ChipFind - документация

Электронный компонент: L6919E

Скачать:  PDF   ZIP
1/33
L6919E
September 2003
s
2 PHASE OPERATION WITH
SYNCRHONOUS RECTIFIER CONTROL
s
ULTRA FAST LOAD TRANSIENT RESPONSE
s
INTEGRATED HIGH CURRENT GATE
DRIVERS: UP TO 2A GATE CURRENT
s
TTL-COMPATIBLE 5 BIT PROGRAMMABLE
OUTPUT FROM 0.800V TO 1.550V WITH
25mV STEPS
s
DYNAMIC VID MANAGEMENT
s
0.6% OUTPUT VOLTAGE ACCURACY
s
10% ACTIVE CURRENT SHARING ACCURACY
s
DIGITAL 2048 STEP SOFT-START
s
OVERVOLTAGE PROTECTION
s
OVERCURRENT PROTECTION REALIZED
USING THE LOWER MOSFET'S R
dsON
OR A
SENSE RESISTOR
s
OSCILLATOR EXTERNALLY ADJUSTABLE
AND INTERNALLY FIXED AT 200kHz
s
POWER GOOD OUTPUT AND INHIBIT
FUNCTION
s
REMOTE SENSE BUFFER
s
PACKAGE: SO-28
APPLICATIONS
s
POWER SUPPLY FOR SERVERS AND
WORKSTATIONS
s
POWER SUPPLY FOR HIGH CURRENT
MICROPROCESSORS
s
DISTRIBUTED POWER SUPPLY
DESCRIPTION
The device is a power supply controller specifically
designed to provide a high performance DC/DC
conversion for high current microprocessors. The
device implements a dual-phase step-down con-
troller with a 180 phase-shift between each
phase. A precise 5-bit digital to analog converter
(DAC) allows adjusting the output voltage from
0.800V to 1.550V with 25mV binary steps manag-
ing On-The-Fly VID code changes.
The high precision internal reference assures the
selected output voltage to be within 0.6%. The
high peak current gate drive affords to have fast
switching to the external power mos providing low
switching losses.
The device assures a fast protection against load
over current and load over/under voltage. An inter-
nal crowbar is provided turning on the low side
mosfet if an over-voltage is detected. In case of
over-current, the system works in Constant Cur-
rent mode.
SO-28
ORDERING NUMBERS:L6919E
L6919ETR
5 BIT PROGRAMMABLE DUAL-PHASE CONTROLLER
WITH DYNAMIC VID MANAGEMENT
BLOCK DIAGRAM
C U R R EN T
R EA D IN G
I
FB
TO TAL
C UR REN T
CUR
RE
N
T
AV
G
C H1
O C P
D A C
DIGIT AL
SOFT- START
LO
G
I
C
P
W
M
AD
A
P
T
I
VE
A
N
T
I
CR
O
S
S
C
O
ND
U
C
T
I
O
N
C H1 OCP
2 P
H
A
S
E

OS
C
I
L
L
A
T
O
R
PW M1
CU
R
R
E
N
T
CO
R
R
E
C
T
I
O
N
ERR OR
A MPL IF IER
R EMO TE
BU FFE R
3 2k
3 2k
32k
L S
L S
H S
Vc c
H S
BOO T 1
U
GA T E1
PHAS E1
L GAT E1
ISE N1
PGN DS1
PGN D
PGN DS2
ISE N2
L GAT E2
PHAS E2
U GA T E2
BOO T 2
V c c
COM P
FB
V S EN
FB G
FB R
VID 0
VID 1
VID 2
VID 3
VID 4
PGO O D
O S C / I NH
S GN D
VC C D R
32k
V CC DR
V CC
L
O
G
I
C A
N
D
PR
O
T
EC
T
I
O
N
S
CH 2 OC P
PW M2
C
U
RRE
NT
CO
RR
E
C
T
I
O
N
C H2
O C P
C U R R EN T
R EA D IN G
LO
G
I
C
P
W
M
AD
AP
T
I
V
E
A
N
T
I
CRO
S
S
CO
N
D
U
C
T
I
O
N
C U R R EN T
R EA D IN G
C U R R EN T
R EA D IN G
I
FB
TO TAL
C UR REN T
CUR
RE
N
T
AV
G
C H1
O C P
D A C
DIGIT AL
SOFT- START
LO
G
I
C
P
W
M
AD
A
P
T
I
VE
A
N
T
I
CR
O
S
S
C
O
ND
U
C
T
I
O
N
LO
G
I
C
P
W
M
AD
A
P
T
I
VE
A
N
T
I
CR
O
S
S
C
O
ND
U
C
T
I
O
N
C H1 OCP
2 P
H
A
S
E

OS
C
I
L
L
A
T
O
R
PW M1
CU
R
R
E
N
T
CO
R
R
E
C
T
I
O
N
ERR OR
A MPL IF IER
R EMO TE
BU FFE R
3 2k
3 2k
32k
L S
L S
H S
Vc c
H S
BOO T 1
U
GA T E1
PHAS E1
L GAT E1
ISE N1
PGN DS1
PGN D
PGN DS2
ISE N2
L GAT E2
PHAS E2
U GA T E2
BOO T 2
V c c
COM P
FB
V S EN
FB G
FB R
VID 0
VID 1
VID 2
VID 3
VID 4
PGO O D
O S C / I NH
S GN D
VC C D R
32k
V CC DR
V CC
L
O
G
I
C A
N
D
PR
O
T
EC
T
I
O
N
S
CH 2 OC P
PW M2
C
U
RRE
NT
CO
RR
E
C
T
I
O
N
C H2
O C P
C U R R EN T
R EA D IN G
C U R R EN T
R EA D IN G
LO
G
I
C
P
W
M
AD
AP
T
I
V
E
A
N
T
I
CRO
S
S
CO
N
D
U
C
T
I
O
N
LO
G
I
C
P
W
M
AD
AP
T
I
V
E
A
N
T
I
CRO
S
S
CO
N
D
U
C
T
I
O
N
L6919E
2/33
ABSOLUTE MAXIMUM RATINGS
THERMAL DATA
PIN CONNECTION
Symbol
Parameter
Value
Unit
Vcc, V
CCDR
to PGND
15
V
V
BOOT
-V
PHASE
Boot Voltage
15
V
V
UGATE1
-V
PHASE1
V
UGATE2
-V
PHASE2
15
V
LGATE1, PHASE1, LGATE2, PHASE2 to PGND
-0.3 to Vcc+0.3
V
VID0 to VID4
-0.3 to 5
V
All other pins to PGND
-0.3 to 7
V
V
phase
Sustainable Peak Voltage t < 20ns @ 600kHz
26
V
UGATEx Pin
Maximum Withstanding Voltage Range
Test Condition: CDF-AEC-Q100-002"Human Body Model"
Acceptance Criteria: "Normal Performance"
1000
V
OTHER PINS
2000
V
Symbol
Parameter
Value
Unit
R
th j-amb
Thermal Resistance Junction to Ambient
60
C/W
T
max
Maximum junction temperature
150
C
T
storage
Storage temperature range
-40 to 150
C
T
j
Junction Temperature Range
0 to 125
C
P
MAX
Max power dissipation at T
amb
= 25C
2
W
1
3
2
4
5
6
7
8
9
18
17
16
15
19
20
10
11
12
13
14
24
23
22
21
25
26
27
28
LGATE1
VCCDR
PHASE1
FB
BOOT1
UGATE1
VSEN
VCC
SGND
COMP
ISEN1
PGNDS1
FBR
FBG
VID3
VID2
VID1
VID4
BOOT2
PGOOD
UGATE2
PHASE2
LGATE2
PGND
OSC / INH / FAULT
ISEN2
PGNDS
VID0
L69
19E
3/33
L6919E
ELECTRICAL CHARACTERISTICS
V
CC
= 12V 15%, T
J
= 0 to 70C unless otherwise specified
Symbol
Parameter
Test Condition
Min
Typ
Max
Unit
Vcc SUPPLY CURRENT
I
CC
Vcc supply current
HGATEx and LGATEx open
V
CCDR
=V
BOOT
=12V
7.5
10
12.5
mA
I
CCDR
V
CCDR
supply current
LGATEx open; V
CCDR
=12V
2
3
4
mA
I
BOOTx
Boot supply current
HGATEx open; PHASEx to PGND
V
CC
=V
BOOT
=12V
0.5
1
1.5
mA
POWER-ON
Turn-On V
CC
threshold
V
CC
Rising; V
CCDR
=5V
8.2
9.2
10.2
V
Turn-Off V
CC
threshold
V
CC
Falling; V
CCDR
=5V
6.5
7.5
8.5
V
Turn-On V
CCDR
Threshold
V
CCDR
Rising
V
CC
=12V
4.2
4.4
4.6
V
Turn-Off V
CCDR
Threshold
V
CCDR
Falling
V
CC
=12V
4.0
4.2
4.4
V
OSCILLATOR/INHIBIT/FAULT
f
OSC
Initial Accuracy
OSC = OPEN
OSC = OPEN; Tj=0
C to 125
C
135
127
150
165
178
kHz
kHz
INH
Inhibit threshold
I
SINK
=5mA
0.5
V
d
MAX
Maximum duty cycle
OSC = OPEN; I
FB
= 0
72
80
%
OSC = OPEN; I
FB
= 70
A
30
40
%
Vosc
Ramp Amplitude
3
V
FAULT
Voltage at pin OSC
OVP or UVP Active
4.75
5.0
5.25
V
REFERENCE AND DAC
Output Voltage
Accuracy
VID0, VID1, VID2, VID3, VID4
see Table1;
FBR = V
OUT
; FBG = GND
-0.6
-
0.6
%
I
DAC
VID pull-up Current
VIDx = GND
4
5
6
A
VID pull-up Voltage
VIDx = OPEN
2.9
-
3.3
V
ERROR AMPLIFIER
DC Gain
80
dB
SR
Slew-Rate
COMP=10pF
15
V/
s
DIFFERENTIAL AMPLIFIER (REMOTE BUFFER)
DC Gain
1
V/V
CMRR
Common Mode Rejection Ratio
40
dB
SR
Slew Rate
VSEN=10pF
15
V/
s
L6919E
4/33
DIFFERENTIAL CURRENT SENSING
I
ISEN1
,
I
ISEN2
Bias Current
I
LOAD
= 0
45
50
55
A
I
PGNDSx
Bias Current
45
50
55
A
I
ISEN1
,
I
ISEN2
Bias Current at
Over Current Threshold
80
85
90
A
I
FB
Active Droop Current
I
LOAD
0%
I
LOAD
= 100%
47.5
0
50
1
52.5
A
A
GATE DRIVERS
t
RISE
HGATE
High Side
Rise Time
V
BOOTx
-V
PHASEx
=10V;
C
HGATEx
to PHASEx=3.3nF
15
30
ns
I
HGATEx
High Side
Source Current
V
BOOTx
-V
PHASEx
=10V 2
A
R
HGATEx
High Side
