
160 Units/Tray
NB100LVEP224FAR2 LQFP-64 1500/Tape & Reel
MARKING
DIAGRAM*
*For additional information, see Application Note
AND8002/D
A
= Assembly Location
WL
= Wafer Lot
YY
= Year
WW
= Work Week
NB100
LVEP224
AWLYYWW
64
1
64
1
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NB100LVEP224
http://onsemi.com
2
49
50
51
52
53
54
55
56
31
30
29
28
27
26
25
1
2
3
4
5
6
7
8
48
47
46
45
44
43
42
41
32
All V
CC
, V
CCO
, and V
EE
pins must be externally connected to appropriate Power Supply to guarantee proper operation. The thermally
conductive exposed pad on package bottom (see package case drawing) must be attached to a heat-sinking conduit, capable of transfer-
ring 1.2 Watts. This exposed pad is electrically connected to V
EE
internally.
FUNCTION TABLE
OE (1)
L
L
H
H
PIN DESCRIPTION
FUNCTION
ECL Differential Input Clock
ECL Differential Input Clock
ECL Input CLK Select
ECL Output Enable
ECL Differential Outputs
Positive Supply
Negative Supply
PIN
CLK0*, CLK0**
CLK1*, CLK1**
CLK_SEL*
OE*
Q0-Q23, Q0-Q23
V
CC
, V
CCO
V
EE
***
Figure 1. 64-Lead LQFP Pinout (Top View)
V
CCO
CLK0
CLK0
CLK_SEL
CLK1
CLK1
V
EE
OE
V
EE
V
EE
Q8
Q8
Q9
Q9
Q10
Q10
Q7
V
CCO
Q7
Q6
Q6
Q5
Q1
V
CCO
V
CCO
Q15
Q15
Q16
Q16
Q17
Q17
V
CCO
CLK_SEL
L
H
L
H
Q0-Q23
Q0-Q23
CLK0
CLK1
L
L
CLK0
CLK1
H
H
1. The OE (Output Enable) signal is synchronized with the
falling edge of the LVPECL_CLK signal.
NB100LVEP224
* Pins will default LOW when left open.
** Pins will default HIGH when left open.
*** The thermally conductive exposed pad on the bottom of the
package is electrically connected to V
EE
internally.
9
10
11
12
13
14
15
16
Q0
Q0
V
CC
Q23
Q23
V
CCO
Q22
Q22
Q18
Q18
Q19
Q19
Q20
Q20
Q21
Q21
23
22
21
20
19
18
17
24
40
39
38
37
36
35
34
33
57
58
59
60
61
62
63
64
Q1
1
Q1
1
Q12
Q12
Q13
Q13
Q14
Q14
Q5
Q4
Q4
Q3
Q3
Q2
Q2
Q1
NB100LVEP224
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3
0
1
Figure 2. Logic Diagram
CLK_SEL
CLK0
CLK0
CLK1
CLK1
OE
Q0-Q23
Q0-Q23
Q
D
24
24
V
CC
V
EE
ATTRIBUTES
Characteristics
Value
Internal Input Pulldown Resistor
75 k
W
Internal Input Pullup Resistor
37.5 k
W
ESD Protection
Human Body Model
Machine Model
Charged Device Model
> 2 kV
> 150 V
> 2 kV
Moisture Sensitivity (Note 1)
Level 3
Flammability Rating
Oxygen Index: 28 to 34
UL 94 V-0 @ 0.125 in
Transistor Count
654 Devices
Meets or exceeds JEDEC Spec EIA/JESD78 IC Latchup Test
1. For additional information, refer to Application Note AND8003/D.
MAXIMUM RATINGS
(Note 2)
Symbol
Parameter
Condition 1
Condition 2
Rating
Units
V
CC
PECL Mode Power Supply
V
EE
= 0 V
6
V
V
EE
NECL Mode Power Supply
V
CC
= 0 V
-6
V
V
I
PECL Mode Input Voltage
NECL Mode Input Voltage
V
EE
= 0 V
V
CC
= 0 V
V
I
V
CC
V
I
V
EE
6 to 0
-6 to 0
V
T
A
Operating Temperature Range
0 to +85
C
T
stg
Storage Temperature Range
-65 to +150
C
q
JA
Thermal Resistance (Junction-to-Ambient)
(See Application Information)
0 LFPM
500 LFPM
64 LQFP
64 LQFP
35.6
30
C/W
C/W
q
JC
Thermal Resistance (Junction-to-Case)
(See Application Information)
