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White Electronic Designs

WED3C7410E16M-XBX

May 2006
Rev. 9

FEATURES

Footprint compatible with WED3C7558M-XBX and
WED3C750A8M-200BX

Implementation

Altivec

TM technology instruction

set

Optional, high-bandwidth MPX bus interface

RISC Microprocessor Multichip Package

OVERVIEW

The WEDC 7410E/SSRAM multichip package is targeted
for high performance, space sensitive, low power systems
and supports the following power management features:
doze, nap, sleep and dynamic power management.

The WED3C7410E16M-XBX multichip package consists
of:

7410E

AltiVec

TM RISC processor

Dedicated 2MB SSRAM L2 cache, confi gured as
256Kx72

21mmx25mm, 255 Ceramic Ball Grid Array (CBGA)

Maximum Core frequency = 400, 450MHz

Maximum L2 Cache frequency = 200MHz

Maximum 60x Bus frequency = 133MHz**

The WED3C7410E16M-XBX is offered in Commercial
(0°C to +70°C), industrial (-40°C to +85°C) and military
(-55°C to +125°C) temperature ranges and is well suited
for embedded applications such as missiles, aerospace,
fl ight computers, fi re control systems and rugged critical
systems.

* This product is subject to change without notice.
** At a maximum 60x bus frequency of 133MHz, the maximum

confi gurable core frequency is 400MHz.

FIGURE 1 MULTI-CHIP PACKAGE DIAGRAM

AltiVec

TM is a trademark of Motorola Inc.

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White Electronic Designs

WED3C7410E16M-XBX

May 2006
Rev. 9

Reservation

Station

Reservation

Station

Fetcher

Dispatch Unit

Reservation

Station

ctor

Permute

Unit

VSCR

ctor ALU

VSIU

VCIU

VFPU

Reservation

Station

VR File

6 Rename

Buf

fers

Reservation

Station

Interger

Unit 1

. .

+ x

Interger

Unit 2

. .

GPR File

6 Rename

Buf

fers

. .

FPR File

6 Rename

Buf

fers

. .

System

Unit

ctor

Queue

Reservation

Station

Floating-Point

Unit

Reservation

Station (2 Entry)

Load/Store Unit

(EA

Calculation)

Finished

Stores

Complete

Stores

Operations

Load Fold

Queue

. .

+ x

FPSCR

Additional Features

i
me Base

Counter/Decrementer

Clock Muliplier

AG/COP

Interface

Thermal/Power Management

Performance Monitor

Instruction Queue

(6 W

ord)

Completion Queue

(8 Entry)

Completion Unit

Branch Processing Unit

BTIC

(64 Entry)

BHT

(512 Entry)

CTR

Instruction MMU

SRs

(Shadow)

128-Entry

DTLB

IBA

Array

Data MMU

SRs

(Original)

128-Entry

DTLB

DBA

Array

32-Kbyte

I Cache

32-Kbyte

I Cache

Ability to complete up

to two instructions per clock

L2 Data

ransaction

Queue

L2 Controller

L2 T

ags

L2CR

L2PMCR

L2 Miss

L2 Castout

Data

ransaction

Queue

Bus Interface Unit

Data Reload

Buf

fer

Instruction

Reload Buf

fer

Instruction

Reload T

able

Data Reload

l
e

Memory Subsystem

SSRAM

SRAM

19-Bit L2 Address Bus

64- 32-Bit L2 Data Bus

64-Bit Data Bus

32-Bit Address Bus

32-Bit

64-Bit

128-Bit

(4 Instructions)

FIGURE 2 BLOCK DIAGRAM

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White Electronic Designs

WED3C7410E16M-XBX

May 2006
Rev. 9

PACKAGE PINOUT LISTING

Signal Name

Pin Number

Active

I/O

1.8V (7) 2.5V (7)

3.3V (7)

A[0-31]

C16, E4, D13, F2, D14, G1, D15, E2, D16, D4, E13, G2, E15, H1, E16, H2, F13, J1, F14, J2, F15, H3,
F16, F4, G13, K1, G15, K2, H16, M1, J15, P1