Sink Resistance
V
BOOTx
-V
PHASEx
=12V;
1.5
2
2.5
t
RISE
LGATE
Low Side
Rise Time
V
CCDR
=10V;
C
LGATEx
to PGNDx=5.6nF
30
55
ns
I
LGATEx
Low Side
Source Current
V
CCDR
=10V
1.8
A
R
LGATEx
Low Side
Sink Resistance
V
CCDR
=12V
0.7
1.1
1.5
PROTECTIONS
PGOOD
Upper Threshold
(V
SEN
/DAC Output)
V
SEN
Rising
108
112
116
%
PGOOD
Lower Threshold
(V
SEN
/DAC Output)
V
SEN
Falling
84
88
92
%
OVP
Over Voltage Threshold
(V
SEN
)
V
SEN
Rising
1.915
2.05
V
UVP
Under Voltage Trip
(V
SEN
/DAC Output)
V
SEN
Falling
55
60
65
%
V
PGOODL
PGOOD Voltage Low
I
PGOOD
= -4mA
0.4
V
I
PGOODH
PGOOD Leakage
V
PGOOD
= 5V
1
A
ELECTRICAL CHARACTERISTICS (continued)
V
CC
= 12V 15%, T
J
= 0 to 70C unless otherwise specified
Symbol
Parameter
Test Condition
Min
Typ
Max
Unit
5/33
L6919E
Table 1. Voltage Identification (VID) Codes
The device automatically regulates 25mV higher than the Hammer specs avoiding the use of any external offset resistor
Reference Schematic
VID4 VID3
VID2
VID1
VID0
Output
Voltage (V)
VID4 VID3
VID2
VID1
VID0
Output
Voltage (V)
0
0
0
0
0
1.575
1
0
0
0
0
1.175
0
0
0
0
1
1.550
1
0
0
0
1
1.150
0
0
0
1
0
1.525
1
0
0
1
0
1.125
0
0
0
1
1
1.500
1
0
0
1
1
1.100
0
0
1
0
0
1.475
1
0
1
0
0
1.075
0
0
1
0
1
1.450
1
0
1
0
1
1.050
0
0
1
1
0
1.425
1
0
1
1
0
1.025
0
0
1
1
1
1.400
1
0
1
1
1
1.000
0
1
0
0
0
1.375
1
1
0
0
0
0.975
0
1
0
0
1
1.350
1
1
0
0
1
0.950
0
1
0
1
0
1.325
1
1
0
1
0
0.925
0
1
0
1
1
1.300
1
1
0
1
1
0.900
0
1
1
0
0
1.275
1
1
1
0
0
0.875
0
1
1
0
1
1.250
1
1
1
0
1
0.850
0
1
1
1
0
1.225
1
1
1
1
0
0.825
0
1
1
1
1
1.200
1
1
1
1
1
Shutdown
PGOOD
PGND
PGNDS2
ISEN2
LGATE2
VSEN
FB
PHASE2
UGATE2
BOOT2
VCC
COMP
SGND
OSC / INH
VID0
VID1
VID2
VID3
VID4
PGNDS1
ISEN1
LGATE1
PHASE1
UGATE1
BOOT1
VCCDR
6
24
25
26
27
16
15
2
5
4
3
1
13
14
22
21
20
18
19
7
28
23
10
9
8
11
12
FBR
FBG
17
R
FB
R
F
C
F
Rg
Rg
LS2
HS2
L2
C
IN
C
OUT
S1
S0
S3
S2
S4
Rg
LS1
L1
HS1
Vin
GNDin
PGOOD
L6919E
LOAD
Rg
L6919E
6/33
PIN FUNCTION
N
Name
Description
1
LGATE1
Channel 1 LS driver output.
A little series resistor helps in reducing device-dissipated power.
2
VCCDR
LS drivers supply: it can be varied from 5V to 12V buses.
Filter locally with at least 1
F ceramic cap vs. PGND.
3
PHASE1
Channel 1 HS driver return path. It must be connected to the HS1 mosfet source and provides
the return path for the HS driver of channel 1.
4
UGATE1
Channel 1 HS driver output.
A little series resistor helps in reducing device-dissipated power.
5
BOOT1
Channel 1 HS driver supply. This pin supplies the relative high side driver.
Connect through a capacitor (100nF typ.) to the PHASE1 pin and through a diode to VCC
(cathode vs. boot).
6
VCC
Device supply voltage. The operative supply voltage is 12V 10%.
Filter with 1
F (Typ.) capacitor vs. GND.
7
GND
All the internal references are referred to this pin. Connect it to the PCB signal ground.
8
COMP
This pin is connected to the error amplifier output and is used to compensate the control
feedback loop.
9
FB
This pin is connected to the error amplifier inverting input and is used to compensate the
voltage control feedback loop.
A current proportional to the sum of the current sensed in both channel is sourced from this pin
(50
A at full load, 70
A at the Constant Current threshold). Connecting a resistor between this
pin and VSEN pin allows programming the droop effect.
10
VSEN
Manages Over&Under-voltage conditions and the PGOOD signal. It is internally connected with
the output of the Remote Sense Buffer for Remote Sense of the regulated voltage.
If no Remote Sense is implemented, connect it directly to the regulated voltage in order to
manage OVP, UVP and PGOOD.
Connecting 1nF capacitor max vs. SGND can help in reducing noise injection.
11
FBR
Remote sense buffer non-inverting input. It has to be connected to the positive side of the load
to perform a remote sense.
If no remote sense is implemented, connect directly to the output voltage (in this case connect
also the VSEN pin directly to the output regulated voltage).
12
FBG
Remote sense buffer inverting input. It has to be connected to the negative side of the load to
perform a remote sense.
Pull-down to ground if no remote sense is implemented.
13
ISEN1
Channel 1 current sense pin. The output current may be sensed across a sense resistor or
across the low-side mosfet R
dsON.
This pin has to be connected to the low-side mosfet drain or
to the sense resistor through a resistor Rg.
The net connecting the pin to the sense point must be routed as close as possible to the
PGNDS net in order to couple in common mode any picked-up noise.
14
PGNDS1
Channel 1 Power Ground sense pin. The net connecting the pin to the sense point must be
routed as close as possible to the ISEN1 net in order to couple in common mode any picked-up
noise.
15
PGNDS2
Channel 2 Power Ground sense pin. The net connecting the pin to the sense point must be
routed as close as possible to the ISEN2 net in order to couple in common mode any picked-up
noise.
16
ISEN2
Channel 2 current sense pin. The output current may be sensed across a sense resistor or
across the low-side mosfet R
dsON.
This pin has to be connected to the low-side mosfet drain or
to the sense resistor through a resistor Rg.
The net connecting the pin to the sense point must be routed as close as possible to the
PGNDS net in order to couple in common mode any picked-up noise.
7/33
L6919E
17
OSC/INH
FAULT
Oscillator pin.
It allows programming the switching frequency of each channel: the equivalent switching
frequency at the load side results in being doubled.
Internally fixed at 1.24V, the frequency is varied proportionally to the current sunk (forced) from
(into) the pin with an internal gain of 6kHz/
A (See relevant section for details). If the pin is not
connected, the switching frequency is 150kHz for each channel (300kHz on the load).
The pin is forced high (5V Typ.) when an Over/Under Voltage is detected; to recover from this
condition, cycle VCC.
Forcing the pin to a voltage lower than 0.6V, the device stop operation and enter the inhibit
state.
18-22
VID4-0
Voltage IDentification pins.
Internally pulled-up, connect to GND to program a `0' while leave floating to program a `1'.
They are used to program the output voltage as specified in Table 1 and to set the PGOOD,
OVP and UVP thresholds.
The device automatically regulates 25mV higher than the HAMMER DAC avoiding the use of
any external set-up resistor.
