STP40N03L-20
N - CHANNEL ENHANCEMENT MODE
"ULTRA HIGH DENSITY" POWER MOS TRANSISTOR
PRELIMINARY DATA
s
TYPICAL R
DS(on)
= 0.016
s
AVALANCHE RUGGED TECHNOLOGY
s
100% AVALANCHE TESTED
s
HIGH CURRENT CAPABILITY
s
175
o
C OPERATING TEMPERATURE
s
HIGH dV/dt CAPABILITY
s
APPLICATION ORIENTED
CHARACTERIZATION
APPLICATIONS
s
HIGH CURRENT, HIGH SPEED SWITCHING
s
POWER MOTOR CONTROL
s
DC-DC & DC-AC CONVERTERS
s
SYNCRONOUS RECTIFICATION
INTERNAL SCHEMATIC DIAGRAM
ABSOLUTE MAXIMUM RATINGS
Symbol
Parameter
Value
Uni t
V
DS
Drain-source Voltage (V
GS
= 0)
30
V
V
DGR
Drain- gate Voltage (R
G S
= 20 k
)
30
V
V
GS
Gate-source Voltage
15
V
I
D
Drain Current (continuous) at T
c
= 25
o
C
40
A
I
D
Drain Current (continuous) at T
c
= 100
o
C
28
A
I
DM
(
)
Drain Current (pulsed)
160
A
P
to t
Total Dissipat ion at T
c
= 25
o
C
90
W
Derating Fact or
0.6
W/
o
C
dV/dt(
1
)
Peak Diode Recovery voltage slope
6
V/ ns
T
st g
St orage Temperature
-65 to 175
o
C
T
j
Max. Operating Junction Temperat ure
175
o
C
(
) Pulse width limited by safe operating area
TYPE
V
DSS
R
DS(on)
I
D
ST P40N03L-20
30 V
< 0.02
40 A
March 1996
1
2
3
TO-220
1/7
THERMAL DATA
R
t hj-ca se
R
t hj- amb
R
thc- si nk
T
l
Thermal Resistance Junction-case
Max
Thermal Resistance Junction-ambient
Max
Thermal Resistance Case-sink
Typ
Maximum Lead T emperature For Soldering Purpose
1.66
62.5
0.5
300
o
C/W
o
C/W
o
C/W
o
C
AVALANCHE CHARACTERISTICS
Symb ol
Parameter
Max Valu e
Uni t
I
AR
Avalanche Current , Repet itive or Not -Repetitive
(pulse widt h limited by T
j
max,
< 1%)
40
A
E
AS
Single Pulse Avalanche Energy
(starting T
j
= 25
o
C, I
D
= I
AR
, V
DD
= 25 V)
300
mJ
E
AR
Repetit ive Avalanche Energy
(pulse widt h limited by T
j
max,
< 1%)
75
mJ
I
AR
Avalanche Current , Repet itive or Not -Repetitive
(T
c
= 100
o
C, pulse width limited by T
j
max,
< 1%)
28
A
ELECTRICAL CHARACTERISTICS (T
case
= 25
o
C unless otherwise specified)
OFF
Symb ol
Parameter
Test Cond ition s
Mi n.
Typ .
Max.
Un it
V
(BR)DSS
Drain-source
Breakdown Volt age
I
D
= 250
A
V
G S
= 0
30
V
I
DSS
Zero Gat e Voltage
Drain Current (V
GS
= 0)
V
DS
= Max Rating
V
DS
= Max Rating x 0. 8
T
c
= 125
o
C
250
1000
A
A
I
GSS
Gate-body Leakage
Current (V
DS
= 0)
V
G S
=
15 V
100
nA
ON (
)
Symb ol
Parameter
Test Cond ition s
Mi n.
Typ .
Max.
Un it
V
GS(th)
Gate T hreshold Voltage V
DS
= V
GS
I
D
= 250
A
1
1.6
2
V
R
DS( on)
St atic Drain-source On
Resistance
V
G S
= 10V
I
D
= 20 A
V
G S
= 10V
I
D
= 20 A
T
c
= 100
o
C
V
G S
= 5V
I
D
= 20 A
0.016
0.019
0.02
0.04
0. 023
I
D(o n)
On Stat e Drain Current
V
DS
> I
D(on)
x R
DS(on) max
V
G S
= 10 V
40
A
DYNAMIC
Symb ol
Parameter
Test Cond ition s
Mi n.
