ChipFind - документация

Электронный компонент: W39L040-70

Скачать:  PDF   ZIP
W39L040
512K
8 CMOS FLASH MEMORY
Publication Release Date: February 10, 2003
- 1 -
Revision A3
1. GENERAL DESCRIPTION
The W39L040 is a 4Mbit, 3.3-volt only CMOS flash memory organized as 512K
8 bits. For flexible
erase capability, the 4Mbits of data are divided into 8 uniform sectors of 64 Kbytes, which are
composed of 16 smaller even pages with 4 Kbytes. The byte-wide (
8) data appears on DQ7 - DQ0.
The device can be programmed and erased in-system with a standard 3.3V power supply. A 12-volt
V
PP
is not required. The unique cell architecture of the W39L040 results in fast program/erase
operations with extremely low current consumption (compared to other comparable 3.3-volt flash
memory products). The device can also be programmed and erased by using standard EPROM
programmers.
2. FEATURES
Single 3.3-volt operations
- 3.3-volt Read
- 3.3-volt Erase
- 3.3-volt Program
Fast Program operation:
- Byte-by-Byte programming: 50 S (max.)
Fast Erase operation:
- Chip Erase cycle time: 100 mS (max.)
- Sector Erase cycle time: 25 mS (max.)
- Page Erase cycle time: 25 mS (max.)
Read access time: 70/90 nS
8 Even sectors with 64K bytes each, which is
composed of 16 flexible pages with 4K bytes
Any individual sector or page can be erased
Hardware protection:
- Optional 16K byte or 64K byte Top/Bottom
Boot Block with lockout protection
Flexible 4K-page size can be used as
Parameter Blocks
Typical program/erase cycles: 1K/10K
Twenty-year data retention
Low power consumption
- Active current: 10 mA (typ.)
- Standby current: 2 A (typ.)
End of program detection
- Software method: Toggle bit/Data polling
TTL compatible I/O
JEDEC standard byte-wide pinouts
Available packages: 32L PLCC, 32L TSOP (8 x
20 mm) and 32L STSOP (8 x 14 mm)
W39L040
- 2 -
3. PIN CONFIGURATIONS
5
6
7
9
10
11
12
13
A7
A6
A5
A4
A3
A2
A1
A0
DQ0
29
28
27
26
25
24
23
22
21
30
31
32
1
2
3
4
8
20
19
18
17
16
15
14
D
Q
1
D
Q
2
D
Q
3
D
Q
4
D
Q
5
D
Q
6
A14
A13
A8
A9
A11
#OE
A10
#CE
DQ7
A
1
2
A
1
6
V
D
D
#
W
E
A
1
5
A
1
7
32L PLCC
V
S
S
A
1
8
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
A3
A2
A1
A0
DQ0
DQ1
DQ2
V
#OE
A10
#CE
DQ7
DQ6
DQ5
DQ4
DQ3
32L TSOP & STSOP
A15
A12
A7
A6
A5
A4
V
#WE
A14
A13
A8
DD
A11
A9
32
31
30
29
28
27
26
25
24
23
22
21
20
19
18
17
A16
A17
SS
A18
4. BLOCK DIAGRAM
CONTROL
OUTPUT
BUFFER
DECODER
CORE
ARRAY
#CE
#OE
#WE
A0
.
.
A18
.
.
DQ0
DQ7
V
DD
V
SS
5. PIN DESCRIPTION
SYMBOL
PIN NAME
A0
- A18
Address Inputs
DQ0
- DQ7
Data Inputs/Outputs
#CE
Chip Enable
#OE Output
Enable
#WE Write
Enable
V
DD
Power
Supply
V
SS
Ground
W39L040
Publication Release Date: February 10, 2003
- 3 -
Revision A3
6. FUNCTIONAL DESCRIPTION
Device Bus Operation
Read Mode
The read operation of the W39L040 is controlled by #CE and #OE, both of which have to be low for
the host to obtain data from the outputs. #CE is used for device selection. When #CE is high, the chip
is de-selected and only standby power will be consumed. #OE is the output control and is used to
gate data from the output pins. The data bus is in high impedance state when either #CE or #OE is
high. Refer to the timing waveforms for further details.
Write Mode
Device erasure and programming are accomplished via the command register. The contents of the
register serve as inputs to the internal state machine. The state machine outputs dictate the function
of the device.
The command register itself does not occupy any addressable memory location. The register is a
latch used to store the commands, along with the address and data information needed to execute the
command. The command register is written by bringing #WE to logic low state, while #CE is at logic
low state and #OE is at logic high state. Addresses are latched on the falling edge of #WE or #CE,
whichever happens later; while data is latched on the rising edge of #WE or #CE, whichever happens
first. Standard microprocessor write timings are used.
Refer to AC Write Characteristics and the Erase/Programming Waveforms for specific timing
parameters.
Standby Mode
There are two ways to implement the standby mode on the W39L040 device, both using the #CE pin.
A CMOS standby mode is achieved with the
#CE
input held at
V
DD
0.3V. Under this condition the current
is typically reduced to less than 15
A (max). A TTL standby mode is achieved with the #CE pin held
at V
IH
.
Under this condition the current is typically reduced to 2 mA(max).
In the standby mode the outputs are in the high impedance state, independent of the #OE input.