23
PGOOD
This pin is an open collector output and is pulled low if the output voltage is not within the above
specified thresholds and during soft start. It cannot be pulled-up above 5V.
If not used may be left floating.
24
BOOT2
Channel 2 HS driver supply. This pin supplies the relative high side driver.
Connect through a capacitor (100nF typ.) to the PHASE2 pin and through a diode to VCC
(cathode vs. boot).
25
UGATE2
Channel 2 HS driver output.
A little series resistor helps in reducing device-dissipated power.
26
PHASE2
Channel 2 HS driver return path. It must be connected to the HS2 mosfet source and provides
the return path for the HS driver of channel 2.
27
LGATE2
Channel 2 LS driver output.
A little series resistor helps in reducing device-dissipated power.
28
PGND
LS drivers return path.
This pin is common to both sections and it must be connected through the closest path to the
LS mosfets source pins in order to reduce the noise injection into the device.
PIN FUNCTION (continued)
N
Name
Description
L6919E
8/33
DEVICE DESCRIPTION
The device is an integrated circuit realized in BCD technology. It provides complete control logic and protections for
a high performance dual-phase step-down DC-DC converter optimized for microprocessor power supply. It is de-
signed to drive N Channel MOSFETs in a dual-phase synchronous-rectified buck topology. A 180 deg phase shift is
provided between the two phases allowing reduction in the input capacitor current ripple, reducing also the size and
the losses. The output voltage of the converter can be precisely regulated, programming the VID pins, from 0.825V to
1.575V with 25mV binary steps, with a maximum tolerance of 0.6% over temperature and line voltage variations. The
device automatically regulates 25mV higher than the HAMMER DAC avoiding the use of any external set-up resistor.
The device manages On-The-Fly VID Code changes stepping to the new configuration following the VID table with no
need for external components. The device provides an average current-mode control with fast transient response. It
includes a 150kHz free-running oscillator. The error amplifier features a 15V/
s slew rate that permits high converter
bandwidth for fast transient performances. Current information is read across the lower mosfets RdsON or across a
sense resistor in fully differential mode. The current information corrects the PWM output in order to equalize the av-
erage current carried by each phase. Current sharing between the two phases is then limited at 10% over static and
dynamic conditions. The device protects against Over-Current, with an OC threshold for each phase, entering in con-
stant current mode. Since the current is read across the low side mosfets, the constant current keeps constant the
bottom of the inductors current triangular waveform. When an under voltage is detected the device latches and the
FAULT pin is driven high. The device performs also Over-Voltage protection that disables immediately the device turn-
ing ON the lower driver and driving high the FAULT pin.
OSCILLATOR
The switching frequency is internally fixed at 150kHz. Each phase works at the frequency fixed by the oscillator so
that the resulting switching frequency at the load side results in being doubled.
The internal oscillator generates the triangular waveform for the PWM charging and discharging with a constant cur-
rent an internal capacitor. The current delivered to the oscillator is typically 25 A (Fsw=150kHz) and may be varied
using an external resistor (ROSC) connected between OSC pin and GND or Vcc. Since the OSC pin is maintained at
fixed voltage (Typ. 1.237V), the frequency is varied proportionally to the current sunk (forced) from (into) the pin con-
sidering the internal gain of 6KHz/
A.
In particular connecting it to GND the frequency is increased (current is sunk from the pin), while connecting ROSC
to Vcc=12V the frequency is reduced (current is forced into the pin), according to the following relationships:
Note that forcing a 25
A into this pin, the device stops switching because no current is delivered to the oscillator.
Figure 1. R
OSC
vs. Switching Frequency
R
O SC
vs. GND: f
S
150 kHz
1.237
R
O SC
---------------
6
kH z
A
-----------
+
150kHz
7.422 10
6
R
O SC
K
(
)
------------------------------
+
=
=
R
O SC
vs. 12V: f
S
150kHz
12
1.237
R
O SC
---------------------------
6
kHz
A
-----------
150 kHz
6.457 10
7
R
O SC
K
(
)
------------------------------
=
=
0
2000
4000
6000
8000
10000
12000
14000
25
50
75
100
125
150
Frequency (KHz)
R
o
sc(
K



) v
s
.
1
2
V
0
100
200
300
400
500
600
700
800
150
250
350
450
550
650
Frequency (KHz)
R
o
sc(
K



)
vs.
G
N
D
9/33
L6919E
DIGITAL TO ANALOG CONVERTER
The built-in digital to analog converter allows the adjustment of the output voltage from 0.800V to 1.550V with
25mV as shown in the previous table 1. The internal reference is trimmed to ensure output voltage precision of
0.6% and a zero temperature coefficient around 70C. The internal reference voltage for the regulation is pro-
grammed by the voltage identification (VID) pins. These are TTL compatible inputs of an internal DAC that is
realized by means of a series of resistors providing a partition of the internal voltage reference. The VID code
drives a multiplexer that selects a voltage on a precise point of the divider. The DAC output is delivered to an
amplifier obtaining the V
PROG
voltage reference (i.e. the set-point of the error amplifier). Internal pull-ups are
provided (realized with a 5
A current generator up to 3.0V Typ); in this way, to program a logic "1" it is enough
to leave the pin floating, while to program a logic "0" it is enough to short the pin to GND. Programming the
"11111" code, the device enters the NOCPU mode: all mosfets are turned OFF and protections are disabled.
The condition is latched.
The voltage identification (VID) pin configuration also sets the power-good thresholds (PGOOD) and the Over
/ Under Voltage protection (OVP/UVP) thresholds.
DYNAMIC VID TRANSITION
The device is able to manage On-The-Fly VID Code changes that allow Output Voltage modification during nor-
mal device operation. The device checks every clock cycle (synchronously with the PWM ramp) for VID code
modifications. Once the new code is stable for more than one clock cycle, the reference steps up or down in
25mV increments every clock cycle until the new VID code is reached. During the transition, VID code changes
are ignored; the device re-starts monitoring VID after the transition has finished. PGOOD, signal is masked dur-
ing the transition and it is re-activated after the transition has finished while OVP / UVP are still active.
Figure 2. Dynamic VID transition
DRIVER SECTION
The integrated high-current drivers allow using different types of power MOS (also multiple MOS to reduce the
R
dsON
), maintaining fast switching transition.
The drivers for the high-side mosfets use BOOTx pins for supply and PHASEx pins for return. The drivers for
the low-side mosfets use VCCDRV pin for supply and PGND pin for return. A minimum voltage of 4.6V at VC-
CDRV pin is required to start operations of the device.
The controller embodies a sophisticated anti-shoot-through system to minimize low side body diode conduction
time maintaining good efficiency saving the use of Schottky diodes. The dead time is reduced to few nanosec-
onds assuring that high-side and low-side mosfets are never switched on simultaneously: when the high-side
mosfet turns off, the voltage on its source begins to fall; when the voltage reaches 2V, the low-side mosfet gate
drive is applied with 30ns delay. When the low-side mosfet turns off, the voltage at LGATEx pin is sensed. When
it drops below 1V, the high-side mosfet gate drive is applied with a delay of 30ns. If the current flowing in the
inductor is negative, the source of high-side mosfet will never drop.
VID
Reference
V
OUT
t
t
t
1 Clock Cycle Blanking Time
25mV steps transition
L6919E
10/33
Figure 3. Drivers peak current: High Side (left) and Low Side (right)
To allow the turning on of the low-side mosfet even in this case, a watchdog controller is enabled: if the source
of the high-side mosfet don't drop for more than 240ns, the low side mosfet is switched on so allowing the neg-
ative current of the inductor to recirculate. This mechanism allows the system to regulate even if the current is
negative.
The BOOTx and VCCDR pins are separated from IC's power supply (VCC pin) as well as signal ground (SGND
pin) and power ground (PGND pin) in order to maximize the switching noise immunity. The separated supply
for the different drivers gives high flexibility in mosfet choice, allowing the use of logic-level mosfet. Several com-
bination of supply can be chosen to optimize performance and efficiency of the application. Power conversion
is also flexible; 5V or 12V bus can be chosen freely.
The peak current is shown for both the upper and the lower driver of the two phases in figure 3. A 10nF capac-
itive load has been used. For the upper drivers, the source current is 1.9A while the sink current is 1.5A with
V
BOOT -VPHASE
= 12V; similarly, for the lower drivers, the source current is 2.4A while the sink current is 2A with
VCCDR = 12V.
CURRENT READING AND OVER CURRENT
The current flowing trough each phase is read using the voltage drop across the low side mosfets R
dsON
or
across a sense resistor (R
SENSE
) and internally converted into a current. The Tran conductance ratio is issued
by the external resistor Rg placed outside the chip between ISENx and PGNDSx pins toward the reading points.
The full differential current reading rejects noise and allows to place sensing element in different locations with-
out affecting the measurement's accuracy. The current reading circuitry reads the current during the time in
which the low-side mosfet is on (OFF Time). During this time, the reaction keeps the pin ISENx and PGNDSx
at the same voltage while during the time in which the reading circuitry is off, an internal clamp keeps these two
pins at the same voltage sinking from the ISENx pin the necessary current (Needed if low-side mosfet R
dsON
sense is implemented to avoid absolute maximum rating overcome on ISENx pin).
