Philips Semiconductors

Product specification

ABT22V10A5, A7

5V high-speed universal PLD device
with live insertion capability

1996 Dec 16

8531795 17606

DESCRIPTION

The ABT22V10A is a versatile PAL

device fabricated on Philips

BiCMOS process known as QUBiC.

The QUBiC process produces very high speed, 5 volt devices
(5.0ns) which have excellent noise immunity. The ground bounce of
an output held low while the 9 remaining outputs are switching is
less than 1.0V (typical).

The ABT22V10A outputs are designed to support Live
Insertion/Extraction into powered-up systems. The output is
specially designed so that during V

ramp, the output remains

3-Stated until V

2.1V. At that time, the outputs become fully

functional, depending upon device inputs. (See DC Electrical
Characteristics, Symbol I

PU/PD

, Page 4).

The ABT family of devices have virtually no ground bounce-- less
than 1.0 volts V

OLP

, measured on an unswitched output (9 remaining

outputs switching, each with a 50pF load tied to ground).

The ABT family of devices has been designed with high drive
outputs (48mA sink and 16mA source currents), which allow for
direct connection to a backplane bus. This feature eliminates the
need for additional, standalone bus drivers, which are traditionally
required to boost the drive of a standard 16/4mA PLDs.

Philips has developed a new means of testing the integrity of fuses,
both blown and intact fuses, which insures that all the fuses have
been correctly programmed and that each and every fuse--whether
"blown" or "intact"--is at the appropriate and optimal fuse resistance.
This dual verify scheme represents a significant improvement over
single reference voltage comparison schemes that have been used
for bipolar devices since the late 1980's.

The ABT22V10A uses the familiar AND/OR logic array structure,
which allows direct implementation of sum-of-products equations.

This device has a programmable AND array, which drives a fixed
OR array. The OR sum-of-products feeds an "Output Macro Cell"
(OMC) that can be individually configured as a dedicated input, a
combinatorial output, or a registered output with internal feedback.

FEATURES

Fastest 5V 22V10

Low ground bounce (<1.0V typical)

Live insertion/extraction permitted

High output drive capability: 48mA/16mA

Varied product term distribution with up to 16 product terms per
output for complex functions

Metastable hardened flip-flops

Programmable output polarity

Design support provided for third party CAD development and
programming hardware

Improved fuse verification circuitry increases reliability

PIN CONFIGURATIONS

VCC

GND

A Package

GND

CLK/

GND

I10 GND

I11

A = Plastic Leaded Chip Carrier

VCC

SP00367

PIN LABEL DESCRIPTIONS

SYMBOL

FUNCTION

I1 I11

Dedicated Input

F0 F9

Macro Cell Input/Output

CLK/I0

Clock Input/Dedicated Input

Supply Voltage

GND

Ground

ORDERING INFORMATION

DESCRIPTION

ORDER CODE

DRAWING NUMBER

28-Pin Plastic Leaded Chip Carrier

ABT22V10A5A

(5ns device)

SOT261-3

28-Pin Plastic Leaded Chip Carrier

ABT22V10A7A

(7.5ns device)

SOT261-3

PAL is a registered trademark of Advanced Micro Devices, Inc.

Philips Semiconductors

Product specification

ABT22V10A5, A7

5V high-speed universal PLD device
with live insertion capability

1996 Dec 16

ABSOLUTE MAXIMUM RATINGS

SYMBOL

PARAMETER

RATINGS

UNIT

SYMBOL

PARAMETER

MIN

MAX

UNIT

Supply voltage

0.5

+7.0

Input voltage

1.2

+ 0.5

OUT

Output voltage

0.5

+ 0.5

Input currents

+30

OUT

Output currents

+100

stg

Storage temperature range

+150

NOTES:
1. Stresses above those listed may cause malfunction or permanent damage to the device. This is a stress rating only. Functional operation at

these or any other condition above those indicated in the operational and programming specification of the device is not implied.

