DAC1243X-AL
0.25
m 10-BIT 40MSPS HEXA CHANNEL
1
GENERAL DESCRIPTION
This core is a CMOS hexa-channel 10bit D/A converter for general & video. The DAC1243X-AL core is in the
Samsung 0.25um 2.5V process. Digital inputs are coded as binary. Each DAC channel includes power down
control and the ability sense output load. An external(optional) or 0.7V reference voltage (VBIAS) and a external
resister define the full-scale current together. It uses the two of current-segment and -weighted.
FEATURES
-- Maximum conversion rate is 40MSPS
-- +2.5V CMOS monolithic construction
--
0.75LSB differential linearity (typical)
--
1.0LSB integral linearity (typical)
-- External or internal voltage reference (Including Band Gap Reference Block)
-- Hexa Channel DAC
-- 10-Bit parallel Straight Binary Digital input per channel
-- DAC auto-load detection circuitry
-- Temperature: 0 ~ 70
C
-- Each channel Power_Down
TYPICAL APPLICATIONS
-- High Definition Television(HDTV)
-- High Resolution Color Graphics
-- Hard Disk Driver (HDD)
-- CAE/CAD/CAM
-- Image Processing
-- Instrumentation
0.25
m 10-BIT 40MSPS HEXA CHANNEL
DAC1243X-AL
2
FUNCTIONAL BLOCK DIAGRAM
Digital
Decode
Binary
Weighted
LSBs
Segmented
MSBs
D1[9:0]
PDAC[0]
Digital
Decode
Binary
Weighted
LSBs
Segmented
MSBs
D2[9:0]
PDAC[1]
Digital
Decode
Binary
Weighted
LSBs
Segmented
MSBs
D3[9:0]
PDAC[2]
Digital
Decode
Binary
Weighted
LSBs
Segmented
MSBs
D6[9:0]
PDAC[5]
Digital
Decode
Binary
Weighted
LSBs
Segmented
MSBs
D5[9:0]
PDAC[4]
Digital
Decode
Binary
Weighted
LSBs
Segmented
MSBs
D4[9:0]
PDAC[3]
Auto-load
Detect
Bias_ gen
DTOUT
PRE
SEL<2:0>
ALLPD
IREF
VBIAS
CCOMP
IO1
IO2
IO3
IO4
IO5
IO6
VDD25AA1,VDD25AD1
VSS25AA1,VSS25AD1
VABB
CLK
Ver 1.3 (Aug. 2000)
This data sheet is a preliminary version. No responsibility is assumed by SEC for its use nor for any
infringements of patents or other rights of third parties that may result from its use. The content of this data sheet
is subject to change without any notice.
DAC1243X-AL
0.25
m 10-BIT 40MSPS HEXA CHANNEL
3
PIN CONFIGURATION
Name
I/O Type
I/O Pad
Pin Description
PDAC[5:0]
DI
piar50_abb
Individual DAC power down control. When activated
(high), the corresponding DAC is disabled.
CLK
DI
picc_abb
DAC master clock. Input data is sampled with the
rising edge of CLK.
PRE
DI
piar50_abb
Control strobe for the DAC auto-load detection
comparator. When PRE transitions high-to-low, the
auto-load detect circuit evaluates its selected input.
Appropriate settling time must be allowed before the
comparator output (DTOUT) is used. When not used,
PRE should be left high.
D1[9:0]
D2[9:0]
D3[9:0]
D4[9:0]
D5[9:0]
D6[9:0]
DI
picc_abb
10-bit straight binary digital input for each DAC
channel.
ALLPD
DI
piar50_abb
Power down control for Bandgap and all six DACs. A
high level disables all six DACs plus the bandgap
reference regardless of the states of PDAC0-5
DTOUT
DO
pot8_abb
Comparator output for detection of resistive load at
DAC output. A low at the detect output indicates that
the output voltage of the selected channel is above
0.53V and therefore that no load is attached.
CCOMP
AB
poa_bb
Internal DAC compensation node. Connect external
0.1uF cap to VDD25AA1.
IRSET
AB
poa_bb
External resistor from this node to VSS25AA1 defines
the full scale output current for the DACs.
VBIAS
AB
poa_bb
External reference voltage output.
I/O TYPE ABBR.