The proprietary current reading circuit allows a very precise and high bandwidth reading for both positive and
negative current. This circuit reproduces the current flowing through the sensing element using a high speed
Track & Hold Tran conductance amplifier. In particular, it reads the current during the second half of the OFF
time reducing noise injection into the device due to the mosfet turn-on (See fig. 4). Track time must be at least
200ns to make proper reading of the delivered current
This circuit sources a constant 50
A current from the PGNDSx pin and keeps the pins ISENx and PGNDSx at
the same voltage. Referring to figure 4, the current that flows in the ISENx pin is then given by the following
equation:
CH3 = HGATE1; CH4 = HGATE2
CH3 = LGATE1; CH4 = LGATE2
I
ISENx
50
A
R
SENSE
I
PHASE
R
g
----------------------------------------------
+
50
A
I
IN FO x
+
=
=
11/33
L6919E
Figure 4. Current Reading Timing (Left) and Circuit (Right)
Where R
SENSE
is an external sense resistor or the rds,on of the low side mosfet and Rg is the transconductance
resistor used between ISENx and PGNDSx pins toward the reading points; I
PHASE
is the current carried by each
phase and, in particular, the current measured in the middle of the oscillator period
The current information reproduced internally is represented by the second term of the previous equation as
follow:
Since the current is read in differential mode, also negative current information is kept; this allow the device to
check for dangerous returning current between the two phases assuring the complete equalization between the
phase's currents. From the current information of each phase, information about the total current delivered (I
FB
=I
INFO1
+I
INFO2
) and the average current for each phase (I
AVG
=(I
INFO1
+I
INFO2
)/2 ) is taken. I
INFOX
is then com-
pared to I
AVG
to give the correction to the PWM output in order to equalize the current carried by the two phases.
The transconductance resistor Rg can be designed in order to have current information of 25
A per phase at
full nominal load; the over current intervention threshold is set at 140% of the nominal (I
INFOx
= 35
A). According
to the above relationship, the over current threshold (I
OCPx
) for each phase, which has to be placed at one half
of the total delivered maximum current, results:
Since the device senses the output current across the low-side mosfets (or across a sense resistors in series
with them) the device limits the bottom of the inductor current triangular waveform: an over current is detected
when the current flowing into the sense element is greater than I
OCPx
(I
INFOx
> 35
A).
Introducing now the maximum ON time dependence with the delivered current (where T is the switching period
T=1/f
SW
):
This linear dependence has a value at zero load of 0.80T and at maximum current of 0.40T typical and results
in two different behaviors of the device:
R
SE
N
S
E
Rg
50



A
I
ISENx
I
PH
A
S
E
Rg
LGATEX
ISENX
PGNDSX
I
LS1
I
LS2
Track & Hold
Total current
information
I
IN FO x
R
SENSE
I
PHASE
R
g
----------------------------------------------
=
I
O C Px
35
A Rg
R
S EN SE
---------------------------
=
Rg
I
OC P x
R
SE NSE
35
A
-------------------------------------------
=
T
O N ,MAX
0.80
I
FB
5.73 k
(
)
T
0.80
R
SENSE
Rg
----------------------
I
O U T
5.73k
T
0.80 T I
F B
0
A
=
0.40 T I
F B
7 0
A
=
=
=
L6919E
12/33
1. T
ON
Limited Output Voltage.
This happens when the maximum ON time is reached before the current in each phase reaches I
OCPx
(I
INFOx
< 35
A).
Figure 5a shows the maximum output voltage that the device is able to regulate considering the T
ON
limitation
imposed by the previous relationship. If the desired output characteristic crosses the T
ON
limited maximum output
voltage, the output resulting voltage will start to drop after crossing. In this case, the device doesn't perform con-
stant current limitation but only limits the maximum ON time following the previous relationship. The output volt-
age follows the resulting characteristic (dotted in Figure 5b) until UVP is detected or anyway until I
FB
= 70
A.
Figure 5. T
ON
Limited Operation
2. Constant Current Operation
This happens when ON time limitation is reached after the current in each phase reaches I
OCPx
(I
INFOx
>35
A).
The device enters in Quasi-Constant-Current operation: the low-side mosfets stays ON until the current read
becomes lower than I
OCPx
(I
INFOx
< 35
A) skipping clock cycles. The high side mosfets can be turned ON with
a T
ON
imposed by the control loop at the next available clock cycle and the device works in the usual way until
another OCP event is detected.
This means that the average current delivered can slightly increase also in Over Current condition since the cur-
rent ripple increases. In fact, the ON time increases due to the OFF time rise because of the current has to reach
the I
OCPx
bottom. The worst-case condition is when the ON time reaches its maximum value.
When this happens, the device works in Constant Current and the output voltage decrease as the load increase.
Crossing the UVP threshold causes the device to latch (FAULT pin is driven high).
Figure 6 shows this working condition
It can be observed that the peak current (Ipeak) is greater than the I
OCPx
but it can be determined as follow:
Where V
outMIN
is the minimum output voltage (VID-30% as follow).
The device works in Constant-Current, and the output voltage decreases as the load increase, until the output
voltage reaches the Under-Voltage threshold (V
outMIN
). When this threshold is crossed, all mosfets are turned
off, the FAULT pin is driven high and the device stops working. Cycle the power supply to restart operation. The
maximum average current during the Constant-Current behavior results:
a) Maximum output Voltage
b) T
ON
Limited Output Voltage
0.80V
IN
0.40V
IN
V
OUT
I
OUT
I
OCP
=2I
OCPx
(I
FB
=70
A)
T
ON
Limited Output
characteristic
0.80V
IN
0.40V
IN
V
OUT
I
OUT
I
OCP
=2I
OCPx
(I
FB
=70
A)
Desired Output
characteristic and
UVP threshold
Resulting Output
characteristic
Ipea k
I
O C Px
V
IN
Vo ut
M IN
L
---------------------------------------
T on
M AX
+
I
O C Px
V
IN
Vo ut
M IN
L
---------------------------------------
0.40 T
+
=
=
I
M AX,TOT
2 I
MA X
2
I
O C Px
Ipe ak
I
OC P x
2
--------------------------------------
+
+
=
13/33
L6919E
Figure 6. Constant Current operation
In this particular situation, the switching frequency results reduced. The ON time is the maximum allowed
(T
onMAX
) while the OFF time depends on the application:
Over current is set anyway when I
INFOx
reaches 35
A (I
FB
= 70
A). The full load value is only a convention
to work with convenient values for I
FB
. Since the OCP intervention threshold is fixed, to modify the percent-
age with respect to the load value, it can be simply considered that, for example, to have on OCP threshold
of 170%, this will correspond to I
INFOx
= 35
A (I
FB
= 70
A). The full load current will then correspond to
I
INFOx
= 20.6
A (I
FB
= 41.1
A).
Integrated Droop Function
The device uses a droop function to satisfy the requirements of high performance microprocessors, reducing
the size and the cost of the output capacitor.
This method "recovers" part of the drop due to the output capacitor ESR in the load transient, introducing a de-
pendence of the output voltage on the load current
As shown in figure 7, the ESR drop is present in any case, but using the droop function the total deviation of the
output voltage is minimized. In practice the droop function introduces a static error (V
DROOP
in figure 8) propor-
tional to the output current. Since the device has an average current mode regulation, the information about the
total current delivered is used to implement the Droop Function.
This current (equal to the sum of both I
INFOx
) is sourced from the FB pin. Connecting a resistor between this pin
and V
OUT
, the total current information flows only in this resistor because the compensation network between
FB and COMP has always a capacitor in series (See fig. 8). The voltage regulated is then equal to:
V
OUT
= V
ID
- R
FB
I
FB
Since I
FB
depends on the current information about the two phases, the output characteristic vs. load current is
given by:
a) Maximum current for each phase
b) Output Characteristic
TonMAX
TonMAX
I
OCPx
Ipeak
I
MAX
Vout
Iout
(I
FB
=50
A)
I
OCP
=2I
OCPx
(I
FB
=70
A)
I
MAX,TOT
UVP
Droop effect
T
O FF
L
Ipe ak
I
OC P x
V
O U T
--------------------------------------
=
f
1
T
ON m a x
T
O FF
+
------------------------------------------
=
V
O U T
VID
R
FB
R
SENSE
Rg
----------------------
I
O U T
=
L6919E
14/33
Figure 7. Output transient response without (a) and with (b) the droop function
Figure 8. Active Droop Function Circuit
The feedback current is equal to 50
A at nominal full load (I
FB
= I
INFO1
+ I
INFO2
) and 70
A at the OC intervention
threshold, so the maximum output voltage deviation is equal to:
V
FULL_POSITIVE_LOAD
= -R
FB
50
A
V
OC_INTERVENTION
= -R
FB
70
A
Droop function is provided only for positive load; if negative load is applied, and then I
INFOx
< 0, no current is
sunk from the FB pin. The device regulates at the voltage programmed by the VID.
REMOTE VOLTAGE SENSE
A remote sense buffer is integrated into the device to allow output voltage remote sense implementation without
any additional external components. In this way, the output voltage programmed is regulated between the re-
mote buffer inputs compensating motherboard trace losses or connector losses if the device is used for a VRM
module. The very low offset amplifier senses the output voltage remotely through the pins FBR and FBG (FBR
is for the regulated voltage sense while FBG is for the ground sense) and reports this voltage internally at VSEN
pin with unity gain eliminating the errors. Keeping the FBR and FBG traces parallel and guarded by a power
plane results in common mode coupling for any picked-up noise.
