ChipFind - документация

Электронный компонент: Q67000-S94

Скачать:  PDF   ZIP
Semiconductor Group
1
Sep-12-1996
BSP 317
SIPMOS
Small-Signal Transistor
P channel
Enhancement mode
Logic Level
V
GS(th)
= -0.8...-2.0 V
Pin 1
Pin 2
Pin 3
Pin 4
G
D
S
D
Type
V
DS
I
D
R
DS(on)
Package
Marking
BSP 317
-200 V
-0.37 A
6
SOT-223
Type
Ordering Code
Tape and Reel Information
BSP 317
Q67000-S94
E6327
Maximum Ratings
Parameter
Symbol
Values
Unit
Drain source voltage
V
DS
-200
V
Drain-gate voltage
R
GS
= 20 k
V
DGR
-200
Gate source voltage
V
GS
20
Continuous drain current
T
A
= 25 C
I
D
-0.37
A
DC drain current, pulsed
T
A
= 25 C
I
Dpuls
-1.48
Power dissipation
T
A
= 25 C
P
tot
1.8
W
Semiconductor Group
2
Sep-12-1996
BSP 317
Maximum Ratings
Parameter
Symbol
Values
Unit
Chip or operating temperature
T
j
-55 ... + 150
C
Storage temperature
T
stg
-55 ... + 150
Thermal resistance, chip to ambient air
R
thJA
70
K/W
Therminal resistance, junction-soldering point
1)
R
thJS
10
DIN humidity category, DIN 40 040
E
IEC climatic category, DIN IEC 68-1
55 / 150 / 56
1) Transistor on epoxy pcb 40 mm x 40 mm x 1,5 mm with 6 cm
2
copper area for drain connection
Electrical Characteristics, at
T
j
= 25C, unless otherwise specified
Parameter
Symbol
Values
Unit
min.
typ.
max.
Static Characteristics
Drain- source breakdown voltage
V
GS
= 0 V,
I
D
= -0.25 mA,
T
j
= 25 C
V
(BR)DSS
-200
-
-
V
Gate threshold voltage
V
GS=
V
DS,
I
D
= -1 mA
V
GS(th)
-0.8
-1.1
-2
Zero gate voltage drain current
V
DS
= -200 V,
V
GS
= 0 V,
T
j
= 25 C
V
DS
= -200 V,
V
GS
= 0 V,
T
j
= 125 C
V
DS
= -130 V,
V
GS
= 0 V,
T
j
= 25 C
I
DSS
-
-
-
-
-10
-0.1
-100
-100
-1
A
nA
Gate-source leakage current
V
GS
= -20 V,
V
DS
= 0 V
I
GSS
-
-10
-100
nA
Drain-Source on-state resistance
V
GS
= -10 V,
I
D
= -0.37 A
R
DS(on)
-
3.4
6
Semiconductor Group
3
Sep-12-1996
BSP 317
Electrical Characteristics, at
T
j
= 25C, unless otherwise specified
Parameter
Symbol
Values
Unit
min.
typ.
max.
Dynamic Characteristics
Transconductance
V
DS
2
*
I
D *
R
DS(on)max,
I
D
= -0.37 A
g
fs
0.25
0.35
-
S
Input capacitance
V
GS
= 0 V,
V
DS
= 25 V,
f = 1 MHz
C
iss
-
270
360
pF
Output capacitance
V
GS
= 0 V,
V
DS
= 25 V,
f = 1 MHz
C
oss
-
50
75
Reverse transfer capacitance
V
GS
= 0 V,
V
DS
= 25 V,
f = 1 MHz
C
rss
-
15
25
Turn-on delay time
V
DD
= -30 V,
V
GS
= -10 V,
I
D
= -0.29 A
R
GS
= 50
t
d(on)
-
8
12
ns
Rise time
V
DD
= -30 V,
V
GS
= -10 V,
I
D
= -0.29 A
R
GS
= 50
t
r
-
30
45
Turn-off delay time
V
DD
= -30 V,
V
GS
= -10 V,
I
D
= -0.29 A
R
GS
= 50
t
d(off)
-
80
110
Fall time
V
DD
= -30 V,
V
GS
= -10 V,
I
D
= -0.29 A
R
GS
= 50
t
f
-
90
120
Semiconductor Group
4
Sep-12-1996
BSP 317
Electrical Characteristics, at
T
j
= 25C, unless otherwise specified
Parameter
Symbol
Values
Unit
min.
typ.
max.