0 LFPM
500 LFPM
64 LQFP
64 LQFP
3.2
6.4
C/W
C/W
T
sol
Wave Solder
< 2 to 3 sec @ 248
C
265
C
2. Maximum Ratings are those values beyond which device damage may occur.
NB100LVEP224
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4
LVPECL DC CHARACTERISTICS
V
CC
= 2.5 V; V
EE
= 0 V (Note 3)
-40
C
25
C
85
C
Symbol
Characteristic
Min
Typ
Max
Min
Typ
Max
Min
Typ
Max
Unit
I
EE
Power Supply Current
130
160
195
135
165
200
140
165
205
mA
V
OH
Output HIGH Voltage (Note 8)
1355
1480
1605
1355
1480
1605
1355
1480
1605
mV
V
OL
Output LOW Voltage (Note 8)
555
680
900
555
680
900
555
680
900
mV
V
IH
Input HIGH Voltage (Single-Ended)
(Note 9)
1335
1620
1335
1620
1275
1620
mV
V
IL
Input LOW Voltage (Single-Ended)
(Note 9)
555
900
555
900
555
900
mV
V
IHCMR
Input HIGH Voltage Common Mode
Range (Differential) (Note 10)
CLK/CLK
1.2
2.5
1.2
2.5
1.2
2.5
V
I
IH
Input HIGH Current
150
150
150
m
A
I
IL
Input LOW Current
CLK
CLK
0.5
-150
0.5
-150
0.5
-150
m
A
NOTE:
100LVEP circuits are designed to meet the DC specifications shown in the above table, after thermal equilibrium has been
established. The circuit is in a test socket or mounted on a printed circuit board and transverse air flow greater than 500 lfpm is
maintained.
3. Input and output parameters vary 1:1 with V
CC
. V
EE
can vary + 0.125 V to -1.3 V.
4. All outputs loaded with 50
W
to V
CC
- 2.0 V.
5. Do not use V
BB
at VCC < 3.0 V.
6. V
IHCMR
min varies 1:1 with V
EE
, V
IHCMR
max varies 1:1 with V
CC
. The V
IHCMR
range is referenced to the most positive side of the differen-
tial input signal.
LVPECL DC CHARACTERISTICS
V
CC
= 3.3 V; V
EE
= 0 V (Note 7)
-40
C
25
C
85
C
Symbol
Characteristic
Min
Typ
Max
Min
Typ
Max
Min
Typ
Max
Unit
I
EE
Power Supply Current
140
165
195
145
175
205
145
175
210
mA
V
OH
Output HIGH Voltage (Note 8)
2155
2280
2405
2155
2280
2405
2155
2280
2405
mV
V
OL
Output LOW Voltage (Note 8)
1355
1480
1700
1355
1480
1700
1355
1480
1700
mV
V
IH
Input HIGH Voltage (Single-Ended)
(Note 9)
2135
2420
2135
2420
2135
2420
mV
V
IL
Input LOW Voltage (Single-Ended)
(Note 9)
1355
1700
1355
1700
1355
1700
mV
V
IHCMR
Input HIGH Voltage Common Mode
Range (Differential) (Note 10) (Figure
5)
1.2
3.3
1.2
3.3
1.2
3.3
V
I
IH
Input HIGH Current
150
150
150
m
A
I
IL
Input LOW Current
CLK
CLK
0.5
-150
0.5
-150
0.5
-150
m
A
NOTE:
100LVEP circuits are designed to meet the DC specifications shown in the above table, after thermal equilibrium has been established.
The circuit is in a test socket or mounted on a printed circuit board and transverse air flow greater than 500 lfpm is maintained.
7. Input and output parameters vary 1:1 with V
CC
. V
EE
can vary +0.925 V to -0.5 V.
8. All outputs loaded with 50
W
to V
CC
- 2.0 V.
9. Single ended input operation is limited V
CC
3.0 V in LVPECL mode.
10. V
IHCMR
min varies 1:1 with V
EE
, V
IHCMR
max varies 1:1 with V
CC
. The V
IHCMR
range is referenced to the most positive side of the differential
input signal.