If remote sense is not required, it is enough connecting RFB directly to the regulated voltage: VSEN becomes
not connected and still senses the output voltage through the remote buffer. In this case the FBG and FBR pins
must be connected anyway to the regulated voltage (See figure 10).
The remote buffer is included in the trimming chain in order to achieve 0.5% accuracy on the output voltage
when the RB Is used: eliminating it from the control loop causes the regulation error to be increased by the RB
offset worsening the device performances.
V
MAX
V
MIN
V
NOM
(a)
(b)
ESR DROP
ESR DROP
V
DROOP
Ref
COMP
FB
To V
O UT
Total Current Info (I
INFO1
+I
INFO2
)
V
DR OOP
R
FB
Ref
COMP
FB
To V
O UT
Total Current Info (I
INFO1
+I
INFO2
)
V
DR OOP
R
FB
15/33
L6919E
Figure 9. - Remote Buffer Connections
OUTPUT VOLTAGE MONITOR AND PROTECTIONS
The device monitors through pin VSEN the regulated voltage in order to build the PGOOD signal and manage
the OVP / UVP conditions.
Power good output is forced low if the voltage sensed by VSEN is not within 12% (Typ.) of the programmed
value. It is an open drain output and it is enabled only after the soft start is finished (2048 clock cycles after start-
up). During Soft-Start this pin is forced low.
Under voltage protection is provided. If the output voltage monitored by VSEN drops below the 60% of the ref-
erence voltage for more than one clock period, the device turns off all mosfets and the OSC/FAULT is driven
high (5V). The condition is latched, to recover it is required to cycle the power supply.
Over Voltage protection is also provided: when the voltage monitored by VSEN reaches the OVP threshold
VOVP the controller permanently switches on both the low-side mosfets and switches off both the high-side
mosfets in order to protect the load. The OSC/ FAULT pin is driven high (5V) and power supply (Vcc) turn off
and on is required to restart operations.
The over voltage percentage is then set by the ratio between the fixed OVP threshold VOVP and the reference
programmed by VID:
Both Over Voltage and Under Voltage are active also during soft start (Under Voltage after than the output volt-
age reaches 0.6V). The reference used in this case to determine the UV thresholds is the increasing voltage
driven by the 2048 soft start digital counter while the reference used for the OV threshold is the final reference
programmed by the VID pins.
SOFT START AND INHIBIT
At start-up a ramp is generated increasing the loop reference from 0V to the final value programmed by VID in
2048 clock periods as shown in figure 10.
Once the soft start begins, the reference is increased: upper and lower MOS begin to switch and the output volt-
age starts to increase with closed loop regulation. At the end of the digital soft start, the Power Good comparator
is enabled and the PGOOD signal is then driven high (See fig. 10). The Under Voltage comparator is enabled
when the reference voltage reaches 0.6V. The Soft-Start will not take place, if both VCC and VCCDR pins are
not above their own turn-on thresholds.
During normal operation, if any under-voltage is detected on one of the two supplies the device shuts down.
Forcing the OSC/INH pin to a voltage lower than 0.6V (Typ.) disables the device: all the power mosfets and
protections are turned off until the condition is removed.
Reference
I
FB
REMOTE
BUFFER
ERROR
AMPLIFIER
FB
COMP
VSEN
FBG
FBR
Remote
Ground
Remote
V
OUT
R
F
C
F
R
FB
64k
64k
64k
64k
Reference
I
FB
REMOTE
BUFFER
ERROR
AMPLIFIER
FB
COMP
VSEN
FBG
FBR
R
F
C
F
R
FB
64k
64k
64k
64k
V
OUT
RB used (0.5% Accuracy)
RB Not Used
O VP %
[ ]
V
O VP
Re feren ceVo ltage VID
(
)
-----------------------------------------------------------------------
100
=
L6919E
16/33
Figure 10. Soft Start
INPUT CAPACITOR
The input capacitor is designed considering mainly the input RMS current that depends on the duty cycle as
reported in figure 11. Considering the dual-phase topology, the input RMS current is highly reduced comparing
with a single phase operation.
Figure 11. Input RMS Current vs. Duty Cycle (D) and Driving Relationships
It can be observed that the input rms value is one half of the single-phase equivalent input current in the worst
case condition that happens for D = 0.25 and D = 0.75.
The power dissipated by the input capacitance is then equal to:
Input capacitor is designed in order to sustain the ripple relative to the maximum load duty cycle. To reach the
high RMS value needed by the CPU power supply application and also to minimize components cost, the input
capacitance is realized by more than one physical capacitor. The equivalent RMS current is simply the sum of
the single capacitor's RMS current.
Input bulk capacitor must be equally divided between high-side drain mosfets and placed as close as possible
Timing Diagram
Acquisition:
(CH1=LGATEx; CH2=VCC; CH3=VOUT;
V
CC
=V
CCDR
V
LGATEx
PGOOD
V
OUT
t
t
t
t
Turn ON threshold
2048 Clock Cycles
0.50 0.75
0.25
0.50
0.25
Single Phase
Dual Phase
Duty Cycle (V
OUT
/V
IN
)
R
m
s
Cu
rr
en
t

No
rm
a
l
i
z
e
d
(I
RM
S
/I
OU
T
)
>
-
<
-
=
0.5
D
if
D)
2
(2
1)
-
(2D
2
OUT
I
5
.
0
D
if
D)
2
(1
2D
2
OUT
I
rms
I
P
R M S
ESR
I
R M S
(
)
2
=
17/33
L6919E
to reduce switching noise above all during load transient. Ceramic capacitor can also introduce benefits in high
frequency noise decoupling, noise generated by parasitic components along power path.
OUTPUT CAPACITOR
Since the microprocessors require a current variation beyond 50A doing load transients, with a slope in the
range of tenth A/
s, the output capacitor is a basic component for the fast response of the power supply.
Dual phase topology reduces the amount of output capacitance needed because of faster load transient response
(switching frequency is doubled at the load connections). Current ripple cancellation due to the 180 phase shift
between the two phases also reduces requirements on the output ESR to sustain a specified voltage ripple.
When a load transient is applied to the converter's output, for first few microseconds the current to the load is sup-
plied by the output capacitors. The controller recognizes immediately the load transient and increases the duty
cycle, but the current slope is limited by the inductor value.
The output voltage has a first drop due to the current variation inside the capacitor (neglecting the effect of the
ESL):
V
OUT
=
I
OUT
ESR
A minimum capacitor value is required to sustain the current during the load transient without discharge it. The
voltage drop due to the output capacitor discharge is given by the following equation:
Where D
MAX
is the maximum duty cycle value. The lower is the ESR, the lower is the output drop during load
transient and the lower is the output voltage static ripple.
INDUCTOR DESIGN
The inductance value is defined by a compromise between the transient response time, the efficiency, the cost
and the size. The inductor has to be calculated to sustain the output and the input voltage variation to maintain
the ripple current
I
L
between 20% and 30% of the maximum output current. The inductance value can be cal-
culated with this relationship:
Where f
SW
is the switching frequency, V
IN
is the input voltage and V
OUT
is the output voltage.
Increasing the value of the inductance reduces the ripple current but, at the same time, reduces the converter
response time to a load transient. The response time is the time required by the inductor to change its current
from initial to final value. Since the inductor has not finished its charging time, the output current is supplied by
the output capacitors. Minimizing the response time can minimize the output capacitance required.
The response time to a load transient is different for the application or the removal of the load: if during the ap-
plication of the load the inductor is charged by a voltage equal to the difference between the input and the output
voltage, during the removal it is discharged only by the output voltage. The following expressions give approx-
imate response time for
I load transient in case of enough fast compensation network response:
The worst condition depends on the input voltage available and the output voltage selected. Anyway the worst
case is the response time after removal of the load with the minimum output voltage programmed and the max-
imum input voltage available.
V
O U T
I
O U T
2
L
4 C
O U T
V
IN
D
MAX
V
O U T
(
)
-----------------------------------------------------------------------------------
=
L
V
IN
V
O U T
f
S W
I
L
------------------------------
V
OU T
V
IN
---------------
=
t
a pplic atio n
L
I
V
IN
V
O U T
------------------------------
=
t
rem ov al
L
I
V
O U T
---------------
=
L6919E
18/33
Figure 12. Inductor ripple current vs V
OUT
MAIN CONTROL LOOP
The control loop is composed by the Current Sharing control loop and the Average Current Mode control loop.
Each loop gives, with a proper gain, the correction to the PWM in order to minimize the error in its regulation:
the Current Sharing control loop equalize the currents in the inductors while the Average Current Mode control
loop fixes the output voltage equal to the reference programmed by VID. Figure 13 reports the block diagram of
the main control loop.
Figure 13. Main Control Loop Diagram
Current Sharing (CS) Control Loop
Active current sharing is implemented using the information from Tran conductance differential amplifier in an
average current mode control scheme. A current reference equal to the average of the read current (I
AVG
) is in-
ternally built; the error between the read current and this reference is converted to a voltage with a proper gain
and it is used to adjust the duty cycle whose dominant value is set by the error amplifier at COMP pin (See fig. 14).
The current sharing control is a high bandwidth control loop allowing current sharing even during load transients.
