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Электронный компонент: N74F20D

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Philips
Semiconductors
74F20
Dual 4-input NAND gate
Product specification
IC15 Data Handbook
1989 Mar 03
INTEGRATED CIRCUITS
Philips Semiconductors
Product specification
74F20
Dual 4-input NAND gate
2
March 3, 1989
8530332 95935
TYPE
TYPICAL
PROPAGATION
DELAY
TYPICAL
SUPPLY CURRENT
(TOTAL)
74F20
3.5ns
2.2mA
ORDERING INFORMATION
DESCRIPTION
COMMERCIAL RANGE
V
CC
= 5V
10%,
T
amb
= 0
C to +70
C
PKG DWG #
14-pin plastic DIP
N74F20N
SOT27-1
14-pin plastic SO
N74F20D
SOT108-1
PIN CONFIGURATION
14
13
12
11
10
9
8
7
6
5
4
3
2
1
GND
V
CC
D1b
D1a
Q1
NC
D1d
D1c
D0a
D0b
Q0
NC
D0c
D0d
SF00065
INPUT AND OUTPUT LOADING AND FAN-OUT TABLE
PINS
DESCRIPTION
74F (U.L.) HIGH/LOW
LOAD VALUE HIGH/LOW
Dna, Dnb, Dnc, Dnd
Data inputs
1.0/1.0
20
A/0.6mA
Q0, Q1
Data outputs
50/33
1.0mA/20mA
NOTE: One (1.0) FAST unit load is defined as: 20
A in the High state and 0.6mA in the Low state.
LOGIC DIAGRAM
V
CC
= Pin 14
GND = Pin 7
SF00066
Q0
6
1
2
4
D0a
D0b
D0c
5
D0d
Q1
8
9
10
12
D1a
D1b
D1c
13
D1d
FUNCTION TABLE
INPUTS
OUTPUT
Dna
Dnb
Dnc
Dnd
Qn
L
X
X
X
H
X
L
X
X
H
X
X
L
X
H
X
X
X
L
H
H
H
H
H
L
NOTES:
H = High voltage level
L
= Low voltage level
X = Don't care
LOGIC SYMBOL
D1a D1b
D0a D0b D0c
D1c D1d
D0d
Q0 Q1
6
8
1
2
4
5
9
10
12
13
V
CC
= Pin 14
GND = Pin 7
SF00067
IEC/IEEE SYMBOL
SF00068
&
6
8
1
2
4
5
9
10
12
13
Philips Semiconductors
Product specification
74F20
Dual 4-input NAND gate
March 3, 1989
3
ABSOLUTE MAXIMUM RATINGS
(Operation beyond the limits set forth in this table may impair the useful life of the device.
Unless otherwise noted these limits are over the operating free-air temperature range.)
SYMBOL
PARAMETER
RATING
UNIT
V
CC
Supply voltage
0.5 to +7.0
V
V
IN
Input voltage
0.5 to +7.0
V
I
IN
Input current
30 to +5
mA
V
OUT
Voltage applied to output in High output state
0.5 to V
CC
V
I
OUT
Current applied to output in Low output state
40
mA
T
amb
Operating free-air temperature range
0 to +70
C
T
stg
Storage temperature range
65 to +150
C
RECOMMENDED OPERATING CONDITIONS
SYMBOL
PARAMETER
LIMITS
UNIT
SYMBOL
PARAMETER
MIN
NOM
MAX
UNIT
V
CC
Supply voltage
4.5
5.0
5.5
V
V
IH
High-level input voltage
2.0
V
V
IL
Low-level input voltage
0.8
V
I
IK
Input clamp current
18
mA
I
OH
High-level output current
1
mA
I
OL
Low-level output current
20
mA
T
amb
Operating free-air temperature range
0
+70
C
DC ELECTRICAL CHARACTERISTICS
(Over recommended operating free-air temperature range unless otherwise noted.)
SYMBOL
PARAMETER
TEST CONDITIONS
1
LIMITS
UNIT
SYMBOL
PARAMETER
TEST CONDITIONS
1
MIN
TYP
2
MAX
UNIT
V
O
High level output voltage
V
CC
= MIN, V
IL
= MAX
10%V
CC
2.5
V
V
OH
High-level output voltage
V
IH
= MIN, I
OH
= MAX
5%V
CC
2.7
3.4
V
V
O
Low level output voltage
V
CC
= MIN, V
IL
= MAX
10%V
CC
0.30
0.50
V
V
OL
Low-level output voltage
V
IH
= MIN, I
OL
= MAX
5%V
CC
0.30
0.50
V
V
IK
Input clamp voltage
V
CC
= MIN, I
I
= I
IK
0.73
1.2
V
I
I
Input current at maximum input voltage
V
CC
= MAX, V
I
= 7.0V
100
A
I
IH
High-level input current
V
CC
= MAX, V
I
= 2.7V
20
A
I
IL
Low-level input current
V
CC
= MAX, V
I
= 0.5V
0.6
mA
I
OS
Short-circuit output current
3
V
CC
= MAX
60
150
mA
I
CC
Supply current (total)
I
CCH
V
CC
= MAX
V
IN
= GND
0.9
1.4
mA
I
CC
Supply current (total)
I
CCL
V
CC
= MAX
V
IN
= 4.5V
3.4
5.1
mA
NOTES:
1. For conditions shown as MIN or MAX, use the appropriate value specified under recommended operating conditions for the applicable type.
2. All typical values are at V
CC
= 5V, T
amb
= 25
C.
