ChipFind - документация

Электронный компонент: 2SC5886

Скачать:  PDF   ZIP
2SC5886
2002-08-21
1
TOSHIBA Transistor Silicon NPN Epitaxial Type
2SC5886
High-Speed Swtching Applications
DC-DC Converter Applications


High DC current gain: h
FE
= 400 to 1000 (I
C
= 0.5 A)
Low collector-emitter saturation: V
CE (sat)
= 0.22 V (max)
High-speed switching: t
f
= 55 ns (typ.)
Maximum Ratings
(Ta = 25C)
Characteristics Symbol
Rating
Unit
Collector-base voltage
V
CBO
100 V
V
CEX
80
Collector-emitter voltage
V
CEO
50
V
Emitter-base voltage
V
EBO
7 V
DC I
C
5
Collector current
Pulse I
CP
10
A
Base current
I
B
0.5
A
Ta
= 25C
1
Collector power
dissipation
Tc
= 25C
Pc
20
W
Junction temperature
T
j
150
C
Storage temperature range
T
stg
-55 to 150
C
Electrical Characteristics
(Ta = 25C)
Characteristics Symbol
Test
Condition
Min
Typ.
Max
Unit
Collector cut-off current
I
CBO
V
CB
= 100 V, I
E
= 0
100
nA
Emitter cut-off current
I
EBO
V
EB
= 7 V, I
C
= 0
100
nA
Collector-emitter brakedown voltage
V
(BR) CEO
I
C
= 10 mA, I
B
= 0
50
V
h
FE
(1)
V
CE
= 2 V, I
C
= 0.5 A
400
1000
DC current gain
h
FE
(2)
V
CE
= 2 V, I
C
= 1.6 A
200
Collector-emitter saturation voltage
V
CE (sat)
I
C
= 1.6 A, I
B
= 32 mA
0.22
V
Base-emitter saturation voltage
V
BE (sat)
I
C
= 1.6 A, I
B
= 32 mA
1.10
V
Rise time
t
r
63
Storage time
t
stg
560
Switching time
Fall time
t
f
See Figure 1 circuit diagram
V
CC
~
- 24 V, R
L
= 15 W
I
B1
= 32 mA, I
B2
= -53 mA
55
ns
Unit: mm
JEDEC
JEITA SC-64
TOSHIBA 2-7J1A
Weight: 0.36 g (typ.)
2SC5886
2002-08-21
2
Marking
Explanation of Lot No.
C5886
Product No.
Lot No.
Month of manufacture: January to December are denoted by letters A to L respectively.
Year of manufacture: last decimal digit of the year of manufacture
Figure 1 Switching Time Test Circuit & Timing Chart
I
B2
I
B1
20
ms
Output
Input
I
B2
I
B1
R
L
V
CC
Duty cycle
< 1%
2SC5886
2002-08-21
3

























































0.001
0.01
0.01
0.1 1
3
0.03
0.1
10
1
0.05
0.3
0.5
3
5
0.3
0.003
0.03
Common emitter
Tc
= 25C
IC = 2.5 A
1 A
2 A
0.001
10
0.01
0.1 1 10
100
1000
30000
10000
3000
5000
300
500
30
50
0.003
0.03
0.3 3
Common emitter
VCE = 2 V
Tc
= 100C
-55C
25C
0.001
0.01
0.01
0.1 1 10
0.1
1
30
10
3
5
0.3
0.5
0.03
0.05
0.003
0.03
0.3 3
Common emitter
IC/IB = 50
Tc
= -55C
100C
25C
0.001
0.001
0.01 0.1
1 10
0.01
0.1
3
1
0.3
0.5
0.03
0.05
0.003
0.005
0.003 0.03 0.3
3
Common emitter
IC/IB = 50
Tc
= 100C
-55C
25C
0
0
0.5
1
1.5
1
2
Common emitter
VCE = 2 V
-55C
Tc
= 100C
25C
Co
lle
ct
o
r

cu
r
r
e
n
t I
C
(
A
)
B
a
se-
e
mi
tte
r sa
tu
rati
on v
o
ltage
V
BE (sat)
(
V
)
Collector-emitter voltage V
CE
(V)
I
C
V
CE
Co
lle
ct
o
r

cu
r
r
e
n
t I
C
(A
)
Collector current I
C
(A)
h
FE
I
C
D
C

c
u
rr
en
t

g
a
i
n h
FE
Collector current I
C
(A)
V
CE (sat)
I
C
C
o
l
l
e
ct
or
emi
tte
r sa
tu
rati
on v
o
l
t
age
V
CE (sat)
(
V
)
Collector current I
C
(A)
V
BE (sat)
I
C
Base-emitter voltage V
BE
(V)
I
C
V
BE
Base current I
B
(A)
V
CE
I
B
C
o
l
l
e
c
t
or
-e
mi
tte
r s
a
tu
rati
on
v
o
l
t
ag
e
V
CE
(
V
)
0
0
2
4
6
8
2
4
6
Common emitter
Tc
= 25C
10 mA
5 mA
2 mA
IB = 1 mA
70 mA
50 mA
20 mA
30 mA
0
2SC5886
2002-08-21
4

























































Pulse width t
w
(s)
r
th (j-c)
t
w
Collector-emitter voltage V
CEO
(V)
Safe Operation Area
Co
lle
ct
o
r
cu
r
r
e
n
t
I
C
(
A
)
T
r
a
n
sie
n
t t
h
e
r
m
a
l r
e
sistanc
e
(
j
un
ctio
n-

case
)
r
th (j-c)
(C
/
W
)
0.001
0.5
0.01 0.1
1
3
10
50
1
5
30
10
0.003 0.03
0.3
3
Tc
= 25C Infinite heat sink
Curves should be applied in
thermal limited area.
(single nonrepetitive pulse)
0.1
0.01
1 10 100
0.1
1
10
100
0.03
0.05
0.3
0.5
3
5
30
50
*: Single pulse Tc
= 25C
Curves must be derated
linealy with increase in
temperature
IC max (pulsed) *
10
ms*
100
ms*
1 ms*
IC max (continuous)
DC OPERATION
(Tc
= 25C)
10 ms*
100 ms*
V
CEO
max
2SC5886
2002-08-21
5
TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor
devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical
stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of
safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of
such TOSHIBA products could cause loss of human life, bodily injury or damage to property.
In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as
set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and
conditions set forth in the "Handling Guide for Semiconductor Devices," or "TOSHIBA Semiconductor Reliability
Handbook" etc..
The TOSHIBA products listed in this document are intended for usage in general electronics applications
(computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances,
etc.). These TOSHIBA products are neither intended nor warranted for usage in equipment that requires
extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or
bodily injury ("Unintended Usage"). Unintended Usage include atomic energy control instruments, airplane or
spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments,
medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in this
document shall be made at the customer's own risk.
The information contained herein is presented only as a guide for the applications of our products. No
responsibility is assumed by TOSHIBA CORPORATION for any infringements of intellectual property or other
rights of the third parties which may result from its use. No license is granted by implication or otherwise under
any intellectual property or other rights of TOSHIBA CORPORATION or others.
The information contained herein is subject to change without notice.
000707EAA
RESTRICTIONS ON PRODUCT USE