The current sharing error is affected by the choice of external components; choose precise Rg resistor (1% is
0
1
2
3
4
5
6
7
8
9
0.5
1.5
2.5
3.5
Output Voltage [V]
I
n
du
ct
or R
i
p
p
l
e
[
A
]
L=3
H,
Vin=12V
L=2
H,
Vin=12V
L=1.5
H, Vin=12V
L=2
H,
Vin=5V
L=1.5
H,
Vin=5V
L=3
H, Vin=5V
L1
L2
+
+
PWM1
1/5
+
-
1/5
I
INFO2
I
INFO1
4/5
Z
F(S)
PWM2
C
O
FB
COMP
R
O
ERROR
AMPLIFIER
REFERENCE
PROGRAMMED
BY VID
CURRENT
SHARING
DUTY CYCLE
CORRECTION
R
FB
D02IN1392
19/33
L6919E
necessary) to sense the current. The current sharing error is internally dominated by the voltage offset of Tran
conductance differential amplifier; considering a voltage offset equal to 2mV across the sense resistor, the cur-
rent reading error is given by the following equation:
Where
I
READ
is the difference between one phase current and the ideal current (I
MAX
/2).
For R
SENSE
= 4m
and I
MAX
= 40A the current sharing error is equal to 2.5%, neglecting errors due to Rg and
Rsense mismatches.
Figure 14. Current Sharing Control Loop
Average Current Mode (ACM) Control Loop
The average current mode control loop is reported in figure 15. The current information I
FB
sourced by the FB
pin flows into RFB implementing the dependence of the output voltage from the read current.
The ACM control loop gain results (obtained opening the loop after the COMP pin):
Where:
is the equivalent output resistance determined by the droop function;
Z
P
(s) is the impedance resulting by the parallel of the output capacitor (and its ESR) and the applied
load Ro;
Z
F
(s) is the compensation network impedance;
Z
L
(s) is the parallel of the two inductor impedance;
A(s) is the error amplifier gain;
is the ACM PWM transfer function where
V
OSC
is the oscillator ramp amplitude
and has a typical value of 3V
Removing the dependence from the Error Amplifier gain, so assuming this gain high enough, the control loop
gain results:
I
R E A D
I
M AX
--------------------
2m V
R
SENSE
I
M AX
----------------------------------------
=
L1
L2
+
+
PWM1
1/5
1/5
I
INFO2
I
INFO1
PWM2
COMP
V
OUT
CURRENT
SHARING
DUTY CYCLE
CORRECTION
D02IN1393
G
LO O P
s
( )
PWM Z
F
s
( )
R
D R O O P
Z
P
s
( )
+
(
)
Z
P
s
( )
Z
L
s
( )
+
(
)
Z
F
s
( )
A s
( )
---------------
1
1
A s
( )
------------
+
R
FB
+
--------------------------------------------------------------------------------------------------------------------
=
R
D R OO P
R
s en se
R
g
-------------------
R
FB
=
PWM
4
5
---
V
IN
V
O SC
-------------------
=
L6919E
20/33
With further simplifications, it results:
Considering now that in the application of interest it can be assumed that Ro>>R
L
; ESR<<Ro and
R
DROOP
<<Ro, it results:
The ACM control loop gain is designed to obtain a high DC gain to minimize static error and cross the 0dB axes
with a constant -20dB/dec slope with the desired crossover frequency
T
. Neglecting the effect of Z
F
(s), the
transfer function has one zero and two poles. Both the poles are fixed once the output filter is designed and the
zero is fixed by ESR and the Droop resistance.
To obtain the desired shape an R
F
-C
F
series network is considered for the Z
F
(s) implementation. A zero at
F
=1/R
F
C
F
is then introduced together with an integrator. This integrator minimizes the static error while placing
the zero in correspondence with the L-C resonance a simple -20dB/dec shape of the gain is assured (See Figure
15). In fact, considering the usual value for the output filter, the LC resonance results to be at frequency lower
than the above reported zero.Compensation network can be simply designed placing
Z
=
LC
and imposing
the cross-over frequency
T
as desired obtaining:
Figure 15. ACM Control Loop Gain Block Diagram (left) and Bode Diagram (right)
LAYOUT GUIDELINES
Since the device manages control functions and high-current drivers, layout is one of the most important things
G
LO O P
s
( )
4
5
---
V
IN
V
OS C
-------------------
Z
F
s
( )
Z
P
s
( )
Z
L
s
( )
+
------------------------------------
Rs
Rg
--------
Z
P
s
( )
R
FB
---------------
+
=
G
L OO P
s
( )
4
5
---
V
IN
V
O SC
-------------------
Z
F
s
( )
R
FB
---------------
R o
R
D R O OP
+
R o
R
L
2
-------
+
--------------------------------------
1
s Co
R
D R O O P
//Ro
ESR
+
(
)
+
s
2
C o
L
2
---
s
L
2 R o
---------------
Co ESR
Co
R
L
2
-------
+
+
1
+
+
----------------------------------------------------------------------------------------------------------------------------------
=
G
L OO P
s
( )
4
5
---
V
IN
V
O SC
-------------------
Z
F
s
( )
R
FB
---------------
1
s Co
R
D R O O P
ESR
+
(
)
+
s
2
Co
L
2
---
s
L
2 Ro
---------------
C o ESR
C o
R
L
2
-------
+
+
1
+
+
----------------------------------------------------------------------------------------------------------------------------------
=
R
F
R
FB
V
O SC
V
IN
----------------------------------
5
4
---
T
L
2
R
D R O O P
ESR
+
(
)
--------------------------------------------------------
=
C
F
C o
L
2
---
R
F
--------------------
=
Rout
Cout
ESR
L/2
R
FB
R
F
C
F
REF
PWM
I
FB
V
COMP
V
OUT
d



V
IN
Z
F
dB
T
Z
LC
G
LOOP
Z
F
(s)
K
K
4
5
---
V
I N
V
o sc
---------------
1
R
FB
----------
dB
=
21/33
L6919E
to consider when designing such high current applications.
A good layout solution can generate a benefit in lowering power dissipation on the power paths, reducing radi-
ation and a proper connection between signal and power ground can optimize the performance of the control
loops.
Integrated power drivers reduce components count and interconnections between control functions and drivers,
reducing the board space.
Here below are listed the main points to focus on when starting a new layout and rules are suggested for a cor-
rect implementation.
s
Power Connections.
These are the connections where switching and continuous current flows from the input supply towards the load.
The first priority when placing components has to be reserved to this power section, minimizing the length of
each connection as much as possible.
To minimize noise and voltage spikes (EMI and losses) these interconnections must be a part of a power plane
and anyway realized by wide and thick copper traces. The critical components, i.e. the power transistors, must
be located as close as possible, together and to the controller.
Considering that the "electrical" components reported in figure are composed by more than one "physical" com-
ponent, a ground plane or "star" grounding connection is suggested to minimize effects due to multiple connec-
tions.
Figure 16. Power connections and related connections layout guidelines (same for both phases)
Fig. 16a shows the details of the power connections involved and the current loops. The input capacitance (C
IN
),
V
IN
LOAD
HS
R
gate
LS
R
gate
HGATEx
PHASEx
LGATEx
PGNDx
C
IN
C
OUT
L
D
C
BOOTx
V
IN
LOAD
HS
LS
BOOTx
PHASEx
VCC
SGND
C
IN
C
OUT
L
D
+V
CC
C
VCC
a. PCB power and ground planes areas
b. PCB small signal components placement
L6919E
22/33
or at least a portion of the total capacitance needed, has to be placed close to the power section in order to
eliminate the stray inductance generated by the copper traces. Low ESR and ESL capacitors are required.
s
Power Connections Related.
Fig.16b shows some small signal components placement, and how and where to mix signal and power ground
planes. The distance from drivers and mosfet gates should be reduced as much as possible. Propagation delay
times as well as for the voltage spikes generated by the distributed inductance along the copper traces are so
minimized.
In fact, the further the mosfet is from the device, the longer is the interconnecting gate trace and as a conse-
quence, the higher are the voltage spikes corresponding to the gate PWM rising and falling signals. Even if
these spikes are clamped by inherent internal diodes, propagation delays, noise and potential causes of insta-
bilities are introduced jeopardizing good system behavior. One important consequence is that the switching
losses for the high side mosfet are significantly increased.
For this reason, it is suggested to have the device oriented with the driver side towards the mosfets and the
GATEx and PHASEx traces walking together toward the high side mosfet in order to minimize distance (see fig
17). In addition, since the PHASEx pin is the return path for the high side driver, this pin must be connected
directly to the High Side mosfet Source pin to have a proper driving for this mosfet.
For the LS mosfets, the return path is the PGND pin: it can be connected directly to the power ground plane (if
implemented) or in the same way to the LS mosfets Source pin. GATEx and PHASEx connections (and also
PGND when no power ground plane is implemented) must also be designed to handle current peaks in excess
of 2A (30 mils wide is suggested).
Gate resistors of few ohms help in reducing the power dissipated by the IC without compromising the system
efficiency.
Figure 17. Device orientation (left) and sense nets routing (right)
The placement of other components is also important:
The bootstrap capacitor must be placed as close as possible to the BOOTx and PHASEx pins to mini-
mize the loop that is created.
Decoupling capacitor from Vcc and SGND placed as close as possible to the involved pins.
Decoupling capacitor from VCCDR and PGND placed as close as possible to those pins. This capacitor
sustains the peak currents requested by the low-side mosfet drivers.