-- AI: Analog Input
-- DI: Digital Input
-- AO: Analog Output
-- DO: Digital Output
-- AB: Analog Bidirectional
-- DB: Digital Bidirectional
-- AP: Analog Power
-- DP: Digital Power
-- AG: Analog Ground
-- DG: Digital Ground
0.25
m 10-BIT 40MSPS HEXA CHANNEL
DAC1243X-AL
4
Name
I/O Type
I/O Pad
Pin Description
VDD25AA1
AP
vdd2t_bb
Analog
Power
(needs 3 pads)
VSS25AA1
AG
vss2t_abb
Analog
Ground (needs 3 pads)
VDD25AD1
DP
vdd2t_abb
Digital
Power
VSS25AD1
DG
vss2t_abb
Digital
Ground
VABB
AG
vbb_abb
Substrate
Bias(the same with ground level)
IO1
AO
poa_bb
1st
Analog
Current
Output
IO2
AO
poa_bb
2nd
Analog
Current
Output
IO3
AO
poa_bb
3rd
Analog
Current
Output
IO4
AO
poa_bb
4th
Analog
Current
Output
IO5
AO
poa_bb
5th
Analog
Current
Output
IO6
AO
poa_bb
6th
Analog
Current
Output
I/O TYPE ABBR.
-- AI: Analog Input
-- DI: Digital Input
-- AO: Analog Output
-- DO: Digital Output
-- AB: Analog Bidirectional
-- DB: Digital Bidirectional
-- AP: Analog Power
-- DP: Digital Power
-- AG: Analog Ground
-- DG: Digital Ground
DAC1243X-AL
0.25
m 10-BIT 40MSPS HEXA CHANNEL
5
CORE CONFIGURATION
VDD25AA1
VDD25AD1
VSS25AD1
VSS25AA1
VBBA
IO2
Dac1243x-al
D1[10:0]
D2[10:0]
ALLPD
CLK
IO1
CCOMP IRSET VBIAS
D3[10:0]
D4[10:0]
D5[10:0]
D6[10:0]
PDAC[6:1]
DTCT_OUT
PRE
SEL[2:0]
IO3
IO5
IO6
IO4
DTOUT
PDAC[5:0]
0.25
m 10-BIT 40MSPS HEXA CHANNEL
DAC1243X-AL
6
ABSOLUTE MAXIMUM RATINGS
Characteristic
Symbol
Value
Unit
Supply Voltage
VDD25AA1 - VSS25AA1
VDD25AD1 - VSS25AD1
2.5
V
Voltage on Any Digital Pin
CLK
VSS25AD1-0.25 to
VDD25AD1+0.25
V
Storage Temperature Range
T
stg
-45 ~ 125
C
NOTES:
1. ABSOLUTE MAXIMUM RATING specifies the values beyond which the device may be damaged permanently. Exposure
to ABSOLUTE MAXIMUM RATING conditions for extended periods may affect reliability. Each condition value is applied
with the other values kept within the following operating conditions and function operation under any of these conditions
is
not implied.
2.
All voltages are measured with respect to GND unless otherwise specified
3. Applied voltage must be limited to specified range.
RECOMMENDED OPERATING CONDITIONS
Characteristics
Symbol
Min
Typ
Max
Unit
Operating Supply Voltage
VDD25AD1,VDD25AA1
2.25
2.5
2.75
V
Digital Input Voltage High
V
IH
1.75
2.5
-
V
Digital Input Voltage Low
V
IL
-
0.0
0.75
V
Operating Temperature
Range
Topr
0
25
70
C
Output Load(effective)
R
L
-
37.5
-
Reference Load(effective)
Resistor
Rset
-
658
-
Reference Voltage
V
BIAS
-
0.7
-
V
Data Input Setup Time
T
S
4
-
-
ns
Data Input Hold Time
T
H
1
-
-
ns
Clock Cycle Time
T
CLK
25
-
-
ns
Clock Pulse Width High
T
PWH
12
-
-
ns
Clock Pulse Width Low
T
PWL
12
-
-
ns
Zero_level Voltage
V
OZ
-10
-5
+10
mV
IRSET Current
I
REF
0.9
1.06
1.1
mA
NOTE: It is strongly recommended that all the supply pins (VDD25AA1,VDD25AD2) be powered from the same source and
all the ground pins(VSS25AA1,VSS25AD1,VABB) avoid power latch-up.
