K6R4004C1A-C, K6R4004C1A-E, K6R4004C1A-I
CMOS SRAM
PRELIMINARY
Rev 2.0
- 1 -
February 1998
Document Title
1MKx4 Bit (with OE) High Speed Static RAM(5V Operating), Revolutionary Pin out.
Operated at Commercial, Extended and Industrial Temperature Ranges.
Revision History
The attached data sheets are prepared and approved by SAMSUNG Electronics. SAMSUNG Electronics CO., LTD. reserve the right to change the
specifications. SAMSUNG Electronics will evaluate and reply to your requests and questions on the parameters of this device. If you have any ques-
tions, please contact the SAMSUNG branch office near your office, call or contact Headquarters.
Rev No.
Rev. 0.0
Rev. 0.5
Rev. 1.0
Rev. 2.0
Remark
Design Target
Preliminary
Final
Final
History
Initial release with Design Target.
Release to Preliminary Data Sheet.
0.1. Replace Design Target to Preliminary.
0.2. Delete 12ns part but add 17ns part.
0.3. Relax D.C and A.C parameters and insert new parameter(Icc
1
)
with the test condition.
0.3.1. Insert Icc
1
parameter with the test condition as address is
increased with binary count.
0.3.2. Relax D.C and A.C parameters.
Release to Final Data Sheet.
1.1. Delete Preliminary.
1.2. Delete Icc1 parameter with the test condition.
1.3. Update D.C parameters.
1.4. Add the test condition for V
OH1
with Vcc=5V
5% at 25
C.
1.5. Add timing diagram to define t
WP
as
(
Timing Wave Form of
Write Cycle(CS=Low fixed)
.
2.1 Add extended and industrial temperature range parts.
Items
Previous spec.
(15/ - /20ns part)
Relaxed spec.
(15/17/20ns part)
Icc
170/ - /160mA
200/195/190mA
t
CW
10/ - /12ns
12/13/14ns
t
AW
10/ - /12ns
12/13/14ns
t
WP
(OE=H)
10/ - /12ns
12/13/14ns
t
WP1
(OE=L)
12/ - /14ns
15/17/20ns
t
DW
7/ - /9ns
8/ 9/10ns
Items
Previous spec.
(15/17/20ns part)
Updated spec.
(15/17/20ns part)
Icc
200/195/190mA
150/145/140mA
Draft Data
Jun. 14th, 1996
Sep. 16th, 1996
Jun. 5th, 1997
Feb. 25th, 1998
K6R4004C1A-C, K6R4004C1A-E, K6R4004C1A-I
CMOS SRAM
PRELIMINARY
Rev 2.0
- 2 -
February 1998
1M x 4 Bit (with OE)High-Speed CMOS Static RAM
GENERAL DESCRIPTION
FEATURES
Fast Access Time 15,17,20ns(Max.)
Low Power Dissipation
Standby (TTL) : 50mA(Max.)
(CMOS) : 10mA(Max.)
Operating K6R4004C1A-15 : 150mA(Max.)
K6R4004C1A-17 : 145mA(Max.)
K6R4004C1A-20 : 140mA(Max.)
Single 5.0V
10% Power Supply
TTL Compatible Inputs and Outputs
I/O Compatible with 3.3V Device
Fully Static Operation
- No Clock or Refresh required
Three State Outputs
Center Power/Ground Pin Configuration
Standard Pin Configuration
K6R4004C1A-J : 32-SOJ-400
PIN FUNCTION
Pin Name
Pin Function
A
0
- A
19
Address Inputs
WE
Write Enable
CS
Chip Select
OE
Output Enable
I/O
1
~ I/O
4
Data Inputs/Outputs
V
CC
Power(+5.0V)
V
SS
Ground
N.C
No Connection
The K6R4004C1A is a 4,194,304-bit high-speed Static Random
Access Memory organized as 1,048,576 words by 4 bits. The
K6R4004C1A uses 4 common input and output lines and has
an output enable pin which operates faster than address
access time at read cycle. The device is fabricated using SAM-
SUNG
s advanced CMOS process and designed for high-
speed circuit technology. It is particularly well suited for use in
high-density high-speed system applications. The
K6R4004C1A is packaged in a 400 mil 32-pin plastic SOJ.
PIN CONFIGURATION
(Top View)
Clk Gen.