Output Disable Mode
With the #OE input at a logic high level (V
IH
), output from the device is disabled. This will cause the
output pins to be in a high impedance state.
Auto-select Mode
The auto-select mode allows the reading of a binary code from the device and will identify its
manufacturer and type. This mode is intended for use by programming equipment for the purpose of
automatically matching the device to be programmed with its corresponding programming algorithm.
This mode is functional over the entire temperature range of the device.
To activate this mode, the programming equipment must force V
ID
(11.5V to 12.5V) on address pin
A9. Two identifier bytes may then be sequenced from the device outputs by toggling address A0 from
V
IL
to V
IH
. All addresses are don
t cares except A0 and A1 (see "Auto-select Codes").
W39L040
- 4 -
The manufacturer and device codes may also be read via the command register, for instance, when
the W39L040
is erased or programmed in a system without access to high voltage on the A9 pin. The
command sequence is illustrated in "Auto-select Codes".
Byte 0 (A0 = V
IL
) represents the manufacturer
s code (Winbond = DAH) and byte 1 (A0 = V
IH
) the
device identifier code (W39L040 = B6hex). All identifiers for manufacturer and device will exhibit odd
parity with DQ7 defined as the parity bit. In order to read the proper device codes when executing the
Auto-select, A1 must be low state.
Data Protection
The W39L040
is designed to offer protection against accidental erasure or programming caused by
spurious system level signals that may exist during power transitions. During power up the device
automatically resets the internal state machine in the Read mode. Also, with its control register
architecture, alteration of the memory contents only occurs after successful completion of specific
multi-bus cycle command sequences. The device also incorporates several features to prevent
inadvertent write cycles resulting from V
DD
power-up and power-down transitions or system noise.
Boot Block Operation
There are four alternatives to set the boot block. Either 16K-byte or 64K-byte in the top/bottom
location of this device can be locked as boot block, which can be used to store boot codes. It is
located in the last 16K/64K bytes or first 16K/64K bytes of the memory with the address range from
7C000/ 70000(hex) to 7FFFF(hex) for top location or 00000(hex) to 03FFF/0FFFF(hex) for bottom
location.
See Command Codes for Boot Block Lockout Enable for the specific code. Once this feature is set the
data for the designated block cannot be erased or programmed (programming lockout), other memory
locations can be changed by the regular programming method.
In order to detect whether the boot block feature is set on the first/last 16K/64K-bytes block or not,
users can perform software command sequence: enter the product identification mode (see
Command Codes for Identification/Boot Block Lockout Detection for specific code), and then read
from address 0002(hex) for first (bottom) location or 7FFF2(hex) for last (top) location. If the DQ0/DQ1
of output data is "0/1," the 16K-bytes boot block programming lockout feature will be activated; if the
DQ0/DQ1 of output data is "1/1," the 64K-bytes boot block programming lockout feature will be
activated. If the DQ0/DQ1 of output data is "0/0," for both 16K/64K-bytes boot block, the lockout
feature will be inactivated and the block can be erased/programmed.
To return to normal operation, perform a three-byte command sequence (or an alternate single-byte
command) to exit the identification mode. For the specific code, see Command Codes for
Identification/Boot Block Lockout Detection.
Low V
DD
Inhibit
To avoid initiation of a write cycle during V
DD
power-up and power-down, the W39L040 locks out
when V
DD
< 2.0V (see DC Characteristics section for voltages). The write and read operations are
inhibited when V
DD
is less than 2.0V typical. The W39L040 ignores all write and read operations until
V
DD
> 2,0V. The user must ensure that the control pins are in the correct logic state when V
DD
> 2.0V
to prevent unintentional writes.
Write Pulse "Glitch" Protection
Noise pulses of less than 10 nS (typical) on #OE, #CE, or #WE will not initiate a write cycle.
W39L040
Publication Release Date: February 10, 2003
- 5 -
Revision A3
Logical Inhibit
Writing is inhibited by holding any one of #OE = V
IL
, #CE = V
IH
, or #WE = V
IH
. To initiate a write cycle
#CE and #WE must be a logical zero while #OE is a logical one.
Power-up Write and Read Inhibit
Power-up of the device with #WE = #CE = V
IL
and #OE = V
IH
will not accept commands on the rising
edge of #WE except 5mS delay (see the power up timing in AC Characteristics). The internal state
machine is automatically reset to the read mode on power-up.
Command Definitions
Device operations are selected by writing specific address and data sequences into the command
register. Writing incorrect address and data values or writing them in the improper sequence will reset
the device to the read mode. "Command Definitions" defines the valid register command sequences.
Read Command
The device will automatically power-up in the read state. In this case, a command sequence is not
required to read data. Standard microprocessor read cycles will retrieve array data. This default value
ensures that no spurious alteration of the memory content occurs during the power transition.
The device will automatically returns to read state after completing an Embedded Program or
Embedded Erase algorithm.
Refer to the AC Read Characteristics and Waveforms for the specific timing parameters.
Auto-select Command
Flash memories are intended for use in applications where the local CPU can alter memory contents.
As such, manufacture and device codes must be accessible while the device resides in the target
system. PROM programmers typically access the signature codes by raising A9 to a high voltage.
However, multiplexing high voltage onto the address lines is not generally a desirable system design
practice.