DAC1243X-AL
0.25
m 10-BIT 40MSPS HEXA CHANNEL
7
DC ELECTRICAL CHARACTERISTICS
Characteristics
Symbol
Min
Typ
Max
Unit
Resolution
-
-
-
10
Bits
Full Scale Current per Channel
Ifs
-
34
-
mA
Differential Linearity Error
DLE
-
0.75
1.0
LSB
Integral Linearity Error
ILE
-
1.0
2.0
LSB
Monotonicity
-
Guaranteed
-
Output Compliance
VOC
0
-
+1.3
V
Power Dissipation
PDISS
-
600
700
mW
NOTES:
1. Converter Specifications (unless otherwise specified) : VDD25AA1=VDD25AD1=2.5V VSS25AA1=VSS25AD1=GND,
Ta=25
C, Rset=658
, R
LOAD1
=R
LOAD2
=R
LOAD3
==R
LOAD4
=R
LOAD5
=R
LOAD6
=37.5
, CCCOMP=0.1
F
2. TBD: To Be Determined
AC ELECTRICAL CHARACTERISTICS
Characteristics
Symbol
Min
Typ
Max
Unit
Analog DAC output capacitance
C
IN
0
10
20
pF
Minimum delay from SEL[2:0]
transition to PRE transition low
T
selL
100
-
-
ns
Minimum delay from PRE transition
low to valid DTOUT output
T
DET_VAL
100
-
-
ns
Minimum Pulse width low for PRE
T
SPWL
200
-
-
ns
Mismatching
mm
-
11
-
LSB
Power Supply Rejection
Ratio(5.8KHz)
PSRR
35
45
-
dB
Conversion Rate
F
CON
-
30
40
MHz
Analog Output Delay
Td
-
10
-
ns
Analog Output Rise Time
Tr
-
5
-
ns
Analog Output Fall Time
Tf
-
5
-
ns
Analog Output Settling Time
Tset
-
60
-
ns
Clock & Data Feedthrough
FDTHR
25
30
-
dB
Glitch Impulse
Gl
-
100
200
pv
sec
Pipeline Delay
Top
0.5
0.7
1.0
CLK
Supply Current
Is
190
210
230
mA
NOTES:
1.
The above parameters are not tested through the temperature range, but these are guaranteed over the full temperature
range.
2.
Clock & data feedthrough is a function of the amount of overshoot and undershoot on the digital inputs.
3.
Settling time does not include clock and data feedthrough . Glitch impulse include clock and data feedthrough.
0.25
m 10-BIT 40MSPS HEXA CHANNEL
DAC1243X-AL
8
This is hexa 10bit 40MSPS digital to analog data converter and uses current-segment architecture for 6bits of
MSB sides and binary-weighted architecture for 6bits of LSB side. It contains of 1st latch block, decoder
block,2nd latch block, OPA block, CM(current mirror)block ,BGR(Band Gap Reference) block, Auto-load detect
block and analog switch block, etc.
This core uses reference current which decide the 1LSB current by dividing the reference current by 32times. So
the reference current must be constant and it can be constant by using OPA block with high DC gain. The most
significant block of this core is analog switch block and it must maintain the uniformity at each switch, so layout
designer must care of it. And more than 90% of supply current is dissipated at analog switch block. And it uses
samsung standard cell as all digital cell of latch, decoder and buffer, etc. And to adjust full current output range,
you must decide the Rset value(connected to IRSET pin) and. Its voltage output can be obtained by connecting
RL1(connected to IO1 pin) and RL2(connected to IO2 pin) ,RL3(connected to IO3 pin) and RL4(connected to IO4
pin), RL5(connected to IO5 pin and RL6(connected to IO6 pin).
Its maximum output voltage limit is Compliance voltage. So you must decide the RL[6:1], Vbias and Rset
carefully not to exceed the output voltage limit. It contains PDAC[5:0] pins for power-save of each channel and
ALLPD for power-down mode of all blocks.
Even though one or two out of 6 channels enter power-save mode, the reference block(OPA block, CM block,
BGR block) is still alive, but if ALLPD is activated(high), then all blocks of this core is disable regardless of
PDAC[5:0], so at this case supply current is almost just about the sum of leakage. You cant check the BGR's
output voltage by checking the VBIAS pin.
user can detect the presence of an expected load on each DAC output by configuring the DAC digital inputs such
that the detection comparator threshold(0.53V) is a useful threshold for presence of load resistance. Set SEL[3:0]
to select the appropriate DAC output. Transition PRE to low, wait for settling DTOUT value and return PRE back
to high.
The IRSET pin creates a +0.7VDC reference that can be forced with an external reference voltage ap pin VBIAS.