3. Not more than one output should be shorted at a time. For testing I
OS
, the use of high-speed test apparatus and/or sample-and-hold
techniques are preferable in order to minimize internal heating and more accurately reflect operational values. Otherwise, prolonged shorting
of a High output may raise the chip temperature well above normal and thereby cause invalid readings in other parameter tests. In any
sequence of parameter tests, I
OS
tests should be performed last.
Philips Semiconductors
Product specification
74F20
Dual 4-input NAND gate
March 3, 1989
4
AC ELECTRICAL CHARACTERISTICS
LIMITS
TEST
V
CC
= +5.0V
V
CC
= +5.0V
10%
SYMBOL
PARAMETER
TEST
CONDITION
T
amb
= +25
C
T
amb
= 0
C to +70
C
UNIT
CONDITION
C
L
= 50pF, R
L
= 500
C
L
= 50pF, R
L
= 500
MIN
TYP
MAX
MIN
MAX
t
PLH
t
PHL
Propagation delay
Dna, Dnb, Dnc, Dnd to Qn
Waveform 1
2.4
2.0
3.7
3.2
5.0
4.3
2.4
2.0
6.0
5.3
ns
AC WAVEFORMS
VM
VM
VM
VM
Qn
Dna, Dnb, Dnc, Dnd
tPHL
tPLH
SF00069
Waveform 1.
Propagation Delay for Inverting Outputs
NOTE:
For all waveforms, V
M
= 1.5V.
TEST CIRCUIT AND WAVEFORMS
tw
90%
VM
10%
90%
VM
10%
90%
VM
10%
90%
VM
10%
NEGATIVE
PULSE
POSITIVE
PULSE
tw
AMP (V)
0V
0V
tTHL (tf
)
INPUT PULSE REQUIREMENTS
rep. rate
t
w
t
TLH
t
THL
1MHz
500ns
2.5ns
2.5ns
Input Pulse Definition
VCC
family
74F
D.U.T.
PULSE
GENERATOR
RL
CL
RT
VIN
VOUT
Test Circuit for Totem-Pole Outputs
DEFINITIONS:
R
L
= Load resistor;
see AC ELECTRICAL CHARACTERISTICS for value.
C
L
= Load capacitance includes jig and probe capacitance;
see AC ELECTRICAL CHARACTERISTICS for value.
R
T
= Termination resistance should be equal to Z
OUT
of
pulse generators.
tTHL (tf
)
tTLH (tr
)
tTLH (tr
)
AMP (V)
amplitude
3.0V
1.5V
V
M
SF00006
Philips Semiconductors
Product specification
74F20
Dual 4-input NAND gate
1989 Mar 03
5
DIP14:
plastic dual in-line package; 14 leads (300 mil)
SOT27-1
Philips Semiconductors
Product specification
74F20
Dual 4-input NAND gate
1989 Mar 03
6
SO14:
plastic small outline package; 14 leads; body width 3.9 mm
SOT108-1
Philips Semiconductors
Product specification
74F20
Dual 4-input NAND gate
1989 Mar 03
7
NOTES
Philips Semiconductors
Product specification
74F20
Dual 4-input NAND gate
yyyy mmm dd
8
Definitions
Short-form specification -- The data in a short-form specification is extracted from a full data sheet with the same type number and title. For
detailed information see the relevant data sheet or data handbook.
Limiting values definition -- Limiting values given are in accordance with the Absolute Maximum Rating System (IEC 134). Stress above one
or more of the limiting values may cause permanent damage to the device. These are stress ratings only and operation of the device at these or
at any other conditions above those given in the Characteristics sections of the specification is not implied. Exposure to limiting values for extended
periods may affect device reliability.
Application information -- Applications that are described herein for any of these products are for illustrative purposes only. Philips
Semiconductors make no representation or warranty that such applications will be suitable for the specified use without further testing or
modification.
Disclaimers
Life support -- These products are not designed for use in life support appliances, devices or systems where malfunction of these products can
reasonably be expected to result in personal injury. Philips Semiconductors customers using or selling these products for use in such applications
do so at their own risk and agree to fully indemnify Philips Semiconductors for any damages resulting from such application.
Right to make changes -- Philips Semiconductors reserves the right to make changes, without notice, in the products, including circuits, standard
cells, and/or software, described or contained herein in order to improve design and/or performance. Philips Semiconductors assumes no
responsibility or liability for the use of any of these products, conveys no license or title under any patent, copyright, or mask work right to these
products, and makes no representations or warranties that these products are free from patent, copyright, or mask work right infringement, unless
otherwise specified.
Philips Semiconductors
811 East Arques Avenue
P.O. Box 3409
Sunnyvale, California 940883409
Telephone 800-234-7381
Copyright Philips Electronics North America Corporation 1998
All rights reserved. Printed in U.S.A.
print code
Date of release: 10-98
Document order number:
9397-750-05058
Philips
Semiconductors
Data sheet
status
Objective
specification
Preliminary
specification
Product
specification
Product
status
Development
Qualification
Production
Definition
[1]
This data sheet contains the design target or goal specifications for product development.
Specification may change in any manner without notice.
This data sheet contains preliminary data, and supplementary data will be published at a later date.
Philips Semiconductors reserves the right to make chages at any time without notice in order to
improve design and supply the best possible product.
This data sheet contains final specifications. Philips Semiconductors reserves the right to make
changes at any time without notice in order to improve design and supply the best possible product.
Data sheet status
[1]
Please consult the most recently issued datasheet before initiating or completing a design.