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Электронный компонент: K4S511633C-YL

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K4S511633C-YL/N/P
Rev. 1.2 Dec. 2002
CMOS SDRAM
Revision 1.2
December 2002
32Mx16
54CSP 1/CS
(VDD/VDDQ 3.0V/3.0V or 3.3V/3.3V)
Mobile SDRAM
K4S511633C-YL/N/P
Rev. 1.2 Dec. 2002
CMOS SDRAM
3.0V power supply
LVCMOS compatible with multiplexed address
Four banks operation
MRS cycle with address key programs
-. CAS latency (1 & 2 & 3)
-. Burst length (1, 2, 4, 8 & Full page)
-. Burst type (Sequential & Interleave)
All inputs are sampled at the positive going edge of the system
clock.
Burst read single-bit write operation
DQM for masking
Auto & self refresh
64ms refresh period (8K cycle)
1 /CS Support.
Commercial Temperature Operation (-25
C ~ 70
C).
Extended Temperature Operation (-25
C ~ 85
C).
Industrial Temperature Operation (-40
C ~ 85
C).
54balls DDP CSP
FEATURES
FUNCTIONAL BLOCK DIAGRAM
8M x 16Bit x 4 Banks Mobile SDRAM
ORDERING INFORMATION
- YN : Low Power, Operating Temp : -25
C ~ 85
C.
- YL : Low Power, Operating Temp : -25
C ~ 70
C.
- YP : Low Power, Operating Temp : -40
C ~ 85
C.
Note :
1. In case of 33MHz Frequency, CL1 can be supported.
Part No.
Max Freq.
Interface Package
K4S511633C-YL/N80
125MHz(CL=3)
100MHz(CL=2)
LVCMOS
54 CSP
K4S511633C-YL/N1H
100MHz(CL=2)
K4S511633C-YL/N1L
100MHz(CL=3)
*1
The K4S511633C is 536,870,912 bits synchronous high data
rate Dynamic RAM organized as 4 x 8,388,608 words by 16bits,
fabricated with SAMSUNG's high performance CMOS technology.
Synchronous design allows precise cycle control with the use of
system clock I/O transactions are possible on every clock cycle.
Range of operating frequencies, programmable burst length and
programmable latencies allow the same device to be useful for a
variety of high bandwidth, high performance memory system
applications.
GENERAL DESCRIPTION
Samsung Electronics reserves the right to
change products or specification without
notice.
*
Bank Select
Data Input Register
8M x 16
8M x 16
S
e
n
s
e

A
M
P
O
u
t
p
u
t

B
u
f
f
e
r
I
/
O

C
o
n
t
r
o
l
Column Decoder
Latency & Burst Length
Programming Register
A
d
d
r
e
s
s

R
e
g
i
s
t
e
r
R
o
w

B
u
f
f
e
r
R
e
f
r
e
s
h

C
o
u
n
t
e
r
R
o
w

D
e
c
o
d
e
r
C
o
l
.

B
u
f
f
e
r
L
R
A
S
L
C
B
R
LCKE
LRAS
LCBR
LWE
LDQM
CLK
CKE
CS
RAS
CAS
WE
DQM
LWE
LDQM
DQi
CLK
ADD
LCAS
LWCBR
8M x 16
8M x 16
Timing Register
K4S511633C-YL/N/P
Rev. 1.2 Dec. 2002
CMOS SDRAM
Pin Name
Pin Function
CLK
System Clock
CS
Chip Select
CKE
Clock Enable
A
0
~ A
12
Address
BA
0
~ BA
1
Bank Select Address
RAS
Row Address Strobe
CAS
Column Address Strobe
WE
Write Enable
L(U)DQM
Data Input/Output Mask
DQ
0
~
15
Data Input/Output
V
DD
/V
SS
Power Supply/Ground
V
DDQ
/V
SSQ
Data Output Power/Ground
Package Dimension and Pin Configuration
Symbol
Min
Typ
Max
A
1.00
1.10
1.30
A
1
0.27
0.32
0.37
E
-
9.50
-
E
1
-
6.40
-
D
-
15.50
-
D
1
-
6.40
-
e
-
0.80
-
b
0.40
0.45
0.50
z
-
-
0.10
[Unit:mm]
5
2
1
6
3
4
8
9
7
F
E
D
C
B
J
H
G
A
e
D
D
/
2
D
1
E
1
E
E/2
A
A1
z
b
Encapsulant
Max. 0.20
< Bottom View
*1
>
< Top View
*2
>
< Top View
*2
>
*1: Bottom View
*2: Top View
54Ball(6x9) CSP
1
2
3
7
8
9
A
V
SS
DQ15
V
SSQ
V
DDQ
DQ0
V
D D
B
DQ14
DQ13
V
DDQ
V
SSQ
DQ2
DQ1
C
DQ12
DQ11
V
SSQ
V
DDQ
DQ4
DQ3
D
DQ10
DQ9
V
DDQ
V
SSQ
DQ6
DQ5
E
DQ8
NC
V
SS
V
D D
LDQM
DQ7
F
UDQM
CLK
CKE
CAS
RAS
WE
G
A12
A11
A9
BA0
BA1
CS
H
A8
A7
A6
A0
A1
A10
J
V
SS
A5
A4
A3
A2
V
D D

