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Электронный компонент: UNA0232

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Small Signal Transistor Arrays
1
Publication date: April 2003
SJK00051BED
UNA0232
Silicon NPN epitaxial planar transistor
For motor drives
For small motor drive circuits in general
Features
Small and lightweight
Low power consumption
Low-voltage drive
With 4 elements incorporated
Absolute Maximum Ratings T
a
= 25C
Marking Symbol: UN232
Internal Connection
Unit: mm
1: Emitter
4: Base
8: Base
2: Collector
5: Collector
9: Collector
Emitter
6: Collector
Emitter
3: Base
7: Base
10: Emitter
SO10-G1 Package
Note) *: When the dissipation on one device is T
C
= 25C
12
45
0.2
+0.1
0.0
0.5
0.5
0.2
6
7
8
9
10
5
4
3
2
1
0.4
0.1
1.5
0.1
1.5
+0.2 0.1
0.8
12
0.9
0.1
5.5
0.3
7.7
0.3
6.5
0.3
9
10
Q2
Q4
Q1
Q3
8
8
6
5
4
3
2
1
Parameter
Symbol
Rating
Unit
Collector-base voltage (Emitter open)
V
CBO
12
V
Collector-emitter voltage (Base open)
V
CEO
10
V
Emitter-base voltage (Collector open)
V
EBO
7
V
Collector current
I
C
1
A
Peak collector current
I
CP
2
A
Total power dissipation
*
P
T
0.5
W
Junction temperature
T
j
150
C
Storage temperature
T
stg
-55 to +150
C
UNA0232
2
SJK00051BED
Electrical Characteristics T
a
= 25C 3C
Q1, Q2
Q3, Q4
Parameter
Symbol
Conditions
Min
Typ
Max
Unit
Collector-base voltage (Emitter open)
V
CBO
I
C
= 10 A, I
E
= 0
12
V
Collector-emitter voltage (Base open)
V
CEO
I
C
= 0.1 mA, I
B
= 0
10
V
Collector-base cutoff current (Emitter open)
I
CBO
V
CB
= 10 V, I
E
= 0
1
A
Emitter-base cutoff current (Collector open)
I
EBO
V
EB
= 5 V, I
C
= 0
0.8
1.6
mA
Forward current transfer ratio
*1
h
FE
V
CE
= 1 V, I
C
= 0.5 A
200
700
Collector-emitter saturation voltage
*1
V
CE(sat)
I
C
= 0.5 A, I
B
= 25 mA
0.10
0.15
V
Base-emitter resistance
*2
R
BE
3.3
4.7
6.1
k
Forward voltage
*1, 3
V
F
I
F
= 1 A
1.5
V
Parameter
Symbol
Conditions
Min
Typ
Max
Unit
Collector-base voltage (Emitter open)
V
CBO
I
C
= 10 A, I
E
= 0
12
V
Collector-emitter voltage (Base open)
V
CEO
I
C
= 0.1 mA, I
B
= 0
10
V
Emitter-base voltage (Collector open)
V
EBO
I
E
= 10 A, I
C
= 0
7
V
Collector-base cutoff current (Emitter open)
I
CBO
V
CB
= 10 V, I
E
= 0
1
A
Forward current transfer ratio
*1
h
FE
V
CE
= 1 V, I
C
= 0.5 A
200
700
Collector-emitter saturation voltage
*1
V
CE(sat)
I
C
= 0.5 A, I
B
= 25 mA
0.10
0.15
V
Forward voltage
*1, 3
V
F
I
F
= 1 A
1.5
V
Note) 1. Measuring methods are based on JAPANESE INDUSTRIAL STANDARD JIS C 7030 measuring methods for transistors.
2. *1: Pulse measurement
*2: Application to the built-in resistance
*3: Application to the built-in diode
Request for your special attention and precautions in using the technical information
and semiconductors described in this material
(1) An export permit needs to be obtained from the competent authorities of the Japanese Government
if any of the products or technologies described in this material and controlled under the "Foreign
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product or technologies as described in this material.
(4) The products described in this material are intended to be used for standard applications or general
electronic equipment (such as office equipment, communications equipment, measuring instru-
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Consult our sales staff in advance for information on the following applications:
Special applications (such as for airplanes, aerospace, automobiles, traffic control equipment,
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Any applications other than the standard applications intended.
(5) The products and product specifications described in this material are subject to change without
notice for modification and/or improvement. At the final stage of your design, purchasing, or use of
the products, therefore, ask for the most up-to-date Product Standards in advance to make sure that
the latest specifications satisfy your requirements.
(6) When designing your equipment, comply with the guaranteed values, in particular those of maxi-
mum rating, the range of operating power supply voltage, and heat radiation characteristics. Other-
wise, we will not be liable for any defect which may arise later in your equipment.
Even when the products are used within the guaranteed values, take into the consideration of
incidence of break down and failure mode, possible to occur to semiconductor products. Measures
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2002 JUL