Refer to SGND all the sensible components such as frequency set-up resistor (when present) and also
the optional resistor from FB to GND used to give the positive droop effect.
Connect SGND to PGND on the load side (output capacitor) to avoid undesirable load regulation effect
and to ensure the right precision to the regulation when the remote sense buffer is not used.
Towards HS mosfet
(30 mils wide)
Towards LS mosfet
(30 mils wide)
Towards HS mosfet
(30 mils wide)
To LS mosfet
(or sense resistor)
To regulated output
To LS mosfet
(or sense resistor)
23/33
L6919E
An additional 100nF ceramic capacitor is suggested to place near HS mosfet drain. This helps in reduc-
ing noise.
PHASE pin spikes. Since the HS mosfet switches in hard mode, heavy voltage spikes can be observed
on the PHASE pins. If these voltage spikes overcome the max breakdown voltage of the pin, the device
can absorb energy and it can cause damages. The voltage spikes must be limited by proper layout, the
use of gate resistors, Schottky diodes in parallel to the low side mosfets and/or snubber network on the
low side mosfets, to a value lower than 26V, for 20nSec, at FSW of 600kHz max.
s
Current Sense Connections.
Remote Buffer: The input connections for this components must be routed as parallel nets from the FBG/FBR
pins to the load in order to compensate losses along the output power traces and also to avoid the pick-up of
any common mode noise. Connecting these pins in points far from the load, will cause a non-optimum load reg-
ulation, increasing output tolerance.
Current Reading: The Rg resistor has to be placed as close as possible to the ISENx and PGNDSx pins in
order to limit the noise injection into the device. The PCB traces connecting these resistors to the reading point
must be routed as parallel traces in order to avoid the pick-up of any common mode noise. It's also important
to avoid any offset in the measurement and to get a better precision, to connect the traces as close as possible
to the sensing elements, dedicated current sense resistor or low side mosfet R
dsON
.
Moreover, when using the low side mosfet R
dsON
as current sense element, the ISENx pin is practically con-
nected to the PHASEx pin. DO NOT CONNECT THE PINS TOGETHER AND THEN TO THE HS SOURCE!
The device won't work properly because of the noise generated by the return of the high side driver. In this case
route two separate nets: connect the PHASEx pin to the HS Source (route together with HGATEx) with a wide
net (30 mils) and the ISENx pin to the LS Drain (route together with PGNDSx). Moreover, the PGNDSx pin is
always connected, through the Rg resistor, to the PGND: DO NOT CONNECT DIRECTLY TO THE PGND! In
this case the device won't work properly. Route anyway to the LS mosfet source (together with ISENx net).
Right and wrong connections are reported in Figure 18.
Symmetrical layout is also suggested to avoid any unbalance between the two phases of the converter.
Figure 18. PCB layout connections for sense nets
Wrong (left) and correct (right) connections for the current reading sensing nets.
NOT CORRECT
CORRECT
To PHASE
connection
VIA to GND plane
To HS Gate
and Source
To LS Drain
and Source
L6919E
24/33
Demo Board Description
The L6919E demo board shows the operation of the device in a dual phase application. This evaluation board
allows output voltage adjustability (0.800V - 1.550V) through the switches S0-S4 and high output current capa-
bility.
The board has been laid out with the possibility to use up to two D
2
PACK mosfets for the low side switch in order
to give maximum flexibility in the mosfet choice.
The four layers demo board's copper thickness is of 70
m in order to minimize conduction losses considering
the high current that the circuit is able to deliver.
Demo board schematic circuit is reported in Figure 19.
Figure 19. Demo Board Schematic
Several jumpers allow setting different configurations for the device: JP3, JP4 and JP5 allow configuring the
remote buffer as desired. Simply shorting JP4 and JP5 the remote buffer is enabled and it senses the output
voltage on-board; to implement a real remote sense, leave these jumpers open and connect the FBG and FBR
connectors on the demo board to the remote load. To avoid using the remote buffer, simply short all the jumpers
JP3, JP4 and JP5. Local sense through the R7 is used for the regulation.
The input can be configured in different ways using the jumpers JP1, JP2 and JP6; these jumpers control also
the mosfet driver supply voltage. Anyway, power conversion starts from V
IN
and the device is supplied from V
CC
(See Figure 20).
Figure 20. Power supply configuration
PGOOD
PGND
PGNDS2
ISEN2
LGATE2
VSEN
FB
PHASE2
UGATE2
BOOT2
VCC
COMP
SGND
OSC / INH
VID0
VID1
VID2
VID3
VID4
PGNDS1
ISEN1
LGATE1
PHASE1
UGATE1
BOOT1
VCCDR
6
24
25
26
27
16
15
2
5
4
3
1
13
14
22
21
20
18
19
7
28
23
10
9
8
11
12
FBR
FBG
17
C1
R7
R8
C2
R4
R3
Q3
Q4
C3
L2
C7
R11
D3
C6
C11..C13
C14,
C23
R1
JP3
R2
S1
S0
S3
S2
S4
R5
R6
Q1
L1
Q2
C4
D4
C5
Vin
GNDin
GNDCORE
VoutCORE
PGOOD
FBG
FBR
U1
L6919E
DZ1
C8
JP2
JP1
R13
R15
R12
R14
C9,C10
R9
R18
D1
R17
R16
Q1a
Q3a
D2
R19
R20
JP5
JP4
Vcc
GNDcc
JP6
To pin
VCC
R21
R10
C24
Vin
GNDin
DZ1
JP2
JP1
Vcc
GNDcc
JP6
To Vcc pin
To HS Drains (Power Input)
To BOOTx (HS Driver Supply)
To VCCDR pin (LS Driver Supply)
25/33
L6919E
Two main configurations can be distinguished: Single Supply (VCC=VIN=12V) and Double Supply (VCC=12V
VIN=5V or different).
Single Supply: In this case JP6 has to be completely shorted. The device is supplied with the same rail
that is used for the conversion. With an additional zener diode DZ1 a lower voltage can be derived to
supply the mosfets driver if Logic level mosfet are used. In this case JP1 must be left open so that the
HS driver is supplied with V
IN
-V
DZ1
through BOOTx and JP2 must be shorted to the left to use V
IN
or to
the right to use V
IN
-V
DZ1
to supply the LS driver through VCCDR pin. Otherwise, JP1 must be shorted
and JP2 can be freely shorted in one of the two positions.
Double Supply: In this case VCC supply directly the controller (12V) while V
IN
supplies the HS drains
for the power conversion. This last one can start indifferently from the 5V bus (Typ.) or from other buses
allowing maximum flexibility in the power conversion. Supply for the mosfet driver can be programmed
through the jumpers JP1, JP2 and JP6 as previously illustrated. JP6 selects now V
CC
or V
IN
depending
on the requirements.
Some examples are reported in the following Figures 21 and 22.
Figure 21. Jumpers configuration: Double Supply
Figure 22. Jumpers configuration: Single Supply
Vin = 5V
GNDin
DZ1
JP2
JP1
Vcc = 12V
GNDcc
JP6
Vcc = 12V
HS Drains = 5V
HS Supply = 5V
VCCDR (LS Supply) = 5V
Vin = 5V
GNDin
DZ1
JP2
JP1
Vcc = 12V
GNDcc
JP6
Vcc = 12V
HS Drains = 5V
HS Supply = 12V
VCCDR (LS Supply) = 12V
(a) V
CC
= 12V; V
BOOTx
= VCCDR = V
IN
= 5V
(b) V
CC
= V
BOOTx
= VCCDR = 12V; V
IN
= 5V
Vin = 12V
GNDin
DZ1 6.8V
JP2
JP1
Vcc = Open
GNDcc
JP6
Vcc = 12V
HS Drains = 12V
HS Supply = 5.2V
VCCDR (LS Supply) = 12V
Vin = 12V
GNDin
DZ1
JP2
JP1
Vcc = Open
GNDcc
JP6
Vcc = 12V
HS Drains = 12V
HS Supply = 12V
VCCDR (LS Supply) = 12V
(a) V
CC
= V
IN
= VCCDR = 12V; V
BOOTx
= 5.2V
(b) V
CC
= V
IN
= V
BOOTx
= VCCDR = 12V
L6919E
26/33
PCB AND COMPONENT LAYOUT
Figure 23. PCB and Components Layouts (Dimensions: 10.8mm x 8.2mm)
Component Side
Internal PGND Plane
Internal SGND Plane
Solder Side
27/33
L6919E
CPU Power Supply: 5 to 12V
IN
; 1.2V
OUT
; 45A
DC
Considering the high slope for the load transient, a high switching frequency has to be used. In addition to fast
reaction, this helps in reducing output and input capacitor. Inductance value is also reduced.
A switching frequency of 200kHz for each phase is then considered allowing large bandwidth for the compen-
sation network. Considering the high output current, power conversion will start from the 12V bus.
Current Reading Network and Over Current:
Since the maximum output current is I
MAX
= 45A, the over current threshold has been set to 45A (22.5A
x 2)in the worst case (max mosfet temperature). Since the device limits the valley of the triangular ripple
across the inductors, the current ripple must be considered too. Considering the inductor core satura-
tion, a current ripple of 10A has to be considered so that the OCP threshold in worst case becomes
OCPx=17A (22.5A-5A). Considering to sense the output current across the low-side mosfet RdsON,
SUB85N03L-04P has 4.3m
max at 25C that becomes 5.6m
at 100C considering the temperature
variation; the resulting transconductance resistor Rg has to be:
Droop function Design:
Considering a voltage drop of 70mV at full load, the feedback resistor R
FB
has to be:
Inductor design:
Transient response performance needs a compromise in the inductor choice value: the biggest the in-
ductor, the highest the efficient but the worse the transient response and vice versa.