Reverse Diode
Inverse diode continuous forward current
T
A
= 25 C
I
S
-
-
-0.37
A
Inverse diode direct current,pulsed
T
A
= 25 C
I
SM
-
-
-1.48
Inverse diode forward voltage
V
GS
= 0 V,
I
F
= -0.74 A,
T
j
= 25 C
V
SD
-
-0.95
-1.1
V
Semiconductor Group
5
Sep-12-1996
BSP 317
Power dissipation
P
tot
=
(
T
A
)
0
20
40
60
80
100
120
C
160
T
A
0.0
0.2
0.4
0.6
0.8
1.0
1.2
1.4
1.6
W
2.0
P
tot
Drain current
I
D
=
(
T
A
)
parameter:
V
GS
-10 V
0
20
40
60
80
100
120
C
160
T
A
0.00
-0.04
-0.08
-0.12
-0.16
-0.20
-0.24
-0.28
-0.32
A
-0.38
I
D
Safe operating area
I
D
=f(
V
DS
)
parameter :
D = 0, T
C
=25C
Transient thermal impedance
Z
th JA
=
(
t
p
)
parameter:
D = t
p
/
T
-4
10
-3
10
-2
10
-1
10
0
10
1
10
2
10
K/W
Z
thJC
10
-8
10
-7
10
-6
10
-5
10
-4
10
-3
10
-2
10
-1
10
0
s
t
p
single pulse
0.01
0.02
0.05
0.10
0.20
D = 0.50
Semiconductor Group
6
Sep-12-1996
BSP 317
Typ. output characteristics
I
D
=
(
V
DS
)
parameter:
t
p
= 80 s
0
-1
-2
-3
-4
-5
-6
-7
V
-9
V
DS
0.0
-0.1
-0.2
-0.3
-0.4
-0.5
-0.6
-0.7
A
-0.9
I
D
V
GS
[V]
a
a
-2.0
b
b
-2.5
c
c
-3.0
d
d
-3.5
e
e
-4.0
f
f
-4.5
g
g
-5.0
h
h
-6.0
i
i
-7.0
j
j
-8.0
k
k
-9.0
l
P
tot
= 2W
l
-10.0
Typ. drain-source on-resistance
R
DS (on)
=
(
I
D
)
parameter:
t
p
= 80 s,
T
j
= 25 C
0.00
-0.10
-0.20
-0.30
-0.40
A
-0.60
I
D
0
2
4
6
8
10
12
14
16
19
R
DS (on)
V
GS
[V] =
a
a
-2.0
b
b
-2.5
c
c
-3.0
d
d
-3.5
e
e
-4.0
f
f
-4.5
g
g
-5.0
h
h
-6.0
i
i
-7.0
j
j
-8.0
k
k
-9.0
l
l
-10.0
Typ. transfer characteristics
I
D
= f(V
GS
)
parameter:
t
p
= 80 s
0
-1
-2
-3
-4
-5
-6
-7
-8
V
-10
V
GS
0.0
-0.2
-0.4
-0.6
-0.8
-1.0
-1.2
-1.4
A
-1.8
I
D
Typ. forward transconductance
g
fs
=
f (I
D
)
parameter:
t
p
= 80 s,
0.0
-0.2
-0.4
-0.6
-0.8
-1.0
-1.2
A
-1.6
I
D
0.00
0.05
0.10
0.15
0.20
0.25
0.30
0.35
0.40
0.45
0.50
0.55
S
0.65
g
fs
7
Sep-12-1996
Semiconductor Group
BSP 317
Drain-source on-resistance
R
DS (on)
=
(
T
j
)
parameter:
I
D
= -0.37 A,
V
GS
= -10 V
-60
-20
20
60
100
C
160
T
j
0
2
4
6
8
10
12
14
18
R
DS (on)
typ
98%
Gate threshold voltage
V
GS (th)
=
(
T
j
)
parameter:
V
GS
=
V
DS
,
I
D
= -1 mA
0.0
-0.4
-0.8
-1.2
-1.6
-2.0
-2.4
-2.8
-3.2
-3.6
-4.0
V
-4.6
V
GS(th)
-60
-20
20
60
100
C
160
T
j
2%
typ
98%
Typ. capacitances
C = f (V
DS
)
parameter:
V
GS
=0V,
f = 1 MHz
0
-5
-10
-15
-20
-25
-30
V
-40
V
DS
0
10
1
10
2
10
3
10
pF
C
C
iss
C
rss
C
oss
Forward characteristics of reverse diode
I
F
=
(
V
SD
)
parameter:
T
j
, t
p
= 80 s
-2
-10
-1
-10
0
-10
1
-10
A
I
F
0.0
-0.4
-0.8
-1.2
-1.6
-2.0
-2.4
V
-3.0
V
SD
T
j
= 25 C typ
T
j
= 25 C (98%)
T
j
= 150 C typ
T
j
= 150 C (98%)
Semiconductor Group
8
Sep-12-1996
BSP 317
Drain-source breakdown voltage
V
(BR)DSS
=
(
T
j
)
-60
-20
20
60
100
C
160
T
j
-180
-185
-190
-195
-200
-205
-210
-215
-220
-225
-230
V
-240
V
(BR)DSS
Safe operating area
I
D
=f(
V
DS
)
parameter :
D = 0.01, T
C
=25C
Semiconductor Group
9
Sep-12-1996
BSP 317
Package outlines
SOT-223
Dimensions in mm