I/O
1
~I/O
4
CS
WE
OE
FUNCTIONAL BLOCK DIAGRAM
R
o
w
S
e
l
e
c
t
Data
Cont.
CLK
Gen.
Pre-Charge Circuit
Memory Array
1024 Rows
1024x4 Columns
SOJ
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
32
31
30
29
28
27
26
25
24
23
22
21
20
19
18
17
A
19
A
18
A
17
A
16
A
15
OE
I/O
4
Vss
Vcc
I/O
3
A
14
A
13
A
12
A
11
A
10
N.C
A
0
A
1
A
2
A
3
A
4
CS
I/O
1
Vcc
Vss
I/O
2
WE
A
5
A
6
A
7
A
8
A
9
A
10
A
12
A
14
A
16
A
18
Column Select
I/O Circuit &
A
11
A
13
A
15
A
17
A
19
K6R4004C1A-C15/C17/C20
Commercial Temp.
K6R4004C1A-E15/E17/E20
Extended Temp.
K6R4004C1A-I15/I17/I20
Industrial Temp.
ORDERING INFORMATION
A
0
A
1
A
2
A
3
A
4
A
5
A
6
A
7
A
8
A
9
K6R4004C1A-C, K6R4004C1A-E, K6R4004C1A-I
CMOS SRAM
PRELIMINARY
Rev 2.0
- 3 -
February 1998
RECOMMENDED DC OPERATING CONDITIONS*
(T
A
=0 to 70
C)
* The above parameters are also guaranteed at extended and industrial temperature ranges.
** V
IL
(Min) = -2.0V a.c(Pulse Width
10ns) for I
20mA
.
*** V
IH
(Max) = V
CC
+ 2.0V a.c (Pulse Width
10ns) for I
20mA
Parameter
Symbol
Min
Typ
Max
Unit
Supply Voltage
V
CC
4.5
5.0
5.5
V
Ground
V
SS
0
0
0
V
Input High Voltage
V
IH
2.2
-
V
CC
+0.5***
V
Input Low Voltage
V
IL
-0.5**
-
0.8
V
DC AND OPERATING CHARACTERISTICS*
(T
A
=0 to 70
C, Vcc=5.0V
10%, unless otherwise specified)
* The above parameters are also guaranteed at extended and industrial temperature ranges.
Parameter
Symbol
Test Conditions
Min
Max
Unit
Input Leakage Current
I
LI
V
IN
=V
SS
to
V
CC
-2
2
A
Output Leakage Current
I
LO
CS=V
IH
or OE=V
IH
or WE=V
IL
V
OUT
=V
SS
to
V
CC
-2
2
A
Operating Current
I
CC
Min. Cycle, 100% Duty
CS=V
IL,
V
IN
=V
IH
or
V
IL,
I
OUT
=0mA
15ns
-
150
mA
17ns
-
145
20ns
-
140
Standby Current
I
SB
Min. Cycle, CS=V
IH
-
50
mA
I
SB1
f=0MHz, CS
V
CC
-0.2V,
V
IN
V
CC
-0.2V or V
IN
0.2V
-
10
mA
Output Low Voltage Level
V
OL
I
OL
=8mA
-
0.4
V
Output High Voltage Level
V
OH
I
OH
=-4mA
2.4
-
V
CAPACITANCE*
(T
A
=25
C, f=1.0MHz)
* Capacitance is sampled and not 100% tested.
Item
Symbol
Test Conditions
MIN
Max
Unit
Input/Output Capacitance
C
I/O
V
I/O
=0V
-
8
pF
Input Capacitance
C
IN
V
IN
=0V
-
7
pF
ABSOLUTE MAXIMUM RATINGS*
* Stresses greater than those listed under "Absolute Maximum Ratings" may cause permanent damage to the device. This is a stress rating only and
functional operation of the device at these or any other conditions above those indicated in the operating sections of this specification is not implied.
Exposure to absolute maximum rating conditions for extended periods may affect reliability.