NB100LVEP224
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5
NECL DC CHARACTERISTICS
V
CC
= 0 V, V
EE
= -2.375 V to -3.8 V (Note 11)
-40
C
25
C
85
C
Symbol
Characteristic
Min
Typ
Max
Min
Typ
Max
Min
Typ
Max
Unit
I
EE
Power Supply Current
V
EE
= -2.5 V
V
EE
= -3.3 V
130
140
160
165
195
195
135
145
165
175
200
205
140
145
165
175
205
210
mA
V
OH
Output HIGH Voltage (Note 12)
-1 145
-1020
-895
-1 145
-1020
-895
-1 145
-1020
-895
mV
V
OL
Output LOW Voltage (Note 12)
-1945
-1820
-1600
-1945
-1820
-1600
-1945
-1820
-1600
mV
V
IH
Input HIGH Voltage (Single-Ended)
(Note 13)
-1 165
-880
-1 165
-880
-1 165
-880
mV
V
IL
Input LOW Voltage (Single-Ended)
(Note 13)
-1945
-1600
-1945
-1600
-1945
-1600
mV
V
IHCMR
Input HIGH Voltage Common Mode
Range (Differential) (Note 14)
(Figure 5)
V
EE
+ 1.2
0.0
V
EE
+ 1.2
0.0
V
EE
+ 1.2
0.0
V
I
IH
Input HIGH Current
150
150
150
m
A
I
IL
Input LOW Current
CLK
CLK
0.5
-150
0.5
-150
0.5
-150
m
A
NOTE:
100LVEP circuits are designed to meet the DC specifications shown in the above table, after thermal equilibrium has been established.
The circuit is in a test socket or mounted on a printed circuit board and transverse air flow greater than 500 lfpm is maintained.
11. Input and output parameters vary 1:1 with V
CC
.
12. All outputs loaded with 50
W
to V
CC
- 2.0 V.
13. Single ended input operation is limited V
EE
-3.0 V in NECL mode.
14. V
IHCMR
min varies 1:1 with V
EE
, V
IHCMR
max varies 1:1 with V
CC
. The V
IHCMR
range is referenced to the most positive side of the differential
input signal.
AC CHARACTERISTICS
V
CC
= 2.375 V to 3.8 V; V
EE
= 0 V (Note 15)
-40
5
C
25
5
C
85
5
C
Symbol
Characteristic
Min
Typ
Max
Min
Typ
Max
Min
Typ
Max
Unit
V
Opp
Differential Output Voltage
(Figure 3)
f
out
< 50 MHz
f
out
< 0.8 GHz
f
out
< 1.0 GHz
600
600
600
750
750
700
600
600
525
725
725
650
575
550
400
700
650
525
mV
mV
mV
t
PLH
t
PHL
Propagation Delay (Differential)
CLKx-Qx
CLK_SELx-Qx
500
600
600
700
700
800
550
650
650
800
750
900
650
750
750
850
1000
1150
ps
ps
t
skew
Within-Device Skew (Note 16)
Device-to-Device Skew (Note 17)
20
50
40
300
20
50
40
300
35
100
60
300
ps
ps
t
JITTER
Random Clock Jitter (Figure 3) (RMS)
1
5
1
5
1
5
ps
V
PP
Input Swing (Differential) (Note 19) (Figure 5)
200
800
1200
200
800
1200
200
800
1200
mV
t
S
OE Set Up Time (Note 18)
200
200
200
ps
t
H
OE Hold Time
200
200
200
ps
t
r
/t
f
Output Rise/Fall Time
(20%-80%)
100
200
300
100
200
300
150
250
350
ps
15. Measured with PECL 750 mV source, 50% duty cycle clock source. All outputs loaded with 50
W
to V
CC
- 2 V.
16. Skew is measured between outputs under identical transitions and conditions on any one device.
17. Device-to-Device skew for identical transitions at identical V
CC
levels.
18. OE Set Up Time is defined with respect to the falling edge of the clock. OE High-to-Low transition ensures outputs remain disabled during
the next clock cycle. OE Low-to-High transition enables normal operation of the next input clock.
19. V
PP
is the differential input voltage swing required to maintain AC characteristics including t
PD
and device-to-device skew.