2. Except in programming mode.

OPERATING RANGES

SYMBOL

PARAMETER

RATINGS

UNIT

SYMBOL

PARAMETER

MIN

MAX

UNIT

Supply voltage

+4.75

+5.25

amb

Operating free-air temperature

+75

THERMAL RATINGS

TEMPERATURE

Maximum junction

150

Maximum ambient

Allowable thermal rise ambient to junction

VOLTAGE WAVEFORM

90%

10%

1.5ns

+3.0V

MEASUREMENTS:
All circuit delays are measured at the +1.5V level of
inputs and outputs, unless otherwise specified.

Input Pulses

SP00368

TEST LOAD CIRCUIT

+5V

NOTE:
C

and C

are to bypass V

to GND.

GND

DUT

INPUTS

SP00369

Philips Semiconductors

Product specification

ABT22V10A5, A7

5V high-speed universal PLD device
with live insertion capability

1996 Dec 16

DC ELECTRICAL CHARACTERISTICS

Over operating ranges.

SYMBOL

PARAMETER

TEST CONDITIONS

LIMITS

UNIT

SYMBOL

PARAMETER

TEST CONDITIONS

MIN

MAX

UNIT

Input voltage

Low

= MIN

0.8

High

= MAX

2.0

Clamp

= MIN, I

= 18mA

1.2

Output voltage

High-level output voltage

= MIN

= V

or V

= 32mA

2.0

High-level output voltage

= MIN

= V

or V

= 16mA

2.4

Low-level output voltage

= MIN

= V

or V

= 48mA

0.5

Input current

Low

= MAX, V

= 0.4V

High

= MAX, V

= 2.7V

Max input current

= MAX, V

= 5.5V

Output current

PU/PD

Power-up/down 3-State
output current

<2.1V; V

= 0.5V to V

;

= GND or V

; OE/OE = X

= MAX

OZH

Output leakage

= V

or V

, V

OUT

= 2.7V

OZL

Output leakage

= V

or V

, V

OUT

=0.4V

Short circuit

OUT

= 0.5V

220

supply current

= MAX, Outputs enabled, V

= V

or GND; I

= 0

200

Ground Bounce

TYP

MAX

UNIT

OLP

Minimum dynamic V

= MAX, 25

= 50pF (including jig capacitance)

1.0

1.2

NOTES:
1. These are absolute values with respect to device ground and all overshoots due to system or tester noise are included.
2. I/O pin leakage is the worst case of I

OZX

or I

(where X = H or L).

3. No more than one output should be tested at a time. Duration of the short-circuit test should not exceed one second. V

OUT

= 0.5V has been

chosen to avoid test problems caused by tester ground degradation.

4. This parameter is valid for any V

between 0V and 1.2 V with a transition time up to 10 mS. From V

= 1.2 to V

= 5.0V

0.25V a

transition time of 100

S is permitted. X = Don't care.

5. Guaranteed by design, but not tested. Measured holding one output (the output under test) Low and simultaneously switching all remianing

output from a High to a Low state. Switch S1 is closed; 50pF load.

Philips Semiconductors

Product specification

ABT22V10A5, A7

5V high-speed universal PLD device
with live insertion capability

1996 Dec 16

AC ELECTRICAL CHARACTERISTICS

4.75V

5.25V; 0

amb

+75

SYMBOL

PARAMETER

TEST

CONDITIONS

LIMITS

UNIT

SYMBOL

PARAMETER

TEST

CONDITIONS

ABT22V10A5

ABT22V10A7

UNIT

CONDITIONS

MIN

TYP

MAX

MIN

TYP

MAX

Input or feedback to
non-registered output

Active-LOW

2.0

4.5

5.0

2.0

6.0

7.5

Input or feedback to
non-registered output

Active-HIGH

2.0

4.5

5.0

2.0

6.0

7.5

Setup time from input or SP
to Clock

2.0

1.3

3.5

3.0

SIO

Setup time from feedback
to Clock

2.25

1.5

3.5

3.0

Hold time

SKEWR

Skew between registered
outputs

4, 7

1.0

Clock to output

2.0

3.5

4.0

2.0

4.5

5.5

Clock to feedback

2.0

4.0

3.0

5.0

Asynchronous Reset to
registered output

10.0

ARW

Asynchronous Reset width

6.0

7.5

ARR

Asynchronous Reset
recovery time

4.0

5.5

SPR

Synchronous Preset
recovery time

4.5

5.0

Width of Clock LOW

2.0

3.0

Width of Clock HIGH

2.0

3.0

MAX

Maximum frequency;
External feedback
1/(t

+ t

)