The device contains an auto-select command operation to supplement traditional PROM programming
methodology. The operation is initiated by writing the auto-select command sequence into the
command register. Following the command write, a read cycle from address XX00H retrieves the
manufacture code of DAH. A read cycle from address XX01H returns the device code (W39L040 =
B6hex).
To terminate the operation, it is necessary to write the auto-select exit command sequence into the
register.
Byte Program Command
The device is programmed on a byte-by-byte basis. Programming is a four-bus-cycle operation. The
program command sequence is initiated by writing two "unlock" write cycles, followed by the program
set-up command. The program address and data are written next, which in turn initiate the Embedded
program algorithm. Addresses are latched on the falling edge of #CE or #WE, whichever happens
later and the data is latched on the rising edge of #CE or #WE, whichever happens first. The rising
edge of #CE or #WE (whichever happens first) begins programming using the Embedded Program
W39L040
- 6 -
Algorithm. Upon executing the algorithm, the system is not required to provide further controls or
timings. The device will automatically provide adequate internally generated program pulses and verify
the programmed cell margin.
The automatic programming operation is completed when the data on DQ7 (also used as Data
Polling) is equivalent to the data written to this bit at which time the device returns to the read mode
and addresses are no longer latched (see "Hardware Sequence Flags"). Therefore, the device
requires that a valid address to the device be supplied by the system at this particular instance of time
for Data Polling operations. Data Polling must be performed at the memory location which is being
programmed.
Any commands written to the chip during the Embedded Program Algorithm will be ignored. If a
hardware reset occurs during the programming operation, the data at that particular location will be
corrupted.
Programming is allowed in any sequence and across sector boundaries. Beware that a data "0"
cannot be programmed back to a "1". Attempting to program 0 back to 1, the toggle bit will stop
toggling. Only erase operations can convert "0"s to "1"s.
Refer to the Programming Command Flow Chart using typical command strings and bus operations.
Chip Erase Command
Chip erase is a six-bus-cycle operation. There are two "unlock" write cycles, followed by writing the
"set-up" command. Two more "unlock" write cycles are asserted, followed by the chip erase
command.
Chip erase does not require the user to program the device prior to erase. Upon executing the
Embedded Erase Algorithm command sequence the device will automatically erase and verify the
entire memory for an all one data pattern. The erase is performed sequentially on each sectors at the
same time (see "Feature"). The system is not required to provide any controls or timings during these
operations.
The automatic erase begins on the rising edge of the last #WE pulse in the command sequence and
terminates when the data on DQ7 is "1" at which time the device returns to read the mode.
Refer to the Erase Command Flow Chart using typical command strings and bus operations.
Sector/Page Erase Command
Sector/page erase is a six bus cycles operation. There are two "unlock" write cycles, followed by
writing the "set-up" command. Two more "unlock" write cycles then follows by the sector erase
command. The sector/page address (any address location within the desired sector/page) is latched
on the falling edge of #WE, while the command (30H/50H) is latched on the rising edge of #WE.
Sector/page erase does not require the user to program the device prior to erase. When erasing a
sector/page or sectors/pages the remaining unselected sectors/pages are not affected. The system is
not required to provide any controls or timings during these operations.
The automatic sector/page erase begins after the erase command is completed, right from the rising
edge of the #WE pulse for the last sector/page erase command pulse and terminates when the data
on DQ7, Data Polling, is "1" at which time the device returns to the read mode. Data Polling must be
performed at an address within any of the sectors/pages being erased.
Refer to the Erase Command flow Chart using typical command strings and bus operations.
W39L040
Publication Release Date: February 10, 2003
- 7 -
Revision A3
Write Operation Status
DQ7: Data Polling
The W39L040 device features Data Polling as a method to indicate to the host that the embedded
algorithms are in progress or completed.
During the Embedded Program Algorithm, an attempt to read the device will produce the complement
of the data last written to DQ7. Upon completion of the Embedded Program Algorithm, an attempt to
read the device will produce the true data last written to DQ7.
During the Embedded Erase Algorithm, an attempt to read the device will produce a "0" at the DQ7
output. Upon completion of the Embedded Erase Algorithm, an attempt to read the device will produce
a "1" at the DQ7 output.
For chip erase, the Data Polling is valid after the rising edge of the sixth pulse in the six #WE write
pulse sequences. For sector erase, the Data Polling is valid after the last rising edge of the sector
erase #WE pulse. Data Polling must be performed at sector addresses within any of the sectors being
erased. Otherwise, the status may not be valid.
Just prior to the completion of Embedded Algorithm operations DQ7 may change asynchronously
while the output enable (#OE) is asserted low. This means that the device is driving status information
on DQ7 at one instant of time and then that byte
s valid data at the next instant of time. Depending on
when the system samples the DQ7 output, it may read the status or valid data. Even if the device has
completed the Embedded Algorithm operations and DQ7 has a valid data, the data outputs on DQ0
DQ6 may be still invalid. The valid data on DQ0
- DQ7 will be read on the successive read attempts.
The Data Polling feature is only active during the Embedded Programming Algorithm, Embedded
Erase Algorithm, or sector erase time-out (see "Command Definitions").
DQ6: Toggle Bit
The W39L040 also features the "Toggle Bit" as a method to indicate to the host system that the
embedded algorithms are in progress or completed.
