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Электронный компонент: K6L0908V2A-TD85

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K6L0908V2A, K6L0908U2A Family
CMOS SRAM
Revision 3.0
February 1998
1
Document Title
64Kx8 bit Low Power and Low Voltage CMOS Static RAM
Revision History
The attached datasheets are provided by SAMSUNG Electronics. SAMSUNG Electronics CO., LTD. reserve the right to change the specifications and
products. SAMSUNG Electronics will answer to your questions about device. If you have any questions, please contact the SAMSUNG branch offices.
Revision No.
0.0
0.1
1.0
2.0
3.0
Remark
Advance
Preliminary
Final
Final
Final
History
Design target
Initial draft
- One datasheet for commercial, extended and industrial product.
- Add 85ns part on KM68V512AFamily.
Finalize
Revise
- Add 32-sTSOP type package on product.
Revise
- Change datasheet format
- Improve power dissipation 0.7 to 1.0W
Draft Data
January 17, 1996
April 15, 1996
June 17, 1996
September 10, 1996
February 12, 1998
K6L0908V2A, K6L0908U2A Family
CMOS SRAM
Revision 3.0
February 1998
2
64Kx8 bit Low Power and Low Voltage CMOS Static RAM
GENERAL DESCRIPTION
The K6L0908V2A and K6L0908U2A families are fabricated
by SAMSUNG
s advanced CMOS process technology. The
families support various operating temperature ranges and
have various package types for user flexibility of system
design. The family also support low data retention voltage for
battery back-up operation with low data retention current.
FEATURES
Process Technology: Poly Load
Organization: 64Kx8
Power Supply Voltage
K6L0908V2A family: 2.7~3.3V
K6L0908U2A family: 3.0~3.3V
Low Data Retention Voltage: 2V(Min)
Three state output and TTL Compatible
Package Type: 32-SOP-525, 32-TSOP1-0820F,
32-TSOP1-0813.4F
PIN DESCRIPTION
Name Name
Function
CS
1
,CS
2
Chip Select Inputs
OE
Output Enable Input
WE
Write Enable Input
A
0
~A
15
Address Inputs
I/O
1
~I/O
8
Data Inputs/Outputs
Vcc
Power
Vss
Ground
N.C
No Connection
PRODUCT FAMILY
1. The parameter is measured with 30pF test load.
Product Family
Operating Temperature
V
CC
Range
Speed
Power Dissipation
PKG Type
Standby
(Isb
1
, Max)
Operating
(Icc
2
, Max)
K6L0908V2A-B
Commercial(0~70
C)
3.0 ~ 3.6V
70
1)
/85/100ns
10
A
40mA
32-SOP
32-TSOP1-F
32-sTSOP1-F
K6L0908U2A-B
2.7 ~ 3.3V
85
1)
/100ns
10
A
K6L0908V2A-D
Extended(-25~85
C)
3.0 ~ 3.6V
70
1)
/85/100ns
20
A
K6L0908U2A-D
2.7 ~ 3.3V
85
1)
/100ns
15
A
K6L0908V2A-F
Industrial (-40~85
C)
3.0 ~ 3.6V
70
1)
/85/100ns
20
A
K6L0908U2A-F
2.7 ~ 3.3V
85
1)
/100ns
15
A
FUNCTIONAL BLOCK DIAGRAM
32-TSOP
Type1 - Forward
(8mm x 20mm)
(8mm x 13.4mm)
32-SOP
N.C
A14
A12
A7
A6
A5
A4
A3
A2
A1
A0
I/O1
I/O2
I/O3
VSS
VCC
A15
WE
A13
A8
A9
A11
OE
A10
CS1
I/O8
I/O7
I/O6
I/O5
I/O4
32
31
30
29
28
27
26
25
24
23
22
21
20
19
18
17
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
N.C
CS2
A11
A9
A8
A13
WE
CS2
A15
VCC
N.C
N.C
A14
A12
A7
A6
A5
A4
OE
A10
CS1
I/O8
I/O7
I/O6
I/O5
I/O4
VSS
I/O3
I/O2
I/O1
A0
A1
A2
A3
32
31
30
29
28
27
26
25
24
23
22
21
20
19
18
17
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
32
31
30
29
28
27
26
25
24
23
22
21
20
19
18
17
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
OE
A10
CS1
I/O8
I/O7
I/O6
I/O5
I/O4
VSS
I/O3
I/O2
I/O1
A0
A1
A2
A3
A11
A9
A8
A13
WE
CS2
A15
VCC
N.C
N.C
A14
A12
A7
A6
A5
A4
SAMSUNG ELECTRONICS CO., LTD. reserves the right to change products and specifications without notice.