This voltage when combined with the external resistor attached to the IRSET pin sets the output current range for
all six DACs. The following example shows how to create a 1Vpk-pk output for a 100 IRE NTSC signal. Any other
required variations can easily be calculated from the supplied equations. Please remember that these are ideal
equations, the mismatch tolerances from the data sheet should be taken into account for any calculations.
The <figure 1> diagram shows a typical relationship between DAC input and voltage output.
1V
808
10
DAC code
Input
An example 10-bit DAC relationship
input code verse output level
< Figure 1 >
DAC1243X-AL
0.25
m 10-BIT 40MSPS HEXA CHANNEL
9
This <figure 2> diagram shows the basic bias-generator and analog current switch. From this diagram the
number of DAC codes for a 1V delta output is: C100 = 808 - 10 = 798
Reference
Generator
CCOMP
IREF
Current for
1 LSB
External
resistor
I
R
< Figure 2 >
a standard doubly terminated 75 Ohm line is assumed :
V
100
1
I100 = -------- = --------- =
26.666mA
RLOAD 37.5
The relationship between the IR reference current and DAC output current is shown below.
IR = 32 LSB
From the previous equation we have:
IRSET 0.7V
RSET = --------- = ------------- = 654W
IR 1.069mA
Summation of all equations gives:
IRSET
C100
RLOAD
RSET = ----------------------------------
32
V100
For most video applications an external resistor
of 649
(+/- 1%) would be selected when driving doubly
terminated loads (37.5
), and an external resistor of 1.3K
(+/- 1%) would be selected when driving loads of
75
, in order to have 798 DAC codes correspond to a 1V delta output voltage swing. Then the DAC output levels
and the associated codes are as shown below.
0.25
m 10-BIT 40MSPS HEXA CHANNEL
DAC1243X-AL
10
Table 1:Summary of DAC Voltage and Codes
Signal Level
CVBS/LUMA
DAC Code
IRE Value
DAC Voltage
Max output
1023
137.2
1.282V
100% White
810
100
1.015V
Black
282
7.37
353mV
Sync
12
-40
15mV
White - Black
570
100
714mV delta
White - Wync
798
140
1V delta
Color burst
228
40
285mV delta
DAC voltages assume the standard 140 IRE = 1V. Numbers shown are for NTSC type video with a pedestal.
DAC1243X-AL
0.25
m 10-BIT 40MSPS HEXA CHANNEL
11
TIMING DIAGRAM
IO
CLK
D[9:0]
1 Clocks Pipeline Delay
data(1111111111)
0000 000000
t
R
Ts
Tpwh
Tpwl
0000 000000
T c l k
Tset
t
F
Td
High
Low
Vout(p-p)
0 V
CLK
T s
Th
Td
D[9:0]
data[2]
data[3]
data[1]
IO
Vout[2]
Vout[1]
CLK
D[9:0]
data1(1111111111)
IO
PDAC
Tpn
Tpf
0V
Vout(pp)
Vout[2]
0 - 5
T
selL
T
S P W L
T
d e t_ v a l
SEL[2:0]
PRE
DTOUT
NOTES:
1.
The Behavioral Modeling is provided by Verilog
2.
Output delay(Td) measured from the 50% point of the rising edge of CLK to the full scale transition.
3.
Settling time(Tset) measured from the 50% point of full scale transition to the output remaining within
1LSB iteration.
4.
Output rising(Tr)/falling(Tf) time measured between the 10% and 90% points of full scale transition.
5.
Any power_down doesn't need clock signal.
6.
PD1(PD2,PD3, ,PD6) makes the 1st(2nd,3rd, ,6th) channel down respectively when it is high.
7.
PD1,PD2,PD3,PD4,PD5 and PD6 have absolutely no relations among them.
8.
ALLPD makes all of the blocks disable regardless of PDAC[5:0].
9.
The minimum Pulse Width Low of ALLPD should be longer than 1ms.