During an Embedded Program or Erase Algorithm cycle, successive attempts to read (#OE toggling)
data from the device at any address will result in DQ6 toggling between one and zero. Once the
Embedded Program or Erase Algorithm cycle is completed, DQ6 will stop toggling and valid data will
be read on the next successive attempt. During programming, the Toggle Bit is valid after the rising
edge of the fourth #WE pulse in the four write pulse sequence. For chip erase, the Toggle Bit is valid
after the rising edge of the sixth #WE pulse in the six write pulse sequence. For sector/page erase, the
Toggle Bit is valid after the last rising edge of the sector/page erase #WE pulse. The Toggle Bit is
active during the sector/page erase time-out.
Either #CE or #OE toggling will cause DQ6 to toggle.
W39L040
- 8 -
Table of Operating Modes
Device Bus Operations
(V
ID
= 12
0.5V)
PIN
MODE
#CE
#OE #WE
A0 A1 A9
DQ0
- DQ7
Read V
IL
V
IL
V
IH
A0 A1 A9
Dout
Write V
IL
V
IH
V
IL
A0 A1 A9
Din
Standby V
IH
X X X X X
High
Z
X
V
IL
X
X X X
High Z/
Dout
Write Inhibit
X X
V
IH
X X X
High Z/
Dout
Output Disable
V
IL
V
IH
V
IH
X X X
High
Z
Auto select Manufacturers ID
V
IL
V
IL
V
IH
V
IL
V
IL
V
ID
Code
Auto select Device ID
V
IL
V
IL
V
IH
V
IH
V
IL
V
ID
Code
Auto-select Codes (High Voltage Method)
(V
ID
= 12
0.5V)
DESCRIPTION
#CE #OE #WE A9
THE OTHER ADDRESS
DQ[7:0]
Manufacturer ID: Winbond
V
IL
V
IL
V
IH
V
ID
All Add = V
IL
DAhex
Device ID: W39L040
V
IL
V
IL
V
IH
V
ID
A1 = V
IH
, All other = V
IL
B6hex
Sector Address Table
SECTOR
A18
A17
A16 SECTOR SIZE (KBYTES)
ADDRESS
SA0 0
0
0
64
00000h
- 0FFFFh
SA1 0
0
1
64
10000h
- 1FFFFh
SA2 0
1
0
64
20000h
- 2FFFFh
SA3 0
1
1
64
30000h
- 3FFFFh
SA4 1
0
0
64
40000h
- 4FFFFh
SA5 1
0
1
64
50000h
- 5FFFFh
SA6 1
1
0
64
60000h
- 6FFFFh
SA7 1
1
1
64
70000h
- 7FFFFh
Note: All sectors are 64K bytes in size.
W39L040
Publication Release Date: February 10, 2003
- 9 -
Revision A3
Command Definitions
COMMAND NO.
OF
1ST CYCLE
2ND CYCLE
3RD CYCLE
4TH CYCLE
5TH CYCLE
6TH CYCLE
7TH CYCLE
DESCRIPTION Cycles
Addr.
(1)
Data
Addr. Data
Addr. Data
Addr. Data
Addr. Data
Addr. Data
Addr. Data
Read 1
A
IN
D
OUT
Chip Erase
6
5555 AA
2AAA 55
5555 80
5555 AA
2AAA 55
5555 10
Sector Erase
6
5555 AA
2AAA 55
5555 80
5555 AA
2AAA 55
SA
(3)
30
Page Erase
6
5555 AA
2AAA 55
5555 80
5555 AA
2AAA 55
PA
(4)
50
Byte Program
4
5555 AA
2AAA 55
5555 A0
A
IN
D
IN
Top Boot Block
Lockout
64K/16KByte
6
5555 AA
2AAA 55
5555 80
5555 AA
2AAA 55
5555 40/70 7FFFF
XX
(5)
Bottom Boot Block
Lockout -
64K/16KByte
6
5555 AA
2AAA 55
5555 80
5555 AA
2AAA 55
5555 40/70
00000 XX
(5)
Product ID Entry
3
5555 AA
2AAA 55
5555 90
Product ID Exit
(2)
3
5555 AA
2AAA 55
5555 F0
Product ID Exit
(2)
1
XXXX F0
Notes
1. Address Format: A14
- A0 (Hex); Data Format: DQ7 - DQ0 (Hex)