Precharge circuit.
Memory array
512 rows
128
8 columns
I/O Circuit
Column select
Clk gen.
Row
select
A0
A1
A2
A3
A9
A11
A10
A4
A5
A6
A7
A8
A12
A14
CS1
CS2
WE
I/O
1
Data
cont
Data
cont
OE
I/O
8
A13
A15
32-sTSOP
Type1 - Forward
Control
logic
K6L0908V2A, K6L0908U2A Family
CMOS SRAM
Revision 3.0
February 1998
3
PRODUCT LIST
Commercial Temperature Products
(0~70
C)
Extended Temperature Products
(-25~85
C)
Industrial Temperature Products
(-40~85
C)
Part Name
Function
Part Name
Function
Part Name
Function
K6L0908V2A-GB70
K6L0908V2A-GB85
K6L0908V2A-GB10
K6L0908V2A-TB70
K6L0908V2A-TB85
K6L0908V2A-TB10
K6L0908V2A-YB70
K6L0908V2A-YB85
K6L0908V2A-YB10
K6L0908U2A-GB85
K6L0908U2A-GB10
K6L0908U2A-TB85
K6L0908U2A-TB10
K6L0908U2A-YB85
K6L0908U2A-YB10
32-SOP, 70ns, 3.3V, LL
32-SOP, 85ns, 3.3V, LL
32-SOP, 100ns, 3.3V, LL
32-TSOP F, 70ns, 3.3V, LL
32-TSOP F, 85ns, 3.3V, LL
32-TSOP F, 100ns, 3.3V,LL
32-sTSOP F,70ns,3.3V,LL
32-sTSOP F,85ns,3.3V,LL
32-sTSOP F,100ns,3.3V,LL
32-SOP, 85ns, 3.0V, LL
32-SOP, 100ns, 3.0V, LL
32-TSOP F, 85ns, 3.0V, LL
32-TSOP F, 100ns, 3.0V, LL
32-sTSOP F, 85ns, 3.0V, LL
32-sTSOP F, 100ns,3.0V, LL
K6L0908V2A-GD70
K6L0908V2A-GD85
K6L0908V2A-GD10
K6L0908V2A-TD70
K6L0908V2A-TD85
K6L0908V2A-TD10
K6L0908V2A-YD70
K6L0908V2A-YD85
K6L0908V2A-YD10
K6L0908U2A-GD85
K6L0908U2A-GD10
K6L0908U2A-TD85
K6L0908U2A-TD10
K6L0908U2A-YD85
K6L0908U2A-YD10
32-SOP, 70ns, 3.3V, LL
32-SOP, 85ns, 3.3V, LL
32-SOP, 100ns, 3.3V, LL
32-TSOP F, 70ns, 3.3V, LL
32-TSOP F, 85ns, 3.3V, LL
32-TSOP F, 100ns, 3.3V,LL
32-sTSOP F,70ns,3.3V,LL
32-sTSOP F,85ns,3.3V,LL
32-sTSOP F,100ns,3.3V,LL
32-SOP, 85ns, 3.0V, LL
32-SOP, 100ns, 3.0V, LL
32-TSOP F, 85ns, 3.0V, LL
32-TSOP F, 100ns, 3.0V, LL
32-sTSOP F, 85ns, 3.0V, LL
32-sTSOP F, 100ns,3.0V, LL
K6L0908V2A-GF70
K6L0908V2A-GF85
K6L0908V2A-GF10
K6L0908V2A-TF70
K6L0908V2A-TF85
K6L0908V2A-TF10
K6L0908V2A-YF70
K6L0908V2A-YF85
K6L0908V2A-YF10
K6L0908U2A-GF85
K6L0908U2A-GF10
K6L0908U2A-TF85
K6L0908U2A-TF10
K6L0908U2A-YF85
K6L0908U2A-YF10
32-SOP, 70ns, 3.3V, LL
32-SOP, 85ns, 3.3V, LL
32-SOP, 100ns, 3.3V, LL
32-TSOP F, 70ns, 3.3V, LL
32-TSOP F, 85ns, 3.3V, LL
32-TSOP F, 100ns, 3.3V,LL
32-sTSOP F,70ns,3.3V,LL
32-sTSOP F,85ns,3.3V,LL
32-sTSOP F,100ns,3.3V,LL
32-SOP, 85ns, 3.0V, LL
32-SOP, 100ns, 3.0V, LL
32-TSOP F, 85ns, 3.0V, LL
32-TSOP F, 100ns, 3.0V, LL