167

208

111

133

MHz

MAX

Maximum frequency;
Internal feedback
1/(t

+ t

)

167

303

125

166

MHz

Input to Output Enable

8.0

Input to Output Disable

7.5

Capacitance

Input Capacitance (Pin 2)

= 2.0V

= 5.0V

amb

= 25

f = 1MHz

Input Capacitance (Others)

= 2.0V

= 5.0V

amb

= 25

f = 1MHz

OUT

Output Capacitance

OUT

= 2.0V

f = 1MHz

NOTES:
1. Test Conditions: R

= 300

, R

=390

2. t

is tested with switch S

closed and C

= 50pF (including jig capacitance). V

= 3V, V

= 0V, V

= 1.5V.

3. Calculated from measured f

MAX

internal.

4. These parameters are not 100% tested, but are calculated at initial characterization and at any time the design is modified where frequency

may be affected.

5. For 3-State output; output enable times are tested with C

= 50pF to the 1.5V level, and S

is open for high-impedance to High tests and

closed for high-impedance to Low tests. Output disable times are tested with C

L =

5pF. High-to-High impedance tests are made to an output

voltage of V

= (V

0.5V) with S

open, and Low-to-High impedance tests are made to the V

= (V

+ 0.5V) level with S

closed.

6. These parameters are not 100% tested, but are evaluated at initial characterization and at any time the design is modified where

capacitance may be affected.

7. Skew is measured with all outputs switching in the same direction.

Philips Semiconductors

Product specification

ABT22V10A5, A7

5V high-speed universal PLD device
with live insertion capability

1996 Dec 16

PRODUCT FEATURES

Low Ground Bounce

The Philips Semiconductors BiCMOS QUBiC process produces
exceptional noise immunity. The typical ground bounce, with 9
outputs simultaneously switching and the 10th output held low, is
less than 1.0V. V

OLP

is tested by holding one output (the output

uncer test) in the Low state and then simultaneously switching all
remaining outputs from a High to a Low state (each output is loaded
with 50pF). The maximum peak voltage on the output under test is
guaranteed to be less than 1.2 Volts.

Live Insertion/Extraction Capability

There are some inherent problems associated with inserting or
extracting an unpowered module from a powered-up, active system.
The ABT22V10A outputs have been designed such that any chance
of bus contention, glitching or clamping is eliminated.

Detailed information on this feature is provided in an application note
AN051:

Philips PLDs Support Live Insertion Applications.

Improved Fuse Verification Circuitry Increases
Reliability

Philips has developed a new means of testing the integrity of fuses,
both blown and intact fuses, which insures that all the fuses have
been correctly programmed and that each and every fuse whether
"blown" or "intact" is at the appropriate and optimal fuse
resistance. This dual verify scheme represents a significant
improvement over single reference voltage comparisons schemes
that have been used for bipolar devices since the late 1980s.
Detailed information on this feature is provided in an application note
entitled

Dual Verify Technique Increases Reliability of PLDs.

Programmable 3-stage Outputs

Each output has a 3-Stage output buffer with 3-State control. A
product term controls the buffer, allowing enable and disable to be a
function of any product of device inputs or output feedback. The
combinatorial output provides a bidirectional I/O pin, and may be
configured as a dedicated input if the buffer is always disabled.

Programmable Output Polarity

The polarity of each macro cell output can be Active-HIGH or
Active-LOW, either to match output signal needs or to reduce
product terms. Programmable polarity allows Boolean expressions
to be written in their most compact form (true or inverted), and the
output can still be of the desired polarity. It can also save
"DeMorganizing" efforts.

Selection is controlled by programmable bit S

in the Output Macro

Cell, and affects both registered and combinatorial outputs.
Selection is automatic, based on the design specification and pin
definitions. If the pin definition and output equation have the same
polarity, the output is programmed to be Active-HIGH (S

= 1).

