 
       
UTRON
                                                      
UT6264C
 
Rev. 1.4
 
 
                       
           
8K X 8 BIT LOW POWER CMOS SRAM
 
 
 
UTRON TECHNOLOGY INC. 
 
P80028 
1F, No. 11, R&D Rd. II, Science-Based Industrial Park, Hsinchu, Taiwan, R. O. C.  
TEL: 886-3-5777882   FAX: 886-3-5777919 
 
 
 
  
1 
 
REVISION HISTORY 
 
REVISION DESCRIPTION 
Date 
Preliminary Rev. 0.1  Original. 
May 3 ,2001 
Rev. 1.0 
Revised 
- 
The timeing waveforms add CE2 control pin 
Jun.4,2001 
Rev. 1.1 
Revised  
- 
Package outline dimension 
- 
Waveform. 
Jan 15,2002 
Rev. 1.2 
Revised 
- 
Improve I
DR
 from 20
A to 10A (LL-version , max.) 
- 
28-pin PDIP package outline dimension 
May 14,2002 
Rev. 1.3 
1.  Add Extended temperature : -20~85 
2.  Revised Operating : 45/30 mA (typ.) 40/30 mA (typ.) 
3.  Revised CMOS Standby : 2 0.3mA (typ.) normal 
4.  Revised DC characteristics : 
a.  Icc(-35) : 45 40mA (typ.), 60 50 mA (max) 
b.  Icc(-70) : 45 40mA (max.) 
c. Icc1(Tcycle=1us)= 
10mA(max.) 
d. Icc2(Tcycle=500ns)=20mA(max.) 
5.  Revised "Order information" : add Extended parts  
Jul 30,2002 
Rev. 1.4 
Add order information for lead free product  
May 15,2003 
 
 
 
 
 
 
 
       
UTRON
                                                      
UT6264C
 
Rev. 1.4
 
 
                       
           
8K X 8 BIT LOW POWER CMOS SRAM
 
 
 
UTRON TECHNOLOGY INC. 
 
P80028 
1F, No. 11, R&D Rd. II, Science-Based Industrial Park, Hsinchu, Taiwan, R. O. C.  
TEL: 886-3-5777882   FAX: 886-3-5777919 
 
 
 
  
2 
 
FEATURES
 
 
 
 
  Access time : 35/70ns (max.)
 
  Low power consumption :   
 
Operating : 40/30 mA (typ.)
  
 
CMOS Standby : 0.3mA (typ.) normal 
2 
A (typ.) L-version   
1 
A (typ.) LL-version 
 
Single 4.5V~5.5V power supply 
 
Operating temperature :  
Commercial : 0~70 
 Extended : -20~85 
  All inputs and outputs TTL compatible 
  Fully static operation 
 Three state outputs 
  Data retention voltage : 2V (min.) 
  Package : 28-pin 600 mil PDIP 
                     28-pin 330 mil SOP 
 
FUNCTIONAL BLOCK DIAGRAM 
 
DECODER
I/O DATA
CIRCUIT
CONTROL
CIRCUIT
8K X 8
MEMORY
ARRAY
COLUMN I/O
OE
WE
A0-A12
Vcc
Vss
I/O1-I/O8
CE
CE2
 
 
 
 
 
 
 
 
 
GENERAL DESCRIPTION 
 
The UT6264C is a 65,536-bit low power CMOS static 
random access memory organized as 8,192 words by 
8 bits. It is fabricated using high performance, high 
reliability CMOS technology.  
 
Easy memory expansion is provided by using two 
chip enable input.(  CE ,CE2) ,and supports low data 
retention voltage for battery back-up operation with 
low data retention current. 
 
The UT6264C operates from a single 4.5V~5.5V 
power supply and all inputs and outputs are fully TTL 
compatible. 
 
