September 2003
1
Document Control # ML0016 rev 0.1
STK15C88
32K x 8 AutoStoreTM nvSRAM
QuantumTrapTM CMOS
Nonvolatile Static RAM
FEATURES
Nonvolatile Storage without Battery Problems
Directly Replaces 32K x 8 Static RAM, Battery-
Backed RAM or EEPROM
25ns, 35ns and 45ns Access Times
STORE to nonvolatile elements Initiated by
Software or AutoStoreTM
RECALL to SRAM Initiated by Software or
Power Restore
10mA Typical I
CC
at 200ns Cycle Time
Unlimited READ, WRITE and RECALL Cycles
1,000,000 STORE Cycles to nonvolatile ele-
ments
100-Year Data Retention in nonvolatile ele-
ments (Commercial/Industrial)
Single 5V + 10% Operation
Commercial and Industrial Temperatures
28-Pin PDIP and SOIC Packages
DESCRIPTION
The STK15C88 is a fast
SRAM
with a nonvolatile
element incorporated in each static memory cell.
The
SRAM
can be read and written an unlimited
number of times, while independent nonvolatile data
resides in nonvolatile elements. Data transfers from
the
SRAM
to the nonvolatile elements (the
STORE
operation) can take place automatically on power
down using charge stored in system capacitance.
Transfers from the nonvolatile elements to the
SRAM
(the
RECALL
operation) take place automatically on
restoration of power. Initiation of
STORE
and
RECALL
cycles can also be controlled by entering specific
read sequences. The STK15C88 is pin-compatible
with 32k x 8
SRAM
s and battery-backed
SRAM
s,
allowing direct substitution while enhancing perfor-
mance. A similar device (STK16C88) with an inter-
nally integrated capacitor is available for
applications with very fast power-down slew rates.
The STK14C88, which uses an external capacitor, is
another alternative for these applications.
BLOCK DIAGRAM
QUANTUM TRAP
512 x 512
STORE
RECALL
COLUMN I/O
COLUMN DEC
STATIC RAM
ARRAY
512 x 512
ROW DE
CODE
R
INPU
T B
U
FFERS
STORE/
RECALL
CONTROL
POWER
CONTROL
A
6
A
7
A
11
A
12
A
13
A
14
DQ
0
DQ
1
DQ
2
DQ
3
DQ
4
DQ
5
DQ
6
DQ
7
SOFTWARE
DETECT
V
CC
A
0
-
A
13
G
E
W
A
9
A
8
A
10
A
3
A
2
A
0
A
1
A
4
A
5
PIN CONFIGURATIONS
A
14
A
12
A
7
A
6
A
5
A
4
A
3
A
2
A
1
A
0
DQ
0
DQ
1
DQ
2
V
SS
V
CC
A
13
A
8
A
9
A
11
G
W
1
2
3
4
5
6
7
8
9
10
11
12
13
14
28
27
26
25
24
23
22
21
20
19
18
17
16
15
A
10
E
DQ
7
DQ
6
DQ
5
DQ
4
DQ
3
28 - 300 PDIP
28 - 600 PDIP
28 - 300 SOIC
28 - 350 SOIC
PIN NAMES
A
0
- A
14
Address Inputs
W
Write Enable
DQ
0
- DQ
7
Data In/Out
E
Chip Enable
G
Output Enable
V
CC
Power (+ 5V)
V
SS
Ground
STK15C88
September 2003
2
Document Control # ML0016 rev 0.1
ABSOLUTE MAXIMUM RATINGS
a
Voltage on Input Relative to Ground . . . . . . . . . . . . . .0.5V to 7.0V
Voltage on Input Relative to V
SS
. . . . . . . . . . 0.6V to (V
CC
+ 0.5V)
Voltage on DQ
0-7
. . . . . . . . . . . . . . . . . . . . . . 0.5V to (V
CC
+ 0.5V)
Temperature under Bias . . . . . . . . . . . . . . . . . . . . . 55
C to 125
C
Storage Temperature . . . . . . . . . . . . . . . . . . . . . . . 65
C to 150
C
Power Dissipation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1W
DC Output Current (1 output at a time, 1s duration) . . . . . . . . 15mA
Note a: Stresses greater than those listed under "Absolute Maximum Rat-
ings" may cause permanent damage to the device. This is a stress
rating only, and functional operation of the device at conditions
above those indicated in the operational sections of this specifica-
tion is not implied. Exposure to absolute maximum rating condi-
tions for extended periods may affect reliability.