Preset/Reset

For initialization, the ABT22V10A has additional Preset and Reset
product terms. These terms are connected to all registered outputs.
When the Synchronous Preset (SP) product term is asserted high,
the output registers will be loaded with a HIGH on the next
LOW-to-HIGH clock transition. When the Asynchronous Reset (AR)
product term is asserted high, the output registers will be
immediately loaded with a LOW, independent of the clock.

Note that Preset and Reset control the flip-flop, not the output pin.
The output level is determined by the output polarity selected.

Power-Up Reset

All flip-flops power-up to a logic LOW for predictable system
initialization. Outputs of the ABT22V10A will depend on the
programmed output polarity. The V

rise must be monotonic and

the reset delay time is 110

s maximum.

Security Fuse

After programming and verification, ABT22V10A designs can be
secured by programming the security fuse link. Once programmed,
this fuse defeats readback of the internal programmed pattern by a
device programmer, securing proprietary designs from competitors.
When the security fuse is programmed, the array will read as if
every fuse is programmed.

Quality and Testability

The ABT22V10A offers a very high level of built-in quality. Extra
programmable fuses provide a means of verifying performance of all
AC and DC parameters. In addition, this verifies programmability
and functionality of the device to provide the highest programming
and post-programming functional yields.

Technology

The BiCMOS ABT22V10A is fabricated with the Philips
Semiconductors process known as QUBiC. QUBiC combines an
advanced, state-of-the-art 1.0

m (drawn feature size) CMOS

process with an ultra fast bipolar process to achieve superior speed
and drive capabilities. QUBiC incorporates three layers of Al/Cu
interconnects for reduced chip size, and our proven Ti-W fuse
technology ensures highest programming yields.

Programming

The ABT22V10A is fully supported by industry standard (JEDEC
compatible) PLD CAD tools, including Philips Semiconductors
SNAP design software package. ABEL

CUPL

and PALASM

design software packages also support the ABT22V10A
architecture.

All packages allow Boolean and state equation entry formats, SNAP,
ABEL and CUPL also accept, as input, schematic capture format.

Output Register Preload

The register on the ABT22V10A can be preloaded from the output
pins to facilitate functional testing of complex state machine designs.
This feature allows direct loading of arbitrary states, making it
unnecessary to cycle through long test vector sequences to reach a
desired state. In addition, transitions from illegal states can be
verified by loading illegal states and observing proper recovery. The
procedure for preloading follows:
1. Raise V

to 5.0V

0.25V.

2. Set pin 2 or 3 to V

to disable outputs and enable preload.

3. Apply the desired value (V

ILP

IHP

) to all registered output pins.

Leave combinatorial output pins floating.

4. Clock Pin 1 from V

ILP

to V

IHP

5. Remove V

ILP

IHP

from all registered output pins.

6. Lower pin 2 or 3 to V

ILP

7. Enable the output registers according to the programmed

pattern.

8. Verify V

at all registered output pins. Note that the output

pin signal will depend on the output polarity.

ABEL is a trademark of Data I/O Corp.
CUPL is a trademark of Logical Devices, Inc.
PALASM is a registered trademark of AMD Corp.

Philips Semiconductors

Product specification

ABT22V10A5, A7

5V high-speed universal PLD device
with live insertion capability

1996 Dec 16

Metastable Characteristics

Philips provides complete data on the ABT22V10A5's metastable
characteristics. While the ABT22V10A5 does not employ Philips
patented metastable immune flip-flop, its metastabel characteristics
are still quite favorable relative to competitive devices. For
information on metastable immune PLDs, refer to the datasheets for
the ABT22V10-7 for 5V applications or the LVT22V10-7 for 3.3V
designs.