High

I/O

AACK#

Low Input

ABB#/AMONO# (8)

Low

Output

AP[0-3]

C1, B4, B3, B2

High I/O

ARTRY# J4

Low I/O

AVCC A10

-- Input

1.8V 1.8V 1.8V

BG# L1

Low Input

BR# B6

Low Output

BVSEL (4, 6)

High Input GND

HRESET# OVCC

CHK# (5, 6, 13)

Low Input

CI# E1

Low I/O

CKSTP_IN# D8

Low Input

CKSTP_OUT# A6

Low Ouput

CLK_OUT

High

Output

DBB#/DMONO (8)

J14

Low Output

DBG# N1

Low Input

DBWO#/DTI[0] G4

Low Input

DH[0-31]

P14, T16, R15, T15, R13, R12, P11, N11, R11, T12, T11, R10, P9, N9, T10, R9, T9, P8, N8, R8, T8, N7,
R7, T7, P6, N6, R6, T6, R5, N5, T5, T4

High I/O

DL[0-31]

K13, K15, K16, L16, L15, L13, L14, M16, M15, M13, N16, N15, N13, N14, P16, P15, R16, R14, T14,
N10, P13, N12, T13, P3, N3, N4, R3, T1, T2, P4, T3, R4

High I/O

DP[0-7]

M2, L3, N2, L4, R1, P2, M4, R2

High

I/O

DRDY# (5, 9, 12)

Low Output

DTI 1-2 (9, 11)

G16, H15

High Input

EMODE# (10, 11)

Low Input

GBL# F1

Low I/O

GND

C5, C12, E3, E6, E8, E9, E11, E14, F3, F5, F7, F10, F12, G6, G8, G9, G11, H5, H7, H10, H12, J5, J7,
J10, J12, K6, K8, K9, K11, L5, L7, L10, L12, M3, M6, M8, M9, M11, M14, P5, P12

-- --

GND

HIT# (5) (12)

Low Output

HRESET# A7

Low Input

INT# B15

Low Input

L1_TSTCLK (1)

D11

High Input

L2_TSTCLK (1)

D12

High Input

L2AVCC L11

-- Input 1.8V 1.8V

1.8V

L2VCC (5) (7)

A2, B8, C3, D6, J16

-- Input 3.3V 3.3V

3.3V

L2OVCC

E10, E12, M12, G12, G14, K12, K14

Input

2.5V

N/A

L2VSEL (3, 6)

High Input *--

HRESET#

N/A

LSSD_MODE# (1)

B10

Low Input

3.3V

MCP# C13

Low Input

NC (No-connect)

B7, C8

OVCC (2)

C7, E5, G3, G5, K3, K5, P7, P10, E7, M5, M7, M10

Input

1.8V

2.5V

3.3V

PLL_CFG[0-3]

A8, B9, A9, D9

High Input

QACK# D3

Low Input

QREQ# J3

Low Output

RSRV# D1

Low Output

SHD0-1# (5) (14)

A4, A5

Low I/O

SMI# A16

Low Input

SRESET# B14

Low Input

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White Electronic Designs

WED3C7410E16M-XBX

May 2006
Rev. 9

Signal Name

Pin Number

Active

I/O

1.8V (7) 2.5V (7) 3.3V (7)

SYSCLK C9

-- Input

TA# H14

Low Input

TBEN C2

High Input

TBST# A14

Low Output

TCK C11

High Input

TDI (6)

A11

High Input

TDO A12

High Output

TEA# H13

Low

Input

TMS (6)

B11

High Input

TRST# (6)

C10

Low Input

TS# J13

Low I/O

TSIZ[0-2]

A13, D10, B12

High Output

TT[0-4]

B13, A15, B16, C14, C15

High

I/O

(2)

F6, F8, F9, F11, G7, G10, H4, H6, H8, H9, H11, J6, J8, J9, J11, K7, K10, L6, L8, L9

Input

1.8V

WT# D2

Low I/O

PACKAGE PINOUT LISTING (continued)

NOTES:
1.