PIN CONFIGURATION 
 
A12
A7
A6
A5
A4
A3
A2
A1
A0
I/O1
I/O2
Vcc
A8
A9
A11
A10
I/O8
I/O7
I/O6
I/O5
I/O4
I/O3
Vss
UT6264C
PDIP/SOP
28
14
13
12
11
10
9
8
7
6
5
4
3
2
1
17
16
15
20
19
18
22
23
24
25
26
27
21
CE
WE
OE
CE2
NC
 
PIN DESCRIPTION 
   
 
SYMBOL DESCRIPTION 
A0 - A12 
Address Inputs 
I/O1 - I/O8 
Data Inputs/Outputs 
CE ,CE2 
Chip Enable Inputs 
WE  
Write Enable Input 
OE  
Output Enable Input 
V
CC
 Power 
Supply 
V
SS
 Ground 
NC No 
connection 
 
 
 
       
UTRON
                                                      
UT6264C
 
Rev. 1.4
 
 
                       
           
8K X 8 BIT LOW POWER CMOS SRAM
 
 
 
UTRON TECHNOLOGY INC. 
 
P80028 
1F, No. 11, R&D Rd. II, Science-Based Industrial Park, Hsinchu, Taiwan, R. O. C.  
TEL: 886-3-5777882   FAX: 886-3-5777919 
 
 
 
  
3 
 
ABSOLUTE MAXIMUM RATINGS
*
 
PARAMETER  
SYMBOL 
 
RATING 
UNIT 
 Terminal Voltage with Respect to V
SS
 
 V
TERM
 
 -0.5 to 7.0 
V 
Commercial  
 T
A
 
 0 to 70 
 
 Operating Temperature 
Extended 
 T
A
  
-20 
to 
85   
 Storage Temperature 
 T
STG
  
-65 
to 
150 
 
 Power Dissipation 
 P
D
  
1 
W 
 DC Output Current 
 I
OUT
  
50 
mA 
 Soldering Temperature (under 10 sec) 
 Tsolder 
 260 
 
*Stresses greater than those listed under "Absolute Maximum Ratings" may cause permanent damage to the device. This is a stress rating 
only and functional operation of the device or any other conditions above those indicated in the operational sections of this specification is 
not implied. Exposure to the absolute maximum rating conditions for extended period may affect device reliability.
  
 
TRUTH TABLE
 
  MODE 
CE
 
CE2 
OE  
WE     I/O OPERATION 
 SUPPLY CURRENT 
   Standby 
     H 
X 
     X 
    X 
       High - Z 
       ISB, ISB1 
   Standby 
     X 
L 
     X 
    X 
       High - Z 
       ISB, ISB1 
   Output Disable 
     L 
H 
     H 
    H 
       High - Z 
       Icc,Icc1,Icc2 
   Read 
     L 
H 
     L 
    H 
       
D
OUT
 
       Icc,Icc1,Icc2 
   Write 
     L 
H 
     X 
    L 
       
D
IN
 
       Icc,Icc1,Icc2 
note:  H = V
IH
, L=V
IL
, X = Don't care. 
 
DC ELECTRICAL CHARACTERISTICS 
(V
CC
 = 4.5V~5.5V, T
A
 = 0 to 70/-20 to 85(E)) 
      PARAMETER 
SYMBOL   TEST CONDITION 
 
MIN.  TYP.  MAX. 
UNIT 
 Input High Voltage 
V
IH
1
 
 
2.2 - 
V
CC
+0.5 V 
 Input Low Voltage 
V
IL
2
 
 
- 0.5 
- 
0.8 
V 
 Input Leakage Current 
I
LI
 
V
SS
 
V
IN
 
V
CC
 
- 1 
- 
1 
A 
 Output Leakage Current 
I
LO
 
V
SS
 
V
I/O
V
CC; 
CE =V
IH;
or CE2=V
IL; 
or  OE = V
IH
 ;
or  WE  = V
IL
 
- 1 
- 
1 
A 
 Output High Voltage 
V
OH
 
I
OH
 
= -1mA
 
 2.4 
- 
- 
V 
 Output Low Voltage 
V
OL
 
I
OL
 
= 4mA
 
 - 
- 
0.4 
V 
- 35 
- 
40 
50 
mA 
I
CC
 
CE  = V
IL
 , 
I
I/O
 = 0mA ,Cycle=Min.    
- 70 
- 
30 
40 
mA 
Icc1 
Tcycle 
=1s 
- -  10  mA 
Operating Power 
Supply Current 
Icc2 
CE  = 0.2V; I
I/O
 = 0mA;  
CE2=Vcc-0.2V;  
other pins at 0.2V or V
CC
-0.2V  Tcycle 
=500ns 
- - 
20 
mA 
I
SB
 