2. Either one of the two Product ID Exit commands can be used.
3. SA: Sector Address
SA = 7XXXXh for Unique Sector7
SA = 6XXXXh for Unique Sector6
SA = 5XXXXh for Unique Sector5
SA = 4XXXXh for Unique Sector4
SA = 3XXXXh for Unique Sector3
SA = 2XXXXh for Unique Sector2
SA = 1XXXXh for Unique Sector1
SA = 0XXXXh for Unique Sector0
4. PA: Page Address
PA = 7FXXXh for Page 15 in Sector7
PA = 7EXXXh for Page 14 in Sector7
PA = 6FXXXh to 60xxx for Page 15 to page 0 in Sector6
(Please reference to left column)
PA = 7DXXXh for Page 13 in Sector7
PA = 7CXXXh for Page 12 in Sector7
PA = 5FXXXh to 50xxx for Page 15 to page 0 in Sector5
(Please reference to left column)
PA = 7BXXXh for Page 11 in Sector7
PA = 7AXXXh for Page 10 in Sector7
PA = 4FXXXh to 40xxx for Page 15 to page 0 in Sector4
(Please reference to left column)
PA = 79XXXh for Page 9 in Sector7
PA = 78XXXh for Page 8 in Sector7
PA = 3FXXXh to 30xxx for Page 15 to page 0 in Sector3
(Please reference to left column)
PA = 77XXXh for Page 7 in Sector7
PA = 76XXXh for Page 6 in Sector7
PA = 2FXXXh to 20xxx for Page 15 to page 0 in Sector2
(Please reference to left column)
PA = 75XXXh for Page 5 in Sector7
PA = 74XXXh for Page 4 in Sector7
PA = 1FXXXh to 10xxx for Page 15 to page 0 in Sector1
(Please reference to left column)
PA = 73XXXh for Page 3 in Sector7
PA = 72XXXh for Page 2 in Sector7
PA = 0FXXXh to 00xxx for Page 15 to page 0 in Sector0
(Please reference to left column)
PA = 71XXXh for Page 1 in Sector7
PA = 70XXXh for Page 0 in Sector7
5. XX: Don't care
W39L040
- 10 -
Embedded Programming Algorithm
Start
Write Program Command Sequence
(see below)
Increment Address
Programming Completed
5555H/AAH
2AAAH/55H
5555H/A0H
Program Address/Program Data
#Data Polling/ Toggle bit
Last Address
?
No
Yes
Program Command Sequence (Address/Command):
Pause T
BP
W39L040
Publication Release Date: February 10, 2003
- 11 -
Revision A3
Embedded Erase Algorithm
Start
Write Erase Command Sequence
(see below)
Erasure Completed
#Data Polling or Toggle
Bit Successfully Completed
5555H/AAH
5555H/AAH
2AAAH/55H
2AAAH/55H
5555H/80H
5555H/10H
Chip Erase Command Sequence
(Address/Command):
5555H/AAH
5555H/AAH
2AAAH/55H
2AAAH/55H
5555H/80H
Sector Address/30H
(Address/Command):
5555H/AAH
5555H/AAH
2AAAH/55H
2AAAH/55H
5555H/80H
Page Address/50H
Individual Page Erase
(Address/Command):
Individual Sector Erase
Command Sequence
Command Sequence
Pause T
EC
/T
SEC
/T
PEC
W39L040
- 12 -
Embedded #Data Polling Algorithm
Start
Read Byte
(DQ0 - DQ7)
Address = VA
Pass
DQ7 = Data
?
Yes
No
VA = Byte address for programming
= Any of the sector addresses within
the sector being erased during sector
erase operation
= Any of the device addresses being erased
during chip erase operation
= Any of the page addresses within
the page being erased during page
erase operation
Embedded Toggle Bit Algorithm
Start
Read Byte
(DQ0 - DQ7)
Address = Don't Care
DQ6 = Toggle
?
Yes
No
Pass
W39L040
Publication Release Date: February 10, 2003
- 13 -
Revision A3
Boot Block Lockout Enable Flow Chart
Boot Block Lockout
Feature Set Flow
Load data AA
to
address 5555
Load data 55
to
address 2AAA
Load data 80
to
address 5555
Load data AA
to
address 5555
Load data 55
to
address 2AAA
Load data 40/70
to
address 5555
Pause 2 mS
Exit
40 to lock 64K Boot Block
70 to lcok 16K Boot Block
Load data XX
to
address 7FFFF/0
7FFFF(XX) to lock Top Boot Block
000000(XX) to lock Bottom Boot Block
W39L040
- 14 -
Software Product Identification and Boot Block Lockout Detection Flow Chart
Product
Identification
Entry (1)
Load data 55
to
address 2AAA
Load data 90
to
address 5555
Pause 10 S
Product
Identification
and Boot Block
Lockout
D t ti
Mode (3)
Read address = 0000
data = DA
Read address = 0001
Read address=02/7FFF2
for Bottom/Top
data:in DQ0="1" or "0"
for 64K Boot Block
or DQ1="1" or "0"
for 16K Boot Block
(4)
Product
Identification Exit(6)
Load data
55
to
address 2AAA
Load data F0
to
address 5555
Normal Mode
(5)
(2)
(2)
Load data AA
to
address 5555
Load data AA
to
address 5555
Pause 10 S
data = B6
W39L040
Publication Release Date: February 10, 2003
- 15 -
Revision A3
7. DC CHARACTERISTICS
Absolute maximum Ratings
PARAMETER RATING
UNIT
Power Supply Voltage to V
SS
Potential
-2.0 to +4.6
V
0 to +70
C
Operating Temperature
-40 to +85
C
Storage Temperature
-65 to +125
C
Voltage on Any Pin to Ground Potential except A9
-2.0 to +4.6
V
Voltage on A9 Pin to Ground Potential
-2.0 to +13.0
V
Note: Exposure to conditions beyond those listed under Absolute maximum Ratings may adversely affect the life and reliability
of the device.
DC Operating Characteristics
(V
DD
= 3.3V
0.3V, V
SS
= 0V, T
A
= 0 to 70
C or -40 to 85
C)
LIMITS
PARAMETER SYM.
TEST
CONDITIONS
MIN. TYP. MAX.