10. The minimum Pulse Width Low of PDAC<5:0> should be longer than 50ns.
11. The minimum Pulse Width Low of ALLPD and PDAC<5:0> should be longer than 20ns.
0.25
m 10-BIT 40MSPS HEXA CHANNEL
DAC1243X-AL
12
CORE EVALUATION GUIDE
SELECT
TEST PATH
HOST
DSP
CORE
10
10
10
10
10
10
MUX
IO2
IO3
IO1
R
L1
R
L2
R
L3
bw1243x-al
D1[9:
0]
D2[9:0]
D3[9:0]
PDAC[5:0]
VBIAS
0.7V
R
SE
T
IRSET
ALLPD
Cc
CCOMP
VDD33AA1
CLK
CLK(30MHz)
V
D
D
2
5
A
D
1
V
S
S
2
5
A
D
1
V
D
D
2
5
A
A
1
V
S
S
2
5
A
A
1
V
B
B
A
2.5V
L1
Ct
+
2.5V
L2
Ct
+
Cc
Cc
D4[9:
0]
D5[9:
0]
D6[9:
0]
10
10
10
10 10 10 10 10 10
IO5
IO6
IO4
R
L4
R
L5
R
L6
PRE SEL[2:0]
Control
Input
DTOUT
You must use more than two PADs for VDD33AA11 'cause it's current is more than about 81mA.
Location
Description
Cc
0.1
F
Ct
10
F
R
SET
658
R
L1
, R
L4
37.5
R
L2
, R
L5
37.5
R
L3
, R
L6
37.5
V
BIAS
0.7V
DAC1243X-AL
0.25
m 10-BIT 40MSPS HEXA CHANNEL
13
CORE EVALUATION GUIDE
Input
Pad
Normal
Operation
Logic
Normal
Operation
Logic
CLK_MUX
Normal
Operation
Logic
CLK_MUX
Input
Pad
Normal
Operation
Logic
Normal
Operation
Logic
CLK_MUX
Software
DC
Control
Normal
Operation
Logic
CLK_MUX
Normal
Operation
Logic
CLK_MUX
Normal
Operation
Logic
CLK_MUX
Normal
Operation
Logic
CLK_MUX
Software
DC
Control
Software
DC
Control
Software
DC
Control
Software
DC
Control
Software
DC
Control
Software
DC
Control
Output
Pad
Output
Pad
Output
Pad
Output
Pad
Output
Pad
Output
Pad
CLK
D1[9:0]
D1[9:0]
D1[9:0]
D1[9:0]
D1[9:0]
D1[9:0]
IO6
IO5
IO4
IO3
IO2
IO1
DAC
1243
X_AL
You must use more than two PADs for VDD33AA11 'cause it's current is more than about 81mA.
Location
Description
Cc
0.1
F
Ct
10
F
R
SET
658
R
L1
37.5
R
L2
37.5
R
L3
37.5
V
BIAS
0.7V
0.25
m 10-BIT 40MSPS HEXA CHANNEL
DAC1243X-AL
14
1. ABOUT TESTABILITY
If you want to test it over full spec via all channel in main chip(that is, when it is used as a block of main
chip) you must add many pins(for 60pins of digital inputs, 6pins of analog outputs, etc) at the main chip to
test this DAC block. But usually it is nearly impossible 'cause the total number of pins at main chip is limited.
So more efficient method for testing this DAC block is needed. We offer two ways of testing efficiently here
as a reference.
But remember this is not the best thing. You can test it by your own testing method.
2. FIRST METHOD OF TESTABILITY
The first way is adding only extra 10PADs for 10bit parallel digital inputs and 3PADs for channel selecting
and path selecting. You can check six channels one by one, that is you can test only one channel at one
time. Therefore you can test all three channels by turn but cannot check all channel at one time. And this
method needs extra MUX and switch blocks for testing.
Furthermore we can assure all channels by testing only one channel because all the six channels have same
architecture and share the same analog reference
block(OPAMP, CM, BGR). This characteristic makes it simple to test this DAC block(when it is embedded in
main chip) by adding another 10PADs for parallel digital inputs and 3PADs for selecting one channel analog
switch block of DAC out of three channels.
3. SECOND METHOD OF TESTABILITY
If above extra 13PADs are burden on you, then you can test it by this second method to reduce the extra
PADs for testing. What is different from above method is that this way needs only 2 extra PADs (one for 1bit
serial digital input and the other for clock signal), but you must insert extra serial to parallel converter block
for converting 1bit 10times high speed digital input to 10bit parallel digital inputs. And this block may need
considerable area. And this method also needs extra 3PADs for channel selecting and path selecting.
4.
ANALYSIS
The voltage applied to VBIAS is measured at IRSET node . And the voltage value is proportioned to the
reference current value of resistor which is connected to IRSET node. So you can estimate the full scale
current value by measuring the voltage, and check the DC characteristics of the OPAMP. For reference, as
VBIAS voltage applied to VBIAS pin is given at IRSET node, the current flowing through RSET resistor
(connected to IRSET pin) is given as VREF/RSET.
