1
White Electronic Designs Corporation (508) 366-5151 www.whiteedc.com
Sept. 2002 Rev. 4A
ECO #15528
EDI7F33512C
EDI7F33512C-BNC: 512Kx32 80 PIN SIMM
512Kx32, 2x512Kx32 and 4x512Kx32 Densities
Based on AMDs - AM290F040 Flash Device
Fast Read Access Time - 80-150ns
5- Volt-Only Reprogramming
Sector Erase Architecture
Uniform sectors of 64 Kbytes each
Any combination of sectors can be erased
Also supports full chip erase
Sector Protection
Hardware method that disables any combination of sectors
from write or erase operations
Embedded Erase Algorithms
Automatically preprograms and erases the chip or any com-
bination of sectors
Embedded Program Algorithms
Automatically programs and verifies data at specified ad-
dress
Data Polling and Toggle Bit feature for detection of program or
erase cycle completion
Low Power Dissipation
40mA per Device Active Current
10A per Device CMOS Standby Current
Typical Endurance >100,000 Cycles
Single 5 Volt 10% Supply
CMOS and TTL Compatible Inputs and Outputs
Commercial and Industrial Temperature Range
Package
80 Pin SIMM (JEDEC)
The EDI7F33512, EDI7F233512 and EDI7F433512 are organized
as 512Kx32 and 2x512Kx32 and 4x512Kx32 respectively. The
modules are based on AMD's AM29F040 - 512Kx8 Flash Device
in TSOP packages which are mounted on an FR4 substrate.
The modules offer access times between 80 and 150ns allowing
for operation of high-speed microprocessors without wait states.
BLOCK DIAGRAMS
EDI7F433512C-BNC: 4x512Kx32 80 PIN SIMM
EDI7F233512C-BNC: 2x512Kx32 80 PIN SIMM
512Kx32 Flash
DESCRIPTION
FEATURES
FIG. 1
512K
X 8
DQ0-DQ7
DQ8-DQ15
DQ16-DQ23
DQ24-DQ31
512K
512K
512K
512K
512K
512K
512K
X 8
X 8
X 8
X 8
X 8
X 8
X 8
G\
W1\
W2\
W3\
A0-A18
E1\
E0\
W0\
512K
X 8
DQ0-DQ7
DQ8-DQ15
DQ16-DQ23
DQ24-DQ31
E\
G
W0
W1
W2
W3
512K
512K
512K
X 8
X 8
X 8
\
\
\
\
\
A0-A18
A0-A18
G\
W1\
W2\
W3\
X8
512K
X8
512K
X8
512K
X8
512K
DQ0-DQ7
X8
512K
X8
512K
X8
512K
X8
512K
X8
512K
X8
512K
X8
512K
X8
512K
DQ8-DQ15
DQ16-DQ23
DQ24-DQ31
X8
512K
X8
512K
X8
512K
X8
512K
E3\
E2\
E1\
E0\
W0\
DATASHEET APPROVALS
ECO#
EDI PART NO.
NEW REV
DATE
APPROVAL:
INITIAL
DATE
CORRECTION ON PAGES
JUAN GUZMAN
MUKESH TRIVEDI
PAUL MARIEN
LARRY WINROTH
DAVE KELLY
MARK DOWNEY
DAVE HARRISON
TONY LEE
BOB KHEDERIAN
LUIS ESTELLA
YES
NO
LINE
:________
WILL THIS DATASHEET GO ON THE WEB?
FAMILY:
____________
PROD.TYPE:
________
ORG:___________
IS THIS A NEW DATASHEET?
DENSITY:________
SPEED:__________
WILL THIS DATASHEET REPLACE AN EXISTING
PKG:____________
DATASHEET THAT'S ALREADY ON THE WEB?
VOLTAGE:________
IF YES, WHAT DATASHEET IS IT REPLACING?
WHAT SECTION SHOULD THIS DATASHEET BE
PLACED IN ON THE WEB?
AFTER REVIEWING OR MAKING CORRECTIONS ON THE DATASHEET (S)
PLEASE SIGN-OFF ON THIS SHEET AND ,MAKE YOUR CORRECTIONS ON
THE ORIGINAL COPY(S).
AFTER REVIEWING THE DATA SHEET, TEST ENGINEERING WILL COMPLETE THE SECTION BELOW.
TEST PROGRAM CHANGE REQUIRED:
YES:_________NO____________DATE:___________
TEST ENGINEER SIGNATURE___________________
IF YES, DO NOT RELEASE DATA SHEET UNTIL TEST PROGRAM CHANGE IS COMPLETED.
TEST PROGRAM CHANGE COMPLETION DATE:__________
TEST PROGRAM NAME AND REVISION_________________
TEST ENGINEER SIGNATURE__________________________
FO-00342R1.DOC
ECO# 14942
SHEET 1 OF
1
9/25/02
9/26/02
9/27/02
L.K.
M.A.
EDI7F33512C
15528
4A
9/24/02
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