NB100LVEP224
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6
Figure 3. Output Amplitude (V
OPP
) versus Input Frequency and Random Clock Jitter (t
JITTER
)
INPUT FREQUENCY (GHz)
0.5 0.6
0.7
0.8
1.3
1.5
800
900
700
600
500
400
300
200
OUTPUT AMPLITUDE (mV)
9.0
8.0
7.0
6.0
5.0
4.0
3.0
2.0
1.0
0
10
RMS JITTER (ps)
Q AMP (mV)
RMS JITTER (ps)
1.0
0.9
1.4
1.2
1.1
2.5 V
3.3 V
Figure 4. Output Enable (OE) Timing Diagram
CLK
CLK
OE
Q
Q
Figure 5. LVPECL Differential Input Levels
V
IH
(DIFF)
V
IL
(DIFF)
V
EE
V
CC
(LVPECL)
V
IHCMR
V
PP
Resource Reference of Application Notes
AN1405
-
ECL Clock Distribution Techniques
AND8002
-
Marking and Date Codes
AND8009
-
ECLinPS Plus Spice I/O Model Kit
AND8020
-
Termination of ECL Logic Devices
For an updated list of Application Notes, please see our website at http://onsemi.com.
NB100LVEP224
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7
APPLICATIONS INFORMATION
Using the thermally enhanced package of the
NB100LVEP224
The NB100LVEP224 uses a thermally enhanced 64-lead
LQFP package. The package is molded so that a portion of
the leadframe is exposed at the surface of the package
bottom side. This exposed metal pad will provide the low
thermal impedance that supports the power consumption of
the NB100LVEP224 high-speed bipolar integrated circuit
and will ease the power management task for the system
design. In multilayer board designs, a thermal land pattern
on the printed circuit board and thermal vias are
recommended to maximize both the removal of heat from
the package and electrical performance of the
NB100LVEP224. The size of the land pattern can be larger,
smaller, or even take on a different shape than the exposed
pad on the package. However, the solderable area should be
at least the same size and shape as the exposed pad on the
package. Direct soldering of the exposed pad to the thermal
land will provide an efficient thermal conduit. The thermal
vias will connect the exposed pad of the package to internal
copper planes of the board. The number of vias, spacing, via
diameters and land pattern design depend on the application
and the amount of heat to be removed from the package.
Maximum thermal and electrical performance is achieved
when an array of vias is incorporated in the land pattern.
The recommended thermal land design for
NB100LVEP224 applications on multi-layer boards
comprises a 4 X 4 thermal via array using a 1.2 mm pitch as
shown in Figure 6 providing an efficient heat removal path.
Figure 6. Recommended Thermal Land Pattern
All Units mm
Thermal Via Array (4 X 4)
1.2 mm Pitch
0.3 mm Diameter
Exposed Pad
Land Pattern
4.6
4.6
The via diameter should be approximately 0.3 mm with
1 oz. copper via barrel plating. Solder wicking inside the via
may result in voiding during the solder process and must be
avoided. If the copper plating does not plug the vias, stencil
print solder paste onto the printed circuit pad. This will
supply enough solder paste to fill those vias and not starve
the solder joints. The attachment process for the exposed pad
package is equivalent to standard surface mount packages.
Figure 7, "Recommended solder mask openings", shows a
recommended solder mask opening with respect to a 4 X 4
thermal via array. Because a large solder mask opening may
result in a poor rework release, the opening should be
subdivided as shown in Figure 7. For the nominal package
standoff of 0.1 mm, a stencil thickness of 5 to 8 mils should
be considered.
Figure 7. Recommended Solder Mask Openings
All Units mm
Thermal Via Array (4 X 4)
1.2 mm Pitch
0.3 mm Diameter
Exposed Pad
Land Pattern
4.6
4.6
0.2
1.0
1.0
0.2
Proper thermal management is critical for reliable system
operation. This is especially true for high-fanout and high
output drive capability products.