If the voltage applied to VBIAS pin is not same with IRSET node, you can say "This DAC chip does not work
properly", because the internal OPAMP block makes the two node voltage(IFEF pin, VBIAS pin) equal. And
you have to check the COMP node to see the desired voltage on it. If the desired voltage is not measured,
you can check the DAC output by applying a desired voltage to the COMP pin instead of compensation
capacitor directly.
If you use internal reference voltage(BGR's output voltage) instead of external Vbias by setting the BGRSW
low, you can check the BGR's output by checking the VBIAS pin voltage.
DAC1243X-AL
0.25
m 10-BIT 40MSPS HEXA CHANNEL
15
PC BOARD LAYOUT CONSIDERATIONS
PC Board Considerations
To minimize noise on the power lines and the ground lines, the digital inputs need to be shielded and decoupled.
This trace length between groups of vdd (VDD33AA1,VDD33AD1) pins short as possible so as to minimize
inductive ringing.
Supply Decoupling and Planes
For the decoupling capacitor between the power line and the ground line, 0.1mF ceramic capacitor is used in
parallel with a 10mF tantalum capacitor. The digital power plane(VDD33AD1) and analog power plane
(VDD33AA1) are connected through a ferrite bead, and also the digital ground plane(VSS33AD1) and the analog
ground plane(VSS33AA1). This ferrite bead should be located within 3inches of the DAC1243x-AL. The analog
power plane supplies power to the DAC1243X-AL of the analog output pin and related devices.
Analog Signal Interconnect
To minimized noise pickup and reflections due to impedance mismatch, the DAC1243X-AL should be located as
close as possible to the output connector.
The line between DAC output and monitor input should also be regarded as a transmission line. Due to the fact,
it can cause problems in transmission line mismatch. As a solution to these problems, the double-termination
methods used.
By using this, both ends of the termination lines are matched, providing an ideal, non-reflective system.
CORE LAYOUT GUIDE (OPTIONAL)
Layout DAC core replacement
It is recommended that you use thick analog power metal. when connecting to PAD, the path should be kept
as short as possible, and use branch metal to connect to the center of analog switch block.
It is recommended that you use thick analog output metal (at least more than 25mm) when connecting to
PAD, and also the path length should be kept as short as possible.
Digital power and analog power are separately used.
When it is connected to other blocks, it must be double shielded using N-well and P+ active to remove the
substrate and coupling noise. In that case, the power metal should be connected to PAD directly.
Bulk power is used to reduce the influence of substrate noise.
You must use more than two pins for VDD33AA11 because it require much current dissipation(about 93mA)
It is recommended that analog metal line(including IRSET,VBIAS,IO[1:3],IOB[1:3]) and analog power metal
line should be layouted alone and should not mixed with other noisy digital metal lines.
If this core is used as a function block in larger main chip, you can join digital power metal of this core with
the main digital power instead of using new digital power pad for this core. But you must use new analog
power pad for the analog power of this core.
0.25
m 10-BIT 40MSPS HEXA CHANNEL
DAC1243X-AL
16
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DC / AC Electrical Characteristic
Characteristics
Min
Typ
Max
Unit
Remarks
Supply
Voltage
V
Power
dissipation
mW
Resolution
Bits
Analog
Output
Voltage
V
Operating
Temperature
C
Output
Load
Capacitor
mF
Output
Load
Resistor
Integral
Non-Linearity
Error
LSB
Differential
Non-Linearity
Error
LSB
Maximum
Conversion
Rate
MHz
Voltage Output DAC
Reference Voltage TOP
BOTTOM
V
Analog Output Voltage Range
V
Digital Input Format
Binary Code or 2's Complement Code
Current Output DAC
Analog
Output
Maximum
Current
mA
Analog
Output
Maximum
Signal
Frequency
MHz
Reference
Voltage
V
External
Resistor
for
Current
Setting(RSET)
Pipeline
Delay
sec
--
Do you want to Internal Reference Voltage(BGR)?
--
Which do you want to Serial Input TYPE or parallel Input TYPE?
--
Do you need 3.3v and 5v power supply in your system?
--
How many channels do you need(BW1221L is dual channel DAC)?
DAC1243X-AL
0.25
m 10-BIT 40MSPS HEXA CHANNEL
17
HISTORY CARD
Version
Date
Modified Items
Comments
Ver 1.0
Newly registered by circuit designer Koo Hyung-Woan
Ver 1.3
00.08.05
Port Name change (PDAC[6:1]->PDAC[5:0]), Add history card