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Электронный компонент: 74ACT11273DW

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74ACT11273
OCTAL D-TYPE FLIP-FLOP
WITH CLEAR
SCAS130 D3443, MARCH 1990 REVISED APRIL 1993
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
Copyright
1993, Texas Instruments Incorporated
21
Inputs Are TTL-Voltage Compatible
Applications Include:
Buffer/Storage Registers
Shift Registers
Pattern Generators
Flow-Through Architecture Optimizes
PCB Layout
Multiple Center-Pin V
CC
and GND
Configurations Minimize High-Speed
Switching Noise
EPIC
t
(Enhanced-Performance Implanted
CMOS) 1-
m
m Process
500-mA Typical Latch-Up Immunity
at 125
C
Package Options Include Plastic
Small-Outline Packages and Standard
Plastic 300-mil DIPs
description
These positive-edge-triggered flip-flops implement D-type flip-flop logic with a direct clear input.
Data at the D inputs meeting the setup time requirements is transferred to the Q outputs on the positive-going
edge of the clock pulse. When the clock input is at either the high or low level, the D input signal has no effect
at the output.
The 74ACT11273 is characterized for operation from 40
C to 85
C.
FUNCTION TABLE
INPUTS
OUTPUT
CLR
CLOCK
D
Q
L
X
X
L
H
H
H
H
L
L
H
L
X
Q0
1
2
3
4
5
6
7
8
9
10
11
12
24
23
22
21
20
19
18
17
16
15
14
13
1Q
2Q
3Q
4Q
GND
GND
GND
GND
5Q
6Q
7Q
8Q
CLR
1D
2D
3D
4D
V
CC
V
CC
5D
6D
7D
8D
CLK
DW OR NT PACKAGE
(TOP VIEW)
1D
CLK
2D
3D
4D
24
13
23
22
21
20
1D
G1
C1
5D
6D
17
16
1Q
2Q
3Q
4Q
1
2
3
4
5Q
6Q
9
10
7D
8D
15
14
7Q
8Q
11
12
CLR
logic symbol
This symbol is in accordance with ANSI/IEEE Std 91-1984
and IEC Publication 617-12.
EPIC is a trademark of Texas Instruments Incorporated.
PRODUCTION DATA information is current as of publication date.
Products conform to specifications per the terms of Texas Instruments
standard warranty. Production processing does not necessarily include
testing of all parameters.
74ACT11273
OCTAL D-TYPE FLIP-FLOP
WITH CLEAR
SCAS130 D3443, MARCH 1990 REVISED APRIL 1993
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
22
logic diagram (positive logic)
13
CLK
CLR
24
1D
23
2D
22
3D
21
4D
20
5D
17
6D
16
7D
15
8D
14
1Q
2Q
3Q
4Q
5Q
6Q
7Q
8Q
1
2
3
4
9
10
11
12
1D
C1
R
1D
C1
R
1D
C1
R
1D
C1
R
1D
C1
R
1D
C1
R
1D
C1
R
1D
C1
R
absolute maximum ratings over operating free-air temperature range (unless otherwise noted)
Supply voltage range, V
CC
0.5 V to 7 V
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Input voltage range, V
I
(see Note 1)
0.5 V to V
CC
+ 0.5 V
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Output voltage range, V
O
(see Note 1)
0.5 V to V
CC
+ 0.5 V
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Input clamp current, I
IK
(V
I
< 0 or V
I
> V
CC
)
20 mA
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Output clamp current, I
OK
(V
O
< 0 or V
O
> V
CC
)
50 mA
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Continuous output current, I
O
(V
O
= 0 to V
CC
)
50 mA
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Continuous current through V
CC
or GND
200 mA
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Storage temperature range
65
C to 150
C
. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
Stresses beyond those listed under "absolute maximum ratings" may cause permanent damage to the device. These are stress ratings only and
functional operation of the device at these or any other conditions beyond those indicated under "recommended operating conditions" is not
implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability.
NOTE 1: The input and output voltage ratings may be exceeded if the input and output current ratings are observed.
recommended operating conditions
MIN
MAX
UNIT
VCC
Supply voltage
4.5
5.5
V
VIH
High-level input voltage
2
V
VIL
Low-level input voltage
0.8
V
VI
Input voltage
0
VCC
V
VO
Output voltage
0
VCC
V
IOH
High-level output current
24
mA
IOL
Low-level output current
24
mA
D
t /
D
v
Input transition rise or fall rate
0
10
ns / V
TA
Operating free-air temperature
40
85
C
74ACT11273
OCTAL D-TYPE FLIP-FLOP
WITH CLEAR
SCAS130 D3443, MARCH 1990 REVISED APRIL 1993
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
23
electrical characteristics over recommended operating free-air temperature range (unless
otherwise noted)
PARAMETER
TEST CONDITIONS
VCC
TA = 25
C
MIN
MAX
UNIT
PARAMETER
TEST CONDITIONS
VCC
MIN
TYP
MAX
MIN
MAX
UNIT
IOH = 50
m
A
4.5 V
4.4
4.4
IOH = 50
m
A
5.5 V
5.4
5.4
VOH
IOH = 24 mA
4.5 V
3.94
3.8
V
OH
IOH = 24 mA
5.5 V
4.94
4.8
IOH = 75 mA
{
5.5 V
3.85
IOL = 50
m
A
4.5 V
0.1
0.1
IOL = 50
m
A
5.5 V
0.1
0.1
VOL
IOL = 24 mA
4.5 V
0.36
0.44
V
OL
IOL = 24 mA
5.5 V
0.36
0.44
IOL = 75 mA
{
5.5 V
1.65
II
VO = VCC or GND
5.5 V
0.1
1
m
A
ICC
VI = VCC or GND,
IO = 0
5.5 V
8
80
m
A
D
ICC
}
One input at 3.4 V,
Other inputs at VCC or GND
5.5 V
0.9
1
mA
Ci
VI = VCC or GND
5 V
4
pF
Not more than one output should be tested at a time, and the duration of the test should not exceed 10 ms.