K
4
S
5
1
1
6
3
3
C
-
X
X
X
X
#A1 Ball Origin Indicator
S
A
M
S
U
N
G




W
e
e
k
K4S511633C-YL/N/P
Rev. 1.2 Dec. 2002
CMOS SDRAM
DC OPERATING CONDITIONS
Recommended operating conditions (Voltage referenced to V
SS
= 0V, T
A
=Commercial, Extended and Industrial)
Notes :
1. V
IH
(max) = 5.3V AC. The overshoot voltage duration is
3ns.
2. V
IL
(min) = -2.0V AC. The undershoot voltage duration is
3ns.
3. Any input 0V
V
IN
V
DDQ
.
Input leakage currents include HI-Z output leakage for all bi-directional buffers with tri-state outputs.
4. Dout is disabled, 0V
V
OUT
V
DDQ.
Parameter
Symbol
Min
Typ
Max
Unit
Note
Supply voltage
V
D D
2.7
3.0
3.6
V
V
DDQ
2.7
3.0
3.6
V
Input logic high voltage
V
I H
2.2
3.0
V
DDQ
+0.3
V
1
Input logic low voltage
V
IL
-0.3
0
0.5
V
2
Output logic high voltage
V
O H
2.4
-
-
V
I
O H
= -2mA
Output logic low voltage
V
OL
-
-
0.4
V
I
OL
= 2mA
Input leakage current
I
LI
-10
-
10
uA
3
ABSOLUTE MAXIMUM RATINGS
Notes :
Permanent device damage may occur if ABSOLUTE MAXIMUM RATINGS are exceeded.
Functional operation should be restricted to recommended operating condition.
Exposure to higher than recommended voltage for extended periods of time could affect device reliability.
Parameter
Symbol
Value
Unit
Voltage on any pin relative to Vss
V
I N
, V
O U T
-1.0 ~ 4.6
V
Voltage on V
D D
supply relative to Vss
V
DD
, V
DDQ
-1.0 ~ 4.6
V
Storage temperature
T
STG
-55 ~ +150
C
Power dissipation
P
D
1
W
Short circuit current
I
OS
50
mA
CAPACITANCE
(V
DD
= 3.0V, T
A
= 23
C, f = 1MHz, V
REF
=0.9V
50
mV)
Pin
Symbol
Min
Max
Unit
Note
Clock
C
CLK
3.0
9.0
pF
RAS, CAS, WE, CS, CKE
C
IN
3.0
9.0
pF
DQM
C
IN
1.5
4.5
pF
Address
C
ADD
3.0
9.0
pF
DQ
0
~ DQ
15
C
OUT
3.0
6.5
pF
K4S511633C-YL/N/P
Rev. 1.2 Dec. 2002
CMOS SDRAM
DC CHARACTERISTICS
Recommended operating conditions (Voltage referenced to V
SS
= 0V, T
A
=Commercial, Extended and Industrial)
Notes :
1. Measured with outputs open.
2. Refresh period is 64ms.
3. K4S511633C-YL**
4. K4S511633C-YN**
5. K4S511633C-YP**
6. Unless otherwise noted, input swing IeveI is CMOS(V
IH
/V
IL
=V
DDQ
/V
SSQ)
Parameter
Symbol
Test Condition
Version
Unit Note
-80
-1H
-1L
Operating Current
(One Bank Active)
I
CC1
Burst length = 1
t
RC
t
R C
(min)
I
O
= 0 mA
160
155
145
mA
1
Precharge Standby Current
in power-down mode
I
CC2
P
CKE
V
IL
(max), t
CC
= 10ns
2
mA
I
C C 2
PS CKE & CLK
V
IL
(max), t
CC
=
2
Precharge Standby Current
in non power-down mode
I
CC2
N
CKE
V
IH
(min), CS
V
IH
(min), t
CC
= 10ns
Input signals are changed one time during 20ns
35
mA
I
CC2
NS
CKE
V
IH
(min), CLK
V
IL
(max), t
CC
=
Input signals are stable
25
Active Standby Current
in power-down mode
I
CC3
P
CKE
V
IL
(max), t
CC
= 10ns
15
mA
I
C C 3
PS CKE & CLK
V
IL
(max), t
CC
=
15
Active Standby Current
in non power-down mode
(One Bank Active)
I
CC3
N
CKE
V
IH
(min), CS
V
IH
(min), t
CC
= 10ns
Input signals are changed one time during 20ns
50
mA
I
CC3
NS
CKE
V
IH
(min), CLK
V
IL
(max), t
CC
=
Input signals are stable
45
mA
Operating Current
(Burst Mode)
I
CC4
I
O
= 0 mA
Page burst
4Banks Activated
t
CCD
= 2CLKs
230
210
210
mA
1
Refresh Current
I
CC5
t
RC
t
R C
(min)
350
335
305
mA
2
Self Refresh Current
I
CC6
CKE
0.2V
-YL
1800
uA
3
-YN
4
-YP
5