32-sTSOP F, 85ns, 3.0V, LL
32-sTSOP F, 100ns,3.0V, LL
FUNCTIONAL DESCRIPTION
1. X means don
t care(Must be low or high state.)
CS
1
CS
2
OE
WE
I/O
Mode
Power
H
X
1)
X
1)
X
1)
High-Z
Deselected
Standby
X
1)
L
X
1)
X
1)
High-Z
Deselected
Standby
L
H
H
H
High-Z
Output Disabled
Active
L
H
L
H
Dout
Read
Active
L
H
X
1)
L
Din
Write
Active
ABSOLUTE MAXIMUM RATINGS
1)
1. Stresses greater than those listed under "Absolute Maximum Ratings" may cause permanent damage to the device. Functional operation should be
restricted to recommended operating condition. Exposure to absolute maximum rating conditions for extended periods may affect reliability.
Item
Symbol
Ratings
Unit
Remark
Voltage on any pin relative to Vss
V
IN
,V
OUT
-0.5 to V
CC
+0.5
V
-
Voltage on Vcc supply relative to
V
CC
-0.3 to 4.6
V
-
Power Dissipation
P
D
1.0
W
-
Storage temperature
T
STG
-65 to 150
C
-
Operating Temperature
T
A
0 to 70
C
K6L0908V2A-B, K6L0908U2A-B
-25 to 85
C
K6L0908V2A-D, K6L0908U2A-D
-40 to 85
C
K6L0908V2A-F, K6L0908U2A-F
Soldering temperature and time
T
SOLDER
260
C, 10sec (Lead Only)
-
-
K6L0908V2A, K6L0908U2A Family
CMOS SRAM
Revision 3.0
February 1998
4
RECOMMENDED DC OPERATING CONDITIONS
1)
Note:
1. Commercial Product : T
A
=0 to 70
C, otherwise specified
Extended Product : T
A
=-25 to 85
C, otherwise specified
Industrial Product : T
A
=-40 to 85
C, otherwise specified
2. Overshoot : V
CC
+3.0V in case of pulse width
30ns
3. Undershoot : -3.0V in case of pulse width
30ns
4. Overshoot and undershoot are sampled, not 100% tested
Item
Symbol
Product
Min
Typ
Max
Unit
Supply voltage
Vcc
K6L0908V2A Family
3.0
3.3
3.6
V
K6L0908U2A Family
2.7
3.0
3.3
V
Ground
Vss
All Family
0
0
0
V
Input high voltage
V
IH
K6L0908V2A, K6L0908U2A Family
2.2
-
Vcc+0.3V
2)
V
Input low voltage
V
IL
K6L0908V2A, K6L0908U2A Family
-0.3
3)
-
0.4
V
CAPACITANCE
1)
(f=1MHz, T
A
=25
C)
1. Capacitance is sampled, not 100% tested
Item
Symbol
Test Condition
Min
Max
Unit
Input capacitance
C
IN
V
IN
=0V
-
6
pF
Input/Output capacitance
C
IO
V
IO
=0V
-
8
pF
DC AND OPERATING CHARACTERISTICS
Item
Symbol
Test Conditions
Min
Typ
Max
Unit
Input leakage current
I
LI
V
IN
=Vss to Vcc
-1
-
1
A
Output leakage current
I
LO
CS
1
=V
IH
or CS
2
=V
IL
or OE=V
IH
or WE=V
IL
, V
IO
=Vss to Vcc
-1
-
1
A
Operating power supply current
I
CC
I
IO