These are test signals for factory use only and must be pulled up to OV

for

normal machine operation.

2. OV

inputs supply power to the I/O drivers and V

inputs supply power to the

processor core.

To allow future L2 cache I/O interface voltage changes.

To allow processor bus I/O voltage changes, provide the option to connect BVSEL
to HRESET# (Selects 2.5V Interface) or to GND (Selects 1.8V Interface) or to
OV

(Selects 3.3V Interface).

Uses one of 9 existing no-connects in WEDC's WED3C755A8M-XBX.

Internal pull up on die.

7. OV

supplies power to the processor bus, JTAG, and all control signals except

the L2 cache controls (L2CE, L2WE, and L2ZZ); L2OV

supplies power to the L2

cache I/O interface (L2ADDR (0-18], L2DATA (0-63), L2DP{0-7] and L2SYNC-
OUT) and the L2 control signals; L2AV

supplies power to the SSRAM core

memory; and V

supplies power to the processor core and the PLL and DLL (after

fi ltering to become AV

and L2AV

respectively). These columns serve as a

reference for the nominal voltage supported on a given signal as selected by the
BVSEL pin confi guration and the voltage supplied. For actual recommended value
of Vin or supply voltages see Recommended Operating Conditions.

Output only for 7410, was I/O for 750/755.

Enhanced mode only.

10. Deasserted (pulled high) at HRESET# for 60x bus mode.
11. Reuses 750/755 DRTRY#, DBIS#, and TLBISYNC pins (DTI1, DTI2, and EMODE#

respectively).

12. Unused output in 60x bus mode.
13. Connect to HRESET# to trigger post power-on-reset (por) internal memory test.
14. Ignored in 60x bus mode.

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WED3C7410E16M-XBX

May 2006
Rev. 9

ABSOLUTE MAXIMUM RATINGS

Characteristic

Symbol

Value

Unit

Notes

Core supply voltage

-0.3 to 2.1

(4)

PLL supply voltage

-0.3 to 2.1

(4)

L2 DLL supply voltage

L2AV

-0.3 to 2.1

(4)

60x bus supply voltage

-0.3 to 3.465

(3)

L2 bus supply voltage

L2OV

-0.3 to 2.6

(3)

L2 supply voltage

L2V

-0.3 to 4.6

(5)

Input supply

Processor Bus

-0.3 to 0V

+0.2

(2)

L2 bus

-0.3 to L20V

+0.2

(2)

JTAG Signals

-0.3 to OV

+0.2

(2)

Storage temperature range

STG

-55 to 150

°C

NOTES:
1. Functional and tested operating conditions are given in Operating Conditions table. Absolute maximum ratings are stress ratings only, and functional operation at the maximums is

not guaranteed. Stresses beyond those listed may affect device reliability or cause permanent damage to the device.

2. Caution:

Vin must not exceed OV

by more than 0.2V at any time including during power-on reset.

3. Caution:

/L2OV

must not exceed V

/AV

/L2AV

by more than 2.0 V at any time including during power-on reset.

4. Caution:

/AV

/L2AV

must not exceed L2OV

/OV

by more than 0.4 V at any time including during power-on reset.

5. L2OV

should never exceed L2V

RECOMMENDED OPERATING CONDITIONS

CHARACTERISTIC SYMBOL

RECOMMENDED

VALUE

UNIT

Core supply voltage

1.8v

100mV

PLL supply voltage

1.8v

100mV

L2 DLL supply voltage

L2AV

1.8v

100mV

Memory core supply voltage

L2V

3.3v

165mV

Processor bus supply voltage

BVSEL = 0

1.8±

100mV

BVSEL = HRESET#

2.5v

100mV

BVSEL = HRESET or BVSEL = 1

3.3v ± 165 mV

L2 bus supply voltage

L2VSEL = HRESET# or 1

L20V

2.5v ± 100 mV

Input Voltage

Processor bus and JTAG Signals

Vin

GND to OV

NOTE: These are the recommended and tested operating conditions. Proper device operation outside of these conditions is not guaranteed

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WED3C7410E16M-XBX

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Rev. 9

L2 CACHE CONTROL REGISTER (L2CR)

The L2 cache control register, shown in Figure 5, is a supervisor-level, implementation-specifi c SPR used to confi gure
and operate the L2 cache. It is cleared by hard reset or power-on reset.