DC CHARACTERISTICS
(V
CC
= 5.0V
10%)
Note b: I
CC1
and I
CC3
are dependent on output loading and cycle rate. The specified values are obtained with outputs unloaded.
Note c: I
CC2
and I
CC4
are the average currents required for the duration of the respective
STORE
cycles (t
STORE
) .
Note d: E
V
IH
will not produce standby current levels until any nonvolatile cycle in progress has timed out.
AC TEST CONDITIONS
CAPACITANCE
e
(T
A
= 25
C, f = 1.0MHz)
Note e: These parameters are guaranteed but not tested.
SYMBOL
PARAMETER
COMMERCIAL
INDUSTRIAL
UNITS
NOTES
MIN
MAX
MIN
MAX
I
CC1
b
Average V
CC
Current
97
80
70
100
85
70
mA
mA
mA
t
AVAV
= 25ns
t
AVAV
= 35ns
t
AVAV
= 45ns
I
CC2
c
Average V
CC
Current during STORE
3
3
mA
All Inputs Don't Care, V
CC
= max
I
CC3
b
Average V
CC
Current at t
AVAV
= 200ns
5V, 25C, Typical
10
10
mA
W
(V
CC
0.2V)
All Others Cycling, CMOS Levels
I
CC4
c
Average V
CAP
Current during
AutoStoreTM Cycle
2
2
mA
All Inputs Don't Care
I
SB1
d
Average
V
CC
Current
(Standby, Cycling TTL Input Levels)
30
25
22
31
26
23
mA
mA
mA
t
AVAV
= 25ns, E
V
IH
t
AVAV
= 35ns, E
V
IH
t
AVAV
= 45ns, E
V
IH
I
SB2
d
V
CC
Standby Current
(Standby, Stable CMOS Input Levels)
1.5
1.5
mA
E
(V
CC
0.2V)
All Others V
IN
0.2V or
(V
CC
0.2V)
I
ILK
Input Leakage Current
1
1
A
V
CC
= max
V
IN
= V
SS
to V
CC
I
OLK
Off-State Output Leakage Current
5
5
A
V
CC
= max
V
IN
= V
SS
to V
CC
, E or G
V
IH
V
IH
Input Logic "1" Voltage
2.2
V
CC
+ .5
2.2
V
CC
+ .5
V
All Inputs
V
IL
Input Logic "0" Voltage
V
SS
.5
0.8
V
SS
.5
0.8
V
All Inputs
V
OH
Output Logic "1" Voltage
2.4
2.4
V
I
OUT
= 4mA
V
OL
Output Logic "0" Voltage
0.4
0.4
V
I
OUT
= 8mA
T
A
Operating Temperature
0
70
40
85
C
Input Pulse Levels . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 0V to 3V
Input Rise and Fall Times
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
5ns
Input and Output Timing Reference Levels . . . . . . . . . . . . . . . 1.5V
Output Load . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . See Figure 1
SYMBOL
PARAMETER
MAX
UNITS
CONDITIONS
C
IN
Input Capacitance
5
pF
V = 0 to 3V
C
OUT
Output Capacitance
7
pF
V = 0 to 3V
Figure 1: AC Output Loading
480 Ohms
30 pF
255 Ohms
5.0V
INCLUDING
OUTPUT
SCOPE AND
FIXTURE
STK15C88
September 2003
3
Document Control # ML0016 rev 0.1
SRAM READ CYCLES #1 & #2
(V
CC
= 5.0V
10%)
Note f:
W must be high during SRAM READ cycles and low during SRAM WRITE cycles.
Note g: I/O state assumes E, G < V
IL
and W > V
IH
; device is continuously selected.
Note h: Measured + 200mV from steady state output voltage.
SRAM READ CYCLE #1: Address Controlled
f, g
SRAM READ CYCLE #2: E Controlled
f
NO.
SYMBOLS
PARAMETER
STK15C88-25
STK15C88-35
STK15C88-45
UNITS
#1, #2
Alt.