=0mA, CS
1
=V
IL
, CS
2
=V
IH,
V
IN
=V
IH
or V
IL
-
-
5
mA
Average operating current
I
CC1
Cycle time=1
s, 100% duty, I
IO
=0mA,
CS
1
0.2V, CS
2
Vcc-0.2V, V
IN
0.2V or V
IN
Vcc-0.2V
-
-
5
mA
I
CC2
Cycle time=Min, 100% duty, I
IO
=0mA
CS
1
=V
IL
, CS
2
=V
IH
, V
IN
=V
IL
or V
IH
-
-
40
mA
Output low voltage
V
OL
I
OL
=2.1mA
-
-
0.4
V
Output high voltage
V
OH
I
OH
=-1.0mA
2.4
-
-
V
Standby Current(TTL)
I
SB
CS
1
=V
IH
, CS
2
=V
IL
, Other inputs=V
IL
or V
IH
-
-
0.3
mA
Standby Current(CMOS)
I
SB1
CS
1
Vcc-0.2V, CS
2
Vcc-0.2V, or
CS
2
0.2V
,
Other inputs=0~Vcc
K6L0908V2A-B
-
-
10
A
K6L0908V2A-D
K6L0908V2A-F
-
-
20
A
K6L0908U2A-B
-
-
10
A
K6L0908U2A-D
K6L0908U2A-F
-
-
15
A
K6L0908V2A, K6L0908U2A Family
CMOS SRAM
Revision 3.0
February 1998
5
AC CHARACTERISTICS
(K6L0908V2B Family:Vcc=3.0~3.6V, K6L0908U2B Family:Vcc=2.7~3.3V,
Commercial product:T
A
=0 to 70
C, Extended product:T
A
=-25 to 85
C, Industrial product:T
A
=-40 to 85
C)
Parameter List
Symbol
Speed Bins
Units
70ns
85ns
100ns
Min
Max
Min
Max
Min
Max
Read
Read cycle time
t
RC
70
-
85
-
100
-
ns
Address access time
t
AA
-
70
-
85
-
100
ns
Chip select to output
t
CO
-
70
-
85
-
100
ns
Output enable to valid output
t
OE
-
35
-
45
-
50
ns
Chip select to low-Z output
t
LZ
10
-
10
-
10
-
ns
Output enable to low-Z output
t
OLZ
5
-
5
-
5
-
ns
Chip disable to high-Z output
t
HZ
0
25
0
30
0
30
ns
Output disable to high-Z output
t
OHZ
0
25
0
20
0
20
ns
Output hold from address change
t
OH
10
-
10
-
15
-
ns
Write
Write cycle time
t
WC
70
-
85
-
100
-
ns
Chip select to end of write
t
CW
60
-
70
-
80
-
ns
Address set-up time
t
AS
0
-
0
-
0
-
ns
Address valid to end of write
t
AW
60
-
70
-
80
-
ns
Write pulse width
t
WP
55
-
60
-
70
-
ns
Write recovery time
t
WR
0
-
0
-
0
-
ns
Write to output high-Z
t
WHZ
0
25
0
25
0
30
ns
Data to write time overlap
t
DW
30
-
35
-
40
-
ns
Data hold from write time
t
DH
0
-
0
-
0
-
ns
End write to output low-Z
t
OW
5
-
5
-
5
-
ns
C
L
1)
1. Including scope and jig capacitance
AC OPERATING CONDITIONS
TEST CONDITIONS
( Test Load and Input/Output Reference)
Input pulse level : 0.4 to 2.2V
Input rising and falling time : 5ns
Input and output reference voltage :1.5V
Output load(see right) : C
L
=100pF+1TTL
1)
C
L
=30pF+1TTL
1. K6L0908V2A-70 Family, K6L0908U2A-85 Family
DATA RETENTION CHARACTERISTICS
1.