Parameter
Symbol
Rating
Unit
Voltage on Any Pin Relative to V
SS
V
IN
,
V
OUT
-0.5 to 7.0
V
Voltage on V
CC
Supply Relative to V
SS
V
CC
-0.5 to 7.0
V
Power Dissipation
P
D
1.0
W
Storage Temperature
T
STG
-65 to 150
C
Operating Temperature
Commercial
T
A
0 to 70
C
Extended
T
A
-25 to 85
C
Industrial
T
A
-40 to 85
C
K6R4004C1A-C, K6R4004C1A-E, K6R4004C1A-I
CMOS SRAM
PRELIMINARY
Rev 2.0
- 4 -
February 1998
TEST CONDITIONS*
* The above parameters are also guaranteed at extended and industrial temperature ranges.
Parameter
Value
Input Pulse Levels
0V to 3V
Input Rise and Fall Times
3ns
Input and Output timing Reference Levels
1.5V
Output Loads
See below
AC CHARACTERISTICS
(T
A
=0 to 70
C, V
CC
=5.0V
10%, unless otherwise noted.)
READ CYCLE*
* The above parameters are also guaranteed at extended and industrial temperature ranges.
Parameter
Symbol
K6R4004C1A-15
K6R4004C1A-17
K6R4004C1A-20
Unit
Min
Max
Min
Max
Min
Max
Read Cycle Time
t
RC
15
-
17
-
20
-
ns
Address Access Time
t
AA
-
15
-
17
-
20
ns
Chip Select to Output
t
CO
-
15
-
17
-
20
ns
Output Enable to Valid Output
t
OE
-
7
-
8
-
9
ns
Chip Enable to Low-Z Output
t
LZ
3
-
3
-
3
-
ns
Output Enable to Low-Z Output
t
OLZ
0
-
0
-
0
-
ns
Chip Disable to High-Z Output
t
HZ
0
7
0
8
0
9
ns
Output Disable to High-Z Output
t
OHZ
0
7
0
8
0
9
ns
Output Hold from Address Change
t
OH
3
-
3
-
3
-
ns
Chip Selection to Power Up Time
t
PU
0
-
0
-
0
-
ns
Chip Selection to Power DownTime
t
PD
-
15
-
17
-
20
ns
Output Loads(A)
Output Loads(B)
D
OUT
5pF*
480
255
for t
HZ
, t
LZ
, t
WHZ
, t
OW
, t
OLZ
& t
OHZ
+5.0V
D
OUT
30pF*
480
255
+5.0V
* Including Scope and Jig Capacitance
K6R4004C1A-C, K6R4004C1A-E, K6R4004C1A-I
CMOS SRAM
PRELIMINARY
Rev 2.0
- 5 -
February 1998
WRITE CYCLE*
* The above parameters are also guaranteed at extended and industrial temperature ranges.
Parameter
Symbol
K6R4004C1A-15
K6R4004C1A-17
K6R4004C1A-20
Unit
Min
Max
Min
Max
Min
Max
Write Cycle Time
t
WC
15
-
17
-
20
-
ns
Chip Select to End of Write
t
CW
12
-
13
-
14
-
ns
Address Set-up Time
t
AS
0
-
0
-
0
-
ns
Address Valid to End of Write
t
AW
12
-
13
-
14
-
ns
Write Pulse Width(OE High)
t
WP
12
-
13
-
14
-
ns
Write Pulse Width(OE Low)
t
WP1
15
-
17
-
20
-
ns
Write Recovery Time
t
WR
0
-
0
-
0
-
ns
Write to Output High-Z
t
WHZ
0
7
0
8
0
9
ns
Data to Write Time Overlap
t
DW
8
-
9
-
10
-
ns
Data Hold from Write Time
t
DH
0
-
0
-
0
-
ns
End Write to Output Low-Z
t
OW
3
-
3
-
3
-
ns
Address
Data Out
Previous Valid Data
Valid Data
TIMMING DIAGRAMS
TIMING WAVEFORM OF READ CYCLE(1)
(Address Controlled
,
CS=OE=V
IL
, WE=V
IH
)
t
AA
t
RC
t
OH
TIMING WAVEFORM OF READ CYCLE(2)
(WE=V
IH
)
CS
Address
OE
Data out
t
AA
t
OLZ
t
LZ(4,5)
t
OH
t
RC
t
OE
t
CO
t
PU
t
PD
t
HZ(3,4,5)
50%
50%
V
CC
Current
I
CC
I
SB
Valid Data
t
OHZ
K6R4004C1A-C, K6R4004C1A-E, K6R4004C1A-I
CMOS SRAM
PRELIMINARY
Rev 2.0
- 6 -
February 1998
NOTES(READ CYCLE)
1. WE is high for read cycle.
2. All read cycle timing is referenced from the last valid address to the first transition address.
3. t
HZ
and t
OHZ
are defined as the time at which the outputs achieve the open circuit condition and are not referenced to V
OH
or V
OL
levels.