Design Example

Suppose a designer wants to use the ABT22V10A5 for
synchronizing asynchronous data that is arriving at 10MHz (as
measured by a frequency counter), in a 5V system that has a clock
frequency of 50MHz, at an ambient temperature of 25

C. The next

device in the sytem samples the output fo the ABT22V10A5 5.5ns
after the clock edge to ensure that any metastable conditions that
occur have time to resolve to the correct state. The MTBF for this
situatio can be calcuclated by using the equation below:

MTBF = e(t /

)/T

In this formula, F

is the frequency of the clock, F

is the average

input event frequency, and t is the time after the clock pulse that the
output is sampled (t > T

). T

and

are device parameters

provided by the semiconductor manufacturer (refer to Table 1 for the
ABT22V10A5 metastability specifications). T

and

are derived

from tests and can be most nearly be defined as follows:

is a

function of the rate at which a latch in a metastable state resolves
that condition. T

is a function of the measurement of the propensity

of a latch to enter a metastable state. T

is also a normalization

constant which is a very strong function of the normal propagation
dely of the device.

In this situation, the F

will be twice that data frequency, or 20MHz,

because input events consist of both low and high transitions. Thus
in this case F

is 50MHz, F

is 20MHz,

is 85.6ps, t is 5.5ns, and

is 4.55 seconds. Using the above formula, the actual MTBF for

this situation is 1.76

seconds, or 55,889 years for the

ABT22V10A5.

Table 1. Typical Values for

and T

at various V

's and Temperatures

+25

+75

5.25V

72.00ps

7.20E+01

96.70ps

4.59E01

105.00ps

1.43E01

5.00V

72.80ps

2.06E+02

85.60ps

4.55E+00

100.00ps

8.37E01

4.75V

68.70ps

9.97E+03

81.70ps

4.85E+01

99.80ps

1.29E+00

Philips Semiconductors

Product specification

ABT22V10A5, A7

5V high-speed universal PLD device
with live insertion capability

1996 Dec 16

FUNCTIONAL DIAGRAM

OUTPUT

MACRO

CELL

CLK/I0

I1 I11

RESET

PRESET

PROGRAMMABLE AND ARRAY

(44

132)

SP00060

OUTPUT

MACRO

CELL

OUTPUT

MACRO

CELL

OUTPUT

MACRO

CELL

OUTPUT

MACRO

CELL

OUTPUT

MACRO

CELL

OUTPUT

MACRO

CELL

OUTPUT

MACRO

CELL

OUTPUT

MACRO

CELL

OUTPUT

MACRO

CELL

Figure 1. Functional Diagram

FUNCTIONAL DESCRIPTION

The ABT22V10A allows the systems engineer to implement the
design on-chip, by opening fuse links to configure AND and OR
gates within the device, according to the desired logic function.

Product terms with all fuses opened assume the logical HIGH state;
product terms connected to both True and Complement of any
single input assume the logical LOW state.

The ABT22V10A has 12 inputs and 10 I/O Macro Cells (Figure 1).
The Macro Cell allows one of four potential output configurations,

registered output or combinatorial I/O, Active-HIGH or Active-LOW
(see Figure 2). The configuration choice is made according to the
user's design specification and corresponding programming of the
configuration bits S

. Multiplexer controls are connected to

ground (0) through a programmable fuse link, selecting the "0" path
through the multiplexer. Programming the fuse disconnects the
control line from GND and it floats to V

(1), selecting the "1" path.

Philips Semiconductors

Product specification

ABT22V10A5, A7

5V high-speed universal PLD device
with live insertion capability

1996 Dec 16

OUTPUT MACRO CELL

CLK

OUTPUT CONFIGURATION

0 = Unprogrammed fuse
1 = Programmed fuse

Registered/Active-LOW

Registered/Active-HIGH

Combinatorial/Active-LOW

Combinatorial/Active-HIGH

SP00375

Figure 2. Output Macro Cell Logic Diagram

CLK

S0 = 0
S1 = 0

a. Registered/Active-LOW

CLK

S0 = 1
S1 = 0

b. Registered/Active-HIGH

S0 = 0
S1 = 1

c. Combinatorial/Active-LOW

d. Combinatorial/Active-HIGH

S0 = 1
S1 = 1

SP00376

Figure 3. Output Macro Cell Configurations

Registered Output Configuration

Each Macro Cell of the ABT22V10A includes a D-type flip-flop for
data storage and synchronization. The flip-flop is loaded on the
LOW-to-HIGH transition of the clock input. In the registered
configuration (S

= 0), the array feedback is from Q of the flip-flop.