CS
1
Vcc-0.2V, CS
2
Vcc-0.2V( CS
1
controlled) or CS
2
0.2V(CS
2
controlled)
Item
Symbol
Test Condition
Min
Typ
Max
Unit
Vcc for data retention
V
DR
CS
1
1)
Vcc-0.2V
2.0
-
3.6
V
Data retention current
I
DR
K6L0908V2A-B
K6L0908V2A-D
K6L0908V2A-F
Vcc=3.0V, CS
1
Vcc-0.2V,
CS
2
Vcc-0.2V or CS
2
0.2V
-
-
-
-
-
-
10
15
15
A
K6L0908U2A-B
K6L0908U2A-D
K6L0908U2A-F
-
-
-
-
-
-
8
10
10
Data retention set-up time
t
SDR
See data retention waveform
0
-
-
ms
Recovery time
t
RDR
5
-
-
K6L0908V2A, K6L0908U2A Family
CMOS SRAM
Revision 3.0
February 1998
6
Address
Data Out
Previous Data Valid
Data Valid
TIMMING DIAGRAMS
TIMING WAVEFORM OF READ CYCLE(1)
(Address Controlled
,
CS
1
=OE=V
IL
, WE=V
IH
)
t
AA
t
RC
t
OH
TIMING WAVEFORM OF READ CYCLE(2)
(WE=V
IH
)
Data Valid
High-Z
CS
1
Address
OE
Data out
NOTES (READ CYCLE)
1.
t
HZ
and
t
OHZ
are defined as the time at which the outputs achieve the open circuit conditions and are not referenced to output voltage
levels.
2. At any given temperature and voltage condition,
t
HZ
(Max.) is less than
t
LZ
(Min.) both for a given device and from device to device
interconnection.
CS
2
t
OH
t
AA
t
OLZ
t
LZ
t
OHZ
t
HZ(1,2)
t
RC
t
CO2
t
OE
t
CO1
K6L0908V2A, K6L0908U2A Family
CMOS SRAM
Revision 3.0
February 1998
7
TIMING WAVEFORM OF WRITE CYCLE(1)
(WE Controlled)
Address
CS
1
t
CW(2)
t
WR(4)
TIMING WAVEFORM OF WRITE CYCLE(2)
(CS
1
Controlled)
Address
CS
1
t
WC
t
WR(4)
t
AS(3)
CS
2
t
CW(2)
t
WP(1)
t
DW
t
DH
t
OW
t
WHZ
Data Undefined
Data Valid
WE
Data in
Data out
t
DW
t
DH
Data Valid
WE
Data in
Data out
High-Z
High-Z
CS
2
t
WC
t
AW
t
AS(3)
t
CW(2)
t
WP(1)
t
AW
K6L0908V2A, K6L0908U2A Family
CMOS SRAM
Revision 3.0
February 1998
8
DATA RETENTION WAVE FORM
CS
1
controlled
V
CC
3.0/2.7V
2.2V
V
DR
CS
1
GND
Data Retention Mode
CS
1
V
CC
- 0.2V
t
SDR
t
RDR
TIMING WAVEFORM OF WRITE CYCLE(3)
(CS
1
Controlled)
Address
CS
1
t
AW
NOTES (WRITE CYCLE)
1. A write occurs during the overlap of a low CS
1
, a high CS
2
and a low WE. A write begins at the latest transition among CS
1
goes low,
CS
2
going high and WE going low : A write end at the earliest transition among CS
1
going high, CS
2
going low and WE going high,
t
WP
is measured from the begining of write to the end of write.
2. t
CW
is measured from the CS
1
going low or CS
2
going high to the end of write.