MIN
MAX
MIN
MAX
MIN
MAX
1
t
ELQV
t
ACS
Chip Enable Access Time
25
35
45
ns
2
t
AVAV
f
t
RC
Read Cycle Time
25
35
45
ns
3
t
AVQV
g
t
AA
Address Access Time
25
35
45
ns
4
t
GLQV
t
OE
Output Enable to Data Valid
10
15
20
ns
5
t
AXQX
g
t
OH
Output Hold after Address Change
5
5
5
ns
6
t
ELQX
t
LZ
Chip Enable to Output Active
5
5
5
ns
7
t
EHQZ
h
t
HZ
Chip Disable to Output Inactive
10
13
15
ns
8
t
GLQX
t
OLZ
Output Enable to Output Active
0
0
0
ns
9
t
GHQZ
h
t
OHZ
Output Disable to Output Inactive
10
13
15
ns
10
t
ELICCH
e
t
PA
Chip Enable to Power Active
0
0
0
ns
11
t
EHICCL
d, e
t
PS
Chip Disable to Power Standby
25
35
45
ns
DATA VALID
5
t
AXQX
3
t
AVQV
DQ (DATA OUT)
ADDRESS
2
t
AVAV
STANDBY
DATA VALID
DQ (DATA OUT)
E
ADDRESS
2
t
AVAV
G
I
CC
ACTIVE
1
t
ELQV
11
t
EHICCL
7
t
EHQZ
9
t
GHQZ
6
t
ELQX
8
t
GLQX
4
t
GLQV
10
t
ELICCH
STK15C88
September 2003
4
Document Control # ML0016 rev 0.1
SRAM WRITE CYCLES #1 & #2
(V
CC
= 5.0V
10%)
Note i:
If W is low when E goes low, the outputs remain in the high-impedance state.
Note j:
E or W must be
V
IH
during address transitions.
SRAM WRITE CYCLE #1: W Controlled
j
SRAM WRITE CYCLE #2: E Controlled
j
NO.
SYMBOLS
PARAMETER
STK15C88-25
STK15C88-35
STK15C88-45
UNITS
#1
#2
Alt.
MIN
MAX
MIN
MAX
MIN
MAX
12
t
AVAV
t
AVAV
t
WC
Write Cycle Time
25
35
45
ns
13
t
WLWH
t
WLEH
t
WP
Write Pulse Width
20
25
30
ns
14
t
ELWH
t
ELEH
t
CW
Chip Enable to End of Write
20
25
30
ns
15
t
DVWH
t
DVEH
t
DW
Data Set-up to End of Write
10
12
15
ns
16
t
WHDX
t
EHDX
t
DH
Data Hold after End of Write
0
0
0
ns
17
t
AVWH
t
AVEH
t
AW
Address Set-up to End of Write
20
25
30
ns
18
t
AVWL
t
AVEL
t
AS
Address Set-up to Start of Write
0
0
0
ns
19
t
WHAX
t
EHAX
t
WR
Address Hold after End of Write
0
0
0
ns
20
t
WLQZ
h, i
t
WZ
Write Enable to Output Disable
10
13
15
ns
21
t
WHQX
t
OW
Output Active after End of Write
5
5
5
ns
PREVIOUS DATA
DATA OUT
E
ADDRESS
12
t
AVAV
W
16
t
WHDX
DATA IN
19
t
WHAX
13
t
WLWH
18
t
AVWL
17
t
AVWH
DATA VALID
20
t
WLQZ
15
t
DVWH
HIGH IMPEDANCE
21
t
WHQX
14
t
ELWH
DATA OUT
E
ADDRESS
12
t
AVAV
W
DATA IN
13
t
WLEH
DATA VALID
HIGH IMPEDANCE
14
t
ELEH
18
t
AVEL
17
t
AVEH
15
t
DVEH
19
t
EHAX
16
t
EHDX
STK15C88
September 2003
5
Document Control # ML0016 rev 0.1
AutoStoreTM/POWER-UP RECALL
(V
CC
= 5.0V
10%)
Note k: t
RESTORE
starts from the time V
CC
rises above V
SWITCH
.
AutoStoreTM/POWER-UP RECALL
NO.
SYMBOLS
PARAMETER
STK15C88
UNITS NOTES
Standard
MIN
MAX
22
t
RESTORE
Power-up RECALL Duration
550
s
k
23
t
STORE
STORE Cycle Duration
10
ms
g
24
V
SWITCH
Low Voltage Trigger Level
4.0
4.5
V
25
V
RESET
Low Voltage Reset Level
3.6
V
V
CC
V
SWITCH
V
RESET
POWER-UP RECALL
W
DQ (DATA OUT)
AutoStoreTM
5V
22
t
RESTORE
23
t
STORE
24
25
POWER-UP
RECALL
BROWN OUT
AutoStoreTM
NO RECALL
(V
CC
DID NOT GO
BELOW V
RESET
)
BROWN OUT
AutoStoreTM
RECALL WHEN
V
CC
RETURNS
ABOVE V
SWITCH
BROWN OUT
NO STORE DUE TO
NO SRAM WRITES
NO RECALL
(V
CC
DID NOT GO
BELOW V
RESET
)
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