Typ .
Max.
Un it
g
fs
(
)
Forward
Transconductance
V
DS
> I
D(on)
x R
DS(on) max
I
D
= 20 A
15
22
S
C
iss
C
oss
C
rss
Input Capacitance
Output Capacit ance
Reverse Transfer
Capacitance
V
DS
= 25 V
f = 1 MHz
V
GS
= 0
1800
450
180
2300
580
230
pF
pF
pF
STP40N03L-20
2/7
ELECTRICAL CHARACTERISTICS (continued)
SWITCHING ON
Symb ol
Parameter
Test Cond ition s
Mi n.
Typ .
Max.
Un it
t
d(on)
t
r
Turn-on T ime
Rise Time
V
DD
= 15 V
I
D
= 10 A
R
G
= 4.7
V
GS
= 5 V
(see t est circuit, figure 3)
20
80
30
100
ns
ns
(di/ dt)
on
Turn-on Current Slope
V
DD
= 24 V
I
D
= 20 A
R
G
= 50
V
GS
= 5 V
(see t est circuit, figure 5)
200
A/
s
Q
g
Q
gs
Q
gd
Total Gat e Charge
Gate-Source Charge
Gate-Drain Charge
V
DD
= 24 V
I
D
= 20 A
V
G S
= 5 V
40
10
20
60
nC
nC
nC
SWITCHING OFF
Symb ol
Parameter
Test Cond ition s
Mi n.
Typ .
Max.
Un it
t
r(Vof f)
t
f
t
c
Of f-voltage Rise Time
Fall T ime
Cross-over T ime
V
DD
= 24 V
I
D
= 20 A
R
G
= 4.7
V
G S
= 5 V
(see t est circuit, figure 5)
42
45
76
55
60
100
ns
ns
ns
SOURCE DRAIN DIODE
Symb ol
Parameter
Test Cond ition s
Mi n.
Typ .
Max.
Un it
I
SD
I
SDM
(
)
Source-drain Current
Source-drain Current
(pulsed)
40
160
A
A
V
SD
(
)
Forward O n Volt age
I
SD
= 40 A
V
GS
= 0
1.5
V
t
rr
Q
rr
I
RRM
Reverse Recovery
Time
Reverse Recovery
Charge
Reverse Recovery
Current
I
SD
= 20 A
di/ dt = 100 A/
s
V
DD
= 24 V
T
j
= 150
o
C
(see t est circuit, figure 5)
65
0. 12
4
ns
C
A
(
) Pulsed: Pulse duration = 300
s, duty cycle 1.5 %
(
) Pulse width limited by safe operating area
(
1
) I
SD
40 A, di/dt
300 A/
s, V
DD
V
(BR)DSS
, T
j
T
JMAX
STP40N03L-20
3/7
PSPICE PARAMETERS
SUBCIRCUIT COMPONENTS
Symb ol
Parameter
Valu e
Uni t
S1
(V14_16<0) (See Power Mosfet Model Subcircuit)
O N
S2
(V16_11<0) (See Power Mosfet Model Subcircuit)
O N
LD
Drain Induct ance
8
nH
LG
Gate I nductance
10
nH
LS
Source Inductance
10
nH
RDRAIN
Drain Resistance
1.9E
-2
RG ATE
Gate Resistance
1
CG D
Gate Drain Capacitance
3.92
nF
CGS
Gate Source Capacit ance
1. 9
nF
ALFA
Drift Coef icient
1E
-3
V
-1
RG N
Negative Bias Resistance
10
K
DIODE DRAIN GATE (Depletion Capacitance)
Symb ol
Parameter
Valu e
Uni t
CJO
Zero Bias p-n Capacitance
2. 7
nF
VJ
p-n Potential
0.35
V
M
p-n G rading Coef ficient
0.55
DIODE DRAIN SOURCE
Symb ol
Parameter
Valu e
Uni t
CJO
Zero Bias p-n Capacitance
10
nF
VJ
p-n Potential
0.35
V
M
p-n G rading Coef ficient
0.55
TT
Transit Time
20
nsec
N MOSFET
Symb ol
Parameter
Valu e
Uni t
L
Channel Lengt h
1
Meter
W
Channel Width
1
Meter
LEVEL
Model I ndex
3
TO X
Oxide Thickness
1
Met er
VT O
Zero Bias Threshold Voltage
3.25
V
U0
Surface Mobility
600
cm
2
/VS
THETA
Mobility Modulation
0.005
V
-1
Vmax
Maximum Drif t Velocit y
0
Meter/sec
KP