BGA THERMAL RESISTANCE

Description

Symbol

PPC

SSRAM Units

Notes

Junction to Ambient (No Airfl ow)

Theta JA

14.0

10.3

C/W

Junction to Ball

Theta JB

8.9

5.2

C/W

Junction to Case (Top)

Theta JC

0.1

C/W

NOTE 1: Refer to PBGA Thermal Resistance Correlation at www.whiteedc.com in the application notes section for modeling conditions

POWER CONSUMPTION

= AV

= 1.8 ±0.1V V

, L2V

= 3.3V ±5% V

, GND = 0 V

, 0

< 105°C

Processor (CPU) Frequency/L2 Frequency

Unit Notes

400MHz/200MHz

450MHz/200MHz

Full-on Mode

Typical

5.7

6.2

1, 3

Maximum 13.1 14.3

Doze Mode

Maximum

5.3

5.8

1, 2

Nap Mode

Maximum

2.25

2.4

1, 2

Sleep Mode

Maximum

2.20

2.35

1, 2

Sleep ModePLL and DLL Disabled

Maximum

2.0

1, 2

NOTES:
1. These values apply for all valid system bus and L2 bus ratios. The values do not include OV

; AV

and L2AV

suppling power. OV

power is system dependent, but is typically

<10% of V

power. Worst case power consumption, for AV

= 15mW and L2AV

= 15mW.

2. Maximum power is measured at V

= 1.9 V while running an entirely cache-resident, contrived sequence of instructions which keep the execution units maximally busy.

3. Typical power is an average value measured at V

= AV

= L2AV

= 1.8V, OV

d = L2OV

= 2.5V in a system, executing typical applications and benchmark sequences.

At a maximum 60x bus frequency of 133MHz, the maximum confi gurtable core frequency is 400MHz.

FIGURE 5 L2 CACHE CONTROL REGISTER (L2CR)

The L2CR bits are described in Table 1.

L2E

L2SIZ

L2CLK

L2RAM

L21

L2OH 0000000

10 11 12 13 14 15 16 17 18 19 20 21 22 22 24 30 31

L2IP

L2PE

L2DO

L2CTL

L2TS

L2SL

L2BYP

L2HWF

L2IO

L2DRO

L2WT L2DF

L2FA

L2CLKSTP

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WED3C7410E16M-XBX

May 2006
Rev. 9

TABLE 1: L2CR BIT SETTINGS

Bit

Name

Function

L2E

L2 enable. Enables L2 cache operation (including snooping) starting with the next transaction the L2 cache unit receives.
Before enabling the L2 cache, the L2 clock must be confi gured through L2CR[2CLK], and the L2 DLL must stabilize. All other
L2CR bits must be set appropriately. The L2 cache may need to be invalidated globally.

L2PE

L2 data parity checking enable. Enables parity generation and checking for the L2 data RAM interface. When disabled,
generated parity is always zeros. L2 Parity is supported by WEDC's WED3C7410E16M-XBX, but is dependent on application.

L2SIZ

L2 size--Should be set according to the size of the private memory setting. Total SRAM space is 2M bytes (256Kx72). See L2
cache/private memory confi gurations table in Motorola User's Manual.