For thermal system analysis and junction temperature
calculation the thermal resistance parameters of the package
is provided:
Table 1. Thermal Resistance *
LFPM
q
JA
5
C/W
q
JC
5
C/W
0
35.6
3.2
100
32.8
4.9
500
30.0
6.4
* Junction to ambient and Junction to board, four-conductor
layer test board (2S2P) per JESD 51-8
These recommendations are to be used as a guideline,
only. It is therefore recommended that users employ
sufficient thermal modeling analysis to assist in applying the
general recommendations to their particular application to
assure adequate thermal performance. The exposed pad of
the NB100LVEP224 package is electrically shorted to the
substrate of the integrated circuit and V
EE
. The thermal land
should be electrically connected to V
EE
.
NB100LVEP224
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8
PACKAGE DIMENSIONS
LQFP
FA SUFFIX
64-LEAD PACKAGE
CASE 848G-02
ISSUE A
-Y-
NOTES:
1. DIMENSIONING AND TOLERANCING PER ANSI
Y14.5M, 1982.
2. CONTROLLING DIMENSION: MM.
3. DATUM PLANE E" IS LOCATED AT BOTTOM OF
LEAD AND IS COINCIDENT WITH THE LEAD
WHERE THE LEAD EXITS THE PLASTIC BODY AT
THE BOTTOM OF THE PARTING PLANE.
4. DATUM X", Y" AND Z" TO BE DETERMINED AT
DATUM PLANE DATUM E".
5. DIMENSIONS M AND L TO BE DETERMINED AT
SEATING PLANE DATUM T".
6. DIMENSIONS A AND B DO NOT INCLUDE MOLD
PROTRUSION. ALLOWABLE PROTRUSION IS 0.25
(0.010) PER SIDE. DIMENSIONS A AND B DO
INCLUDE MOLD MISMATCH AND ARE
DETERMINED AT DATUM PLAND E".
7. DIMENSION D DOES NOT INCLUDE DAMBAR
PROTRUSION. ALLOWABLE DAMBAR
PROTRUSION SHALL NOT CAUSE THE LEAD
WIDTH TO EXCEED THE MAXIMUM D DIMENSION
BY MORE THAN 0.08 (0.003). DAMBAR CANNOT
BE LOCATED ON THE LOWER RADIUS OR THE
FOOT. MINIMUM SPACE BETWEEN PROTRUSION
AND ADJACENT LEAD OR PROTRUSION 0.07
(0.003).
8. EXACT SHAPE OF EACH CORNER IS OPTIONAL.
DIM
A
MIN
MAX
MIN
MAX
INCHES
10.00 BSC
0.394 BSC
MILLIMETERS
B
10.00 BSC
0.394 BSC
C
1.35
1.45
0.053
0.057
D
0.17
0.27
0.007
0.011
F
0.45
0.75
0.018
0.030
G
0.50 BSC
0.020 BSC
H
1.00 REF
0.039 BSC
J
0.09
0.20
0.004
0.008
K
0.05
0.15
0.002
0.006
L
12.00 BSC
0.472 BSC
M
12.00 BSC
0.472 BSC
N
0.20 0.008
P
0
7
0
7
R
0
---
0
---
S
---
1.60
---
0.063
V
W
AA
0.17
0.23
0.007
0.009
AB
0.09
0.16
0.004
0.006
AC
0.08
---
0.003
---
AD
0.08
---
0.003
---
AE
4.50
4.78
0.180
0.188
0.05 (0.002)
S
1
B
B/2
16
17
32
33
48
49
64
-X-
L
L/2
-Z-
M
M/2
A
A/2
AJ
AJ
Z
0.20 (0.008) T X-Y
4 PL
Z
0.20 (0.008) E X-Y
-T-
SEATING
PLANE
G/2
G
4 PL
AG
AG
D
64 PL
Z
0.08 (0.003)
M
T X-Y
-E-
0.08 (0.003) T
EXPOSED PAD
VIEW AG-AG
DETAIL AH
DETAIL AH
_
_
_
_
_
_
AA
D
AB
J
DETAIL AJ-AJ
REF
BASE
METAL
PLATING
Z
0.08 (0.003)
M
Y T-U
S
C
K
V
R
W
N
F
H
P
AC
0.25
GAGE
PLANE
60 PL
1
16
17
32
33
48
49
64
AD
---
---
11
13
11
13
_
_
_
_
11
13
11
13
_
_
_
_
AF
4.50
4.78
0.180
0.188
AE
AF
NB100LVEP224
http://onsemi.com
9
Notes
NB100LVEP224
http://onsemi.com
10
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