Trans Conductance Coefficient
15
Amp/V
2
For Transient Simulation Applicate U.I.C. (Use Initial Condition) Option
STP40N03L-20
4/7
PSPICE NETLIST OF THE SUBCIRCUIT
. SUBCKT STP40N03L-20 1 2 3
*VALUE OF THE PACKAG E INDUCTANCES
LS 1 11 10n
LG 2 12 10n
LD 3 13 7n
*RESISTA NCE O F T HE G AT E
POLYSILI CON
RG 12 16 1
*EPY AND DRIF T RESISTANCES
RD 13 14 1. 9e-02
EDRI 14 15 POLY(2) (13 14) (13 11) 0 0 0 0
1e-3
*CAPACITANCE G ATE SO URCE
CGS 16 11 1.90n
*OPT IO NAL FO R NEGAT IVE GATE BIAS
*S2 51 11 11 16 SWI TCH
*CGN 51 16 3.92n
*RGN 51 16 10k
*MILLER CAPACI TANCE
CGD 16 17 3.92n
* DEPLET ION CAPACIT ANCE
DGD 17 14 DGD
S1 17 14 16 14 SW ITCH
. MODEL DGD D +I S=
+CJO =2. 6n
+Vj=.1
+M=.6
. MODEL SWITCH VSW IT CH
+RON=1m
+ROF F=1MEG
+VON=0. 1
* OUTPUT CAPACITANCE AND BODY DRAI N DI ODE
DBD 11 14 DBD
. MODEL DBD D
+TT=20n
+CJO =7. 8n
+VJ=.1
+M=.6
* MO DEL OF THE MO SF ET
MMAI N 15 16 11 11 MMAI N L=1u W =1u
. MODEL MMAIN NMO S
+LEVEL=3
+TOX=1
+VTO =3. 25
+uo=600
+THETA=0.005
+VMAX=5e7
+KP=28
. ENDS
Power Mosfet Model Subcircuit
STP40N03L-20
5/7
DIM.
mm
inch
MIN.
TYP.
MAX.
MIN.
TYP.
MAX.
A
4.40
4.60
0.173
0.181
C
1.23
1.32
0.048
0.051
D
2.40
2.72
0.094
0.107
D1
1.27
0.050
E
0.49
0.70
0.019
0.027
F
0.61
0.88
0.024
0.034
F1
1.14
1.70
0.044
0.067
F2
1.14
1.70
0.044
0.067
G
4.95
5.15
0.194
0.203
G1
2.4
2.7
0.094
0.106
H2
10.0
10.40
0.393
0.409
L2
16.4
0.645
L4
13.0
14.0
0.511
0.551
L5
2.65
2.95
0.104
0.116
L6
15.25
15.75
0.600
0.620
L7
6.2
6.6
0.244
0.260
L9
3.5
3.93
0.137
0.154
DIA.
3.75
3.85
0.147
0.151
L6
A
C
D
E
D1
F
G
L7
L2
Dia.
F1
L5
L4
H2
L9
F2
G1
TO-220 MECHANICAL DATA
P011C
STP40N03L-20
6/7
Information furnished is believed to be accurate and reliable. However, SGS-THOMSON Microelectronics assumes no responsability for the
consequences of use of such information nor for any infringement of patents or other rights of third parties which may results from its use. No
license is granted by implication or otherwise under any patent or patent rights of SGS-THOMSON Microelectronics. Specifications mentioned
in this publication are subject to change without notice. This publication supersedes and replaces all information previously supplied.
SGS-THOMSON Microelectronics products are not authorized for use as critical components in life support devices or systems without express
written approval of SGS-THOMSON Microelectonics.
1995 SGS-THOMSON Microelectronics - All Rights Reserved
SGS-THOMSON Microelectronics GROUP OF COMPANIES
Australia - Brazil - France - Germany - Hong Kong - Italy - Japan - Korea - Malaysia - Malta - Morocco - The Netherlands -
Singapore - Spain - Sweden - Switzerland - Taiwan - Thailand - United Kingdom - U.S.A
. . .
STP40N03L-20
7/7