512 KBIT (32KB X16) OTP EPROM
1/13
September 2000
M27C516
512 Kbit (32Kb x16) OTP EPROM
s
5V 10% SUPPLY VOLTAGE in READ
OPERATION
s
ACCESS TIME: 35ns
s
LOW POWER CONSUMPTION:
Active Current 30mA at 5MHz
Stand-by Current 100A
s
PROGRAMMING VOLTAGE: 12.75V 0.25V
s
PROGRAMMING TIME: 100s/word
s
ELECTRONIC SIGNATURE
Manufacturer Code: 20h
Device Code: 0Fh
DESCRIPTION
The M27C516 is a 512 Kbit EPROM offered in the
OTP range (one time programmable). It is ideally
suited for microprocessor systems requiring large
data or program storage and is organized as
32,768 words of 16 bits.
The M27C516 is offered in a PLCC44 and
TSOP40 (10 x 14 mm) packages.
Figure 1. Logic Diagram
AI00932
15
A0-A14
P
Q0-Q15
VPP
VCC
M27C516
G
E
VSS
16
PLCC44 (C)
TSOP40 (N)
10 x 14 mm
M27C516
2/13
Figure 2B. TSOP Connections
DQ6
DQ3
DQ2
DQ13
DQ8
DQ7
DQ10
DQ9
A14
A8
A11
A10
A4
NC
A9
G
A7
A2
DQ1
DQ0
A0
A1
A3
NC
P
E
DQ14
VPP
VCC
DQ15
AI01600
M27C516
(Normal)
10
1
11
20
21
30
31
40
VSS
A12
A6
A13
A5
DQ12
DQ4
DQ11
DQ5
VSS
Figure 2A. LCC Connections
AI00934
A14
A11
A7
A3
23
Q6
Q5
Q4
Q3
Q2
NC
A2
Q12
Q8
VSS
NC
Q11
Q10
12
NC
A9
1
Q15
VSS
A12
Q13
A5
44
NC
NC
M27C516
Q14
A13
A4
NC
A6
34
Q1
Q9
A10
A8
Q7
Q0
G
A0
A1
V
PP
E
P
V
CC
Table 1. Signal Names
A0-A14
Address Inputs
Q0-Q15
Data Outputs
E
Chip Enable
G
Output Enable
P
Program Enable
V
CC
Supply Voltage
V
PP
Program Supply
V
SS
Ground
NC
Not Connected Internally
DEVICE OPERATION
The operating modes of the M27C516 are listed in
the Operating Modes table. A single power supply
is required in the read mode. All inputs are TTL
levels except for G and 12V on A9 for Electronic
Signature.
Read Mode
The M27C516 has two control functions, both of
which must be logically active in order to obtain
data at the outputs. Chip Enable (E) is the power
control and should be used for device selection.
Output Enable (G) is the output control and should
be used to gate data to the output pins, indepen-
dent of device selection. Assuming that the ad-
dresses are stable, the address access time
(t
AVQV
) is equal to the delay from E to output
(t
ELQV
). Data is available at the output after a delay
of t
GLQV
from the falling edge of G, assuming that
E has been low and the addresses have been sta-
ble for at least t
AVQV
-t
GLQV
.
3/13
M27C516
Table 2. Absolute Maximum Ratings
(1)
Note: 1. Except for the rating "Operating Temperature Range", stresses above those listed in the Table "Absolute Maximum Ratings" may
cause permanent damage to the device. These are stress ratings only and operation of the device at these or any other conditions
above those indicated in the Operating sections of this specification is not implied. Exposure to Absolute Maximum Rating condi-
tions for extended periods may affect device reliability. Refer also to the STMicroelectronics SURE Program and other relevant qual-
ity documents.
2. Minimum DC voltage on Input or Output is 0.5V with possible undershoot to 2.0V for a period less than 20ns. Maximum DC
voltage on Output is V
CC
+0.5V with possible overshoot to V
CC
+2V for a period less than 20ns.
3. Depends on range.
Table 3. Operating Modes
Note: X = V
IH
or V
IL
, V
ID
= 12V 0.5V.
Table 4. Electronic Signature
Note: Outputs Q15-Q8 are set to '0'.