4. At any given temperature and voltage condition, t
HZ
(Max.) is less than t
LZ
(Min.) both for a given device and from device to
device.
5. Transition is measured
200mV from steady state voltage with Load(B). This parameter is sampled and not 100% tested.
6. Device is continuously selected with CS=V
IL.
7. Address valid prior to coincident with CS transition low.
8. For common I/O applications, minimization or elimination of bus contention conditions is necessary during read and write cycle.
TIMING WAVEFORM OF WRITE CYCLE(1)
(OE= Clock)
Address
CS
t
WP(2)
t
DW
t
DH
Valid Data
WE
Data in
Data out
t
WC
t
WR(5)
t
AW
t
CW(3)
High-Z(8)
High-Z
OE
t
OHZ(6)
t
AS(4)
TIMING WAVEFORM OF WRITE CYCLE(2)
(OE=Low Fixed)
Address
CS
t
WP1(2)
t
DW
t
DH
t
OW
t
WHZ(6)
Valid Data
WE
Data in
Data out
t
WC
t
AS(4)
t
WR(5)
t
AW
t
CW(3)
(10)
(9)
High-Z(8)
High-Z
K6R4004C1A-C, K6R4004C1A-E, K6R4004C1A-I
CMOS SRAM
PRELIMINARY
Rev 2.0
- 7 -
February 1998
TIMING WAVEFORM OF WRITE CYCLE(3)
(CS=Controlled)
Address
CS
t
AW
t
DW
t
DH
Valid Data
WE
Data in
Data out
High-Z
High-Z(8)
t
CW(3)
t
WP(2)
t
AS(4)
t
WC
t
WR(5)
High-Z
High-Z
t
LZ
t
WHZ(6)
NOTES(WRITE CYCLE)
1. All write cycle timing is referenced from the last valid address to the first transition address.
2. A write occurs during the overlap of a low CS and WE. A write begins at the latest transition CS going low and WE going low ;
A write ends at the earliest transition CS going high or WE going high. t
WP
is measured from the beginning of write to the end of
write.
3. t
CW
is measured from the later of CS going low to end of write.
4. t
AS
is measured from the address valid to the beginning of write.
5. t
WR
is measured from the end of write to the address change. t
WR
applied in case a write ends as CS or WE going high.
6. If OE, CS and WE are in the Read Mode during this period, the I/O pins are in the output low-Z state. Inputs of opposite phase
of the output must not be applied because bus contention can occur.
7. For common I/O applications, minimization or elimination of bus contention conditions is necessary during read and write cycle.
8. If CS goes low simultaneously with WE going or after WE going low, the outputs remain high impedance state.
9. Dout is the read data of the new address.
10. When CS is low : I/O pins are in the output state. The input signals in the opposite phase leading to the output should not be
applied.
FUNCTIONAL DESCRIPTION
* X means Don
t Care.
CS
WE
OE
Mode
I/O Pin
Supply Current
H
X
X*
Not Select
High-Z
I
SB
, I
SB1
L
H
H
Output Disable
High-Z
I
CC
L
H
L
Read
D
OUT
I
CC
L
L
X
Write
D
IN
I
CC
K6R4004C1A-C, K6R4004C1A-E, K6R4004C1A-I
CMOS SRAM
PRELIMINARY
Rev 2.0
- 8 -
February 1998
#1
32-SOJ-400
#32
20.95
0.12
0.825
0.005
1
0
.
1
6
0
.
4
0
0
+0.10
MAX
21.36
0.841
0.20
-0.05
+0.004
0.008
-0.002
9.40
0.25
0.370
0.010
MAX
0.148
3.76
MIN
0.69
0.027
1.30
( )
0.051
1.30
( )
0.051
0.95
( )
0.0375
+0.10
0.43
-0.05
+0.004
0.017
-0.002
+0.10
0.71
-0.05
+0.004
0.028
-0.002
1.27
0.050
#16
#17
0.004
0.10
MAX
11.18
0.12
0.440
0.005
PACKAGE DIMENSIONS
Units:millimeters/Inches
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