UNIT
Power Supply
Current
I
DD
#CE = #OE = V
IL
, #WE = V
IH
,
all DQs open, Address inputs =
V
IL
/V
IH
, at f = 5 MHz
- 10 20
mA
Standby V
DD
Current (TTL input)
I
SB
1
#CE = V
IH
, all DQs open
Other inputs = V
IL
/V
IH
- 1 2 mA
Standby V
DD
Current
(CMOS input)
I
SB
2
#CE = V
DD
-0.3V, all DQs open
Other inputs = V
DD
-0.3V/ V
SS
- 2 15
A
Input Leakage
Current
I
LI
V
IN
= V
SS
to V
DD
-
-
1
A
Output Leakage
Current
I
LO
V
OUT
= V
SS
to V
DD
-
-
1
A
Input Low Voltage
V
IL
- -0.3
-
0.8
V
Input High Voltage
V
IH
- 2.0
-
V
DD
+0.5
V
Output Low Voltage
V
OL
I
OL
= 2.1 mA
-
-
0.45
V
Output High Voltage
V
OH
I
OH
= -0.4 mA
2.4
-
-
V
Pin Capacitance
(V
DD
= 3.3V, T
A
= 25
C, f = 1 MHz)
PARAMETER SYMBOL
CONDITIONS
TYP.
MAX.
UNIT
Input Capacitance
C
IN
V
IN
= 0V
6
8
pF
Output Capacitance
C
OUT
V
OUT
= 0V
10
12
pF
W39L040
- 16 -
8. AC CHARACTERISTICS
AC Test Conditions
PARAMETER CONDITIONS
Input Pulse Levels
0V to 3V
Input Rise/Fall Time
<5 nS
Input/Output Timing Level
1.5V/1.5V
Output Load
1 TTL Gate and C
L
= 30 pF
AC Test Load and Waveform
+3.3V
1.2K
2.1K
D
OUT
30 pF
(Including Jig and Scope)
Input
3V
0V
Test Point
Test Point
1.5V
1.5V
Output
W39L040
Publication Release Date: February 10, 2003
- 17 -
Revision A3
AC Characteristics, continued
Read Cycle Timing Parameters
(V
DD
= 3.3V
0.3V, V
SS
= 0V, T
A
= 0 to 70
C or -40 to 85
C)
W39L040-70 W39L040-90
PARAMETER SYM.
MIN. MAX. MIN. MAX.
UNIT
Read Cycle Time
T
RC
70 - 90 - nS
Chip Enable Access Time
T
CE
- 70 - 90
nS
Address Access Time
T
AA
- 70 - 90
nS
Output Enable Access Time
T
OE
- 35 - 45
nS
#CE Low to Active Output
T
CLZ
0 - 0 - nS
#OE Low to Active Output
T
OLZ
0 - 0 - nS
#CE High to High-Z Output
T
CHZ
- 25 - 25
nS
#OE High to High-Z Output
T
OHZ
- 25 - 25
nS
Output Hold from Address Change
T
OH
0 - 0 - nS
Write Cycle Timing Parameters
PARAMETER SYM.
MIN.
TYP.
MAX.
UNIT
Address Setup Time
T
AS
0 - - nS
Address Hold Time
T
AH
40 - - nS
#WE and #CE Setup Time
T
CS
0 - - nS
#WE and #CE Hold Time
T
CH
0 - - nS
#OE High Setup Time
T
OES
0 - - nS
#OE High Hold Time
T
OEH
0 - - nS
#CE Pulse Width
T
CP
100 - - nS
#WE Pulse Width
T
WP
100 - - nS
#WE High Width
T
WPH
100 - - nS
Data Setup Time
T
DS
40 - - nS
Data Hold Time
T
DH
10 - - nS
Byte Programming Time
T
BP
- 35 50
S
Chip Erase Cycle Time
T
EC
- 50
100
mS
Sector/Page Erase Cycle Time
T
EP
- 12.5 25 mS
Note: All AC timing signals observe the following guidelines for determining setup and hold times:
(a) High level signal's reference level is V
IH
and (b) low level signal's reference level is V
IL
.
W39L040
- 18 -
AC Characteristics, continued
Power-up Timing
PARAMETER SYMBOL
TYPICAL
UNIT
Power-up to Read Operation
T
PU
. READ
100
S
Power-up to Write Operation
T
PU
. WRITE
5
mS
Data Polling and Toggle Bit Timing Parameters
W39L040-70 W39L040-90
PARAMETER SYM.
MIN. MAX. MIN. MAX.