Combinatorial I/O Configuration

Any Macro Cell can be configured as combinatorial by selecting the
multiplexer path that bypasses the flip-flop (S

= 1). In the

combinatorial configuration, the feedback is from the pin.

Variable Input/Output Pin Ratio

The ABT22V10A has twelve dedicated input lines, and each Macro
Cell output can be an I/O pin. Buffers for device inputs have
complementary outputs to provide user-programmable input signal
polarity.

Philips Semiconductors

Product specification

ABT22V10A5, A7

5V high-speed universal PLD device
with live insertion capability

1996 Dec 16

POWER-UP RESET

The power-up reset feature ensures that all flip-flops will be reset to
LOW after the device has been powered up. The output state will
depend on the programmed pattern. This feature is valuable in
simplifying state machine initialization. A timing diagram and
parameter table are shown below. Due to the synchronous operation

of the power-up reset and the wide range of ways V

can rise to its

steady state, two conditions are required to ensure a valid power-up
reset. These conditions are:
1. The V

rise must be monotonic.

2. Following reset, the clock input must not be driven from LOW to

HIGH until all applicable input and feedback setup times are met.

SYMBOL

PARAMETER

LIMITS

UNIT

SYMBOL

PARAMETER

MIN

MAX

UNIT

Power-up Reset Time

Input or Feedback Setup Time

See AC Electrical Characteristics

Clock Width LOW

See AC Electrical Characteristics

tWL

Power-Up Reset Waveform

VCC

tPR

POWER

REGISTERED

ACTIVE-LOW

OUTPUT

CLOCK

SP00066

OTHER PHILIPS 22V10 DEVICES

Philips offers a complete family of 22V10 devices, addressing a wide
variety of design applications. This Features Matrix summarizes the
basic features of each specific device.

PHILIPS 22V10 FEATURES MATRIX

PL22V10-10/-15

LVT22V10-7

ABT22V10-7

ABT22V10A5

ABT22V10A7

Operating supply voltage

+4.75 to +5.25V

+3.0 to +3.6V

+4.75 to +5.25V

Live Insertion

Yes

Dual Verify

Yes

Metastability

Hardened

Immune

Source Drive Capability

4mA

= 2.4V)

16mA

= 2.0V)

16mA

= 2.4V)

16mA

= 2.4V)

16mA

= 2.4V)

Sink Drive Capability

16mA

= 0.5V)

32mA

= 0.5V)

48mA

= 0.5V)

48mA

= 0.5V)

48mA

= 0.5V)

Low Ground Bounce

Yes

Package Availability:

Plastic Dual In-Line (N)

24-Pin

not available

Plastic Leaded Chip Carrier (A)

24-Pin

28-Pin

Plastic Small Outline Large (D)

24-Pin

not available

NOTE:
1. 5 volt compatible I/O. Inputs are capable of handling 7V and the outputs can also be pulled up to 7 volts.

Philips Semiconductors

Product specification

ABT22V10A5, A7

5V high-speed universal PLD device
with live insertion capability

1996 Dec 16

ABT22V10A5 TIMING CHARACTERIZATION

Normalized t

vs Temperature

= 5.0V, output capacitance = 50pF, 5 outputs switching)

Normalized t

vs Temperature

= 5.0V, output capacitance = 50pF, 5 outputs switching)

Normalized tCO vs VCC
(temp = 25

C, output capacitance = 50pF, 5 outputs switching)

Temperature (

Supply Voltage (V)

Normalized t

1.10

1.05

1.00

0.95

0.90

RISE

FALL

Normalized tPD vs VCC
(temp = 25

C, output capacitance = 50pF, 5 outputs switching)

The timing characterization represents the average values of a representative sample for each parameter.
The data can be used to derate the MAX AC CHARACTERIZATION based upon the specific user design.
Philips guarantees the MAX AC CHARACTERIZATION specifications.

