TPC8114
2003-07-14
1
TOSHIBA Field Effect Transistor Silicon P Channel MOS Type (U-MOS)
TPC8114
Lithium Ion Battery Applications
Notebook PC Applications
Portable Equipment Applications
Small footprint due to small and thin package
Low drain-source ON resistance: R
DS (ON)
= 3.1 m (typ.)
High forward transfer admittance: |Y
fs
| = 47 S (typ.)
Low leakage current: I
DSS
= -10 A (max) (V
DS
= -30 V)
Enhancement-mode: V
th
= -0.8 to -2.0 V (V
DS
= -10 V, I
D
= -1 mA)
Maximum Ratings
(Ta = 25C)
Characteristics Symbol
Rating
Unit
Drain-source voltage
V
DSS
-30 V
Drain-gate voltage (R
GS
= 20 k) V
DGR
-30 V
Gate-source voltage
V
GSS
20 V
DC (Note
1)
I
D
-18
Drain current
Pulse (Note 1)
I
DP
-72
A
Drain power dissipation (t
= 10 s)
(Note
2a)
P
D
1.9
W
Drain power dissipation (t
= 10 s)
(Note
2b)
P
D
1.0
W
Single pulse avalanche energy
(Note
3)
E
AS
211
mJ
Avalanche current
I
AR
-18 A
Repetitive avalanche energy
(Note 2a) (Note 4)
E
AR
0.19
mJ
Channel temperature
T
ch
150
C
Storage temperature range
T
stg
-55 to 150
C
Note: For (Note 1), (Note 2), (Note 3) and (Note 4), please refer to the
next page.
This transistor is an electrostatic sensitive device. Please handle with
caution.
Unit: mm
JEDEC
JEITA
TOSHIBA 2-6J1B
Weight: 0.080 g (typ.)
Circuit Configuration
8 6
1 2 3
7
5
4
TPC8114
2003-07-14
2
Thermal Characteristics
Characteristics Symbol
Max
Unit
Thermal resistance, channel to ambient
(t
= 10 s)
(Note 2a)
R
th (ch-a)
65.8
C/W
Thermal resistance, channel to ambient
(t
= 10 s)
(Note 2b)
R
th (ch-a)
125
C/W
Marking
(Note 5)
Note 1: Please use devices on condition that the channel temperature is below 150C.
Note 2:
(a) Device mounted on a glass-epoxy board (a) (b) Device mounted on a glass-epoxy board (b)
Note 3: V
DD
= -24 V, T
ch
= 25C (initial), L = 500H, R
G
= 25 , I
AR
= -18 A
Note 4: Repetitive rating; pulse width limited by maximum channel temperature
Note 5:
on lower left of the marking indicates Pin 1.
(b)
FR-4
25.4
25.4 0.8
(Unit:
mm)
(a)
FR-4
25.4
25.4 0.8
(Unit:
mm)
Type
TPC8114
Lot No.
Weekly code:
(Three digits)
Week of manufacture
(01 for first week of year, continues up to 52 or 53)
Year of manufacture
(One low-order digits of calendar year)
TPC8114
2003-07-14
3
Electrical Characteristics
(Ta
= 25C)
Characteristics Symbol
Test
Condition
Min
Typ.
Max
Unit
Gate leakage current
I
GSS
V
GS
= 16 V, V
DS
= 0 V
10
A
Drain cut-OFF current
I
DSS
V
DS
= -30 V, V
GS
= 0 V
-10
A
V
(BR) DSS
I
D
= -10 mA, V
GS
= 0 V
-30
Drain-source breakdown voltage
V
(BR) DSX
I
D
= -10 mA, V
GS
= 20 V
-15
V
Gate threshold voltage
V
th
V
DS
= -10 V, I
D
= -1 mA
-0.8
-2.0
V
V
GS
= -4 V, I
D
= -9 A
5.2 6.8
Drain-source ON resistance
R
DS (ON)
V
GS
= -10 V, I
D
= -9 A
3.1 4.5
m
Forward transfer admittance
|Y
fs
| V
DS
= -10 V, I
D
= -9 A
23.5 47
S
Input capacitance
C
iss
7480
Reverse transfer capacitance
C
rss
1320
Output capacitance
C
oss
V
DS
= -10 V, V
GS
= 0 V, f = 1 MHz
1460
pF
Rise time
t
r
25
Turn-ON time
t
on
36
Fall time
t
f
235
Switching time
Turn-OFF time
t
off
Duty
<
=
1%, t
w
= 10 s
625
ns
Total gate charge
(gate-source plus gate-drain)
Q
g
180
Gate-source charge 1
Q
gs1
10
Gate-drain ("miller") charge
Q
gd
V
DD
- -24 V, V
GS
= 10 V,
I
D
= -18 A
60
nC
Source-Drain Ratings and Characteristics
(Ta
= 25C)
Characteristics Symbol
Test
Condition
Min
Typ.
Max
Unit
Drain reverse
current
Pulse (Note
1) I
DRP
-72 A
Forward voltage (diode)
V
DSF
I
DR
= -18 A, V
GS
= 0 V
1.2 V
R
L
=
1.7
V
DD
- -15 V
0 V
V
GS
-10 V
4.7
I
D
= -9 A
V
OUT
TPC8114
2003-07-14
4
TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor
devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical
stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of
safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of
such TOSHIBA products could cause loss of human life, bodily injury or damage to property.
In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as
set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and
conditions set forth in the "Handling Guide for Semiconductor Devices," or "TOSHIBA Semiconductor Reliability
Handbook" etc..
The TOSHIBA products listed in this document are intended for usage in general electronics applications
(computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances,
etc.). These TOSHIBA products are neither intended nor warranted for usage in equipment that requires
extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or
bodily injury ("Unintended Usage"). Unintended Usage include atomic energy control instruments, airplane or
spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments,
medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in this
document shall be made at the customer's own risk.
The information contained herein is presented only as a guide for the applications of our products. No
responsibility is assumed by TOSHIBA CORPORATION for any infringements of intellectual property or other
rights of the third parties which may result from its use. No license is granted by implication or otherwise under
any intellectual property or other rights of TOSHIBA CORPORATION or others.
The information contained herein is subject to change without notice.
000707EAA
RESTRICTIONS ON PRODUCT USE
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