UNIT
#OE to Data Polling Output Delay
T
OEP
- 35 - 45
nS
#CE to Data Polling Output Delay
T
CEP
- 70 - 90
nS
#OE to Toggle Bit Output Delay
T
OET
- 35 - 45
nS
#CE to Toggle Bit Output Delay
T
CET
- 70 - 90
nS
W39L040
Publication Release Date: February 10, 2003
- 19 -
Revision A3
9. TIMING WAVEFORMS
Read Cycle Timing Diagram
Address A18-0
DQ7-0
Data Valid
Data Valid
High-Z
#CE
#OE
#WE
T
RC
V
IH
T
CLZ
T
OLZ
T
OE
T
CE
T
OH
T
AA
T
CHZ
T
OHZ
High-Z
#WE Controlled Command Write Cycle Timing Diagram
Address A18-0
DQ7-0
Data Valid
T
AS
T
CS
T
OES
T
AH
T
CH
T
OEH
T
WPH
T
WP
T
DS
T
DH
#CE
#OE
#WE
W39L040
- 20 -
Timing Waveforms, continued
#CE Controlled Command Write Cycle Timing Diagram
High Z
Data Valid
DQ7-0
T
AS
T
AH
T
CPH
T
OEH
T
DH
T
DS
T
CP
T
OES
Address A18-0
#CE
#OE
#WE
Chip Erase Timing Diagram
SB2
SB1
SB0
Address A18-0
DQ7-0
SB3
SB4
SB5
Internal Erase starts
Six-byte code for 3.3V-only software
chip erase
T
WP
T
WPH
T
EC
5555
2AAA
5555
5555
2AAA
5555
AA
55
80
AA
55
10
#CE
#OE
#WE
W39L040
Publication Release Date: February 10, 2003
- 21 -
Revision A3
Timing Waveforms, continued
Sector/Page Erase Timing Diagram
SB2
SB1
SB0
Address A18-0
DQ7-0
SB3
SB4
SB5
Internal Erase starts
Six-byte commands for 3.3V-only
Sector/Page Erase
T
WP
T
WPH
T
EP
5555
2AAA
5555
5555
2AAA
SA/PA
AA
55
80
AA
55
30/50
SA = Sector Address, PA = Page Address
Please refer to page 9 for detail information
#CE
#OE
#WE
#DATA Polling Timing Diagram
Address A18-0
DQ7
X
X
X
X
T
CEP
T
OEH
T
OEP
T
OES
T
EC
T
BP or
An An An
An
#CE
#OE
#WE
W39L040
- 22 -
Timing Waveforms, continued
Toggle Bit Timing Diagram
Address A18-0
DQ6
T
OEH
T
OES
T
BP or
T
EC
#CE
#OE
#WE
W39L040
Publication Release Date: February 10, 2003
- 23 -
Revision A3
10. ORDERING INFORMATION
PART NO.
ACCESS
TIME
(nS)
POWER
SUPPLY
CURRENT
MAX. (mA)
STANDBY
V
DD
CURRENT
MAX. (mA)
PACKAGE
OPERATING
TEMP.
(
C)
CYCLE
W39L040P-70 70 20
2
32L
PLCC
0
- 70
1K
W39L040P-90 90 20
2
32L
PLCC
0
- 70
1K
W39L040T-70
70
20
2
32L TSOP (8 x 20 mm)
0
- 70
1K
W39L040T-90
90
20
2
32L TSOP (8 x 20 mm)
0
- 70
1K
W39L040Q-70
70
20
2
32L STSOP (8 x 14 mm)
0
- 70
1K
W39L040Q-90
90
20
2
32L STSOP (8 x 14 mm)
0
- 70
1K
W39L040P-70B 70 20
2 32L
PLCC
0
- 70
10K
W39L040P-90B 90 20
2 32L
PLCC
0
- 70
10K
W39L040T-70B
70
20
2
32L TSOP (8 x 20 mm)
0
- 70
10K
W39L040T-90B
90
20
2
32L TSOP (8 x 20 mm)
0
- 70
10K
W39L040Q-70B
70
20
2
32L STSOP (8 x 14 mm)
0
- 70
10K
W39L040Q-90B
90
20
2
32L STSOP (8 x 14 mm)
0
- 70
10K
W39L040P-70J 70 20
2 32L
PLCC
-40
- 85
1K
W39L040P-90J 90 20
2 32L
PLCC
-40
- 85
1K
W39L040T-70J
70
20
2
32L TSOP (8 x 20 mm)
-40
- 85
1K
W39L040T-90J
90
20
2
32L TSOP (8 x 20 mm)
-40
- 85
1K
W39L040Q-70J
70
20
2
32L STSOP (8 x 14 mm)
-40
- 85
1K
W39L040Q-90J
90
20
2
32L STSOP (8 x 14 mm)
-40
- 85
1K
W39L040P-70K 70 20
2 32L
PLCC
-40
- 85
10K
W39L040P-90K 90 20
2 32L
PLCC
-40
- 85
10K
W39L040T-70K
70
20
2
32L TSOP (8 x 20 mm)
-40
- 85
10K
W39L040T-90K
90
20
2
32L TSOP (8 x 20 mm)
-40
- 85
10K
W39L040Q-70K
70
20
2
32L STSOP (8 x 14 mm)
-40
- 85
10K
W39L040Q-90K
90
20
2
32L STSOP (8 x 14 mm)
-40
- 85
10K
Notes:
1. Winbond reserves the right to make changes to its products without prior notice.
2. Purchasers are responsible for performing appropriate quality assurance testing on products intended for use in
applications where personal injury might occur as a consequence of product failure.
W39L040
- 24 -
11. HOW TO READ THE TOP MARKING
Example: The top marking of 32-pin TSOP W39L040T-70
1
st
line: Winbond logo
2
nd
line: the part number: W39L040T-70
3
rd
line: the lot number
4
th
line: the tracking code: 149 O B SA
149: Packages made in '01, week 49
O: Assembly house ID: A means ASE, O means OSE, ... etc.
B: IC revision; A means version A, B means version B, ... etc.