4.5

4.6

4.7

4.8

4.9

5.0

5.1

5.2

5.3

5.4

5.5

SP00370

1.10

1.00

0.90

0.80

1.10

1.00

0.90

0.80

1.10

1.05

1.00

0.95

0.90

4.5

4.6

4.7

4.8

4.9

5.0

5.1

5.2

5.3

5.4

5.5

RISE

FALL

RISE

FALL

RISE

FALL

Philips Semiconductors

Product specification

ABT22V10A5, A7

5V high-speed universal PLD device
with live insertion capability

1996 Dec 16

ABT22V10A5 TIMING CHARACTERIZATION

Delta t

vs Number of Outputs Switching

= 5.0V, temp = 25

C, output capacitance = 50pF)

Delta t

vs Number of Outputs Switching

= 5.0V, temp = 25

C, output capacitance = 50pF)

Delta t

vs Output Capacitance

= 5.0V, temp = 25

C, 5 Outputs Switching)

Delta t

vs Output Capacitance

= 5.0V, temp = 25

C, 5 Outputs Switching)

0.20

0.0

0.40

0.80

1.00

1.40

1.80

Number of Outputs Switching

Output Capacitance

Delta t (ns)

SP00371

0.20

0.60

RISE

FALL

1.20

1.60

0.20

0.0

0.40

0.80

1.00

1.40

1.80

0.20

0.60

1.20

1.60

RISE

FALL

100

200

400

3.50

2.50

0.50

1.50

4.50

1.50

0.50

100

200

400

3.50

2.50

0.50

1.50

4.50

1.50

0.50

RISE

FALL

RISE

FALL

Philips Semiconductors

Product specification

ABT22V10A5, A7

5V high-speed universal PLD device
with live insertion capability

1996 Dec 16

Philips Semiconductors and Philips Electronics North America Corporation reserve the right to make changes, without notice, in the products,
including circuits, standard cells, and/or software, described or contained herein in order to improve design and/or performance. Philips
Semiconductors assumes no responsibility or liability for the use of any of these products, conveys no license or title under any patent, copyright,
or mask work right to these products, and makes no representations or warranties that these products are free from patent, copyright, or mask
work right infringement, unless otherwise specified. Applications that are described herein for any of these products are for illustrative purposes
only. Philips Semiconductors makes no representation or warranty that such applications will be suitable for the specified use without further testing
or modification.

LIFE SUPPORT APPLICATIONS
Philips Semiconductors and Philips Electronics North America Corporation Products are not designed for use in life support appliances, devices,
or systems where malfunction of a Philips Semiconductors and Philips Electronics North America Corporation Product can reasonably be expected
to result in a personal injury. Philips Semiconductors and Philips Electronics North America Corporation customers using or selling Philips
Semiconductors and Philips Electronics North America Corporation Products for use in such applications do so at their own risk and agree to fully
indemnify Philips Semiconductors and Philips Electronics North America Corporation for any damages resulting from such improper use or sale.

This data sheet contains preliminary data, and supplementary data will be published at a later date. Philips
Semiconductors reserves the right to make changes at any time without notice in order to improve design
and supply the best possible product.

Philips Semiconductors
811 East Arques Avenue
P.O. Box 3409
Sunnyvale, California 940883409
Telephone 800-234-7381

DEFINITIONS

Data Sheet Identification

Product Status

Definition

Objective Specification

Preliminary Specification

Product Specification

Formative or in Design

Preproduction Product

Full Production

This data sheet contains the design target or goal specifications for product development. Specifications
may change in any manner without notice.

This data sheet contains Final Specifications. Philips Semiconductors reserves the right to make changes
at any time without notice, in order to improve design and supply the best possible product.

Philips Semiconductors and Philips Electronics North America Corporation

Philips

Semiconductors

Ð­Ð»ÐµÐºÑ‚Ñ€Ð¾Ð½Ð½Ñ‹Ð¹ ÐºÐ¾Ð¼Ð¿Ð¾Ð½ÐµÐ½Ñ‚: ABT22V10A7A

ÐÐ»ÐµÐºÑ‚Ñ€Ð¾Ð½Ð½Ñ‹Ð¹ ÐºÐ¾Ð¼Ð¿Ð¾Ð½ÐµÐ½Ñ‚: ABT22V10A7A