L2CLK

L2 clock ratio (core-to-L2 frequency divider). Specifi es the clock divider ratio based from the core clock frequency that the
L2 data RAM interface is to operate at. When these bits are cleared, the L2 clock is stopped and the on-chip DLL for the L2
interface is disabled. For nonzero values, the processor generates the L2 clock and the on-chip DLL is enabled. After the L2
clock ratio is chosen, the DLL must stabilize before the L2 interface can be enabled. The resulting L2 clock frequency cannot be
slower than the clock frequency of the 60x bus interface.
000 L2 clock and DLL disabled
001

÷ 1

010

÷ 1.5

011

÷ 3.5

100

÷ 2

101

÷ 2.5

110

÷ 3

111

÷ 4

L2RAM

L2 RAM type--Confi gures the L2 RAM interface for the type of synchronous SRAMs used:
· Pipelined (register-register) synchronous burst SRAMs that clock addresses in and clock data out
The 7410 does not burst data into the L2 cache, it generates an address for each access.
10: Pipelined (register-register) synchronous burst SRAM - Setting for WED3C7410E16M-XBX

L2DO

L2 data only. Setting this bit enablesÚdata-only operation in the L2 cache. When this bit is set, only transactions from the L1
data cache can be cached in the L2 cache. L1 instruction cache operations will be serviced for instruction addresses already
in the L2 cache; however, the L2 cache will not be reloaded for L1 instruction cache misses. Note that setting both L2DO and
L2IO effectively locks the L2 cache.

L2I

L2 global invalidate. Setting L2I invalidates the L2 cache globally by clearing the L2 status bits. This bit must not be set while
the L2 cache is enabled. See
Motorola's User manual for L2 Invalidation procedure.

L2CTL

L2 RAM control (ZZ enable). Setting L2CTL enables the automatic operation of the L2ZZ (low-power mode) signal for cache
RAMs. Sleep mode is supported by the WED3C7410E16M-XBX. While L2CTL is asserted, L2ZZ asserts automatically when
the device enters nap or sleep mode and negates automatically when the device exits nap or sleep mode. This bit should not
be set when the device is in nap mode and snooping is to be performed through deassertion of QACK.

L2WT

L2 write-through. Setting L2WT selects write-through mode (rather than the default write-back mode) so all writes to the L2
cache also write through to the system bus. For these writes, the L2 cache entry is always marked as clean (value unmodifi ed)
rather than dirty (value modifi ed). This bit must never be asserted after the L2 cache has been enabled as previously-modifi ed
lines can get remarked as clean (value unmodifi ed) during normal operation.

L2TS

L2 test support. Setting L2TS causes cache block pushes from the L1 data cache that result from dcbf and dcbst
instructions to be written only into the L2 cache and marked valid, rather than being written only to the system bus and marked
invalid in the L2 cache in case of hit. This bit allows a dcbz/dcbf instruction sequence to be used with the L1 cache enabled
to easily initialize the L2 cache with any address and data information. This bit also keeps dcbz instructions from being
broadcast on the system and single-beat cacheable store misses in the L2 from being written to the system bus.

1415

L2OH

L2 output hold. These bits confi gure output hold time for address, data, and control signals driven to the L2 data RAMs.
01: 0.8ns Hold Time - Setting for WED3C7410E16M-XBX

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Bit

Name

Function

L2SL

L2 DLL slow. Setting L2SL increases the delay of each tap of the DLL delay line. It is intended to increase the delay through the
DLL to accommodate slower L2 RAM bus frequencies.
0: Setting for WED3C7410E16M-XBX because L2 RAM interface is operated above 100 MHz.

L2DF

L2 differential clock. This mode supports the differential clock requirements of late-write SRAMs.
0: Setting for WED3C7410E16M-XBX because late-write SRAMs are not used.

L2BYP

L2 DLL bypass is reserved.
0: Setting for WED3C7410E16M-XBX

L2FA

L2 fl ush assist (for software fl ush). When this bit is negated, all lines castout from the dL1 which have a state of
CDMRSV=01xxx1 (i.e. C-bit negated), will not allocate in the L2 if they miss. Asserting this bit forces every castout from the dL1
to allocate an entry in the L2 if that castout misses in the L2 regardless of the state of the C-bit. The L2FA bit must be set and
the L2IO bit must be cleared in order to use the software fl ush algorithm.