SA: Process code
W39L040T-70
2138977A-A12
149OBSA
W39L040
Publication Release Date: February 10, 2003
- 25 -
Revision A3
12. PACKAGE DIMENSIONS
32L PLCC
L
c
1
b
2
A
H
E
E
e
b
D H
D
y
A
A
1
Seating Plane
E
G
G
D
1
13
14
20
29
32
4
5
21
30
Notes:
1. Dimensions D & E do not include interlead flash.
2. Dimension b1 does not include dambar protrusion/intrusion.
3. Controlling dimension: Inches.
4. General appearance spec. should be based on final
visual inspection sepc.
Symbol
Min.
Nom.
Max.
Max.
Nom.
Min.
Dimension in Inches
Dimension in mm
A
b
c
D
e
H
E
L
y
A
A
1
2
E
b
1
G
D
3.56
0.50
2.80
2.67
2.93
0.71
0.66
0.81
0.41
0.46
0.56
0.20
0.25
0.35
13.89
13.97
14.05
11.35
11.43
11.51
1.27
H
D
G
E
12.45
12.95
13.46
9.91
10.41
10.92
14.86
14.99
15.11
12.32
12.45
12.57
1.91
2.29
0.004
0.095
0.090
0.075
0.495
0.490
0.485
0.595
0.590
0.585
0.430
0.410
0.390
0.530
0.510
0.490
0.050
0.453
0.450
0.447
0.553
0.550
0.547
0.014
0.010
0.008
0.022
0.018
0.016
0.032
0.026
0.028
0.115
0.105
0.110
0.020
0.140
1.12
1.42
0.044
0.056
0
10
10
0
0.10
2.41
32L TSOP (8 x 20 mm)
A
A
A
2
1
L
L
1
Y
c
E
H
D
D
b
e
M
0.10(0.004)
Min.
Nom.
Max.
Min.
Nom.
Max.
Symbol
A
A
b
c
D
E
e
L
L
Y
1
1
2
A
H
D
Note:
Controlling dimension: Millimeters
Dimension in Inches
0.047
0.006
0.041
0.039
0.037
0.007
0.008
0.009
0.005
0.006
0.007
0.720
0.724
0.728
0.311
0.315
0.319
0.780
0.787
0.795
0.020
0.016
0.020
0.024
0.031
0.000
0.004
1
3
5
0.002
1.20
0.05
0.15
1.05
1.00
0.95
0.17
0.12
18.30
7.90
19.80
0.40
0.00
1
0.20
0.23
0.15
0.17
18.40
18.50
8.00
8.10
20.00
20.20
0.50
0.50
0.60
0.80
0.10
3
5
Dimension in mm
__
__
__
__
__
__
__
__
__
__
__
__
__
__
__
__
W39L040
- 26 -
Package Dimensions, continued
32L STSOP (8 x 14 mm)
A
A
A
2
1
L
L
1
Y
E
H
D
D
c
Min.
Dimension in Inches
Nom. Max. Min. Nom. Max.
Symbol
1.20
0.05
0.15
1.05
1.00
0.95
0.17
0.10
0.50
0.00
0
0.22
0.27
-----
0.21
12.40
8.00
14.00
0.50
0.60
0.70
0.80
0.10
3
5
0.047
0.006
0.041
0.040
0.035
0.007
0.009
0.010
0.004
-----
0.008
0.488
0.315
0.551
0.020
0.020
0.024
0.028
0.031
0.000
0.004
0
3
5
0.002
A
A
b
c
D
E
e
L
L
Y
1
1
2
A
H
D
Dimension in mm
b
e
W39L040
Publication Release Date: February 10, 2003
- 27 -
Revision A3
13. VERSION HISTORY
VERSION DATE PAGE
DESCRIPTION
A1
April 16, 2002
-
Initial Issued
A2
August 13, 2002
11
Correct Block Erase as Sector Erase in the
Embedded Erase Algorithm
12
Correct Embedded #Data Polling Algorithm
A3
February 10, 2003 1, 3, 15
Modify the Standby Current (CMOS input) from
15
A to 2 A (typ.) and 50 A to 15 A (max.)
Headquarters
No. 4, Creation Rd. III,
Science-Based Industrial Park,
Hsinchu, Taiwan
TEL: 886-3-5770066
FAX: 886-3-5665577
http://www.winbond.com.tw/
Taipei Office
TEL: 886-2-8177-7168
FAX: 886-2-8751-3579
Winbond Electronics Corporation America
2727 North First Street, San Jose,
CA 95134, U.S.A.
TEL: 1-408-9436666
FAX: 1-408-5441798
Winbond Electronics (H.K.) Ltd.
No. 378 Kwun Tong Rd.,
Kowloon, Hong Kong
FAX: 852-27552064
Unit 9-15, 22F, Millennium City,
TEL: 852-27513100
Please note that all data and specifications are subject to change without notice.
All the trade marks of products and companies mentioned in this data sheet belong to their respective owners.
Winbond Electronics (Shanghai) Ltd.
200336 China
FAX: 86-21-62365998
27F, 2299 Yan An W. Rd. Shanghai,
TEL: 86-21-62365999
Winbond Electronics Corporation Japan
Shinyokohama Kohoku-ku,
Yokohama, 222-0033
FAX: 81-45-4781800
7F Daini-ueno BLDG, 3-7-18
TEL: 81-45-4781881
9F, No.480, Rueiguang Rd.,
Neihu District, Taipei, 114,
Taiwan, R.O.C.