Considering then an inductor value of 0.8
H, the current ripple becomes:
Output Capacitor:
Five Rubycon MBZ (2200
F / 6.3V / 12m
max ESR) has been used implementing a resulting ESR of
2.4m
resulting in an ESR voltage drop of 45A 2.4m
= 108mV after a 45A load transient.
Compensation Network:
A voltage loop bandwidth of 20kHz is considered to let the device fast react after load transient.
The R
F
C
F
network results:
(R8)
(C2)
Further adjustments can be done on the work bench to fit the requirements and to compensate layout parasitic
components.
Rg
I
O C Px
R
d sO N
35
------------------
17
5.6m
35
-------------
2.7k
(R3 to R6)
=
=
=
R
FB
70mV
70
A
----------------
1k
(R7)
=
=
I
Vin
Vout
L
-----------------------------
d
Fsw
-----------
12
1.2
0.8
---------------------
1.2
12
--------
1
200k
-------------
6.5A (L1, L2)
=
=
=
R
F
R
F B
V
O S
V
IN
------------------------------
5
4
---
T
L
2
R
D R OOP
ESR
+
(
)
-------------------------------------------------------
1K 2
12
---------------
5
4
---
20K 2
0.8
2
5.6m
2.7
-------------
1.2k
2.4m
+
---------------------------------------------------------------
2.0k
=
=
=
C
F
C o
L
2
---
R
F
--------------------
6 2200
1
2
-------
2k
-----------------------------------------
33nF
=
=
=
L6919E
28/33
Part List
R2
147k
1%
SMD 0805
R1, R20,R21
Not Mounted
SMD 0805
R3, R4, R5, R6
2.7k
1%
SMD 0805
R7
1k
1%
SMD 0805
R8
1.8k
SMD 0805
R9
47k
1%
SMD 0805
R10
510
SMD 0805
R11
82
SMD 0805
R12 to R19
0
SMD 0805
C1
Not Mounted
SMD 0805
C2
22n
SMD 0805
C3, C4
100n
SMD 0805
C5, C6, C7, C8
1
Ceramic
SMD 1206
C9, C10
10
or 22
/ 16V
TDK Multilayer Ceramic SMD 1206
C11 to C13
1800
/ 16V
Rubycon MBZ
Radial 10x23
C14 to C18
2200
/ 6.3V
Rubycon MBZ
Radial 10x20
C24
100n
SMD 0805
L1, L2
0.8
77121 - 4Turns
U1
L6919E
STMicroelectronics
SO28
Q1, Q3
SUB85N03-04P
Vishay
D
2
PACK
Q2, Q4
SUB70N03-09BP
Vishay
D
2
PACK
D1, D2
STPS340U
STMicroelectronics
SMB
D3, D4
1N4148
STMicroelectronics
SOT23
S0,S4
Short
S1,S2,S3
Open
STATIC PERFORMANCES
Figure 24 shows the demo board measured efficiency versus load current in steady state conditions without air-
flow at ambient temperature.
Figure 24. System Efficiency
50
55
60
65
70
75
80
85
90
0
5
10
15
20
25
30
35
40
45
Output Current [A]
Ef
f
i
ci
en
cy [
%
]
c
29/33
L6919E
Figure 25 shows the mosfets temperature versus output current in steady state condition without any air-flow
or heat sink. It can be observed that the mosfets are under 100C in any conditions. Load regulation is also re-
ported from 10A to 45A.
Figure 25. Mosfet Temperature and Load Regulation
DYNAMIC PERFORMANCES
Figure 26 shows the system response to a load transient from 3A to 45A. The output voltage is contained in the
50mV range. Additional output capacitors can help in reducing the initial voltage spike mainly due to the ESR.
Figure 26. 3A to 45A Load Transient Response
Figure 27 shows the system response to a VID transient from 1.200V to 0.800V and vice versa at minimum load (3A).
Figure 27. Dynamic VID Response
20
30
40
50
60
70
80
90
100
0
5
10
15
20
25
30
35
40
45
Output Current [A]
M
O
S
T
e
m
p
er
atu
r
e
[
o
C]
High-side MOS Q2
High-side MOS Q4
Low -side MOS Q1
Low -side MOS Q3
1.170
1.180
1.190
1.200
1.210
1.220
1.230
1.240
1.250
0
5
10
15
20
25
30
35
40
45
Output Current [A]
V
out
[
V
]
L6919E
30/33
DEMO BOARD ENHANCEMENTS: 1.200V / 52A CPU Power Supply
Considering the same application schematic, minor changes can be done to achieve the 52A thermal output
current required by AMD Hammer processor core. Part list has been modified as follow:
Part List
R2
147k
1%
SMD 0806
R1, R20,R21
Not Mounted
SMD 0805
R3, R4, R5, R6
1.5k
1%
SMD 0805
R7
1k
1%
SMD 0805
R8
1.8k
SMD 0805
R9
47k
1%
SMD 0805
R10
510
SMD 0805
R11
82
SMD 0805
R12 to R19
0
SMD 0805
C1
Not Mounted
SMD 0805
C2
10n
SMD 0805
C3, C4
100n
SMD 0805
C5, C6, C7, C8
1
Ceramic
SMD 1206
C9, C10
10
or 22
/ 16V
TDK Multilayer Ceramic SMD 1206
C11 to C13
1800
/ 16V
Rubycon MBZ
Radial 10x23
C14 to C18
2200
/ 6.3V
Rubycon MBZ
Radial 10x20
C24
100n
SMD 0805
L1, L2
0.8
77121 - 4Turns
U1
L6919E
STMicroelectronics
SO28
Q1, Q1a, Q3, Q3a
SUB85N03-04P
Vishay-Siliconix
D
2
PACK
Q2, Q4
SUB70N03-09BP
Vishay-Siliconix
D
2
PACK
D1, D2
STPS340U
STMicroelectronics
SMB
D3, D4
1N4148
STMicroelectronics
SOT23
S0,S4
Short
S1,S2,S3
Open
STATIC PERFORMANCES
Figure 28 shows the demo board measured efficiency versus load current in steady state conditions without air-
flow at ambient temperature.
Figure 28. System Efficiency
40
45
50
55
60
65
70
75
80
85
90
0
5
10
15
20
25
30
35
40
45
50
55
60
Output Current [A]
E
f
f
i
ci
en
cy [
%
]
31/33
L6919E
Figure 29 shows the mosfets temperature versus output current in steady state condition without any air-flow
or heat sink. It can be observed that the mosfets are under 105C in any conditions. Load regulation is also re-
ported from 10A to 55A.
Figure 29. Mosfet Temperature and Load Regulation.
Figure 30 shows the system response to a load transient from 3A to 45A. The output voltage is contained in the
50mV range. Additional output capacitors can help in reducing the initial voltage spike mainly due to the ESR.
Figure 30. 3A to 45A Load Transient Response
Figure 31 shows the system response to a VID transient from 1.200V to 0.800V and vice versa at minimum load (3A).
Figure 31. Dynamic VID Response
25
35
45
55
65
75
85
95
105
115
0
5
10 15 20 25 30 35 40 45 50 55 60
Output Current [A]
M
O
S T
e
m
p
er
at
u
r
e [
o
C]
High-side M OS Q2
High-side M OS Q4
Lo w-side M OS Q1
Lo w-side M OS Q3
1.155
1.165
1.175
1.185
1.195
1.205
1.215
1.225
1.235
0
5 10 15 20 25 30 35 40 45 50 55 60
Output Current [A]
V
out
[
V
]
L6919E
32/33
SO28
DIM.
mm
inch
MIN.
TYP.
MAX.
MIN.
TYP.
MAX.
A
2.65
0.104
a1
0.1
0.3
0.004
0.012
b
0.35
0.49
0.014
0.019
b1
0.23
0.32
0.009
0.013
C
0.5
0.020
c1
45
(typ.)
D
17.7
18.1
0.697
0.713
E
10
10.65
0.394
0.419
e
1.27
0.050
e3
16.51
0.65
F
7.4
7.6
0.291
0.299
L
0.4
1.27
0.016
0.050
S
8
(max.)
OUTLINE AND
MECHANICAL DATA
Information furnished is believed to be accurate and reliable. However, STMicroelectronics assumes no responsibility for the consequences
of use of such information nor for any infringement of patents or other rights of third parties which may result from its use. No license is granted
by implication or otherwise under any patent or patent rights of STMicroelectronics. Specifications mentioned in this publication are subject
to change without notice. This publication supersedes and replaces all information previously supplied. STMicroelectronics products are not
authorized for use as critical components in life support devices or systems without express written approval of STMicroelectronics.
The ST logo is a registered trademark of STMicroelectronics.
All other names are the property of their respective owners
2003 STMicroelectronics - All rights reserved
STMicroelectronics GROUP OF COMPANIES
Australia - Belgium - Brazil - Canada - China - Czech Republic - Finland - France - Germany - Hong Kong - India - Israel - Italy - Japan -
Malaysia - Malta - Morocco - Singapore - Spain - Sweden - Switzerland - United Kingdom - United States
www.st.com
33/33
L6919E