L2HWF

L2 hardware fl ush. When the processor detects the value of L2HWF set to 1, the L2 will begin a hardware fl ush. The fl ush will
be done by starting with low cache indices and increment these indices for way 0 of the cache, one index at a time until the
maximum index value is obtained. Then, the index will be cleared to zero and the same process is repeated for way 1 of the
cache. For each index and way of the cache, the processor will generate a castout operation to the system bus for all modifi ed
32-byte sectors. At the end of the hardware fl ush, all lines in the L2 tag will be invalidated. During the fl ush, all memory activity
from the icache and dcache are blocked from accessing the L2 until the fl ush is complete. Snoops, however, are fully serviced
by the L2 during the fl ush. When the L2 tags have been fully fl ushed of all valid entries, this bit will be reset to b'0" by hardware.
When this bit is cleared, it does not necessarily guarantee that all lines form the L2 have been written completely to the system
interface. L2 copybacks can stll be queued in the bus interface unit. Below is the code which must be run to use L2 Hardware
Flush. When the fi nal sync completes, all modifi ed lines in the L2 will have been written to the system
address bus.
Disable interrupts
dssall
sync
set L2HWF
sync

L2IO

L2 Instruction-Only. Setting this bit enales instruction-only operation in the L2 cache. For this operation, only transactions from
the L1 instruction cache are allowed to be reloaded in the L2 cache. Data addresses already in the cache will still hit for the L1
data cache. When both L2DO and L2IO are asserted, the L2 cache is effectively locked.

L2CLKSTP

L2 Clock Stop. Setting this bit enables the automatic stopping of the L2CLK_OUT signals for cache rams that support this
function. While L2CLKSTP is set, the L2CLK_OUT signals will automatically be stopped when WED3C7410E16M-XBX enters
nap or sleep mode, and automatically restarted when WED3C7410E16M-XBX exits nap or sleep.

L2DRO

L2 DLL rollover. Setting this bit enables a potential rollover (or actual rollover) condition of the DLL to cause a checkstop for the
processor. A potential rollover condition occurs when the DLL is selecting the last tap of the delay line, and thus may risk rolling
over to the fi rst tap with one adjustment while in the process of keeping synchronized. Such a condition is improper operation
for the DLL, and, while this condition is not expected, it allows detection for added security. This bit can be set when the DLL is
fi rst enabled (set with the L2CLK bits) to detect rollover during initial synchronization. It could also be set when the L2 cache is
enabled (with L2E bit) after the DLL has achieved its initial lock.

2430 -

Reserved

L2IP

L2 global invalidate in progress (read only)--See the Motorola user's manual for L2 Invalidation procedure.

TABLE 1: L2CR BIT SETTINGS

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Rev. 9

The AVCC and L2AVCC power signals are provided on
the WED3C7410E16M-XBX to provide power to the clock
generation phase-locked loop and L2 cache delay-locked
loop respectively. To ensure stability of the internal clock,
the power supplied to the AVCC input signal should be
fi ltered of any noise in the 500kHz to 10 MHz resonant
frequency range of the PLL. A circuit similar to the
one shown in Figure 6 using surface mount capacitors
with minimum Effective Series Inductance (ESL) is
recommended. Multiple small capacitors of equal value are
recommended over a single large value capacitor.

PLL POWER SUPPLY FILTERING

The circuit should be placed as close as possible to the
AVCC pin to minimize noise coupled from nearby circuits.
An identical but separate circuit should be placed as close
as possible to the L2AVCC pin. It is often possible to route
directly from the capacitors to the AVCC pin, which is on the
periphery of the 255 BGA footprint, without the inductance
of vias. The L2AVCC pin may be more diffi cult to route but
is proportionately less critical.

FIGURE 6 POWER SUPPLY FILTER CIRCUIT

(or L2AV

)

2.2

µF

2.2

µF

GND

Low ESL surface mount capacitors

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