Symbol
Parameter
Value
Unit
T
A
Ambient Operating Temperature
(3)
40 to 125
C
T
BIAS
Temperature Under Bias
50 to 125
C
T
STG
Storage Temperature
65 to 150
C
V
IO
(2)
Input or Output Voltage (except A9)
2 to 7
V
V
CC
Supply Voltage
2 to 7
V
V
A9
(2)
A9 Voltage
2 to 13.5
V
V
PP
Program Supply Voltage
2 to 14
V
Mode
E
G
P
A9
V
PP
Q15-Q0
Read
V
IL
V
IL
V
IH
X
V
CC
Data Output
Output Disable
V
IL
V
IH
X
X
V
CC
Hi-Z
Program
V
IL
X
V
IL
Pulse
X
V
PP
Data Input
Verify
V
IL
V
IL
V
IH
X
V
PP
Data Output
Program Inhibit
V
IH
X
X
X
V
PP
Hi-Z
Standby
V
IH
X
X
X
V
CC
Hi-Z
Electronic Signature
V
IL
V
IL
V
IH
V
ID
V
CC
Codes
Identifier
A0
Q7
Q6
Q5
Q4
Q3
Q2
Q1
Q0
Hex Data
Manufacturer's Code
V
IL
0
0
1
0
0
0
0
0
20h
Device Code
V
IH
0
0
0
0
1
1
1
1
0Fh
M27C516
4/13
Table 5. AC Measurement Conditions
High Speed
Standard
Input Rise and Fall Times
10ns
20ns
Input Pulse Voltages
0 to 3V
0.4V to 2.4V
Input and Output Timing Ref. Voltages
1.5V
0.8V and 2V
Figure 3. AC Testing Input Output Waveform
Figure 4. AC Testing Load Circuit
AI02024B
1.3V
OUT
CL = 30pF or 60pF or 100pF
CL includes JIG capacitance
3.3k
1N914
DEVICE
UNDER
TEST
Table 6. Capacitance
(1)
(T
A
= 25 C, f = 1 MHz)
Note: 1. V
CC
must be applied simultaneously with or before V
PP
and removed simultaneously with or after V
PP
.
2. This parameter is sampled only and not tested 100%.
Symbol
Parameter
Test Condition
Min
Max
Unit
C
IN
Input Capacitance
V
IN
= 0V
6
pF
C
OUT
Output Capacitance
V
OUT
= 0V
12
pF
Standby Mode
The M27C516 has a standby mode which reduces
the supply current from 30mA to 100A. The
M27C516 is placed in the standby mode by apply-
ing a CMOS high signal to the E input. When in the
standby mode, the outputs are in a high imped-
ance state, independent of the G input.
Two Line Output Control
Because OTP EPROMs are usually used in larger
memory arrays, the product features a 2 line con-
trol function which accommodates the use of mul-
tiple memory connection. The two line control
function allows:
a. the lowest possible memory power dissipation,
b. complete assurance that output bus contention
will not occur.
For the most efficient use of these two control
lines, E should be decoded and used as the prima-
ry device selecting function, while G should be
made a common connection to all devices in the
array and connected to the READ line from the
system control bus. This ensures that all deselect-
ed memory devices are in their low power standby
mode and that the output pins are only active
when data is required from a particular memory
device.
5/13
M27C516
Table 7. Read Mode DC Characteristics
(1)
(T
A
= 0 to 70 C or 40 to 85 C; V
CC
= 5V 5% or 5V 10%; V
PP
= V
CC
)
Note: 1. V
CC
must be applied simultaneously with or before V
PP
and removed simultaneously or after V
PP
.
2. Maximum DC voltage on Output is V
CC
+0.5V.
Table 8A. Read Mode AC Characteristics
(1)
(T
A
= 0 to 70 C or 40 to 85 C; V
CC
= 5V 5% or 5V 10%; V
PP
= V
CC
)
Note: 1. V
CC
must be applied simultaneously with or before V
PP
and removed simultaneously or after V
PP
.
2. Sampled only, not 100% tested.
3. Speed obtained with High Speed measurement conditions and a load capacitance of 30pF
4. Speed obtained with a load capacitance of 60pF.
Symbol
Parameter
Test Condition
Min
Max
Unit
I
LI
Input Leakage Current
0V
V
IN
V
CC
1
A
I
LO
Output Leakage Current
0V
V
OUT
V
CC
5
A
I
CC
Supply Current
E = V
IL
, G = V
IL
, f = 5MHz
30
mA
I
CC1
Supply Current (Standby) TTL
E = V
IH
1
mA
I
CC2
Supply Current (Standby) CMOS
E > V
CC
0.3V
100
A
I
PP
Program Current
V
PP
= V
CC
10
A
V
IL
Input Low Voltage
0.3
0.8
V
V
IH
(2)
Input High Voltage
2
V
CC
+ 1
V
V
OL
Output Low Voltage
I
OL
= 2.1mA
0.4
V
V
OH
Output High Voltage TTL
I
OH
= 400A
2.4
V
Output High Voltage CMOS
I
OH
= 100A
V
CC
0.7V
V
Symbol
Alt
Parameter
Test Condition
M27C516
Unit
-35
(3)
-45
(3)
-55
(4)
Min
Max
Min
Max
Min
Max
t
AVQV
t
ACC
Address Valid to Output
Valid
E = V
IL
, G = V
IL
35
45
55
ns
t
ELQV
t
CE
Chip Enable Low to
Output Valid
G = V
IL
35
45
55
ns
t
GLQV
t
OE
Output Enable Low to
Output Valid
E = V
IL
18
23
25
ns
t
EHQZ
(2)
t
DF
Chip Enable High to
Output Hi-Z
G = V
IL
0
18
0
18
0
20
ns
t
GHQZ
(2)
t
DF
Output Enable High to
Output Hi-Z
E = V
IL
0
18
0
18
0
20
ns
t
AXQX
t
OH
Address Transition to
Output Transition
E = V
IL
, G = V
IL
0
0
0
ns
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