CE  =V
IH  
or CE2= V
IL
 
- 1  10  mA 
I
SB1
 
CE V
CC
-0.2V  
or CE2
 0.2V
 
normal 
 0.3  5  mA 
I
SB
 
CE  =V
IH   
or CE2= V
IL
 
-L/-LL -  -  3  mA 
-L - 
2  100  A 
Standby Power 
Supply Current 
I
SB1
 
CE V
CC
-0.2V 
or CE2
 0.2V
 
-LL - 1 50  A 
Notes: 
1. Overshoot : Vcc+2.0v for pulse width less than 10ns.  
2. Undershoot : Vss-2.0v for pulse width less than 10ns. 
3. Overshoot and Undershoot are sampled, not 100% tested. 
 
 
       
UTRON
                                                      
UT6264C
 
Rev. 1.4
 
 
                                        
8K X 8 BIT LOW POWER CMOS SRAM
 
 
 
UTRON TECHNOLOGY INC. 
P80028 
1F, No. 11, R&D Rd. II, Science-Based Industrial Park, Hsinchu, Taiwan, R. O. C.  
TEL: 886-3-5777882   FAX: 886-3-5777919 
 
 
 
  
4 
 
CAPACITANCE 
(T
A
=25, f=1.0MHz)
 
 
 PARAMETER 
SYMBOL 
MIN. 
MAX 
UNIT 
 Input Capacitance 
C
IN
 
- 
8 pF 
 Input/Output Capacitance 
C
I/O
 
- 
10 pF 
Note : These parameters are guaranteed by device characterization, but not production tested. 
 
AC TEST CONDITIONS 
 
   Input Pulse Levels 
0V to 3.0V 
   Input Rise and Fall Times 
5ns 
   Input and Output Timing Reference Levels 
1.5V 
   Output Load 
C
L
 = 100pF, I
OH
/I
OL
 = -1mA/4mA 
 
AC ELECTRICAL CHARACTERISTICS
  
(V
CC 
= 4.5V~5.5V, T
A
 = 0 to 70/-20 to 85(E)) 
 
(1) READ CYCLE 
UT6264C-35 UT6264C-70 
PARAMETER
 
 
SYMBOL
 
MIN. MAX. MIN. MAX. 
UNIT 
 Read Cycle Time 
 t
RC
 
35 - 70 -  ns 
 Address Access Time 
 t
AA
 
- 35 - 70  ns 
 Chip Enable Access Time 
 t
ACE
 
- 35 - 70  ns 
 Output Enable Access Time 
 t
OE
 
- 25 - 35  ns 
 Chip Enable to Output in Low-Z 
 t
CLZ*
 
10 - 10 -  ns 
 Output Enable to Output in Low-Z 
 t
OLZ*
 
5 - 5 -  ns 
 Chip Disable to Output in High-Z 
 t
CHZ*
 
- 25 - 35  ns 
 Output Disable to Output in High-Z 
 t
OHZ*
 
- 25 - 35  ns 
 Output Hold from Address Change 
 t
OH
 
5 - 5 -  ns 
 
(2) WRITE CYCLE
 
UT6264C-35 UT6264C-70 
 PARAMETER 
 SYMBOL 
MIN. MAX. MIN. MAX. 
  UNIT 
 Write Cycle Time 
 t
WC
 
35 - 70 -  ns 
 Address Valid to End of Write 
 t
AW
 
30 - 60 -  ns 
 Chip Enable to End of Write 
 t
CW
 
30 - 60 -  ns 
 Address Set-up Time 
 t
AS
 
0 - 0 -  ns 
 Write Pulse Width 
 t
WP
 
25 - 50 -  ns 
 Write Recovery Time 
 t
WR
 
0 - 0 -  ns 
 Data to Write Time Overlap 
 t
DW
 
20 - 30 -  ns 
 Data Hold from End of Write-Time 
 t
DH
 
0 - 0 -  ns 
 Output Active from End of Write 
 t
OW*
 
5 - 5 -  ns 
 Write to Output in High-Z 
 t
WHZ*
 
- 15 - 25  ns 
*These parameters are guaranteed by device characterization, but not production tested.