3. t
AS
is measured from the address valid to the beginning of write.
4. t
WR
is measured from the end of write to the address change. t
WR(1)
applied in case a write ends as CS
1
or WE going high t
WR(2)
applied in case a write ends as CS
2
going to low.
CS
2
t
CW(2)
WE
Data in
Data Valid
Data out
High-Z
High-Z
t
CW(2)
t
WR(4)
t
WP(1)
t
DW
t
DH
t
AS(3)
t
WC
CS
2
controlled
V
CC
3.0/2.7V
0.4V
V
DR
CS
2
GND
Data Retention Mode
t
SDR
t
RDR
.
CS
2
0.2V
K6L0908V2A, K6L0908U2A Family
CMOS SRAM
Revision 3.0
February 1998
9
PACKAGE DIMENSIONS
32 PIN SMALL OUTLINE PACKAGE (525mil)
Units: millimeter(inch)
0~8
#32
20.47
0.20
0.806
0.008
MAX
20.87
0.822
MAX
2.74
0.20
0.108
0.008
3.00
0.118
MIN
0.002
0.05
0.004 MAX
0.10 MAX
#1
0.71
( )
0.028
1
3
.
3
4
0
.
5
2
5
11.43
0.20
0.450
0.008
0.80
0.20
0.031
0.008
+0.10
0.20
-0.05
+0.004
0.008
-0.002
14.12
0.30
0.556
0.012
#17
#16
1.27
0.050
+0.100
0.41
-0.050
+0.004
0.016
-0.002
32 PIN THIN SMALL OUTLINE PACKAGE TYPE I (0820F)
#32
1.00
0.10
0.039
0.004
MAX
8.40
0.331
0
.
1
0

M
A
X
0
.
0
0
4
M
A
X
#1
0.50
( )
0.020
18.40
0.10
0.724
0.004
0.45 ~0.75
0.018 ~0.030
20.00
0.20
0.787
0.008
#17
+0.10
0.15
-0.05
+0.004
0.006
-0.002
0~8
+0.10
0.20
-0.05
+0.004
0.008
-0.002
0.50
0.0197
0.25
( )
0.010
MIN
0.05
0.002
MAX
1.20
0.047
8
.
0
0
0
.
3
1
5
TYP
0.25
0.010
#16
K6L0908V2A, K6L0908U2A Family
CMOS SRAM
Revision 3.0
February 1998
10
32 PIN THIN SMALL OUTLINE PACKAGE TYPE I (0813.4F)
PACKAGE DIMENSIONS
1.00
0.10
0.039
0.004
MAX
8.40
0.331
0
.
1
0

M
A
X

0
.
0
0
4

M
A
X
#1
0.50
( )
0.020
11.80
0.10
0.465
0.004
0.45 ~0.75
0.018 ~0.030
13.40
0.10
0.528
0.008
+0.10
0.15
-0.05
+0.004
0.006
-0.002
0~8
+0.10
0.20
-0.05
+0.004
0.008
-0.002
0.50
0.0197
0.25
( )
0.010
MIN
0.05
0.002
MAX
1.20
0.047
8
.
0
0
0
.
3
1
5
TYP
0.25
0.010
#16
#32
#17
32 PIN THIN SMALL OUTLINE PACKAGE TYPE I (0813.4R)
1.00
0.10
0.039
0.004
MAX
8.40
0.331
0
.
1
0

M
A
X

0
.
0
0
4

M
A
X
#16
0.50
( )
0.020
11.80
0.10
0.465
0.004
0.45 ~0.75
0.018 ~0.030
13.40
0.10
0.528
0.008
+0.10
0.15
-0.05
+0.004
0.006
-0.002
0~8
+0.10
0.20
-0.05
+0.004
0.008
-0.002
0.50
0.0197
0.25
( )
0.010
MIN
0.05
0.002
MAX
1.20
0.047
8
.
0
0
0
.
3
1
5
TYP
0.25
0.010
#1
#17
#32
Units: millimeter(inch)