This is the increase in supply current for each input that is at one of the specified TTL voltage levels rather than 0 V to VCC.
timing requirements over recommended ranges of supply voltage and operating free-air
temperature range (unless otherwise noted) (see Figure 1)
PARAMETER
TA = 25
C
MIN
MAX
UNIT
PARAMETER
MIN
MAX
MIN
MAX
UNIT
fclock
Clock frequency
0
85
0
85
MHz
t
Pulse duration
CLR low
5
5
ns
tw
Pulse duration
CLK high or low
5.9
5.9
ns
Data high
4
4
tsu
Setup time before CLK
Data low
5
5
ns
CLR inactive
4
4
th
Hold time after CLK
1
1
ns
switching characteristics over recommended ranges of supply voltage and operating free-air
temperature (unless otherwise noted) (see Figure 1)
PARAMETER
FROM
TO
TA = 25
C
MIN
MAX
UNIT
PARAMETER
(INPUT)
(OUTPUT)
MIN
TYP
MAX
MIN
MAX
UNIT
fmax
85
85
MHz
tPHL
CLR
Any Q
4.4
9.5
12
4.4
13.3
ns
tPLH
CLK
Any Q
5.4
9.4
11.4
5.4
13.1
ns
tPHL
CLK
Any Q
6
10.3
12.5
6
14.1
ns
operating characteristics, V
CC
= 5 V, T
A
= 25
C
PARAMETER
TEST CONDITIONS
TYP
UNIT
Cpd Power dissipation capacitance
CL = 50 pF, f = 1 MHz
73
pF
74ACT11273
OCTAL D-TYPE FLIP-FLOP
WITH CLEAR
SCAS130 D3443, MARCH 1990 REVISED APRIL 1993
POST OFFICE BOX 655303
DALLAS, TEXAS 75265
24
PARAMETER MEASUREMENT INFORMATION
50% VCC
1.5 V
1.5 V
1.5 V
3 V
3 V
0 V
0 V
th
tsu
VOLTAGE WAVEFORMS
Data Input
tPLH
tPHL
tPHL
tPLH
VOH
VOH
VOL
VOL
1.5 V
1.5 V
3 V
0 V
50% VCC
50% VCC
Input
(see Note B)
Out-of-Phase
Output
In-Phase
Output
Timing Input
(see Note B)
50% VCC
VOLTAGE WAVEFORMS
3 V
0 V
1.5 V
1.5 V
tw
VOLTAGE WAVEFORMS
Input
LOAD CIRCUIT
From Output
Under Test
CL = 50 pF
(see Note A)
500
NOTES: A. CL includes probe and jig capacitance.
B. All input pulses are supplied by generators having the following characteristics: PRR
10 MHz, ZO = 50
, tr = 3 ns, tf = 3 ns.
C. The outputs are measured one at a time with one input transition per measurement.
Figure 1. Load Circuit and Voltage Waveforms
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pertaining to warranty, patent infringement, and limitation of liability.
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accordance with TI's standard warranty. Testing and other quality control techniques are utilized to the extent
TI deems necessary to support this warranty. Specific testing of all parameters of each device is not necessarily
performed, except those mandated by government requirements.
CERTAIN APPLICATIONS USING SEMICONDUCTOR PRODUCTS MAY INVOLVE POTENTIAL RISKS OF
DEATH, PERSONAL INJURY, OR SEVERE PROPERTY OR ENVIRONMENTAL DAMAGE ("CRITICAL
APPLICATIONS"). TI SEMICONDUCTOR PRODUCTS ARE NOT DESIGNED, AUTHORIZED, OR
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In order to minimize risks associated with the customer's applications, adequate design and operating
safeguards must be provided by the customer to minimize inherent or procedural hazards.
TI assumes no liability for applications assistance or customer product design. TI does not warrant or represent
that any license, either express or implied, is granted under any patent right, copyright, mask work right, or other
intellectual property right of TI covering or relating to any combination, machine, or process in which such
semiconductor products or services might be or are used. TI's publication of information regarding any third
party's products or services does not constitute TI's approval, warranty or endorsement thereof.
Copyright
1998, Texas Instruments Incorporated